WO2008048418A3 - Procédé et appareil pour injecter des défauts de matériel passagers pour un test de logiciel - Google Patents
Procédé et appareil pour injecter des défauts de matériel passagers pour un test de logiciel Download PDFInfo
- Publication number
- WO2008048418A3 WO2008048418A3 PCT/US2007/021124 US2007021124W WO2008048418A3 WO 2008048418 A3 WO2008048418 A3 WO 2008048418A3 US 2007021124 W US2007021124 W US 2007021124W WO 2008048418 A3 WO2008048418 A3 WO 2008048418A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- circuit device
- selected ones
- software testing
- register
- hardware faults
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
- G06F11/3668—Software testing
- G06F11/3672—Test management
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/36—Preventing errors by testing or debugging software
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009533306A JP5297382B2 (ja) | 2006-10-18 | 2007-10-01 | ソフトウェア試験のために過渡ハードウェア故障を注入する方法及び装置 |
EP07852485A EP2074515A2 (fr) | 2006-10-18 | 2007-10-01 | Procédé et appareil pour injecter des défauts de matériel passagers pour un test de logiciel |
KR1020097007874A KR101174186B1 (ko) | 2006-10-18 | 2007-10-01 | 동적 결함 주입 장치, 동적 결함 주입 방법 및 동적 결함 주입 시스템 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/550,498 US7689866B2 (en) | 2006-10-18 | 2006-10-18 | Method and apparatus for injecting transient hardware faults for software testing |
US11/550,498 | 2006-10-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2008048418A2 WO2008048418A2 (fr) | 2008-04-24 |
WO2008048418A3 true WO2008048418A3 (fr) | 2008-10-02 |
Family
ID=39186752
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2007/021124 WO2008048418A2 (fr) | 2006-10-18 | 2007-10-01 | Procédé et appareil pour injecter des défauts de matériel passagers pour un test de logiciel |
Country Status (6)
Country | Link |
---|---|
US (1) | US7689866B2 (fr) |
EP (1) | EP2074515A2 (fr) |
JP (1) | JP5297382B2 (fr) |
KR (1) | KR101174186B1 (fr) |
CN (1) | CN101529389A (fr) |
WO (1) | WO2008048418A2 (fr) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101689150B (zh) * | 2007-06-20 | 2011-11-30 | 富士通株式会社 | 信息处理装置及控制方法 |
US8051346B2 (en) * | 2009-02-25 | 2011-11-01 | Cisco Technology, Inc. | Fault injection |
US8276021B2 (en) * | 2009-12-18 | 2012-09-25 | Microsoft Corporation | Concurrency test effectiveness via mutation testing and dynamic lock elision |
US9652365B2 (en) * | 2010-08-24 | 2017-05-16 | Red Hat, Inc. | Fault configuration using a registered list of controllers |
US8418012B2 (en) | 2010-09-21 | 2013-04-09 | Ansaldo Sts Usa, Inc. | Method of analyzing the safety of a device employing on target hardware description language based fault injection |
CN102565603B (zh) * | 2010-12-30 | 2015-08-12 | 德律科技股份有限公司 | 电性连接缺陷仿真测试方法及其系统 |
WO2014196059A1 (fr) * | 2013-06-06 | 2014-12-11 | 株式会社日立製作所 | Procédé et système d'injection de défaut dans un microcontrôleur |
JP6295113B2 (ja) * | 2014-03-17 | 2018-03-14 | ルネサスエレクトロニクス株式会社 | 自己診断装置及び自己診断方法 |
KR102251991B1 (ko) | 2015-05-14 | 2021-05-17 | 한국전자통신연구원 | 결함 주입 및 결함 감내 분석을 위한 방법 및 장치 |
US9753826B2 (en) | 2015-07-21 | 2017-09-05 | International Business Machines Corporation | Providing fault injection to cloud-provisioned machines |
US10380341B2 (en) * | 2016-04-01 | 2019-08-13 | Qualcomm Incorporated | Adaptive systems and procedures for defending a processor against transient fault attacks |
US11093673B2 (en) * | 2016-12-22 | 2021-08-17 | Synopsys, Inc. | Three-dimensional NoC reliability evaluation |
EP3617723B1 (fr) | 2018-08-29 | 2023-03-22 | Nxp B.V. | Dispositif de circuit intégré comportant un système de surveillance de panne intégré |
CN110728802A (zh) * | 2019-10-23 | 2020-01-24 | 深圳市丰巢科技有限公司 | 智能柜的巡检方法、装置、智能柜及存储介质 |
CN111289886B (zh) * | 2020-03-16 | 2021-02-02 | 电子科技大学 | 一种基于边界扫描测试链路的故障注入方法 |
US20240320112A1 (en) * | 2023-03-22 | 2024-09-26 | Nxp B.V. | Method and apparatus to inject errors in a memory block and validate diagnostic actions for memory built-in-self-test (mbist) failures |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0415614A2 (fr) * | 1989-08-28 | 1991-03-06 | AT&T Corp. | Méthode et dispositif pour générer des signaux de commande |
EP0511752A1 (fr) * | 1991-04-26 | 1992-11-04 | AT&T Corp. | Test à haute vitesse d'un circuit intégré avec ITAG |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5130988A (en) * | 1990-09-17 | 1992-07-14 | Northern Telecom Limited | Software verification by fault insertion |
JPH0764817A (ja) * | 1993-08-30 | 1995-03-10 | Mitsubishi Electric Corp | 故障検出システム |
US7284159B2 (en) * | 2003-08-26 | 2007-10-16 | Lucent Technologies Inc. | Fault injection method and system |
-
2006
- 2006-10-18 US US11/550,498 patent/US7689866B2/en not_active Expired - Fee Related
-
2007
- 2007-10-01 CN CNA2007800386433A patent/CN101529389A/zh active Pending
- 2007-10-01 JP JP2009533306A patent/JP5297382B2/ja not_active Expired - Fee Related
- 2007-10-01 WO PCT/US2007/021124 patent/WO2008048418A2/fr active Application Filing
- 2007-10-01 KR KR1020097007874A patent/KR101174186B1/ko not_active IP Right Cessation
- 2007-10-01 EP EP07852485A patent/EP2074515A2/fr not_active Withdrawn
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0415614A2 (fr) * | 1989-08-28 | 1991-03-06 | AT&T Corp. | Méthode et dispositif pour générer des signaux de commande |
EP0511752A1 (fr) * | 1991-04-26 | 1992-11-04 | AT&T Corp. | Test à haute vitesse d'un circuit intégré avec ITAG |
Non-Patent Citations (2)
Title |
---|
BECKERLE M: "AC-SCAN: A DESIGN FOR TEST ALTERNATIVE TO BOUNDARY SCAN WHICH ALLOWS DETECTION OF AC SIGNAL FAILURE MODES", MOTOROLA TECHNICAL DEVELOPMENTS, MOTOROLA INC. SCHAUMBURG, ILLINOIS, US, vol. 16, 1 August 1992 (1992-08-01), pages 157 - 160, XP000310400, ISSN: 0887-5286 * |
GRAHAM ET AL: "AC Interconnect Test With Series Boundary Scan", IP.COM JOURNAL, IP.COM INC., WEST HENRIETTA, NY, US, 1 November 1991 (1991-11-01), XP013110069, ISSN: 1533-0001 * |
Also Published As
Publication number | Publication date |
---|---|
US20080155328A1 (en) | 2008-06-26 |
CN101529389A (zh) | 2009-09-09 |
KR20090068259A (ko) | 2009-06-25 |
US7689866B2 (en) | 2010-03-30 |
JP2010507170A (ja) | 2010-03-04 |
EP2074515A2 (fr) | 2009-07-01 |
WO2008048418A2 (fr) | 2008-04-24 |
KR101174186B1 (ko) | 2012-08-14 |
JP5297382B2 (ja) | 2013-09-25 |
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