WO2007043263A1 - Truing member for abrasive pad and truing method of abrasive pad - Google Patents

Truing member for abrasive pad and truing method of abrasive pad Download PDF

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Publication number
WO2007043263A1
WO2007043263A1 PCT/JP2006/317896 JP2006317896W WO2007043263A1 WO 2007043263 A1 WO2007043263 A1 WO 2007043263A1 JP 2006317896 W JP2006317896 W JP 2006317896W WO 2007043263 A1 WO2007043263 A1 WO 2007043263A1
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WO
WIPO (PCT)
Prior art keywords
polishing
polishing pad
base plate
truing
pad
Prior art date
Application number
PCT/JP2006/317896
Other languages
French (fr)
Japanese (ja)
Inventor
Takashi Kubo
Hiroshi Kimura
Original Assignee
Asahi Glass Company, Limited
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asahi Glass Company, Limited filed Critical Asahi Glass Company, Limited
Priority to JP2007539832A priority Critical patent/JP5013202B2/en
Publication of WO2007043263A1 publication Critical patent/WO2007043263A1/en

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Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/017Devices or means for dressing, cleaning or otherwise conditioning lapping tools
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B53/00Devices or means for dressing or conditioning abrasive surfaces
    • B24B53/12Dressing tools; Holders therefor

Definitions

  • the present invention relates to a polishing pad crane member for correcting (optimizing) the shape of a polishing pad (polishing member) of a polishing apparatus for polishing a plate glass, particularly a glass substrate for a display.
  • the present invention relates to a clawing member and a clawing method for a polishing pad.
  • a production method using a molding method called a float method is known.
  • the molten glass is formed into a plate shape by the float method, and then the fine irregularities and undulations on the surface of the glass plate are polished and removed by a polishing apparatus to obtain a thickness of 0.5.
  • This is a method of forming a thin plate of ⁇ 1.1 mm.
  • the applicant of the present application has proposed a polishing apparatus that targets a large thin glass substrate for a flat panel display as disclosed in Patent Document 1.
  • This polishing apparatus supplies pressurized fluid between a film body to which an adsorption sheet for adsorbing and holding a substrate is attached and a carrier to which the film body is attached, and pressurizes the substrate that is adsorbed and held on the adsorption sheet. It is pressed against the polishing pad (polishing member) of the polishing surface plate by the pressure of the fluid for polishing.
  • a grindstone such as a micro waviness or the like existing on the surface of a polishing pad after polishing a polishing pad before use and a predetermined number of glass substrates
  • a truing process shape correction process using a truing member is performed.
  • a polishing pad for polishing a large glass substrate having a side exceeding 2000 mm cannot be composed of a single piece (one pad). For this reason, a large area of polishing pad is created by attaching a plurality of small polishing pads to a polishing surface plate.
  • the stepped portion at the boundary between each polishing pad generated by bonding a plurality of polishing nodes is a glass substrate. In order to adversely affect the quality of the polishing pad, the stepped portion of the polishing pad must also be removed by grinding with a vine member! /.
  • the above-mentioned vine member is constituted by fixing (electrodepositing) diamond abrasive grains on the entire surface of a rectangular base plate (metal sheet) corresponding to the shape of the glass substrate.
  • the tooling member is attached to a carrier of a polishing apparatus, and the carrier is rotated and revolved, and the polishing pad is tooled by pressing it against a circular polishing pad while rotating or swinging the polishing surface plate.
  • Patent Document 1 JP-A-2004-122351
  • the amount of grinding of the polishing pad by the temple member is proportional to the contact time between the polishing pad and the temple member.
  • the central portion thereof is always in contact with the polishing pad. Therefore, the central part of the polishing pad is always ground by relative rotation (rotation) and revolving motion.
  • the peripheral portion of the polishing pad is not always ground because the contact with the vine member becomes intermittent during relative revolving motion. As a result, the polishing pad is ground more in the central part than in the peripheral part by the truing process.
  • the conventional vine member is very expensive because diamond particles are electrodeposited on the entire surface of the base plate.
  • the present invention has been made in view of such a problem, and a polishing pad (polishing member) formed by laminating a plurality of small-sized polishing pads is efficiently and effectively used as a crane. It is an object of the present invention to provide a clawing member that can be worn and a method for clawing a polishing pad using the truing member.
  • the present invention provides a polishing pad crane member having a barrel fixing portion formed by fixing a barrel on a base plate,
  • the fixed part is located on a straight line passing through the center of the base plate and has a wedge shape that narrows toward the center of the base plate, and a part of the contour line of the barrel fixing part is the center of the base plate.
  • a polishing pad crane member characterized by being provided in a plurality so as to be positioned on a point.
  • the crane lining member is a wedge shape in which the base plate is rectangular, the gunball fixing portion is located on a diagonal line of the base plate and becomes narrower toward the center of the base plate, It is preferable that the base plate is disposed at least in a pair with a center point therebetween.
  • the difference between the contact time of the polishing pad and the gunball is reduced over the entire surface of the polishing pad by pressing the pulling member against the polishing pad while rotating and revolving. Become. Therefore, the entire surface of the polishing pad can be ground uniformly, and excessive grinding of the central portion of the polishing pad can be prevented. Therefore, the present invention can efficiently and effectively even a polishing pad configured by laminating a plurality of small polishing pads, that is, a polishing pad having a plurality of layers bonded to each other and having a step in the bonded portion. It can be craned.
  • the base plate is formed by joining a plurality of small flat plates! /.
  • the clawing member when the clawing member is rotated about a predetermined rotation axis, there is provided a polishing pad truing method in which both are pressed against a polishing pad while revolving around a predetermined revolution axis, and the shape of the polishing pad is corrected.
  • the crane member of the present invention can also dress a polishing pad.
  • a polishing pad crane having an abrasive grain fixing portion formed by fixing abrasive grains on a base plate.
  • the barrel fixing part is in a wedge shape that is positioned on a straight line passing through the center of the base plate and narrows toward the center of the base plate, and is one on the contour line of the barrel fixing part. Since a plurality of force parts are provided so as to be positioned on the center point of the base plate, it is possible to efficiently and effectively tool a polishing pad formed by laminating a plurality of small polishing pads. .
  • FIG. 1 is a plan view showing an overall structure of a polishing apparatus according to a first embodiment.
  • FIG. 2 is a side view showing an embodiment of a polishing head and a polishing stage.
  • FIG. 3 is an assembled perspective view of a polishing head.
  • FIG. 4 is an explanatory view showing a three-layer structure of a film body of a film frame.
  • FIG. 5 is an enlarged cross-sectional view of the main part showing the structure for attaching and detaching the membrane frame to the sliding ring.
  • FIG. 6 is a plan view of the crane member of the present embodiment.
  • FIG. 7 is an explanatory view showing a movement locus of the crane member shown in FIG.
  • FIG. 8 is an explanatory view showing a plan view of the crane member of patterns 1 to 4.
  • FIG. 9 is a graph showing the evaluation of crane members of patterns 1 to 4.
  • G Glass substrate, 10 ... Polishing device, 12 ... Conveyor, 14 ... Film frame, 16 ... Stage, 18 ... First polishing stage, 20 ... Second polishing stage, 22 ... "Stage, 24 ... Glass substrate unloading conveyor, 26 ... Membrane frame washing stage, 28 ... Membrane frame drying stage, 30 ... Membrane frame return conveyor, 32 ... Robot, 33 ... Arm, 34 ... Adsorption node, 36 ... Conveyor, 38 ... Film body, 40 ... Upper frame, 42 ... Lower frame, 44 ... Airtight holding layer, 46 ... Strength holding layer, 48 ... Smooth layer, 50 ... Polishing head, 51 ... Main body casing, 52 ... Carrier, 53 ...
  • Lower outer ring, 54 Air chamber, 56 ... Spindle, 58 ... Polishing pad, 60 ... Polishing pad, 62 ... Polishing surface plate, 64 ... Rotary axis, 66 ... Polishing surface plate, 68 ... Rotary axis, 70 ... Linear motion Guide, 72 ... Guide rail, 74 ... Maintenance stage, 76 ... Maintenance stage, 78 ... Lifting ring, 80 ... Through hole, 82 ...
  • a polishing apparatus 10 shown in FIG. 1 is a polishing apparatus that polishes one side of a large liquid crystal display glass substrate G (hereinafter simply referred to as a glass substrate G) to a desired flatness.
  • a glass substrate G for example, one side exceeds 2000 mm and the thickness is 0.5 mn! ⁇ 1. lmm can be applied.
  • the polishing apparatus 10 includes a conveyor 12 that conveys an unpolished glass substrate G, a stage 16 that adheres the glass substrate G to a film frame 14, a first polishing stage 18, a second polishing stage 20, and a polishing
  • the main parts are the stage 22 for removing the polished glass substrate G from the membrane frame 14, the glass substrate carry-out conveyor 24, the membrane frame cleaning stage 26, the membrane frame drying stage 28, and the membrane frame return conveyor 30!
  • the polishing apparatus 10 has a transfer apparatus 150 for transferring the film frame 14 from the stage 16 to the first polishing stage 18, and the film frame 14 from the first polishing stage 18 to the second polishing stage 20.
  • a transfer device 152 for transferring and a transfer device 154 for transferring the film frame 14 from the second polishing stage 20 to the stage 22 are provided.
  • the unpolished glass substrate G transported by the conveyor 12 is sucked and held by the suction pad 34 provided on the arm 33 of the robot 32. Then, it is transferred from the conveyor 12 to the conveyor 36 by the rotating operation of the arm 33, and is conveyed toward the stage 16 by the conveyor 36.
  • stage 16 glass substrate G is held on film frame 14. This holding method will be described.
  • the film frame 14 is held on the stage 16 by an elevating device (not shown) which is a glass substrate sticking means, and the glass substrate G is positioned below the film frame 14.
  • the film frame 14 is lowered by the lifting device, and the film body 38 of FIG. 2 stretched on the film frame 14 is pressed against the glass substrate G.
  • a porous foamed polyurethane adsorption sheet 200 that self-adsorbs the glass substrate G is adhered, and between the adsorption sheet 200 and the film body 38, a poly force-carbonate is adhered.
  • An intermediate sheet 210 made of metal is interposed and adhered to both the adsorbing sheet 200 and the film body 38.
  • the glass substrate G is relatively pressed against the suction sheet 200 by the pressing force by the lifting device described above, and is sucked and held by the suction sheet 200. Thereafter, the film frame 14 is held by the transfer device 150 of FIG. 1 and transferred to the first polishing stage 18 of FIG. 3, where it is attached to the carrier 52.
  • the membrane frame 14 has a membrane body 38 stretched between the upper frame 40 and the lower frame 42, and then the upper frame 40 and the lower frame 42 are bolted (not shown). It is comprised by fastening with.
  • the film frame 14 and the film body 38 are not limited to a circular shape, but may be a rectangular shape.
  • the film body 38 has a two-layer structure including an airtight holding layer 44 and a strength holding layer 46.
  • the airtight holding layer 44 is a sheet material whose outer peripheral portion is closely attached to the lower outer peripheral ring portion 53 of the carrier 52 and maintains airtightness with the air chamber 54 of the carrier 52. is there. Examples of the material of the sheet material include rubber materials, silicone materials, fluorine resin, salt materials (polyvinyl chloride), polyamide materials, urethane materials, and the like.
  • the strength holding layer 46 in FIG. 4 is a sheet material having a predetermined tensile strength that can withstand the tension that holds the airtight holding layer 44 and stretches the entire film body 38.
  • an intermediate sheet 210 is bonded to the lower surface thereof.
  • the material for the strength retaining layer 46 include aramid fiber, stainless steel wire mesh, steel wire mesh, carbon fiber, glass fiber, nylon fiber, metal sheet, and resin sheet.
  • aramid fibers are preferred because of their very low elongation to tensile force.
  • the polishing head 50 is configured such that a motor is built in a main body casing 51, and an output shaft of the motor is connected to a spindle 56 that is suspended in a vertical direction.
  • a carrier 52 is connected to the spindle 56. Therefore, the carrier 52 rotates.
  • the main body casing 51 is connected to the slider 158 via the lifting mechanism 156.
  • the main body casing 51 is moved up and down with respect to the slider 158 by the lifting mechanism 156, so that the carrier 52 moves forward and backward with respect to the polishing pad 58 of the first polishing stage 18 and the polishing pad 60 of the second polishing stage 20.
  • the glass substrate G adhered to the film frame 14 can be pressed against the polishing pads 58 and 60 with a predetermined polishing pressure.
  • polishing pad 58 is made of urethane foam and cannot be formed as a single piece (one pad), a plurality of (for example, eight) small-sized polishing pads are attached to the upper surface of the polishing surface plate 62. A large area polishing pad is attached to the surface.
  • a rotating shaft 64 that is rotated by a motor (not shown) is connected to the lower portion of the polishing surface plate 62.
  • the polishing pad 60 is affixed to the upper surface of the polishing surface plate 66, and a rotating shaft 68 that is rotated by a motor (not shown) is connected to the lower portion of the polishing surface plate 66.
  • the main casing 51 is connected to a revolution drive mechanism (not shown) and has a function of revolving around a revolution radius around a predetermined revolution axis. Accordingly, the carrier 52 revolves around the revolution axis.
  • This revolution drive mechanism can also be configured by incorporating a planetary gear mechanism in the main body casing 51 and connecting the output shaft of the planetary gear mechanism to the spindle 56.
  • the above is the configuration of each polishing stage 18, 20, and the glass substrate G is polished by these polishing stages 18, 20, and minute irregularities and undulations on the surface of the glass substrate G are removed. Further, the stepped portion at the boundary between the polishing pads is intensively ground and removed by a crane lining member described later.
  • linear guides 70 and 70 are attached to the slider 158 of the first polishing stage 18.
  • the linear guides 70 and 70 are fitted to guide rails 72 and 72.
  • the guide rails 72 and 72 are arranged toward the maintenance stage 74 that maintains the spindle 56 and the carrier 52 of the first polishing stage 18! /
  • linear motion guides 70 and 70 are similarly attached to the slider 158 of the second polishing stage 20, and the linear motion guides 70 and 70 are fitted to the guide rails 160 and 160. Yes. As shown in FIG. 1, the guide rails 160 and 160 are arranged toward the maintenance stage 76 for maintaining the spindle 56 and the carrier 52 of the second polishing stage 20.
  • a lifting ring 78 is fixed to the upper outer peripheral portion of the carrier 52 with bolts (not shown) as shown in FIG.
  • a plurality of through holes 80, 80 ... are formed at equal intervals on a concentric circle in the flange portion where the outer peripheral force of the carrier 52 of the lifting ring 78 also protrudes, and these through holes 80, 80,.
  • a sliding ring hanger 84 projecting from the upper surface of the sliding ring 82 is penetrated from below. Further, the sliding ring suspension 84 is penetrated by a lifting spring 88 disposed between the lifting ring 78 and the lifting disc spring 86 and penetrates through the through hole 90 of the lifting disc spring 86. And connected to a screw jack 92.
  • the force required to measure the amount of contraction of the suspension spring 88 in order to maintain a constant tension As one means, the current of a motor (not shown) connected to the screw jack 92 via the line shaft 96 is used. By calculating the torque from the value, indirectly acquiring the lifting force of the screw jack 92, and managing this, the tension applied to the film body 38 can be monitored.
  • the line shaft 96 is a shaft that transmits the driving force of the motor to the screw jack 92.
  • Reference numeral 94 is a stopper pin for receiving the reaction force of the lifting spring 88 generated between the lifting ring 78 and the lifting disc spring 86.
  • a plurality of injection ports 98, 98... For discharging compressed air that is a pressurized fluid is formed in the air chamber 54 of FIG.
  • These injection ports 98, 98... Communicate with an air supply path 102 indicated by a broken line in FIG. 3 via an air chamber 100 formed on the upper surface of the carrier 52.
  • the air supply path 102 extends outside the polishing head 50 via a rotary joint (not shown) attached to the polishing head 50, and is connected to the air pump 106 via a valve 104. Therefore, when the valve 104 is opened, compressed air from the air pump 106 is supplied to the air chamber 54 via the air supply path 102, the air chamber 100, and the injection port 98. Thereby, the pressure of the compressed air is transmitted to the glass substrate G through the film body 38, and the entire surface of the glass substrate G is pressed against the polishing pads 58 and 60 with a uniform pressure by this pressure and polished.
  • the upper frame 40 of the membrane frame 14 is provided with a plurality of pins 108, 108... Protruding at equal intervals on a concentric circle and formed at the upper ends of these pins 108.
  • the membrane frame 14 is attached to the sliding ring 82 by engaging the large-diameter head portion 110 shown in FIG.
  • the engagement force between the head part 110 and the hook 112 is strengthened by the reaction force of the film body 38 when the film body 38 is lifted by the screw jack 92, and the polishing resistance received from the film body 38 during polishing causes the head from the hook 112 to Part 110 is not off.
  • the film frame 14 is removed from the carrier 52 and transferred to the stage 22 by the transfer device 154.
  • the screw jack 92 shown in FIG. the film frame 14 is rotated by a predetermined angle with respect to the carrier 52 to remove the head portion 110 from the hook 112. This allows the carrier The membrane frame 14 is removed from 52.
  • the glass substrate G that has been polished is removed from the film frame 14 that has been transported by the transport device 154.
  • the removed glass substrate G is conveyed by the conveyor 138, and is adsorbed by the adsorption head 144 attached to the arm 142 of the robot 140, and transferred to the glass substrate carry-out conveyor 24 by the operation of the robot 140. It is carried out of the polishing apparatus 10.
  • the film frame 14 from which the glass substrate G has been removed is conveyed to the film frame cleaning stage 26 by the conveyor 146, where it is cleaned with water.
  • the membrane frame 14 that has been cleaned is conveyed to the membrane frame drying stage 28 by the conveyor 148, where it is heated and dried. Then, the dried film frame 14 is transported to the stage 16 by the film frame return conveyor 30 and reused for adhering the glass substrate G.
  • the above is the overall configuration of the polishing apparatus 10.
  • the polishing pads 58 and 60 are subjected to tooling (shape correction) before use in order to grind and remove the above-described stepped portions and to remove micro-waviness on the surface layer after processing a predetermined number of sheets.
  • tooling shape correction
  • the tooling is designed to reinforce the surface of the polishing pad before use and after polishing a predetermined number of undulations, irregularities, and steps! This refers to the process to be removed.
  • a grinding member is incorporated in the polishing apparatus 10. Since the crane member serves as a reference for the polishing surface of the polishing pad, high precision is required.
  • FIG. 6 shows a crane member of the present embodiment.
  • the tooling is carried out by attaching a rectangular tooling member 224 having a barrel fixing part in which diamond barrels 220 are electrodeposited to a stainless steel sheet 222 as a base plate. That is, similarly to the polishing of the glass substrate G, the rounding member 224 attached to the adsorption sheet 200 of the film frame 14 is uniformly pressurized with compressed air, which is a pressurized fluid, to form a circular polishing node. While pressing against the belts 58 and 60, the crane pad 224 is rotated (revolved) and revolved, and the polishing pads 58 and 60 are rotated to rotate the polishing pads 58 and 60. It is preferable that the vine member has substantially the same shape as the glass substrate G!
  • the grinding amount of the polishing pad by the crane member is proportional to the contact time between the polishing pad and the gunshot particles. Therefore, diamond particles are electrodeposited on the entire surface of the base plate.
  • the peripheral portion of the polishing pad is not always ground because the contact with the barrel is intermittent due to the relative revolving motion.
  • the central portion of the polishing pad is always in contact with the crane member, the central portion of the polishing pad is always ground by relative rotation and revolution. As a result, the polishing pad is shaved more in the center than in the periphery.
  • the vine member 224 of the present embodiment is formed by forming a stainless steel sheet 222 as a base plate into a rectangular shape and electrodepositing diamond barrels 220.
  • the pair of barrel fixing parts 226, 226 force formed on the diagonal line of the stainless steel sheet 222 are formed in a wedge shape that narrows toward the center O of the stainless steel sheet 222.
  • nine stainless sheets (base plates) A to I of small size are joined in this embodiment.
  • the diamond abrasive grains 220 are fixed (electrodeposited) to the stainless steel sheets A, E, and I to provide the barrel fixing part.
  • the temple fixing member 224 has a pair of forces formed on one diagonal along the center O of the stainless steel sheet 222 with the barrel fixing parts 226, 226 further along the other diagonal. You may arrange.
  • the temple member 224 configured as above, the temple member 22 4 while rotating and revolving the crane member 224 and the polishing pads 58, 60 relatively as shown in FIG. Is pressed against the polishing pads 58 and 60, so that the entire surface of the polishing nodes 58 and 60 (inside the circle indicated by reference numeral 228) with which the temple member 224 comes into contact is disposed between the polishing pads 58 and 60 and the barrel fixing part 226. Contact time is equal. Therefore, the entire surface of the polishing pad 58, 60 should be uniform. It is possible to grind and prevent the center portion of the polishing pads 58 and 60 from being excessively shaved.
  • the temple member 224 of the present embodiment it is possible to efficiently and effectively tool the polishing pads 58 and 60 formed by bonding a plurality of small polishing pads. it can.
  • Pattern 1 is a conventional templed member in which diamond particles are electrodeposited on the entire surface of a rectangular base plate (metal sheet).
  • Pattern 2 is a tooling member in which diamond barrels are electrodeposited on a diagonal line of a rectangular base plate (metal sheet) so that the barrel fixing portions are strip-shaped.
  • Pattern 3 is a force that has a shape narrowing toward the center of the base plate on a diagonal line of a rectangular base plate (metal sheet), and the diamond cannon is fixed to have a predetermined width at the center of the base plate.
  • the crane member of pattern 3 does not correspond to the crane member of the present invention because a part of the contour line of the barrel fixing part is not located on the center point of the base plate (metal sheet).
  • Pattern 4 is an electrode of this embodiment in which diamond abrasive grains are electrodeposited on a diagonal line of a rectangular base plate (metal sheet) so as to have a wedge shape (sharp shape) that narrows toward the center of the base plate (metal sheet).
  • a truing member 224 is an electrode of this embodiment in which diamond abrasive grains are electrodeposited on a diagonal line of a rectangular base plate (metal sheet) so as to have a wedge shape (sharp shape) that narrows toward the center of the base plate (metal sheet).
  • the crane member of the present invention should have a substantial effective area of the barrel fixing portion that is the same as the pattern 4 shown in the example! By providing a cutout in the barrel fixing part and changing the shape and distribution density of the cutout, it is possible to make the barrel fixing part obtained by removing this notch the same as pattern 4. it can.
  • Such a crane member also includes the present invention.
  • Fig. 9 is a graph showing the polishing amount ratio when the polishing pad is ground by the truing members of patterns 1 to 4, and the horizontal axis indicates the position (mm) of the polishing pad central force. The grinding ratio is shown on the vertical axis.
  • (C) It is determined whether or not an abrasive grain fixing portion exists at the position of the crane member. If there is no abrasive grain fixing portion, the grinding amount of the polishing pad is set to zero.
  • FIG. 9 shows the grinding amount ratio calculated under the above conditions (A) to (E).
  • the polishing amount in the central portion of the polishing pad is overwhelmingly larger than the polishing amount in the peripheral portion, so all steps are ground and removed. In order to do so, it was found that the total grinding amount increased.
  • the total grinding amount of the non-turn 2 and 3 crane members is smaller than that of the pattern 1 crane member, the grinding amount in the center of the polishing pad is different from the grinding amount in other parts. The life of the polishing pad cannot be extended because it clearly increases in comparison.
  • the tooling member 224 of the pattern 4 can grind almost uniformly on the entire surface of the polishing pad, so that the step of the polishing pad can be ground and removed with a minimum amount of grinding. found.
  • polishing pads 58 and 60 formed by adhering the pads can be efficiently and effectively tooled.
  • the temple member for polishing pad of the present invention is suitable for correcting (optimizing) the shape of a polishing pad (polishing member) of a polishing apparatus for polishing plate glass, particularly a display glass substrate.

Abstract

A truing member capable of truing an abrasive pad composed by sticking a plurality of sheets of small abrasive pad efficiently and effectively, and a truing method of an abrasive pad. The truing member has a rectangular base place, and an abrasive grain securing portion formed by electrodepositing diamond abrasive grains is formed on the diagonal of the base plate such that it becomes thinner toward the center of the base plate. When the truing member is presses against the abrasive pad while they are rotated relatively and revolved, contact time of the abrasive pad with the abrasive grain securing portion becomes equal over the entire surface of the abrasive pad and thereby the entire surface of the abrasive pad can be ground uniformly.

Description

明 細 書  Specification
研磨パッド用ツル一イング部材及び研磨パッドのツル一イング方法 技術分野  Polishing pad crane member and polishing pad crane method
[0001] 本発明は研磨パッド用ツル一イング部材に関するものであり、板ガラス、特にディス プレイ用ガラス基板を研磨する研磨装置の研磨パッド (研磨部材)の形状を修正 (最 適ィ匕)するためのツル一イング部材及び研磨パッドのツル一イング方法に関する。 背景技術  TECHNICAL FIELD [0001] The present invention relates to a polishing pad crane member for correcting (optimizing) the shape of a polishing pad (polishing member) of a polishing apparatus for polishing a plate glass, particularly a glass substrate for a display. The present invention relates to a clawing member and a clawing method for a polishing pad. Background art
[0002] 液晶ディスプレイ等のフラットパネルディスプレイ用の薄板ガラス基板の製造方法の 一つとして、フロート法といわれる成形法を用いた製造方法が知られている。この製 造方法は、前記フロート法により溶融ガラスを板状に成形し、その後研磨装置によつ てガラス板の表面の微小な凹凸やうねりを研磨して除去することにより、厚さ 0. 5〜1 . 1mmの薄板状にする方法である。  [0002] As a method for producing a thin glass substrate for a flat panel display such as a liquid crystal display, a production method using a molding method called a float method is known. In this production method, the molten glass is formed into a plate shape by the float method, and then the fine irregularities and undulations on the surface of the glass plate are polished and removed by a polishing apparatus to obtain a thickness of 0.5. This is a method of forming a thin plate of ~ 1.1 mm.
[0003] 最近のフラットパネルディスプレイ用薄板ガラス基板は、ディスプレイの大画面化に 伴 、一辺が 2000mmを超えるような大型のものも製造されて 、る。  [0003] As a thin glass substrate for a recent flat panel display, a large-sized glass substrate having a side exceeding 2000 mm is manufactured as the display is enlarged.
[0004] ところで、本願出願人は、特許文献 1にお ヽて大型のフラットパネルディスプレイ用 薄板ガラス基板を対象とする研磨装置を提案している。この研磨装置は、基板を吸 着保持する吸着シートが取り付けられた膜体と、この膜体が取り付けられるキャリアと の間に加圧流体を供給し、吸着シートに吸着保持された基板を加圧流体の圧力によ り研磨定盤の研磨パッド (研磨部材)に押し付けて研磨するものである。  By the way, the applicant of the present application has proposed a polishing apparatus that targets a large thin glass substrate for a flat panel display as disclosed in Patent Document 1. This polishing apparatus supplies pressurized fluid between a film body to which an adsorption sheet for adsorbing and holding a substrate is attached and a carrier to which the film body is attached, and pressurizes the substrate that is adsorbed and held on the adsorption sheet. It is pressed against the polishing pad (polishing member) of the polishing surface plate by the pressure of the fluid for polishing.
[0005] 一般に、このような研磨装置では、使用前の研磨パッド及び所定枚数のガラス基板 を研磨した後の研磨パッドに対して、その表面に存在する微小うねり等の凹凸を除去 するため砥石 (ツル一イング部材)を使用したツル一イング処理 (形状修正処理)が施 される。  [0005] Generally, in such a polishing apparatus, a grindstone (such as a micro waviness or the like existing on the surface of a polishing pad after polishing a polishing pad before use and a predetermined number of glass substrates) is removed. A truing process (shape correction process) using a truing member is performed.
また、一辺が 2000mmを超えるような大型のガラス基板を研磨する研磨パッドは一 体(1枚のパッド)で構成することができない。そのため、複数の小さな研磨パッドを研 磨定盤に貼り合わせることにより大面積の研磨パッドとしている。しかし、複数の研磨 ノ ッドを貼り合わせることによって生じる各研磨パッド間の境界の段差部がガラス基板 の品質に悪影響を与えるため、前記研磨パッドの段差部もツル一イング部材によって 研削し除去しなければならな!/、。 In addition, a polishing pad for polishing a large glass substrate having a side exceeding 2000 mm cannot be composed of a single piece (one pad). For this reason, a large area of polishing pad is created by attaching a plurality of small polishing pads to a polishing surface plate. However, the stepped portion at the boundary between each polishing pad generated by bonding a plurality of polishing nodes is a glass substrate. In order to adversely affect the quality of the polishing pad, the stepped portion of the polishing pad must also be removed by grinding with a vine member! /.
[0006] 前記のツル一イング部材は、ガラス基板の形状に対応した矩形のベースプレート( 金属シート)の全面に、ダイヤモンド砥粒を固定 (電着)することにより構成されている 。このツル一イング部材を研磨装置のキャリアに取り付けるとともに、前記キャリアを回 転及び公転させ、研磨定盤を回転又は揺動させながら円形の研磨パッドに押し付け ることにより研磨パッドをツル一イングする。  [0006] The above-mentioned vine member is constituted by fixing (electrodepositing) diamond abrasive grains on the entire surface of a rectangular base plate (metal sheet) corresponding to the shape of the glass substrate. The tooling member is attached to a carrier of a polishing apparatus, and the carrier is rotated and revolved, and the polishing pad is tooled by pressing it against a circular polishing pad while rotating or swinging the polishing surface plate.
特許文献 1 :特開 2004— 122351号公報  Patent Document 1: JP-A-2004-122351
発明の開示  Disclosure of the invention
発明が解決しょうとする課題  Problems to be solved by the invention
[0007] しかしながら、ベースプレートの全面にダイヤモンド砲粒が電着された従来方式の 前記のツル一イング部材では、研磨パッドの段差部を全て研削除去したときの研磨 ノ ッドの総研削量が必要以上に多 、と 、う問題があった。このように研磨パッドの総 研削量が多いと、ツル一イング処理に長い時間を要するとともに、発泡ポリウレタン製 の高価な研磨パッドの使用寿命が短くなる。 [0007] However, in the above-described conventional vine member in which diamond barrels are electrodeposited on the entire surface of the base plate, the total grinding amount of the polishing node is required when all the steps of the polishing pad are removed by grinding. There were many more problems. Thus, when the total amount of grinding of the polishing pad is large, it takes a long time for the vineling process and the service life of the expensive polishing pad made of polyurethane foam is shortened.
ツル一イング部材による研磨パッドの研削量は、研磨パッドとツル一イング部材の接 触時間に比例する。例えば、全面にダイヤモンド砥粒が電着された従来のツルーィ ング部材の場合、その中央部は研磨パッドに常時接触している。そのため研磨パッド の中央部分は相対的な回転(自転)及び公転運動により常時研削される。一方、研 磨パッドの周部は、相対的な公転運動の際、ツル一イング部材との接触が間欠的に なるため常時研削されない。その結果、研磨パッドはツル一イング処理によって周部 よりも中央部が多く研削される。  The amount of grinding of the polishing pad by the temple member is proportional to the contact time between the polishing pad and the temple member. For example, in the case of a conventional truing member in which diamond abrasive grains are electrodeposited on the entire surface, the central portion thereof is always in contact with the polishing pad. Therefore, the central part of the polishing pad is always ground by relative rotation (rotation) and revolving motion. On the other hand, the peripheral portion of the polishing pad is not always ground because the contact with the vine member becomes intermittent during relative revolving motion. As a result, the polishing pad is ground more in the central part than in the peripheral part by the truing process.
次に、小サイズの研磨パッドが貼り合わされて構成された大面積の研磨パッドの場 合、研磨パッド中央部に存在する段差部は既に研削除去されていても、研磨パッド の周部の段差部は前述のように除去されにくいため、ツル一イング処理が «I続される Next, in the case of a large-area polishing pad configured by laminating a small-sized polishing pad, even if the stepped portion existing in the center of the polishing pad has already been ground and removed, the stepped portion on the periphery of the polishing pad Is difficult to remove as described above, so the vinening process is continued.
。その結果、研磨パッドの周部の段差部を研削するために研磨パッドの中央部を余 計に研削することになる。そのため研磨パッドの全ての段差部を研削して除去したと きの研磨パッドの総研削量が多くなり、研磨パッドの寿命が短くなるという問題があつ た。 . As a result, the center portion of the polishing pad is excessively ground in order to grind the step portion of the peripheral portion of the polishing pad. Therefore, there is a problem that the total amount of grinding of the polishing pad is increased when all the steps of the polishing pad are removed by grinding, and the life of the polishing pad is shortened. It was.
また、従来のツル一イング部材は、ダイヤモンド砲粒がベースプレートの全面に電 着されているため非常に高価なものであった。  Further, the conventional vine member is very expensive because diamond particles are electrodeposited on the entire surface of the base plate.
[0008] 本発明は、このような問題に鑑みてなされたものであって、小サイズの複数枚の研 磨パッドが貼り合わされて構成された研磨パッド (研磨部材)を効率よく効果的にツル 一イングすることができるツル一イング部材及び該ッルーイング部材を用いた研磨パ ッドのツル一イング方法を提供することを目的とする。  [0008] The present invention has been made in view of such a problem, and a polishing pad (polishing member) formed by laminating a plurality of small-sized polishing pads is efficiently and effectively used as a crane. It is an object of the present invention to provide a clawing member that can be worn and a method for clawing a polishing pad using the truing member.
課題を解決するための手段  Means for solving the problem
[0009] 前記の目的を達成するため、本発明は、ベースプレート上に、砲粒が固定されて形 成された砲粒固定部を有する研磨パッド用ツル一イング部材にお 、て、前記砲粒固 定部が、前記ベースプレートの中心を通る直線上に位置し、かつ前記ベースプレート の中心に向かって細くなる楔形状であり、前記砲粒固定部の輪郭線上の一部が、前 記ベースプレートの中心点上に位置するように複数設けられていることを特徴とする 研磨パッド用ツル一イング部材を提供する。  [0009] In order to achieve the above object, the present invention provides a polishing pad crane member having a barrel fixing portion formed by fixing a barrel on a base plate, The fixed part is located on a straight line passing through the center of the base plate and has a wedge shape that narrows toward the center of the base plate, and a part of the contour line of the barrel fixing part is the center of the base plate. Provided is a polishing pad crane member characterized by being provided in a plurality so as to be positioned on a point.
[0010] また、前記ツル一イング部材は、前記ベースプレートが矩形であり、前記砲粒固定 部が、前記ベースプレートの対角線上に位置し、かつ前記ベースプレートの中心に 向かって細くなる楔形状であり、前記ベースプレートの中心点を挟んで少なくとも一 対配置されて 、ることが好ま 、。  [0010] Further, the crane lining member is a wedge shape in which the base plate is rectangular, the gunball fixing portion is located on a diagonal line of the base plate and becomes narrower toward the center of the base plate, It is preferable that the base plate is disposed at least in a pair with a center point therebetween.
[0011] このように構成されたツル一イング部材によれば、該ッルーイング部材を回転及び 公転させながら研磨パッドに押し付けることにより、研磨パッド全面において研磨パッ ドと砲粒の接触時間の差が小さくなる。そのため、研磨パッドの全面を均一に研削す ることができ、研磨パッドの中央部の過度の研削を防止することができる。したがって 、本発明は、複数枚の小さな研磨パッドが貼り合わされて構成された研磨パッド、す なわち複数枚が貼り合わされその貼り合わせ部分に段差を有する研磨パッドであつ ても、効率よく効果的にツル一イングすることができる。 [0011] According to the crane member configured as described above, the difference between the contact time of the polishing pad and the gunball is reduced over the entire surface of the polishing pad by pressing the pulling member against the polishing pad while rotating and revolving. Become. Therefore, the entire surface of the polishing pad can be ground uniformly, and excessive grinding of the central portion of the polishing pad can be prevented. Therefore, the present invention can efficiently and effectively even a polishing pad configured by laminating a plurality of small polishing pads, that is, a polishing pad having a plurality of layers bonded to each other and having a step in the bonded portion. It can be craned.
[0012] また、本発明のツル一イング部材は、前記ベースプレートが、複数の小さな平板を 接合することにより構成されて 、ることが好まし!/、。  [0012] Further, in the crane member of the present invention, it is preferable that the base plate is formed by joining a plurality of small flat plates! /.
[0013] さらに、本発明は、前記ツル一イング部材を、所定の回転軸を中心に回転させると ともに所定の公転軸を中心に公転させながら研磨パッドに押し付け、該研磨パッドの 形状を修正する、研磨パッドのツル一イング方法を提供する。なお、本発明のツル一 イング部材は、研磨パッドのドレッシングを行うことも可能である。 [0013] Further, according to the present invention, when the clawing member is rotated about a predetermined rotation axis, There is provided a polishing pad truing method in which both are pressed against a polishing pad while revolving around a predetermined revolution axis, and the shape of the polishing pad is corrected. The crane member of the present invention can also dress a polishing pad.
発明の効果  The invention's effect
[0014] 本発明の研磨パッド用ツル一イング部材及び研磨パッドのツル一イング方法によれ ば、ベースプレート上に、砥粒が固定されて形成された砥粒固定部を有する研磨パ ッド用ツル一イング部材において、前記砲粒固定部が、前記ベースプレートの中心を 通る直線上に位置し、かつ前記ベースプレートの中心に向力つて細くなる楔形状で あり、前記砲粒固定部の輪郭線上の一部力 前記ベースプレートの中心点上に位置 するように複数設けられて 、るので、複数枚の小さな研磨パッドが貼り合わされて構 成された研磨パッドを効率よく効果的にツル一イングすることができる。  [0014] According to the polishing pad crane member and polishing pad crane method of the present invention, a polishing pad crane having an abrasive grain fixing portion formed by fixing abrasive grains on a base plate. In the first inching member, the barrel fixing part is in a wedge shape that is positioned on a straight line passing through the center of the base plate and narrows toward the center of the base plate, and is one on the contour line of the barrel fixing part. Since a plurality of force parts are provided so as to be positioned on the center point of the base plate, it is possible to efficiently and effectively tool a polishing pad formed by laminating a plurality of small polishing pads. .
図面の簡単な説明  Brief Description of Drawings
[0015] [図 1]第 1の実施の形態の研磨装置の全体構造を示す平面図。 FIG. 1 is a plan view showing an overall structure of a polishing apparatus according to a first embodiment.
[図 2]研磨ヘッドと研磨ステージの実施の形態を示す側面図。  FIG. 2 is a side view showing an embodiment of a polishing head and a polishing stage.
[図 3]研磨ヘッドの組立斜視図。  FIG. 3 is an assembled perspective view of a polishing head.
[図 4]膜枠の膜体の三層構造を示す説明図。  FIG. 4 is an explanatory view showing a three-layer structure of a film body of a film frame.
[図 5]摺動リングに対する膜枠の着脱構造を示す要部拡大断面図。  FIG. 5 is an enlarged cross-sectional view of the main part showing the structure for attaching and detaching the membrane frame to the sliding ring.
[図 6]本実施形態のツル一イング部材の平面図。  FIG. 6 is a plan view of the crane member of the present embodiment.
[図 7]図 7に示したツル一イング部材の移動軌跡を示した説明図。  FIG. 7 is an explanatory view showing a movement locus of the crane member shown in FIG.
[図 8]パターン 1〜4のツル一イング部材の平面図を示した説明図。  FIG. 8 is an explanatory view showing a plan view of the crane member of patterns 1 to 4.
[図 9]パターン 1〜4のツル一イング部材の評価を示したグラフ。  FIG. 9 is a graph showing the evaluation of crane members of patterns 1 to 4.
符号の説明  Explanation of symbols
[0016] G…ガラス基板、 10…研磨装置、 12· ··コンベア、 14…膜枠、 16· ··ステージ、 18· ·· 第 1の研磨ステージ、 20…第 2の研磨ステージ、 22· "ステージ、 24· ··ガラス基板搬 出コンベア、 26…膜枠洗净ステージ、 28…膜枠乾燥ステージ、 30· ··膜枠返送コン ベア、 32· ··ロボット、 33· ··アーム、 34· ··吸着ノ ッド、 36· ··コンベア、 38· ··膜体、 40 …上枠、 42· ··下枠、 44· ··気密保持層、 46· ··強度保持層、 48…平滑層、 50· ··研磨 ヘッド、 51· ··本体ケーシング、 52· ··キャリア、 53· ··下部外周リング部、 54· ··空気室、 56···スピンドル、 58···研磨パッド、 60…研磨パッド、 62···研磨定盤、 64…回転軸、 66…研磨定盤、 68···回転軸、 70···直動ガイド、 72···ガイドレール、 74···メンテナン スステージ、 76···メンテナンスステージ、 78···吊上リング、 80···貫通孔、 82···摺動リ ング、 84···摺動リング吊具、 86···吊上用皿ばね、 88···吊上ばね、 90···貫通孔、 92 …スクリュージャッキ、 94···ストッパピン、 96···ラインシャフト、 98···噴射口、 100···空 気室、 102···エア供給路、 104···ノ レブ、 106· "エアポンプ、 108···ピン、 110· "へ ッド部、 112···フック、 114···ピン、 116···孔、 118···ストッノ板、 120···エア流路、 1 22···挟持部材、 124···挟みプレート、 126···ポール、 128···貫通孔、 130···貫通孔 、 138···コンベア、 140···ロボット、 142···アーム、 144···吸着ヘッド、 146···コンベア 、 150、 152、 154···搬送装置、 160···ガイドレール、 170···ガイドレール、 200···吸 着シート、 210···中間シート、 220···ダイヤモンド砲粒、 222…ステンレスシート(ベー スプレート)、 224···ツル一イング部材、 226···砥粒固定部 [0016] G ... Glass substrate, 10 ... Polishing device, 12 ... Conveyor, 14 ... Film frame, 16 ... Stage, 18 ... First polishing stage, 20 ... Second polishing stage, 22 ... "Stage, 24 ... Glass substrate unloading conveyor, 26 ... Membrane frame washing stage, 28 ... Membrane frame drying stage, 30 ... Membrane frame return conveyor, 32 ... Robot, 33 ... Arm, 34 ... Adsorption node, 36 ... Conveyor, 38 ... Film body, 40 ... Upper frame, 42 ... Lower frame, 44 ... Airtight holding layer, 46 ... Strength holding layer, 48 ... Smooth layer, 50 ... Polishing head, 51 ... Main body casing, 52 ... Carrier, 53 ... Lower outer ring, 54 ... Air chamber, 56 ... Spindle, 58 ... Polishing pad, 60 ... Polishing pad, 62 ... Polishing surface plate, 64 ... Rotary axis, 66 ... Polishing surface plate, 68 ... Rotary axis, 70 ... Linear motion Guide, 72 ... Guide rail, 74 ... Maintenance stage, 76 ... Maintenance stage, 78 ... Lifting ring, 80 ... Through hole, 82 ... Sliding ring, 84 ··· Sliding ring suspension, 86 · · · Belleville spring for lifting, · · · Lifting spring, 90 · · · Through hole, 92 · · · Screw jack, 94 · · · Stopper pin, ··· Line Shaft, 98 ··· Injection port, 100 ··· Air chamber, 102 ··· Air supply passage, 104 ··· Noleb, 106 · “Air pump, 108 ··· pin, 110 ·” , 112 ··· Hook, 114 ··· Pin, 116 ··· Hole, 118 ··· Stocko plate, 120 · · · Air flow path, 1 22 ··· Holding member, 124 ··· Clipping plate, 126 Pole, 128 ... Through hole, 130 ... Through hole, 138 ... Bear, 140 ··· Robot, 142 ··· Arm, 144 ··· Suction head, 146 ··· Conveyor, 150, 152, 154 ··· Transport device, 160 ··· Guide rail, 170 ··· Guide Rail, 200 ··· Adhesive sheet, 210 ··· Intermediate sheet, 220 ··· Diamond barrel, 222 ··· Stainless steel sheet (base plate), 224 ································ Fixed part
発明を実施するための最良の形態  BEST MODE FOR CARRYING OUT THE INVENTION
[0017] 以下、図面に従って本発明のツル一イング部材及びツル一イング方法の好ましい 実施形態につ!ヽて詳説する。 Hereinafter, preferred embodiments of the crane member and the crane method of the present invention will be described in detail according to the drawings.
[0018] 図 1に示す研磨装置 10は、大型の液晶ディスプレイ用ガラス基板 G (以下、単にガ ラス基板 Gという。)の片面を所望の平坦度に研磨する研磨装置である。なお、前記 ガラス基板 Gとしては、例えば、一辺が 2000mmを超え、厚さが 0.5mn!〜 1. lmm のものを適用できる。 A polishing apparatus 10 shown in FIG. 1 is a polishing apparatus that polishes one side of a large liquid crystal display glass substrate G (hereinafter simply referred to as a glass substrate G) to a desired flatness. As the glass substrate G, for example, one side exceeds 2000 mm and the thickness is 0.5 mn! ~ 1. lmm can be applied.
[0019] この研磨装置 10は、未研磨のガラス基板 Gを搬送するコンベア 12、ガラス基板 Gを 膜枠 14に貼着するステージ 16、第 1の研磨ステージ 18、第 2の研磨ステージ 20、研 磨が完了したガラス基板 Gを膜枠 14から取り外すステージ 22、ガラス基板搬出コン ベア 24、膜枠洗浄ステージ 26、膜枠乾燥ステージ 28、及び膜枠返送コンベア 30を 主要部として構成されて!ヽる。  The polishing apparatus 10 includes a conveyor 12 that conveys an unpolished glass substrate G, a stage 16 that adheres the glass substrate G to a film frame 14, a first polishing stage 18, a second polishing stage 20, and a polishing The main parts are the stage 22 for removing the polished glass substrate G from the membrane frame 14, the glass substrate carry-out conveyor 24, the membrane frame cleaning stage 26, the membrane frame drying stage 28, and the membrane frame return conveyor 30! The
[0020] また、研磨装置 10には、ステージ 16から第 1の研磨ステージ 18に膜枠 14を搬送す る搬送装置 150、第 1の研磨ステージ 18から第 2の研磨ステージ 20に膜枠 14を搬送 する搬送装置 152、及び第 2の研磨ステージ 20からステージ 22に膜枠 14を搬送す る搬送装置 154が設けられている。 [0021] コンベア 12によって搬送されてきた未研磨のガラス基板 Gは、ロボット 32のアーム 3 3に設けられた吸着パッド 34に吸着され保持される。そして、アーム 33の回転動作に よってコンベア 12からコンベア 36に移載され、コンベア 36によってステージ 16に向 けて搬送される。 In addition, the polishing apparatus 10 has a transfer apparatus 150 for transferring the film frame 14 from the stage 16 to the first polishing stage 18, and the film frame 14 from the first polishing stage 18 to the second polishing stage 20. A transfer device 152 for transferring and a transfer device 154 for transferring the film frame 14 from the second polishing stage 20 to the stage 22 are provided. The unpolished glass substrate G transported by the conveyor 12 is sucked and held by the suction pad 34 provided on the arm 33 of the robot 32. Then, it is transferred from the conveyor 12 to the conveyor 36 by the rotating operation of the arm 33, and is conveyed toward the stage 16 by the conveyor 36.
[0022] ステージ 16において、まず、ガラス基板 Gが膜枠 14に保持される。この保持方法に ついて説明すると、膜枠 14はステージ 16において、ガラス基板貼着手段である昇降 装置(図示しない)に保持されており、ガラス基板 Gが膜枠 14の下方に位置したところ で、膜枠 14が昇降装置により下降し、膜枠 14に張設された図 2の膜体 38がガラス基 板 Gに押し付けられる。  In stage 16, first, glass substrate G is held on film frame 14. This holding method will be described. The film frame 14 is held on the stage 16 by an elevating device (not shown) which is a glass substrate sticking means, and the glass substrate G is positioned below the film frame 14. The film frame 14 is lowered by the lifting device, and the film body 38 of FIG. 2 stretched on the film frame 14 is pressed against the glass substrate G.
[0023] 膜体 38の下面には、ガラス基板 Gを自己吸着する多孔質の発泡ポリウレタン製吸 着シート 200が接着されているとともに、この吸着シート 200と膜体 38との間にポリ力 ーボネイト製の中間シート 210が介在して吸着シート 200と膜体 38の両者に接着さ れている。  [0023] On the lower surface of the film body 38, a porous foamed polyurethane adsorption sheet 200 that self-adsorbs the glass substrate G is adhered, and between the adsorption sheet 200 and the film body 38, a poly force-carbonate is adhered. An intermediate sheet 210 made of metal is interposed and adhered to both the adsorbing sheet 200 and the film body 38.
[0024] ガラス基板 Gは、前述した昇降装置による押圧力によって吸着シート 200に相対的 に押し付けられ、吸着シート 200によって吸着'保持される。その後、膜枠 14が図 1の 搬送装置 150に保持されて、図 3の第 1の研磨ステージ 18に搬送され、ここでキヤリ ァ 52に取り付けられる。  [0024] The glass substrate G is relatively pressed against the suction sheet 200 by the pressing force by the lifting device described above, and is sucked and held by the suction sheet 200. Thereafter, the film frame 14 is held by the transfer device 150 of FIG. 1 and transferred to the first polishing stage 18 of FIG. 3, where it is attached to the carrier 52.
[0025] 図 2に示したように、膜枠 14は、膜体 38を上枠 40と下枠 42との間で張設した後、 上枠 40と下枠 42とをボルト(図示しない)で締結することによって構成される。なお、 膜枠 14や膜体 38は円形に限定されるものではなぐ矩形でもよい。  [0025] As shown in FIG. 2, the membrane frame 14 has a membrane body 38 stretched between the upper frame 40 and the lower frame 42, and then the upper frame 40 and the lower frame 42 are bolted (not shown). It is comprised by fastening with. The film frame 14 and the film body 38 are not limited to a circular shape, but may be a rectangular shape.
[0026] この膜体 38は図 4の如く気密保持層 44、強度保持層 46からなる二層構造に構成 されている。気密保持層 44は図 2及び図 5に示すように、その外周部がキャリア 52の 下部外周リング部 53に密着されてキャリア 52の空気室 54との間で気密を保持するシ ート材である。シート材の材料としてはゴム類、シリコン類、フッ素榭脂、塩ィ匕ビュル( PVC)等のビュル系素材、ポリアミド系素材、及びウレタン系素材等が例示される。ま た、図 4の強度保持層 46は、気密保持層 44を保持するとともに膜体 38全体を張設 する張力に耐え得る所定の引張強さを有するシート材である。また、その下面には中 間シート 210が接着されている。 [0027] 強度保持層 46の材料としては、ァラミド繊維、ステンレス製金網、スチール金網、炭 素繊維、ガラス繊維、ナイロン繊維、金属シート、榭脂シート等が挙げられる。特に、 引張力に対する伸びが極めて少な 、と 、う理由でァラミド繊維が好ま U、。 As shown in FIG. 4, the film body 38 has a two-layer structure including an airtight holding layer 44 and a strength holding layer 46. As shown in FIGS. 2 and 5, the airtight holding layer 44 is a sheet material whose outer peripheral portion is closely attached to the lower outer peripheral ring portion 53 of the carrier 52 and maintains airtightness with the air chamber 54 of the carrier 52. is there. Examples of the material of the sheet material include rubber materials, silicone materials, fluorine resin, salt materials (polyvinyl chloride), polyamide materials, urethane materials, and the like. Also, the strength holding layer 46 in FIG. 4 is a sheet material having a predetermined tensile strength that can withstand the tension that holds the airtight holding layer 44 and stretches the entire film body 38. Further, an intermediate sheet 210 is bonded to the lower surface thereof. [0027] Examples of the material for the strength retaining layer 46 include aramid fiber, stainless steel wire mesh, steel wire mesh, carbon fiber, glass fiber, nylon fiber, metal sheet, and resin sheet. In particular, aramid fibers are preferred because of their very low elongation to tensile force.
[0028] 次に、図 3に示す研磨ヘッド 50について説明する力 第 1の研磨ステージ 18の研 磨ヘッド 50及び第 2の研磨ステージ 20の研磨ヘッド 50は同一構造なので、同一の 符号を付して説明する。  Next, the force for explaining the polishing head 50 shown in FIG. 3. Since the polishing head 50 of the first polishing stage 18 and the polishing head 50 of the second polishing stage 20 have the same structure, they are given the same reference numerals. I will explain.
[0029] 研磨ヘッド 50は、本体ケーシング 51にモータが内蔵され、このモータの出力軸が、 鉛直方向に垂下されたスピンドル 56に連結されて構成される。このスピンドル 56にキ ャリア 52が連結されている。したがって、キャリア 52は自転する。また、本体ケーシン グ 51は、昇降機構 156を介してスライダ 158に連結されている。この昇降機構 156に よって本体ケーシング 51がスライダ 158に対して昇降されることにより、キャリア 52が 第 1の研磨ステージ 18の研磨パッド 58、及び第 2の研磨ステージ 20の研磨パッド 60 に対し進退移動されるとともに、膜枠 14に貼着されたガラス基板 Gを研磨パッド 58、 60に所定の研磨圧力で押圧することができる。  The polishing head 50 is configured such that a motor is built in a main body casing 51, and an output shaft of the motor is connected to a spindle 56 that is suspended in a vertical direction. A carrier 52 is connected to the spindle 56. Therefore, the carrier 52 rotates. The main body casing 51 is connected to the slider 158 via the lifting mechanism 156. The main body casing 51 is moved up and down with respect to the slider 158 by the lifting mechanism 156, so that the carrier 52 moves forward and backward with respect to the polishing pad 58 of the first polishing stage 18 and the polishing pad 60 of the second polishing stage 20. In addition, the glass substrate G adhered to the film frame 14 can be pressed against the polishing pads 58 and 60 with a predetermined polishing pressure.
[0030] 研磨パッド 58は、発泡ウレタン製であり、一体(1枚のパッド)で構成することができ ないため、複数枚 (例えば 8枚)の小サイズの研磨パッドを研磨定盤 62の上面に貼り 付けることにより大面積の研磨パッドとしている。  [0030] Since the polishing pad 58 is made of urethane foam and cannot be formed as a single piece (one pad), a plurality of (for example, eight) small-sized polishing pads are attached to the upper surface of the polishing surface plate 62. A large area polishing pad is attached to the surface.
[0031] 研磨定盤 62の下部には、モータ(図示しない)によって回転される回転軸 64が連 結される。また、研磨パッド 60は、研磨定盤 66の上面に貼り付けられ、研磨定盤 66 の下部には、モータ(図示しない)によって回転される回転軸 68が連結されている。  A rotating shaft 64 that is rotated by a motor (not shown) is connected to the lower portion of the polishing surface plate 62. The polishing pad 60 is affixed to the upper surface of the polishing surface plate 66, and a rotating shaft 68 that is rotated by a motor (not shown) is connected to the lower portion of the polishing surface plate 66.
[0032] さらに、本体ケーシング 51は、公転駆動機構(図示しない)に連結され、所定の公 転軸を中心とする公転半径で公転する機能も有している。したがって、キャリア 52は 前記公転軸を中心に公転する。なお、この公転駆動機構は、本体ケーシング 51にプ ラネタリーギア機構を内蔵し、プラネタリーギア機構の出力軸をスピンドル 56に連結 すること〖こよっても構成できる。以上が各研磨ステージ 18、 20の構成であり、これらの 研磨ステージ 18、 20によってガラス基板 Gが研磨され、ガラス基板 Gの表面の微小 な凹凸やうねりが除去される。また、研磨パッド間の境界の段差部が後述するツル一 イング部材によってあら力じめ研削除去される。 [0033] 一方、第 1の研磨ステージ 18のスライダ 158には、直動ガイド 70、 70が取り付けら れている。直動ガイド 70、 70はガイドレール 72、 72に嵌合されている。このガイドレ ール 72、 72は、図 1の如く第 1の研磨ステージ 18のスピンドル 56やキャリア 52をメン テナンスするメンテナンスステージ 74に向けて配設されて!/、る。 [0032] Further, the main casing 51 is connected to a revolution drive mechanism (not shown) and has a function of revolving around a revolution radius around a predetermined revolution axis. Accordingly, the carrier 52 revolves around the revolution axis. This revolution drive mechanism can also be configured by incorporating a planetary gear mechanism in the main body casing 51 and connecting the output shaft of the planetary gear mechanism to the spindle 56. The above is the configuration of each polishing stage 18, 20, and the glass substrate G is polished by these polishing stages 18, 20, and minute irregularities and undulations on the surface of the glass substrate G are removed. Further, the stepped portion at the boundary between the polishing pads is intensively ground and removed by a crane lining member described later. On the other hand, linear guides 70 and 70 are attached to the slider 158 of the first polishing stage 18. The linear guides 70 and 70 are fitted to guide rails 72 and 72. As shown in FIG. 1, the guide rails 72 and 72 are arranged toward the maintenance stage 74 that maintains the spindle 56 and the carrier 52 of the first polishing stage 18! /
[0034] また、図 2の如く第 2の研磨ステージ 20のスライダ 158にも同様に、直動ガイド 70、 70が取り付けられ、直動ガイド 70、 70はガイドレール 160、 160に嵌合されている。 このガイドレール 160、 160は、図 1の如く第 2の研磨ステージ 20のスピンドル 56ゃキ ャリア 52をメンテナンスするメンテナンスステージ 76に向けて配設されている。  Also, as shown in FIG. 2, linear motion guides 70 and 70 are similarly attached to the slider 158 of the second polishing stage 20, and the linear motion guides 70 and 70 are fitted to the guide rails 160 and 160. Yes. As shown in FIG. 1, the guide rails 160 and 160 are arranged toward the maintenance stage 76 for maintaining the spindle 56 and the carrier 52 of the second polishing stage 20.
[0035] キャリア 52は、図 2の如くキャリア 52の上部外周部に吊上リング 78がボルト(図示し ない)によって固定されている。吊上リング 78のキャリア 52の外周部力も突出したフラ ンジ部には、貫通孔 80、 80…が同心円上で等間隔に複数個形成され、これらの貫 通孔 80、 80· ··に、摺動リング 82の上面に突設された摺動リング吊具 84が図 5の如く 下方から貫通される。また、摺動リング吊具 84は、吊上リング 78と吊上用皿ばね 86と の間に配置された吊上ばね 88に貫通されるとともに、吊上用皿ばね 86の貫通孔 90 に貫通され、スクリュージャッキ 92に連結されている。  In the carrier 52, a lifting ring 78 is fixed to the upper outer peripheral portion of the carrier 52 with bolts (not shown) as shown in FIG. A plurality of through holes 80, 80 ... are formed at equal intervals on a concentric circle in the flange portion where the outer peripheral force of the carrier 52 of the lifting ring 78 also protrudes, and these through holes 80, 80,. As shown in FIG. 5, a sliding ring hanger 84 projecting from the upper surface of the sliding ring 82 is penetrated from below. Further, the sliding ring suspension 84 is penetrated by a lifting spring 88 disposed between the lifting ring 78 and the lifting disc spring 86 and penetrates through the through hole 90 of the lifting disc spring 86. And connected to a screw jack 92.
[0036] したがって、スクリュージャッキ 92を動作させ、摺動リング吊具 84を吊上ばね 88の 付勢力に抗して上方に引き上げると、摺動リング 82がキャリア 52に対して引き上げら れる。これにより、摺動リング 82に着脱自在に取り付けられた膜枠 14が引き上げられ て、膜体 38に所定の張力が付与される。  Therefore, when the screw jack 92 is operated and the sliding ring suspension 84 is pulled upward against the urging force of the lifting spring 88, the sliding ring 82 is pulled up with respect to the carrier 52. Thereby, the membrane frame 14 detachably attached to the sliding ring 82 is pulled up, and a predetermined tension is applied to the membrane body 38.
[0037] 張力付与の自動化に際しては、膜枠 14と膜体 38とを複数個用意し運用する。しか し、膜枠 14に対して膜体 38の初期張力には個体差があることが考えられること、また 使用時間の違いにより、複数存在する膜体 38、 38· ··の初期張力の違いから、いかな る張力個体差を有する膜体 38にも同等の使用張力を付与することは難しい。また、 膜体 38に過張力が力かってしまうと膜体 38や周辺機器の破損にもつながる危険が ある。これを解決するために、吊上ばね 88の収縮量(吊上リング 78と吊上用皿ばね 8 6との間隔)を監視する。すなわち、スクリュージャッキ 92の引き上げ量だけではなぐ 実際に膜体 38に付与される張力を吊上ばね 88の縮み量を監視することで測るもの である。この吊上ばね 88を有することで、膜体 38に一定張力が力かるようにすること と、膜体 38に過張力が力かることの防止とを同時に解決することができる。 In automating the application of tension, a plurality of film frames 14 and film bodies 38 are prepared and operated. However, there may be individual differences in the initial tension of the film body 38 with respect to the film frame 14, and the difference in the initial tension between the multiple film bodies 38, 38 ... Therefore, it is difficult to give the same working tension to the film body 38 having any individual difference in tension. Further, if excessive tension is applied to the film body 38, the film body 38 and peripheral devices may be damaged. In order to solve this, the amount of contraction of the lifting spring 88 (the distance between the lifting ring 78 and the lifting disc spring 86) is monitored. That is, the tension actually applied to the film body 38 is measured by monitoring the amount of contraction of the lifting spring 88 in addition to the amount of lifting of the screw jack 92 alone. By having this lifting spring 88, a certain tension is applied to the membrane 38. And the prevention of excessive tension applied to the film body 38 can be solved at the same time.
なお、一定張力にするために、吊上ばね 88の縮み量の測定が必要となる力 その 一つの手段として、スクリュージャッキ 92にラインシャフト 96を介して連結されたモー タ(図示しない)の電流値からトルクを算出し、スクリュージャッキ 92の吊上力を間接 的に取得し、これを管理することで膜体 38に付与される張力を監視することができる 。ラインシャフト 96は、前記モータの駆動力をスクリュージャッキ 92に伝達するシャフ トである。また、符号 94は、吊上リング 78と吊上用皿ばね 86との間に生じている吊上 ばね 88の反力を受けておくためのストッパピンである。  Note that the force required to measure the amount of contraction of the suspension spring 88 in order to maintain a constant tension. As one means, the current of a motor (not shown) connected to the screw jack 92 via the line shaft 96 is used. By calculating the torque from the value, indirectly acquiring the lifting force of the screw jack 92, and managing this, the tension applied to the film body 38 can be monitored. The line shaft 96 is a shaft that transmits the driving force of the motor to the screw jack 92. Reference numeral 94 is a stopper pin for receiving the reaction force of the lifting spring 88 generated between the lifting ring 78 and the lifting disc spring 86.
[0038] キャリア 52には、図 5の空気室 54に加圧流体である圧縮エアを噴出する噴射口 98 、 98· ··が複数形成される。これらの噴射口 98、 98· ··は、キャリア 52の上面に形成さ れた空気室 100を介して、図 3上で破線で示すエア供給路 102に連通される。エア 供給路 102は、研磨ヘッド 50に取り付けられたロータリジョイント(図示しない)を介し て研磨ヘッド 50の外部に延設され、バルブ 104を介してエアポンプ 106に接続され ている。したがって、バルブ 104を開放すると、エアポンプ 106からの圧縮エアがエア 供給路 102、空気室 100、及び噴射口 98を介して空気室 54に供給される。これによ り、圧縮エアの圧力が膜体 38を介してガラス基板 Gに伝達され、この圧力によってガ ラス基板 Gの全面が研磨パッド 58、 60に均一な圧力で押し付けられて研磨される。  In the carrier 52, a plurality of injection ports 98, 98... For discharging compressed air that is a pressurized fluid is formed in the air chamber 54 of FIG. These injection ports 98, 98... Communicate with an air supply path 102 indicated by a broken line in FIG. 3 via an air chamber 100 formed on the upper surface of the carrier 52. The air supply path 102 extends outside the polishing head 50 via a rotary joint (not shown) attached to the polishing head 50, and is connected to the air pump 106 via a valve 104. Therefore, when the valve 104 is opened, compressed air from the air pump 106 is supplied to the air chamber 54 via the air supply path 102, the air chamber 100, and the injection port 98. Thereby, the pressure of the compressed air is transmitted to the glass substrate G through the film body 38, and the entire surface of the glass substrate G is pressed against the polishing pads 58 and 60 with a uniform pressure by this pressure and polished.
[0039] 一方、図 2の如く膜枠 14の上枠 40には、複数のピン 108、 108· ··が同心円上で等 間隔に突設され、これらのピン 108の上端部に形成された、図 5に示す大径のヘッド 部 110が、摺動リング 82の下部に固定されたフック 112に係合されることにより、膜枠 14が摺動リング 82に取り付けられる。ヘッド部 110とフック 112との係合力は、スクリュ 一ジャッキ 92によって膜体 38を張り上げた時の膜体 38の反力によって強固になり、 研磨時に膜体 38から受ける研磨抵抗ではフック 112からヘッド部 110が外れな 、。  On the other hand, as shown in FIG. 2, the upper frame 40 of the membrane frame 14 is provided with a plurality of pins 108, 108... Protruding at equal intervals on a concentric circle and formed at the upper ends of these pins 108. The membrane frame 14 is attached to the sliding ring 82 by engaging the large-diameter head portion 110 shown in FIG. The engagement force between the head part 110 and the hook 112 is strengthened by the reaction force of the film body 38 when the film body 38 is lifted by the screw jack 92, and the polishing resistance received from the film body 38 during polishing causes the head from the hook 112 to Part 110 is not off.
[0040] 図 1に示した第 2の研磨ステージ 20でガラス基板 Gの研磨が終了すると、ここで膜 枠 14がキャリア 52から取り外されて搬送装置 154によりステージ 22に搬送される。 キャリア 52から膜枠 14を取り外す方法は、まず、図 5に示したスクリュージャッキ 92を 緩める方向に動作させ、膜体 38の張力を解消する。次に、キャリア 52に対して膜枠 1 4を所定角度回動させてフック 112からヘッド部 110を取り外す。これにより、キャリア 52から膜枠 14が取り外される。 When the polishing of the glass substrate G is completed at the second polishing stage 20 shown in FIG. 1, the film frame 14 is removed from the carrier 52 and transferred to the stage 22 by the transfer device 154. In order to remove the membrane frame 14 from the carrier 52, first, the screw jack 92 shown in FIG. Next, the film frame 14 is rotated by a predetermined angle with respect to the carrier 52 to remove the head portion 110 from the hook 112. This allows the carrier The membrane frame 14 is removed from 52.
[0041] 図 1に示したステージ 22では、搬送装置 154で搬送されてきた膜枠 14から、研磨 が終了したガラス基板 Gを取り外す。取り外されたガラス基板 Gは、コンベア 138によ つて搬送され、そして、ロボット 140のアーム 142に取り付けられた吸着ヘッド 144に 吸着され、ロボット 140の動作によってガラス基板搬出用コンベア 24に移載され、研 磨装置 10の外部に搬出される。  In the stage 22 shown in FIG. 1, the glass substrate G that has been polished is removed from the film frame 14 that has been transported by the transport device 154. The removed glass substrate G is conveyed by the conveyor 138, and is adsorbed by the adsorption head 144 attached to the arm 142 of the robot 140, and transferred to the glass substrate carry-out conveyor 24 by the operation of the robot 140. It is carried out of the polishing apparatus 10.
[0042] ガラス基板 Gが取り外された膜枠 14はコンベア 146によって膜枠洗浄ステージ 26 に搬送され、ここで水により洗浄される。洗浄が終了した膜枠 14は、コンベア 148に よって膜枠乾燥ステージ 28に搬送され、ここで加熱されて乾燥される。そして、乾燥 が終了した膜枠 14は、膜枠返送コンベア 30によってステージ 16に搬送され、ガラス 基板 Gの貼着に再使用される。以上が研磨装置 10の全体構成である。  [0042] The film frame 14 from which the glass substrate G has been removed is conveyed to the film frame cleaning stage 26 by the conveyor 146, where it is cleaned with water. The membrane frame 14 that has been cleaned is conveyed to the membrane frame drying stage 28 by the conveyor 148, where it is heated and dried. Then, the dried film frame 14 is transported to the stage 16 by the film frame return conveyor 30 and reused for adhering the glass substrate G. The above is the overall configuration of the polishing apparatus 10.
[0043] 一方、研磨パッド 58、 60に対しては、前述した段差部の研削 ·除去及び所定枚数 処理後の表層の微小うねりの除去のために、使用前にツル一イング (形状修正)が施 される。なお、ツル一イングとは、使用前及び所定枚数研磨後の研磨パッドに対し、 その表層に生じた微小うねり、凹凸、段差等を研肖! 除去する処理のことをいう。この ため、研磨装置 10にはツル一イング部材が組み込まれている。ツル一イング部材は 、研磨パッドの研磨面の基準になるため高精度が要求される。  [0043] On the other hand, the polishing pads 58 and 60 are subjected to tooling (shape correction) before use in order to grind and remove the above-described stepped portions and to remove micro-waviness on the surface layer after processing a predetermined number of sheets. Applied. Note that the tooling is designed to reinforce the surface of the polishing pad before use and after polishing a predetermined number of undulations, irregularities, and steps! This refers to the process to be removed. For this reason, a grinding member is incorporated in the polishing apparatus 10. Since the crane member serves as a reference for the polishing surface of the polishing pad, high precision is required.
[0044] 本実施形態のツル一イング部材を図 6に示す。本実施形態では、ベースプレートと してのステンレスシート 222にダイヤモンド砲粒 220が電着された砲粒固定部を有す る矩形のツル一イング部材 224を取り付けることでツル一イングを実施する。すなわ ち、ガラス基板 Gの研磨の際と同様に、膜枠 14の吸着シート 200に取り付けられたッ ルーイング部材 224を加圧流体である圧縮エアによって均一に加圧し、円形の研磨 ノ ッド 58、 60に押し付けながら、ツル一イング部材 224を回転(自転)させるとともに 公転させ、且つ研磨パッド 58、 60を回転させることにより研磨パッド 58、 60のツル一 イングを行う。なお、このツル一イング部材は、ガラス基板 Gと略同一の形状を有して 、ることが好まし!/、。  [0044] FIG. 6 shows a crane member of the present embodiment. In the present embodiment, the tooling is carried out by attaching a rectangular tooling member 224 having a barrel fixing part in which diamond barrels 220 are electrodeposited to a stainless steel sheet 222 as a base plate. That is, similarly to the polishing of the glass substrate G, the rounding member 224 attached to the adsorption sheet 200 of the film frame 14 is uniformly pressurized with compressed air, which is a pressurized fluid, to form a circular polishing node. While pressing against the belts 58 and 60, the crane pad 224 is rotated (revolved) and revolved, and the polishing pads 58 and 60 are rotated to rotate the polishing pads 58 and 60. It is preferable that the vine member has substantially the same shape as the glass substrate G!
[0045] 前述のように、ツル一イング部材による研磨パッドの研削量は、研磨パッドと砲粒の 接触時間に比例する。したがって、ベースプレートの全面にダイヤモンド砲粒が電着 された従来のツル一イング部材の場合、研磨パッドの周部は、相対的な公転運動に より砲粒との接触が間欠的であるため常時研削されることはない。しかし、研磨パッド の中央部はツル一イング部材に常時接触して 、るため、相対的な回転及び公転運 動により研磨パッドの中央部分は常時研削される。その結果、研磨パッドは周部より も中央部が多く削られる。 [0045] As described above, the grinding amount of the polishing pad by the crane member is proportional to the contact time between the polishing pad and the gunshot particles. Therefore, diamond particles are electrodeposited on the entire surface of the base plate. In the case of the conventional vine member, the peripheral portion of the polishing pad is not always ground because the contact with the barrel is intermittent due to the relative revolving motion. However, since the central portion of the polishing pad is always in contact with the crane member, the central portion of the polishing pad is always ground by relative rotation and revolution. As a result, the polishing pad is shaved more in the center than in the periphery.
[0046] 一方、小サイズの研磨パッドが貼り合わされて構成された実施の形態の大面積の 研磨パッド 58、 60の場合、前述のように、研磨パッド 58、 60の中央部に存在する段 差部は既に研削除去されているにもかかわらず、研磨パッド 58、 60の周部の段差部 が除去されて ヽな 、ためにツル一イング処理を継続しなければならな 、。その結果、 研磨パッド 58、 60の周部の段差部を研削するために、研磨パッド 58、 60の中央部を 余計に削らなければならないという問題があった。それ故に、研磨パッド 58、 60の段 差部を全て研肖 Ι』·除去したときの研磨パッド 58、 60の総研削量が多くなり、研磨パッ ド 58、 60の使用寿命が無意味に短くなつていた。  [0046] On the other hand, in the case of the large-area polishing pads 58 and 60 of the embodiment configured by bonding the small-sized polishing pads, as described above, the difference existing in the center part of the polishing pads 58 and 60 is provided. Even though the part has already been removed by grinding, the stepped part on the periphery of the polishing pads 58 and 60 must be removed, so that the tooling process must be continued. As a result, in order to grind the stepped portion around the periphery of the polishing pads 58, 60, there was a problem that the central portions of the polishing pads 58, 60 had to be further cut. Therefore, all the stepped parts of the polishing pads 58 and 60 are sharpened. ”・ The total grinding amount of the polishing pads 58 and 60 when removed is increased, and the service life of the polishing pads 58 and 60 is meaninglessly shortened. It was summer.
[0047] これに対し、図 6に示すように、本実施形態のツル一イング部材 224は、ベースプレ ートとしてのステンレスシート 222が矩形状に形成され、ダイヤモンド砲粒 220を電着 して形成された一対の砲粒固定部 226、 226力 ステンレスシート 222の対角線上に ステンレスシート 222の中心 Oに向力つて細くなる楔形状に形成されている。また、ス テンレスシート 222は、サイズの制約によって一体 (一つの部品)で構成することがで きないため、本実施形態では小サイズの 9枚のステンレスシート(ベースプレート) A〜 Iを接合することにより構成し、ステンレスシート A、 E及び Iにダイヤモンド砥粒 220を 固定 (電着)して砲粒固定部を設けている。なお、本実施形態のツル一イング部材 22 4は、砲粒固定部 226、 226をステンレスシート 222の中心 Oを挟んで一つの対角線 上に一対形成した力 もう一つの対角線上に沿ってさらに一対配置してもよい。  [0047] On the other hand, as shown in FIG. 6, the vine member 224 of the present embodiment is formed by forming a stainless steel sheet 222 as a base plate into a rectangular shape and electrodepositing diamond barrels 220. The pair of barrel fixing parts 226, 226 force formed on the diagonal line of the stainless steel sheet 222 are formed in a wedge shape that narrows toward the center O of the stainless steel sheet 222. In addition, since the stainless steel sheet 222 cannot be configured as a single piece (single part) due to size restrictions, nine stainless sheets (base plates) A to I of small size are joined in this embodiment. The diamond abrasive grains 220 are fixed (electrodeposited) to the stainless steel sheets A, E, and I to provide the barrel fixing part. In this embodiment, the temple fixing member 224 has a pair of forces formed on one diagonal along the center O of the stainless steel sheet 222 with the barrel fixing parts 226, 226 further along the other diagonal. You may arrange.
[0048] このように構成されたツル一イング部材 224によれば、図 7の如ぐツル一イング部材 224と研磨パッド 58、 60とを相対的に回転及び公転させながらツル一イング部材 22 4を研磨パッド 58、 60に押し付けることにより、ツル一イング部材 224が接触する研磨 ノッド 58、 60の全面(符号 228で示す円内)において、研磨パッド 58、 60と砲粒固 定部 226間の接触時間が等しくなる。したがって、研磨パッド 58、 60の全面を均一に 研削することができ、研磨パッド 58、 60の中央部の削り過ぎを防止できる。 [0048] According to the temple member 224 configured as above, the temple member 22 4 while rotating and revolving the crane member 224 and the polishing pads 58, 60 relatively as shown in FIG. Is pressed against the polishing pads 58 and 60, so that the entire surface of the polishing nodes 58 and 60 (inside the circle indicated by reference numeral 228) with which the temple member 224 comes into contact is disposed between the polishing pads 58 and 60 and the barrel fixing part 226. Contact time is equal. Therefore, the entire surface of the polishing pad 58, 60 should be uniform. It is possible to grind and prevent the center portion of the polishing pads 58 and 60 from being excessively shaved.
[0049] したがって、本実施形態のツル一イング部材 224を使用することにより、複数枚の 小さな研磨パッドが貼り合わされて構成された研磨パッド 58、 60を効率よく効果的に ツル一イングすることができる。  Therefore, by using the temple member 224 of the present embodiment, it is possible to efficiently and effectively tool the polishing pads 58 and 60 formed by bonding a plurality of small polishing pads. it can.
[0050] 次に、図 8、図 9を参照して本実施形態のツル一イング部材 224による研削量と、他 のツル一イング部材による研削量を比較した結果を説明する。  [0050] Next, the results of comparison between the grinding amount by the temple member 224 of the present embodiment and the grinding amount by another temple member will be described with reference to Figs.
[0051] まず、図 8に示したパターン(pattern) 1〜4のツル一イング部材について説明する。  First, the crane members having the patterns 1 to 4 shown in FIG. 8 will be described.
パターン 1は、矩形のベースプレート(金属シート)の全面にダイヤモンド砲粒が電着 形成された従来のツル一イング部材である。パターン 2は、矩形のベースプレート(金 属シート)の対角線上に、砲粒固定部が帯状となるようにダイヤモンド砲粒を電着した ツル一イング部材である。パターン 3は、矩形のベースプレート(金属シート)の対角 線上に、前記ベースプレートの中心に向かって細くなる形状である力 前記ベースプ レートの中心において砲粒固定部が所定の幅を有するようにダイヤモンド砲粒を電 着したツル一イング部材である。なお、パターン 3のツル一イング部材は、砲粒固定 部の輪郭線上の一部がベースプレート (金属シート)の中心点上に位置しないため、 本発明のツル一イング部材には該当しない。パターン 4は、矩形状ベースプレート( 金属シート)の対角線上に、前記ベースプレート(金属シート)の中心に向かって細く なる楔形状 (先鋭状)となるようにダイヤモンド砥粒を電着した本実施形態のツルーィ ング部材 224である。  Pattern 1 is a conventional templed member in which diamond particles are electrodeposited on the entire surface of a rectangular base plate (metal sheet). Pattern 2 is a tooling member in which diamond barrels are electrodeposited on a diagonal line of a rectangular base plate (metal sheet) so that the barrel fixing portions are strip-shaped. Pattern 3 is a force that has a shape narrowing toward the center of the base plate on a diagonal line of a rectangular base plate (metal sheet), and the diamond cannon is fixed to have a predetermined width at the center of the base plate. A vine member with electrodeposited grains. The crane member of pattern 3 does not correspond to the crane member of the present invention because a part of the contour line of the barrel fixing part is not located on the center point of the base plate (metal sheet). Pattern 4 is an electrode of this embodiment in which diamond abrasive grains are electrodeposited on a diagonal line of a rectangular base plate (metal sheet) so as to have a wedge shape (sharp shape) that narrows toward the center of the base plate (metal sheet). A truing member 224.
なお、本発明のツル一イング部材は砲粒固定部の実質的な有効面積が例示のパ ターン 4と同じようになればよ!、ので、例えばパターン 3のツル一イング部材にお!/、て 砲粒固定部に切欠き部を設け、該切欠き部の形状や分布密度を変えることにより、こ の切欠き部を除いて得られる砲粒固定部をパターン 4と同じようにすることができる。 このようなツル一イング部材も本発明は包含する。  It should be noted that the crane member of the present invention should have a substantial effective area of the barrel fixing portion that is the same as the pattern 4 shown in the example! By providing a cutout in the barrel fixing part and changing the shape and distribution density of the cutout, it is possible to make the barrel fixing part obtained by removing this notch the same as pattern 4. it can. Such a crane member also includes the present invention.
[0052] 図 9は、パターン 1〜4のツル一イング部材によって研磨パッドを研削したときの研 削量比を示したグラフであり、横軸に研磨パッド中央力 の位置 (mm)が示され、縦 軸に研削量比が示されている。  [0052] Fig. 9 is a graph showing the polishing amount ratio when the polishing pad is ground by the truing members of patterns 1 to 4, and the horizontal axis indicates the position (mm) of the polishing pad central force. The grinding ratio is shown on the vertical axis.
[0053] なお、図 9のグラフは、 (1) ツル一イング部材全体に付与される圧力が均一であるものとし、研削量は研磨 ノ ッドとツル一イング部材との間の相対速度に比例するものとすること、及び [0053] The graph of FIG. (1) The pressure applied to the entire temple member shall be uniform, and the grinding amount shall be proportional to the relative speed between the polishing node and the temple member; and
(2) 相対的な揺動動作も無視するものとすること、  (2) Relative swinging motion shall be ignored.
を前提条件として作成した。  Was created as a prerequisite.
[0054] また、計算方法の手順の概略は、  [0054] The outline of the procedure of the calculation method is as follows.
(A) ツル一イング部材の中心を原点として X—Y軸をとり、同様に研磨パッドの中心 を原点として X,一 Y'軸をとる。  (A) Take the X–Y axis from the center of the clawing member as the origin, and similarly take the X and Y ′ axes from the center of the polishing pad as the origin.
(B) ツル一イング部材が角速度 ωで公転し、同時にツル一イング部材が角速度 W で自転運動したときの時刻 tにおける研磨パッドの任意の点 (χ'、 y' )力 ツル一イン グ部材のどの位置と一致する力を計算する。  (B) Any point (χ ', y') force on the polishing pad at time t when the crane member revolves at the angular velocity ω and the crane member rotates at the angular velocity W at the same time. Calculate the force that matches the throat position.
(C) ツル一イング部材の前記位置に砥粒固定部が存在するか否かを判断し、砥粒 固定部が存在して 、なければ、研磨パッドの研削量をゼロとする。  (C) It is determined whether or not an abrasive grain fixing portion exists at the position of the crane member. If there is no abrasive grain fixing portion, the grinding amount of the polishing pad is set to zero.
(D) ツル一イング部材の前記位置に砲粒固定部が存在すればその時刻 tにおける 研磨パッドとツル一イング部材との間の相対速度を計算する。  (D) If there is a barrel fixing part at the position of the temple member, the relative speed between the polishing pad and the temple member at the time t is calculated.
(E) ツル一イング時間 Tの間で研磨パッド上の任意の点(χ'、 y' )上に砲石が存在 する時の相対速度を積算し、その位置での研削量比とする。  (E) Accumulate the relative speed when the turret is on any point (χ ', y') on the polishing pad during the crushing time T, and obtain the grinding amount ratio at that position.
というものである。  That's it.
上記 (A)〜 (E)の条件により算出された研削量比が図 9に示されている。  FIG. 9 shows the grinding amount ratio calculated under the above conditions (A) to (E).
[0055] 図 9によれば、パターン 1のツル一イング部材においては、研磨パッドの中央部の 研磨量が周部の研磨量と比較して圧倒的に多 、ため全ての段差を研削 ·除去するた めには総研削量が増加することが判明した。また、ノターン 2、 3のツル一イング部材 では、パターン 1のツル一イング部材と比較して総研削量は減少するものの、研磨パ ッドの中央部の研削量が他の部分の研削量と比較して明らかに増えるため研磨パッ ドの長寿命化を図ることはできない。 [0055] According to FIG. 9, in the pattern 1 crane member, the polishing amount in the central portion of the polishing pad is overwhelmingly larger than the polishing amount in the peripheral portion, so all steps are ground and removed. In order to do so, it was found that the total grinding amount increased. In addition, although the total grinding amount of the non-turn 2 and 3 crane members is smaller than that of the pattern 1 crane member, the grinding amount in the center of the polishing pad is different from the grinding amount in other parts. The life of the polishing pad cannot be extended because it clearly increases in comparison.
[0056] これに対してパターン 4のツル一イング部材 224は、研磨パッドの全面においてほ ぼ均一に研削することができるので、最低限の研削量で研磨パッドの段差を研削 ·除 去できることが判明した。 [0056] On the other hand, the tooling member 224 of the pattern 4 can grind almost uniformly on the entire surface of the polishing pad, so that the step of the polishing pad can be ground and removed with a minimum amount of grinding. found.
[0057] 以上により、本実施形態のツル一イング部材 224によれば、複数枚の小さな研磨パ ッドが貼り合わされて構成された研磨パッド 58、 60を効率よく効果的にツル一イング することができる。 [0057] As described above, according to the crane member 224 of the present embodiment, a plurality of small polishing pads are used. The polishing pads 58 and 60 formed by adhering the pads can be efficiently and effectively tooled.
産業上の利用可能性 Industrial applicability
本発明の研磨パッド用ツル一イング部材は、板ガラス、特にディスプレイ用ガラス基 板を研磨する研磨装置の研磨パッド (研磨部材)の形状を修正 (最適化)するのに好 適である。 なお、 2005年 10月 14日に出願された日本特許出願 2005— 300287号の明細書 、特許請求の範囲、図面及び要約書の全内容をここに引用し、本発明の明細書の開 示として、取り入れるものである。  The temple member for polishing pad of the present invention is suitable for correcting (optimizing) the shape of a polishing pad (polishing member) of a polishing apparatus for polishing plate glass, particularly a display glass substrate. It should be noted that the entire contents of the specification, claims, drawings and abstract of Japanese Patent Application No. 2005-300287 filed on October 14, 2005 are cited here as disclosure of the specification of the present invention. Incorporate.

Claims

請求の範囲 The scope of the claims
[1] ベースプレート上に、砲粒が固定されて形成された砲粒固定部を有する研磨パッド 用ツル一イング部材にお 、て、  [1] On a polishing pad crane member having a barrel fixed portion formed by fixing barrels on a base plate,
前記砲粒固定部が、前記ベースプレートの中心を通る直線上に位置し、かつ前記 ベースプレートの中心に向かって細くなる楔形状であり、  The barrel fixing part is located on a straight line passing through the center of the base plate, and has a wedge shape that narrows toward the center of the base plate,
前記砲粒固定部の輪郭線上の一部力 前記ベースプレートの中心点上に位置す るように複数設けられて 、ることを特徴とする研磨パッド用ツル一イング部材。  A polishing pad crane member, wherein a plurality of partial forces on the contour line of the barrel fixing portion are provided so as to be positioned on a center point of the base plate.
[2] 前記ベースプレートが矩形であり、  [2] The base plate is rectangular,
前記砲粒固定部が、前記ベースプレートの対角線上に位置し、かつ前記ベースプ レートの中心に向かって細くなる楔形状であり、前記ベースプレートの中心点を挟ん で少なくとも一対配置されて 、ることを特徴とする請求項 1に記載の研磨パッド用ツル 一イング部材。  The barrel fixing parts are in a wedge shape that is located on a diagonal line of the base plate and narrows toward the center of the base plate, and at least one pair is arranged across the center point of the base plate. The vine member for a polishing pad according to claim 1.
[3] 前記ベースプレートが、複数の平板を接合して構成されていることを特徴とする請 求項 1又は 2に記載の研磨パッド用ツル一イング部材。  [3] The polishing pad crane member according to claim 1 or 2, wherein the base plate is configured by joining a plurality of flat plates.
[4] 請求項 1〜3の 、ずれか 1項に記載の研磨パッド用ツル一イング部材を用い、該ッ ルーイング部材を回転及び公転させながら研磨パッドに押し付け、該研磨パッドの形 状を修正することを特徴とする研磨パッドのツル一イング方法。 [4] The polishing pad crane member according to any one of claims 1 to 3, wherein the polishing pad is pressed against the polishing pad while rotating and revolving, thereby correcting the shape of the polishing pad. A method for clawing a polishing pad, comprising:
[5] 前記ツル一イング部材をガラス基板用の吸着シートに吸着保持させて研磨パッドに 押し付けることを特徴とする請求項 4に記載の研磨パッドのツル一イング方法。 5. The polishing pad tooling method according to claim 4, wherein the crane member is sucked and held on a glass substrate suction sheet and pressed against the polishing pad.
PCT/JP2006/317896 2005-10-14 2006-09-08 Truing member for abrasive pad and truing method of abrasive pad WO2007043263A1 (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102267095A (en) * 2011-08-26 2011-12-07 湖南宇环同心数控机床有限公司 Method for monitoring and dressing grinding wheel on line

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60217062A (en) * 1985-02-28 1985-10-30 Kanebo Ltd Surface polishing device
JPH1034519A (en) * 1996-07-18 1998-02-10 Nippon Steel Corp Dresser of polishing cloth for semiconductor substrate
JP2000176828A (en) * 1998-12-15 2000-06-27 Topcon Corp Polishing tool for optical member, and pitch segment used for polishing tool, and forming mold of pitch segment
JP2000326235A (en) * 1999-05-17 2000-11-28 Inst Of Physical & Chemical Res Grinding wheel for elid and surface grinding machine therewith
JP2001293651A (en) * 2000-04-17 2001-10-23 Asahi Glass Co Ltd Polishing device of plate-like body
JP2004122351A (en) * 2002-07-31 2004-04-22 Asahi Glass Co Ltd Method and device for polishing substrate

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH031172Y2 (en) * 1985-05-16 1991-01-16
JPH0639054B2 (en) * 1988-11-25 1994-05-25 富士産機株式会社 Grinding wheel dressing device for parallel plane honing grinder and vertical double-side grinder
JP2000135675A (en) * 1998-10-28 2000-05-16 Okamoto Machine Tool Works Ltd Grinding device
JP2003094330A (en) * 2001-09-20 2003-04-03 Micron Seimitsu Kk Dressing method and device
US6951509B1 (en) * 2004-03-09 2005-10-04 3M Innovative Properties Company Undulated pad conditioner and method of using same

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60217062A (en) * 1985-02-28 1985-10-30 Kanebo Ltd Surface polishing device
JPH1034519A (en) * 1996-07-18 1998-02-10 Nippon Steel Corp Dresser of polishing cloth for semiconductor substrate
JP2000176828A (en) * 1998-12-15 2000-06-27 Topcon Corp Polishing tool for optical member, and pitch segment used for polishing tool, and forming mold of pitch segment
JP2000326235A (en) * 1999-05-17 2000-11-28 Inst Of Physical & Chemical Res Grinding wheel for elid and surface grinding machine therewith
JP2001293651A (en) * 2000-04-17 2001-10-23 Asahi Glass Co Ltd Polishing device of plate-like body
JP2004122351A (en) * 2002-07-31 2004-04-22 Asahi Glass Co Ltd Method and device for polishing substrate

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102267095A (en) * 2011-08-26 2011-12-07 湖南宇环同心数控机床有限公司 Method for monitoring and dressing grinding wheel on line

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