WO2005121814A1 - Analyseur logique et procede d'analyse de donnees de forme d'onde - Google Patents

Analyseur logique et procede d'analyse de donnees de forme d'onde Download PDF

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Publication number
WO2005121814A1
WO2005121814A1 PCT/US2004/015583 US2004015583W WO2005121814A1 WO 2005121814 A1 WO2005121814 A1 WO 2005121814A1 US 2004015583 W US2004015583 W US 2004015583W WO 2005121814 A1 WO2005121814 A1 WO 2005121814A1
Authority
WO
WIPO (PCT)
Prior art keywords
waveform
waveform data
display
logic analyzer
display mode
Prior art date
Application number
PCT/US2004/015583
Other languages
English (en)
Inventor
Ming-Kuo Cheng
Chiu-Hao Cheng
Chun-Feng Tseng
Hung-Ye Chang
Original Assignee
Zeroplus Technology Co., Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeroplus Technology Co., Ltd. filed Critical Zeroplus Technology Co., Ltd.
Priority to PCT/US2004/015583 priority Critical patent/WO2005121814A1/fr
Publication of WO2005121814A1 publication Critical patent/WO2005121814A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3177—Testing of logic operation, e.g. by logic analysers

Definitions

  • waveform observation modes such as, 3D display mode, up/down
  • FIG. 1A is a view of a circuit layout of a logic analyzer according to an
  • Fig. 2 is an operation flowchart of a logic analyzer according to an
  • Fig. 3 is an operation flowchart of a logic analyzer in a 3D display mode
  • FIG. 8 is a view of a control window of a logic analyzer according to an
  • Fig. 9D is a view of a waveform data displayed in an up-left/down-right
  • Fig. 9E is a view of a waveform data displayed in an up-right/down-left
  • FIG. 1A a circuit layout of a logic analyzer according to an
  • the logic analyzer 10 comprises at least a
  • the control circuit 11 is connected to a test
  • up/down display mode up-left/down-right display mode, up-right/down-left display
  • FIG. IB a circuit layout of a logic analyzer according to
  • control circuit 11 is connected to the test object 40 using a suitable tool (not shown) for
  • the control circuit 11 is adapted for transmitting the data stored in the
  • control circuit 11 of the logic analyzer 10 retrieves the waveform data
  • the waveform data can be zoomed in and synchronizing display mode
  • step 100 the logic analyzer 10 is turned on.
  • step 101 a channel or a waveform display mode is selected in the channel display
  • the display mode for example, two different display modes, such as a
  • the observation mode for example, five different display modes, such as
  • 3D display mode up/down display mode, up-left/down-right display mode, up-
  • logic analyzer 10 is selected, the operation proceeds as follows, which can be described
  • step 200 the operation procedure starts.
  • step 201 the test signal is input.
  • step 202 waveform data plotted along X and Y-axis, is retrieved and stored into
  • step 203 result of the 3D display mode is transmitted to the sub-waveform display
  • step 204 whether or not the result is stored in a file is determined. If yes, the
  • step 206 operation proceeds to step 206, if not, operation proceeds to step 205.
  • step 205 whether or not to print the resulting waveform data is determined. If yes,
  • step 207 the operation proceeds to step 207, if not, the operation proceeds to step 208.
  • step 206 the resulting waveform data is stored in the file.
  • step 207 the resulting waveform data is printed.
  • step 208 the operation procedure ends.
  • the resulted waveform is displayed in the sub-waveform display area 54, as
  • the user can rotate the angle of the 3D waveform, or choose to zoom
  • step 302 the test signal is input, when the down-up display mode is selected, the
  • step 303 when up-down display mode is selected, the
  • step 305 the operation proceeds to step 305.
  • step 304 the retrieved waveform data is stored to the buffer 14 and the waveform
  • step 305 the operation proceeds to step 305.
  • step 305 the above resulting waveform data analyzed in the up/down display mode
  • step 306 whether the resulting waveform data is stored in a file is determined. If
  • step 307 whether or not to print the resulting waveform data is determined. If yes,
  • step 309 the resulting waveform data is printed out.
  • step 310 the operation procedure ends.
  • the waveform data can be analyzed in a up/down display
  • the waveform display mode 102 to zoom in or synchronize the display, and the waveform
  • observation mode 103 such as 3D display mode, up/down display mode, up-left/down-
  • step 400 the operation procedure starts.
  • step 401 one of the two display modes, down-right to up-left display mode or
  • step 402 the test signal is input, when the down-right to up-left display mode is
  • step 403 when the up-left to down-right display
  • step 404 the waveform data is retrieved and stored to the buffer 14 and the
  • step 405 the above resulting waveform data analyzed in the up-left/down-right
  • display mode is transmitted to the sub-waveform display area 54 via interface.
  • step 406 whether or not the resulting waveform data is stored in a file is determined. If yes, the operation proceeds to step 408, if not, the operation proceeds to
  • step 409 the operation proceeds to step 409, if not, the operation proceeds to step 410.
  • step 408 the resulting waveform data is stored in the file.
  • step 409 the resulting waveform is printed out.
  • step 410 the operation procedure ends.
  • the waveform data can be analyzed in the above up-left/down-
  • a user can select the waveform display mode 102 to zoom in or synchronize the
  • the waveform observation mode 103 such as 3D display mode, up/down
  • step 500 the operation procedure starts.
  • step 501 one of the two display modes, down-left to up-right display mode or up ⁇
  • step 502 the test signal is input, when the down-left to up-right display mode is selected.
  • step 503 when up-right to down-left display
  • step 503 the waveform data is retrieved and stored to the buffer 14 and the waveform data is analyzed in the down-left to up-right display mode, then the operation
  • step 504 the waveform data is retrieved and stored to the buffer 14 and the
  • step 505 the waveform data analyzed in the up-right/down-left display mode is
  • step 506 whether or not the analyzed waveform data is stored in a file is
  • step 508 If yes, the operation proceeds to step 508, if not, the operation proceeds to
  • step 603 the waveform data is retrieved and stored to the memory 12 and the

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

L'invention concerne un procédé permettant d'analyser des données de forme d'onde au moyen d'un analyseur logique (10). Ledit analyseur logique comprend un circuit de commande (11) et une mémoire (12). Des données de forme d'onde sont extraites d'un objet d'essai (40) et stockées dans la mémoire (12) de l'analyseur logique (10). Les données de forme d'onde stockées dans la mémoire (12) sont ensuite transmises à un ordinateur (30), puis remplissent un tampon (14) de l'analyseur logique (10). Les données de forme d'onde stockées dans le tampon (14) sont par la suite transmises à un afficheur (13), l'utilisateur pouvant alors choisir un canal d'affichage dans une zone d'affichage de canaux (53) d'une zone d'affichage de forme d'onde principale (51) d'une fenêtre de commande (50) de l'analyseur logique (10) pour choisir un mode d'affichage de forme d'onde (102) ou un mode d'observation de forme d'onde (103) pour afficher un secteur des données de forme d'onde dans différents modes d'affichage et différents angles selon différentes synchronisations dans l'afficheur (13).
PCT/US2004/015583 2004-06-07 2004-06-07 Analyseur logique et procede d'analyse de donnees de forme d'onde WO2005121814A1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
PCT/US2004/015583 WO2005121814A1 (fr) 2004-06-07 2004-06-07 Analyseur logique et procede d'analyse de donnees de forme d'onde

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2004/015583 WO2005121814A1 (fr) 2004-06-07 2004-06-07 Analyseur logique et procede d'analyse de donnees de forme d'onde

Publications (1)

Publication Number Publication Date
WO2005121814A1 true WO2005121814A1 (fr) 2005-12-22

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Country Status (1)

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WO (1) WO2005121814A1 (fr)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012024147A1 (fr) * 2010-08-18 2012-02-23 Snap-On Incorporated Système et procédé pour l'affichage simultané de formes d'onde générées à partir de signaux d'entrée reçus par un dispositif d'acquisition de données
US8463953B2 (en) 2010-08-18 2013-06-11 Snap-On Incorporated System and method for integrating devices for servicing a device-under-service
US8502821B2 (en) 2008-02-04 2013-08-06 C Speed, Llc System for three-dimensional rendering of electrical test and measurement signals
US8560168B2 (en) 2010-08-18 2013-10-15 Snap-On Incorporated System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment
EP2711721A1 (fr) * 2012-09-25 2014-03-26 Tektronix, Inc. Procédés et systèmes pour la génération d'affichages de formes d'onde
US8754779B2 (en) 2010-08-18 2014-06-17 Snap-On Incorporated System and method for displaying input data on a remote display device
US9117321B2 (en) 2010-08-18 2015-08-25 Snap-On Incorporated Method and apparatus to use remote and local control modes to acquire and visually present data
US9633492B2 (en) 2010-08-18 2017-04-25 Snap-On Incorporated System and method for a vehicle scanner to automatically execute a test suite from a storage card

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6502045B1 (en) * 1999-05-19 2002-12-31 Ics Systems, Inc. Unified analog/digital waveform software analysis tool with video and audio signal analysis methods
US20030058243A1 (en) * 2001-09-21 2003-03-27 Faust Paul G. Delivery and display of measurement instrument data via a network
US6707474B1 (en) * 1999-10-29 2004-03-16 Agilent Technologies, Inc. System and method for manipulating relationships among signals and buses of a signal measurement system on a graphical user interface

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6502045B1 (en) * 1999-05-19 2002-12-31 Ics Systems, Inc. Unified analog/digital waveform software analysis tool with video and audio signal analysis methods
US6707474B1 (en) * 1999-10-29 2004-03-16 Agilent Technologies, Inc. System and method for manipulating relationships among signals and buses of a signal measurement system on a graphical user interface
US20030058243A1 (en) * 2001-09-21 2003-03-27 Faust Paul G. Delivery and display of measurement instrument data via a network

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8502821B2 (en) 2008-02-04 2013-08-06 C Speed, Llc System for three-dimensional rendering of electrical test and measurement signals
US8754779B2 (en) 2010-08-18 2014-06-17 Snap-On Incorporated System and method for displaying input data on a remote display device
US8463953B2 (en) 2010-08-18 2013-06-11 Snap-On Incorporated System and method for integrating devices for servicing a device-under-service
US8560168B2 (en) 2010-08-18 2013-10-15 Snap-On Incorporated System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment
WO2012024147A1 (fr) * 2010-08-18 2012-02-23 Snap-On Incorporated Système et procédé pour l'affichage simultané de formes d'onde générées à partir de signaux d'entrée reçus par un dispositif d'acquisition de données
US8935440B2 (en) 2010-08-18 2015-01-13 Snap-On Incorporated System and method for integrating devices for servicing a device-under-service
US8983785B2 (en) 2010-08-18 2015-03-17 Snap-On Incorporated System and method for simultaneous display of waveforms generated from input signals received at a data acquisition device
US9117321B2 (en) 2010-08-18 2015-08-25 Snap-On Incorporated Method and apparatus to use remote and local control modes to acquire and visually present data
US9304062B2 (en) 2010-08-18 2016-04-05 Snap-On Incorporated System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment
US9633492B2 (en) 2010-08-18 2017-04-25 Snap-On Incorporated System and method for a vehicle scanner to automatically execute a test suite from a storage card
EP2711721A1 (fr) * 2012-09-25 2014-03-26 Tektronix, Inc. Procédés et systèmes pour la génération d'affichages de formes d'onde
JP2014066707A (ja) * 2012-09-25 2014-04-17 Tektronix Inc トリガされた波形記録セグメントを表示する方法及びシステム
US9541579B2 (en) 2012-09-25 2017-01-10 Tektronix, Inc. Methods and systems for generating displays of waveforms

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