WO2005083147A1 - 液晶高分子からなる膜の製造方法 - Google Patents
液晶高分子からなる膜の製造方法 Download PDFInfo
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- WO2005083147A1 WO2005083147A1 PCT/JP2004/012378 JP2004012378W WO2005083147A1 WO 2005083147 A1 WO2005083147 A1 WO 2005083147A1 JP 2004012378 W JP2004012378 W JP 2004012378W WO 2005083147 A1 WO2005083147 A1 WO 2005083147A1
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- film
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- protective film
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Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K19/00—Liquid crystal materials
- C09K19/04—Liquid crystal materials characterised by the chemical structure of the liquid crystal components, e.g. by a specific unit
- C09K19/38—Polymers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
- H10K10/80—Constructional details
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K19/00—Liquid crystal materials
- C09K19/04—Liquid crystal materials characterised by the chemical structure of the liquid crystal components, e.g. by a specific unit
- C09K19/38—Polymers
- C09K19/3804—Polymers with mesogenic groups in the main chain
- C09K19/3809—Polyesters; Polyester derivatives, e.g. polyamides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/12—Organic material
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/162—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using laser ablation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/731—Liquid crystalline materials
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K2219/00—Aspects relating to the form of the liquid crystal [LC] material, or by the technical area in which LC material are used
- C09K2219/03—Aspects relating to the form of the liquid crystal [LC] material, or by the technical area in which LC material are used in the form of films, e.g. films after polymerisation of LC precursor
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K2323/00—Functional layers of liquid crystal optical display excluding electroactive liquid crystal layer characterised by chemical composition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having a potential-jump barrier or a surface barrier
- H10K10/80—Constructional details
- H10K10/88—Passivation; Containers; Encapsulations
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
Definitions
- the present invention relates to a film formed from a vaporized product generated by irradiating a liquid crystal polymer (LCP) having optical anisotropy with a pulsed laser, and an electron-emitting device using the film as a protective film.
- LCP liquid crystal polymer
- the present invention relates to an organic electronic device such as an organic electroluminescent device (hereinafter, referred to as an organic EL device), an organic field effect transistor device (hereinafter, referred to as an organic FET device), and a photoelectric conversion device.
- the electronic device of the present invention has excellent water and water vapor barrier properties, oxygen barrier properties, electrical properties, heat resistance, chemical resistance, etc. derived from LCP without impairing advantages such as low cost productivity and lightness and shortness. And electrical characteristics.
- Non-Patent Document 1 In recent years, the demand for electronic devices such as EL devices, FET devices, and photoelectric conversion devices made of inorganic and / or organic materials has greatly increased as a result of research and development for improving performance.
- these electronic devices especially electronic devices using organic materials, easily react with moisture and oxygen in the atmosphere and easily deteriorate in performance. It has been pointed out that there is a need to perform this (for example, Patent Document 1).
- organic materials such as epoxy resin, polyimide resin and polymethyl methacrylate resin
- an FET element in which a semiconductor is made of an inorganic material is manufactured by sandwiching the inorganic material between electrodes and then sealing it with an epoxy resin or the like.
- a large amount of filler must be contained in order to suppress permeation and residue, and there is a limit to the demand for lighter, thinner and shorter units.
- semiconductors made of inorganic materials have low productivity, there is a limit to the demand for cost reduction.
- the semiconductor is made of an organic material.
- the material that protects the semiconductor of the organic FET element and blocks moisture and oxygen in the air the above-mentioned inorganic materials and the like can be used. The advantage of is lost.
- Non-patent Document 1 Macromolecular Rapid Communications, Vol. 25, ppl96_203 (2004)
- Patent Document 1 Japanese Patent Application Laid-Open No. 7-169567
- the present invention provides a method for producing a film of an organic material having excellent moisture barrier properties and / or oxygen barrier properties, and provides a film obtained by the production method with an electronic device, particularly an organic material.
- An object of the present invention is to provide an electronic device which is formed as a protective film of an electronic device and has excellent long-term stability in which performance is prevented from being deteriorated by moisture or oxygen in the air.
- the inventors of the present invention have conducted intensive studies to achieve the above object, and as a result, a vaporized product generated by irradiating a liquid crystal polymer exhibiting optical anisotropy with a pulse laser is evaporated on a substrate.
- the inventors have found that a film excellent in moisture nori property and / or oxygen barrier property can be formed by depositing and solidifying on the surface, and the present invention has been completed.
- the present invention provides a method of irradiating a pulse laser to a target made of a liquid crystalline polymer exhibiting optical anisotropy (hereinafter, referred to as LCP) and evaporating the target. It is deposited and solidified on the surface of a substrate such as an electronic device installed at a position opposite to the above.
- LCP liquid crystalline polymer exhibiting optical anisotropy
- FIG. 1 is a cross-sectional structure diagram showing an organic FET device formed by a manufacturing method of the present invention.
- FIG. 2 is a cross-sectional structure diagram showing a conventional organic EL device.
- FIG. 3 is a sectional structural view showing an organic EL device formed by the manufacturing method of the present invention.
- FIG. 4 is a sectional structural view showing an organic EL device formed by the manufacturing method of the present invention.
- FIG. 5 is a cross-sectional structural view showing a sample for measuring an insulating property of a protective film formed by the manufacturing method of the present invention.
- the properties of the LCP used in the present invention are not particularly limited, and include a solvent such as a lyophepic pick LCP and Z exhibiting optical anisotropy by containing a solvent or a thermot exhibiting optical anisotropy when melted. From the viewpoint of the force S at which the mouth pick LCP can be used and the molding into a shape suitable for a target, a thermotome pick LCP is more preferable.
- Aromatic polyamide and polyphenylenebisbenzothiazole can be exemplified as the lyophote pick LCP.
- thermopick LCP thermopick liquid crystal polyesters and thermopick liquid crystal polyesteramides derived from the compounds classified into (1) to (4) and derivatives thereof exemplified below are exemplified. Can be mentioned. However, it goes without saying that a suitable combination of repeating units is required to obtain a polymer capable of forming an optically anisotropic molten phase.
- Aromatic diamine, aromatic hydroxyamine or aromatic aminocarboxylic acid (for typical examples, see Table 4)
- thermopick LCP obtained from these raw material conjugates include copolymers having the structural units shown in Table 5.
- thermoport pick LCP used in the present invention has a force S for efficiently forming a film on a base material, and therefore has a range of 200 ° C, 400 ° C, and 200 ° C. In particular, those having a melting point in the range of about 250 to about 350 ° C are preferred.
- thermopick LCP In order to use as a target of equipment having high productivity, the thermopick LCP is required to be able to easily exchange targets and to supply a continuous target. Therefore, it is more preferable that the film is in the form of a long film, which is preferably in the form of a film.
- the film of the thermopic pick LCP used as the target in the present invention is obtained by extrusion molding the thermopic pick LCP.
- Any extrusion molding method can be used for this purpose, but the well-known T-die film forming stretching method, laminate stretching method, inflation method and the like are industrially advantageous.
- stress is applied not only in the mechanical axis direction of the film (hereinafter abbreviated as the MD direction) but also in a direction orthogonal to the film direction (hereinafter abbreviated as the TD direction). It is possible to obtain a flat film in which the mechanical properties and the thermal properties are balanced between the TD direction and the TD direction, and it is more preferable in terms of handling.
- the production of a film made of LCP is preferably carried out using a pulse laser irradiation apparatus capable of generating a specific wavelength and energy under an atmosphere having a degree of vacuum of 10-oir or less. . If the degree of vacuum is out of this range, the vapors will not solidify
- the preferred wavelength range of the pulse laser that can be used in the present invention is from 200 to 1200 nm. Outside of this range, a film formed not only with a low vapor deposition rate but poor gas barrier properties and poor electrical insulation performance.
- Examples of wavelengths at which LCP is efficiently vaporized include 266 nm, 354 nm, 532 nm, and 1064 nm of a YAG laser, 248 nm of a KrF laser, and 193 nm of an ArF laser.
- the preferable energy range of the pulse laser that can be used in the present invention is 0.1 to 3. Oj / cm 2 . If it exceeds this range, carbonization is promoted and a film cannot be formed effectively, and the obtained film has poor gas barrier properties and electric insulation performance.
- Energy of the pulse laser is preferably 0. 1 -2. OjZcm 2
- the base material for depositing and solidifying a vapor generated by irradiation with the pulse laser there is no particular limitation on the base material for depositing and solidifying a vapor generated by irradiation with the pulse laser.
- articles of various shapes such as sheets, films, plates, tubes, fibers, fabrics, and shaped articles can be used as the base material.
- an article having a planar shape such as a sheet, a film, or a plate is preferable.
- the material constituting the base material there are no particular restrictions on the material constituting the base material.
- Polymers such as polyamide imide, polyether imide, polyimide, LCP, polyether ketone, polyether ether ketone, and polyphenylene ether; gold, silver, copper, and anolemminium And various metals such as paper, glass, ceramics, inorganic semiconductors, and organic semiconductors described below.
- the surface temperature of the substrate is not particularly limited when depositing and solidifying the vapor generated by irradiation with the pulse laser. There is no problem if the surface temperature of the substrate is normally set to room temperature, but it is preferable to set the temperature as low as possible.
- a film made of LCP is formed on the above-described base material, and a laminate comprising the base material and the LCP film can be obtained.
- a laminate can be used for various applications depending on the type of the base material.Applications in which excellent properties such as gas barrier properties and electrical insulation properties of the LCP are activated, It can be effectively used as electronic devices such as organic FET elements, organic EL elements, and photoelectric conversion elements.
- the thickness of the film formed by the production method of the present invention is not particularly limited, but is preferably 30 nm or more from the viewpoint of gas barrier properties and electrical insulation performance.
- such films exhibit excellent performance as protective films for electronic devices.
- the film according to the present invention is formed on the light emitting surface of the EL element or the light receiving surface of the photoelectric conversion element, the light transmittance of the film is further increased. It is good to set the film thickness in consideration of it.
- the force S for easily forming a very thin film for example, less than 1 ⁇ m can be obtained.
- Such a thin film of LCP has not been easy to manufacture by a conventionally known method.
- FIG. 1 shows a cross-sectional structure of an organic FET element as an example of an electronic device.
- This organic FET element is formed by depositing a gate electrode 3, a gate dielectric 5, an organic semiconductor 6, a drain electrode 7 and a source electrode 8 on a substrate 2 such as sapphire using a laser molecular beam epitaxy apparatus. Obtained by forming protective film 1 from LCP [0028]
- a material used as the gate electrode 3 of the organic FET element a metal material such as anomium or gold, or doped silicon can be used. It is necessary to use appropriate ones for these depending on the work function of the semiconductor used and the operation method of the FET.
- the material used as the gate dielectric 5 of the organic FET element aluminum oxide, hafnium oxide, silicon nitride, oxides such as dielectric polymers, nitrides, sulfides, and organic substances can be used.
- An electric field having a small leakage current and a large electric field resistance and a large dielectric constant are preferable in terms of easy application of an electric field, but should be selected according to an intended output and are not limited.
- Examples of the material used as the organic semiconductor 6 of the organic FET element include organic materials exhibiting an electric field effect.
- acene-based ⁇ -conjugated organic materials such as pentacene, tetracene, and rubrene, phthalocyanine, fullerene (C60 ) Is preferable in terms of mobility, but is not limited as long as it is appropriately selected according to the desired output.
- Examples of the material used for the drain electrode 7 and the source electrode 8 of the organic FET element include gold, silver, aluminum, magnesium, and a magnesium: silver alloy, which have high electric conductivity. It is preferable that the work function is consistent with the organic material to be used. The force should be selected depending on the desired output, and is not limited.
- FIG. 2 shows a cross-sectional structure of an organic EL element as another example of the electronic device.
- the device shown in this figure is a conventional organic EL device.
- An anode such as ⁇ , a hole transport layer, a light-emitting layer, an electron transport layer, are sequentially formed.
- the hole transport layer, the light emitting layer and the electron transport layer are low molecular weight and / or high molecular weight organic compounds, and should be formed by a method of depositing the molecules sublimed in a vacuum state or coating the solution with a solvent. Can be.
- FIGS. 3 and 4 show an example of a cross-sectional structure of an organic EL device using a film formed from LCP by a production method of the present invention as a protective film.
- the protective film provided on the light emitting surface has a practically sufficient light transmittance, and in order to use LCP for this purpose, the film thickness of the film should be set as thin as possible.
- an extremely thin film having a thickness of, for example, less than 1 ⁇ m is formed. It can be easily formed.
- an LCP film (protective film) 11 is formed on a transparent polymer film (substrate) 12 by the method of the present invention, and then the conventional organic EL device shown in FIG. It is obtained by sequentially forming an anode 13, a hole transporting layer 14, a light emitting layer 15, an electron transporting layer 16, and a force sword 17, similarly to the EL element.
- the organic EL device shown in FIG. 4 is formed by using the organic EL device itself shown in FIG. 3 as a base material and covering the entire surface with an LCP film (protective film) 11A according to the method of the present invention. The ability to obtain an element can be achieved.
- a photoelectric conversion element formed by laminating an electrode layer, a photoelectric conversion layer, and the like on a substrate, and the like are also known.
- a film (protective film) can be formed on the surface.
- the protective properties and insulating performance of the protective film were measured by the following methods.
- the field effect mobility (A) immediately after fabrication or in a vacuum device and the field effect mobility (B) after being left in the atmosphere at a relative humidity of 60% for 9 days were measured.
- the protection properties were evaluated using equation 1).
- the field-effect mobility was calculated from the V-I curve in the saturation region using (Equation 2).
- an insulating substrate 2 made of sapphire As shown in FIG. 5, on an insulating substrate 2 made of sapphire, a sample composed of gold for electrode A, protective film 1 formed by the manufacturing method of the present invention, and gold for electrode B was prepared. The breakdown voltage between poles A and B was measured.
- the target of the pulse laser is a thermopick LCP with a melting point of 280 ° C, which is a copolymer of p-hydroxybenzoic acid and 6-hydroxy_2_naphthoic acid.
- a film having a thickness of 50 ⁇ m was obtained by inflation film formation under the conditions of 77 times and a longitudinal stretching ratio of 2.09 times.
- the target of the pulse laser is a thermocoupling pick LCP, a copolymer of p-hydroxybenzoic acid, terephthalic acid, isophthalic acid, and biphenol, with a melting point of 340 ° C.
- a film having a thickness of 50 ⁇ m was obtained by inflation film formation under the conditions of a magnification of 3.56 and a longitudinal stretching ratio of 2.81.
- a gate electrode made of aluminum with a thickness of 300 A by vapor deposition On a sapphire substrate with a thickness of 1800 A, a gate electrode made of aluminum with a thickness of 300 A by vapor deposition, a gate dielectric made of aluminum oxide with a thickness of 2000 A by sputtering, and a gate dielectric with a thickness of 500 A by molecular beam epitaxy.
- An organic FET device was fabricated by sequentially forming an organic semiconductor made of pentacene, a 300 A-thick gold drain electrode and a 100 A-thick nickel drain electrode and a source electrode by a vapor deposition method.
- a KrF pulse laser having a wavelength of 248 nm and an energy density of 0.56 j / cm 2 was used in an atmosphere with a degree of vacuum of 10 to 7 Torr.
- a sample for evaluating the insulation properties having the structure shown in FIG. 5 having a protective film having a thickness of 700 A was produced.
- Table 6 shows the insulation properties of the obtained insulation property evaluation sample and the protection properties of the organic FET element.
- Table 6 shows the insulation properties of the obtained insulation property evaluation sample and the protection properties of the organic FET element.
- a KrF pulse laser with a wavelength of 248 nm was irradiated at an energy density of 0.56 j / cm 2 in an atmosphere with a degree of vacuum of 10 to 7 Torr to obtain a thickness.
- a sample for evaluating insulation properties having the structure shown in FIG. 5 having a protective film of 1100 A was prepared.
- the organic FET element having no protective film obtained in Reference Example 3 was used as a substrate, and in the same manner as described above, the structure of FIG. 1 having a protective film with a thickness of 1100 A on the surface was used. An organic FET device was fabricated.
- Table 6 shows the insulation properties of the obtained insulation property evaluation sample and the protection properties of the organic FET element.
- Example 4 In the same manner as in Example 1, except that the film of the thermopic pick LCP obtained in Reference Example 2 was used as the target, a sample for evaluating the insulation properties of the structure shown in FIG. 5 having a protective film having a thickness of 700 A, and a thickness of 700 A An organic FET device having the structure shown in FIG.
- Table 6 shows the insulation properties of the obtained insulation property evaluation sample and the protection properties of the organic FET element.
- Table 6 shows the insulation properties of the obtained insulation property evaluation sample and the protection properties of the organic FET element.
- a film of Samoto port pick LCP obtained in Reference Example 1 as a target in an atmosphere of vacuum degree 10- 7 Torr, energy KrF pulsed laser having a wavelength of 248nm Irradiation at a density of 0.56 j / cm 2 forms a 700 A thick protective film, followed by a 700 A thick ITO electrode and a 50 nm thick T electrode.
- thermopic pick LCP obtained in Reference Example 1 was further formed.
- the full Ilm as a target in an atmosphere of vacuum degree 10- 7 Torr by forming a protective film having a thickness of 700 a by irradiation with KrF pulsed laser with a wavelength of 248nm at an energy density 0. 56jZcm 2, 4 , An organic EL device having a structure in which the electron transport layer was omitted.
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
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US10/585,204 US7727686B2 (en) | 2004-02-27 | 2004-08-27 | Method of making LC polymer film |
CA 2552488 CA2552488C (en) | 2004-02-27 | 2004-08-27 | Method of making lc polymer film |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2004054035A JP4587276B2 (ja) | 2004-02-27 | 2004-02-27 | 液晶高分子からなる膜の製造方法 |
JP2004-054035 | 2004-02-27 |
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WO2005083147A1 true WO2005083147A1 (ja) | 2005-09-09 |
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PCT/JP2004/012378 WO2005083147A1 (ja) | 2004-02-27 | 2004-08-27 | 液晶高分子からなる膜の製造方法 |
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US (1) | US7727686B2 (ja) |
JP (1) | JP4587276B2 (ja) |
CA (1) | CA2552488C (ja) |
WO (1) | WO2005083147A1 (ja) |
Families Citing this family (12)
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DE102008011185A1 (de) * | 2008-02-27 | 2009-09-03 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung einer dotierten organischen halbleitenden Schicht |
KR101187632B1 (ko) | 2011-02-14 | 2012-10-08 | 한국과학기술원 | Lcp를 이용한 플렉서블 전자소자 제조방법 및 이를 이용한 플렉서블 메모리 소자 제조방법 |
DE102011078998A1 (de) * | 2011-07-12 | 2013-01-17 | Osram Opto Semiconductors Gmbh | Lichtemittierendes Bauelement und Verfahren zum Herstellen eines lichtemittierenden Bauelements |
JP2015522086A (ja) * | 2012-06-27 | 2015-08-03 | ティコナ・エルエルシー | 超低粘度の液晶性ポリマー組成物 |
JP6517694B2 (ja) | 2012-11-06 | 2019-05-22 | オーティーアイ ルミオニクス インコーポレーテッドOti Lumionics Inc. | 導電性コーティングを表面に堆積する方法 |
WO2015179819A1 (en) * | 2014-05-22 | 2015-11-26 | Ohio State Innovation Foundation | Liquid thin-film laser target |
KR102054754B1 (ko) * | 2015-02-04 | 2019-12-11 | 후지필름 가부시키가이샤 | 화상 표시 장치 |
US10355246B2 (en) | 2015-12-16 | 2019-07-16 | Oti Lumionics Inc. | Barrier coating for opto-electronics devices |
WO2018033860A1 (en) | 2016-08-15 | 2018-02-22 | Oti Lumionics Inc. | Light transmissive electrode for light emitting devices |
US10651103B2 (en) * | 2016-10-28 | 2020-05-12 | Qorvo Us, Inc. | Environmental protection for wafer level and package level applications |
CN111416039A (zh) * | 2019-01-07 | 2020-07-14 | 纽多维有限公司 | 制剂和层 |
US11877505B2 (en) | 2020-10-15 | 2024-01-16 | Qorvo Us, Inc. | Fluorinated polymers with low dielectric loss for environmental protection in semiconductor devices |
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---|---|---|---|---|
JPH07169567A (ja) * | 1993-12-16 | 1995-07-04 | Idemitsu Kosan Co Ltd | 有機el素子 |
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WO1992010073A1 (en) * | 1990-11-30 | 1992-06-11 | Idemitsu Kosan Company Limited | Organic electroluminescence device |
JP2003297553A (ja) * | 2002-03-29 | 2003-10-17 | Kuraray Co Ltd | El素子用防湿フィルムおよび該フィルムを使用してなるel素子 |
JP4136482B2 (ja) * | 2002-06-20 | 2008-08-20 | キヤノン株式会社 | 有機半導体素子、その製造方法および有機半導体装置 |
AU2007213255B2 (en) * | 2006-02-10 | 2010-11-18 | Lef Technology, Inc. | Method of modifying liquid crystal polymers |
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2004
- 2004-02-27 JP JP2004054035A patent/JP4587276B2/ja not_active Expired - Fee Related
- 2004-08-27 WO PCT/JP2004/012378 patent/WO2005083147A1/ja active Application Filing
- 2004-08-27 CA CA 2552488 patent/CA2552488C/en not_active Expired - Fee Related
- 2004-08-27 US US10/585,204 patent/US7727686B2/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07169567A (ja) * | 1993-12-16 | 1995-07-04 | Idemitsu Kosan Co Ltd | 有機el素子 |
Non-Patent Citations (4)
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JP4587276B2 (ja) | 2010-11-24 |
US7727686B2 (en) | 2010-06-01 |
CA2552488C (en) | 2011-10-11 |
JP2005243532A (ja) | 2005-09-08 |
US20070160846A1 (en) | 2007-07-12 |
CA2552488A1 (en) | 2005-09-09 |
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