WO2005022127A3 - Vorrichtung zur vermessung eines flächigen elementes - Google Patents

Vorrichtung zur vermessung eines flächigen elementes Download PDF

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Publication number
WO2005022127A3
WO2005022127A3 PCT/AT2004/000281 AT2004000281W WO2005022127A3 WO 2005022127 A3 WO2005022127 A3 WO 2005022127A3 AT 2004000281 W AT2004000281 W AT 2004000281W WO 2005022127 A3 WO2005022127 A3 WO 2005022127A3
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
planar element
distance
sensors
opto
Prior art date
Application number
PCT/AT2004/000281
Other languages
English (en)
French (fr)
Other versions
WO2005022127A2 (de
Inventor
Gerhard Abraham
Original Assignee
Sensor Tech Messtechnik Gmbh
Gerhard Abraham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sensor Tech Messtechnik Gmbh, Gerhard Abraham filed Critical Sensor Tech Messtechnik Gmbh
Publication of WO2005022127A2 publication Critical patent/WO2005022127A2/de
Publication of WO2005022127A3 publication Critical patent/WO2005022127A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Vorrichtung zur Vermessung eines flächigen Elements (6) mit zumindest teilweise direkt reflektierender Oberfläche, z.B. eines Glaselements, mit einer Meßauflage (3), auf der das zu vermessende Element (6) positionierbar ist und mit einer Vielzahl voneinander beabstandeter Abstands-Meßsensoren (1), mit welchen jeweils der Abstand zwischen einer Bezugsfläche und der Oberfläche des flächigen Elements (6) entlang einer Meßachse des Meßsensors bestimmbar ist, wobei die Abstands-Meßsensoren durch optische Meßsensoren (1), welche jeweils einen Lichtsender (2) zur Aussendung eines gebündelten Lichtstrahls und einen Lichtempfänger (9) umfassen, gebildet sind.
PCT/AT2004/000281 2003-08-21 2004-08-09 Vorrichtung zur vermessung eines flächigen elementes WO2005022127A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AT13162003 2003-08-21
ATA1316/2003 2003-08-21

Publications (2)

Publication Number Publication Date
WO2005022127A2 WO2005022127A2 (de) 2005-03-10
WO2005022127A3 true WO2005022127A3 (de) 2005-05-12

Family

ID=34229699

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/AT2004/000281 WO2005022127A2 (de) 2003-08-21 2004-08-09 Vorrichtung zur vermessung eines flächigen elementes

Country Status (1)

Country Link
WO (1) WO2005022127A2 (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980553B2 (en) * 2008-12-11 2011-07-19 Eastman Kodak Company Media measurement with sensor array
US8223348B2 (en) 2008-12-11 2012-07-17 Eastman Kodak Company Media identification system with sensor array
US8118390B2 (en) 2008-12-11 2012-02-21 Eastman Kodak Company Media identification system with moving optoelectronic device
US8035093B2 (en) 2008-12-11 2011-10-11 Eastman Kodak Company Movable media tray with position reference marks
DE102018121337A1 (de) * 2018-08-31 2020-03-05 NoKra Optische Prüftechnik und Automation GmbH Verfahren zur Bestimmung der Krümmung einer Glasscheibe, insbesondere einer Windschutzscheibe
DE102018126009B4 (de) * 2018-10-19 2022-05-19 Leica Microsystems Cms Gmbh Verfahren und Mikroskop zur Bestimmung der Dicke eines Deck- oder Tragglases
CZ308522B6 (cs) * 2020-03-05 2020-10-21 FOR G, s.r.o. Způsob bezkontaktního zjišťování geometrické přesnosti tvaru transparentního tvarovaného plošného výrobku ze skla nebo plastu a zařízení k jeho provádění
FR3141767A1 (fr) * 2022-11-09 2024-05-10 Safran Reosc Profilomètre pour surfaces optiques

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2695049A1 (fr) * 1992-09-03 1994-03-04 Lorraine Laminage Procédé et dispositif d'évaluation de la planéité d'une bande et ligne de fabrication d'une bande en continu comportant un dispositif d'évaluation de la planéité de la bande.
US5870199A (en) * 1992-09-02 1999-02-09 Betriebsforschungsinstitut Vdeh Institut Fur Angewandte Forschung Gmbh Method and apparatus for highly accurate distance measurement with respect to surfaces
US5933240A (en) * 1997-02-12 1999-08-03 Jurca; Marius Christian Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5870199A (en) * 1992-09-02 1999-02-09 Betriebsforschungsinstitut Vdeh Institut Fur Angewandte Forschung Gmbh Method and apparatus for highly accurate distance measurement with respect to surfaces
FR2695049A1 (fr) * 1992-09-03 1994-03-04 Lorraine Laminage Procédé et dispositif d'évaluation de la planéité d'une bande et ligne de fabrication d'une bande en continu comportant un dispositif d'évaluation de la planéité de la bande.
US5933240A (en) * 1997-02-12 1999-08-03 Jurca; Marius Christian Method and apparatus for determining the distance between a base and a specular surface by means of radiation reflected at the surface

Also Published As

Publication number Publication date
WO2005022127A2 (de) 2005-03-10

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