WO2004086132A1

WO2004086132A1 - Liquid crystal panel testing device

Info

Publication number: WO2004086132A1
Application number: PCT/JP2004/004308
Authority: WO
Inventors: Hiroyasu Sotoma
Original assignee: Nhk Spring Co., Ltd.
Priority date: 2003-03-26
Filing date: 2004-03-26
Publication date: 2004-10-07
Also published as: KR20050113249A; KR101011424B1; JP4115484B2; TWI323054B; CN1764868A; CN100541301C; TW200423481A; JPWO2004086132A1

Abstract

A liquid crystal panel testing device for conducting a test on a liquid crystal panel by applying a probe (2) of a probe block (1) to a terminal conductive pattern (4) on a liquid crystal pane array glass (3). The probe block (1) has insertion holes (16) into which probes (2) can be inserted in such a way as to adapt to the whole wirings even if a conductive pattern (4S) for basic terminals is composed of a maximum number of function lines (F) and a maximum number of signal lines (S) conforming to the required specifications for the liquid crystal panels. Probes (2) are inserted into the insertion holes (16), out of all the insertion holes (16), corresponding to the wirings constituting the terminal conductive patterns (4) of an array glass (3) under test, and the probes (16) into which no probes (2) are inserted are left as they are.

Description

Inspection equipment for liquid crystal panel

Technical field

The present invention relates to a liquid crystal panel for inspecting a short state, an open state, TFT characteristics, and pixel characteristics of a conductive pattern printed on an array glass for a liquid crystal panel.

The present invention relates to an inspection device.

Field background technology

As shown in Fig. 8, a general liquid crystal panel inspection device makes the probe 2 of the probe block 1 contact the conductive pattern 4 of the terminal of the array glass 3 for the liquid crystal panel. The TFT (Thin) is read by reading the signal from the tester body 7 via the probe 2, the flexible board 5 connecting one end to the probe 2, and the relay board 6 connecting to the other end of the flexible board 5.

F ilm Tran s i s s t o r) and pixel characteristic inspection.

At this time, the flexible substrate 5 includes the flexible substrate 5a corresponding to the odd-numbered conductor and the flexible substrate 5b corresponding to the even-numbered conductor in the terminal conductive pattern 4. The relay board 6 is a flexible board

It is composed of an odd-numbered substrate 6a to which 5a is connected and an even-numbered substrate 6b to which the flexible substrate 5b is connected. Further, the tester body 7 is an odd-numbered board

It comprises an odd address tester 7a to which a signal from 6a is input and an even address tester 7b to which a signal from the even corresponding substrate 6 is input.

In FIG. 8, reference numerals 22 and 24 denote odd-side and even-side address conversion substrates connected to the odd and even address testers 7a and 7b, respectively, and reference numerals 21 and 23 denote odd-number corresponding substrates 6a. And odd side address conversion board 22, and フレ Flexible board for connecting the even-numbered board 6 and the even-numbered address conversion board 24, respectively. Further, reference numeral 25 indicates a support frame for supporting the probe block 1.

In the case of inspecting the characteristics of the TFT array substrate constituting the liquid crystal panel array glass 3, a TAB (Tape Automated Bonding) and a PCB (Print Circuit Board) as a panel lighting drive LSI: In a process prior to bonding the mounting printed circuit board), a voltage is applied to each of the conductive patterns 4 for the pixel signal terminals of the array glass 3 for the liquid crystal panel to perform characteristic inspection.

In this detection, since the same number of probes 2 as the number of conductive patterns for pixel signal terminals are used, the probe block 1 having a plurality of probes 2 is connected to the side of the liquid crystal panel array glass 3 where the conductive patterns 4 for terminals are provided. Set alongside. In the inspection, a pixel inspection signal is sent separately to odd-numbered pixel terminals and even-numbered pixel terminals.

As such a probe block, a probe block 1 shown in FIG. 9 has been proposed (for example, see JP-A-8-222299 (pages 3, 4, and 1).

))).

The probe block 1 has a plurality of probes 2 for making contact with each of the plurality of terminal conductive patterns 4 arranged on the pixels of the liquid crystal panel array glass 3. Approximately constituted by supporting by At this time, the probe 2 is divided into two lines L1 and L2 corresponding to the odd-numbered and even-numbered terminal conductive patterns 4, respectively, as shown in FIG. 9 (see FIG. 10). The lines are arranged in a staggered manner for each line Ll, L2. In addition, the probe 2 is an odd-numbered conductive needle of the plurality of conductive needles projecting upwards:! 1a is elongated so as to protrude above the even-numbered conductive needles 11 and is stepped in the protruding direction between the two. The probe 2 is configured by connecting each of the upper conductive needles 11 a and 11 b and the lower conductive needle 10 via a conductive coil spring 14. At the time of inspection, each of the conductive needles 10 It comes into contact with each of the plurality of terminal conductive patterns 4 arranged on the pixels of the panel array glass 3.

Then, as shown in FIG. 9, the odd-numbered conductive needles 11a, which are longer, are connected to the flexible substrate 5a attached to the lower surface of the upper insulating plate 12 for the odd-numbered signal transmission. The even-numbered conductive needles 11 which are in contact with the conductive pattern 8 and the shorter conductive needles 11 are attached to the lower surface of the lower insulating plate 13 for the even-numbered signal transmitting conductive pattern 9 of the flexible board 5 b. The upper insulating plate 12 is integrally superimposed on the lower insulating plate 13 so as to be in contact with the lower insulating plate 13.

Instead of using long and short conductive needles as shown in FIG. 9, as shown in FIG. 13, they are inserted into insertion holes (not shown) of the main body 20 as probes. A pair of conductive needles 10 and 11 having the same length and a conductive coil panel for urging the pair may be coaxially received.

In order to configure an inspection device for a liquid crystal panel using the probe block 1 configured as described above, it is necessary to provide the same number of the probes 2 as the number of the conductive patterns 4 for the terminals. The required number of probe blocks 1 each having a small size (1 block) are set in parallel on the support frame 25 (see Fig. 8) in parallel with each other, and The connected flexible boards 5a and 5b are connected to the odd-numbered and even-numbered corresponding boards 6a and 6b of the relay board 6, respectively, so as to be sorted into odd-numbered and even-numbered ones. It is composed entirely by connecting to the main body 7.

At this time, since the types of liquid crystal panels are different for the terminal conductive patterns 4, the arrangement of the probes 2 in the probe block 1, the number of wirings and the wiring positions of the flexible board 5 and the relay board 6 are subject to inspection. It is designed to match the terminal conductive pattern 4 of the liquid crystal panel array glass 3.

That is, FIGS. 11 (a) to 11 (d) show terminal conductive patterns per block printed on the liquid crystal panel array glass 3. FIG. And, for example, the conductive pattern 4 A for the terminal of the liquid crystal panel of the type A has 384 signal lines S and It consists of four function lines F and F arranged on both sides of the signal line S (see Fig. 11 (a)). Also, for example, the terminal conductive pattern 4 B of the B-type liquid crystal panel is composed of 384 signal lines S and two function lines F, F arranged on both sides of the signal lines S. (See Figure 11 (b)). Also, for example, the conductive pattern 4C for terminal of the liquid crystal panel of C type is composed of 384 signals and lines S and 8 function lines F and F arranged on both sides of this signal US. (See Figure 11 (c)). Furthermore, for example, the conductive pattern 4D for terminals of the liquid crystal panel of the D type is composed of 384 signal lines S and four functional lines F which are provided on both sides of the signal lines S and are spaced apart by two lines. And F (see Fig. 11 (d)).

In FIG. 11, reference numerals Ll and L2 denote probes 2 in probe block 1 corresponding to odd-numbered and even-numbered terminal conductive patterns 4A (4B, 4C, .4D), respectively, as described above. These two lines are shown, and a dedicated probe block is used in which the arrangement and the number of probes 2 constituting the two lines Ll and L2 differ depending on the type of liquid crystal cell.

That is, the probe block 1A is applied to the type A (conductive pattern 4A for terminals), the probe block 1B is applied to the type B (conductive pattern 4B for terminals), and the probe block 1B is applied to the type C (conductive pattern 4A for terminals). Probe block 1C is applied to C), and probe block 1D is applied to D type (conductive pattern for terminal 4D).

FIGS. 12 (a) and 12 (b) show the terminal conductive pattern 4 per block printed on the liquid crystal panel array glass, the probe 2, the flexible / lead substrate 5, and the relay substrate 6. Shows the connection state.

That is, FIG. 12 (a) shows the connection state of the liquid crystal panel of the type A described above. The probe 2 and the flexible board 5 are connected one-to-one to the terminal conductive pattern 4A. At the same time, the flexible board 5 and the relay board 6 are connected one to one.

Fig. 12 (b) shows the connection status of the above-mentioned B type LCD panel. The probe 2 and the flexible board 5 are connected one-to-one to the terminal conductive pattern 4B, and the flexible board 5 and the relay board 6 are also connected one-to-one. In FIGS. 12 (a) and (b), the solid lines shown in the portions of the flexible board 5 and the relay board 6 indicate the respective wirings of the flexible board 5 and the relay board 6. .

As described above, also in the flexible board 5 and the relay board 6, a dedicated flexi board and a relay board having different wiring arrangements and numbers depending on the type of liquid crystal panel are applied. In other words, for Type A (terminal conductive pattern 4A), the odd-numbered (even-numbered) flexible board 5a (5b) and odd-numbered (even-numbered) corresponding board 6a (6b) ) For the S and B types (conductive patterns for terminals 4 B), the flexible board 5 a (5 b) for odd (even) and the board 6 a (6) for odd (even) with four wires b) is applied respectively. In the conventional inspection apparatus for a liquid crystal panel configured as described above, the probe 2 is divided into two lines L1 and L2 corresponding to the odd-numbered and the even-numbered of the terminal conductive pattern 4, respectively. 1 and 2 are arranged in a zigzag pattern, so that the pitch of the conductive pattern for terminals can be reduced sufficiently.However, the number of probes 2 in the probe block 1, the arrangement position, and flexibility Since the number of wirings and wiring positions of the substrate 5 and the relay substrate 6 are designed to match the conductive patterns 4 for the terminals of the array glass 3 for the liquid crystal panel as a test object, a certain type The probe block, flexible board, and relay board designed for this type of liquid crystal panel cannot be applied to other types of liquid crystal panels.

For this reason, the conventional liquid crystal panel inspection device cannot mass-produce the probe block, the flexible substrate, and the relay substrate, and each time, these terminals are used as terminals of the liquid crystal panel array glass as a test object. Since it is necessary to manufacture a new one in conformity with the conductive pattern, it has the problem that not only the cost is increased but also the manufacturing time is lengthened and the manufacturing process within the delivery date is complicated. .

Therefore, the present invention relates to a method for inspecting liquid crystal panels of different types. As a result, the probe block, flexible board, and relay board can be shared, and by mass production of these components, the LCD panel can be manufactured easily, reducing costs and shortening delivery times. It is intended to provide an inspection device for use. DISCLOSURE OF THE INVENTION-The object of the present invention is to solve at least the above-mentioned problems.

In the inspection apparatus for a liquid crystal panel according to the present invention, a probe of a probe block is brought into contact with a conductive pattern for a terminal of an array glass for a liquid crystal panel, and a signal from the conductive pattern for a terminal is connected to one end of the probe. The short circuit state, the open state, and the TFT state of the terminal conductive pattern are obtained by reading with the tester main body via a flexible board connecting the other side and a relay board connected to the other end of the flexible board. In a liquid crystal panel inspection device for inspecting characteristics and pixel characteristics, the probe block comprises a conductive pattern for a basic terminal from a maximum number of function lines and signal lines based on required specifications of the liquid crystal panel. A plurality of insertion holes for inserting the probe are formed so as to correspond to each wiring of the whole when Of 揷入 hole, characterized in that it is constructed by inserting the probe into the insertion hole matching the respective wires constituting the terminal conductive patterns Areigarasu for test liquid crystal panel.

For this reason, in the present invention, the plurality of insertion holes of the probe block are formed so as to correspond to each wiring of this pattern, assuming a basic terminal conductive pattern. At this time, the conductive pattern for the basic terminal is composed of the maximum number of function lines and signal lines based on the required specifications of the liquid crystal panel, so the probe block has the maximum number of input holes. The probe is inserted only into the holes matching the number of the holes and the lines that make up the conductive pattern for the terminals of the array glass for the liquid crystal panel under test. The entry hole where the probe is not inserted is left as a hole. This allows the probe block to be applied in common between different types of LCD panels. Can be used.

The foregoing and other objects, features, and advantages of the present invention will be apparent from the following detailed description of the invention. BRIEF DESCRIPTION OF THE FIGURES

FIG. 1 shows a probe block per probe of a terminal conductive pattern of a liquid crystal panel array glass, a probe inserted into an insertion hole of a probe block, a flexible board, FIG. 4 is a schematic diagram illustrating a mutual electrical connection state of the relay board and the relay board. FIG. 2 shows a probe block and a prop block per block of a conductive pattern for a terminal of an array glass for a liquid crystal panel in a liquid crystal panel inspection apparatus of the present invention when applied to a type A liquid crystal panel. FIG. 3 is a schematic diagram illustrating a mutual electrical connection state of a probe, a flexible board, and a relay board inserted into an inlet. FIG. 3 is a diagram showing a probe block and a probe block per block of a conductive pattern for a terminal of a liquid crystal panel array glass of the liquid crystal panel inspection apparatus of the present invention when applied to a type B liquid crystal panel. FIG. 4 is a schematic diagram illustrating a mutual electrical connection state of a probe, a flexible board, and a relay board inserted into an inlet. Fig. 4 shows the inspection block for a liquid crystal panel according to the present invention when applied to a liquid crystal panel of the C type, in which the probe block per block of the conductive pattern for the terminal of the array glass for the liquid crystal panel and the insertion hole of the probe block. FIG. 4 is a schematic diagram illustrating an electrical connection state between an inserted probe, a flexible board, and a relay board. FIG. 5 shows the probe block and probe block per block of the conductive pattern for the terminal of the array glass for the liquid crystal panel of the liquid crystal panel inspection apparatus of the present invention when applied to the liquid crystal panel of the D type. FIG. 4 is a schematic diagram illustrating a mutual electrical connection state of a prop, a flexible board, and a relay board inserted into a hole. FIG. 6 is a plan view for explaining an electrical connection state on a single-sided substrate of the liquid crystal panel inspection device of the present invention, which is a single-sided substrate. FIG. 7 shows the electrical connection state of the liquid crystal panel inspection device of the present invention on a relay substrate composed of a double-sided substrate or a multilayer substrate. It is a top view explaining a state. FIG. 8 is a schematic explanatory view for explaining an entire electric connection system gun of the inspection apparatus for a liquid crystal panel. FIG. 9 is a sectional view of a main part of a conventional inspection device for a liquid crystal panel. FIG. 10 is an explanatory diagram for explaining a contact state of a probe with a terminal conductive pattern of a conventional liquid crystal panel detection device. FIGS. 11A, 11B, 11C, and 11D are plan views of a conductive pattern for a terminal of a liquid crystal panel of a different type per block. Fig. 12 shows (a) and (b), the per-block conductive pattern for the terminal of the liquid crystal panel array glass of the conventional liquid crystal panel inspection device when applied to different types of liquid crystal panels. FIG. 3 is a schematic diagram illustrating a mutual connection between a probe block, a probe inserted into an insertion hole of a probe block, a flexible board, and an intermediate board. FIG. 13 is a perspective view of another inspection apparatus for a liquid crystal panel.

BEST MODE FOR CARRYING OUT THE INVENTION

Hereinafter, embodiments of the present invention will be described in detail. The present invention is not limited by the embodiment.

The liquid crystal inspection device of the present invention will be described based on the following embodiments shown together with the attached drawings.

Hereinafter, embodiments of the present invention will be described with reference to the drawings. The same members as those shown in FIGS. 8 to 13 are denoted by the same reference numerals. The inspection device for a liquid crystal panel according to the present invention is different from the conventional device only in the structure of the constituent members, and the whole connection system gun is the same as the conventional device.

That is, as shown in FIG. 8, the general connection system of a general liquid crystal panel inspection apparatus applicable to the present invention is such that the probe 2 of the probe block 1 is connected to the conductive pattern for the terminal of the liquid crystal panel glass 3. 4 and a signal from the conductive pattern 4 for terminals is connected to the probe 2 via a probe 2, a flexible substrate 5 connected to one end of the probe 2 and a relay substrate 6 connected to the other end of the flexible substrate 5. The terminal conductive pattern 4 can be short-circuited, opened, It is configured to inspect TFT characteristics and pixel characteristics.

At this time, the connection between the probe 2 and the flexi-nore board 5 can be made by directly connecting the tip of the probe 2 to the conductive portion of the flexi-nore board 5 or by an indirect connection via a printed circuit board fixed to the probe block 1. Connections have also been adopted. For this indirect connection, for example, the tip of the probe 2 is brought into contact with one end of the printed circuit board, and the flexible substrate 5 is connected to the other end with, for example, a connector, an anisotropic adhesive, solder, or the like. Done by

FIG. 1 is a schematic diagram for explaining the structure of each constituent member per unit block from the probe block 1 to the relay board 6 and the connection state between the constituent members in the liquid crystal panel inspection apparatus according to the present invention. FIG.

First, the probe block 1 is designed so that the maximum number of function lines F and signal lines S based on the required specifications of the liquid crystal panel constitutes the basic terminal conductive pattern 4S, so that the probe block 1 corresponds to each line. A plurality of input holes 16 (see FIG. 9) into which the second liquid crystal panel 2 is inserted are formed, and among the plurality of input holes 16, holes corresponding to the lines constituting the conductive pattern for terminals of the test liquid crystal panel are formed. It is configured by inserting probe 2 into inlet 16. In FIG. 1, a white circle on the conductive pattern 4 S for the basic terminal indicates an insertion hole 16 where the probe 2 is not inserted, and a black circle indicates an insertion hole 16 where the probe 2 is inserted. I have.

Here, the number of the maximum number of functional lines F based on the required specifications of the liquid crystal panel is less than 20.

The basic terminal conductive pattern 4S is a virtual pattern obtained from an empirical rule composed of a signal line S determined by the number of bits of a dry IC that drives a liquid crystal panel and a functional line F that differs according to the specifications required by each user. The signal S arranged in the center is composed of 240 to 480 wires, and the function lines F arranged on both sides of the signal line S are composed of 3 to 20 wires. By composition + it is composed entirely. The probe block 1 has a plurality of insertion holes 16 corresponding to the respective lines of the basic terminal conductive pattern 4S. For example, 23 2 to 5 20 insertion holes 16 are provided. Provided. At this time, 116 to 260 insertion holes 16 are respectively provided in the two lines L 1 and L 2 of the probe 2 in the probe block 1.

The case where the number of the input holes 16 is S2 32 is the case where the number of the function lines F is set to 20 and the number of the function lines F is assumed to be 19 2. In addition, the case where the number of the insertion holes 16 is 520 is the case where the number of the functional lines is set to 20 and the number of the functional lines is assumed to be 480.

As described above, the plurality of insertion holes 16 of the probe block 1 are formed as corresponding to the respective lines of the pattern 4S, assuming the basic terminal conductive pattern 4S. At this time, the conductive pattern 4 S for the basic terminal is composed of the maximum number of function lines F and the signal lines S based on the required specifications of the liquid crystal panel according to empirical rules, so the probe block 1 is the maximum number determined by empirical rules. Of the maximum number of holes 16, the holes 16 that match the lines constituting the conductive patterns for the terminals of the array glass 3 for the LCD panel under test are provided. It is composed by inserting probe 2 only. The insertion hole 16 into which the probe 2 is not inserted is left as a hole. As a result, the prop block 1 can be applied commonly to liquid crystal panels of different types.

As a result, mass production can be performed at once, and inventory management can be performed in advance. As a result, no time is required for delivery, which can contribute to a reduction in the cost of the inspection apparatus for liquid crystal panels.

Preferably, the flexible substrate 5 in the present device matches the odd-numbered and even-numbered functional lines F and the signal lines S among the functional lines F and the signal lines S of the conductive pattern 4 S for the basic terminal, respectively. It comprises an odd-numbered corresponding substrate 5a and an even-numbered corresponding substrate 5b formed with the number and arrangement of conductors 17a and 17b, respectively. The odd-numbered substrate 5a and the even-numbered substrate 5b are composed of, for example, 125 to 260 conductors 17a and 17b, respectively.

This flexible substrate 5 not only has an odd-numbered substrate 5a and an even-numbered substrate 5b, but also has an increased number of conductive patterns for terminals and a narrower pitch. If you want to go to step 5, connect the odd-numbered board 5a and the even-numbered board 5b to In some cases, two (or more) are provided.

In this configuration, all the functions of the flexible substrate 5 and the conductive pattern 4 S for the basic terminal, 锒 F and the signal line S are targeted, and the number of the arrangement corresponding to the odd-numbered all function lines F and the signal line S is The odd-numbered flexible board 5 a having the conductor 1 Ί a and the even-numbered flexible board 5 b having the number and arrangement of the conductors 17 b corresponding to the even-numbered all function lines F and the signal lines S Therefore, even if the insertion hole 16 into which the probe 2 is inserted is any of the insertion holes 16 of the probe block 1, the connection with the probe 2 can be achieved. At this time, the conductor 17 a (17 b) corresponding to the insertion hole 16 (indicated by a white circle in the figure) into which the probe 2 is not inserted remains as an unconnected conductor. Thus, the flexible substrate 5 can be applied commonly to liquid crystal panels of different types.

More preferably, the relay board 6 in the present device includes a functional section 18 and a signal section 19 corresponding to the functional line F and the signal line S constituting the basic terminal conductive pattern 4S, respectively. 18 is composed of odd-numbered functional sections 18a and 18b corresponding to odd-numbered flexible boards 5a and even-numbered flexible boards 5h, respectively, and signal section 19 is composed of odd-numbered flexible boards 5 a and an even-numbered corresponding signal section 19 a and an even-numbered corresponding signal section 19 formed with conductors 26 and 27 of the number and arrangement corresponding to the a and even-numbered flexible boards 5 b respectively. The odd-numbered function section 18a and the odd-numbered signal section 19a constitute the odd-numbered board 6a, and the even-numbered function section 18b and the even-numbered signal section 19b form an even-numbered board 6b. Make up the whole It has been made.

At this time, the odd-numbered flexible board 5a and the odd-numbered function section 18a and the even-numbered flexible board 5b and the even-numbered function section 18b are connected via jumper wires 28, respectively. Flexible board 5 a and odd-numbered signal section 19 a and even-numbered flexi-pole board 5 b and even-numbered signal section 1 9 b force Conductor 2 6/1 7 corresponding to probe 2 inserted into input hole 16 a and 27/17 b are connected together. Usually, connectors are used to connect these conductors. You.

In this configuration, the relay board 6 includes the functional parts 18 and the signal parts 19 corresponding to the functional lines F and the signal lines S that constitute the conductive pattern 4S for the basic terminals, respectively. The signal section 19 can correspond to the maximum number of function lines F and signal lines S based on the required specifications of the liquid crystal panel array glass 3. At this time, the odd-numbered function part 18a and the even-numbered function part 18b that constitute the function part 18 are connected to the odd-numbered flexible board 5a and the even-numbered flexible board 5b, respectively. The connection is made via a connection, so that the necessary parts can be connected accurately, and the other odd-numbered function sections 18a and even-numbered function sections 18b that are not involved in the connection remain unconnected function sections. Will be left.

The connection by the jumper wire 28 is specifically performed as follows. That is, as shown in FIG. 6 and FIG. 7, the relay board 6 is composed of two connectors C1 and C2, which are fixed at appropriate intervals, and the two connectors C1 and C2. A signal line S that is electrically connected between C2 and a functional line F that is electrically connected at both ends to the two connectors C1 and C2 and divided at the middle part And a pair of terminal portions f 1 and f 2 that are respectively connected to both ends of the divided portion of the functional line F and are exposed and arranged. , F2 by connecting a jumper wire 28. At this time, the odd-numbered (even-numbered) flexible board 5a (5b) is connected to one of the two connectors C1 and C2, and the other connector C1 is connected to the tester body. The flexible substrate 21 (23) connected to 7 is connected.

FIG. 6 shows an example in which the relay board 6 is formed by a single-sided board, and FIG. 7 shows an example in which the relay board 6 is formed by a double-sided board or a multilayer board. In FIG. 7, reference numeral h denotes a through horn for electrically connecting wirings respectively provided on the upper surface and the lower surface of the substrate.

As shown in FIG. 1, the odd-numbered signal portion 19a and the even-numbered signal portion 19b that constitute the signal portion 19 are respectively composed of an odd-numbered flexible substrate 5a and an even-numbered number. Corresponds to the flexible board 5b by connecting the conductors 26 / 17a and 27 / 17b corresponding to the probe 2 inserted into the inlet 16 and other odd numbers that are not involved in the connection The signal section 19a and the even-numbered signal section 19b are left as they are as the unconnected signal section. As a result, the relay board 6 can be applied commonly to liquid crystal panels of different types.

Specifically, the conductor 26 (27) is connected between the one connector connected to the odd-numbered (even-numbered) flexible board 5, a (5b) and the other connector connected to the tester body 7. Are connected on the relay board 6 so as to be connected. Hereinafter, specific examples shown in FIGS. 2 to 5 will be described. 2 to 5, black circles corresponding to the two lines L1 and L2 indicate the input holes 16 into which the probe 2 is inserted, and white circles corresponding to the two lines L1 and L2. The insertion hole 16 into which the probe 2 is not inserted is shown.

This apparatus applied to this specific example is composed of a probe block 1 provided with 200 input holes 16 in each of two lines Ll and L2, and an odd-numbered flexible substrate 5 provided with 200 conductors 17a. The flexible board 5 is composed of an even-numbered flexible board 5b provided with a and 200 conductors 17b, and the relay board 6 is composed of an odd-numbered board 6a and an even-numbered board 6b.

More specifically, the relay board 6 includes a total of 384 conductors 26 and 27 of the odd-number corresponding signal portion 19a and the even-number corresponding signal portion 19b, and the odd-number corresponding signal portion 19a The odd-numbered function board 18a including three terminals F1, F2, and F3 provided on both sides of the odd-numbered function section 18a, 18a, and the even-numbered signal section 19b and both sides thereof And an even-numbered circuit board 6 including three even-numbered function units 18b and 18b each including three terminals Fl, F2, and F3. The three terminals F1, F2, and F3 constituting the odd-numbered function unit 18a and the even-numbered function unit 18b conform to the tester specifications.

FIG. 2 shows an example of application to a type A liquid crystal panel having a conductive pattern 4A for terminals. This device uses a probe 2 inserted into an input hole 16 corresponding to all wiring of the conductive pattern 4A for terminals. By inserting the probe block, the probe block 1 corresponding to the terminal conductive pattern 4A can be configured. All the probes 2 of the probe block 1 are connected to the corresponding conductors 17a and 17b of the flexible board 5. The terminal conductive pattern 4A includes 384 signal lines and four functional lines formed on both sides of the signal lines.

Further, the relay board 6 has the odd-numbered functional sections 18a and 18a provided on the odd-numbered board 6a, and the terminals F1 and F2 of the odd-numbered board 18a are connected to the conductors 17a of the odd-numbered flexible board 5a. And the terminals F 1 and F 2 of the even-numbered function section 18 b and 18 b provided on the even-numbered board 6 are connected to the conductors 17 of the even-numbered flexible board 5 via jumpers 28. The odd-numbered flexible board 5a and the odd-numbered signal section 19a and the even-numbered flexible board 5 and the even-numbered signal section 19b are connected to the probe 2 inserted into the input hole 16. The corresponding conductors 26 / '17a and 27 / 17b are connected together.

Fig. 3 shows an example of application to a B-type LCD panel having terminal conductive patterns 4B.This device uses the same probe block 1, flexible board 5, and It is configured using the relay board 6. The terminal conductive pattern 4B includes 384 signal lines and two functional lines formed on both sides of the signal lines.

At this time, the probe block 1 is configured by inserting the probe 2 into the insertion hole 16 corresponding to all wirings of the terminal conductive pattern 4B. All the probes 2 in the probe block 1 are connected to one end of the flexible board 5a or 5b corresponding to the odd and even number, and the flexible board 5a corresponds to the odd and even number of the flexible board 5a. And the other end of 5b are connected to odd-even board 6a and 6b of relay board 6, respectively. At this time, the functional section 18 is connected to the odd-numbered and even-numbered flexible boards 5a and 5b via the jumper line 28 with the odd-numbered and even-numbered functional sections 18a and 18b connected to the odd-numbered and even-numbered flexible boards 5a and 5b, respectively. Signal section 19 is odd and even corresponding signal sections 19a and 19b and odd The flexible substrates 5a and 5b corresponding to the even number and the conductors corresponding to the probe 2 inserted into the force input holes 16 are connected to each other.

Fig. 4 shows an example of application to a C-type liquid crystal panel having terminal conductive patterns 4C.This device uses the same probe block 1, flexible substrate 5, And a relay board 6. The terminal conductive pattern 4C is composed of 384 signal lines and eight function lines formed on both sides of the signal lines.

At this time, the probe block 1 is configured by inserting the probe 2 into the insertion hole 16 corresponding to all wirings of the terminal conductive pattern 4C. All probes 2 in the probe block 1 are connected to one end of the flexible board 5a or 5b corresponding to the odd and even number of the flexible board 5, and the flexible board 5 is connected to the odd and even number flexible board. The other ends of the boards 5a and 5b are connected to the odd and even corresponding boards 6a and 6b of the relay board 6, respectively. At this time, the functional section 18 is connected to the odd and even flexible boards 5a and 5 by connecting the terminals F1, F2 and F3 of the odd and even functional sections 18a and 18b via the jumper wire 28. b (the terminal F 2 is connected by two jumper wires 28), and the signal section 19 is connected to the odd and even corresponding signal sections 19a and 19b. The odd-numbered and even-numbered flexible boards 5a and 5b are connected to the conductors corresponding to the probes 2 inserted into the force input holes 16 by connection.

Fig. 5 shows an example of application to a liquid crystal panel of type D having a conductive pattern 4D for terminals.This device uses the same probe block 1, flexible board 5, and It is configured using the relay board 6. The terminal conductive pattern 4D is composed of 384 signal lines and four functional lines formed on both sides of the signal line and separated by two.

At this time, the probe block 1 is configured by inserting the probe 2 into the insertion hole 16 corresponding to all wirings of the terminal conductive pattern 4D. All the probes 2 in the prop block 1 are connected to the odd-even The other ends of the flexible boards 5 a and 5 b are connected to one end of the flexible boards 5 a and 5, respectively, and the other ends of the odd- and even-numbered boards 6 of the relay board 6 are respectively connected to the odd-numbered and even-numbered flexible boards 5 a and 5 b. Connected to a and 6b. At this time, the functional section 18 is connected to the odd- and even-numbered flexible board 5 via two jumper lines 28 where the terminals F1 and F2 of the odd-numbered and even-numbered functioning sections 18a and 18b intersect. a and 5b, respectively, and the signal part 19 is composed of the odd-numbered and even-numbered signal parts 19a and 19 and the odd-numbered even-numbered flexible boards 5a and 5b. It is connected by the connection between the conductors corresponding to the probe 2 inserted in 6.

As described above, the inspection device for liquid crystal panels applied to the liquid crystal panels of types A to D shown in FIGS. 2 to 5 respectively has a configuration in which the conductive pattern for terminals of the liquid crystal panel array glass 3 differs depending on the type. Regardless, the probe block 1 in which the probe 2 is not inserted, the flexible board 5, and the relay board 6 can be configured in common.

In the above specific description, the case of 384 signal lines has been specifically described, but the present invention is not limited to this. For example, 420, 480, etc. It is needless to say that the present invention can be applied to the signal lines.

As described above, according to the present invention, the insertion hole into which the probe is inserted is a conductive hole for a basic terminal composed of the maximum number of function lines and signal lines based on the required specifications of the liquid crystal panel according to empirical rules. Assuming a pattern, it is formed as one corresponding to each wiring of this pattern.Therefore, the number of probe blocks is much larger than the number of wiring of conductive pattern for terminal of array glass for test liquid crystal panel of each type. And the insertion hole. For this reason, the probe block can be configured by inserting the probe only into the insertion hole corresponding to each wiring of the conductive pattern for the terminal of the array glass for the test liquid crystal panel, and the probe is not inserted. The probe block can be applied in common to different types of liquid crystal panels, so that mass production of the probe block facilitates production, reduces cost and shortens delivery time. A liquid crystal panel inspection device that can be provided.

Further, according to the present invention, the flexible substrate is intended to cover all functional lines and signal lines of the conductive pattern for the basic terminal, and the number of conductors arranged in the same number as the odd-numbered all functional lines and signal lines. Since it is composed of an odd-numbered flexible board having an odd-numbered flexible board and an even-numbered flexible board having a number and arrangement of conductors corresponding to all even-numbered function lines and signal lines, an insertion hole for inserting a probe Can be connected to the probe regardless of the entirety of the insertion hole of the probe block, and in addition to the effects of the present invention, a flexible substrate can be shared between different types of liquid crystal panels. Therefore, mass production of flexible substrates makes it easy to manufacture, reduces costs and shortens delivery times.

Further, according to the present invention, the relay board includes a functional unit and a signal unit corresponding to the functional line and the signal line configuring the conductive pattern for the basic terminal, respectively, and an odd number configuring the functional unit. The corresponding function unit and the even-numbered function unit are connected to the odd-numbered flexible board and the even-numbered flexible board via a jumper line, respectively, and the odd-numbered signal unit and the even-numbered signal unit constituting the signal unit are respectively connected to each other. In addition to the effects of the invention, the relay board can be connected to the odd-numbered flexible board and the even-numbered flexible board by connecting the conductors corresponding to the probes inserted into the insertion holes. It can be applied in common between different liquid crystal panels, and as a result, mass production of relay boards makes it easy to manufacture, Delivery time can be shortened together. Industrial applicability

As described above, the liquid crystal inspection apparatus according to the present invention can be configured by inserting the prop only into the insertion hole corresponding to each wiring of the terminal conductive pattern of the array glass for the test liquid crystal panel. In addition, a probe block without a probe can be commonly applied to different types of liquid crystal panels, thereby reducing costs and shortening delivery times. Applied to panel inspection Probe blocks can be shared between inspection devices, and used to inspect the short-circuit state, open state, TFT characteristics, and pixel characteristics of conductive patterns printed on LCD glass for LCD panels. It is suitable.

Claims

The scope of the claims

1. A probe of the probe block is brought into contact with the conductive pattern for the terminal of the array glass for the liquid crystal panel, and a signal from the conductive pattern for the terminal is connected to the probe, the flexible board for connecting one end to the probe. , And a short circuit state, an open state, a TFT characteristic, and a pixel characteristic of the conductive pattern for the terminal are read by the tester body via a relay board connected to the other end of the flexible substrate. In the inspection equipment for liquid crystal panel which performs the inspection,

The probe block includes a plurality of probes for inserting the probes so as to correspond to the entire wiring when a basic terminal conductive pattern is formed from the maximum number of function lines and signal lines based on the required specifications of the liquid crystal panel. And by inserting the probe into an insertion hole corresponding to each wiring constituting a conductive pattern for a terminal of the array glass for a test liquid crystal panel among the plurality of insertion holes. Inspection equipment for liquid crystal panels characterized by the fact that:

2. The inspection apparatus for a liquid crystal panel according to claim 1, wherein

The flexible substrate is formed to have the number and arrangement of conductors corresponding to the odd-numbered and even-numbered function lines and the signal lines, respectively, of the functional lines and the signal lines of the conductive pattern for the basic terminal. A liquid crystal panel inspection device comprising an odd-numbered flexible substrate and an even-numbered flexible substrate.

3. The inspection device for a liquid crystal panel according to claim 1, wherein

The maximum number of functional lines based on the required specifications of the liquid crystal panel is 20 or less, an inspection apparatus for a liquid crystal panel.

4. The inspection apparatus for a liquid crystal panel according to claim 2, wherein The relay board includes a functional section and a signal section respectively corresponding to the functional line and the signal line constituting the conductive pattern for the basic terminal, and the functional section is respectively provided on the odd-numbered flexible board and the even-numbered flexible board. A corresponding odd-numbered function unit and an even-numbered function unit, and the signal unit is formed with the number and arrangement of conductors corresponding to the odd-numbered flexible board and the even-numbered flexible board, respectively. An odd-numbered function unit and an odd-numbered signal unit to form an odd-numbered substrate, and an even-numbered substrate by the even-numbered function unit and the even-numbered signal unit. The odd-numbered flexible substrate, the odd-numbered functional unit, The even-numbered flexible substrate and the even-numbered function unit are connected via jumpers, respectively, and the odd-numbered flexible substrate and the odd-numbered signal unit, and the even-numbered flexible substrate and the even-numbered signal unit, An inspection device for a liquid crystal panel, wherein the inspection device is connected by connecting conductors corresponding to the probe inserted into the insertion hole.