JP3561322B2

JP3561322B2 - Conductive contact unit

Info

Publication number: JP3561322B2
Application number: JP05333695A
Authority: JP
Inventors: 栄二綿谷
Original assignee: NHK Spring Co Ltd
Current assignee: NHK Spring Co Ltd
Priority date: 1995-02-17
Filing date: 1995-02-17
Publication date: 2004-09-02
Anticipated expiration: 2019-09-02
Also published as: JPH08222299A

Description

【０００１】
【産業上の利用分野】
本発明は、プリント配線板や電子素子等との間に於いて電気信号を授受するのに適する導電性接触子ユニットに関し、特に、複数の導電性針状体を用いて多点同時に電気信号の授受を行うのに適する導電性接触子ユニットに関する。
【０００２】
【従来の技術】
従来、プリント配線板の導体パターンや電子素子などの電気的検査を行うためのコンタクトプローブに用いられる導電性接触子には、導電性針状体と、その針状体を軸線方向に変位自在に受容する筒状のホルダとを有し、針状体の先端をホルダの一端から突出させる向きにコイルばねにて弾発付勢しておき、針状体の先端を被測定物に弾発的に接触させるようにしたものがある。
【０００３】
上記したような導電性接触子として、例えば実開昭６０−１５４８６８号公報に開示されているように、一対の導電性針状体をホルダの軸線方向両端にてそれぞれ出没自在にした両端可動型のものがある。この両端可動型の導電性接触子は、２つの回路基板同士を結合して製品化するものに於いて、両基板同士を結合する前に両者間を仮接続して検査を行う際に用いるのに適する。
【０００４】
そのような検査を行うものとして液晶パネルの点灯検査やアレイ基板検査があり、液晶パネルを構成するＴＦＴアレイ基板の特性検査の場合には、パネル点灯駆動用ＬＳＩとしてのＴＡＢ及びＰＣＢ（実装プリント基板）を結合する前工程で、液晶パネルの画素信号端子用導電パターンの１本ずつに電圧を印加して特性試験を行っている。その際に、画素信号端子用導電パターン数と同数の導電性接触子を用いるため、複数の導電性接触子を有する導電性接触子ユニットを液晶パネルの端子用導電パターンを設けられた辺に沿って並べてセットする。
【０００５】
ところで、液晶パネルに於いて、画素信号ライン（Ｘ軸方向）用と走査ライン（Ｙ軸方向）用とにそれぞれ複数のＴＡＢを並べて配設しており、図５（ａ）に示されるようにＸ軸方向については液晶パネルの一対の対向する両辺にそれぞれＴＡＢを配設する両ＴＡＢ型の液晶パネル２２があった。しかしながら、両ＴＡＢ型のものにあっては、対向する２辺にそれぞれＴＡＢを配設していることから、液晶パネル２２全体に対する表示エリアが狭くなるという問題があり、表示エリアの拡大または小型化のためにＸ軸・Ｙ軸方向の各一辺のみにＴＡＢを配設する片ＴＡＢ型の液晶パネル２（図５（ｂ）参照）が用いられるようになってきた。
【０００６】
前記した特性検査では、奇数番目画素端子と偶数番目画素端子とに分けて画素検査信号を送るようにしており、両ＴＡＢ型液晶パネル２２では奇数番目・偶数番目用に各辺に分かれて各端子用導電パターン２２ａ・２２ｂが配設されており、検査機器側の信号も奇数番目・偶数番目用の基板に分かれて出力されている。従って、片ＴＡＢ型液晶パネル２に於いても、その片側に集中する端子用導電パターン２ａの奇数番目画素用と偶数番面画素用とに分けて検査を行う必要がある。また、両ＴＡＢ型のものに対して、１辺に画素信号を集中させる片ＴＡＢ型のものでは狭ピッチ化に対応し得る導電性接触子ユニットを用いる必要があるという問題が生じた。
【０００７】
【発明が解決しようとする課題】
このような従来技術の問題点に鑑み、本発明の主な目的は、被検査体の端子用導電パターンの狭ピッチ化に対応し得る導電性接触子ユニットを提供することにある。
【０００８】
【課題を解決するための手段】
このような目的は、本発明によれば、被検査体に互いに並列に設けられた複数の端子用導電パターンと検査機器側の複数の信号伝送用導電パターンとを互いに電気的に接続するための複数の導電性接触子を有する導電性接触子ユニットであって、前記導電性接触子が、絶縁性支持部材に設けた貫通孔内に同軸的に受容された導電性圧縮コイルばねと、前記貫通孔の両開口端から出没可能なように前記圧縮コイルばねの両端に結合された一対の導電性針状体とからなると共に、前記複数の端子用導電パターンに対応しかつ前記複数の端子用導電パターンの奇数番目に対応するものと偶数番目に対応するもの同士が互い違いになるように千鳥状に配設され、かつ前記奇数番目に対応する奇数列と前記偶数番目に対応する偶数列とに分けられ、該各列内に於いて隣り合うもの同士が前記端子用導電パターンの延在方向に相対的にずれるように配設されていることを特徴とする導電性接触子ユニットを提供することにより達成される。特に、前記複数の導電性接触子の各前記一対の導電性針状体の前記信号伝送用導電パターンに接触する方が、前記複数の端子用導電パターンの奇数番目に対応するものと偶数番目に対応するもの同士間で突出方向に段違いにされ、前記複数の信号伝送用導電パターンの前記奇数番目に対応するもの同士と前記偶数番目に対応するもの同士とが互いに重なり合うようにされた別々の基板に設けられていると良い。
【０００９】
【作用】
このようにすれば、導電性接触子ユニットに複数の導電性接触子が被検査体の端子用導電パターンの奇数番目と偶数番目とに分けてそれぞれ互い違いになるように千鳥状に配設されていることから、互いの干渉を回避しかつ端子用導電パターンのピッチ方向に好適に狭ピッチ化することができる。また、一対の導電性針状体の信号伝送用導電パターンに接触する方を、複数の端子用導電パターンの奇数番目に対応するものと偶数番目に対応するもの同士間で突出方向に段違いにすると共に、互いに重なり合うようにされた別々の基板にそれぞれ信号伝送用導電パターンを設けかつ奇数番目用と偶数番目用とに分けることにより、狭ピッチ化した信号伝送用導電パターンの基板を作ることなく対応し得る。また、導電性接触子を奇数番目に対応する奇数列と偶数番目に対応する偶数列とに分け、各列内に於いて隣り合うもの同士を端子用導電パターンの延在方向に相対的にずれるように配設することにより、より一層狭ピッチ化し得る。
【００１０】
【実施例】
以下、本発明の好適実施例を添付の図面について詳しく説明する。
【００１１】
図１は本発明に基づく導電性接触子ユニット１の模式的側断面図であり、図２は図１のＩＩ−ＩＩ線に沿って見た断面図である。本導電性接触子ユニット１は、被検査体としての液晶パネル２にパネル点灯駆動ＬＳＩとしてのＴＡＢを結合する前工程で行う特性検査に用いられるものである。特性検査としては、従来例で示したように液晶パネルの画素信号端子用導電パターンの１本ずつに電圧を印加して特性試験を行っている。
【００１２】
図に示されるように、本導電性接触子ユニット１は、液晶パネル２のセルの画素信号用の複数の端子用導電パターン２ａの１本ずつに接触させるための複数の導電性接触子３を板状の絶縁体を積層した本体４により支持している。本体４は、図に於ける下側から、比較的薄い板状の合成樹脂製の下側絶縁体５と、比較的厚い板状の２枚の合成樹脂製中間絶縁体６・７と、比較的薄い板状の合成樹脂製の上側絶縁体８とをこの順に積層して形成されている。それら積層された各絶縁体５〜８を上下方向に貫通するように導電性接触子３が設けられている。
【００１３】
両中間絶縁体６・７には比較的大径の支持孔６ａ・７ａが同軸的に連通して形成され、下側及び上側の各絶縁体５・８内には支持孔６ａ・７ａよりも若干縮径された小径孔５ａ・８ａが同軸的に形成されている。支持孔６ａ・７ａ内には導電性コイルばね９が同軸的にかつある程度圧縮された状態で受容されており、そのコイルばね９の軸線方向両端部に、互いに相反する向きに突出する下側及び上側の各導電性針状体１０・１１ａがそれぞれ結合されている。
【００１４】
各導電性針状体１０・１１ａは、支持孔６ａ・７ａ内に受容された部分に小径孔５ａ・８ａよりも大径の外向フランジ部を有し、外向フランジ部から同軸的に支持孔６ａ・７ａ内側に突出する軸部に前記コイルばね９の軸線方向端部を巻着かつ半田付けされている。また、各絶縁体５〜８を上下に貫通する位置決めピン（図示せず）により、支持孔６ａ・７ａ及び各小径孔５ａ・８ａ同士が同軸に整合され、例えばねじ（図示せず）により各絶縁体５〜８同士が互いに密着状態に固定されて、本体４が一体化されている。
【００１５】
各導電性針状体１０・１１ａは、本体４に組み付けられた自然状態で上下方向にそれぞれ弾発付勢されて所定量突出するように、各導電性針状体１０・１１ａの各外向フランジ部が、支持孔６ａ・７ａ側から下側及び上側絶縁体５・８に衝当して抜け止めされている。このようにして、両端可動型の導電性接触子３が構成されている。
【００１６】
本発明に基づく導電性接触子ユニット１にあっては、導電性接触子３が図３に示されるように端子用導電パターン２ａの奇数番目と偶数番目とにそれぞれ対応する２ラインＬ１・Ｌ２に分けられ、更に各ラインＬ１・Ｌ２毎に千鳥状に配設されている。なお、図３では１番目から８番目までの導電性接触子３_１〜３_８の配列状態を示している。このように導電性接触子３_１〜３_８を千鳥配列にすることにより、各導電性接触子３_１〜３_８の隣り合うもの同士が端子用導電パターン２ａの延在方向にずれるため、導電性接触子を細径化することなく、片ＴＡＢ型のものに於ける端子用導電パターン２ａの狭ピッチ化に十分に対応し得る。
【００１７】
また、本発明に基づく導電性接触子ユニット１にあっては、図１・図２に於ける上側に突出する複数の導電性針状体の奇数番目の導電性針状体１１ａを、偶数番目の導電性針状体１１ｂよりも上側に突出するように長くしており、両者間で突出方向に段違いになっている。そして、長い方である奇数番目の導電性針状体１１ａが、上側絶縁板１２の下面に貼着されたフレキシブル基板１３の奇数番目用信号伝送用導電パターン１３ａに接触し、短い方である偶数番目の導電性針状体１１ｂが、下側絶縁板１４の下面に貼着されたフレキシブル基板１５の偶数番目用信号伝送用導電パターン１５ａに接触するように、下側絶縁板１４の上に上側絶縁板１２が重ね合わされる。また、長い方である奇数番目の導電性針状体１１ａは、下側絶縁板１４の貫通孔により軸線方向に往復動自在に支持されている。なお、図１及び図２の状態は、本体４に各絶縁板１２・１４を取り付ける前の組み付け途中の状態を示しており、組立後には本体４に各絶縁板１２・１４が積層され、それぞれが一体化される。
【００１８】
このようにして組み立てられた導電性接触子ユニット１を使用して特性検査を行う際には、導電性接触子３を端子用導電パターン２ａと同数になるように設けるべく、例えばＴＡＢと略同一幅の大きさに小ユニット化された導電性接触子ユニット１を例えば図示されない支持枠に並列に必要数並べてセットする。なお、前記したように、信号伝送用導電パターン１３ａ・１５ａを奇数番目用と偶数番目用とに分けることができ、それぞれのフレキシブル基板１３・１５を別個に引き回すことができるため、従来の両ＴＡＢ型に使用していたフレキシブル基板をそのまま流用することができ、奇数番目と偶数番目とに振り分けるための中継基板などを設ける必要がない。また、信号伝送用導電パターン１３ａ・１５ａにあっては、端子用導電パターン２ａに対して２倍のピッチで形成できるため、狭ピッチ化によるパターンの加工困難性を回避でき、検査機器側の信頼性を向上し得る。更に、検査機器の信号処理関係も変更する必要が無く、両ＴＡＢ型と片ＴＡＢ型とが混在する検査ラインにも同一の検査機器で特性検査を行うことができる。
【００１９】
前記実施例では、導電性接触子３を、端子用導電パターン２ａの奇数番目と偶数番目とにそれぞれ対応する２ラインＬ１・Ｌ２に分け、更に各ラインＬ１・Ｌ２毎に千鳥状に配設した４段千鳥配列にしたが、４段に限るものではなく、例えば図４に示されるように各ラインＬ１・Ｌ２毎に導電性接触子を３段にずらしたパターンを繰り返すようにした６段千鳥配列にしても良い。更に、その段数を限るものではなく、最小では奇数番目・偶数番目を交互に千鳥状にずらす２段から、端子用導電パターン２ａの延在方向長さに左右されるが、８段以上に多段化しても良い。
【００２０】
【発明の効果】
このように本発明によれば、導電性接触子を千鳥状に配設したことから、被検査体の端子用導電パターンの狭ピッチ化に好適に対応し得ると共に、パターンの奇数番目と偶数番目とに分けたことから、奇数番目と偶数番目とに分けた信号処理を行う場合に特に好適に対応し得る。また、導電性接触子の信号伝送用導電パターンに接触する方を奇数番目と偶数番目との間で突出方向に段違いにして、それぞれの信号伝送用導電パターンを互いに重なり合うようにされた別々の基板に設けることにより、奇数番目と偶数番目との信号を何ら問題なく処理できる。さらに、奇数番目の列と偶数番目の列とのそれぞれ中で導電性接触子をずらすことにより、より一層狭ピッチ化に対応し得る。
【図面の簡単な説明】
【図１】本発明が適用された導電性接触子ユニットの組立途中の状態を示す側断面図。
【図２】図１のＩＩ−ＩＩ線に沿って見た縦断面図。
【図３】本発明に基づく導電性接触子の配列状態を示す図。
【図４】本発明に基づく導電性接触子の配列状態の別の実施例を示す図。
【図５】（ａ）は被検査体としての両ＴＡＢ型液晶パネルを示す平面図であり、（ｂ）は片ＴＡＢ型液晶パネルを示す平面図。
【符号の説明】
１導電性接触子ユニット
２液晶パネル
２ａ端子用導電パターン
３導電性接触子
４本体
５下側絶縁体
５ａ小径孔
６・７中間絶縁体
６ａ・７ａ支持孔
８上側絶縁体
８ａ小径孔
９コイルばね
１０導電性針状体
１１ａ・１１ｂ導電性針状体
１２上側絶縁板
１３フレキシブル基板
１３ａ信号伝送用導電パターン
１４下側絶縁板
１５フレキシブル基板
１５ａ信号伝送用導電パターン
２２液晶パネル
２２ａ・２２ｂ端子用導電パターン[0001]
[Industrial applications]
The present invention relates to a conductive contact unit suitable for transmitting and receiving an electric signal between a printed wiring board, an electronic element, and the like, and more particularly, to a multipoint simultaneous electric signal using a plurality of conductive needles. The present invention relates to a conductive contact unit suitable for transmitting and receiving.
[0002]
[Prior art]
Conventionally, a conductive needle used for a contact probe for conducting an electrical inspection of a conductor pattern or an electronic element of a printed wiring board includes a conductive needle-like body and the needle-like body which can be displaced in an axial direction. A cylindrical holder for receiving the needle-like object, and the tip of the needle-like body is elastically urged by a coil spring in a direction to protrude from one end of the holder. There is one that comes in contact with
[0003]
As the above-mentioned conductive contact, for example, as disclosed in Japanese Utility Model Application Laid-Open No. 154868/1985, a pair of conductive needle-like bodies are movable at both ends in the axial direction of a holder. There are things. This two-sided movable conductive contact is used when two circuit boards are connected to each other to produce a product, and when the two boards are temporarily connected to each other before the two boards are connected, an inspection is performed. Suitable for.
[0004]
Such inspections include a lighting inspection of a liquid crystal panel and an array substrate inspection. In the case of a characteristic inspection of a TFT array substrate constituting a liquid crystal panel, a TAB and a PCB (mounting printed circuit board) as panel lighting driving LSIs are used. In the step before combining (1) and (2), a voltage test is applied to each of the pixel signal terminal conductive patterns of the liquid crystal panel to perform a characteristic test. At that time, the same number of conductive contacts as the number of conductive patterns for pixel signal terminals are used, so that a conductive contact unit having a plurality of conductive contacts is formed along the side of the liquid crystal panel on which the conductive patterns for terminals are provided. And set them side by side.
[0005]
By the way, in the liquid crystal panel, a plurality of TABs are arranged side by side for a pixel signal line (X-axis direction) and a plurality of TABs for a scanning line (Y-axis direction), as shown in FIG. In the X-axis direction, there was a double TAB type liquid crystal panel 22 in which TABs were respectively disposed on a pair of opposite sides of the liquid crystal panel. However, in the case of both TAB types, since the TABs are provided on two opposing sides, there is a problem that the display area with respect to the entire liquid crystal panel 22 becomes narrow, and the display area is enlarged or downsized. For this reason, a single TAB type liquid crystal panel 2 (see FIG. 5B) in which a TAB is provided only on each side in the X-axis and Y-axis directions has come to be used.
[0006]
In the above-described characteristic inspection, pixel inspection signals are sent separately to odd-numbered pixel terminals and even-numbered pixel terminals. In both TAB-type liquid crystal panels 22, each terminal is divided into odd- and even-numbered terminals. Conductive patterns 22a and 22b are provided, and signals on the inspection device side are also output separately to odd-numbered and even-numbered substrates. Therefore, also in the one TAB type liquid crystal panel 2, it is necessary to perform the inspection separately for the odd-numbered pixels and the even-numbered pixels of the terminal conductive patterns 2a concentrated on one side. Further, in contrast to both TAB types, a single TAB type in which pixel signals are concentrated on one side has a problem that a conductive contact unit capable of coping with a narrow pitch needs to be used.
[0007]
[Problems to be solved by the invention]
In view of such problems of the related art, a main object of the present invention is to provide a conductive contact unit that can cope with a narrow pitch of conductive patterns for terminals of a device under test.
[0008]
[Means for Solving the Problems]
According to the present invention, such an object is to electrically connect a plurality of terminal conductive patterns provided in parallel with each other on a device under test and a plurality of signal transmission conductive patterns on an inspection device side to each other. A conductive contact unit having a plurality of conductive contacts, wherein the conductive contacts are coaxially received in a through hole provided in an insulating support member, A pair of conductive needle-like bodies coupled to both ends of the compression coil spring so as to be able to protrude and retract from both open ends of the hole, and correspond to the plurality of terminal conductive patterns, and correspond to the plurality of terminal conductive patterns. Patterns corresponding to odd-numbered patterns and those corresponding to even-numbered patterns are arranged in a staggered manner so as to be alternated , and divided into odd-numbered rows corresponding to the odd-numbered rows and even-numbered rows corresponding to the even-numbered rows. Said each Is adjacent groups at the inside is achieved by providing a conductive contact unit, characterized by being arranged such relatively displaced in the extending direction of the terminal conductive pattern. In particular, the one in contact with the signal transmission conductive pattern of each of the pair of conductive needles of the plurality of conductive contacts is an even number corresponding to the odd number of the plurality of terminal conductive patterns. Separate substrates that are stepped in the protruding direction between corresponding ones, and that the odd-numbered ones and the even-numbered ones of the plurality of signal transmission conductive patterns overlap each other. may that provided in.
[0009]
[Action]
According to this configuration, the plurality of conductive contacts are arranged in the conductive contact unit in a staggered manner so as to be divided into odd-numbered and even-numbered conductive patterns for the terminals of the device under test and to be staggered. Therefore, mutual interference can be avoided and the pitch can be suitably narrowed in the pitch direction of the terminal conductive patterns. In addition, the side of the pair of conductive needles that contacts the signal transmission conductive pattern is stepped in the projecting direction between the odd-numbered and the even-numbered ones of the plurality of terminal conductive patterns. At the same time, by providing the signal transmission conductive patterns on separate substrates that are overlapped with each other and dividing them into odd-numbered and even-numbered ones, it is possible to cope without making a narrow pitch signal transmission conductive pattern substrate I can do it. Further, the conductive contacts are divided into odd-numbered rows corresponding to odd-numbered rows and even-numbered rows corresponding to even-numbered rows, and adjacent ones in each row are relatively shifted in the extending direction of the terminal conductive pattern. With such arrangement, the pitch can be further reduced.
[0010]
【Example】
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.
[0011]
FIG. 1 is a schematic side sectional view of a conductive contact unit 1 according to the present invention, and FIG. 2 is a sectional view taken along line II-II of FIG. The conductive contact unit 1 is used for a characteristic test performed in a process before coupling a TAB as a panel lighting drive LSI to a liquid crystal panel 2 as a device to be inspected. As a characteristic test, a voltage characteristic is applied to each of the pixel signal terminal conductive patterns of the liquid crystal panel to perform a characteristic test as shown in the conventional example.
[0012]
As shown in the drawing, the present conductive contact unit 1 includes a plurality of conductive contacts 3 for making contact with each of a plurality of terminal conductive patterns 2a for pixel signals of a cell of a liquid crystal panel 2. It is supported by a main body 4 in which plate-shaped insulators are laminated. The main body 4 is compared with a lower insulator 5 made of synthetic resin in a relatively thin plate shape and two intermediate insulators 6 and 7 made of synthetic resin in a relatively thick plate shape from the lower side in the figure. It is formed by laminating a substantially thin plate-shaped upper insulator 8 made of synthetic resin in this order. A conductive contact 3 is provided so as to vertically penetrate the stacked insulators 5 to 8.
[0013]
Support holes 6a and 7a having relatively large diameters are formed coaxially in communication with the intermediate insulators 6 and 7, and the lower and upper insulators 5 and 8 have a larger diameter than the support holes 6a and 7a. Small diameter holes 5a and 8a slightly reduced in diameter are formed coaxially. A conductive coil spring 9 is received in the support holes 6a and 7a coaxially and in a compressed state to some extent. The lower and upper and lower ends of the coil spring 9 projecting in opposite directions to each other in the axial direction. The upper conductive needles 10 and 11a are respectively connected.
[0014]
Each of the conductive needles 10 and 11a has an outward flange portion having a diameter larger than that of the small diameter holes 5a and 8a at a portion received in the support holes 6a and 7a. The axial end of the coil spring 9 is wound and soldered to a shaft protruding inside 7a. The support holes 6a and 7a and the small-diameter holes 5a and 8a are coaxially aligned with each other by positioning pins (not shown) penetrating the insulators 5 to 8 vertically. The insulators 5 to 8 are fixed in close contact with each other, and the main body 4 is integrated.
[0015]
Each of the outwardly extending flanges of each of the conductive needle-shaped bodies 10 and 11a is resiliently urged in the vertical direction in a natural state assembled to the main body 4 and protrudes by a predetermined amount. The parts are prevented from coming off by abutting against the lower and upper insulators 5.8 from the support holes 6a and 7a side. In this manner, the conductive contacts 3 having both ends movable are configured.
[0016]
In the conductive contact unit 1 according to the present invention, as shown in FIG. 3, the conductive contact 3 is connected to two lines L1 and L2 respectively corresponding to the odd-numbered and even-numbered terminal conductive patterns 2a. The lines L1 and L2 are arranged in a zigzag pattern. FIG. 3 shows the arrangement of the _first to _eighth conductive contacts 31 to 38. Since such a conductive contact 3 ₁ to 3 ₈ By staggered, the adjacent groups of each of the conductive contacts 3 ₁ to 3 ₈ shifts in the extending direction of the terminal conductive patterns 2a, conductive It is possible to sufficiently cope with the narrowing of the pitch of the terminal conductive pattern 2a in the one-tab type without having to reduce the diameter of the contact.
[0017]
Also, in the conductive contact unit 1 according to the present invention, the odd-numbered conductive needles 11a of the plurality of conductive needles projecting upward in FIGS. The conductive needle-shaped body 11b is longer than the conductive needle-shaped body 11b, and has a step difference in the projecting direction between the two. The longer odd-numbered conductive needles 11a come into contact with the odd-numbered signal transmission conductive patterns 13a of the flexible substrate 13 attached to the lower surface of the upper insulating plate 12, and the shorter even-numbered conductive needles 11a. The upper surface of the lower insulating plate 14 is placed on the lower insulating plate 14 so that the second conductive needle 11b comes into contact with the even-numbered signal transmitting conductive pattern 15a of the flexible substrate 15 attached to the lower surface of the lower insulating plate 14. The insulating plates 12 are overlaid. The odd-numbered conductive needles 11a, which are longer, are supported by the through holes of the lower insulating plate 14 so as to be able to reciprocate in the axial direction. 1 and 2 show a state in which the insulating plates 12 and 14 are being assembled before the insulating plates 12 and 14 are attached to the main body 4, and after the assembly, the insulating plates 12 and 14 are laminated on the main body 4, Are integrated.
[0018]
When a characteristic test is performed using the conductive contact unit 1 assembled in this manner, the conductive contacts 3 are provided so as to have the same number as the terminal conductive patterns 2a. The necessary number of the conductive contact units 1 reduced in size to the width are set in parallel on a support frame (not shown), for example. As described above, the signal transmission conductive patterns 13a and 15a can be divided into odd-numbered and even-numbered conductive patterns, and the flexible substrates 13 and 15 can be separately routed. The flexible substrate used for the mold can be diverted as it is, and there is no need to provide a relay substrate or the like for sorting the odd-numbered and even-numbered substrates. In addition, the signal transmission conductive patterns 13a and 15a can be formed at twice the pitch with respect to the terminal conductive patterns 2a, so that it is possible to avoid the difficulty of pattern processing due to the narrow pitch, and to reduce the reliability of the inspection equipment. Performance can be improved. Further, there is no need to change the signal processing relationship of the inspection equipment, and the characteristic inspection can be performed with the same inspection equipment even on an inspection line in which both the TAB type and the single TAB type are mixed.
[0019]
In the above embodiment, the conductive contacts 3 are divided into two lines L1 and L2 corresponding to the odd and even numbers of the terminal conductive pattern 2a, respectively, and are further arranged in a staggered manner for each line L1 and L2. Although the four-stage staggered arrangement is used, the invention is not limited to the four-stage staggered arrangement. For example, as shown in FIG. 4, a six-stage staggered pattern in which the conductive contacts are shifted in three stages for each line L1 and L2 is repeated. It may be arranged. Further, the number of stages is not limited, and the minimum number of stages depends on the length in the extending direction of the terminal conductive pattern 2a, from two stages in which odd-numbered and even-numbered are alternately shifted in a staggered manner. May be changed.
[0020]
【The invention's effect】
As described above, according to the present invention, since the conductive contacts are arranged in a staggered manner, it is possible to suitably cope with the narrowing of the pitch of the terminal conductive pattern of the device under test, and the odd-numbered and even-numbered patterns of the pattern. Therefore, it is possible to particularly suitably cope with the case where the signal processing is divided into odd-numbered and even-numbered. In addition, a separate substrate in which the conductive contacts for contacting the signal transmission conductive pattern are stepped in the protruding direction between the odd-numbered and even-numbered projections so that the respective signal transmission conductive patterns overlap with each other. , Odd-numbered and even-numbered signals can be processed without any problem. Further, by shifting the conductive contacts in each of the odd-numbered row and the even-numbered row, it is possible to cope with a further narrow pitch.
[Brief description of the drawings]
FIG. 1 is a side sectional view showing a state in which a conductive contact unit to which the present invention is applied is being assembled.
FIG. 2 is a longitudinal sectional view taken along the line II-II in FIG.
FIG. 3 is a view showing an arrangement state of conductive contacts according to the present invention.
FIG. 4 is a view showing another embodiment of the arrangement of the conductive contacts according to the present invention.
5A is a plan view showing both TAB-type liquid crystal panels as an object to be inspected, and FIG. 5B is a plan view showing a single TAB-type liquid crystal panel.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Conductive contact unit 2 Liquid crystal panel 2a Terminal conductive pattern 3 Conductive contact 4 Main body 5 Lower insulator 5a Small diameter hole 6.7 Intermediate insulator 6a / 7a Support hole 8 Upper insulator 8a Small diameter hole 9 Coil spring REFERENCE SIGNS LIST 10 conductive needles 11 a and 11 b conductive needles 12 upper insulating plate 13 flexible substrate 13 a conductive pattern for signal transmission 14 lower insulating plate 15 flexible substrate 15 a conductive pattern for signal transmission 22 liquid crystal panels 22 a and 22 b terminal conductive pattern

Claims

A conductive contact having a plurality of conductive contacts for electrically connecting a plurality of terminal conductive patterns provided on a device under test in parallel with a plurality of signal transmission conductive patterns on an inspection device side to each other. A unit,
A conductive compression coil spring coaxially received in a through hole provided in the insulating support member; and both ends of the compression coil spring so as to be able to protrude and retract from both open ends of the through hole. And a pair of conductive needle-like bodies that are connected to the plurality of terminal conductive patterns, and those corresponding to the odd-numbered and even-numbered ones of the plurality of terminal conductive patterns. The odd-numbered rows corresponding to the odd-numbered rows and the even-numbered rows corresponding to the even-numbered rows are arranged in a staggered manner so as to be staggered . A conductive contact unit, which is disposed so as to be relatively displaced in an extending direction of a conductive pattern .

The one in contact with the signal transmission conductive pattern of each of the pair of conductive needles of the plurality of conductive contacts corresponds to an odd-numbered one and an even-numbered one of the plurality of terminal conductive patterns. Provided on separate substrates in which the odd-numbered ones of the plurality of signal transmission conductive patterns and the even-numbered ones of the plurality of signal transmission conductive patterns are overlapped with each other. The conductive contact unit according to claim 1, wherein the conductive contact unit is provided.