WO2003095712A3 - Procede de fabrication de structures tridimensionnelles solidaires de circuits a semi-conducteurs - Google Patents
Procede de fabrication de structures tridimensionnelles solidaires de circuits a semi-conducteurs Download PDFInfo
- Publication number
- WO2003095712A3 WO2003095712A3 PCT/US2003/014664 US0314664W WO03095712A3 WO 2003095712 A3 WO2003095712 A3 WO 2003095712A3 US 0314664 W US0314664 W US 0314664W WO 03095712 A3 WO03095712 A3 WO 03095712A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- semiconductor based
- based circuitry
- forming
- dimensional structures
- structures integral
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 239000004065 semiconductor Substances 0.000 title abstract 2
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 abstract 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 abstract 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 abstract 1
- 229910052782 aluminium Inorganic materials 0.000 abstract 1
- 230000004888 barrier function Effects 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 239000010949 copper Substances 0.000 abstract 1
- 238000009792 diffusion process Methods 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 abstract 1
- 229910052759 nickel Inorganic materials 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00023—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems without movable or flexible elements
- B81C1/00126—Static structures not provided for in groups B81C1/00031 - B81C1/00119
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00222—Integrating an electronic processing unit with a micromechanical structure
- B81C1/00246—Monolithic integration, i.e. micromechanical structure and electronic processing unit are integrated on the same substrate
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/003—3D structures, e.g. superposed patterned layers
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
- C25D5/022—Electroplating of selected surface areas using masking means
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/288—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
- H01L21/2885—Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition using an external electrical current, i.e. electro-deposition
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76885—By forming conductive members before deposition of protective insulating material, e.g. pillars, studs
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/11—Manufacturing methods
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- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0174—Manufacture or treatment of microstructural devices or systems in or on a substrate for making multi-layered devices, film deposition or growing
- B81C2201/019—Bonding or gluing multiple substrate layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/05—Temporary protection of devices or parts of the devices during manufacturing
- B81C2201/053—Depositing a protective layers
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2203/00—Forming microstructural systems
- B81C2203/07—Integrating an electronic processing unit with a micromechanical structure
- B81C2203/0707—Monolithic integration, i.e. the electronic processing unit is formed on or in the same substrate as the micromechanical structure
- B81C2203/0735—Post-CMOS, i.e. forming the micromechanical structure after the CMOS circuit
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
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- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/01005—Boron [B]
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- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
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- H01L2924/0494—4th Group
- H01L2924/04941—TiN
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- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
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- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- General Physics & Mathematics (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analytical Chemistry (AREA)
- Electroplating Methods And Accessories (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003228977A AU2003228977A1 (en) | 2002-05-07 | 2003-05-07 | Method of and apparatus for forming three-dimensional structures integral with semiconductor based circuitry |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US37918302P | 2002-05-07 | 2002-05-07 | |
US60/379,183 | 2002-05-07 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2003095712A2 WO2003095712A2 (fr) | 2003-11-20 |
WO2003095712A3 true WO2003095712A3 (fr) | 2005-08-18 |
Family
ID=29420501
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/US2003/014664 WO2003095712A2 (fr) | 2002-05-07 | 2003-05-07 | Procede de fabrication de structures tridimensionnelles solidaires de circuits a semi-conducteurs |
Country Status (3)
Country | Link |
---|---|
US (2) | US20040065554A1 (fr) |
AU (1) | AU2003228977A1 (fr) |
WO (1) | WO2003095712A2 (fr) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW522238B (en) * | 2001-10-18 | 2003-03-01 | Chipmos Technologies Inc | Method for manufacturing probes of a probe card |
EP1576206A2 (fr) * | 2002-05-07 | 2005-09-21 | Microfabrica Inc. | Procede et appareil pour former des structures tridimensionnelles integrees dans des circuits a semiconducteurs |
WO2005065430A2 (fr) * | 2003-12-31 | 2005-07-21 | Microfabrica Inc. | Procedes de fabrication electrochimique pour produire des structures multicouches faisant appel a l'utilisation de l'usinage diamant dans la planarisation de depots de matiere |
US20070238265A1 (en) * | 2005-04-05 | 2007-10-11 | Keiichi Kurashina | Plating apparatus and plating method |
KR100870820B1 (ko) * | 2005-12-29 | 2008-11-27 | 매그나칩 반도체 유한회사 | 이미지 센서 및 그의 제조방법 |
CH704572B1 (fr) | 2007-12-31 | 2012-09-14 | Nivarox Sa | Procédé de fabrication d'une microstructure métallique et microstructure obtenue selon ce procédé. |
WO2013106442A1 (fr) * | 2012-01-10 | 2013-07-18 | Hzo, Inc. | Masques servant à l'application de revêtements de protection sur des ensembles électroniques, ensembles électroniques masqués, et procédés associés |
JP2014522543A (ja) | 2012-06-18 | 2014-09-04 | エイチズィーオー・インコーポレーテッド | 完全に組み立てられている電子デバイスの内部表面へ保護被覆を塗工するためのシステム及び方法 |
WO2014110046A1 (fr) | 2013-01-08 | 2014-07-17 | Hzo, Inc. | Substrats de masquage pour une application de revêtements de protection |
US9894776B2 (en) | 2013-01-08 | 2018-02-13 | Hzo, Inc. | System for refurbishing or remanufacturing an electronic device |
US10449568B2 (en) | 2013-01-08 | 2019-10-22 | Hzo, Inc. | Masking substrates for application of protective coatings |
Citations (3)
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US5685491A (en) * | 1995-01-11 | 1997-11-11 | Amtx, Inc. | Electroformed multilayer spray director and a process for the preparation thereof |
US6027630A (en) * | 1997-04-04 | 2000-02-22 | University Of Southern California | Method for electrochemical fabrication |
WO2000042231A2 (fr) * | 1999-01-15 | 2000-07-20 | The Regents Of The University Of California | Films de polysilicium-germanium permettant de realiser des systemes micro-electromecaniques |
Family Cites Families (25)
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US5829128A (en) * | 1993-11-16 | 1998-11-03 | Formfactor, Inc. | Method of mounting resilient contact structures to semiconductor devices |
US5011580A (en) * | 1989-10-24 | 1991-04-30 | Microelectronics And Computer Technology Corporation | Method of reworking an electrical multilayer interconnect |
US5190637A (en) * | 1992-04-24 | 1993-03-02 | Wisconsin Alumni Research Foundation | Formation of microstructures by multiple level deep X-ray lithography with sacrificial metal layers |
US5378583A (en) * | 1992-12-22 | 1995-01-03 | Wisconsin Alumni Research Foundation | Formation of microstructures using a preformed photoresist sheet |
US6023103A (en) * | 1994-11-15 | 2000-02-08 | Formfactor, Inc. | Chip-scale carrier for semiconductor devices including mounted spring contacts |
US6064213A (en) * | 1993-11-16 | 2000-05-16 | Formfactor, Inc. | Wafer-level burn-in and test |
US5718618A (en) * | 1996-02-09 | 1998-02-17 | Wisconsin Alumni Research Foundation | Lapping and polishing method and apparatus for planarizing photoresist and metal microstructure layers |
US5994152A (en) * | 1996-02-21 | 1999-11-30 | Formfactor, Inc. | Fabricating interconnects and tips using sacrificial substrates |
US5866281A (en) * | 1996-11-27 | 1999-02-02 | Wisconsin Alumni Research Foundation | Alignment method for multi-level deep x-ray lithography utilizing alignment holes and posts |
US5801100A (en) * | 1997-03-07 | 1998-09-01 | Industrial Technology Research Institute | Electroless copper plating method for forming integrated circuit structures |
US6008102A (en) * | 1998-04-09 | 1999-12-28 | Motorola, Inc. | Method of forming a three-dimensional integrated inductor |
US6255126B1 (en) * | 1998-12-02 | 2001-07-03 | Formfactor, Inc. | Lithographic contact elements |
US6569701B2 (en) * | 2001-10-25 | 2003-05-27 | Rockwell Automation Technologies, Inc. | Method for fabricating an isolated microelectromechanical system device |
TWI227285B (en) * | 2001-10-15 | 2005-02-01 | Univ Southern California | Methods of and apparatus for producing a three-dimensional structure |
US7303663B2 (en) * | 2002-05-07 | 2007-12-04 | Microfabrica, Inc. | Multistep release method for electrochemically fabricated structures |
AU2002360464A1 (en) * | 2001-12-03 | 2003-06-17 | Memgen Corporation | Miniature rf and microwave components and methods for fabricating such components |
US20030221968A1 (en) * | 2002-03-13 | 2003-12-04 | Memgen Corporation | Electrochemical fabrication method and apparatus for producing three-dimensional structures having improved surface finish |
US20040065550A1 (en) * | 2002-05-07 | 2004-04-08 | University Of Southern California | Electrochemical fabrication methods with enhanced post deposition processing |
EP1506329A1 (fr) * | 2002-05-07 | 2005-02-16 | University Of Southern California | Procedes et appareil de surveillance de la qualite de depot au cours d'operations de galvanoplastie effectuees a l'aide d'un masque de contact adaptable |
JP4554357B2 (ja) * | 2002-05-07 | 2010-09-29 | マイクロファブリカ インク | 電気化学的に成型加工され、気密的に封止された微細構造および上記微細構造を製造するための方法および装置 |
AU2003234397A1 (en) * | 2002-05-07 | 2003-11-11 | Memgen Corporation | Methods of and apparatus for electrochemically fabricating structures |
WO2003095713A1 (fr) * | 2002-05-07 | 2003-11-20 | University Of Southern California | Procedes et appareils de masquage de contacts adaptables utilisant une activation cathodique in situ d'un substrat |
AU2003234398A1 (en) * | 2002-05-07 | 2003-11-11 | Memgen Corporation | Electrochemically fabricated structures having dielectric or active bases |
EP1576206A2 (fr) * | 2002-05-07 | 2005-09-21 | Microfabrica Inc. | Procede et appareil pour former des structures tridimensionnelles integrees dans des circuits a semiconducteurs |
EP1576207A2 (fr) * | 2002-05-07 | 2005-09-21 | Microfabrica Inc. | Procedes et appareil de moulage de structures utilisant des configurations metalliques sacrificielles |
-
2003
- 2003-05-07 AU AU2003228977A patent/AU2003228977A1/en not_active Abandoned
- 2003-05-07 US US10/434,292 patent/US20040065554A1/en not_active Abandoned
- 2003-05-07 WO PCT/US2003/014664 patent/WO2003095712A2/fr not_active Application Discontinuation
-
2007
- 2007-02-28 US US11/680,596 patent/US20070221505A1/en not_active Abandoned
Patent Citations (3)
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US5685491A (en) * | 1995-01-11 | 1997-11-11 | Amtx, Inc. | Electroformed multilayer spray director and a process for the preparation thereof |
US6027630A (en) * | 1997-04-04 | 2000-02-22 | University Of Southern California | Method for electrochemical fabrication |
WO2000042231A2 (fr) * | 1999-01-15 | 2000-07-20 | The Regents Of The University Of California | Films de polysilicium-germanium permettant de realiser des systemes micro-electromecaniques |
Non-Patent Citations (1)
Title |
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COHEN A ET AL: "EFAB: rapid, low-cost desktop micromachining of high aspect ratio true 3-D MEMS", MICRO ELECTRO MECHANICAL SYSTEMS, 1999. MEMS '99. TWELFTH IEEE INTERNATIONAL CONFERENCE ON ORLANDO, FL, USA 17-21 JAN. 1999, PISCATAWAY, NJ, USA,IEEE, US, 17 January 1999 (1999-01-17), pages 244 - 251, XP010321754, ISBN: 0-7803-5194-0 * |
Also Published As
Publication number | Publication date |
---|---|
AU2003228977A1 (en) | 2003-11-11 |
AU2003228977A8 (en) | 2003-11-11 |
US20070221505A1 (en) | 2007-09-27 |
US20040065554A1 (en) | 2004-04-08 |
WO2003095712A2 (fr) | 2003-11-20 |
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