WO2003014711A1 - Puce de detection a resonance de plasmon de surface et procede et dispositif d'analyse d'echantillon utilisant cette puce - Google Patents

Puce de detection a resonance de plasmon de surface et procede et dispositif d'analyse d'echantillon utilisant cette puce Download PDF

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Publication number
WO2003014711A1
WO2003014711A1 PCT/JP2002/008091 JP0208091W WO03014711A1 WO 2003014711 A1 WO2003014711 A1 WO 2003014711A1 JP 0208091 W JP0208091 W JP 0208091W WO 03014711 A1 WO03014711 A1 WO 03014711A1
Authority
WO
WIPO (PCT)
Prior art keywords
diffraction grating
sensor chip
grating surfaces
reflected light
surface plasmon
Prior art date
Application number
PCT/JP2002/008091
Other languages
English (en)
French (fr)
Inventor
Takaaki Sorin
Hidehito Takayama
Kazuhiro Nagaike
Original Assignee
Mitsubishi Chemical Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Chemical Corporation filed Critical Mitsubishi Chemical Corporation
Priority to EP02755870A priority Critical patent/EP1424549A1/en
Publication of WO2003014711A1 publication Critical patent/WO2003014711A1/ja
Priority to US10/774,327 priority patent/US20040155309A1/en

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/7703—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides
    • G01N21/774—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure
    • G01N21/7743—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator using reagent-clad optical fibres or optical waveguides the reagent being on a grating or periodic structure the reagent-coated grating coupling light in or out of the waveguide
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/251—Colorimeters; Construction thereof
    • G01N21/253—Colorimeters; Construction thereof for batch operation, i.e. multisample apparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons
    • G01N21/554—Attenuated total reflection and using surface plasmons detecting the surface plasmon resonance of nanostructured metals, e.g. localised surface plasmon resonance
PCT/JP2002/008091 2001-08-07 2002-08-07 Puce de detection a resonance de plasmon de surface et procede et dispositif d'analyse d'echantillon utilisant cette puce WO2003014711A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP02755870A EP1424549A1 (en) 2001-08-07 2002-08-07 SURFACE PLASMON RESONANCE SENSOR CHIP, AND SAMPLE ANALYSIS METHOD AND ANALYSIS APPARATUS USING THE SAME
US10/774,327 US20040155309A1 (en) 2001-08-07 2004-02-06 Surface plasmon resonance sensor chip and sample analysis method and apparatus using the same

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2001238883 2001-08-07
JP2001-238883 2001-08-07
JP2001238884 2001-08-07
JP2001-238884 2001-08-07

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US10/774,327 Continuation US20040155309A1 (en) 2001-08-07 2004-02-06 Surface plasmon resonance sensor chip and sample analysis method and apparatus using the same

Publications (1)

Publication Number Publication Date
WO2003014711A1 true WO2003014711A1 (fr) 2003-02-20

Family

ID=26620075

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2002/008091 WO2003014711A1 (fr) 2001-08-07 2002-08-07 Puce de detection a resonance de plasmon de surface et procede et dispositif d'analyse d'echantillon utilisant cette puce

Country Status (3)

Country Link
US (1) US20040155309A1 (ja)
EP (1) EP1424549A1 (ja)
WO (1) WO2003014711A1 (ja)

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EP1566627A1 (en) * 2004-02-18 2005-08-24 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Surface plasmon field-enhanced diffraction sensor
US7973933B2 (en) * 2005-01-12 2011-07-05 Jiri Homola Method for spectroscopy of surface plasmons in surface plasmon resonance sensors and an element for the use of thereof
US8094316B1 (en) 2008-05-12 2012-01-10 Institute Of Photonics And Electronics As Cr, V.V.I. Surface plasmon resonance coupler and disperser sensor
US8298831B2 (en) 2005-02-01 2012-10-30 Purdue Research Foundation Differentially encoded biological analyzer planar array apparatus and methods
CN112858224A (zh) * 2021-01-20 2021-05-28 哈尔滨工程大学 一种传感探头及其制备方法和应用该传感探头的传感器

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US7405831B2 (en) 2005-02-01 2008-07-29 Purdue Research Foundation Laser scanning interferometric surface metrology
US8178046B2 (en) * 2005-02-23 2012-05-15 Sierra Sensors Gmbh Microfluidic devices with SPR sensing capabilities
KR20080106262A (ko) * 2006-02-16 2008-12-04 펄듀 리서치 파운데이션 인라인 쿼드러처 및 반사 방지 향상 위상 쿼드러처 간섭측정 방식 검출
JP2007286045A (ja) * 2006-03-20 2007-11-01 Canon Inc 検出装置、検出素子用基板、検出素子、検出素子用キット及び検出方法
JP5178049B2 (ja) * 2006-05-12 2013-04-10 キヤノン株式会社 標的物質検出素子、標的物質検出装置、及び標的物質検出方法
WO2008089495A2 (en) 2007-01-19 2008-07-24 Purdue Research Foundation System with extended range of molecular sensing through integrated multi-modal data acquisition
US7787126B2 (en) 2007-03-26 2010-08-31 Purdue Research Foundation Method and apparatus for conjugate quadrature interferometric detection of an immunoassay
EP2134471A2 (en) 2007-04-06 2009-12-23 California Institute of Technology Microfluidic device
EP2183573A1 (en) * 2007-08-10 2010-05-12 Koninklijke Philips Electronics N.V. Sensor array for spr-based detection.
US8836931B2 (en) * 2008-10-28 2014-09-16 National Center For Nanoscience And Technology, China Detection system and method for acquiring resonance angle of surface plasmon
US8208191B2 (en) * 2008-10-30 2012-06-26 Leigh University Ultra-wide band slow light structure using plasmonic graded grating structures
US8680483B2 (en) 2008-12-24 2014-03-25 Hitachi High-Technologies Corporation Fluorescence detector
WO2010103386A1 (en) * 2009-03-10 2010-09-16 Università Degli Studi Di Padova Sensitivity enhancement in grating coupled surface plasmon resonance by azimuthal control
US8247881B2 (en) * 2009-04-27 2012-08-21 University Of Seoul Industry Cooperation Foundation Photodiodes with surface plasmon couplers
JP2011027461A (ja) * 2009-07-22 2011-02-10 Renesas Electronics Corp パターン形状計測方法、半導体装置の製造方法、およびプロセス制御システム
US8415611B2 (en) * 2009-11-19 2013-04-09 Seiko Epson Corporation Sensor chip, sensor cartridge, and analysis apparatus
US20110188032A1 (en) * 2010-02-04 2011-08-04 Ravi Verma Far-field superlensing
EP3239717B1 (en) * 2010-04-15 2020-05-27 Accellix Ltd System and method for determination of a medical condition
EP2932268A4 (en) 2012-12-17 2016-10-19 Leukodx Ltd SYSTEMS AND METHOD FOR RECOGNIZING A BIOLOGICAL CONDITION
US10610861B2 (en) 2012-12-17 2020-04-07 Accellix Ltd. Systems, compositions and methods for detecting a biological condition
US20140170678A1 (en) 2012-12-17 2014-06-19 Leukodx Ltd. Kits, compositions and methods for detecting a biological condition
US9804329B2 (en) * 2013-05-30 2017-10-31 Okhtay MONTAZERI Surface plasmon resonant devices and methods of use thereof
CN103745984B (zh) * 2013-12-31 2018-06-22 上海集成电路研发中心有限公司 可测量入射光角度的像素阵列、图像传感器及方法
EP3137935B1 (en) * 2014-04-30 2023-07-05 Hewlett-Packard Development Company, L.P. Imaging apparatus using diffraction-based illumination
JP6704920B2 (ja) 2015-10-14 2020-06-03 アルプスアルパイン株式会社 流路構造体および測定対象液体の測定装置
RU2660764C2 (ru) * 2016-12-19 2018-07-09 ООО "ПроматиксЛаб" Сенсор на основе поверхностно-плазмонного резонанса с элементом плоской оптики
JP6854134B2 (ja) * 2017-01-16 2021-04-07 矢崎総業株式会社 高選択性腐食センサーシステム
US10866263B2 (en) * 2017-10-05 2020-12-15 The Regents Of The University Of California Plasmonic ultrasensitive multiplex analysis platform for hyperspectral molecular sensing
DE102018217199A1 (de) * 2018-10-09 2020-04-09 Dr. Johannes Heidenhain Gmbh Gitterstruktur für eine diffraktive Optik
FR3097051B1 (fr) 2019-06-07 2021-11-05 Centre Nat Rech Scient Procédé et dispositif d'analyse d'un échantillon, mettant en œuvre un support résonant, illuminé par un rayonnement infra-rouge.
FR3097050B1 (fr) 2019-06-07 2021-08-27 Centre Nat Rech Scient Procédé et dispositif d'analyse d'un échantillon, mettant en œuvre un support résonant.

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Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
JPH05346398A (ja) * 1990-05-03 1993-12-27 F Hoffmann La Roche Ag 化学物質のマイクロオプティカル検出方法
JPH06300683A (ja) * 1993-03-26 1994-10-28 F Hoffmann La Roche Ag 伝搬特性測定プロセス及び装置
JPH1164216A (ja) * 1997-08-26 1999-03-05 Matsushita Electric Ind Co Ltd 減衰全反射測定装置およびそれを用いた特定成分の測定方法
WO1999066330A1 (en) * 1998-06-15 1999-12-23 Imation Corp. Optical sensor having optimized surface profile

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1566627A1 (en) * 2004-02-18 2005-08-24 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V. Surface plasmon field-enhanced diffraction sensor
US7973933B2 (en) * 2005-01-12 2011-07-05 Jiri Homola Method for spectroscopy of surface plasmons in surface plasmon resonance sensors and an element for the use of thereof
US8298831B2 (en) 2005-02-01 2012-10-30 Purdue Research Foundation Differentially encoded biological analyzer planar array apparatus and methods
US8094316B1 (en) 2008-05-12 2012-01-10 Institute Of Photonics And Electronics As Cr, V.V.I. Surface plasmon resonance coupler and disperser sensor
CN112858224A (zh) * 2021-01-20 2021-05-28 哈尔滨工程大学 一种传感探头及其制备方法和应用该传感探头的传感器
CN112858224B (zh) * 2021-01-20 2022-07-15 哈尔滨工程大学 一种传感探头及其制备方法和应用该传感探头的传感器

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Publication number Publication date
EP1424549A1 (en) 2004-06-02
US20040155309A1 (en) 2004-08-12

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