WO1998019340A1 - Grossflächiges hochstrommodul eines feldgesteuerten, abschaltbaren leistungs-halbleiterschalters - Google Patents
Grossflächiges hochstrommodul eines feldgesteuerten, abschaltbaren leistungs-halbleiterschalters Download PDFInfo
- Publication number
- WO1998019340A1 WO1998019340A1 PCT/DE1997/002418 DE9702418W WO9819340A1 WO 1998019340 A1 WO1998019340 A1 WO 1998019340A1 DE 9702418 W DE9702418 W DE 9702418W WO 9819340 A1 WO9819340 A1 WO 9819340A1
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- WIPO (PCT)
- Prior art keywords
- current module
- low
- contact plate
- voltage power
- area high
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/03—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/07—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00
- H01L25/072—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L29/00 the devices being arranged next to each other
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01004—Beryllium [Be]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01066—Dysprosium [Dy]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01067—Holmium [Ho]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01068—Erbium [Er]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1301—Thyristor
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/151—Die mounting substrate
- H01L2924/1515—Shape
- H01L2924/15158—Shape the die mounting substrate being other than a cuboid
- H01L2924/15162—Top view
Definitions
- the invention relates to a large-area high-current module of a field-controlled, switchable power semiconductor switch, which has two large-area, opposite contact plates and n field-controlled, switchable low-voltage power chips, whose drain connections by means of one contact plate and their source connections by means of the other Contact plate are electrically connected in parallel, these contact plates being insulated from one another on their contact surfaces.
- the field-controlled, switchable power semiconductor switches belong to the non-latching, switchable power semiconductor switches, in which a control signal must be constantly present at the control input so that they are in the conductive state
- field-controlled, switchable semiconductor components include, for example, the self-blocking field effect transistor (MOSFET) and the insulated gate bipolar transistor (IGBT).
- MOSFET self-blocking field effect transistor
- IGBT insulated gate bipolar transistor
- MCT MOS Controlled Thyristor
- GTO thyristors are significantly improved by means of a cascode circuit (control), whereas the additional effort is low compared to conventional control.
- a GTO cascode circuit has a shorter storage time and a power drop time, whereby the turn-off capacity of the GTO thyristor expands and the wiring capacitor decreases.
- gate unit complex control unit
- the shutdown process is controlled with low power via the gate input of the MOSFET of the GTO cascode circuit.
- FIG. 15 of this publication illustrates a constructive embodiment of a transistor cascode circuit according to FIG. 1 of this publication. This constructive embodiment (tension bandage) shows that it is not compact, but requires a lot of space.
- a large-area high-current module is from the publication entitled "2000-A / l-m ⁇ Power MOSFET's in Wafer Repair Technigue", printed in IEEE TRANSACTIONS ON ELECTRON DEVICES, Vol.37, No .5, May 1990, pages 1397 to 1401 - nes field-controlled, switchable power semiconductor switch known.
- This large-area MOSFET is housed in a disk-shaped insulating housing, which has a large-area contact plate on the end face.
- This large-area MOSFET has an annular active area on the inside, which is covered with 96 identical semiconductor cells. Each cell represents a power MOSFET that has been manufactured together in a wafer process. After the wafer production, each semiconductor cell is tested for functionality.
- a large-area high-current module of a field-controlled, switchable power semiconductor switch is known from German patent 39 10 470, which module has a plurality of semiconductor chips and two large-area, opposing contact plates. These semiconductor chips are electrically connected in parallel for the purpose of greater current carrying capacity. In addition, these semiconductor chips are arranged in the bores of a heat-conducting body made of insulating material, these bores being located on an arc. This insulating body is divided into two parts and is in contact with both one and the other large-area contact plate. So that the heat coefficient is approximately equal to the heat coefficient of the semiconductor chips, this warm- conductive insulating body made of silicon or aluminum trid.
- each semiconductor chip is provided with two metal layers, each of which is in contact with a contact plate.
- the gate electrodes of the individual chips are led out of the high-current module by means of a lead.
- the object of the invention is to improve the known large-area high-current module in such a way that its manufacture is considerably simplified.
- this large-area high-current module of a field-controlled, switchable power semiconductor switch with a GTO thyristor disk to form a hybrid GTO cascode.
- the one contact plate has a plurality of recesses, in which several busbars are inserted by means of insulation, which are electrically conductive with the source connections the n low-voltage power chips are connected and that the other contact plate, which connects the source connections of the n low-voltage power chips to one another in an electrically conductive manner, is provided with webs corresponding to these busbars, not only simplifies the structure of the known large area High current module very much, but also its manufacture.
- the large-area high-current module can be easily adapted to the drain current to be conducted by changing the number of low-voltage power chips.
- the n low-voltage power chips are arranged in a plurality of concentric circles, the control connections of which are connected to one another in an electrically conductive manner with at least one ring line.
- the contact plate which connects the drain connections of the n low-voltage power chips to one another in an electrically conductive manner, is divided into two mutually insulating parts, in one particularly advantageous embodiment the part of the contact plate being annular and the other part of this contact plate are circular and the circular part is enclosed by the annular part.
- the drain connections of part of the n low-voltage power chips can be electrically connected in parallel by means of the circular contact plate, and the drain connections of the other low-voltage power chips can be connected in parallel using the circular contact plate.
- the second large-area contact plate remains in one piece.
- the n low-voltage power chips are not arranged between two large-area contact plates, but on the outer surface of a contact plate.
- the two contact plates are arranged axially to one another and separated from one another by insulation.
- the drain connections of the n low-voltage power chips are electrically connected in parallel by means of the outer surface of the first contact plate and the source connections are connected by means of the second contact plate.
- the two contact plates are each subdivided into two parts which can be plugged into one another, both lateral surfaces of the two parts of the first contact plate being provided with low-voltage power chips.
- a second large-area high-current module is thus obtained, which contains two large-area, field-controlled, switchable power semiconductor switches with a common source connection.
- IG 1 shows a section through a first embodiment of a first large-area high-current module
- IG 2 shows a sectional view according to section AB of FIG. 1
- IG 3 shows a second embodiment of a first large-area high-current module
- FIG. 4 showing a particularly advantageous embodiment 5 shows a first embodiment of a second large-area high-current module
- FIG. 1 shows a section through a first embodiment of a first large-area high-current module of a field-controlled, switchable power semiconductor switch.
- This high-current module has two large opposing contact plates 2 and 4 and n low-voltage power chips 6. These n low-voltage power chips 6 are connected with their drain connections in an electrically conductive manner to the contact plate 2, as a result of which these low-voltage power chips 6 are electrically connected in parallel.
- the source connections 8 of these chips are electrically conductively connected to the contact plate 4 by means of bonding wires, as a result of which they are electrically connected in parallel.
- the two contact plates 2 and 4 are insulated from one another at their contact surfaces by means of insulation 10.
- a ring line 16 FIG. 2
- This contact ring 18, to which the source connections of the n low-voltage power chips 6 are connected in an electrically conductive manner are therefore also called busbars.
- the large-area contact plate 4 has webs 20 corresponding to these busbars 18, which in the assembled state are supported on these busbars 18.
- This subdivision of the contact plate 4 considerably simplifies the manufacture of the large-area high-current module, since when the chips 6 are electrically conductively connected to the large-area contact plate 2 by means of their drain connections, the insulations 10 into the grooves or recesses provided in the contact plate 2 are inserted, in which the contact rings 18 are then inserted. The source connections 8 of the chips 6 are connected in an electrically conductive manner with these contact rings 18. Finally, the contact plate 4, which serves as a power source connection, is placed with its corresponding webs 20 on the contact rings 18 and the high-current module is clamped.
- n low-voltage power chips 6 are arranged in a plurality of concentric circles. This allows the gate and source
- Control connections 12 and 14 of the many chips 6 can be contacted simultaneously by means of a ring line 16.
- This ring line 16 has two circular rings 22 and 24, the ring widths of which are different.
- the two contact rings 22 and 24 are electrically insulated from one another.
- the two ring lines 16 are electrically conductively connected to a gate and source control connection of the high-current module.
- the number of low-voltage power chips 6 for a large-area high-current module depends on the one to be led
- this high-voltage module is to be combined with a GTO thyristor to form a cascode circuit
- the contact plate te 2 which serves as the power-drain connection of the high-current module, provided with a shoulder, so that a bearing surface for a GTO thyristor disk is formed.
- the dimension of the receiving area for the chips 6 of the high-current module is thus fixed. If the high-current module is to be used, for example, as a large-area MOSFET module, the dimensions of the module are determined only by the number of chips 6 required.
- FIG. 3 shows a further embodiment of the first large-area high-current module according to FIG. 1.
- This embodiment differs from the embodiment shown in FIG. 1 in that the large-area contact plate 2 is divided into two partial contact plates 26 and 28, which are electrically separated from one another by means of insulation 30.
- One partial contact plate 26 is circular, whereas the other partial contact plate 28 is annular. The dimensions are chosen so that the partial contact plate 26 is arranged within the partial contact plate 28. So that the circular partial contact plate 26 cannot fall out of the surrounding partial contact plate 28, the partial contact plate 26 is provided with a circumferential shoulder.
- the inner low-voltage power chips 6 (FIG. 2) are electrically connected in parallel with respect to their drain connections by means of the partial contact plate 26.
- n-6 low-voltage power chips 6, which are arranged in two concentric circles according to FIG. 2, are electrically connected in parallel with respect to their drain connections by means of the annular partial contact plate 28.
- a large-area high-current module is thus obtained which contains, for example, two high-current MOSFET modules which have a common power-source connection and separate power-drain connections.
- the gate area of the GTO thyristor disk lies directly on the partial contact plate 26, whereas the cathode area of this GTO thyristor disk lies on the partial contact plate 28.
- the two high-current MOSFET modules therefore require a different number of chips 6, since one MOSFET module carries the current of the GTO thyristor in the switched-on state and the other MOSFET module only has to carry the switch-off current for a few microseconds.
- This close arrangement of the two MOSFET modules within a high current module means that the leakage inductance between these two MOSFET modules is very small. This makes it possible to commutate currents in the kA range from the cathode MOSFET to the gate MOSFET of a GTO cascode within a few 100 nsec.
- FIG. 1 A particularly advantageous embodiment of the first large-area high-current module is illustrated in FIG.
- the source connections of the n low-voltage power chips 6 are not electrically conductively connected to the contact plate 4 by means of bonding technology, but rather by means of a known low-temperature connection technology (NTV).
- NTV low-temperature connection technology
- the source contact is made over a large area via plates or foils.
- the main difference from the first high-current module is that the n low-voltage power chips 6 are no longer arranged in one plane, but spatially.
- the two contact plates 2 and 4 are electrically separated from one another at the end by means of an insulating layer 32.
- the n low-voltage power chips 6 are arranged on the outer surface 34 of the contact plate 2 and are electrically connected in parallel by means of this outer surface 34.
- the source connections 8 of each chip 6 are electrically conductively connected to the outer surface 36 of the contact plate 4 by means of bonding technology or by means of the known low-temperature connection technology (NTV).
- this outer surface 34 is designed as an n-corner.
- the lateral surface 36 of the contact plate 4 is also formed.
- a GTO thyristor disk is placed with its gate cathode side on the contact plate 2 and then clamped. Since no low-voltage power chips 6 and cavities are arranged transversely to the direction of heat dissipation from the GTO thyristor disk, as in the first high-current module according to FIG. 1, particularly good heat transfer is ensured.
- the clamping pressure of a built-in GTO cascode is transmitted over a large area by the MOSFET module. Another advantage of this arrangement is that the manufacture of this large-area high-current module is considerably simplified.
- two sub-modules are combined to form a high-current module.
- these sub-modules are identically constructed, so that can be arranged one within the other module part sectionmo ⁇ duls, this module component is eroded.
- the diameter of this recess must be larger than the diameter of the sub-module to be accommodated so that the con- Clock plates 2, each used as a power drain connection, do not touch. So that this sub-module is fixed in its position within the sub-module, an insulating cylinder can be inserted into the intermediate space 38.
Abstract
Description
Claims
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP51988098A JP2001502849A (ja) | 1996-10-31 | 1997-10-20 | 電界制御型の遮断可能なパワー半導体スイッチの大面積大電流モジュール |
EP97947012A EP0938750A1 (de) | 1996-10-31 | 1997-10-20 | Grossflächiges hochstrommodul eines feldgesteuerten, abschaltbaren leistungs-halbleiterschalters |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19644009.2 | 1996-10-31 | ||
DE1996144009 DE19644009A1 (de) | 1996-10-31 | 1996-10-31 | Großflächiges Hochstrommodul eines feldgesteuerten, abschaltbaren Leistungs-Halbleiterschalters |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1998019340A1 true WO1998019340A1 (de) | 1998-05-07 |
Family
ID=7809732
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE1997/002418 WO1998019340A1 (de) | 1996-10-31 | 1997-10-20 | Grossflächiges hochstrommodul eines feldgesteuerten, abschaltbaren leistungs-halbleiterschalters |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0938750A1 (de) |
JP (1) | JP2001502849A (de) |
KR (1) | KR20000052973A (de) |
DE (1) | DE19644009A1 (de) |
WO (1) | WO1998019340A1 (de) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150140289A (ko) * | 2013-04-09 | 2015-12-15 | 에이비비 테크놀로지 아게 | 전력 반도체 모듈 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10048436A1 (de) * | 2000-09-29 | 2002-04-18 | Siemens Ag | Elektronische Leistungsschaltervorrichtung |
DE10200372A1 (de) * | 2002-01-08 | 2003-07-24 | Siemens Ag | Leistungshalbleitermodul |
KR20040085169A (ko) | 2002-01-29 | 2004-10-07 | 어드밴스드 파워 테크놀로지 인코포레이티드 | 스플릿 게이트 파워 모듈과 그 모듈안의 진동을 억제하는방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5710958A (en) * | 1980-06-25 | 1982-01-20 | Shindengen Electric Mfg Co Ltd | Semiconductor device |
EP0064383A2 (de) * | 1981-05-06 | 1982-11-10 | LUCAS INDUSTRIES public limited company | Ein Halbleitergehäuse |
EP0499707A1 (de) * | 1991-02-22 | 1992-08-26 | Asea Brown Boveri Ag | Abschaltbares Hochleistungs-Halbleiterbauelement |
EP0637080A1 (de) * | 1993-07-27 | 1995-02-01 | Fuji Electric Co. Ltd. | Halbleiterbauelement mit Druckkontakt und dessen Montageverfahren |
EP0645815A2 (de) * | 1993-09-07 | 1995-03-29 | Delco Electronics Corporation | Hochleistungs-Halbleiter-Schaltmodul |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5006921A (en) * | 1988-03-31 | 1991-04-09 | Kabushiki Kaisha Toshiba | Power semiconductor switching apparatus with heat sinks |
-
1996
- 1996-10-31 DE DE1996144009 patent/DE19644009A1/de not_active Withdrawn
-
1997
- 1997-10-20 JP JP51988098A patent/JP2001502849A/ja active Pending
- 1997-10-20 KR KR1019990703850A patent/KR20000052973A/ko not_active Application Discontinuation
- 1997-10-20 WO PCT/DE1997/002418 patent/WO1998019340A1/de not_active Application Discontinuation
- 1997-10-20 EP EP97947012A patent/EP0938750A1/de not_active Withdrawn
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5710958A (en) * | 1980-06-25 | 1982-01-20 | Shindengen Electric Mfg Co Ltd | Semiconductor device |
EP0064383A2 (de) * | 1981-05-06 | 1982-11-10 | LUCAS INDUSTRIES public limited company | Ein Halbleitergehäuse |
EP0499707A1 (de) * | 1991-02-22 | 1992-08-26 | Asea Brown Boveri Ag | Abschaltbares Hochleistungs-Halbleiterbauelement |
EP0637080A1 (de) * | 1993-07-27 | 1995-02-01 | Fuji Electric Co. Ltd. | Halbleiterbauelement mit Druckkontakt und dessen Montageverfahren |
EP0645815A2 (de) * | 1993-09-07 | 1995-03-29 | Delco Electronics Corporation | Hochleistungs-Halbleiter-Schaltmodul |
Non-Patent Citations (1)
Title |
---|
PATENT ABSTRACTS OF JAPAN vol. 006, no. 072 (E - 105) 7 May 1982 (1982-05-07) * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20150140289A (ko) * | 2013-04-09 | 2015-12-15 | 에이비비 테크놀로지 아게 | 전력 반도체 모듈 |
KR102200166B1 (ko) | 2013-04-09 | 2021-01-08 | 에이비비 슈바이쯔 아게 | 전력 반도체 모듈 |
Also Published As
Publication number | Publication date |
---|---|
KR20000052973A (ko) | 2000-08-25 |
EP0938750A1 (de) | 1999-09-01 |
JP2001502849A (ja) | 2001-02-27 |
DE19644009A1 (de) | 1998-05-07 |
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