WO1997000430A1 - Dispositif de mesure pour des impulsions lumineuses courtes et ultracourtes - Google Patents

Dispositif de mesure pour des impulsions lumineuses courtes et ultracourtes Download PDF

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Publication number
WO1997000430A1
WO1997000430A1 PCT/DE1996/001127 DE9601127W WO9700430A1 WO 1997000430 A1 WO1997000430 A1 WO 1997000430A1 DE 9601127 W DE9601127 W DE 9601127W WO 9700430 A1 WO9700430 A1 WO 9700430A1
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WIPO (PCT)
Prior art keywords
pulses
pulse
partial
correlation signal
gekenn
Prior art date
Application number
PCT/DE1996/001127
Other languages
German (de)
English (en)
Inventor
Harald Schulz
Ping Zhou
Original Assignee
Optikzentrum Nrw Gmbh (Oz)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from DE19549303A external-priority patent/DE19549303A1/de
Application filed by Optikzentrum Nrw Gmbh (Oz) filed Critical Optikzentrum Nrw Gmbh (Oz)
Publication of WO1997000430A1 publication Critical patent/WO1997000430A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor
    • G—PHYSICS
    • G04—HOROLOGY
    • G04F—TIME-INTERVAL MEASURING
    • G04F13/00—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00
    • G04F13/02—Apparatus for measuring unknown time intervals by means not provided for in groups G04F5/00 - G04F10/00 using optical means
    • G04F13/026—Measuring duration of ultra-short light pulses, e.g. in the pico-second range; particular detecting devices therefor

Definitions

  • the invention relates to a measuring device for short and ultrashort light pulses with pulse durations in the femtosecond to picosecond range, with which qualitative and quantitative measurements of the pulse shape, phase, duration and spectrum as well as the chirp of short and ultrashort light pulses are carried out can.
  • Such measuring devices are used in particular in the investigation of the pulse properties of lasers and in the development and adjustment of laser systems with short or ultra-short light pulses.
  • the autocorrelation function of these pulses is usually examined.
  • individual properties of these laser pulses such as their shape, phase, spectrum or intensity, can be determined different procedures are available. These differ in particular with regard to the method in order to produce a defined delay between two partial pulses of the laser to be correlated, and with regard to the information about properties of the examined laser pulse that can be obtained by these methods.
  • Each of these methods is suitable for a specific type of laser radiation, a distinction being made in particular between methods for measuring the radiation pulse properties of highly repetitive pulses and the properties of individual light pulses or those generated with a low repetition rate.
  • the principle of measuring the light pulse properties by correlation is based in general on the fact that the light pulse to be measured is divided into two partial pulses. One of these partial pulses is then delayed by a defined time compared to the other partial pulse. Then these two partial impulses are superimposed. On the basis of the physical phenomena generated by the superimposition, ie the correlation signal, properties of the individual partial pulses can then be determined.
  • the correlation signal consists, for example, of the second or higher harmonic of the laser pulse to be examined or radiation with a mixture of the frequencies of the partial pulses to be correlated.
  • the running distance of the one partial pulse is extended by a few ⁇ m to cm.
  • the idea of the short-term measurements is therefore that a delay time p is generated by a delay path x becomes. Because of this equivalence between the delay time p and the delay path x, time-dependent properties of the light pulse, such as amplitude or phase, can then be displayed as a function of the delay path x to be generated very precisely.
  • the path of the one partial pulse is determined changes a movable element and thereby delays this partial pulse compared to the other partial pulse by a defined time.
  • the autocorrelation between these two partial pulses is determined point by point as a function of the delay path. Since this method for determining the autocorrelation for a specific delay path requires measurement with one light pulse each, the scanning autocorrelator is only suitable for measurement with laser pulses with a high repetition rate. The temporal course of the amplitude and the pulse duration of the laser pulse, but not its phase or the chirp of the laser pulse, can be determined from such measurements.
  • the two partial pulses are focused into a narrow strip by a cylindrical lens and then superimposed on one another at a certain angle.
  • the single pulse autocorrelator does not make it possible to determine the phase or the chirp of the laser pulse.
  • the radiation generated from the superimposition of the partial pulses is then analyzed in a spectrometer.
  • a two-dimensional representation of the correlation signal as a function of the delay time and the wavelength is obtained, so that the time-dependent pulse shape, the pulse phase, the pulse duration and the pulse spectrum are then obtained from this information using known methods can.
  • Such wavelength-resolving single-pulse correlators according to the prior art use a third-order nonlinear optical effect to generate the correlation signal. Therefore, only laser pulses with a high energy greater than 1 ⁇ J can be examined with this method. Since the intensity of laser pulses is inversely related to the repetition rate of the laser pulses, no laser pulses from highly repetitive laser systems can be examined with the usual wavelength-resolving individual pulse correlators.
  • the scanning autocorrelator can also be provided with dispersive imaging optics, as a result of which a wavelength-resolved autocorrelation can be measured.
  • a sampling autocorrelator requires high pulse repetition frequencies with the same permanent pulse properties in order to avoid long data acquisition times.
  • the wavelength-resolved scanning autocorrelator can therefore not be used as a pulse monitor for direct observation of the properties of laser pulses.
  • the aim of the present invention to enable and simplify the measurement of the spectral and / or temporal properties of short and ultrashort light pulses in the femtosecond and picosecond range with both high and low pulse repetition frequencies using as many correlation methods as possible.
  • Another object of the invention is to enable the simultaneous measurement of the spectral and temporal properties of such light pulses.
  • the aim of the present invention is to enable complete characterization of individual and / or low-intensity laser pulses. This object is achieved by the measuring device according to the preamble in conjunction with the characterizing features of claim 1.
  • the measuring device contains an arrangement of beam splitters and / or reflectors, which superimposes two partial pulses in an optical element which generates a cross-correlation signal of the two partial pulses, as well as for spatial or temporal and / or spectral resolution necessary detectors.
  • the two partial pulses are again superimposed in the optical element to generate a cross-correlation signal, and the resulting correlation signal is then analyzed in the detection unit.
  • pulses with different optical properties are superimposed.
  • either a pulse to be analyzed and a well-characterized pulse or also two partial pulses, which were generated from a pulse by beam splitters can be superimposed, both pulses being referred to as partial pulses in both cases.
  • partial pulses generated by beam splitters or the like are superimposed, the symmetry of these partial pulses must additionally be broken, for example, by dispersive elements in the beam path of one of the partial pulses. Since the optical element for generating the correlation signal in the second order is nonlinearly optical, radiation is generated when the two partial pulses are superimposed as a correlation signal, the frequency of which corresponds to the sum and / or difference of the two frequencies of the two partial pulses.
  • the device according to the invention makes it possible to measure the autocorrelation signal of a single partial pulse and thus to determine the spectrum of the laser beam Among other things, this results in great advantages when adjusting lasers, since every intermediate stage of laser pulse generation and amplification can now be analyzed. It is also possible to analyze the effect of these dispersive elements on the pulse shape and phase of the laser pulse by analyzing the laser pulse properties before and after passing through dispersive elements, for example samples to be examined.
  • the presented correlator can therefore be used for the analysis of laser radiation and thus also as a measuring device for analyzing samples.
  • the development and adjustment of lasers is considerably simplified by using a second-order nonlinear optical effect to generate the correlation function, even in the spectrally resolved single-pulse correlator.
  • the measuring device according to the invention is suitable for determining both the auto-correlation and the cross-correlation.
  • the measuring device according to the invention can be used both for the immediate display of the pulse properties as a pulse monitor or for the quantitative evaluation of the pulse properties as a pulse measuring system.
  • phase shift triggered by the optical components is usually regarded as undesirable in the prior art and is therefore reduced or compensated for as far as possible.
  • phase-dependent phase shift of the one partial pulse compared to the other can be deliberately generated in the measuring device according to the invention.
  • Such a wavelength-dependent, defined phase shift leads to an asymmetry between the two partial pulses. Because of this asymmetry, a non-linear optical effect of the second order can then be used to generate the correlation signal for all types of correlator, since the correlation function of the two asymmetrical ones
  • Partial pulses with spatial or temporal and spectral resolution can determine the entire information about the amplitude and phase profile of the laser pulse to be examined.
  • a dispersive element is not required if two pulses are irradiated into the device which have different optical properties than, for example, pulses generated in different oscillators. Such pulses are also to be recorded under the term partial pulses. If one of these pulses is well characterized, the properties of the cross-correlation signal can easily be determined completely with the other unknown pulse on the basis of the sum frequency generation and / or the difference frequency generation.
  • the dispersive phase shift of one partial pulse relative to the other partial pulse can advantageously be generated by a suitably chosen dielectric or metallic coating of an optical component, for example the beam splitter, or by a suitable, additional dispersive element in one of the beam paths become.
  • the radiation with the sum frequency and / or the difference frequency of the two partial pulses as a correlation signal can be generated both in the forward direction, for example in a crystal, and on a reflecting surface, for example a mirror, in the reverse direction.
  • a crystal of lithium betaborate (LBO) is particularly suitable as the crystal and a gallium arsenide surface is suitable as the surface for generating the correlation signal.
  • a reflective element can also be used to deflect the optical beam path.
  • 0.2 nJ of a pulse with a pulse duration of 100 fs is sufficient to analyze a laser pulse.
  • the correlation signal is emitted in the center of the directions of the two partial pulses in the forward or backward direction. Apart from scattered light from the two partial pulses in the direction of the correlation signal, a largely background-free measurement of the correlation can thus be carried out. There is no need to use an aperture or a wavelength filter in front of the detection unit. In addition, the maximum possible dynamic range of the measuring device is achieved in a simple manner.
  • a largely background-free measurement can also be carried out with collinear beam guidance if the exchange plate is equipped with a polarization-rotating element for one of the partial pulses and the detector for detecting the total or differential frequency radiation is provided with a polarization-analyzing element.
  • the beam path can be provided with an additional variable delay path.
  • a retroflector can advantageously be used as a movable deceleration element. If this retroflector is driven by a stepper motor via a micrometer screw, a very high relative resolution of 4 ⁇ IO 4 with delay times between 1 fs and ⁇ 40 ps can be achieved with a correspondingly strong reduction of the stepper motor. With such a movable delay element, pulses with a length between 10 fs and 80 ps can be examined.
  • a dispersive optical component can be used as the movable delay element, which is advantageously mounted in a rotatable self-adjusting holder.
  • this makes the exchange of the dispersive element very easy, and it does not become one after the exchange
  • Glass plates with which delay times between 300 fs and ⁇ 15 ps can be produced depending on the plate thickness, are particularly suitable as dispersive elements. By using glass plates of different thicknesses, the range of the delay times to be set can be changed quickly and easily.
  • Suitable detectors for the various methods for determining the correlation are both time-resolving detectors, such as secondary electron multipliers, photodiodes and the like, as well as spatially resolving detectors, such as, for example, arrangements of the charge-coupled type.
  • time-resolving detectors such as secondary electron multipliers, photodiodes and the like
  • spatially resolving detectors such as, for example, arrangements of the charge-coupled type.
  • the line focus which occurs in the single pulse correlator at the location of the nonlinear optical element, is advantageously imaged dispersively, so that no additional spectrometer gap is required for imaging.
  • the detectors on the measuring system according to the invention are exchanged in a simple manner, for example on standardized, easy-to-use and precisely positioning coupling devices.
  • the measuring device according to the invention can be provided with an exchangeable plate.
  • This interchangeable plate carries optical components which focus the two partial pulses, depending on the correlation principle to be used, on the optical element for generating the correlation signal.
  • the correlation method used can be changed quickly and with very little effort in order to subsequently examine the same laser pulse with another method.
  • an assembled plate can be removed and reinserted at will without the correct, adjusted position of the optical components mounted on it being destroyed. It has thus become possible to characterize laser pulses with any repetition rate and also very low energy in succession with all available correlation methods without great adjustment effort, without using different devices and / or having to re-adjust each time.
  • a further advantage of the measuring device according to the invention is that instead of an exchangeable plate fitted, an empty plate can be used or the exchangeable plate can be omitted.
  • the two partial pulses are then not focused on the crystal, but can be led out of the measuring device and used for excitation / interrogation pulse experiments.
  • the zero time for the two partial pulses remains, as was previously the case through a correlation experiment. ment was obtained. This saves lengthy adjustments, which can take hours or days when using conventional measuring systems.
  • the interchangeable plate in the measuring device according to the invention is advantageously adjusted using adjusting elements attached to the plate, which interact with a corresponding number of sensors of the measuring device.
  • These transducers can be designed to be self-adjusting, for example as conical depressions. A particularly high positioning accuracy can thereby be achieved by appropriate shaping of the adjusting elements attached to the plate.
  • the adjusting elements can furthermore be designed in such a way that they carry the exchangeable plate and additional support elements are therefore unnecessary.
  • exchange plates which either have one-dimensionally focusing optics, such as a mirror and a cylindrical lens, for producing a single-pulse correlator or a wavelength-resolved single-pulse correlator or a two-dimensionally focusing Optics, for example a spherically corrected achromatic and a mirror, for producing a scanning correlator or a spectrally resolved scanning correlator.
  • one-dimensionally focusing optics such as a mirror and a cylindrical lens
  • a single-pulse correlator or a wavelength-resolved single-pulse correlator or a two-dimensionally focusing Optics for example a spherically corrected achromatic and a mirror, for producing a scanning correlator or a spectrally resolved scanning correlator.
  • the dispersive optical elements can be replaced by reflective optical elements, for example mirrors.
  • An additional short-pass filter between the nonlinear optical element and the detector prevents stray light from the fundamental wave of the two partial pulses from reaching the detector.
  • the optical components can be dielectric coated specifically for the properties of the light pulse used. By matching the coating to the wavelength of the light pulse used, undesired reflections and / or dispersive effects, such as phase dispersion, can be reduced or avoided.
  • the reflective optical elements can also be metallically coated instead of dielectric.
  • the reflectivity of the metallic coating and the phase change of the light upon reflection from metallic coatings are only weakly frequency-dependent. There are therefore only small dispersive phase changes in the light field in the case of the metallic coating, which would lead to a change in the light pulse properties in the case of ultrashort light pulses.
  • a particular advantage of the metallic coating is consequently that when the laser pulse wavelength used is changed, no change of the mirror is necessary and ultrashort pulses (up to 10 fs) with a large spectral bank width (up to greater than 200 nm) can be measured.
  • the reflective optical elements can be coated with gold particularly advantageously.
  • a gold coating has a very high reflectivity for these wavelengths.
  • a gold coating has a considerably higher reflectivity in the near infrared range and in the infrared range.
  • a gold coating is chemically stable, so that no additional protective layer is required.
  • the gold coating can be applied using a plasma-assisted process.
  • a gold coating has improved adhesion and, in contrast to conventional gold coatings, for example by evaporation, can be cleaned with a conventional lens cloth without the risk of destruction.
  • the destruction limit of the plasma-supported gold coating applied by intensive laser radiation is also higher than the destruction limit of conventionally applied gold coatings.
  • the beam splitter can also be metallically coated to avoid undesired phase changes of the continuous partial pulse instead of being coated with a dielectric. This results in a lower dispersive phase modulation of the continuous, non-reflected partial pulse and a large spectral bandwidth within which the beam splitter can be used.
  • the measuring device according to the invention can also be provided with an additional pulse compressor, for example a prism compressor, the dispersion of which can be adjusted. Such a compensation of the dispersion is particularly advantageous for ultrashort light pulses with a pulse duration of less than 20 fs.
  • the recording of the data and the control of the measuring device according to the invention and the detectors can be carried out via microcontrollers. Furthermore, the data can be recorded, offset and displayed at the same time. Another possibility is that the laser power is determined and recorded parallel to the measurement of the correlation.
  • the user thus has the complete representation of both Fourier components, frequency and time, as a two-dimensional pattern and no longer needs, as in the prior art, to combine the temporal and spectral course.
  • the individual light pulse to be analyzed enters the scanning correlator through an aperture 10 below the mirror 1.
  • the light pulse is split by a beam splitter 4 into two partial pulses, which are directed by mirrors 2 and 3 to two retroflectors 7 and 8, which shift the beam in height.
  • the beam splitter is coated dielectric and / or metallic in order to generate a defined, frequency-dependent phase shift between the two partial pulses.
  • the two partial impulses pass through a glass plate 5, which is driven by a speed-controlled motor 6 with a step constancy of 10 3 and rotation frequencies is rotated between 0.1 Hz and 25 Hz.
  • the glass plate 5 generates a path difference .DELTA.L between the two partial pulses, which results from the following formula (FIG. 2):
  • ⁇ L —2— [ n -cos ( ⁇ i- ⁇ i)] -— Lr [n-cos ( ⁇ 2 - ⁇ £)] cos ⁇ i cos ⁇ j
  • the thickness and n the refractive index of the glass plate 5, ⁇ - and ⁇ 2 the angle of incidence of the two partial pulses on the glass plate 5 and ⁇ , 'and ⁇ 2 ' the angle between the rays broken into the glass plate len and the surface normal of the glass plate.
  • the reflected partial pulses then pass through the glass plate 5 again and are sent again by the mirrors 2 and 3 through the beam splitter 4.
  • One of the partial pulses is deflected by mirror 1 in such a way that it runs offset but parallel to the other partial pulse in the direction of an exchangeable plate 13.
  • One partial pulse passes through an aperture 11 and then parallel to the other partial pulse through a spherical lens 14 mounted on the interchangeable plate 13.
  • Both pulses are deflected approximately at right angles by a mirror 15 which is also mounted on the interchangeable plate 13 and meet in their focus, which is due to the lens 14 in a crystal 9.
  • An LBO crystal is used as crystal 9.
  • the electromagnetic wave generated in the LBO crystal 9 with the sum frequency of the individual frequencies of the two partial pulses is centered on the direction of the two by the LBO crystal Partial impulses emitted and hit a mirror
  • the mirror 16 directs the radiation at the sum frequency through an aperture 20 to a detector
  • the detector 17 is, for example, a secondary electron multiplier.
  • the exchangeable plate 13 can be removed from the measuring device 12 or inserted into it in the simplest way. It is held in position with a precision of 10 ⁇ m by means of precision pins, so that a plate can be replaced without having to make any new adjustments.
  • a spherical lens 14 and a mirror 15 are mounted on the exchangeable plate 13.
  • the retro reflector 8 is displaceable. It can be used to generate delay times between 1 fs and greater than +/- 40 ps. Delay times between ⁇ 300 fs and ⁇ 15 ps can be generated with the glass pane.
  • the detector 17 records the intensity of the pulse with the sum frequency as a function of the delay time or the delay path.
  • 5 light pulses with a high pulse repetition frequency and, at a rotational frequency of up to 0.1 Hz, also light pulses with a low pulse repetition rate can be characterized.
  • light pulses with low and high pulse repetition frequencies can also be measured using the delay lines generated by the retro-reflector 8.
  • the pulse duration of the light pulse to be analyzed can be determined from the correlation signal recorded by the detector 17.
  • the 3 shows a sampling correlator as shown in FIG. 1.
  • the radiation generated by the crystal 9 with the sum frequency of the individual frequencies of the partial pulses is imaged onto the detector 17 by a lens 18 and a dispersive element 19.
  • the wavelength-resolved signals thus obtained are recorded by a one-dimensional detection unit 17.
  • the dispersive imaging element 19 can be, for example, a grating and a spherically curved mirror.
  • the line detection unit 17 is, for example, of the charge-coupled type.
  • This arrangement realizes a wavelength-resolving scanning correlator which, in addition to measuring the pulse shape, also enables the chirp to be determined. Because of its otherwise identical arrangement to FIG. 1, it is also possible in this case to analyze light pulses with both high and low pulse repetition frequencies. Since the generation of the radiation with a sum frequency is also used here to determine the correlation, low light pulse energies are also sufficient for this measuring method, as in the case of the scanning correlator from FIG.
  • FIG. 4 shows an arrangement in which, compared to the scanning correlator from FIG. 1, the exchangeable plate 13 has been removed or has been replaced by an empty plate. As a result, the two partial light pulses can now be used, for example, outside the measuring device according to the invention for pump probe experiments.
  • the achievable delays of one partial pulse against the other partial pulse are also in the range of ⁇ 40 ps for the generation of the delay by shifting the retro-reflector 8 and in the range of ⁇ 300 fs to ⁇ 15 ps for the generation of the delay through the glass plate 5.
  • the exchange plate 13 is now equipped with a mirror 15 and a cylindrical lens 14.
  • the cylindrical lens 14 focuses the two partial pulses on one another at a predetermined angle in the crystal 9 in line form.
  • the exchange plate 13 can also be equipped with 2 deflecting mirrors and a cylindrical lens in order to vary the angle between the partial beams. Radiation with the total frequency of the individual partial pulses is only generated in the crystal 9 where in the crystal 9 the partial pulses overlap both temporally and spatially.
  • This Overlay line is formed by a mirror 16 and a lens 18 in a one-dimensional detector arrangement, for example of the charge-coupled type.
  • the pulse duration and, approximately, the pulse shape of the light pulse to be examined can also be determined from this representation of the correlation signal.
  • the delay time in the individual pulse correlation can be varied further according to FIG. 5.
  • the displaceable retroflector 8 can be used to produce an additional defined delay between the partial pulses, which results in a shift in the image of the overlap line obtained with the detector, i.e. of the correlation signal, along the pixel of the one-dimensional position-resolving detector.
  • a single pulse correlator which measures time and wavelength resolved.
  • the mirror 16, the lens 18 and the detection unit 17 of FIG. 5 are made up of an achromatic lens 18, the dispersive element 19 from a grating and a spherical mirror and a two-dimensional detection arrangement 17, for example of the charge-coupled type, are replaced.
  • the phase shift between the two partial pulses is not caused by a dielectric Coating the beam splitter, but by an additional dispersive element 21, for example a glass plate, which is located in the beam path of one of the two partial pulses.
  • the one-dimensional image of the superposition of the two partial pulses is now diffracted perpendicularly to this axis by the dispersive imaging element 19.
  • Line focus in the crystal corresponds to an illuminated slit in a spectrometer. Therefore, an additional input slit of the spectrally resolving element 19 can be dispensed with and the line focus can be imaged directly dispersively on the detector 17.
  • the two-dimensional detector 17 thus provides a time-dependent and wavelength-dependent representation of the intensity of this sum frequency radiation along two orthogonal coordinate axes. In this way, the temporal and wavelength-dependent correlation function for a single light pulse can be measured at the same time.
  • FIG. 7 shows a further single pulse correlator which measures time and wavelengths in a resolved manner.
  • the arrangement of this single pulse correlator largely corresponds to the arrangement shown in FIG. 6 and described there.
  • two laser pulses with two different wavelengths ⁇ 1 and ⁇ 2 are radiated into the device according to the invention.
  • Both beams pass through the aperture 10.
  • the beam with the frequency ⁇ l is directed by the mirror 2 and the retroflector 7 onto the mirror 1 and is radiated from there in the direction of the exchangeable plate 15.
  • the beam with the frequency ⁇ 2 is radiated back through the semi-transparent mirror 4, the mirror 3 and the retroflector 8 via the mirror 3 and the semi-transparent mirror 4 in the direction of the exchangeable plate 15. It can be seen that in this case the mirrors 1 and 4 are arranged differently in accordance with the geometry caused by the two laser pulses than in the previous examples.
  • the beam ⁇ 2 passes through an aperture 11 and, together with the beam ⁇ l, is focused onto a crystal 9 by a dispersive element 14. The focusing takes place in the same way as described in FIG.
  • this cross-correlation signal is particularly simple if one of the two pulses, for example the laser pulse ⁇ l, is well characterized with regard to its optical properties.
  • the optical properties of the second laser pulse superimposed with it can be determined simply and quickly. This makes it possible, for example, to overlay an amplified laser pulse with a non-amplified pulse from a laser oscillator, which can usually be characterized very well, and thereby to obtain a rapid and precise characterization of the amplified laser pulse.
  • the device described here and the method described here for superimposing two separately irradiated laser pulses can not only be used for the spectrally resolving single pulse described here. correlator but can also be used in the same way for all other correlators described so far.
  • the term partial pulse used up to now therefore refers not only to two partial pulses which were obtained from a laser pulse via beam splitters, but also to two separately irradiated laser pulses, as denoted by ⁇ 1 and ⁇ 2 in FIG. 7.
  • the measuring systems according to the invention given in the exemplary embodiments make it possible to measure the correlation largely free of background due to their non-collinear beam guidance. In this way, the correlation can be measured with very high dynamics (16 bits or more depending on the detector used).

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Abstract

L'invention a pour objet un dispositif de mesure pour des impulsions lumineuses courtes et ultracourtes, à durée de l'ordre de la femtoseconde et de la picoseconde, au moyen duquel on peut effectuer une caractérisation complète eu égard à la forme, à la phase, à la durée et au spectre des impulsions, ainsi qu'aux fluctuations de fréquence des impulsions lumineuses courtes et ultracourtes, à la fois pour des lasers à fréquence élevée de récurrence des impulsions et pour des lasers à fréquence faible élevée de récurrence des impulsions, et pour une intensité élevée ou faible. L'impulsion laser à déterminer est scindée en deux impulsions partielles, et l'un des deux faisceaux partiels est soumis à une dispersion supplémentaire, ou bien une deuxième impulsion laser bien caractérisée est irradiée en plus de l'impulsion laser à déterminer. Les deux faisceaux partiels sont ensuite superposés l'un à l'autre dans un élément optique non linéaire du second ordre, par exemple, dans un cristal ou sur une surface. Le rayonnement de fréquence somme résultant est analysé chronologiquement, dans l'espace et/ou spectralement sous la forme d'un signal de corrélation.
PCT/DE1996/001127 1995-06-19 1996-06-19 Dispositif de mesure pour des impulsions lumineuses courtes et ultracourtes WO1997000430A1 (fr)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
DE19522190 1995-06-19
DE19522190.7 1995-06-19
DE19526767.2 1995-07-21
DE19526767 1995-07-21
DE19549303.6 1995-12-22
DE19549303A DE19549303A1 (de) 1995-06-19 1995-12-22 Meßvorrichtung für kurze und ultrakurze Lichtimpulse
DE19549280.3 1995-12-22
DE1995149280 DE19549280A1 (de) 1995-06-19 1995-12-22 Meßvorrichtung für kurze und ultrakurze Lichtimpulse

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PCT/DE1996/001125 WO1997000429A1 (fr) 1995-06-19 1996-06-19 Dispositif de mesure pour des impulsions lumineuses courtes et ultracourtes

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100366298B1 (ko) * 2000-01-27 2002-12-31 한국전자통신연구원 극초단펄스 스펙트럼 분석방법
DE102004054408A1 (de) * 2004-11-10 2006-05-11 Johann Wolfgang Goethe-Universität Frankfurt am Main Bestimmung der Carrier-Envelope Phase (CEP) eines ultrakurzen Laserpulses
DE102010026701A1 (de) * 2010-05-12 2011-11-17 Forschungsverbund Berlin E.V. Verfahren und Vorrichtung zur räumlich-zeitlichen Pulsanalyse mittels statischer Parameter
WO2019056127A1 (fr) * 2017-09-25 2019-03-28 Institut National De La Recherche Scientifique Procédé et système à grille temporelle linéaire pour une caractérisation d'impulsion ultracourte

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KR100366298B1 (ko) * 2000-01-27 2002-12-31 한국전자통신연구원 극초단펄스 스펙트럼 분석방법
DE102004054408A1 (de) * 2004-11-10 2006-05-11 Johann Wolfgang Goethe-Universität Frankfurt am Main Bestimmung der Carrier-Envelope Phase (CEP) eines ultrakurzen Laserpulses
DE102004054408B4 (de) * 2004-11-10 2007-05-31 Johann Wolfgang Goethe-Universität Frankfurt am Main Bestimmung der Carrier-Envelope Phase (CEP) eines ultrakurzen Laserpulses
DE102010026701A1 (de) * 2010-05-12 2011-11-17 Forschungsverbund Berlin E.V. Verfahren und Vorrichtung zur räumlich-zeitlichen Pulsanalyse mittels statischer Parameter
DE102010026701B4 (de) * 2010-05-12 2012-03-01 Forschungsverbund Berlin E.V. Verfahren und Vorrichtung zur räumlich-zeitlichen Pulsanalyse mittels statischer Parameter
DE102010026701B8 (de) * 2010-05-12 2012-05-10 Forschungsverbund Berlin E.V. Verfahren und Vorrichtung zur räumlich-zeitlichen Pulsanalyse mittels statistischer Parameter
WO2019056127A1 (fr) * 2017-09-25 2019-03-28 Institut National De La Recherche Scientifique Procédé et système à grille temporelle linéaire pour une caractérisation d'impulsion ultracourte

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