WO1979000189A1 - Procede et dispositif pour la mesure d'une distance - Google Patents

Procede et dispositif pour la mesure d'une distance Download PDF

Info

Publication number
WO1979000189A1
WO1979000189A1 PCT/CH1978/000026 CH7800026W WO7900189A1 WO 1979000189 A1 WO1979000189 A1 WO 1979000189A1 CH 7800026 W CH7800026 W CH 7800026W WO 7900189 A1 WO7900189 A1 WO 7900189A1
Authority
WO
WIPO (PCT)
Prior art keywords
measuring
target
distance
image
impact point
Prior art date
Application number
PCT/CH1978/000026
Other languages
German (de)
English (en)
Inventor
T Celio
Original Assignee
T Celio
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by T Celio filed Critical T Celio
Publication of WO1979000189A1 publication Critical patent/WO1979000189A1/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/10—Measuring distances in line of sight; Optical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument

Definitions

  • the invention relates to a method and a device for distance measurement using a light beam illuminating the target.
  • the measurement of distances using a light beam has boomed since the invention of LASER.
  • High radiance, small angular divergence and monochromaticity are the characteristics of the LASER that distinguish this light source, although, depending on the application, rays derived from classic light sources can also be used.
  • the usual way of measuring distance using a light beam consists of illuminating the target and collecting the light reflected by it from the same location, as well as subsequently determining the time difference between returning and returning radiation.
  • the disadvantage here is that the high propagation speed of the light leads in principle to very short runtime differences (learning corresponds to 30 psec), the measurement of which is subject to technological limits. High relative measurement accuracy can therefore only be achieved practically when measuring larger distances.
  • the object of the invention is to provide a method for distance measurement which still has high measurement accuracy even at smaller distances and which requires a modest technical outlay.
  • the invention is based on the known type of distance measurement by means of a beam of light illuminating the target and is characterized in that an optical image of the beam impact point is created at an angle, based on the direction of incidence, of between 0 and 90 that by photoelectronic scanning local position of the impact point image is determined and that the distance of the target is calculated from this position.
  • Fig. 3 the basic type of photoelectronic position determination
  • Fig. 6 shows an exemplary embodiment.
  • Beam S 1 is emitted by light source 1, which hits a target 2 at a distance D 1 at point T 1 .
  • the light reflected by T. is partially collected at an angle ⁇ by lens 3 and thus image T 2 of the impact point T 1 is created. If goal 2 is closer (T ') or a further (T 1 ") distance, correspondingly shifted images will result, which form a straight line, image 4 of all possible impact points.
  • Image 4 is scanned photoelectronically by means of a device 5 located at a known distance A 2 from the light source in computer 7, in a manner known per se, the respective position of T 2 within image 4 (ie distance d 2 ) is determined and then calculated in computer 8, in a manner still to be enlightened, D 1 .
  • the parameters b 1 and b 1 correspond to the segments LZ 2 and A 1 L.
  • System parameters b 1 b 2 can therefore be determined for the system by selecting a, ⁇ , f. If distance d 2 (from computer 7) is determined, then distance D 1 (from computer 8) can be calculated using formula 3.
  • point A 1 represents the lower limit of the measuring range in the object space (the image of A 1 is infinite) and point Z 2 represents the position of the target image closest to light source 0 (target is infinitely distant).
  • ⁇ and a determines the physical dimensions of the measurement arrangement. They can be freely selected within wide limits. It is only necessary to prevent the angle ß from taking the values 0 and 90. In the first case, image 4 (FIG. 1) is reduced to one point, in the second case practically no light reaches lens 3.
  • FIGS. 1 and 3 The photoelectronic determination of the position of the impact point image is explained on the basis of FIGS. 1 and 3, a camera tube (for example Vidicon) being assumed as the photodetector.
  • Fig. 4 consists of a straight line illuminated at certain points. This is imaged on the photocathode of camera 5.
  • Deflection generator 6 and deflection coil 10 effect a linear scanning of FIG. 4, the linear increase in time of deflection current J 2 (known to be directly linked to the respective local position of the scanning spot) being reduced via resistor 9 as sawtooth voltage U 7 (proportional to d 2 ) ( Fig. 3).
  • sawtooth voltage U 7 Proportional to d 2
  • Fig. 3 Meets the scanning beam onto the illuminated point T 2 , then a pulse U 1 is generated via camera load resistor 11.
  • Computer 7 (essentially a coincidence level) uses sawtooth U 2 to determine the time t 2 , which, based on t 2m and d 2
  • t 2 and d 2 are system parameters and correspond to the lower distance limit of the measuring range.
  • D 1 is calculated from D 2 in computer 8 according to formula 5, where
  • D 2 A 2 + d 2 10) applies.
  • a 2 is system parameter and, as noted, computer 2 calculates d 2 .
  • the invention thus achieves a simple distance measurement which electronically permits the use of slow circuit technology and elementary computer technology and is limited in measurement accuracy only by the spatial resolution of the photoelectronic scanning device.
  • At least two systems are used simultaneously for measurement, the illuminating light bundles of which lie in the same plane 21.
  • This arrangement shown in Fig. 4 is particularly suitable for measuring perforated profiles.
  • the hole diameter can be determined, when using several systems lying in level 21, distances D 11 , D 12 , D 13 , D 14 etc. can be measured, from which, by interpolation, the hole profile can be calculated.
  • a system in accordance with the invention is rotated about an axis 15 which is perpendicular to the beam of light shining on it.
  • This arrangement shown in FIG. 5 is particularly suitable for measuring perforated profiles, which can be scanned sequentially and with any desired resolution.
  • the systems described in the two previous embodiments are moved in translation. These arrangements shown in FIGS. 4 and 5 are particularly suitable for the continuous measurement of boreholes when the translation 15 takes place parallel to the hole axis.
  • the drill hole is then scanned sequentially in the form of a spiral 18 in the rotating arrangement of FIG. 5 and along the surface lines 17 in the case of the simultaneous arrangement of FIG. 4.
  • the systems 180 described in the penultimate and second-last embodiment are rotated about an axis 16 which lies in the measurement plane 21 and passes through the measurement center 0.
  • This arrangement shown in FIG. 6 is particularly suitable for measuring cavities which are scanned sequentially by a number of meridians 20 or latitude circles 22.
  • a LASER beam is used as the emitting light beam. This arrangement offers the advantage of high luminance and is simple in terms of device technology.
  • a linear photodiode array is used for photoelectronic scanning of the impact point image.
  • This arrangement has the advantages high geometric accuracy and stability as well as smallest dimensions.
  • FIG. 7 An embodiment of the device according to the invention is given in FIG. 7. This is the measurement of distances between 3500 and 6000 mm, which typically occur as profile radii in tunnel construction. A simultaneous or sequential scanning of the profile according to subclaims 1 respectively. 2 is used.
  • the radiation emitted by LASER 1 is partially reflected at target 2, partially collected by objective 3 and imaged on photodetector 5, which is designed as a linear photodiode array.
  • a CLOCK signal is derived from a clock generator 12, which uses the shift register built into the photodiode array 5 to query the state of charge of the capacitor assigned to each photodiode in succession. The result of this scan is taken in synchronism with the CLOCK signal at the ⁇ flDEO output.
  • d 2 k 1 d 2 '11) where k 1 represents the distance (eg mm) between the individual photodiodes.
  • Value d 2 ' is taken over by computer 8, where first d 2 (according to formula 11) is calculated. Then the absolute position D 2 becomes due to the operation
  • D 2 D 2 min + d 2 12) determined where D 2 mm. (for the applicable values of the optical arrangement) is calculated from D 1 using Formula 6. Finally, the target distance D 1 is calculated using Formula 5. In the meantime, the polling process has continued on array 5. After the last photodiode in the array has been scanned, a RESET pulse is emitted, which sets counter 14 to zero. A new measuring cycle is then initiated automatically or on command.
  • Image 4 of the measuring section has a length of D 2 max

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Un procede et un dispositif pour la mesure d'une distance utilisent une disposition optotrigonometrique et une determination de position photoelectronique. Le but (2) est irradie au moyen d'un rayonnement lumineux (S1) et le point -- d'impact (T1) est represente optiquement sur un photodetecteur lineaire (5) au moyen d'un angle oblique (B) par rapport a la direction d'irradiation. On determine la position spatiale (d2) de l'image d'impact au moyen d'un balayage electronique du photodetecteur et de la, on calcule l'eloignement (D1) du but au moyen de relations trigonometriques. Des variantes preferentielles sont specialement destinees a la mesure de courtes distances et de profils creux.
PCT/CH1978/000026 1977-10-06 1978-10-04 Procede et dispositif pour la mesure d'une distance WO1979000189A1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH1226177A CH628138A5 (de) 1977-10-06 1977-10-06 Verfahren und vorrichtung zur messung der entfernung eines zielobjekts durch beaufschlagung mit einem strahlenbuendel sowie anwendung des verfahrens.
CH12261/77 1977-10-06

Publications (1)

Publication Number Publication Date
WO1979000189A1 true WO1979000189A1 (fr) 1979-04-19

Family

ID=4381369

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CH1978/000026 WO1979000189A1 (fr) 1977-10-06 1978-10-04 Procede et dispositif pour la mesure d'une distance

Country Status (2)

Country Link
CH (1) CH628138A5 (fr)
WO (1) WO1979000189A1 (fr)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US4373805A (en) * 1979-05-03 1983-02-15 The Singer Company Laser altimeter and probe height sensor
US4477184A (en) * 1979-01-19 1984-10-16 Nissan Motor Company, Limited Obstacle detection system for use in vehicles
GB2143396A (en) * 1983-05-21 1985-02-06 Mac Co Ltd Beam riding location system
US4939439A (en) * 1985-09-26 1990-07-03 Unisearch Limited Robot vision and optical location systems
US5086411A (en) * 1988-07-25 1992-02-04 Unisearch Limited Optical location systems
US5280179A (en) * 1979-04-30 1994-01-18 Sensor Adaptive Machines Incorporated Method and apparatus utilizing an orientation code for automatically guiding a robot
US5940302A (en) * 1981-02-27 1999-08-17 Great Lakes Intellectual Property Controlled machining of combustion chambers, gears and other surfaces
DE10015153B4 (de) * 2000-03-27 2006-07-13 Metronom Ag Lichtschnittsystem für ultraviolettes Licht

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1389111A (fr) * 1963-02-22 1965-02-12 Marconi Co Ltd Dispositifs de mesures des distances notamment pour les véhicules à coussins d'air
LU49115A1 (fr) * 1965-07-19 1967-01-19
US3610754A (en) * 1967-11-24 1971-10-05 Centre Nat Rech Metall Method for determining distances
NL7202622A (fr) * 1971-03-19 1972-09-21 Siemens Ag
FR2242663A1 (fr) * 1973-08-31 1975-03-28 Alcyon
GB1450577A (en) * 1973-08-13 1976-09-22 British Gas Corp Apparatus for measuring the size of subterranean cavities

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1389111A (fr) * 1963-02-22 1965-02-12 Marconi Co Ltd Dispositifs de mesures des distances notamment pour les véhicules à coussins d'air
LU49115A1 (fr) * 1965-07-19 1967-01-19
US3610754A (en) * 1967-11-24 1971-10-05 Centre Nat Rech Metall Method for determining distances
NL7202622A (fr) * 1971-03-19 1972-09-21 Siemens Ag
GB1450577A (en) * 1973-08-13 1976-09-22 British Gas Corp Apparatus for measuring the size of subterranean cavities
FR2242663A1 (fr) * 1973-08-31 1975-03-28 Alcyon

Cited By (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4477184A (en) * 1979-01-19 1984-10-16 Nissan Motor Company, Limited Obstacle detection system for use in vehicles
US5734172A (en) * 1979-04-30 1998-03-31 Sensor Adaptive Machines Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US5877491A (en) * 1979-04-30 1999-03-02 Sensor Adaptive Machines, Inc. Method and apparatus for imaging an object illuminated with light
US5773840A (en) * 1979-04-30 1998-06-30 Sensor Adaptive Machines Inc. Method & apparatus for electro optically determining the dimension, location & attitude of objects
US5767525A (en) * 1979-04-30 1998-06-16 Sensor Adaptive Machines Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US6211506B1 (en) * 1979-04-30 2001-04-03 Diffracto, Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5280179A (en) * 1979-04-30 1994-01-18 Sensor Adaptive Machines Incorporated Method and apparatus utilizing an orientation code for automatically guiding a robot
US5362970A (en) * 1979-04-30 1994-11-08 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5510625A (en) * 1979-04-30 1996-04-23 Sensor Adaptive Machines Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US5670787A (en) * 1979-04-30 1997-09-23 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5677541A (en) * 1979-04-30 1997-10-14 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5684292A (en) * 1979-04-30 1997-11-04 Sensor Adaptive Machines, Inc. Method and apparatus for electro optically determining the dimension location and attitude of objects
US5691545A (en) * 1979-04-30 1997-11-25 Sensor Adaptive Machines Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5693953A (en) * 1979-04-30 1997-12-02 Sensor Adaptive Machines, Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US4373804A (en) * 1979-04-30 1983-02-15 Diffracto Ltd. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US6127689A (en) * 1979-04-30 2000-10-03 Diffracto Ltd. Method and apparatus for positioning a member relative to an object surface
US5981965A (en) * 1979-04-30 1999-11-09 Lmi-Diffracto Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5786602A (en) * 1979-04-30 1998-07-28 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5811827A (en) * 1979-04-30 1998-09-22 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5811825A (en) * 1979-04-30 1998-09-22 Sensor Adaptive Machines, Inc. Method and apparatus for electro-optically determining the dimension, location and attitude of objects
US5854491A (en) * 1979-04-30 1998-12-29 Sensor Adaptive Machines, Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US5866916A (en) * 1979-04-30 1999-02-02 Sensor Adaptive Machines, Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US5866915A (en) * 1979-04-30 1999-02-02 Sensor Adaptive Machines, Inc. Method and apparatus for electro optically determining the dimension, location and attitude of objects
US5883390A (en) * 1979-04-30 1999-03-16 Sensor Adaptive Machines, Inc. Method and apparatus for positioning a member in a desired attitude relative to the surface of an object
US5880459A (en) * 1979-04-30 1999-03-09 Sensor Adaptive Machines, Inc. Method and apparatus for control of a detector array based imaging
US4373805A (en) * 1979-05-03 1983-02-15 The Singer Company Laser altimeter and probe height sensor
US5940302A (en) * 1981-02-27 1999-08-17 Great Lakes Intellectual Property Controlled machining of combustion chambers, gears and other surfaces
GB2143396A (en) * 1983-05-21 1985-02-06 Mac Co Ltd Beam riding location system
US4939439A (en) * 1985-09-26 1990-07-03 Unisearch Limited Robot vision and optical location systems
US5086411A (en) * 1988-07-25 1992-02-04 Unisearch Limited Optical location systems
DE10015153B4 (de) * 2000-03-27 2006-07-13 Metronom Ag Lichtschnittsystem für ultraviolettes Licht

Also Published As

Publication number Publication date
CH628138A5 (de) 1982-02-15

Similar Documents

Publication Publication Date Title
EP1423731B1 (fr) Procede et dispositif pour acquerir une image telemetrique tridimensionnelle
DE60124647T2 (de) Vorrichtung und Verfahren zur Abstandsmessung
DE3122712A1 (de) "verfahren und vorrichtung zum beruehrungslosen messen von oberflaechenprofilen"
DE3305739A1 (de) Vorrichtung und verfahren zum aufbereiten von lagemesssignalen
DE3318331A1 (de) Entfernungsmesseinrichtung
DE2637361A1 (de) Vorrichtung zum messen der bewegung eines ersten teiles relativ zu einem zweiten teil
DE3930632A1 (de) Verfahren zur direkten phasenmessung von strahlung, insbesondere lichtstrahlung, und vorrichtung zur durchfuehrung dieses verfahrens
EP1236023B1 (fr) Systeme pantometre
DE2307722A1 (de) Verfahren und geraet zur flaechenmessung ohne beruehrung
DE3613209A1 (de) Optische oberflaechenprofil-messeinrichtung
DE10217726A1 (de) Optische Positionsmesseinrichtung
CH658514A5 (de) Verfahren und vorrichtung zur erfassung einer messgroesse.
WO1979000189A1 (fr) Procede et dispositif pour la mesure d'une distance
DE1905392A1 (de) Vorrichtung zum Erzeugen von elektrischen Signalen mittels eines Skalengitters,das relativ zu einem Indexgitter bewegbar ist
DE3542514A1 (de) Wegmesseinrichtung
DE19963809C2 (de) Optischer Encoder mit dreifacher Photodiode
EP0324757B1 (fr) Procede d'extension de la resolution d'une camera a lignes ou a matrice
DE3824820C2 (fr)
CH616508A5 (fr)
DE3312203C2 (fr)
DE2526110C3 (de) Vorrichtung zum Messen kleiner Auslenkungen eines Lichtbündels
WO2017037248A1 (fr) Procédé de mesure par filtre spatial et dispositif de mesure par filtre spatial
DE3517671A1 (de) Vorrichtung zum bildpunktweisen erfassen der oberflaechengestalt eines entfernten objektes
DE1813743A1 (de) Anordnung zur Abtastung eines Feldes in zwei Richtungen
DE112015006912T5 (de) Optisches Entfernungsmesssystem

Legal Events

Date Code Title Description
AK Designated states

Designated state(s): JP US

AL Designated countries for regional patents

Designated state(s): DE FR GB

WA Withdrawal of international application