USD350490S - Semiconductor wafer testing apparatus - Google Patents

Semiconductor wafer testing apparatus Download PDF

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Publication number
USD350490S
USD350490S US29/006,815 US681593F USD350490S US D350490 S USD350490 S US D350490S US 681593 F US681593 F US 681593F US D350490 S USD350490 S US D350490S
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US
United States
Prior art keywords
semiconductor wafer
testing apparatus
wafer testing
view
ornamental design
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US29/006,815
Inventor
Itaru Takao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Tokyo Electron Yamanashi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd, Tokyo Electron Yamanashi Ltd filed Critical Tokyo Electron Ltd
Assigned to TOKYO ELECTRON KABUSHIKI KAISHA, TOKYO ELECTRON YAMANASHI KABUSHIKI KAISHA reassignment TOKYO ELECTRON KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TAKAO, ITARU
Application granted granted Critical
Publication of USD350490S publication Critical patent/USD350490S/en
Assigned to TOKYO ELELCTRON KABUSHIKI KAISHA reassignment TOKYO ELELCTRON KABUSHIKI KAISHA ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: TOKYO ELECTRON YAMANASHI KABUSHIKI KAISHA
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top, front and right side perspective view of a semiconductor wafer testing apparatus showing my new design;
FIG. 2 is a top plan view;
FIG. 3 is a front elevational view;
FIG. 4 is a left side elevational view;
FIG. 5 is a right side elevational view;
FIG. 6 is a rear elevational view; and,
FIG. 7 is a bottom plan view thereof.

Claims (1)

  1. The ornamental design for semiconductor wafer testing apparatus, as shown and described.
US29/006,815 1992-10-08 1993-04-07 Semiconductor wafer testing apparatus Expired - Lifetime USD350490S (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2949992 1992-10-08
JP4-29499 1992-10-08

Publications (1)

Publication Number Publication Date
USD350490S true USD350490S (en) 1994-09-13

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ID=70916512

Family Applications (1)

Application Number Title Priority Date Filing Date
US29/006,815 Expired - Lifetime USD350490S (en) 1992-10-08 1993-04-07 Semiconductor wafer testing apparatus

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US (1) USD350490S (en)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD383683S (en) * 1996-04-25 1997-09-16 Tokyo Electron Limited Wafer prober
USD637098S1 (en) * 2009-10-30 2011-05-03 Hitachi High-Technologies Corporation Semiconductor testing machine
USD642941S1 (en) * 2009-12-22 2011-08-09 Robert Bosch Gmbh Test bench
USD935424S1 (en) * 2019-05-06 2021-11-09 Lam Research Corporation Semiconductor wafer processing tool
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD323628S (en) 1989-04-25 1992-02-04 Tokyo Electron Limited Semiconductor wafer measuring instrument
US5141212A (en) 1991-04-08 1992-08-25 Ekstrom Carlson & Co. Vacuum chuck with foam workpiece-supporting surface
US5264069A (en) 1990-05-09 1993-11-23 G. M. Pfaff Aktiengesellshcaft Device for joining a two-dimensional compound workpiece

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD323628S (en) 1989-04-25 1992-02-04 Tokyo Electron Limited Semiconductor wafer measuring instrument
US5264069A (en) 1990-05-09 1993-11-23 G. M. Pfaff Aktiengesellshcaft Device for joining a two-dimensional compound workpiece
US5141212A (en) 1991-04-08 1992-08-25 Ekstrom Carlson & Co. Vacuum chuck with foam workpiece-supporting surface

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Fully Automatic Wafer Prober Model 785, Tokyo Electron Limited, p. 2.

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD383683S (en) * 1996-04-25 1997-09-16 Tokyo Electron Limited Wafer prober
USD637098S1 (en) * 2009-10-30 2011-05-03 Hitachi High-Technologies Corporation Semiconductor testing machine
USD642941S1 (en) * 2009-12-22 2011-08-09 Robert Bosch Gmbh Test bench
USD935424S1 (en) * 2019-05-06 2021-11-09 Lam Research Corporation Semiconductor wafer processing tool
USD990538S1 (en) * 2021-02-05 2023-06-27 Syskey Technology Co., Ltd. Miniaturized semiconductor manufacturing device
USD989144S1 (en) * 2021-05-14 2023-06-13 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate
USD989830S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Semiconductor substrate transfer apparatus
USD989831S1 (en) * 2021-05-14 2023-06-20 Hitachi High-Tech Corporation Apparatus for evaluating semiconductor substrate

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