USD292979S - Automatic semiconductor wafer tester - Google Patents

Automatic semiconductor wafer tester Download PDF

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Publication number
USD292979S
USD292979S US06/727,417 US72741785F USD292979S US D292979 S USD292979 S US D292979S US 72741785 F US72741785 F US 72741785F US D292979 S USD292979 S US D292979S
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US
United States
Prior art keywords
semiconductor wafer
wafer tester
automatic semiconductor
automatic
tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US06/727,417
Inventor
Marland Chow
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tencor Instruments Inc
Prometrix Corp
Original Assignee
Prometrix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Prometrix Corp filed Critical Prometrix Corp
Priority to US06/727,417 priority Critical patent/USD292979S/en
Assigned to PROMETRIX CORPORATION, A A CORP OF CA reassignment PROMETRIX CORPORATION, A A CORP OF CA ASSIGNMENT OF ASSIGNORS INTEREST. Assignors: CHOW, MARLAND
Application granted granted Critical
Publication of USD292979S publication Critical patent/USD292979S/en
Assigned to TENCOR INSTRUMENTS (A CA CORP.) reassignment TENCOR INSTRUMENTS (A CA CORP.) MERGER (SEE DOCUMENT FOR DETAILS). Assignors: PROMETRIX CORPORATION (A CA CORP.)
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

FIG. 1 is a top and left front perspective view of an automatic semiconductor wafer tester showing my new design;
FIG. 2 is a top plan view thereof;
FIG. 3 is a front elevational view thereof;
FIG. 4 is a rear elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof.

Claims (1)

  1. The ornamental design for an automatic semiconductor wafer tester, as shown.
US06/727,417 1985-04-26 1985-04-26 Automatic semiconductor wafer tester Expired - Lifetime USD292979S (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US06/727,417 USD292979S (en) 1985-04-26 1985-04-26 Automatic semiconductor wafer tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US06/727,417 USD292979S (en) 1985-04-26 1985-04-26 Automatic semiconductor wafer tester

Publications (1)

Publication Number Publication Date
USD292979S true USD292979S (en) 1987-12-01

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ID=70169916

Family Applications (1)

Application Number Title Priority Date Filing Date
US06/727,417 Expired - Lifetime USD292979S (en) 1985-04-26 1985-04-26 Automatic semiconductor wafer tester

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US (1) USD292979S (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD747227S1 (en) * 2014-02-28 2016-01-12 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD758221S1 (en) * 2014-02-28 2016-06-07 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD759517S1 (en) * 2015-02-25 2016-06-21 Shimadzu Corporation Spectrophotometer
USD915914S1 (en) * 2018-11-29 2021-04-13 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD935424S1 (en) * 2019-05-06 2021-11-09 Lam Research Corporation Semiconductor wafer processing tool

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USD747227S1 (en) * 2014-02-28 2016-01-12 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD758221S1 (en) * 2014-02-28 2016-06-07 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD759517S1 (en) * 2015-02-25 2016-06-21 Shimadzu Corporation Spectrophotometer
USD915914S1 (en) * 2018-11-29 2021-04-13 Hitachi High-Tech Science Corporation Thermogravimetric analyzer
USD935424S1 (en) * 2019-05-06 2021-11-09 Lam Research Corporation Semiconductor wafer processing tool

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