GB1457253A
(en)
*
|
1972-12-01 |
1976-12-01 |
Mullard Ltd |
Semiconductor charge transfer devices
|
JPS5024084A
(ja)
*
|
1973-07-05 |
1975-03-14 |
|
|
DE2541510A1
(de)
*
|
1974-09-17 |
1976-03-25 |
Westinghouse Electric Corp |
Verarbeitungssystem fuer diskrete analogsignale
|
US4233527A
(en)
*
|
1975-06-20 |
1980-11-11 |
Siemens Aktiengesellschaft |
Charge injection device opto-electronic sensor
|
US3991322A
(en)
*
|
1975-06-30 |
1976-11-09 |
California Microwave, Inc. |
Signal delay means using bucket brigade and sample and hold circuits
|
DE2543083C3
(de)
*
|
1975-09-26 |
1979-01-11 |
Siemens Ag, 1000 Berlin Und 8000 Muenchen |
Bildsensor sowie Verfahren zum Betrieb eines solchen Bildsensors
|
US4079238A
(en)
*
|
1975-10-24 |
1978-03-14 |
Westinghouse Electric Corporation |
Dual-CCD, real-time, fully-analog correlator
|
US4156818A
(en)
*
|
1975-12-23 |
1979-05-29 |
International Business Machines Corporation |
Operating circuitry for semiconductor charge coupled devices
|
US4410811A
(en)
*
|
1977-03-18 |
1983-10-18 |
Siemens Aktiengesellschaft |
Method for the operation of a CID sensor matrix
|
US4152606A
(en)
*
|
1977-09-16 |
1979-05-01 |
Hewlett-Packard Company |
Waveform capture device
|
US4151429A
(en)
*
|
1977-10-03 |
1979-04-24 |
Northern Telecom Limited |
Differential charge sensing circuit for MOS devices
|
FR2440079A1
(fr)
*
|
1978-10-23 |
1980-05-23 |
Westinghouse Electric Corp |
Element a transfert de charges perfectionne
|
US4298953A
(en)
*
|
1979-02-28 |
1981-11-03 |
Massachusetts Institute Of Technology |
Programmable zero-bias floating gate tapping method and apparatus
|
US4287441A
(en)
*
|
1979-03-30 |
1981-09-01 |
The United States Of America As Represented By The Secretary Of The Army |
Correlated double sampling CCD video preprocessor-amplifier
|
JPS55163694A
(en)
*
|
1979-06-01 |
1980-12-19 |
Fujitsu Ltd |
Sample holding circuit
|
DE3068106D1
(en)
*
|
1979-08-29 |
1984-07-12 |
Rockwell International Corp |
Ccd integrated circuit
|
US4389615A
(en)
*
|
1979-08-29 |
1983-06-21 |
Rockwell International Corporation |
CCD Demodulator circuit
|
JPS56116374A
(en)
*
|
1980-02-20 |
1981-09-12 |
Sony Corp |
Charge detection circuit
|
FR2483667A1
(fr)
*
|
1980-06-03 |
1981-12-04 |
Thomson Csf |
Dispositif d'echantillonnage et maintien a capacite mos
|
US4454435A
(en)
*
|
1981-08-07 |
1984-06-12 |
Hewlett-Packard Company |
CCD Amplifier using second correlated sampling and negative feedback for noise reduction
|
US4454545A
(en)
*
|
1982-06-14 |
1984-06-12 |
Rca Corporation |
Charge coupled device based inspection system and method
|
US4454541A
(en)
*
|
1982-06-14 |
1984-06-12 |
Rca Corporation |
Charge coupled device based blemish detection system and method
|
DE3232671A1
(de)
*
|
1982-09-02 |
1984-03-08 |
Siemens AG, 1000 Berlin und 8000 München |
Anordnung und verfahren zur spannungsmessung an einem vergrabenen messobjekt
|
US4551759A
(en)
*
|
1983-04-13 |
1985-11-05 |
The United States Of America As Represented By The Secretary Of The Navy |
Sample video amplifier
|
US4575751A
(en)
*
|
1983-11-15 |
1986-03-11 |
Rca Corporation |
Method and subsystem for plotting the perimeter of an object
|
DE3484122D1
(de)
*
|
1983-11-21 |
1991-03-28 |
Nec Corp |
Schaltung zur feststellung von signalladungen, die in einer ladungsverschiebeschaltung uebertragen werden.
|
NL8401311A
(nl)
*
|
1984-04-24 |
1985-11-18 |
Philips Nv |
Ladingsgekoppelde halfgeleiderinrichting met dynamische besturing.
|
JPS6134798A
(ja)
*
|
1984-07-25 |
1986-02-19 |
Sharp Corp |
電荷転送素子の出力信号処理回路
|
US4661788A
(en)
*
|
1985-05-10 |
1987-04-28 |
Rca Corporation |
Tapped CCD delay line with non-destructive charge sensing using floating diffusions
|
JPH0693765B2
(ja)
*
|
1985-11-06 |
1994-11-16 |
キヤノン株式会社 |
撮像装置
|
JPH0815321B2
(ja)
*
|
1986-12-16 |
1996-02-14 |
キヤノン株式会社 |
光電変換装置
|
US5737016A
(en)
*
|
1985-11-15 |
1998-04-07 |
Canon Kabushiki Kaisha |
Solid state image pickup apparatus for reducing noise
|
US5771070A
(en)
*
|
1985-11-15 |
1998-06-23 |
Canon Kabushiki Kaisha |
Solid state image pickup apparatus removing noise from the photoelectric converted signal
|
US4990862A
(en)
*
|
1986-02-24 |
1991-02-05 |
Sony Corporation |
Output stage for solid-state image pick-up device
|
JPS6358968A
(ja)
*
|
1986-08-29 |
1988-03-14 |
Mitsubishi Electric Corp |
電荷結合素子
|
US5349380A
(en)
*
|
1991-10-15 |
1994-09-20 |
Hughes Aircraft Company |
Resettable clamp-sample-and-hold signal processing circuit for imaging sensors
|
JPH05275692A
(ja)
*
|
1992-03-25 |
1993-10-22 |
Sony Corp |
半導体装置およびその製造方法
|
US5670935A
(en)
*
|
1993-02-26 |
1997-09-23 |
Donnelly Corporation |
Rearview vision system for vehicle including panoramic view
|
US6025875A
(en)
*
|
1995-10-23 |
2000-02-15 |
National Semiconductor Corporation |
Analog signal sampler for imaging systems
|
JP3774499B2
(ja)
|
1996-01-24 |
2006-05-17 |
キヤノン株式会社 |
光電変換装置
|
US6031399A
(en)
*
|
1998-02-13 |
2000-02-29 |
National Semiconductor Corporation |
Selectively configurable analog signal sampler
|
US6337808B1
(en)
|
1999-08-30 |
2002-01-08 |
Micron Technology, Inc. |
Memory circuit and method of using same
|
US6304505B1
(en)
|
2000-05-22 |
2001-10-16 |
Micron Technology Inc. |
Differential correlated double sampling DRAM sense amplifier
|
US6518607B2
(en)
*
|
2000-07-31 |
2003-02-11 |
Isetex, Inc. |
Low feed through-high dynamic range charge detection using transistor punch through reset
|
US6937025B1
(en)
*
|
2003-07-17 |
2005-08-30 |
Foveon, Inc. |
Method and circuit employing current sensing to read a sensor
|
JP4924228B2
(ja)
*
|
2007-06-19 |
2012-04-25 |
ソニー株式会社 |
画像処理装置、画像処理方法、およびプログラム
|
US9029750B1
(en)
|
2011-08-02 |
2015-05-12 |
Northrop Grumman Systems Corporation |
CMOS and CCD sensor R/O with high gain and no kTC noise
|
US9989597B2
(en)
|
2014-08-22 |
2018-06-05 |
The Board Of Trustees Of The Leland Stanford Junior University |
Correlated double sampling for noise reduction in magnetoresistive sensors and sensor arrays
|
US10306172B2
(en)
|
2017-09-08 |
2019-05-28 |
Microsoft Technology Licensing, Llc |
Time-of-flight sensor readout circuit
|