US8228374B2 - Method to determine dielectric permeability of dielectric object - Google Patents

Method to determine dielectric permeability of dielectric object Download PDF

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Publication number
US8228374B2
US8228374B2 US13/120,494 US201013120494A US8228374B2 US 8228374 B2 US8228374 B2 US 8228374B2 US 201013120494 A US201013120494 A US 201013120494A US 8228374 B2 US8228374 B2 US 8228374B2
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dielectric
microwave
reflector
dimensional
image
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US20110304698A1 (en
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Andrey Kuznetsov
Igor Gorshkov
Valery Averyanov
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Apstec Systems Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S13/00—Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
    • G01S13/88—Radar or analogous systems specially adapted for specific applications
    • G01S13/887—Radar or analogous systems specially adapted for specific applications for detection of concealed objects, e.g. contraband or weapons

Definitions

  • This invention belongs to the field of remote measurement of physical characteristics of the objects, particularly to the remote determination of dielectric permeability of dielectric objects.
  • dielectric permeability can then be derived from the following formula:
  • ⁇ ⁇ 0 2 Sin 2 ⁇ Q ⁇ ( 1 ⁇ - 1 ⁇ b ) 2 , where ⁇ 0 is free-space wavelength; ⁇ b is length of the wave in double-armed emitter; and ⁇ is period of amplitude “zero” the passed-through wave.
  • Angle ⁇ is chosen according to the ratio
  • the primary disadvantage of this method is the fact that a contact is required between the emitter and a sample to determine dielectric permeability. Moreover, the sample should have a flat surface to maintain proper contact with the emitter. Thus, this method cannot be used for remote determination of dielectric permeability of the object.
  • a second method used to determine dielectric permeability of a dielectric object is irradiating the object with coherent microwave radiation at N-frequencies.
  • the microwave radiation is reflected from a background reflector.
  • a border between the object's layers, a boundary between the dielectric object and air, or a physical body, on which the irradiated object is placed, may serve as the reflector.
  • the signal reflected from the dielectric object is then registered. Then it is transferred to the time domain. Peak temporal components in the temporal spectrum are determined and measured. This data is used to calculate the dielectric permeability and the thickness of the layers. Probing and receiving is made into a sector of angles. Dielectric permeability and thickness of layers are then determined from the formulae:
  • ⁇ ⁇ ⁇ l h 1 + h 2 2
  • h 1 and h 2 are heights between the border of the first and second layers respectively and points from which probing is made and signal receiving points
  • ⁇ (i) nad1 is angle of received signal reflected from the border between i and i+1 layer, c is speed of light
  • t 1 is frequency of peak i-constituent of the time spectrum which corresponds with the reflection of the signal from the border between i and i+1 layers
  • d is projection of the distance between the point of probing and signal receiving point, see Russian Patent No. RU 2039352.
  • the primary purpose of the proposed invention is to fulfill capability of remote determination of dielectric permeability of the moving dielectric object of irregular shape.
  • the dielectric object is radiated by coherent microwave radiation at N-frequencies to produce a three-dimensional microwave image of the dielectric object and the reflector.
  • the produced video image is converted into digital form, and the three-dimensional video image of the specified area is built.
  • the three-dimensional video image and microwave image are transferred into a general system of coordinates; distance Z 1 is determined between the source of microwave radiation and the reflector, free of the dielectric object, and distance Z 2 is determined between the source of microwave radiation and the section of the microwave image of the reflector in the zone of the dielectric object.
  • distance Z 3 is determined between the source of microwave radiation and the video image of the dielectric object, at which point dielectric permeability of the object is determined based on ratio:
  • the test dummy with the attached dielectric object was radiated with coherent microwave radiation at 14 equidistant frequencies in the range between 8-12 GHz. Irradiation was made using a switched plane antenna array with hexagonal configuration of emitting elements. The array consisted of 256 primary emitters. The reflected signal, in the form of two quadrature components in two parallel receiving channels, was recorded by 12-digit analog-to-digital converters. From these receiving channels, data on the electrical component of the recorded scattered electromagnetic field was transferred onto a PC screen. The microwave image was reconstructed using focusing method (coherent processing). The image was made only for one three-dimensional surface formed with points that have maximal values of intensity in the images of the dielectric object and reflector. Simultaneously, the microwave radiation video image of the dielectric object was received from two digital spatially-separated SDU-415 video cameras. Using this data, the three-dimensional video image of the area with the dielectric object and reflector was obtained.
  • the microwave image and three-dimensional video image were transferred into a general system of coordinates.
  • the general system of coordinates was set by the antenna array plane and perpendicular intersecting at its center.
  • the microwave image and three-dimensional video image were processed.
  • Value Z 1 was determined between the source of microwave radiation and the reflector, free of the dielectric object
  • distance Z 2 was determined between the source of microwave radiation and the section of the microwave image of the reflector in the zone of the dielectric object.
  • distance Z 3 was determined between the source of microwave radiation and the video image of the dielectric object.
  • the dielectric permeability of the object was determined based on the ratio:
  • ⁇ ( z 2 - z 3 z 1 - z 3 ) 2 .
  • This method could be used for various tasks, for example, to determine the physical characteristics of dielectrics used in electrical industry.

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  • Physics & Mathematics (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Radar Systems Or Details Thereof (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
US13/120,494 2009-11-26 2010-11-24 Method to determine dielectric permeability of dielectric object Active US8228374B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
RU2009145423/07A RU2408005C1 (ru) 2009-11-26 2009-11-26 Способ определения диэлектрической проницаемости диэлектрического объекта
RU2009145423 2009-11-26
PCT/RU2010/000724 WO2011065868A1 (ru) 2009-11-26 2010-11-24 Способ определения диэлектрической проницаемости диэлектрического объекта

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US20110304698A1 US20110304698A1 (en) 2011-12-15
US8228374B2 true US8228374B2 (en) 2012-07-24

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US (1) US8228374B2 (uk)
EP (1) EP2505995B1 (uk)
JP (1) JP5260799B2 (uk)
KR (1) KR101332957B1 (uk)
CN (1) CN102630300B (uk)
BR (1) BR112012012587B1 (uk)
CA (1) CA2781590C (uk)
DK (1) DK2505995T3 (uk)
ES (1) ES2557457T3 (uk)
HK (1) HK1176404A1 (uk)
IL (1) IL219999A (uk)
MX (1) MX2012006103A (uk)
NZ (1) NZ599725A (uk)
PL (1) PL2505995T3 (uk)
PT (1) PT2505995E (uk)
RU (1) RU2408005C1 (uk)
UA (1) UA102197C2 (uk)
WO (1) WO2011065868A1 (uk)
ZA (1) ZA201203382B (uk)

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PT3071998T (pt) 2013-11-19 2019-05-24 Apstec Systems Usa Llc Dispositivo de micro-ondas ativo e método de deteção
WO2015077169A1 (en) * 2013-11-19 2015-05-28 Apstec Systems Usa Llc Standoff detection and analysis of objects
HUE057503T2 (hu) * 2013-11-19 2022-05-28 Apstec Systems Ltd Tárgyak távoli észlelése és elemzése
CN104931797B (zh) * 2015-07-16 2017-08-25 上海无线电设备研究所 基于透波机制的有耗媒质介电常数的测量方法
RU2652530C1 (ru) * 2017-05-05 2018-04-26 Алексей Андреевич Калмыков Трехмерная система голографического радиовидения для досмотра

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RU2096767C1 (ru) 1994-07-01 1997-11-20 Северо-Западный Заочный Политехнический Институт Радиолокатор-интроскоп
RU2121671C1 (ru) 1997-01-24 1998-11-10 Открытое акционерное общество "Центральный научно-исследовательский институт радиоэлектронных систем" Устройство зондирования строительных конструкций
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GB2458764A (en) 2008-03-18 2009-10-07 Univ Manchester Metropolitan Remote detection and measurement of a metallic or dielectric object
US20100069744A1 (en) * 2006-03-10 2010-03-18 Ray Andrew Simpkin Imaging System
US20100253783A1 (en) * 2009-02-25 2010-10-07 University Of Memphis Research Foundation Spatially-selective reflector structures, reflector disks, and systems and methods for use thereof
US20110057653A1 (en) * 2009-09-08 2011-03-10 California Institute Of Technology New technique for performing dielectric property measurements at microwave frequencies
US20110267215A1 (en) * 2008-08-13 2011-11-03 Samuel Allan Barr Methods and systems for determining the phase constant for a dielectric medium

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RU2039352C1 (ru) 1992-04-30 1995-07-09 Научно-исследовательский центр "Резонанс" Способ определения диэлектрических проницаемостей и толщин слоев многослойной среды
RU2096767C1 (ru) 1994-07-01 1997-11-20 Северо-Западный Заочный Политехнический Институт Радиолокатор-интроскоп
RU2121671C1 (ru) 1997-01-24 1998-11-10 Открытое акционерное общество "Центральный научно-исследовательский институт радиоэлектронных систем" Устройство зондирования строительных конструкций
US20030214309A1 (en) * 2002-04-16 2003-11-20 Samsung Electronics Co., Ltd. RF power sensor for measuring an RF signal power using capacitance
US20050021321A1 (en) 2003-07-22 2005-01-27 Communications Research Laboratory, Independent Administrative Institution Apparatus, method, and program for estimation of biological electromagnetic compatibility
US20070293752A1 (en) * 2004-09-10 2007-12-20 Industrial Research Limited Synthetic Focusing Method
US20090024026A9 (en) * 2004-09-10 2009-01-22 Simpkin Ray A Imaging system
US20060127267A1 (en) * 2004-10-06 2006-06-15 Ener1 Group, Inc. Method and apparatus for measuring conductivity of powder materials using eddy currents
US7040168B1 (en) 2004-11-12 2006-05-09 Frigoscandia Equipment Ab Apparatus for determining physical parameters in an object using simultaneous microwave and ultrasound radiation and measurement
US20100069744A1 (en) * 2006-03-10 2010-03-18 Ray Andrew Simpkin Imaging System
US20090212789A1 (en) * 2008-02-27 2009-08-27 Chih-Ping Lin Modified tdr method and apparatus for suspended solid concentration measurement
GB2458764A (en) 2008-03-18 2009-10-07 Univ Manchester Metropolitan Remote detection and measurement of a metallic or dielectric object
US20110267215A1 (en) * 2008-08-13 2011-11-03 Samuel Allan Barr Methods and systems for determining the phase constant for a dielectric medium
US20100253783A1 (en) * 2009-02-25 2010-10-07 University Of Memphis Research Foundation Spatially-selective reflector structures, reflector disks, and systems and methods for use thereof
US20110057653A1 (en) * 2009-09-08 2011-03-10 California Institute Of Technology New technique for performing dielectric property measurements at microwave frequencies

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DK2505995T3 (en) 2016-01-11
IL219999A0 (en) 2012-07-31
IL219999A (en) 2016-03-31
CA2781590A1 (en) 2011-06-03
JP2013512430A (ja) 2013-04-11
WO2011065868A1 (ru) 2011-06-03
EP2505995A1 (en) 2012-10-03
US20110304698A1 (en) 2011-12-15
ZA201203382B (en) 2013-01-30
PT2505995E (pt) 2016-01-26
EP2505995B1 (en) 2015-11-04
KR101332957B1 (ko) 2013-11-25
AU2010325268A1 (en) 2012-08-16
HK1176404A1 (en) 2013-07-26
JP5260799B2 (ja) 2013-08-14
UA102197C2 (uk) 2013-06-10
PL2505995T3 (pl) 2016-04-29
CN102630300B (zh) 2014-11-26
KR20120112421A (ko) 2012-10-11
RU2408005C1 (ru) 2010-12-27
ES2557457T3 (es) 2016-01-26
CA2781590C (en) 2013-10-01
MX2012006103A (es) 2012-10-05
BR112012012587A2 (pt) 2017-12-12
BR112012012587B1 (pt) 2019-09-17
EP2505995A4 (en) 2013-06-26
NZ599725A (en) 2014-11-28
CN102630300A (zh) 2012-08-08

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