US6816255B2 - Method and apparatus for leak-testing an electroluminescent device - Google Patents

Method and apparatus for leak-testing an electroluminescent device Download PDF

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Publication number
US6816255B2
US6816255B2 US10/173,352 US17335202A US6816255B2 US 6816255 B2 US6816255 B2 US 6816255B2 US 17335202 A US17335202 A US 17335202A US 6816255 B2 US6816255 B2 US 6816255B2
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US
United States
Prior art keywords
led
photo
light
electroluminescent device
leak
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Expired - Fee Related, expires
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US10/173,352
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English (en)
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US20030016361A1 (en
Inventor
Adrianus Johannes Gerardus Mank
Peter Van De Weijer
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Innolux Corp
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Koninklijke Philips Electronics NV
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Assigned to KONINKLIJKE PHILIPS ELECTRONICS N.V. reassignment KONINKLIJKE PHILIPS ELECTRONICS N.V. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: VAN DE WEIJER, PETER, MANK, ADRIANUS JOHANNES GERARDUS
Publication of US20030016361A1 publication Critical patent/US20030016361A1/en
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Publication of US6816255B2 publication Critical patent/US6816255B2/en
Assigned to TPO DISPLAYS CORP. reassignment TPO DISPLAYS CORP. CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: KONINKLIJKE PHILIPS ELECTRONICS N.V.
Assigned to CHIMEI INNOLUX CORPORATION reassignment CHIMEI INNOLUX CORPORATION MERGER (SEE DOCUMENT FOR DETAILS). Assignors: TPO DISPLAYS CORP.
Assigned to Innolux Corporation reassignment Innolux Corporation CHANGE OF NAME (SEE DOCUMENT FOR DETAILS). Assignors: CHIMEI INNOLUX CORPORATION
Adjusted expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00—Organic light-emitting devices
    • H10K50/80—Constructional details
    • H10K50/84—Passivation; Containers; Encapsulations
    • H10K50/846—Passivation; Containers; Encapsulations comprising getter material or desiccants
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
US10/173,352 2001-06-19 2002-06-17 Method and apparatus for leak-testing an electroluminescent device Expired - Fee Related US6816255B2 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP01202372 2001-06-19
EP01202372 2001-06-19
EP01202372.7 2001-06-19

Publications (2)

Publication Number Publication Date
US20030016361A1 US20030016361A1 (en) 2003-01-23
US6816255B2 true US6816255B2 (en) 2004-11-09

Family

ID=8180505

Family Applications (1)

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US10/173,352 Expired - Fee Related US6816255B2 (en) 2001-06-19 2002-06-17 Method and apparatus for leak-testing an electroluminescent device

Country Status (6)

Country Link
US (1) US6816255B2 (ja)
EP (1) EP1402277A2 (ja)
JP (1) JP2004530284A (ja)
KR (1) KR20030033028A (ja)
CN (1) CN1529820A (ja)
WO (1) WO2002103378A2 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060246318A1 (en) * 2005-04-28 2006-11-02 Semiconductor Energy Laboratory Co., Ltd. Evaluation method and manufacturing method of light emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element

Families Citing this family (23)

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Publication number Priority date Publication date Assignee Title
EP1540317A4 (en) * 2002-08-29 2010-06-30 Norcom Systems Inc SYSTEM AND PROCESS FOR DETECTING LEAKS IN SEALED ARTICLES
US7415186B2 (en) * 2004-09-27 2008-08-19 Idc, Llc Methods for visually inspecting interferometric modulators for defects
US7453579B2 (en) * 2004-09-27 2008-11-18 Idc, Llc Measurement of the dynamic characteristics of interferometric modulators
US7343080B2 (en) * 2004-09-27 2008-03-11 Idc, Llc System and method of testing humidity in a sealed MEMS device
US7359066B2 (en) * 2004-09-27 2008-04-15 Idc, Llc Electro-optical measurement of hysteresis in interferometric modulators
US20060103643A1 (en) * 2004-09-27 2006-05-18 Mithran Mathew Measuring and modeling power consumption in displays
US7289256B2 (en) * 2004-09-27 2007-10-30 Idc, Llc Electrical characterization of interferometric modulators
US7299681B2 (en) * 2004-09-27 2007-11-27 Idc, Llc Method and system for detecting leak in electronic devices
US20060176487A1 (en) * 2004-09-27 2006-08-10 William Cummings Process control monitors for interferometric modulators
US7417735B2 (en) * 2004-09-27 2008-08-26 Idc, Llc Systems and methods for measuring color and contrast in specular reflective devices
US7586247B2 (en) * 2005-04-18 2009-09-08 Jiahn-Chang Wu Ballast for light emitting device
US7582952B2 (en) * 2006-02-21 2009-09-01 Qualcomm Mems Technologies, Inc. Method for providing and removing discharging interconnect for chip-on-glass output leads and structures thereof
JP4609349B2 (ja) * 2006-03-13 2011-01-12 セイコーエプソン株式会社 発光装置、及び発光装置の製造方法
JP4747889B2 (ja) * 2006-03-14 2011-08-17 セイコーエプソン株式会社 発光装置、及び発光装置の製造方法
US7388704B2 (en) * 2006-06-30 2008-06-17 Qualcomm Mems Technologies, Inc. Determination of interferometric modulator mirror curvature and airgap variation using digital photographs
KR100790702B1 (ko) * 2006-09-08 2008-01-02 삼성전기주식회사 공초점 전기발광 분광 현미경
KR101084269B1 (ko) * 2009-08-14 2011-11-16 삼성모바일디스플레이주식회사 유기 전계 발광 표시장치 및 이의 동작 방법
JP2013234864A (ja) * 2012-05-07 2013-11-21 Sinto S-Precision Ltd 検査機
CN103760483A (zh) * 2014-01-07 2014-04-30 华南理工大学 一种oled器件光电特性测试系统
CN105116354B (zh) * 2015-09-06 2016-08-31 深圳市源磊科技有限公司 Led封装用在线测试设备及其在线测试方法
FR3045391B1 (fr) * 2015-12-17 2019-09-06 Commissariat A L'energie Atomique Et Aux Energies Alternatives Dispositif implantable pour la stimulation optique du cerveau
CN107369701A (zh) * 2017-07-19 2017-11-21 京东方科技集团股份有限公司 封装结构、显示面板、显示装置和用于检测封装结构的方法
CN111610177B (zh) * 2020-06-11 2023-03-24 北京大学 一种micro LED芯片的拉曼增强的检测方法及其装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5552678A (en) * 1994-09-23 1996-09-03 Eastman Kodak Company AC drive scheme for organic led

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000515309A (ja) * 1997-05-22 2000-11-14 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 有機エレクトロルミネセント装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5552678A (en) * 1994-09-23 1996-09-03 Eastman Kodak Company AC drive scheme for organic led

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
Lin Ke et al, Photoluminescence degradation in organic light-emitting devices, Jan. 2002, Applied Physics Letters, vol. 80, No. 4, 697-699.* *
M. Schaer et al, Water and Oxygen Degradation Mechanisms in Organic Light Emitting Diodes, Apr. 2001, Advanced Functional Materials, 11, No. 2, 116-121.* *
Publication by D. Braun et al, published in Synthetic Metals, 66 (1994) pp 75-79.
V. Savvate'ev et al, Degradation of nonencapsulated polymer-based light-emitting diodes, Dec. 1997, Applied Physics Letters, vol. 71, No. 23, 3344-3346.* *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060246318A1 (en) * 2005-04-28 2006-11-02 Semiconductor Energy Laboratory Co., Ltd. Evaluation method and manufacturing method of light emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element
US7505122B2 (en) * 2005-04-28 2009-03-17 Semiconductor Energy Laboratory Co., Ltd. Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, light-emitting element, and light-emitting device and electric appliance having light-emitting element
US20090168048A1 (en) * 2005-04-28 2009-07-02 Semiconductor Energy Laboratory Co., Ltd. Evaluation Method and Manufacturing Method of Light-Emitting Element Material, Manufacturing Method of Light-Emitting Element, and Light-Emitting Device And Electric Appliance Having Light-Emitting Element
US7796240B2 (en) 2005-04-28 2010-09-14 Semiconductor Energy Laboratory Co., Ltd. Evaluation method and manufacturing method of light-emitting element material, manufacturing method of light-emitting element, and light-emitting device and electric appliance having light-emitting element

Also Published As

Publication number Publication date
EP1402277A2 (en) 2004-03-31
WO2002103378A3 (en) 2003-03-13
KR20030033028A (ko) 2003-04-26
CN1529820A (zh) 2004-09-15
WO2002103378A2 (en) 2002-12-27
JP2004530284A (ja) 2004-09-30
US20030016361A1 (en) 2003-01-23

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