US5531183A - Vaporization sequence for multiple liquid precursors used in semiconductor thin film applications - Google Patents

Vaporization sequence for multiple liquid precursors used in semiconductor thin film applications Download PDF

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US5531183A
US5531183A US08/274,672 US27467294A US5531183A US 5531183 A US5531183 A US 5531183A US 27467294 A US27467294 A US 27467294A US 5531183 A US5531183 A US 5531183A
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Prior art keywords
liquid precursor
manifold
source
liquid
precursor source
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US08/274,672
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Visweswaren Sivaramakrishnam
Hiroshi Nishizato
Jun Zhao
Ichiro Yokoyama
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Applied Materials Inc
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Applied Materials Inc
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Assigned to APPLIED MATERIALS, INC. reassignment APPLIED MATERIALS, INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: ZHAO, JUN, NISHIZATO, HIROSHI, SIVARAMAKRISHNAN, VISWESWAREN, YOKOYAMA, ICHIRO
Priority to DE69508668T priority patent/DE69508668T2/de
Priority to EP95110239A priority patent/EP0692553B1/en
Priority to KR1019950020541A priority patent/KR100254760B1/ko
Priority to JP17776195A priority patent/JP3745413B2/ja
Priority to US08/652,194 priority patent/US6464782B1/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40—Oxides
    • C23C16/401—Oxides containing silicon
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00—Semiconductor device manufacturing: process
    • Y10S438/935—Gas flow control
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
    • Y10T117/10—Apparatus
    • Y10T117/1004—Apparatus with means for measuring, testing, or sensing
    • Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means

Definitions

  • This invention relates to the formation of thin films on semiconductor substrates. More particularly, this invention relates to the vaporization and transport to a deposition chamber of two or more liquid components used in the formation of the thin film on the semiconductor substrate.
  • liquid source precursors or components are often used. These liquids are typically stored in source tanks and are delivered as vapors to a deposition chamber using a delivery system wherein each liquid flows through a separate line and liquid flow meter (to provide individual control of the flow rate of each reactant) and then is injected as a vapor into a common manifold. The vapors flowing in the manifold are then introduced into processing chamber connected to the manifold downstream of the points of entry of the gases and vaporized liquid source precursors into the manifold.
  • the silicon oxide is usually doped with phosphorus and/or boron to enhance the flow characteristics of the silicon oxide during a subsequent planarization step.
  • liquid silicon source precursor such as an alkoxysilane, e.g., tetraethylorthosilicate (TEOS), a liquid phosphorus source precursor such as, for example, trimethylphosphite (TMP), triethylphosphite (TEP), or triethylphosphate (TEPO); and/or a liquid boron source precursor such as, for example, trimethylborate (TMB) or triethylborate (TEB).
  • TEOS tetraethylorthosilicate
  • TMP trimethylphosphite
  • TEP triethylphosphite
  • TEPO triethylphosphate
  • a liquid boron source precursor such as, for example, trimethylborate (TMB) or triethylborate (TEB).
  • liquids are stored in separate source tanks and are delivered as vapors to a deposition chamber using a delivery system wherein the liquid sources of silicon, phosphorus, and boron flow through separate lines and liquid flow meters and then are respectively injected as vapors into a common manifold where they are usually mixed with a carrier gas.
  • the vapors flowing in the manifold are then further mixed with a vapor source of oxygen, usually just prior to entry into a deposition chamber to avoid premature reaction, to form the doped silicon oxide film on the semiconductor substrate in the deposition chamber.
  • the reaction may be either a thermal CVD reaction or a plasma-enhanced CVD reaction.
  • the presence of the dopants in the resulting silicon oxide film lowers the temperature at which the silicon oxide film may be subsequently reflowed to product a planarized film.
  • the resultant instabilities in the flow rate of the reactants can interfere with the satisfactory formation of a homogeneous product such as a properly doped silicon oxide film.
  • a homogeneous product such as a properly doped silicon oxide film.
  • premature condensation can effect incorporation of one or more of the dopants into the film, as well as effecting the uniform distribution of the dopant(s) in the silicon oxide film.
  • each microlayer of the thin film of silicon oxide could incorporate different concentrations of the respective dopants if the vaporization rates and flow into the processing chamber are not uniform.
  • a component delivery system used in the processing of thin films on semiconductor substrates and in particular a component delivery system which utilizes liquid precursors, could be designed and operated in a manner which would reduce the temperature sensitivity of the respective components in either the vapor or liquid state.
  • the invention comprises a process and apparatus for the processing of thin films on semiconductor substrates using liquid precursor sources wherein the liquid precursor source or component with the highest vapor pressure is first vaporized and then introduced as a vapor into a common manifold connected to a processing chamber, with the point of introduction being spaced away from the processing chamber.
  • a second liquid precursor source having a vapor pressure lower than the first liquid precursor source, is then introduced in vaporized form into the manifold at a point closer to the processing chamber than the entry point of the previous vaporized liquid precursor source. This is repeated for each liquid precursor source, with each succeeding liquid precursor source having the next lower vapor pressure being introduced in vaporized form into the manifold at a point closer to the processing chamber than the previous liquid precursor source.
  • a temperature gradient may then be maintained along the manifold with the temperature gradually increased in a direction toward the processing chamber while still mitigating premature boiling of the liquid precursors prior to vaporization, or condensation of already vaporized components.
  • FIG. 1 is a flow sheet illustrating the process of the invention.
  • FIG. 2 is a diagrammatic illustration of an arrangement of apparatus embodying the invention.
  • the process and apparatus of the invention comprise an improvement in the formation of thin films on semiconductor substrates by introduction of the vapors of a plurality of liquid precursor sources into a common manifold upstream of a processing chamber in a particular order of introduction into the manifold.
  • the vapors of the liquid precursor sources are introduced into the manifold in order of their respective vapor pressures, with the liquid precursor source having the highest vapor pressure being introduced into the manifold at a point farthest upstream of the processing chamber.
  • the vapor from the liquid precursor source having the next lower vapor pressure is then introduced at a point downstream of the point of introduction of the vapor from the highest vapor pressure liquid source, i.e., closer to the processing chamber. This is repeated for each liquid precursor source, with the vapor of each succeeding liquid precursor source having the next lower vapor pressure being introduced into the manifold at a point downstream of the point of introduction of the vapor of the preceding liquid precursor source having a higher vapor pressure.
  • highest vapor pressure and “next lower vapor pressure” is meant a comparison of the respective vapor pressures of the various liquids when measured at the same temperature. It will be recognized, of course, that a different temperature may be used for each liquid precursor at its point of entry as a vapor into the common manifold, as will be discussed in more detail below.
  • FIG. 2 by way of illustration and not of limitation, the process and apparatus of the invention will be illustrated with respect to the formation of a film of boron and phosphorus doped silicon oxide glass (BPSG) on a silicon wafer using liquid precursor sources of silicon, phosphorus, and boron.
  • BPSG boron and phosphorus doped silicon oxide glass
  • a deposition chamber 10 is shown, having a silicon wafer 20 mounted on a susceptor or wafer support 12 in chamber 10. Carder gas and process gases and/or vapors, from a common manifold 30, enter deposition chamber 10 through a distribution nozzle or showerhead 14 positioned in chamber 10 over wafer 20.
  • Chamber 10 is usually evacuated or maintained at a subatmospheric pressure, but in any event is maintained at a lower pressure than the carrier gas and process gases and/or vapors so that the gases and vapors flow through manifold 30 in the direction of chamber 10, which is usually located at the end of manifold 30.
  • a source of carrier gas 40 such as argon, nitrogen, or helium, is connected to manifold 30 through a line 42, a flow controller 44, a second line 46, and a shutoff valve 48 through which the carrier gas flows to an entry point 31 which is the farthest away or upstream of deposition chamber 10, so that the carrier gas entering manifold 30 at point 31 passes through the entire length of manifold 30 prior to entering deposition chamber 10.
  • carrier gas 40 such as argon, nitrogen, or helium
  • a liquid source of boron dopant 50 for example, such as trimethylborate (TMB), having a vapor pressure of 400 Torr, at 50° C., may be introduced as a vapor into manifold 30 (presuming that this liquid source has the highest vapor pressure--at a given temperature--of all of the liquid sources to be introduced into manifold 30 as a vapor).
  • TMB trimethylborate
  • Liquid boron source 50 is connected through a line 52 to a flowmeter 54 through which the liquid boron dopant source flows to a second line 56 to a combined valve and vaporizer 58 which both vaporizes the liquid boron dopant and controls the amount of boron dopant which flows, as a vapor, into manifold 30 at point 32, which is downstream from carrier gas entry point 31, i.e., closer to processing chamber 10.
  • Combined valve and vaporizer 58 may comprise a structure wherein the carrier gas traveling along manifold 30 enters through a first port and is carried through a chamber or cavity where the liquid precursor, under pressure, is radially injected into the carrier gas stream from an injection port positioned generally normal to the flow of carrier gas. Flow of the liquid precursor through the injection port opening is controlled by a diaphragm which may, in turn, be controlled by a piezoelectric element electrically connected to a feedback control system to control the flow of liquid precursor through the structure to be vaporized therein. A pressure gradient will, therefore, exist between the liquid aperture port and the remainder of the cavity.
  • Vaporizer structure 58 may be provided with heating means (not shown) to maintain the structure above the condensation point of the vapors flowing through the cavity with the carrier gas at reduced pressure, but at a temperature below the boiling or decomposition temperature of the unvaporized liquid precursor maintained at a higher pressure.
  • Heating means not shown
  • Such a valve and vaporizer structure is shown in more detail in commonly assigned and copending U.S. patent application Ser. No. 07/990,755, filed Dec. 12, 1993, the disclosure of which is hereby incorporated herein by reference.
  • a liquid source of phosphorus dopant 60 such as, for example, trimethylphosphite (TMP), having a vapor pressure of 70 Torr at 50° C.
  • TMP trimethylphosphite
  • the liquid phosphorus dopant source flows through flowmeter 64 to a second line 66 to a combined valve and vaporizer 68, similar or identical to valve and vaporizer 58 described above, which both vaporizes the liquid phosphorus dopant and controls the amount of phosphorus dopant which flows as a vapor into manifold 30 at point 34, which is downstream from both carrier gas entry point 31 and entry point 32 of the boron dopant vapor.
  • TMP trimethylphosphite
  • valve and vaporizer 68 may be maintained within a range sufficient to result in vaporization of the liquid phosphorus source without, however, causing the unvaporized liquid precursor to either boil or decompose. Since the particular liquid boron dopant source, in the combination of liquid precursor sources being described, has a higher vapor pressure than the particular liquid phosphorus dopant source, maintaining the temperature of valve and vaporizer 68, and manifold 30 at point of entry 34 of the vapors of the phosphorus dopant, sufficiently high to permit vaporization of the liquid phosphorus source will not result in condensation of the already vaporized boron dopant source at that point in manifold 30.
  • the vapor pressure of the above trimethylphosphite liquid phosphorus dopant source is lower than the vapor pressure of the trimethylborate liquid boron dopant source (at the same temperature).
  • the vapor of the vaporized liquid phosphorus dopant source is introduced into manifold 30 downstream of the vapor of the vaporized liquid boron dopant source.
  • the vaporized liquid phosphorus dopant source would be introduced first into manifold 30, i.e.
  • trimethylphosphite vapor would be introduced into manifold 30 at a point upstream of the introduction of the triethylborate vapor, since trimethylphosphite has a higher vapor pressure (at the same temperature) than triethylborate.
  • a liquid source of silicon 70 for example an alkoxy silane such as tetraethylorthosilicate (TEOS), having a vapor pressure of 9 Torr, at 50° C.
  • TEOS tetraethylorthosilicate
  • a combined valve and vaporizer 78 also identical or similar to valve and vaporizer structure 58 which both vaporizes the liquid silicon source and controls the amount of the silicon source which flows as a vapor into manifold 30 at point 36.
  • Point 36 is shown in FIG.
  • boron dopant vapor entry point 32, and phosphorus dopant vapor entry point 34 because of the lower vapor pressure of TEOS, compared to that of trimethylborate and trimethylphosphite. If, however, liquid precursor sources of either boron and/or phosphorus having vapor pressures less than that of TEOS are used, then the point of entry of the vaporized TEOS into manifold 30 would be changed accordingly.
  • liquid silicon sources such as other alkoxysilanes, e.g., trimethoxysilane, tetramethoxysilane, or triethoxysilane
  • the point of entry of the vaporized silicon source into manifold 30 would be suitably adjusted, if necessary, relative to the entry points of other vaporized liquid precursor sources, based on the vapor pressure of the particular liquid source of silicon, with respect to the vapor pressures of the other liquid precursors at the same temperature.
  • a gaseous source of oxygen 80 which may comprise O 2 , O 3 , or a mixture thereof, may then be introduced into manifold 30 by flowing the oxygen source through a line 82 to a point of entry 38 downstream of entry points 34, 36, and 36, of the vapors of the respective liquid sources of dopants and silicon.
  • an oxygen source should preferably have a point of entry into manifold 30 just prior to the entry of the gases and vapors into the deposition chamber, to avoid premature reaction of the oxygen, in the manifold, with the other gases and vapors in manifold 30.
  • the gaseous mixture enters deposition chamber 10 through distribution nozzle or showerhead 14 over wafer 20.
  • the result is a controllable flow of the vapor/gas mixture through manifold 30 from the respective gaseous and liquid sources of the reactants while eliminating or mitigating condensation of any of the already vaporized components in the manifold or premature boiling or decomposition of any of the unvaporized liquid reactant sources in the flow meters or liquid lines adjacent the flow meters.
  • BPSG layers on a number of silicon wafers using TEOS, trimethylphosphite, and trimethylborate will serve to further illustrate the practice of the invention.
  • 1000 sccm of helium gas Into one end of a manifold, connected at its opposite end to a deposition chamber, was flowed 1000 sccm of helium gas at a temperature of about 100° C. The temperature at the point of entry of the helium gas, was maintained at about 100° C. by a closed loop temperature control system.
  • Liquid trimethylborate from a liquid trimethylborate source, was flowed through a flowmeter at a rate of 50 milligrams/minute and then vaporized and injected into the manifold at a point downstream of the argon entry point.
  • the manifold at the point of entry of the boron-containing dopant vapors was maintained at about 80° C.
  • Liquid trimethylphosphite from a liquid trimethylphosphite source, was flowed through a second flowmeter at a rate of 20 milligrams/minute and then vaporized and injected into the manifold at a point downstream of the boron-containing vapor entry point.
  • the manifold at the point of entry of the phosphorus-containing dopant vapors was maintained at about 120° C.
  • Liquid TEOS was also flowed through a flowmeter at a rate of 500 milligrams/minute and then vaporized and injected into the manifold at a point downstream of the phosphorus-containing vapor entry point.
  • the manifold at the point of entry of the TEOS vapors was maintained at about 120° C.
  • a mixture of O 2 and 8 wt. % O 3 was flowed into the manifold at a rate of about 4000 sccm.
  • the manifold, from the point of entry of the TEOS vapors to the processing chamber was maintained at a temperature of about 100° C. The process was repeated for a number of wafers using the same standard flow control and temperatures for each wafer.
  • BPSG coatings or films formed on the silicon wafers were each examined for the formation of a homogeneously doped silicon oxide glass layer, using Fourier Transform Infra-Red Reflectance Spectroscopy (FTIR Spectroscopy).
  • FTIR Spectroscopy Fourier Transform Infra-Red Reflectance Spectroscopy
  • the invention provides a process and apparatus for forming a coating film on a semiconductor substrate, using two or more liquid precursor sources, wherein liquid precursor sources are respectively vaporized and introduced into a common manifold in order of descending vapor pressure (when measured at the same temperature), with the liquid precursor source having the highest vapor pressure being introduced into the manifold at a point spaced the farthest distance from the process chamber into which the mixture of gases and vapors flow from the manifold.
  • the process and apparatus of the invention eliminates or mitigates condensation in the manifold of previously vaporized liquid precursor sources and/or boiling or decomposition of liquid precursor sources prior to vaporization, whereby a more uniform distribution of process gases and vapors is delivered to the processing chamber, resulting in the formation of a film of enhanced homogeneity.

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US08/274,672 1994-07-13 1994-07-13 Vaporization sequence for multiple liquid precursors used in semiconductor thin film applications Expired - Lifetime US5531183A (en)

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Application Number Priority Date Filing Date Title
US08/274,672 US5531183A (en) 1994-07-13 1994-07-13 Vaporization sequence for multiple liquid precursors used in semiconductor thin film applications
DE69508668T DE69508668T2 (de) 1994-07-13 1995-06-30 Verdampfungssequenz für multiple flüssige Ausgangsstoffe
EP95110239A EP0692553B1 (en) 1994-07-13 1995-06-30 Vaporization sequence for multiple liquid precursors
KR1019950020541A KR100254760B1 (ko) 1994-07-13 1995-07-13 반도체 기판상에서의 박막 처리방법
JP17776195A JP3745413B2 (ja) 1994-07-13 1995-07-13 半導体薄膜法で使用される多くの液状前駆物質に対する気化シーケンス方法
US08/652,194 US6464782B1 (en) 1994-07-13 1996-05-23 Apparatus for vaporization sequence for multiple liquid precursors used in semiconductor thin film applications

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US6136725A (en) * 1998-04-14 2000-10-24 Cvd Systems, Inc. Method for chemical vapor deposition of a material on a substrate
US6179277B1 (en) 1998-02-27 2001-01-30 Applied Materials, Inc. Liquid vaporizer systems and methods for their use
US6296711B1 (en) 1998-04-14 2001-10-02 Cvd Systems, Inc. Film processing system
US6311959B1 (en) * 1999-04-22 2001-11-06 Applied Materials, Inc. Method and apparatus for generating controlled mixture of organic vapor and inert gas
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US6830626B1 (en) * 1999-10-22 2004-12-14 Kurt J. Lesker Company Method and apparatus for coating a substrate in a vacuum
US6860138B1 (en) 2002-02-21 2005-03-01 Taiwan Semiconductor Manufacturing Company Real-time detection mechanism with self-calibrated steps for the hardware baseline to detect the malfunction of liquid vaporization system in AMAT TEOS-based Dxz chamber
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US20050061377A1 (en) * 1999-08-24 2005-03-24 Hayashi Otsuki Gas processing apparatus, gas processing method and integrated valve unit for gas processing apparatus
US20050147753A1 (en) * 1999-10-22 2005-07-07 Kurt J. Lesker Company Material deposition system and a method for coating a substrate or thermally processing a material in a vacuum
US6955211B2 (en) 2002-07-17 2005-10-18 Applied Materials, Inc. Method and apparatus for gas temperature control in a semiconductor processing system
US20060030162A1 (en) * 1995-12-26 2006-02-09 Thakur Randhir P Method to avoid threshold voltage shift in thicker dielectric films
US20140026813A1 (en) * 2012-07-25 2014-01-30 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus for Dielectric Deposition Process

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US5876503A (en) * 1996-11-27 1999-03-02 Advanced Technology Materials, Inc. Multiple vaporizer reagent supply system for chemical vapor deposition utilizing dissimilar precursor compositions
KR100542890B1 (ko) * 1998-12-18 2006-05-09 재단법인 포항산업과학연구원 인도핑 다결정 실리콘성막 제조방법_
JP2004288916A (ja) * 2003-03-24 2004-10-14 Renesas Technology Corp Ｃｖｄ装置
US20050147749A1 (en) * 2004-01-05 2005-07-07 Msp Corporation High-performance vaporizer for liquid-precursor and multi-liquid-precursor vaporization in semiconductor thin film deposition
US7741621B2 (en) * 2004-07-14 2010-06-22 City University Of Hong Kong Apparatus and method for focused electric field enhanced plasma-based ion implantation
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US6464782B1 (en) 2002-10-15
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JPH0888191A (ja) 1996-04-02
KR960005854A (ko) 1996-02-23
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EP0692553A1 (en) 1996-01-17
KR100254760B1 (ko) 2000-05-01

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