US3818195A - Method and apparatus for controlling placement of split die cavities - Google Patents

Method and apparatus for controlling placement of split die cavities Download PDF

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Publication number
US3818195A
US3818195A US00287262A US28726272A US3818195A US 3818195 A US3818195 A US 3818195A US 00287262 A US00287262 A US 00287262A US 28726272 A US28726272 A US 28726272A US 3818195 A US3818195 A US 3818195A
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Prior art keywords
split
contour
signals
group
cavity
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US00287262A
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R Levine
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Diecomp Inc
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Diecomp Inc
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Priority to US00287262A priority Critical patent/US3818195A/en
Priority to CA178,549A priority patent/CA994457A/en
Priority to GB3934673A priority patent/GB1413763A/en
Priority to BE135310A priority patent/BE804447A/xx
Priority to CH1269573A priority patent/CH616520A5/de
Priority to DE19732344803 priority patent/DE2344803A1/de
Priority to FR7332237A priority patent/FR2203060B1/fr
Priority to JP48101008A priority patent/JPS5811285B2/ja
Priority to IT28682/73A priority patent/IT993898B/it
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21D—WORKING OR PROCESSING OF SHEET METAL OR METAL TUBES, RODS OR PROFILES WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21D37/00—Tools as parts of machines covered by this subclass
    • B21D37/20—Making tools by operations not covered by a single other subclass
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three dimensional [3D] modelling, e.g. data description of 3D objects

Definitions

  • ABSTRACT Apparatus for controlling the placement of split die cavities in aprogressive die where each cavity is described in terms of a group of contour coordinate signals which define predetermined coordinates of the contour of the cavity and split direction signals which define faces of the cavity contour from which splits thereof radiate, the apparatus comprising;
  • first register means for storing a first group of contour coordinate signals and split direction signals corresponding to a first split die cavity
  • second register means for storing a second group of contour coordinate signals and split direction signals corresponding to a second split die cavity
  • analyzer means responsive to first and second contour coordinate signals for determining whether the split die cavity corresponding to a first signal group is inappropriately placed with respect to the split die cavity corresponding to a second signal group because of unmatched split conditions.
  • this alone is a sufficient criterion for the placement of the cavities. This is true, for example, if the method of machining allows an isolated complicated hole to be made in the die section, as is the case with Electric Discharge Machining (EDM), or drilling and hand filing or broaching methods.
  • EDM Electric Discharge Machining
  • the point(s) on the cavity contour where the splits occur is governed by machining considerations and the shape of the cavity. It is not feasible to split a cavity so that deep or inaccessable recesses occur in one of the portions since it is not possible to get a grinding wheel into these recesses. Thus, for example, a horizontally long, rectangular cavity would be split by a horizontal line through the left and right ends. Similarly, a vertically tall, rectangular cavity would be split by a vertical line through the top and bottom. More complex shapes may, in general, require more than two points of splitting. In addition, the split generally radiates away from the contour at right angles to the edge at the point of splitting into avoid producing acute points or comers on the die sections.
  • the die cavities cannot be split arbitrarily, certain placements of die cavities in the die are not feasible. These are the placements which would not geometrically permit split radiating from one cavity to terminate on the facing contours of a second nearby cavity.
  • the two cavities described above could not be placed in close proximity, side by side, since the horizontal split radiating from one cavity can- 2 not terminate on the facing side of the second cavity.
  • a topJo-bottom, vertical split, or some suitable additional cavity(ies) must intervene to allow a proper termination of the horizontal split. In this case, the vertical split through the other cavity can terminate on the top and bottom edges of the die structure.
  • the two cavities cannot be placed in close proximity, one above the other, since the vertical split through the tall cavity cannot-terminate on the facing side of the second cavity.
  • a suitable intervening horizontal split or additional cavity would produce a permissible construction.
  • such intervening splits or cavities may not fit into the space between the two original cavities, and thus the entire attempted placement is not feasible.
  • a further object of this invention is to provide a method and apparatus for indicating the result of a gonogo test for a tentative position of a contour in the form of a signal from an independent mechanism which can be flexibly incorporated into various different structures used in the automatic design of dies.
  • FIG. 1 is a block diagram of an illustrative overall system in accordance with this invention.
  • FIG. 2 is a block diagram of an illustrative analyzer circuitry as used in FIG. 1.
  • FIG. 3 is a schematic diagram of an illustrative one of the analyzer units of the analyzer circuitry of FIG. 2.
  • FIG. 4 is a block diagram of an illustrative switching and control circuit as used in FIG. 1..
  • FIG. 5 is a diagrammatic illustration indicating the operation of the analyzer units of FIG. 3.
  • the various die cavity contours must be'deistributed across the die by translating each contour to a particular stage or station. This consists of moving the contour horizontally by an integral number of feed or jump distances.
  • the feed distance is equal to the distance that the metal strip or ribbon is horizontally moved during the operation of the completed die.
  • the number of splits radiating from a cavity maybe zero (for a hole made by drilling or EDM) two, three, four, or more. It is not meaningful to have only one split radiating from a civity since this would not allow the metal segments surrounding the cavity to be separated to give access for a grinding wheel to shape the cavity.
  • the overall system of the invention comprises storage device for storing coordinate describing signals to define each cavity contour and the number and direction of splits radiating therefrom.
  • the store 10 may also be used for storing a contour translated to a particular stage or station of the die by adding, to the x-coordinate signals, a quantity representing the numerical product of the feed distance and the stage number.
  • switching and control circuitry 16 for directing the signals representing the coordinates and split faces to analyzer circuitry 18 for the purpose of determining if any contours do not have matching splits conditions on their facing edges.
  • the feed is stored in storage device 12 and the stage number is stored in a multi-celled device 14, the number of cells corresponding to the number of storage locations in store 10.
  • the system of FIG. 1 may be used by other equipment in a process of sequential operation whereby tne other equipment would set the stage numbers of the various contours and use the output of the FIG. 1 system to determine if the arrangement of the contours indicated by the stage numbers is not feasible due to a mismatch of splits as described hereinbefore.
  • This test is typically used in addition to other test concerned with physical closeness of contours, and other factors (as described in copending Application Ser. No. 66,533) to eventually select a configuration which meets all conditions for die construction.
  • the coordinates for the contour may take many forms of varying complexity.
  • any contour may be adequately represented by four coordinates which respectively represent the maximum and minimum x-coordinates and maximum and minimum y-coordinates of the contour. These are represented by the letter symbols X,,, Y,,, Y,,, Y,,, respectively, in FIG. 1.
  • These numerical co ordinates may be stored as capacitor cell (or other signal) voltages proportional to the coordinate, or they may be represented digitally and stored in binary form in a magnetic core memory, as well as in other forms.
  • the coordinates are storedas analog voltages porportional to the numerical value of the coordinate.
  • the information describing the faces from which the splits radiate can also be represented adequately by considering only four directions, labelled as Right, Left, Top and Bottom (R, L, T, and B, respectively, in FIG. 1).
  • the four cells used to represent these directions can be used in essentially a binary mode, in which a voltage which is non-zero represents a split emerging from the particular face and a voltage of zero represents the fact that no split emerges from that face.
  • a positive, non-zero voltage will be stored in the appropriate storage cell to represent a split emerging from that'face.
  • the values do not actually have to be stored in cells for this purpose so long as they are available to the system when needed.
  • the values could be re-derived from the basic description of the complete contour coordinates by a scan of the contour each time the values are needed.
  • FIG. 1 The overall structure of the system is shown in FIG. 1.
  • the values describing the coordinates and split directions of each contour are stored in storage device lll which comprises a bank of storage cells, organized into groups of 8 cells. These 8 cells store the values respectively of the horizontal maximum and minimum (X and X,,) and the vertical maximum and minimum (Y and Y and the indicators for splits in four directions: Right Left, Top and Bottom (R, L, T, and B).
  • the bank of cells it) is connected to analyzer circuitry l8 by switching and control circuitry 16 which contains, inter alia, a simple multiplier and adder.
  • Circuitry l6 directs signals from and to the various storage cells l0, l2 and 14, the input terminal 20, an analyzer circuitry 1%.
  • Switching and control circuitry 16 may comprise a bi-directional scanner 22 (the input and output connections thereto being simplified for ease of description of circuitry 16) whereby input information from terminal 20 characterizing the contours is successively stored in the groups 10a, 10b, 10c. and Ma, 14b, and Me. of the stores 10 and 14 as the scanner 22 is successively stepped.
  • the feed is also stored in feed store 12.
  • a next mode of operation involves the actual coordinates of the contours are determined. That is, each contour is horizontally translated to its tentative station. This is accomplished by successively reading the contour characterizing information from the stores 10 and 14 by scanner 22. Each stage or station numbers from store 14 is applied to multiplier 24 through switch 26 which would be closed at this time. The feed is applied to multiplier 24 over line 28. The resulting product, which is the distance the horizontal coordinates must be translated, is applied to adder 30 over line 32. Also applied to adder 30 are the initial horizontal coordinates of the contour being currently scanned by the scanner 22. These coordinates, which define the horizontal position of the cavity or contour if it were located in the first stage of the die, are applied over line 34 through swtich 35, which would be closed at this time.
  • the resulting sum which is the horizontal coordinates of the contour translated to the station represented by the number in station store 14 is stored back in store 10 through switch 38 and scanner 22.
  • all the horizontal coordinates of each contour, having a non-zero stage number will have been translated to the stage number assigned thereto and restored in store it).
  • a contour is not assigned a state number unit! it is ready for testing.
  • all contours are initially assigned stage numbers and the system of this invention is used to determine if any cavities with conflicting splits are present.
  • the actual testing of one or more of the contours occurs to determine if conflicting splits are present.
  • a predetermined contour such as that stored in cell group 100.
  • Preset means 40 would be utilized to step scanner 22 to select this contour and store in it register 42 over line 44 through switch 46, which would be closed at this time.
  • the scanner 22 is then reset to scan all the contours stored in store together with their associated stage numbers stored in store 14.
  • the stage numbers are successively tested at blocks 48 and 50 to determine if the contour being currently scanned:
  • (I) has been assigned a zero stage number (which, as stated before, means that the contour is not to be tested at this time), or (2) is the same as the contour previously stored in register 42. If the contour being currently scanned does not satisfy either of the above tests, it is applied to register 52 over line 54 where it is compared with the contour stored in register 42 in analyzer 18. The manner of comparison will be described in more detail hereinafter with respect to FIGS. 2 and 3. Each contour in store 10 may be stored with the other contours stored therein in the manner described above.
  • circuitry 16 is as follows:
  • the signals representing the coordinate and split directions or each contour are directed to and stored in the appropriate stores 10.
  • the feed and stage numbers of each contour are directed from input terminal 20 to the appropriate stores 12 and 14.
  • the scanner 22 scans along the groups describing the coordinates and split directions, and the cells describing the stage number, of each contour.
  • the switching and control circuitry 16 senses thevalue of the two x-coordinates and adds to them the product of the feed and the stage number, as produced by the multiplier 24 and adder in the switching and control circuitry.
  • the coordinates stored in the stores 10 represent the disposition of the contours across the surface of the die. Contours not involved in the test are those with a stage number value of zero. 4.
  • the scanner 22 scans along the groups describing the coordinates and split directions, directing those signals to the analyzer circuitry 18 for comparison with the corresponding signals from the contour under the test, which is stored in register 42 an input signal from preset means may specify which contour number is to be used constantly for the test comparison.
  • the switching and control circuitry 16 selects each group (except those with a state number of zero, and the comparison group itself).
  • the analyzer circuitry 18 will produce no output if all the comparisons show valid combinations of facing splits. If an invalid combination occurs, an output signal will be produced to indicate that the tentative position of the test contour is not consistent with the other contours on the basis of the facing edges having unmatched presence or absence of splits.
  • analyzer circuitry 18 and its connection to the registers 42 and 52 will be described in detail after some further discussion of the use of this system in automatic die design.
  • some of the contours have been placed at a definite stage or station of the die. Others (designated by a stage number value of zero) have not, and one of these would be tentatively tested at various stages to discover where it will fit.
  • the first test might be on the basis of closeness to other placed contours in terms of geometrical distance, strength of materials analysis, or both.
  • the equipment described in this specification would be employed to insure that the tentative placement of the particular contour is feasible on-the basis of the matching of splits.
  • the precise connections produced by the switching and control equipment are shown in FIG. 2.
  • the registers 42 and 52 respectively, correspond to the comparison group and one of the other groups (for example, 100) from the coordinate and split direction memory storage 10.
  • the connections from various cells in the registers 42 and 52 to the terminals of four internal analyzer units 56-62 are shown by schematic wiring lines for the first analyzer unit 56 and in the interest of clarity, the connections to the other three units 58-62 are indicated by lettering on the terminal of the analyzer unit to show which cell is connected there.
  • the outputs of the four analyzer units are connected, through diodes, to a common output terminal 64.
  • the circuitry comprising analyzer units 58-62 is shown in FIG. 3.
  • Each analyzer unit has eight input terminals 66-80 as can be seen in FIGS. 2 and 3.
  • the input terminals are connected to difference amplifiers 82-90, each of which has an output voltage porportional to the algebraic difference between the input signal at its plus and minus input terminals.
  • difference amplifiers 82-90 each of which has an output voltage porportional to the algebraic difference between the input signal at its plus and minus input terminals.
  • the output signal of difference amplifier 82 will only be positive when the signal at terminal 66 is algebraically greater than the signal at terminal 68.
  • Terminals 78 and 80 are cross-connected to the inputs of difference amplifiers 88 and 90, so that one of the two amplifiers will produce a positive output if the signals at terminals 78 and 80 are different, no matter which of the signals is greater than the other.
  • amplifiers 88 and 90 perform an EXCLUSIVE OR function.
  • the outputof amplifiers 82 through 90 are respectively connected through small, equal resistors R, to clamping diodes and a clamping voltage-supply, V Thus, the output volgage at this point will not exceed V, even if the input signals differ by an amount much greater than the minimal difference corresponding to the output value of V
  • the five respective clamped outputs of the difference amplifiers 82 through 90 are connected through the five equal resistors, R To a common node I02.
  • This node is connected to the output through diode 104 and to a negative reference voltage, V,,, through a resistor R
  • the values of the resistors R and R are so chosen that a clamped voltage of V emerging from any four or more of the five difference amplifiers will produce a positive voltage at node 102, and a consequent signal can pass through output diode 104. For example, if V is 1 volt and V, is 3.5 volts, the values R,, 1,000 ohms and R 1,000 ohms would be suitable illustrative values for this purpose.
  • FIGS. 2 and 3 The operation of the analyzer units as shown in FIGS. 2 and 3 is as follows: If as is shown in FIG. 5, the contour B is completely to the left of the contour A, neither contour is completely above or below the other, and the facing edges have unmatched split conditions (i.e., a split on one contour pointing toward the other with no corresponding split pointing back), an output signal will be produced by analyzer unit 56. Thus, in FIG. 5, X is greater than X indicating that B is completely to the left of A. This is detected by difference amplifier 82 whereby at least one volt is applied to node 102 (assuming the illustrative values specified hereinbefore are used). Y Y and Y Y and thus neither contour is completely above or below the other.
  • the other three units 58-62 produce output signals if a similar situation exists with B to the right of A, below A, and above A, respectively, as can readily be determined by an inspection of FIG. 2.
  • first register means for storing a first group of contour coordinate signals and split direction signals corresponding to a first split die cavity
  • second register means for storing a second group of contour coordinate signals and split direction signals corresponding to a second split die cavity; analyzer means responsive to first and second contour coordinate signals for determining whether the split die cavity corresponding to said first signal group is inappropriately placed with respect to the split die cavity corresponding to said second signal group because of unmatched split conditions.
  • first storage means for storing a plurality. of said groups of contour coordinate signals and split direction signals including said first and second groups of contour coordinate signals and split direction signals;
  • second storage means for storing a plurality of stage numbers respectively corresponding to the stage numbers of the split die cavities corresponding to said plurality of initial contour coordinate signals
  • third storage means for storing the feed distance between stages of the progressive die
  • translating means successively responsive to said initial contour coordinate signals, said stage numbers and said feed distance for translating the horizontal coordinates of each initial group of contour coordinate signals to its corresponding stage so that the resulting group of signals corresponds to the contour coordinate signals for that stage.
  • said translating means includes:
  • multiplier means for successively multiplying said stage numbers by said feed distance, the successive products respectively corresponding to the horizontal distances said horizontal coordinates of the initial groups should be translated;
  • adder means for successively adding said successive products and said last-mentioned horizontal coordinates to obtain said plurality of contour coordinate signals.
  • Apparatus for controlling the placement of split die cavities in a progressive die where each cavity is described in terms of a group of contour coordinate signals which define predetermined coordinates of the contour of the cavity and split direction signals which define faces of the cavity contour from which splits thereof radiate, and apparatus comprising:
  • first register means for storing a first group of contour coordinate signals and split direction signals corresponding to a first split die cavity
  • second register means for storing a second group of contour coordinate signals and split direction signals corresponding to a second split die cavity
  • analyzer means including;
  • contour comparing means for comparing said first and second contour coordinate siganls to determine the relative spatial relation of said first and second split die cavities with respect to one another;
  • split comparing means for comparing said first and second split direction signals to determine whether a split is directed toward either said first or second die cavity without a corresponding split being directed back;
  • decision means responsive to said contour comparing means and said split direction comparing means for determining whether the split die cavity corresponding to said first signal group is inappropriately placed with respect to the split die cavity corresponding to said second signal group because of unmathced split conditions.
  • contour comparing means comprises a plurality of groups of comparing units where each group of comparing units deterrnine if a predetermined spatial relation exists between said first and second die cavities.
  • split comparing means comprises a plurality of EXCLUSIVE OR means respectively associated with said plurality of groups of comparing units.
  • said decision means comprises a plurality of detecting means respectively responsive to said plurality of groups of comparing units and said plurality of EXCLUSIVE OR means for determining if said unmatching condition exists at any one of the predetermined spatial relationships between said first and second die cavities.
  • a method as in claim 9 including:
  • said analyzing step determining whether the split die cavity corresponding to said first signal group is inappropriately placed with respect to the other split die cavities corresponding to said remaining groups because of unmatched split conditions.
  • a method as in claim 10 including the steps of initially storing a plurality of groups of initial contour coordinate signals respectively corresponding to said plurality of groups of contour coordinate signals;
  • a method as in claim 11 where said translating step includes:
  • contour comparing step comprises a plurality of groups of comparing steps where each group of comparing steps determines if a predetermined spatial relation exists between said first and second die cavities.
  • split comparing step comprises a plurality of EXCLUSIVE OR steps respectively associated with said plurality of groups of comparing steps.
  • said deciding step comprises a plurality of detecting steps respectively responsive to said plurality of groups of comparing steps and said plurality of EXCLUSIVE OR steps for determining if said unmatching condition exists at any one of the predetermined spatial relationships between said first and second die cavities.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Software Systems (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Graphics (AREA)
  • Mechanical Engineering (AREA)
  • Image Analysis (AREA)
  • Numerical Control (AREA)
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US00287262A 1972-09-08 1972-09-08 Method and apparatus for controlling placement of split die cavities Expired - Lifetime US3818195A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
US00287262A US3818195A (en) 1972-09-08 1972-09-08 Method and apparatus for controlling placement of split die cavities
CA178,549A CA994457A (en) 1972-09-08 1973-08-10 Placement of split die cavities
GB3934673A GB1413763A (en) 1972-09-08 1973-08-20 Method and apparatus for controlling placement of split die cavities
CH1269573A CH616520A5 (it) 1972-09-08 1973-09-04
BE135310A BE804447A (fr) 1972-09-08 1973-09-04 Procede et appareil pour regir la disposition de cavites de matricage divisees
DE19732344803 DE2344803A1 (de) 1972-09-08 1973-09-05 Verfahren zum automatischen entwurf von folgeschnittwerkzeugen und anordnung zur durchfuehrung des verfahrens
FR7332237A FR2203060B1 (it) 1972-09-08 1973-09-06
JP48101008A JPS5811285B2 (ja) 1972-09-08 1973-09-07 順送りダイスの単一ステ−ションにおける割りを入れた２つのダイス空胴の配置の適否を決定する装置
IT28682/73A IT993898B (it) 1972-09-08 1973-09-07 Procedimento ed apparecchiatura per controllare il collocamento di cavita di stampi tagliati

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US00287262A US3818195A (en) 1972-09-08 1972-09-08 Method and apparatus for controlling placement of split die cavities

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US (1) US3818195A (it)
JP (1) JPS5811285B2 (it)
BE (1) BE804447A (it)
CA (1) CA994457A (it)
CH (1) CH616520A5 (it)
DE (1) DE2344803A1 (it)
FR (1) FR2203060B1 (it)
GB (1) GB1413763A (it)
IT (1) IT993898B (it)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4945796A (en) * 1989-02-27 1990-08-07 Riley Wayne F Method of punching material
CN106623587A (zh) * 2016-12-27 2017-05-10 安徽钜芯半导体科技有限公司 一种集成式框架类芯片产品切断测试装置
CN114227152A (zh) * 2021-11-25 2022-03-25 杰瑞石油天然气工程有限公司 筒状件及其加工方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6197525A (ja) * 1984-10-19 1986-05-16 Yokogawa Hokushin Electric Corp 自動平衡記録計
CN104384356B (zh) * 2014-11-28 2016-08-17 黑龙江中科诺晟自动化设备开发有限公司 一种点阵式模具自动成型设备中与驱动丝杠对应的离合器的串行控制装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596068A (en) * 1968-12-30 1971-07-27 California Computer Products System for optimizing material utilization

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3596068A (en) * 1968-12-30 1971-07-27 California Computer Products System for optimizing material utilization

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4945796A (en) * 1989-02-27 1990-08-07 Riley Wayne F Method of punching material
CN106623587A (zh) * 2016-12-27 2017-05-10 安徽钜芯半导体科技有限公司 一种集成式框架类芯片产品切断测试装置
CN114227152A (zh) * 2021-11-25 2022-03-25 杰瑞石油天然气工程有限公司 筒状件及其加工方法

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JPS5811285B2 (ja) 1983-03-02
CA994457A (en) 1976-08-03
BE804447A (fr) 1974-03-04
CH616520A5 (it) 1980-03-31
GB1413763A (en) 1975-11-12
FR2203060B1 (it) 1976-11-19
IT993898B (it) 1975-09-30
FR2203060A1 (it) 1974-05-10
DE2344803A1 (de) 1974-03-21
JPS4967864A (it) 1974-07-01

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