US3740467A - Apparatus for inspecting the appearance of products - Google Patents

Apparatus for inspecting the appearance of products Download PDF

Info

Publication number
US3740467A
US3740467A US00214288A US3740467DA US3740467A US 3740467 A US3740467 A US 3740467A US 00214288 A US00214288 A US 00214288A US 3740467D A US3740467D A US 3740467DA US 3740467 A US3740467 A US 3740467A
Authority
US
United States
Prior art keywords
video signals
product
sample product
signals
appearance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
US00214288A
Other languages
English (en)
Inventor
M Kubo
Y Arimura
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Application granted granted Critical
Publication of US3740467A publication Critical patent/US3740467A/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956Inspecting patterns on the surface of objects
    • G01N21/95607Inspecting patterns on the surface of objects using a comparative method

Definitions

  • FIG.6B X Y X :t
  • FIG.6H T A APPARATUS FOR INSPECTING THE APPEARANCE OF PRODUCTS BACKGROU D OF THE INVENTION 1.
  • This invention generally relates to an apparatus for inspecting the appearance of products and more particularly to an'apparatus for inspecting to'determine the existence of cracks, splits, blots or the like which may appear on the outer surface of the products being inspected.
  • Another object of this invention is to provide a new and improved unique apparatus which is capable of automatically inspecting the appearance of products.
  • an'apparatus for inspecting the appearance of products'by using an image pickup device for photographing an image of a standard product whose appearance is complete and and image of a sample product whose appearance is to be inspected and for generating two video signals respectively corresponding thereto.
  • Meuns are provided for delaying either the video signals of the standard product or those of the sample product as obtained by the image pickup device.
  • Further means are provided-for comparing the delayed video signals and the non-delayed video signals of the two video signals to thereby obtain a comparison there between, whereby the sample product is inspected to determine whether the appearnace thereof is the same or different from that of the standard product.
  • FIG. 1 shows a schematic view of an appearance inspecting apparatus according to a preferred embodiment of this invention
  • FIG. 2 shows a diagramatic plan view of the optical system shown in FIG. 1;
  • FIG. 3 shows a diagramatic side elevation view of the same
  • FIG. 4 shows an enlarged partial view of the mirror sector shown in FIG. 1;
  • FIG. 5 shows a detailed block diagram of the gate signal generator shown in FIG. 1;
  • FIGS. 6a through 6h show time charts for illustrating the operation of the apparatus of this invention.
  • FIGS. 1 through 6 wherein like reference numerals designate identical or corresponding parts throughout the several views.
  • the inspecting apparatus of the present invention is shown as including first and second revolving disks 1 and 2.
  • the disks 1 and 2 are revolved with the same phase by motor 3, that is, the same speed and, for example, in the direction shown by the arrow a.
  • a standard product A whose appearance is correct and complete, that is, one which has no cracks, splits, blots or the like, is placed on the first disk 1.
  • a sample product B to be inspected and whose appearance is supposed to be the same as the standard product A is placed on the second disk 2. It is desirable to set the standard product A and the sample product B to be inspected with their corresponding surfaces being arranged in the same direction with respect to an image pickup device, that is, to match their phases.
  • phase shifter which is described in more detail hereinafter. Now, it will be easily underfirst and second disks 1 and 2 are revolvedwith the I same phase.
  • a plurality of first lighting sources 4, s and 6 are revided above the first disk 1 in order to illuminate the standard product A.
  • the lighting sources 4, 5 and 6 are arranged at a predetermined angle 0 with respect to the plane of the first disk 1 as shown in the respective plan and side elevation views of FIGS; 2 and 3.
  • the respective angles 0 of the lightingsources 4, 5 and 6 are 42,, b2) and
  • a plurality of second lighting sources 7, 8 and 9 are arranged above the second disk 2 at a predetermined angle 0 as shown in FIGS. 2 and 3.
  • the respective angles 0 of the lighting sources 7, 8 and 9 are 41,, @11 and 4:
  • the first and the second lighting sources may be, for example, fluorescent lamps, incandescent lamps or lamps of the electroluminescence type.
  • an image pickup device 11 ' is provided at the right hand side of the first disk 1 and the second disk 2.
  • the image pickup device 11 includes a camera or a pickup tube, such as an image orthicon camera tube or a videcon camera tube, in order to enable an optical image of the products A and B to be scanned and to thereby develop output voltages which vary in accordance with the light intensity of the successive elements of the images.
  • the light reflected from the sample product, B due to the second lighting sources 7, 8 and 9 is reflected by an optical mirror 12, which in turn is received by the image pickup device 11 through an optical interrupting means or chopper 13 and a lens 10.
  • the optical interrupter 13 is, for example, a mirror sector which is arranged in such a position that the light reflected from the standard product A due to the lighting sources 4, 5 and 6 and thelight reflected from the sample product B due to the lighting sources 7, 8 and 9 meet at right angles with each other.
  • the mirror sector or the chopper 13 are conventional in the art and may take any desired form.
  • One example of a suitable mirror sector or chopper will be described with reference to FIG. 4. I
  • the mirror sector l3' is shown as a thin circular plate which includes a light reflection portion or a mirror portion 40-and a light transparent portion, a cut out portion or a non-mirror portion 41.
  • the width C of the mirror portion 40 and the width D of the cut out portion 41 are made substantially equal.
  • the mirror sector 13 may be made, for example, by evaporating Aluminum (Al) on the surface of a circular glass or metal plate to make the mirror portion 40 and then by selectively removing the peripheral portion of the Aluminum evaporated plate to make the cut out portion product B partially overlap due to the rotation of the mirror sector 13.
  • a synchronizing signal generator 15 is provided at the pe ripheral portion of the mirror sector 13 to generate syn-.
  • the synchronizing signal generator 15 is conventional in the art and may by example consist of a photoemitting device or a light source 16, such as a lamp, and a photoreceiving device 17, such as a phototransistor, photocell or phototube.
  • the photoreceiving device is arranged on an opposite side of the mirror sector 13 to that of the photoemitting device so as to interpose the peripheral portion of the mirror sector 13 therebetween.
  • the synchronizing signal generator 15 will alternatively and in turn pass through the cut out portion 41 of the mirror sector 13 and be intercepted by the mirror portion of the mirror sector 13 shown in FIG. 4.
  • the photoreceiving device. 17 will in turn intermittently receive the light from the light source 16 and thereby produce pulses which are used as the synchronizing signals.
  • a typical waveform for the synchronizing signals so generated is shown in FIG. 6c.
  • the synchronizing signals thus obtained and the output signals from a sweep oscillator 18 of the image pickup device 11 are applied to a gate signal generator 19.
  • the gate signal generator 19 is actuated by synchronizing the operation of the mirror sector 13 with the sweep output signals from the sweep oscillator 18.
  • the mirror 13 is rotated about its central axis by a motor 14, so that the light reflected from the standard product A and the sample product B may be alternatively chopped by turns.
  • the light reflected from the standard product A and the sample product B thereby will alter? natively enter the camera tube of the image pickup device 11 by turns. That is, the light reflected from the standard product A is reflected by the mirror portion 40 of the mirror sector, 13 and thereafter enters the camera tube of the image pickup device 11.
  • the light reflected from the sample product B will pass through or penetrate the cut out portion 41 of the mirror sector 13 and thereafter enter the camera tube of the image pickup device 11.
  • the image pickup device 11 will alternately photograph thestandard product A and the sample product B which rotateiwith the same phase and under the same lighting conditions.
  • the operation of the mirror sector 13 and'the image pickup tube 11 are respectively shown in the time chart of FIGS. 6a and 6b. It can be clearly understood from FIG. 611 that the image or reflected light of the standard product A and the sample product 8' are alternately reflected and penetrated by the mirror sector 13 and that the boundary of the reflected light zone of the standard product A and the penetrated light zone of the sample
  • the gate signal generator 19 is shown as including a phase shifter 20, a monostable multivibrator or a one shot multivibrator 21, an inverter 22 and a bistable-multivibrator or a flip-flop 23. More particularly, the synchronizing signals from the synchronizing signal generator 15 of FIG.
  • phase shifter 20 which may, for example, include a monostable multivibrator.
  • the phase of the synchronizing signals are adjusted and at the same time the output pulses of the monostable multivibrator thereof are controlled by controlling the time constant of the monostable multivibrator so as to have a time width which corresponds to the width S of the overlapping portions shown in FIGS. 6a and 6b. In this manner the overlapping portions are thereby eliminated.
  • phase adjustment is carried out in order to synchronize the synchronizing signals from the synchronizing signal generator .15 and the image signals of the standard product A and the sample product B from the mirror sector 13.
  • T stands for a period wherein the image pickup device 11 alternately photographs the standard product A and the sample product B.
  • the output pulses produced by the monostable multivibrator 21 are then applied directly to one input terminal of the flip-flop 23, which may be for example a J-K flip-flop, an R-S flip-flop or an R-S-T flip-flop, and to another input terminal thereof through the inverter 22.
  • Vertical synchronizing signals from the sweep oscillator 18 are applied to a trigger input terminal of the flipflop 23.
  • FIG. 6f shows one example of the vertical synchronizing signals
  • FIG. 6g shows the output or gate signals generated from the flip-flop 23.
  • the gate signals so obtained atan output of the flipflop 23 are applied as shown in FIG. 1 to an AND gate 24 along with the video signals produced by the image pickup device 11.
  • the AND gate 24 is controlled by the gate signals such that video output signals of the standard product and the sample product are obtained which are completely separated from each other as shown in FIG. 6h.
  • the video signals from the AND gate 24 are respectively appliedto a magnetic writing head 25 of a delaying means, such as a video tape recorder, and to one input terminal 28 of a comparator 27.
  • the comparator 27 may conventionally be a subtracting circuit or-a diode comparator which includes an operational amplifier and a diode.
  • the writing head 25 serves to' write the video signals from the AND gate 24 on a magnetic tape 26 which is running in the direction shown by the arrow b and with a speed V.
  • the videosignals which are written on the magnetic tape 26 are then read out by a magnetic readout head 29 which'is set at a distance VT away from the writing head 25.
  • the video signals read out by the readout head 29 are, in turn, applied to the input terminal 30 of the comparator 27.
  • the time delay may be determined in accordance with the frequency of the sweep signal from the sweep oscillator 18, the amount of rotation of the mirror sector 13 and the amount of rotation of the disks 1 and 2.
  • the time delay cannot be determined indiscriminately but must be selected such that the video signals of the standard product and the corresponding video signals of the sample product are simultaneously applied to the comparator 27.
  • the two video signals that is, the nondelayed video signals and the delayed video signals are simultaneously and respectively applied to the input terminals 28 and 30 of the comparator 27.
  • the non-delayed signals and the delayed signals are thereby compared to provide a signal indicative of a balance or a difference therebetween.
  • a judging means 31 is provided for deciding and indicating whether or not a balance exists between the video signals of the sample product and the standard product.
  • the judging means 31 may be of a type that produces output signals if input signals representing a different output from the comparator are applied thereto and will not produce output signals if no input signals representing a balance output from the comparator 27 are applied thereto.
  • the judging means 31 may be a zero point detecting circuit which includes a fullwave rectifier.
  • Such a judging means will produce signals only when a difference between the standard product and the sample product occurs and therebyactuates an alarm 33. Simultaneously with the actuation of the alarm 33, the defective portion of the sample product so indicated is displayed by a television monitor 32 and if necessary the rotation of the disks 1 and 2 are stopped.
  • a mirror sector was used to alternately photograph the image of the standard product and the sample product, the invention is not so limited and that a semitransparent mirror having a reflective rate of about 50 percent or other optical choppers may be readily used.
  • a magnetic tape was used to delay the video signals of the product, it should be understood that the invention is not so limited and that other delay means, such as delay lines, semiconductor memoriesand the like may be readily used.
  • the present invention as described hereinabove provides an apparatus suitable for inspecting the appearance of the products, more quickly, economically and perfectly than heretofore existed. Moreover, it is apparent that this invention is advantageous in that the inspection can be performed automatically, so that the requirement for high skill is eliminated. The present invention is thus quite suitable for the mass production of products.
  • An apparatus for inspecting the appearance of products comprising: I
  • an image pickup device for alternately photographing a standard productwhose appearance is complete and a sample product whose appearance is to be inspected and for providing two video signals corresponding thereto;
  • the inspecting apparatus according to claim I which further includes means for rotating said standard product and sample product with the same phase.
  • An apparatus for inspecting the appearance of products comprising:
  • an optical interrupting means provided between said products and said image pickup device so as to allow images of said products to alternately enter into said image pickup device such that two video signals respectively corresponding to said standard product and said sampleproduct are produced;
  • a synchronizing signal generator for generating synchronizing signals for'synchronizing said optical interrupting means
  • a sweep oscillator for generating sweep signals for said image pickup device
  • a gate signal generator having said sweep signals and said synchronizing signals applied thereto for generating gate signals
  • phase shifter whose input is connected to said synchronizing signal generator
  • a bistable multivibrator connected to the output said monostable multivibrator.
  • said delaying means comprises a video tape recorder having separately arranged reading and writing heads.
  • phase shifter comprises a monostable multivibrator.
  • said optical interrupting means comprises a circular plate having a plurality of light reflective portions and a plurality of light transparent portions that are alternately arranged at the peripheral portion thereof; said light reflective portions and said light transparent portions having a same constant width.
  • saidsynchronizing signal generator comprises rupting means therebetween.

Landscapes

  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Image Processing (AREA)
US00214288A 1970-12-31 1971-12-30 Apparatus for inspecting the appearance of products Expired - Lifetime US3740467A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP45123630A JPS4814272B1 (enrdf_load_html_response) 1970-12-31 1970-12-31

Publications (1)

Publication Number Publication Date
US3740467A true US3740467A (en) 1973-06-19

Family

ID=14865326

Family Applications (1)

Application Number Title Priority Date Filing Date
US00214288A Expired - Lifetime US3740467A (en) 1970-12-31 1971-12-30 Apparatus for inspecting the appearance of products

Country Status (2)

Country Link
US (1) US3740467A (enrdf_load_html_response)
JP (1) JPS4814272B1 (enrdf_load_html_response)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5046185A (enrdf_load_html_response) * 1973-08-28 1975-04-24
US4007326A (en) * 1976-01-15 1977-02-08 Xerox Corporation Electronic copy analysis
US4064534A (en) * 1976-04-20 1977-12-20 Leone International Sales Corporation System for monitoring the production of items which are initially difficult to physically inspect
US4437115A (en) 1979-01-25 1984-03-13 Hajime Industries Ltd. Object and inspection system
US4491868A (en) * 1981-05-06 1985-01-01 Inspection Technology Inc. Video image compensator for inspection apparatus
US5083458A (en) * 1989-09-15 1992-01-28 General Electric Company Method and apparatus for recording loaded running tooth contact patterns on large reduction gears
WO1993025894A1 (de) * 1992-06-10 1993-12-23 Fagus-Grecon Greten Gmbh & Co. Kg Verfahren zur kalibrierung eines bildverarbeitungssystems
US5880848A (en) * 1995-03-27 1999-03-09 Basler Gmbh Process and device for high resolution optical testing of surfaces
US11455716B2 (en) * 2018-11-13 2022-09-27 Rivian Ip Holdings, Llc Image analysis of applied adhesive with fluorescence enhancement

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2460350A (en) * 1946-07-12 1949-02-01 Hinman Charlton Alternate projection collating device
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2460350A (en) * 1946-07-12 1949-02-01 Hinman Charlton Alternate projection collating device
US3049588A (en) * 1959-08-28 1962-08-14 Prec Controls Corp Quality control system

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5046185A (enrdf_load_html_response) * 1973-08-28 1975-04-24
US4007326A (en) * 1976-01-15 1977-02-08 Xerox Corporation Electronic copy analysis
US4064534A (en) * 1976-04-20 1977-12-20 Leone International Sales Corporation System for monitoring the production of items which are initially difficult to physically inspect
US4437115A (en) 1979-01-25 1984-03-13 Hajime Industries Ltd. Object and inspection system
US4491868A (en) * 1981-05-06 1985-01-01 Inspection Technology Inc. Video image compensator for inspection apparatus
US5083458A (en) * 1989-09-15 1992-01-28 General Electric Company Method and apparatus for recording loaded running tooth contact patterns on large reduction gears
WO1993025894A1 (de) * 1992-06-10 1993-12-23 Fagus-Grecon Greten Gmbh & Co. Kg Verfahren zur kalibrierung eines bildverarbeitungssystems
US5880848A (en) * 1995-03-27 1999-03-09 Basler Gmbh Process and device for high resolution optical testing of surfaces
US11455716B2 (en) * 2018-11-13 2022-09-27 Rivian Ip Holdings, Llc Image analysis of applied adhesive with fluorescence enhancement

Also Published As

Publication number Publication date
JPS4814272B1 (enrdf_load_html_response) 1973-05-04

Similar Documents

Publication Publication Date Title
US3598907A (en) Article inspection by successively televised images
US4674875A (en) Method and apparatus for inspecting surface defects on the magnetic disk file memories
US3740467A (en) Apparatus for inspecting the appearance of products
JPH04166751A (ja) びんの欠陥検査方法
US4742237A (en) Surface configuration inspection apparatus with moving grating
US4539561A (en) Process and device for inspecting the surface of a material
JPH03125947A (ja) ビン等の開口部を検査するための装置
JPS6129712A (ja) 微細パタ−ンの欠陥検出方法及びその装置
KR101078404B1 (ko) 금속 표면 결함 검출을 위한 카메라.카메라를 포함하는 금속 표면 결함 검출 장치,및 금속 표면 결함 검출 방법
JPH0570783B2 (enrdf_load_html_response)
FR2474688A1 (fr) Procede de commande de l'emission d'un flash par un stroboscope dans le cadre d'une methode d'appreciation de la qualite d'un objet en mouvement par le controle de ses defauts de forme
USRE28984E (en) Article inspection by successively televised images
JPS6128094B2 (enrdf_load_html_response)
JP2007212544A (ja) 液晶パネル検査装置及びその検査方法
JP2000162134A (ja) 表面検査装置
JPH02150752A (ja) 透明容器内の粉末中異物の検査装置
US3287564A (en) Photoelectric glassware inspecting device
JPH0224543A (ja) 瓶の外観検査方法
JP2769874B2 (ja) 樹脂成形歪の検査方法及び装置
JPH03291507A (ja) 円筒体の検査装置
JPH01214743A (ja) 光学検査装置
US3799682A (en) Apparatus for feeding polished machine parts past optical scanning means to enable inspection of the polished parts
JP3251477B2 (ja) 表面に存在する欠陥の検査方法
JPH0558497B2 (enrdf_load_html_response)
JPH0238955A (ja) 表面疵検査装置