US3287564A - Photoelectric glassware inspecting device - Google Patents

Photoelectric glassware inspecting device Download PDF

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US3287564A
US3287564A US248547A US24854762A US3287564A US 3287564 A US3287564 A US 3287564A US 248547 A US248547 A US 248547A US 24854762 A US24854762 A US 24854762A US 3287564 A US3287564 A US 3287564A
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glassware
photoelectric
closure
light
defects
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US248547A
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Ernest M Gore
Keinanen Henry
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Continental Can Co Inc
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Continental Can Co Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish

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  • This invention relates in general to new and useful improvements in inspecting devices, and more specilically to a novel photoelectric inspecting device for use in inspecting Iglassware for defect-s, and the method of 'utilizing such device.
  • the size of the defects range from about the size of .a pin head to about 1/8 of an inch long. It has also been found that the defects are disposed immediately adjacent the lugs 'with the result that when an attempt has been made to detect the defects in a conventional manner, light reflection from the lugs would give false signals Where no defects exist in the glass. Accordingly, normal detection methods cannot be utilized in conjunction with this ⁇ specific problem.
  • Another object of this invention is to provide a suitable device for inspecting the threads of glassware containers after the containers have been closed by the application of covers having lugs engaging the threads, the apparatus including two detection systems with one system inhibiting the other whereby at the time a lub is vbeing inspected, there is no output and the system detecting defects in the glassware being effective only when the adjacent lug has passed wherein any signal generated will be due to defects in the glassware and not due to the adjacent lug.
  • Still another object of this invention is to provide a novel method of inspecting glassware for defects in the threads thereof after the' application of a cover thereto and wherein the cover Ihas lugs engaging the threads, the method including the detecting of light reflection at a fixed point while the glassware is rotated relative to that point, and the simultaneous detecting of light reections from a lug of the cover remote from the point rwhere the glassware is being inspected, and electrically coupling the results of the two inspections wherein the inspection of the lug inhibits the electrical system for inspecting the glassware for defects wherein no output signal is ⁇ available until the adjacent .lng has passed the point being detected so that the resultant signal is that from a defect which may occur in the glassware.
  • a further object of this invention is to provide la novel inspection device for inspecting the threads of glassware for defects occurring therein after covers have been applied thereto and wherein the cover-s halve lugs which 3,287,564 Patented Nov. 22, 1,966
  • the device including lirst means for detecting the .light reilective effects at one fixed point and second means for detecting the light reflective effects at a second fixed point, the means for detecting the light reflective effects at the rst fixed point being electrically connected to the means for detecting the light reflective effects at the second fixed point, and the means for detecting the light reflective effects at the second fixed point being of a nature so as to be effected by light reflected from a lug of a cover and the signal so generated being electrically connected to inhibit any signal generated by the light reflective effects at the first point so 'as to prevent the fina-l output of a generated signal due to the existence of a lug and simulaneously ceasing the inhibiting of the signal generated by the light reflective effects at the tirst point when the lug has passed the rs-t point so that any defects in the glassware will immediately be detected.
  • Yet another object of the invention is to provide a novel inspection apparatus in Iaccordance with the foregoing wherein the electrical impulse which is indicative of the ⁇ light reflective effects of the glassware thread is utilized to operate a glassware rejector 'when the electrical impulse is Within a predetermined range.
  • Still another object of this invention is to .provide a novel method of detecting the existence of defects in concealed portions ,of glassware, the method including the steps of applying a light beam to the glassware in a manner wherein the .light is directed into the glass at a point some distance from the suspected regi-on and the light travels within the lglass wall of lthe glassware from the illuminated region to the suspect region whereby the light may travel beneath an overlying element.
  • FIGURE 1 is a perspective view showing schematically the photoelectric inspection device which is the subject of this invention, and shows broadly all the components thereof.
  • FIGURE 2 is a fragmentary perspective View of the ⁇ glassware to be inspected with the cover thereof shown in phantom lines and sample types of defects in the threads of the glassware.
  • FIGURE 3 is a schematic elevational view 'with parts broken away and sh-own in section, and shows the arrangement of the components of the two photoelectric detectors.
  • FIGURE 4 is a horizontal schematic view taken along the line 1*-4 of FIGURE 3 and shows further the sche- Ware.
  • FIGURE is a wiring diagram of the electrical system.
  • FIGURE 2 a typical glassware container having a reduced neck 11 which is provided with a plurality of outwardly projecting interrupted threads 12.
  • the glassware container 10 is closed by means of a cover 13 having a plurality of circumferentially spaced lugs 14 which correspond t-o the threads 12 in circumferential spacing and which cooperate with the threads 12 to tightly retain the cover 13 in place.
  • the defects which are caused by the application of the cover 13 are found at the point where greatest pressure is applied to the threads 12 by the lugs 14.
  • the defects which are referred to lby the letter D in FIGURE 2
  • FIG. 1 it will be seen that there is illustrated a magnetic chuck 15 on which the closed glassware container 10 is mounted in an inverted position for inspection.
  • the chuck 15 is supported by an armature shaft 16 of a chuck drive motor 17.
  • the closed glassware container 10 is 4mounted in an inverted position for inspection for two reasons. First, it is desired to rotate the defect areas of the glassware in a constant path.
  • the glassware containers 10 are formed with relatively large tolerances as compared to the closer tolerances of the covers 13. Therefore, it is desirable to utilize the covers 13 for the reference surfaces as opposed to the glassware containers.
  • the height of the product in the containers is usually not even Iwith the result tha-t some portions of the regio-n to lbe inspected would be backed with product and some portions would not if the containers were inspected with the closure up.
  • the inspection device includes a first photoelectric inspection device or detector which includes a light source 18 for directing a beam of light 20 into the glassware container to simultaneously illuminate one of the threads 12 and the overlying cover lug 14 as the glassware container 10 rotates.
  • a photoelectric pickup head 21 is positioned for picking up light rays retiected from the light beam 20 :by the glassware container thread 12 being inspected and the associated cover lug 14.
  • the pickup head 21 has associated therewith a lens 22 and a mask 23.
  • the inspection device also includes a sec-ond photoelectric inspection device or detector which includes a light source 24 for directing a beam of light 25 onto another of the cover lugs 14 atI a point generally diametrically opposite to the cover lug associated with the particular thread being inspected.
  • the second photoelectric inspecting device includes a photoelectric pick-up head 26 which has associated therewith a lens 27 and a mask 28.
  • the light “sources 18 and 24 are of conventional types and each will include a lamp and focusing lenses (not shown) so as to provide light beams which are concentrated, the light beams being the light beams 20 and 25, respectively.
  • the photoelectric pick-up head 21 may utilize a type 931A photomultiplier tube. Satisfactory performance can also be obtained with a Texas Instrument type IN2175 photodiode and a transistor amplier.
  • the photocell of the phataelectric pick-up 26 presently 1n use is a type 47BN1 Model 1000 photocell assembly manufactured by Electronics Corporation of America. However, here again satisfactory performance can be obtained with a type IN2175 photodiode and transistor amplifier.
  • the light source 18 is so positioned whereby the light beam 20 thereof is horizontally disposed (FIG- URE 3) and the light beam 20 intersects the center of rotation of the glassware container 10 (FIGURE 4).
  • the light beam 20 strikes the neck 11 of the glassware container in the vicinity of the threads 12 at a point remote from the test area.
  • the light travels through the glass of the neck 11 to the thread 12 being inspected and the associated cover lug 14.
  • a portion of the light from the light beam 20 is reflected by a lug 14 to the photoelectric pickup 21 and normally would result in a false signal indieating a defect which does not necessarily exist.
  • the pick-up 21 lies in a plane parallel to a plane passing through the center of the glassware container 10 and disposed normal to the axis of the light beam 20, as is clearly shown in FIG- URES 1 and 4.
  • the pick-up 21 is disposed at an angle of 25 to the horizontal, as is best shown in FIGURE 3.
  • the specific relationship of the light source 18 and the photoelectric pick-up 21 provides for the detection of imperfections in the threads 12.
  • the light source 24 is disposed in a position rotated 50 from a diametrically opposite position relative to the light source 18, as is best shown in FIGURE 4. In addition, the light source 24 is disposed at an angle of 18 to the horizontal, as is best shown in FIGURE 3. The light source 24 is positioned so that the light beam 24 therefrom is directed onto the cover lugs 14 and is Ieflected thereby to the photoelectric pick-up 26.
  • the photoelectric pick-up 26 is offset 5 from a position diametrical opposite to the light source 18, as is best shown in FIGURE 4. Also, the photoelectric pick-up 26 is disposed at an angle 49 to the horizontal, as is best shown in FIGURE 3.
  • the relationship of the light source 24 and the photoelectric pick-up 26 is such to provide for the desired light reections from the cover lugs 14 to the photoelectric pick-up 26 simultaneous with the reflection of light from the diametrically opposite cover lugs 14 to the photoelectric pick-up 21.
  • the photoelectric pick-up 26 may be utilized in an electrical system to inhibit the signal from the photoelectric pick-up 2l at the time it is -activated by light reecting from the cover lugs 14 and only the light which may be reflected from defects D in the threads utilized as a final signal.
  • the container 10 is inverted and is rotated in a clockwise direction. It is possible for the glassware container 10 to be rotated in a counterclockwise direction for inspection. However, it will be necessary to change the positions of the light sources, the photoelectric pickups, and the circuitry of the inspection device which is to be described hereinafter. It is also feasible to inspect the glassware containers in upright positions although the position shown is the most desirable position.
  • FIGURE 1 it will be seen that an amplifier '29 is connected to the photoelectric pick-up 21 for the purpose of amplifying the output of the photoelectric pick-up 21. The amplified output then passes into a gated amplifier which is connected to the amplifier 29 for receiving the output thereof.
  • Ano-ther amplifier 31 is electrically connected to the photoelectric pick-up 26 for receiving the output thereof and amplifying the sam-e.
  • the amplified output Athen passes to a Schmitt trigger circuit 32 which functions as a pulse Shaper.
  • the adjustable delay multivibrator 33 passes to a -gate gener-ating multivibrator 34 :and then to the gated amplifier 30 wherein it inhibits the output of gated amplifier 30 so ⁇ as :to suppress the effects of the light reflected from the cover lugs 14 to the photoelectric pick-up 421.
  • the pulse output of the gated amplifier 30 exceeds the threshold .amplitude determined by the adjustable clipper 35 the reject monostable multivibrator 36 is triggered t-o -generate .a reject pulse of iixed time ⁇ duration to represent a detected defect.
  • the pulse from monostable multivibrator 36 is amplified in pulse :amplifier 37 to sufficient power level for operation of a reject solenoid 38 for controlling the operation thereof to reject the glassware containers 10 by ejec-ti'ng the same from the rotating chuck
  • the reject solenoid 38 is provided with a reciprocatable rod 40 having a head 41 thereon -for enga-ging a glassware -container 10 seated on the chuck 15.
  • power for the chuck drive motor 17 :and the light sources 18 and 24 is from a power source 42 to a transformer 43.
  • the transformer 43 furnishes power at the voltage ⁇ appropriate for the lamps of the light souces 18 4and 24 and also for the chuck ⁇ drive motor 17.
  • the signal pulses genenated by the rotating cover lugs -14 within the pliotoelectric pickup 26 are amplified in the amplifier 31 and coupled to the Schmitt trigger circuit 32 via a clamp cir-cuit comprising a capacitor 44, a diode 45 and resistors 46, 47, 48 and 49.
  • the clamp cir-cuit comprising a capacitor 44, a diode 45 and resistors 46, 47, 48 and 49.
  • Schmitt trigger circuit 32 includes transistors 50 and 51,
  • the delay multivibrator 33 is composed of transistors 62 and 63, a capacitor 64 and resistors 65, 166, 67, 68, 69, 70 and 71. Negative going transitions of the pulses from the Schmitt trigger circuit 32 are conducted through the diode 61, thence to the base of the transistor y63, to stop conduction, thereby causing the transistor 62 to conduct due to the connection between the emitters of the transistors 62 and 63 and to the coupling resistor ⁇ 68.
  • the transistor 63 is held in a non-conducting state by the voltage across fthe capacitor 64 until the capacitor 64 discharges sufficiently through the resistors 67, 69 and 70.
  • the transistor 62 is quickly forced to stop conducting while the transistor 63 returns to its full conducting state. Consequently, for each negative transition of the output of the Schmitt trigger circuit 32, the delay multivibrator 33 develops .a rectangular positive-going voltage pulse of fixed time duration at the collector terminal Iof the transistor 63. The time duration of this pulse may be adjusted by means of the variable resistor 70.
  • the pulses from the delay multivibrator 33 are coupled to a lgate multivibrator 34 via a coupling comprising a capacitor 72, ta resistor 73 and a diode 74.
  • the gate multivibrator 34 comprises transistors 75 and 76, and a capacitor 77 and resistors 7-8, 80, 81, 82, 83, 84, 85, 86 and 87, .and develops a positive going voltage pulse of Ifixed time duration at the collector of the transistor 76 for each negative going transition of the output of the ldelay multivibrator 33.
  • the method of operati-on of this circuit is the same as that .set forth above for the ydelay multivibrator 33.
  • the time duration of the pulses may be adjusted by means of the variable resistor 84.
  • the output pulses of the gated multivibrator 34 are coupled 'by means of resistors 85, 86, and ⁇ 87 to the emitter of a transistor 88 which is part of the gated amplifier 30.
  • the transistor 88 conducts when the positive going :gate pulses are present and is non-conducting when Ithe lgate pulses are not present.
  • the light beam 20 may be considered to illuminate for inspection a region 89 and the light rays reflected from the region 89 to the photoelectric pick-up 21 are referred to by @the numeral 90.
  • the light source 24 is considered to illuminate a regi-on 92 and the light rays refiected from the region 92 to the photoelectric pickup 26 are referred to by the numeral 91.
  • the regions 89 and 92 are so Vdisposed with respect to the rotating glassware container 10 and its cover 14 so that the gated amplifier 30 is forced to conduct for the brief time interval during when the suspect regions Iof the glass threads 12 of the glassware container 10 pass through the illuminated inspection region ⁇ 89.
  • the start of the time interval is regulated by mean-s of the variable resistor 70 and the end point is regulated by means lof the variable resistor 84. If a defect cnack is lpresent in one of the glass threads 12, suffi-cient light is reflect-ed into the lens 22 and through 4.the mask 23 to develop an electrical pulse at the output ofthe photoelectric pick-up 21.
  • the output of the photoelectric pick-up 21 - is amplified 4:by the amplifier 29 and is coupled to the base of the transistor 88 via a clamp circuit comprising a capacitor 93, a diode 94, and resistors 95, 96 and 97.
  • the gated ⁇ amplifier 30 is composed of the transistor 88, a resistor 98 and the clamp circuit.
  • a diode 100 together with resistors 101 and 102, comprise the adjustable clipper circuit 35.
  • This clipper circuit transmits to a capacitor 103 only the portion of the pulse on the collector of the transistor 88 which exceeds the voltage set by the variable resistor 102.
  • Capacitors 104 and 105 suppress the undesired high frequency cornponents of the signal from the gated amplifier 30.
  • the variable resistor 102 is adjusted so that only a pulse caused by a defect crack will be transmitted to the capacitor 103 when a defect crack in a glass thread 12 of the glassware container 10 passes through the inspection region 89.
  • Clipped pulses corresponding to defect cracks are partially differentiated by the capacitor 103 and a resistor 106.
  • the negative going portion of the pulse causes the base and the emitter of the emitter follower transistor 107 to become momentarily sufficiently negative such that a transistor 108 conducts.
  • the transistor 107 is then forced into full conduction while the transistor 108 is forced into a non-conducting state by regenerative action in the reject multivibrator circuit 36.
  • the reject multivibrator 36 is composed of the transistors 108 and 109, a capacitor 110, and resistors 111, 112, 113, 114 and 115.
  • the voltage across the capacitor 110 holds the transistor 109 in the non-conducting state until the capacitor 110 discharges sufficiently through the resistors 111, 112 and 114, at which time the transistor 109 again starts to conduct and turns off the transistor 108 by regenerative action.
  • a variable resistor 116 is used to adjust the time duration of the reject pulse.
  • the reject multivibrator 36 thereby develops a positive going pulse of fixed time duration at the collector of the transistor 108 for each pulse input corresponding to a defect crack.
  • This positive going pulse is coupled to a transistor 117 of the reject pulse amplifier 37.
  • the reject pulse amplifier 37 comprises the transistor 117 and a transistor 118, and a resistor 120.
  • the coupling of the positive going pulse to the transistor 117 is by means of the resistors 111 and 112 and thereby causes the transistor 117 to conduct for the duration of this pulse.
  • the transistor 118 is, in turn, forced to conduct by the amplified current passing through the transistor 117.
  • a resistor 120 limits the current passing though the transistor 117 to avoid damage thereto.
  • the collector current pulses of the transistor 11S correspond to detected defect cracks in the glass threads 12 of the glassware container 10.
  • a lamp 121 may be coupled in the circuit, as is shown.
  • the reject solenoid 38 is connected in parallel to the lamp 121 and can be used either in place of the lamp 121 or in conjunction with the lamp so that automatic glassware rejection can be accomplished.
  • the reject solenoid 38 is provided with a control switch 122.
  • the electrical circuitry of this invention is illustrated as being energized by a battery 123 and a control .switch 124 is provided. However, it is to be understood that the electrical circuitry could be energized by an AC operated rectified power sup-ply.
  • a glassware container 10 having no defective threads is placed upside down on the rotating chuck 15.
  • a switch 125 which controls the operation of the chuck drive motor 17 is closed to begin rotation of the glassware container 10.
  • the switch 125 also energizes the light sources 17 and 24.
  • the switch 124 is now closed to energize the electrical circuitry.
  • variable resistance 70 is then adjusted so that the gated amplifier 30 is conductive just after the cover lug 14 has moved out of the lleld of view of the aperture in the photocell mask 23.
  • the good glassware container 10 is then replaced by a glassware container having a cracked thread 12 defect.
  • the variable resistance 84 is now adjusted so that the defect gives a maximum signal but shortly after the defect area of the thread 12 has passed the inspection region 89, the output pulse from the gate multivibrator 34 is cutoff, causing the transistor 88 to be non-conducting until the next cover lug 14 has passed the region 89. In this Way, the possibility of the reject light 121, or the reject solenoid 38, being caused to be operated by other reflective portions of the glassware container 10 is minimized.
  • the delay multivibrator 33 can be eliminated if it ⁇ is so desired. This can be accomplished by properly orienting the second photoelectric detector which includes the light source 24 and the photoelectric pick-up 26. However, normally the delay multivibrator will be utilized in that it is time consuming to obtain the necessary orientation of the second photoelectric detector.
  • reject solenoid has been illustrated in a position for rejecting the glassware containers directly off of the rotating chuck 15, it is to be understood that if it is so desired, a memory device may be incorporated intermediate the reject pulse amplifier 37 and the reject solenoid 38 so that the ejection or rejection of a glassware container may take place at a point remote from the chuck 15.
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said inspection devi-ce comprising a first photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric -detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from Ithe light reflecting from defects in the glassware.
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said -inspection device comprising a first photoelectric detector means for sequentially detecting the light-reflective effects of a portion of the closure at a point 0f engagement with the glassware and then any ⁇ defects that may exist in the glassware at the particular point, -a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically'coupling the outputs ⁇ of said rst and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from the light reflecting from defects in Ithe glassware, and glassware ejecting means electrically coupled to said electrical system for operation by the effective output signal to eject glassware having detected defects.
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said inspection device comprising a first photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure 4at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from the light reflecting from defects in the glassware, and means for rotating the glassware relative to said photoelectric detector means to provide for a complete circumferential inspection of the portion of the glassware to be inspected.
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, the structure of the glassware and closure being repetitive, said inspection device comprising a first photoelectric detector means for sequentially -detecting the light retiective effects of a portion of the closure at a point of engagement with the glassware ⁇ and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light retiective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said tirst photoelectric detector means is inhibited when affected by a closure and the effective output thereof is that resulting from the light reflecting from defec-ts in the glassware, said first and second photoelectric detector means being in circumferentially spaced relation,
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered -by a closure, the structure of the glassware and closure being repetitive, said inspection device comprising a lirst photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a sec-ond photoelectric detector means for detecting the light reflective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure and the eiective output thereof is that resulting from the light reflecting from defects in the glassware, said tirst and second photoelectric detector means being in circu-mferentially spaced relation, with the spacing between the first and second photoelectric detector means being generally in accordance with the repetition -of structure of the glassware and closure, and said electrical system .
  • a photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered 'by :a closure, said inspection device comprising a first photoelectric detector means for sequentially detecting the combined light reflective effects Aof the shape ⁇ of a closure at a point of engagement with the glassware and then :any defects that may exist -in the glassware at the particular po-int, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure and the effective output signal thereof is that resulting from the light reflecting from defects in the glassware, a rotary support for rotating the glassware relative to said photoelectric detector means to provide for a complete circumferential inspection of the portion of the glassware to be inspected, and glassware ejecting means electrically coupled to said electrical system and positioned adjacent said rotary support for operation by the effective output signal to eject
  • An inspection device for determining the condition of one part of a two part assembly wherein the two parts are immediately adjacent and not readily separately accessible, said inspection device comprising first inspection means for sequentially inspecting the physical characteristics of the two parts of the assembly second -inspection means for simultaneously inspecting the physical char-acteristics of only one of the two parts of the assembly, said first and second inspection means having separate electrical outputs in accordance with the inspection results, and electrical circuitry connected to said first and second inspection means for electrically summing the outputs thereof to provide an effective output corresponding to the resultant electrical output due to the one part.
  • An inspection device for determining the condition of threads of an article of glassware while engaged by lugs of a cover, the inspection device comprising first inspection means for sequentially inspect-ing a glassware thread and cover lug assembly disposed in immediate adjacent relation to obtain :a test result, second inspection means for inspecting :a cover lug only to obtain a test result, and means for utilizing the test results obtained by said second -inspecting means to inhibit the test results of the cover lug assembly by said first inspection means to provide the test results of only the glassware thread.
  • An inspection device for determining the condition of threads of an article of glassware while engaged by lugs of a cover, the inspection device comprising first inspect-ion means for inspecting a glassware thread and cover lug assembly disposed in immediately adjacent relation, second inspection means for inspecting a cover lug only, said first and second inspection means being of the type to provide separate electrical outputs, and electrical circuitry connected to said first and second inspection means for electrically coupling together the outputs thereof in inhibiting relation to inhibit the electrical output Aof said first -inspection means at the time of inspection of a cover lug :and to provide an effective output corresponding to the resultant electrical output due to the glassware thread.
  • said first photoelectric detect-or means includes a light source for transmitting a lbeam of light through the glass- -ware to the area being inspected.
  • said first photoelectric detector means includes a light source for transmitting a beam of light through the glassware to the area 'being inspected and a viewing device disposed along an axis disposed normal to the axis of said light source.
  • said first photoelectric detector means includes a light source, and a viewing device disposed along an axis disposed norm-al to the axis of said light source, said second photoelectric detect-or means including a second viewing device having an axis disposed generally diametrically opposite to said light source axis a-nd a second light source having an axis disposed generally at :a horizontal angle of 55 to the second mentioned viewing device.
  • the photoelectric -inspection device of claim 13 wherein said first photoelectric detector means includes a light source and a viewing device disposed along an axis disposed normal to the axis of said light source, said light source axis being horizontal when the glassware axis is vertical, and said viewing device axis is disposed generally at an angle of 25 to the horizontal.
  • said first photoelectric detector means includes a light 4source and a viewing device disposed along an axis d-isposed normal to the axis of said light source, said light source axis being horizontal when the glassware axis is vertical, and said viewing device taxis is disposed generally at Ian angle of 25 to the horizontal
  • said second photoelectric detect-or means including a second viewing device having an :axis disposed generally diametrically opposite to said light source axis and a second light source having an axis disposed generally at a horizontal angle of 55 t0 the second mentioned viewing device.
  • said first photoelectric detector means includes a light source for transmitting a beam of light through the glassware to the area being inspected, said light source having an axis passing through the axis of the glassware, and a viewing device disposed along an axis disposed normal to the axis of said light source.
  • the photoelectric inspection device of claim 1 wherein the electrical system includes an amplifier and a gated amplifier connected in series to said first photoelectric detector, and an amplifier, a pulse shaper and a gate generating multivibrator connected in series between said second photoelectric detector and said gated ampli- Iier.
  • a photoelectric inspection device for determining whether a container having a closure thereon meets a predetermined criterion in a glassware area immediately adjacent a closure portion comprising first means for sequentially viewing the area adjacent the junction of the portion of the closure and its engagement with the glassware, means coupled to said first means for deriving an output signal indicative of the combined light reflective effects at the area, second means for viewing another portion of the closure at its junction and deriving an output indicative of the reflective eflects, and means for electrically summing the outputs from said first means and said second means.
  • a photoelectric inspection device for determining whether a container having a closure with projecting lugs thereon meets a predetermined criterion in a glassware area immediately adjacent a lug comprising first means for photoelectrically viewing a closure lug, means coupled to said first l ⁇ means for deriving an output signal indicative of the reflective eflects of the lug, means for shaping the output signal, means for delaying the shaped output signal for a time period equal to the time for passage of the lug past said first means for viewing, second means for photoelectrically viewing another lug and the glassware RALPH G.
  • a photoelectric inspection device for determining whether a container having a closure with projecting lugs thereon meets a predetermined criterion in the glassware areas immediately adjacent a lug comprising first means for photoelectrically viewing a closure lug, means coupled to said first means for deriving an output signal indicative of the reflective effects of the lug, a Schmitt trigger for shaping the output signal, means coupled to said Schmitt trigger for delaying said signal, a gate generating multivibrator coupled to said Idelay means, second means for photoelectrically viewing another lug and the glassware area adjacent the latter lug, means coupled to said second means for deriving an output signal from said second means indicative of the reflective effects of the latter lug and glassware area, a gated amplifier for receiving the outputs from said gate generating multivibrator and said second means for electrically summing said signals to obtain a resultant signal obtained only from viewing the glassware, clipper means for reciving the summed signals to derive an output only in the event that the magnitude of the magnitude of

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Description

Nov. 22, 1966 E, M, GORE ETAL 3,287,564
PHOTOELECTRIC GLASSWARE INSPECTING DEVICE Filed Dec. 3l, 1962 5 Sheets-Sheet 1 Nov. 22, 1966 E. M. GORE ETAL. 3,287,554
PHOTOELECTRIC GLASSWARE INSPECTING DEVICE Filed Deo. 3l, 1962 5 Sheets-Sheet 2 sob INVENTORS EQMEST M6022 HEMQY Kam-mau Nov. 22, 1966 E. M. GORE ETAL PHOTOELEGTRIC GLASSWARE INSPECTING DEVICE Filed Deo.` 3l, 1962 5 Sheets-Sheet 5 vm moumia ww Wmv .AA A vvvvvvv ATTORNEYS United States Patent O 3,287,564 PHOTOELECTRIC GLASSWARE INSPECTING DEVICE Ernest M. Gore, Chicago, and Henry Keinanen, Oak Lawn, Ill., assignors to Continental Can Company, Inc., New York, N.Y., a corporation of New York Filed Dec. 31, 1962, Ser. No. 248,547 21 Claims. (Cl. Z50- 222) This invention relates in general to new and useful improvements in inspecting devices, and more specilically to a novel photoelectric inspecting device for use in inspecting Iglassware for defect-s, and the method of 'utilizing such device.
At the present time, numerous food products, including baby foods, are packaged in glassware containers having interrupted threads which are engaged by lugs of a metal cover. Although the glassware may be inspected prior to the iilling thereof `.and the application of the covers, heretofore no means have been provided for inspecting the threads -of the glassware after the application of the covers. However, when the covers are applied particularly when fundue pressure is utilized in the application of the covers, there has been 'a resulting cracking of the threads in certain instances. This, -of course, is undesirable, particularly in the case of baby foods, because glass fragments may fall into the pnoduct when the purchaser opens the container.
It has been found that, the size of the defects range from about the size of .a pin head to about 1/8 of an inch long. It has also been found that the defects are disposed immediately adjacent the lugs 'with the result that when an attempt has been made to detect the defects in a conventional manner, light reflection from the lugs would give false signals Where no defects exist in the glass. Accordingly, normal detection methods cannot be utilized in conjunction with this `specific problem.
Accordingly, it is the primary object of this invention to provide a novel inspecting device which may be utilized to inspect the threads .of glassware containers after the containers have been closed through the 4application of covers and the threads of the containers .are partially covered by lugs of the covers.
Another object of this invention is to provide a suitable device for inspecting the threads of glassware containers after the containers have been closed by the application of covers having lugs engaging the threads, the apparatus including two detection systems with one system inhibiting the other whereby at the time a lub is vbeing inspected, there is no output and the system detecting defects in the glassware being effective only when the adjacent lug has passed wherein any signal generated will be due to defects in the glassware and not due to the adjacent lug.
Still another object of this invention is to provide a novel method of inspecting glassware for defects in the threads thereof after the' application of a cover thereto and wherein the cover Ihas lugs engaging the threads, the method including the detecting of light reflection at a fixed point while the glassware is rotated relative to that point, and the simultaneous detecting of light reections from a lug of the cover remote from the point rwhere the glassware is being inspected, and electrically coupling the results of the two inspections wherein the inspection of the lug inhibits the electrical system for inspecting the glassware for defects wherein no output signal is `available until the adjacent .lng has passed the point being detected so that the resultant signal is that from a defect which may occur in the glassware.
A further object of this invention is to provide la novel inspection device for inspecting the threads of glassware for defects occurring therein after covers have been applied thereto and wherein the cover-s halve lugs which 3,287,564 Patented Nov. 22, 1,966
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normally result in false signals, the device including lirst means for detecting the .light reilective effects at one fixed point and second means for detecting the light reflective effects at a second fixed point, the means for detecting the light reflective effects at the rst fixed point being electrically connected to the means for detecting the light reflective effects at the second fixed point, and the means for detecting the light reflective effects at the second fixed point being of a nature so as to be effected by light reflected from a lug of a cover and the signal so generated being electrically connected to inhibit any signal generated by the light reflective effects at the first point so 'as to prevent the fina-l output of a generated signal due to the existence of a lug and simulaneously ceasing the inhibiting of the signal generated by the light reflective effects at the tirst point when the lug has passed the rs-t point so that any defects in the glassware will immediately be detected.
Yet another object of the invention is to provide a novel inspection apparatus in Iaccordance with the foregoing wherein the electrical impulse which is indicative of the `light reflective effects of the glassware thread is utilized to operate a glassware rejector 'when the electrical impulse is Within a predetermined range.
Still another object of this invention is to .provide a novel method of detecting the existence of defects in concealed portions ,of glassware, the method including the steps of applying a light beam to the glassware in a manner wherein the .light is directed into the glass at a point some distance from the suspected regi-on and the light travels within the lglass wall of lthe glassware from the illuminated region to the suspect region whereby the light may travel beneath an overlying element.
It has been found that the permissible tolerances in the manu-facture of glassware is much greater than that permissible in the manufacture -of the metal covers. Accordingly, it is still another object of this invention to provide means for supporting and rotating the glassware and cover assembly in an inverted position wherein the means engaging the assembly engage the cover to provide a more accurate path of Imovement of the assmbly during the inspection thereof.
It also has been found that difficulties have arisen by the variation in reflection due to variation in the height of the contents of the container. It is accordingly a still further object of this invention to provide a novel method lof inspecting glassware after it has been filled and closed by inverting the glassware so that the inspected area is filled with the contents of the glassware and there is no differential in the deflection of light caused by randomly occurring presence or absence of the con-tents closely arjacent the region to be inspected.
With the above, and other objects in view that will hereinafter appear, the nature of the invention will be more clearly understood by reference to the following detailed description, the appended claims and the several views illustrated in the accompanying drawings.
In the drawings:
FIGURE 1 is a perspective view showing schematically the photoelectric inspection device which is the subject of this invention, and shows broadly all the components thereof.
FIGURE 2 is a fragmentary perspective View of the `glassware to be inspected with the cover thereof shown in phantom lines and sample types of defects in the threads of the glassware.
FIGURE 3 is a schematic elevational view 'with parts broken away and sh-own in section, and shows the arrangement of the components of the two photoelectric detectors.
.FIGURE 4 is a horizontal schematic view taken along the line 1*-4 of FIGURE 3 and shows further the sche- Ware.
e) matic arrangement of the components of the photoelectric detectors.
FIGURE is a wiring diagram of the electrical system.
Referring now to the drawings in detail, it Will be seen that there is illustrated in FIGURE 2 a typical glassware container having a reduced neck 11 which is provided with a plurality of outwardly projecting interrupted threads 12. The glassware container 10 is closed by means of a cover 13 having a plurality of circumferentially spaced lugs 14 which correspond t-o the threads 12 in circumferential spacing and which cooperate with the threads 12 to tightly retain the cover 13 in place.
The defects which are caused by the application of the cover 13 are found at the point where greatest pressure is applied to the threads 12 by the lugs 14. As a result, the defects, which are referred to lby the letter D in FIGURE 2, are disposed in advance of the lugs 14 in the direction of the turning of the lugs to apply the cover to the glassware container 10. When an attempt is made to detect the defects, which may vary in size from that of a pin head to approximately l; of an inch in length, utilizing customary photoelectric inspecting devices, light reecting from the adjacent lugs results in false signals indicating defects `which do not actually exist in the glass- It is to the solution of the problem of detecting these defects D in the threads 12 which occur during the application of the cover 13, to which this invention is directed.
Referring now t-o FIGURE 1, it will be seen that there is illustrated a magnetic chuck 15 on which the closed glassware container 10 is mounted in an inverted position for inspection. The chuck 15 is supported by an armature shaft 16 of a chuck drive motor 17.
The closed glassware container 10 is 4mounted in an inverted position for inspection for two reasons. First, it is desired to rotate the defect areas of the glassware in a constant path. The glassware containers 10 are formed with relatively large tolerances as compared to the closer tolerances of the covers 13. Therefore, it is desirable to utilize the covers 13 for the reference surfaces as opposed to the glassware containers. Secondly, the height of the product in the containers is usually not even Iwith the result tha-t some portions of the regio-n to lbe inspected would be backed with product and some portions would not if the containers were inspected with the closure up.
This would result in undesired variations in reflectivity between portions of the region to be inspected. However, when the glassware containers 10 are inverted, the product disposed therein completely fills the inverted lower portion of the containers and there is no differentiation in light reflective characteristics due to the presence or absence of the product adjacent the .region to be inspected.
The inspection device includes a first photoelectric inspection device or detector which includes a light source 18 for directing a beam of light 20 into the glassware container to simultaneously illuminate one of the threads 12 and the overlying cover lug 14 as the glassware container 10 rotates. A photoelectric pickup head 21 is positioned for picking up light rays retiected from the light beam 20 :by the glassware container thread 12 being inspected and the associated cover lug 14. The pickup head 21 has associated therewith a lens 22 and a mask 23.
The inspection device also includes a sec-ond photoelectric inspection device or detector which includes a light source 24 for directing a beam of light 25 onto another of the cover lugs 14 atI a point generally diametrically opposite to the cover lug associated with the particular thread being inspected. The second photoelectric inspecting device includes a photoelectric pick-up head 26 which has associated therewith a lens 27 and a mask 28.
The light " sources 18 and 24 are of conventional types and each will include a lamp and focusing lenses (not shown) so as to provide light beams which are concentrated, the light beams being the light beams 20 and 25, respectively. The photoelectric pick-up head 21 may utilize a type 931A photomultiplier tube. Satisfactory performance can also be obtained with a Texas Instrument type IN2175 photodiode and a transistor amplier.
The photocell of the phataelectric pick-up 26 presently 1n use is a type 47BN1 Model 1000 photocell assembly manufactured by Electronics Corporation of America. However, here again satisfactory performance can be obtained with a type IN2175 photodiode and transistor amplifier.
Referring to FIGURES 1, 3 and 4 in particular, it will oe seen that the light source 18 is so positioned whereby the light beam 20 thereof is horizontally disposed (FIG- URE 3) and the light beam 20 intersects the center of rotation of the glassware container 10 (FIGURE 4). The light beam 20 strikes the neck 11 of the glassware container in the vicinity of the threads 12 at a point remote from the test area. The light travels through the glass of the neck 11 to the thread 12 being inspected and the associated cover lug 14. As the closed glassware container 10 rotates, a portion of the light from the light beam 20 is reflected by a lug 14 to the photoelectric pickup 21 and normally would result in a false signal indieating a defect which does not necessarily exist. As the closed glassware container 10 rotates still further, light from the light beam 20 is no longer reflected to the photoelectric pick-up 21 by the lug 14, and normally the light will pass through the thread 12 being inspected and not reected to the pick-up 21. However, when there is a defect in the thread, there will be an additional reflection of the light from the light Abeam 20 to the photoelectric pick-up 21 shortly after the reiiection of light lfrom the adjacent lug 14. In accordance with this invention, it is desired to only detect and utilize the light reflecting from a defect and to eliminate yany :activity of the apparatus due to the light refiected from the lug 14.
At this time it is pointed out that the pick-up 21 lies in a plane parallel to a plane passing through the center of the glassware container 10 and disposed normal to the axis of the light beam 20, as is clearly shown in FIG- URES 1 and 4. The pick-up 21 is disposed at an angle of 25 to the horizontal, as is best shown in FIGURE 3. The specific relationship of the light source 18 and the photoelectric pick-up 21 provides for the detection of imperfections in the threads 12.
The light source 24 is disposed in a position rotated 50 from a diametrically opposite position relative to the light source 18, as is best shown in FIGURE 4. In addition, the light source 24 is disposed at an angle of 18 to the horizontal, as is best shown in FIGURE 3. The light source 24 is positioned so that the light beam 24 therefrom is directed onto the cover lugs 14 and is Ieflected thereby to the photoelectric pick-up 26.
The photoelectric pick-up 26 is offset 5 from a position diametrical opposite to the light source 18, as is best shown in FIGURE 4. Also, the photoelectric pick-up 26 is disposed at an angle 49 to the horizontal, as is best shown in FIGURE 3. The relationship of the light source 24 and the photoelectric pick-up 26 is such to provide for the desired light reections from the cover lugs 14 to the photoelectric pick-up 26 simultaneous with the reflection of light from the diametrically opposite cover lugs 14 to the photoelectric pick-up 21. Thus, the photoelectric pick-up 26 may be utilized in an electrical system to inhibit the signal from the photoelectric pick-up 2l at the time it is -activated by light reecting from the cover lugs 14 and only the light which may be reflected from defects D in the threads utilized as a final signal.
At this time it is pointed out that in accordance with the invention, the container 10 is inverted and is rotated in a clockwise direction. It is possible for the glassware container 10 to be rotated in a counterclockwise direction for inspection. However, it will be necessary to change the positions of the light sources, the photoelectric pickups, and the circuitry of the inspection device which is to be described hereinafter. It is also feasible to inspect the glassware containers in upright positions although the position shown is the most desirable position.
It is to Ibe understood that the light refiected to and picked up by the photoelectric pick- ups 21 and 26 is converted into an electrical signal. In order to utilize the electrical output of the photoelectric pick- ups 21 and 26, there is connected thereto an electrical system which is generally shown in FIGURE l and specifically shown in FIGURE 5. Referring first to FIGURE 1, it will be seen that an amplifier '29 is connected to the photoelectric pick-up 21 for the purpose of amplifying the output of the photoelectric pick-up 21. The amplified output then passes into a gated amplifier which is connected to the amplifier 29 for receiving the output thereof.
Ano-ther amplifier 31 is electrically connected to the photoelectric pick-up 26 for receiving the output thereof and amplifying the sam-e. The amplified output Athen passes to a Schmitt trigger circuit 32 which functions as a pulse Shaper. The output o-f the Schmitt trigger cir- -cuitpasses to an adjustable delay multivibrator 33 for the purpose of timing the transmission of the pulse. The
pulse transmitted fnom the adjustable delay multivibrator 33 passes to a -gate gener-ating multivibrator 34 :and then to the gated amplifier 30 wherein it inhibits the output of gated amplifier 30 so `as :to suppress the effects of the light reflected from the cover lugs 14 to the photoelectric pick-up 421. When the pulse output of the gated amplifier 30 exceeds the threshold .amplitude determined by the adjustable clipper 35 the reject monostable multivibrator 36 is triggered t-o -generate .a reject pulse of iixed time `duration to represent a detected defect. The pulse from monostable multivibrator 36 is amplified in pulse :amplifier 37 to sufficient power level for operation of a reject solenoid 38 for controlling the operation thereof to reject the glassware containers 10 by ejec-ti'ng the same from the rotating chuck |15. The reject solenoid 38 is provided with a reciprocatable rod 40 having a head 41 thereon -for enga-ging a glassware -container 10 seated on the chuck 15.
Referring more specifically to the electrical circuit shown in IFIGURE 5, it will be seen that power for the chuck drive motor 17 :and the light sources 18 and 24 is from a power source 42 to a transformer 43. The transformer 43 furnishes power at the voltage `appropriate for the lamps of the light souces 18 4and 24 and also for the chuck `drive motor 17. As the glassware container 10, together with the cover 13 is rotated, light reflected from the glassware container and closure to the photoelectric pick- ups 21 and 26 varies in `intensity and thereby .gen-
erates two 'detectable electric signals which correspond to the combined effects of the cover lugs 414 and the thread defects on the one hand, and to the cover lugs 14 on the other hand. The signal pulses genenated by the rotating cover lugs -14 within the pliotoelectric pickup 26 are amplified in the amplifier 31 and coupled to the Schmitt trigger circuit 32 via a clamp cir-cuit comprising a capacitor 44, a diode 45 and resistors 46, 47, 48 and 49. The
Schmitt trigger circuit 32 includes transistors 50 and 51,
to the monostable multivibrator 33 via a differentiating and coupling network comprising .a capacitor 58, a resistor 60 4and Ia diode 61. The delay multivibrator 33 is composed of transistors 62 and 63, a capacitor 64 and resistors 65, 166, 67, 68, 69, 70 and 71. Negative going transitions of the pulses from the Schmitt trigger circuit 32 are conducted through the diode 61, thence to the base of the transistor y63, to stop conduction, thereby causing the transistor 62 to conduct due to the connection between the emitters of the transistors 62 and 63 and to the coupling resistor `68. The transistor 63 is held in a non-conducting state by the voltage across fthe capacitor 64 until the capacitor 64 discharges sufficiently through the resistors 67, 69 and 70. When the transistor 63 again starts to conduct, the transistor 62 is quickly forced to stop conducting while the transistor 63 returns to its full conducting state. Consequently, for each negative transition of the output of the Schmitt trigger circuit 32, the delay multivibrator 33 develops .a rectangular positive-going voltage pulse of fixed time duration at the collector terminal Iof the transistor 63. The time duration of this pulse may be adjusted by means of the variable resistor 70.
The pulses from the delay multivibrator 33 are coupled to a lgate multivibrator 34 via a coupling comprising a capacitor 72, ta resistor 73 and a diode 74. The gate multivibrator 34 comprises transistors 75 and 76, and a capacitor 77 and resistors 7-8, 80, 81, 82, 83, 84, 85, 86 and 87, .and develops a positive going voltage pulse of Ifixed time duration at the collector of the transistor 76 for each negative going transition of the output of the ldelay multivibrator 33. The method of operati-on of this circuit is the same as that .set forth above for the ydelay multivibrator 33. The time duration of the pulses may be adjusted by means of the variable resistor 84.
The output pulses of the gated multivibrator 34 are coupled 'by means of resistors 85, 86, and `87 to the emitter of a transistor 88 which is part of the gated amplifier 30. The transistor 88 conducts when the positive going :gate pulses are present and is non-conducting when Ithe lgate pulses are not present.
The light beam 20 may be considered to illuminate for inspection a region 89 and the light rays reflected from the region 89 to the photoelectric pick-up 21 are referred to by @the numeral 90. In a like manner, the light source 24 is considered to illuminate a regi-on 92 and the light rays refiected from the region 92 to the photoelectric pickup 26 are referred to by the numeral 91. The regions 89 and 92 are so Vdisposed with respect to the rotating glassware container 10 and its cover 14 so that the gated amplifier 30 is forced to conduct for the brief time interval during when the suspect regions Iof the glass threads 12 of the glassware container 10 pass through the illuminated inspection region `89. The start of the time interval is regulated by mean-s of the variable resistor 70 and the end point is regulated by means lof the variable resistor 84. If a defect cnack is lpresent in one of the glass threads 12, suffi-cient light is reflect-ed into the lens 22 and through 4.the mask 23 to develop an electrical pulse at the output ofthe photoelectric pick-up 21. The output of the photoelectric pick-up 21 -is amplified 4:by the amplifier 29 and is coupled to the base of the transistor 88 via a clamp circuit comprising a capacitor 93, a diode 94, and resistors 95, 96 and 97. The gated `amplifier 30 is composed of the transistor 88, a resistor 98 and the clamp circuit.
If a negative going electric pulse is present at the base of the transistor 88, during the time interval when this transistor is forced to conduct by the gating pulse from the gate multivibrator 34, then an amplified positive going pulse will be produced at the collector of the transistor 88. A diode 100, together with resistors 101 and 102, comprise the adjustable clipper circuit 35. This clipper circuit transmits to a capacitor 103 only the portion of the pulse on the collector of the transistor 88 which exceeds the voltage set by the variable resistor 102. Capacitors 104 and 105 suppress the undesired high frequency cornponents of the signal from the gated amplifier 30. The variable resistor 102 is adjusted so that only a pulse caused by a defect crack will be transmitted to the capacitor 103 when a defect crack in a glass thread 12 of the glassware container 10 passes through the inspection region 89.
Clipped pulses corresponding to defect cracks are partially differentiated by the capacitor 103 and a resistor 106. The negative going portion of the pulse causes the base and the emitter of the emitter follower transistor 107 to become momentarily sufficiently negative such that a transistor 108 conducts. The transistor 107 is then forced into full conduction while the transistor 108 is forced into a non-conducting state by regenerative action in the reject multivibrator circuit 36. The reject multivibrator 36 is composed of the transistors 108 and 109, a capacitor 110, and resistors 111, 112, 113, 114 and 115. The voltage across the capacitor 110 holds the transistor 109 in the non-conducting state until the capacitor 110 discharges sufficiently through the resistors 111, 112 and 114, at which time the transistor 109 again starts to conduct and turns off the transistor 108 by regenerative action. A variable resistor 116 is used to adjust the time duration of the reject pulse.
The reject multivibrator 36 thereby develops a positive going pulse of fixed time duration at the collector of the transistor 108 for each pulse input corresponding to a defect crack. This positive going pulse is coupled to a transistor 117 of the reject pulse amplifier 37. The reject pulse amplifier 37 comprises the transistor 117 and a transistor 118, and a resistor 120. The coupling of the positive going pulse to the transistor 117 is by means of the resistors 111 and 112 and thereby causes the transistor 117 to conduct for the duration of this pulse. The transistor 118 is, in turn, forced to conduct by the amplified current passing through the transistor 117. A resistor 120 limits the current passing though the transistor 117 to avoid damage thereto. The collector current pulses of the transistor 11S correspond to detected defect cracks in the glass threads 12 of the glassware container 10. When visual readout is desired, a lamp 121 may be coupled in the circuit, as is shown. The reject solenoid 38 is connected in parallel to the lamp 121 and can be used either in place of the lamp 121 or in conjunction with the lamp so that automatic glassware rejection can be accomplished. The reject solenoid 38 is provided with a control switch 122.
The electrical circuitry of this invention is illustrated as being energized by a battery 123 and a control .switch 124 is provided. However, it is to be understood that the electrical circuitry could be energized by an AC operated rectified power sup-ply.
In order to adjust the inspection device for operation, a glassware container 10 having no defective threads is placed upside down on the rotating chuck 15. A switch 125 which controls the operation of the chuck drive motor 17 is closed to begin rotation of the glassware container 10. The switch 125 also energizes the light sources 17 and 24. The switch 124 is now closed to energize the electrical circuitry.
The variable resistance 70 is then adjusted so that the gated amplifier 30 is conductive just after the cover lug 14 has moved out of the lleld of view of the aperture in the photocell mask 23. The good glassware container 10 is then replaced by a glassware container having a cracked thread 12 defect. The variable resistance 84 is now adjusted so that the defect gives a maximum signal but shortly after the defect area of the thread 12 has passed the inspection region 89, the output pulse from the gate multivibrator 34 is cutoff, causing the transistor 88 to be non-conducting until the next cover lug 14 has passed the region 89. In this Way, the possibility of the reject light 121, or the reject solenoid 38, being caused to be operated by other reflective portions of the glassware container 10 is minimized.
At this time it is pointed out that the delay multivibrator 33 can be eliminated if it `is so desired. This can be accomplished by properly orienting the second photoelectric detector which includes the light source 24 and the photoelectric pick-up 26. However, normally the delay multivibrator will be utilized in that it is time consuming to obtain the necessary orientation of the second photoelectric detector.
Operational tests have been made with the apparatus. It has been found that substantially all of the defective glassware containers have been located and only a very minimum of perfect glassware have been unduly rejected.
Although the reject solenoid has been illustrated in a position for rejecting the glassware containers directly off of the rotating chuck 15, it is to be understood that if it is so desired, a memory device may be incorporated intermediate the reject pulse amplifier 37 and the reject solenoid 38 so that the ejection or rejection of a glassware container may take place at a point remote from the chuck 15.
It is to be understood that the specific angles of the light sources and the photoelectric pick-ups will vary depending upon the specific article being inspected. However, while only a preferred embodiment of the invention has been illustrated and described herein, it is to be understood that minor variations may lbe made in the disclosed structure within the spirit and scope of the invention, as defined by the appended claims:
We claim:
1. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said inspection devi-ce comprising a first photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric -detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from Ithe light reflecting from defects in the glassware.
2. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said -inspection device comprising a first photoelectric detector means for sequentially detecting the light-reflective effects of a portion of the closure at a point 0f engagement with the glassware and then any `defects that may exist in the glassware at the particular point, -a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically'coupling the outputs `of said rst and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from the light reflecting from defects in Ithe glassware, and glassware ejecting means electrically coupled to said electrical system for operation by the effective output signal to eject glassware having detected defects.
3. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, said inspection device comprising a first photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure 4at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure so that the effective output thereof is that resulting from the light reflecting from defects in the glassware, and means for rotating the glassware relative to said photoelectric detector means to provide for a complete circumferential inspection of the portion of the glassware to be inspected.
4. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered by a closure, the structure of the glassware and closure being repetitive, said inspection device comprising a first photoelectric detector means for sequentially -detecting the light retiective effects of a portion of the closure at a point of engagement with the glassware `and then any defects that may exist in the glassware at the particular point, a second photoelectric detector means for detecting the light retiective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said tirst photoelectric detector means is inhibited when affected by a closure and the effective output thereof is that resulting from the light reflecting from defec-ts in the glassware, said first and second photoelectric detector means being in circumferentially spaced relation,
`with the spacing between the first and second photoelectric detector means being in accordance with the repetition of structure of the glassware and closure whereby like portions of a closure are simultaneously inspected.
5. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered -by a closure, the structure of the glassware and closure being repetitive, said inspection device comprising a lirst photoelectric detector means for sequentially detecting the light reflective effects of a portion of the closure at a point of engagement with the glassware and then any defects that may exist in the glassware at the particular point, a sec-ond photoelectric detector means for detecting the light reflective effects of another portion of the closure, and an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure and the eiective output thereof is that resulting from the light reflecting from defects in the glassware, said tirst and second photoelectric detector means being in circu-mferentially spaced relation, with the spacing between the first and second photoelectric detector means being generally in accordance with the repetition -of structure of the glassware and closure, and said electrical system .including a time delay device for synchronizing the outputs of said first and second photoelectric detector means.
6. A photoelectric inspection device for inspecting glassware having a closure thereon for defects disposed immediately adjacent areas covered 'by :a closure, said inspection device comprising a first photoelectric detector means for sequentially detecting the combined light reflective effects Aof the shape `of a closure at a point of engagement with the glassware and then :any defects that may exist -in the glassware at the particular po-int, a second photoelectric detector means for detecting the light reflective effects of another portion of the closure, an electrical system electrically coupling the outputs of said first and second detector means in inhibiting relation whereby the output of said first photoelectric detector means is inhibited when affected by a closure and the effective output signal thereof is that resulting from the light reflecting from defects in the glassware, a rotary support for rotating the glassware relative to said photoelectric detector means to provide for a complete circumferential inspection of the portion of the glassware to be inspected, and glassware ejecting means electrically coupled to said electrical system and positioned adjacent said rotary support for operation by the effective output signal to eject glassware having detected defects from said rotary support.
7. An inspection device -for determining the condition of one part of a two part assembly wherein the two parts are immediately adjacent and not readily separately accessible, said inspection device comprising first inspection means for sequentially inspecting the physical characteristics of the two parts of the assembly second -inspection means for simultaneously inspecting the physical char-acteristics of only one of the two parts of the assembly, said first and second inspection means having separate electrical outputs in accordance with the inspection results, and electrical circuitry connected to said first and second inspection means for electrically summing the outputs thereof to provide an effective output corresponding to the resultant electrical output due to the one part.
8. An inspection device for determining the condition of threads of an article of glassware while engaged by lugs of a cover, the inspection device comprising first inspection means for sequentially inspect-ing a glassware thread and cover lug assembly disposed in immediate adjacent relation to obtain :a test result, second inspection means for inspecting :a cover lug only to obtain a test result, and means for utilizing the test results obtained by said second -inspecting means to inhibit the test results of the cover lug assembly by said first inspection means to provide the test results of only the glassware thread.
9. An inspection device for determining the condition of threads of an article of glassware while engaged by lugs of a cover, the inspection device comprising first inspect-ion means for inspecting a glassware thread and cover lug assembly disposed in immediately adjacent relation, second inspection means for inspecting a cover lug only, said first and second inspection means being of the type to provide separate electrical outputs, and electrical circuitry connected to said first and second inspection means for electrically coupling together the outputs thereof in inhibiting relation to inhibit the electrical output Aof said first -inspection means at the time of inspection of a cover lug :and to provide an effective output corresponding to the resultant electrical output due to the glassware thread.
10. The photoelectric inspection device of claim 1 Wherein said first photoelectric detect-or means includes a light source for transmitting a lbeam of light through the glass- -ware to the area being inspected.
11. The photoelectric inspection device of claim 1 wherein said first photoelectric detector means includes a light source for transmitting a beam of light through the glassware to the area 'being inspected and a viewing device disposed along an axis disposed normal to the axis of said light source.
12. The photoelectric inspection device of claim 1 wherein said first photoelectric detector means includes a light source, and a viewing device disposed along an axis disposed norm-al to the axis of said light source, said second photoelectric detect-or means including a second viewing device having an axis disposed generally diametrically opposite to said light source axis a-nd a second light source having an axis disposed generally at :a horizontal angle of 55 to the second mentioned viewing device.
13. The photoelectric -inspection device of claim 1 wherein said first photoelectric detector means includes a light source and a viewing device disposed along an axis disposed normal to the axis of said light source, said light source axis being horizontal when the glassware axis is vertical, and said viewing device axis is disposed generally at an angle of 25 to the horizontal.
14. The photoelectric inspection device of claim 1 wherein said first photoelectric detector means includes a light 4source and a viewing device disposed along an axis d-isposed normal to the axis of said light source, said light source axis being horizontal when the glassware axis is vertical, and said viewing device taxis is disposed generally at Ian angle of 25 to the horizontal, said second photoelectric detect-or means including a second viewing device having an :axis disposed generally diametrically opposite to said light source axis and a second light source having an axis disposed generally at a horizontal angle of 55 t0 the second mentioned viewing device.
15. The photoelectric inspection device of claim 14 wherein said second light source is generally disposed at an angle of 18 to the horizontal and said second viewing device axis is generally at an angle of 49 to the horizontal.
16. The photoelectric inspection device of claim 1 wherein said first photoelectric detector means includes a light source for transmitting a beam of light through the glassware to the area being inspected, said light source having an axis passing through the axis of the glassware, and a viewing device disposed along an axis disposed normal to the axis of said light source.
17. The photoelectric inspection device of claim 1 wherein the electrical system includes an amplifier and a gated amplifier connected in series to said first photoelectric detector, and an amplifier, a pulse shaper and a gate generating multivibrator connected in series between said second photoelectric detector and said gated ampli- Iier.
18. The photoelectric inspection device of claim 17 together with an adjustable delay multivibrator connected between said pulse Shaper and said gate generating multivibrator.
19. A photoelectric inspection device for determining whether a container having a closure thereon meets a predetermined criterion in a glassware area immediately adjacent a closure portion comprising first means for sequentially viewing the area adjacent the junction of the portion of the closure and its engagement with the glassware, means coupled to said first means for deriving an output signal indicative of the combined light reflective effects at the area, second means for viewing another portion of the closure at its junction and deriving an output indicative of the reflective eflects, and means for electrically summing the outputs from said first means and said second means.
20. A photoelectric inspection device for determining whether a container having a closure with projecting lugs thereon meets a predetermined criterion in a glassware area immediately adjacent a lug comprising first means for photoelectrically viewing a closure lug, means coupled to said first l`means for deriving an output signal indicative of the reflective eflects of the lug, means for shaping the output signal, means for delaying the shaped output signal for a time period equal to the time for passage of the lug past said first means for viewing, second means for photoelectrically viewing another lug and the glassware RALPH G. NILsoN,
area adjacent the latter lug, means coupled to said second means for deriving an output signal from said second means indicative of the reflective effects of the latter lug and glassware area, means for electrically summing the delayed signal and the signal from the second means to obtain`a resultant signal derived only from viewing the glassware, and means to determine the degree of correlation between said resultant signal and said predetermined criterion.
21. A photoelectric inspection device for determining whether a container having a closure with projecting lugs thereon meets a predetermined criterion in the glassware areas immediately adjacent a lug comprising first means for photoelectrically viewing a closure lug, means coupled to said first means for deriving an output signal indicative of the reflective effects of the lug, a Schmitt trigger for shaping the output signal, means coupled to said Schmitt trigger for delaying said signal, a gate generating multivibrator coupled to said Idelay means, second means for photoelectrically viewing another lug and the glassware area adjacent the latter lug, means coupled to said second means for deriving an output signal from said second means indicative of the reflective effects of the latter lug and glassware area, a gated amplifier for receiving the outputs from said gate generating multivibrator and said second means for electrically summing said signals to obtain a resultant signal obtained only from viewing the glassware, clipper means for reciving the summed signals to derive an output only in the event that the magnitude of the summed signal exceeds a predetermined value.
References Cited by the Examiner UNITED STATES PATENTS 2,524,929 10/1950 Razek Z50-223 X 2,548,755 4/1951 Vossberg et al 250-223 X 2,902,151 9/1959 Miles et al. 250-223 X 2,982,862 5/1961 Smith Z50-223 3,067,872 12/1962 Fouse et al 209-75 3,069,553 12/1962 Zoltanski Z50-223 X 3,089,594 5/1963 Early 209-1115 3,094,214 6/1963 Wyman et al 209-1115 3,107,011 10/1963 Mathias et al 209-1115 Primary Examiner.
WALTER STOLWEIN, Examiner.

Claims (1)

  1. 6. A PHOTOELECTRIC INSPECTION DEVICE FOR INSPECTING GLASSWARE HAVING A CLOSURE THEREON FOR DEFECTS DISPOSED IMMEDIATELY ADJACENT AREAS COVERED BY A CLOSURE, SAID INSPECTION DEVICE COMPRISING A FIRST PHOTOELECTRIC DETECTOR MEANS FOR SEQUENTIALLY DETECTING THE COMBINED LIGHT REFLECTIVE EFFECTS OF THE SHAPE OF A CLOSURE AT A POINT OF ENGAGEMENT WITH THE GLASSWARE AND THEN ANY DEFECTS THAT MAY EXIST IN THE GLASSWARE AT THE PARTICULAR POINT, A SECOND PHOTOELECTRIC DETECTOR MEANS FOR DETECTING THE LIGHT REFLECTIVE EFFECTS OF ANOTHER PORTION OF THE CLOSURE, AN ELECTRICAL SYSTEM ELECTRICALLY COUPLING THE OUTPUTS OF SAID FIRST AND SECOND DETECTOR MEANS IN INHIBITING RELATION WHEREBY THE OUTPUT OF SAID FIRST PHOTOELECTRIC DETECTOR MEANS IS INHIBITED WHEN AFFECTED BY A CLOSURE AND THE EFFECTIVE OUTPUT SIGNAL THEREOF IS THAT RESULTING FROM THE LIGHT REFLECTING FROM DEFECTS IN THE GLASSWARE, A ROTARY SUPPORT FOR ROTATING THE GLASSWARE RELATIVE TO SAID PHOTOELECTRIC DETECTOR MEANS TO PROVIDE FOR A COMPLETE CIRCUMFERENTIAL INSPECTION OF THE PORTION OF THE GLASSWARE TO BE INSPECTED, AND GLASSWARE EJECTING MEANS ELECTRICALLY COUPLED TO SAID ELECTRICAL SYSTEM AND POSITIONED ADJACENT SAID ROTARY SUPPORT FOR OPERATION BY THE EFFECTIVE OUTPUT SIGNAL TO EJECT GLASSWARE HAVING DETECTED DEFECTS FROM SAID ROTARY SUPPORT.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492491A (en) * 1967-03-03 1970-01-27 Optomechanisms Inc Thickness monitor for coating silicon wafer
US3639067A (en) * 1970-06-29 1972-02-01 Emhart Corp Glassware inspection apparatus employing fiber-optic guides
US6104482A (en) * 1999-12-02 2000-08-15 Owens-Brockway Glass Container Inc. Container finish check detection
US8941825B2 (en) 2013-03-15 2015-01-27 Owens-Brockway Glass Container Inc. Container inspection

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US2524929A (en) * 1946-02-21 1950-10-10 Wm S Scull Company Photoelectric method and apparatus for testing vacuum conditions in containers
US2548755A (en) * 1947-12-12 1951-04-10 Standard Electronics Res Corp Optical area measuring system
US2902151A (en) * 1955-09-21 1959-09-01 Brockway Glass Co Inc Automatic inspection apparatus for glass containers and the like
US2982862A (en) * 1959-12-31 1961-05-02 Aluminum Co Of America Bottle cap detector
US3067872A (en) * 1958-09-15 1962-12-11 Anchor Hocking Glass Corp Method and means for inspecting containers
US3069553A (en) * 1959-05-12 1962-12-18 Continental Can Co Light source for photoelectric inspection of glassware
US3089594A (en) * 1960-06-13 1963-05-14 Owens Illinois Glass Co Shape and height detection
US3094214A (en) * 1961-05-05 1963-06-18 Industrial Automation Corp Automatic container fill-height inspection machine
US3107011A (en) * 1960-12-23 1963-10-15 Owens Illinois Glass Co Inspecting rims of containers

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Publication number Priority date Publication date Assignee Title
US2524929A (en) * 1946-02-21 1950-10-10 Wm S Scull Company Photoelectric method and apparatus for testing vacuum conditions in containers
US2548755A (en) * 1947-12-12 1951-04-10 Standard Electronics Res Corp Optical area measuring system
US2902151A (en) * 1955-09-21 1959-09-01 Brockway Glass Co Inc Automatic inspection apparatus for glass containers and the like
US3067872A (en) * 1958-09-15 1962-12-11 Anchor Hocking Glass Corp Method and means for inspecting containers
US3069553A (en) * 1959-05-12 1962-12-18 Continental Can Co Light source for photoelectric inspection of glassware
US2982862A (en) * 1959-12-31 1961-05-02 Aluminum Co Of America Bottle cap detector
US3089594A (en) * 1960-06-13 1963-05-14 Owens Illinois Glass Co Shape and height detection
US3107011A (en) * 1960-12-23 1963-10-15 Owens Illinois Glass Co Inspecting rims of containers
US3094214A (en) * 1961-05-05 1963-06-18 Industrial Automation Corp Automatic container fill-height inspection machine

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3492491A (en) * 1967-03-03 1970-01-27 Optomechanisms Inc Thickness monitor for coating silicon wafer
US3639067A (en) * 1970-06-29 1972-02-01 Emhart Corp Glassware inspection apparatus employing fiber-optic guides
US6104482A (en) * 1999-12-02 2000-08-15 Owens-Brockway Glass Container Inc. Container finish check detection
US8941825B2 (en) 2013-03-15 2015-01-27 Owens-Brockway Glass Container Inc. Container inspection

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