US3656229A - Process for producing magnetic head - Google Patents

Process for producing magnetic head Download PDF

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Publication number
US3656229A
US3656229A US874292A US3656229DA US3656229A US 3656229 A US3656229 A US 3656229A US 874292 A US874292 A US 874292A US 3656229D A US3656229D A US 3656229DA US 3656229 A US3656229 A US 3656229A
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United States
Prior art keywords
alkoxide
magnetic
head
ferrite
aluminum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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US874292A
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English (en)
Inventor
Yo Sakurai
Teizo Tamura
Norikazu Hashimoto
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Hitachi Ltd
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Hitachi Ltd
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Publication date
Priority claimed from JP1462169A external-priority patent/JPS4840401B1/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
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Publication of US3656229A publication Critical patent/US3656229A/en
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
    • G11B5/23—Gap features
    • G11B5/232—Manufacture of gap
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/187—Structure or manufacture of the surface of the head in physical contact with, or immediately adjacent to the recording medium; Pole pieces; Gap features
    • G11B5/23—Gap features
    • G11B5/235—Selection of material for gap filler
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S428/00—Stock material or miscellaneous articles
    • Y10S428/90—Magnetic feature
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00—Metal working
    • Y10T29/49—Method of mechanical manufacture
    • Y10T29/49002—Electrical device making
    • Y10T29/4902—Electromagnet, transformer or inductor
    • Y10T29/49021—Magnetic recording reproducing transducer [e.g., tape head, core, etc.]
    • Y10T29/49032—Fabricating head structure or component thereof
    • Y10T29/49055—Fabricating head structure or component thereof with bond/laminating preformed parts, at least two magnetic
    • Y10T29/49057—Using glass bonding material

Definitions

  • This invention relates to an improvement in a process for producing a magnetic head employed in magnetic recording devices, including memory devices for electronic computers and the like, and particularly to an improvement in the struc ture of the magnetic gap portion of such magnetic head.
  • the thickness of the head core of magnetic head and the width of the head gap thereof are critical factors for making the storage density higher.
  • a magnetic head employed in a video tape recorder is different from that employed in a disk file for computer, or the like.
  • the two are substan tially the same in geometrical structure at the head core and head gap portions, and it has recently been required that the head gap portion should be precisely restricted to a width of about 0.8-1 .Zu.
  • the head in connection with the questions to make the storage density higher and to make the speed of recordingreproduction higher, it is required that the head should be uniformly contacted with such a recording medium as magnetic tape or magnetic disk; that the head should be made greater in bonding strength to a spacer, which is inserted in the head gap portion of the head core to regulate the width of the head gap, so that the head core is increased in wear resistance and is prevented from breakage; and that the difference in hardness or thermal expansion coefficient between the two should be made smaller as far as possible.
  • the head gap portion of the above-mentioned head core is formed by inserting between two thin plates of magnetic substances a non-magnetic spacer having a thickness corresponding to the width of the gap and bonding them together by means of a suitable adhesive.
  • a foil of a non-magnetic substance such as titanium, Be-
  • Cu alloy or mica which has a thickness corresponding to a desired gap width, is inserted between two thin plates of magnetic substances, and the resulting composite is fused together by use of glass.
  • a glass foil having a thickness corresponding to a desired gap width is inserted between two thin plates of magnetic substances and the resulting composite is fused by heating to the softening temperature of the glass under a mechanically pressurized state.
  • a metal halide or the like of a non-magnetic substance is coated onto the surface of a thin plate of a magnetic sub stance; the coating is oxidized by heating to convert said coating to a non-magnetic oxide; and then another thin plate of a magnetic substance is adhered to the thus treated coating.
  • the conventional process (1) is not suitable for mass productron.
  • the thin magnetic plates tend to be distorted when mechanical pressure is applied to the composite. Further, the softening of the glass foil results in uneveness in thickness of the spacer. Moreover, the process has such drawbacks that in most cases, air bubbles are formed in the glass spacer which lower the bonding strength between the glass and the magnetic substances and induce the breakage of the gap to make the life of the head shorter.
  • the conventional process (3) necessarily brings about such drawbacks that the control in thickness of the spacer is difficult; and that due to the heat treatment and oxidation reaction in converting the halide to an oxide, even the thin plates of magnetic substances are subjected to chemical change or thermal stress to form cracks.
  • the present inventors made various studies to find a process for producing a new magnetic head which is based particularly on an improvement in procedures for forming the head gap portion of the magnetic head.
  • Another object is to provide a process for producing a mag netic head long in life.
  • a fundamental improvement in the: present process resides in the point that the spacer, which regulates the width of the head gap of magnetic head, is composed of a non-magnetic oxide film formed by applying a vapor of a metal alkoxide onto the surface of a magnetic substance and thermally decomposing said metal alkoxide.
  • FIG. 1 is a rough plane view of a magnetic head for video tape recorder.
  • FIG. 2 is a rough sketch of the head tip portion of the magnetic head.
  • FIG. 3 is a rough plane view of a magnetic head employed in a disk file for electronic computer.
  • FIG. 4 is a flow sheet showing the steps for producing the magnetic head according to the present invention.
  • FIG. 5 is a block diagram showing an example of a thermal decomposition apparatus for depositing a non-magnetic oxide onto a thin magnetic plate.
  • FIG. 6 is a curve showing the relationship between the heating temperature of aluminum isopropoxide and the growth rate of aluminum oxide on a thin magnetic plate.
  • FIG. 7 is a curve showing the relationship between the growth rate of a mixed aluminum-silicon oxide film obtained by thermally decomposing on a thin magnetic plate a mixed vapor of silicon tetraethoxide and aluminum triethoxide and the heating temperature of said aluminum triethoxide.
  • FIG. 8 is a curve showing the relationship between the thermal expansion coefficient and the composition of a film com posed of a mixture of aluminum oxide and silicon oxide.
  • the structure of a magnetic head for video tape recorder is as shown in FIG. 1. That is, the magnetic head of this kind is composed of a head tip 11, a coil 12 wound around said tip, a base plate 14 provided with lead terminals 13, 13' for said coil, and a head base for attaching the tip 11 and the base plate 14 to the main body of tape recorder (not shown).
  • the mark 16 shows a magnetic tape.
  • the detailed structure of the above-mentioned head tip 11 is as shown in FIG. 2. That is, the head tip comprises two plate-like semi-core bodies 21 and 22, and a spacer 25 is inserted between said two semi-core bodies to form a magnetic gap having a gap width 26.
  • the semi-core body 21 is provided on the interior and exterior sides with two V-shaped notches 23 and 24, and a coil 24 is wound around said notches. Further, the semi-core bodies 21 and 22 are cut to the form of an are at the end of the interfacial portion thereof so as to minimize the track width.
  • FIG. 3 shows a head of disk file.
  • This head is composed of a core 31, two coils 32 and 33 wound around said core, and a slider 34 for supporting said core.
  • the structure of the head gap portion of the core is entirely identical with that of the aforesaid head for video tape recorder.
  • such a magnetic head as mentioned above is produced according to, for example, such steps as shown in FIG. 4.
  • a material 41 of the head core there is chiefly used a single crystal or a hot-pressed sintered article of a ferrite of the Mn-Zn system or Ni-Zn system.
  • the material 41 is a single crystal ferrite
  • a definite crystal orientation is selected, and the material is cut to a wafer 42 in the form of a parallel flat plate.
  • the water is processed in a given axial direction into a strip 43 in the form of a rectangular parallelopiped.
  • the strip 43 is lapped on the surface 44, which is to be provided with a spacer to be inserted into a head gap portion, and the surface is polished to a plane degree of about 0.1;,t/ mm and a face coarseness of less than about 0. I ;L.
  • the thus obtained strip 43 is engraved on the interior and exterior sides thereof with V-shaped grooves 45 and 46 to form notches (refer to FIG. 2), through which a coil is wound around a core.
  • the strip 43 is heated in such a heating furnace as mentioned later in a neutral atmosphere, e.g. in a nitrogen or argon gas, to a temperature higher than the thermal decomposition temperature of the metal alkoxide employed, and the polished surface thereof is contacted with a vapor of the metal alkoxide to form on said surface a metal oxide film 47.
  • the above-mentioned strip 43 is further provided with a metal oxide film 47' and is then adhered to the strip 43 to obtain a composite, which is then thinly cut in the same manner as above to prepare a head tip 49.
  • the thus prepared head tip 48 or 49 is ground or cut in order to make the track width smaller, is wound with a coil and is then assembled to such a head as shown in FIG. 1 or 3.
  • FIG. 5 is a rough sketch of an apparatus employed for forming on the aforesaid strip a non-magnetic oxide film by the thermal decomposition of metal alkoxide.
  • This apparatus comprises a vessel 51 for a carrier gas of alkoxide vapor, a deoxidation trip 52 for the carrier gas, a dehydration trap 53, a
  • gas filter 54 a gas flow-controlling valve 55, a flowmeter 56, a
  • thermal decomposition furnace 50 a main pipe 57 connecting in series various means arranged from said vessel 51 to said thermal decomposition furnace 50, at least one branch flow path 58 which is branched from the main pipe 57 at a portion between the gas filter 54 and the thermal decomposition furnace 50 and is again connected to the main pipe, and a flowcontrolling valve 59, a flowmeter 60, a metal alkoxide trap 61 and a heater therefor 62 which are provided on said branch flow path 58.
  • the thermal decomposition furnace 50 is composed of a furnace vessel in the form of a temple bell, a support stand therefor 64, a sample-placing stand 65 inserted through a hole provided in said support stand 64 into the interior of the furnace vessel 63, a cylinder for supporting said sample-placing stand 65, a heater 67 attached to the lower part of said sample-placing stand 65, and a gas-discharging opening 68 provided in said support stand 64.
  • DIOXO which is a disoxidant produced by Baker & Co., Inc. U.S.A.
  • dehydration trap is used such a cooling trap as dry ice or the like.
  • an aluminum oxide film is formed on a single crystal ferrite strip according to such procedures as explained below.
  • a ferrite strip which has been polished as mentioned above on the surface to be provided with an oxide film, is horizontally placed with the polished surface up. Subsequently, the air in the apparatus is completely replaced with nitrogen introduced into the apparatus from the vessel 51. Thereafter, the valve 59 on the branch flow path 58 is closed, and nitrogen gas is flowed only through the main pipe.
  • the strip in the furnace 50 is heated by means of the heater 67 and is maintained at a definite temperature of 500 C.
  • the metal alkoxide trap 61 provided on the branch flow path 58 which trap has been previously charged with aluminum isopropoxide, is heated to l30 C by means of the heater 62.
  • the valve 59 of the branch flow path 58 is opened, and the gas flow rate in the branch flow path is maintained at l liter/min while that in the main pipe is maintained at 4 l/min.
  • the thickness growth rate of the aluminum oxide films is about 50 A./min. Accordingly, the thickness of an aluminum oxide film to be formed on the surface of the ferrite strip 69 can be precisely adjusted to a desired thickness by controlling the time of the thermal decomposition reaction.
  • FIG. 6 is a curve showing the relationship between the above-mentioned heating temperature of the aluminum isopropoxide and the growth rate of the aluminum oxide film formed on the strip. As is clear from FIG. 6, the growth rate of the aluminum oxide film can be accelerated by increasing the vapor pressure of the aluminum isopropoxide.
  • the growth rate of the oxide film can be increased, in general, when the heating temperature of the alkoxide is elevated. However, if the growth rate is excessively accelerated, the resulting oxide film is lowered in density to make it impossible to obtain an oxide film sufficiently high in hardness. In practicing the present process, therefore, the heating temperature of alkoxide is desirably within such a range that the resulting oxide film is not lowered in hardness.
  • the heating temperature of aluminum isopropoxide is C
  • the resulting aluminum oxide film is substantially the same in hardness as a stainless steel film.
  • the ferrite strip, on which the aluminum oxide film has been formed in the above manner, is processed into a head tip according to such steps as shown in FIG. 4.
  • the thermal expansion coefficient of the thus formed aluminum oxide film is 7-8 X I0' C and is close to that of the ferrite 9 X l0/ C. Accordingly, there are scarcely brought about the peeling of said aluminum oxide film and the like damages due to abrasion heat or the like applied to the head.
  • the present invention can be practiced by use of any metal alkoxides so far as they are volatile and can give non-magnetic oxides as thermal decomposition products thereof.
  • a titanium oxide film can be formed on a ferrite strip in the same manner as in the abovementioned embodiment by heating titanium isopropoxide to 60-29 C, using nitrogen gas as a carrier gas.
  • the thermal expansion coefficient of the thus obtained titanium oxide film is 8-9 X l0"/ C and is quite close to that of the ferrite.
  • Table 1 shows the boiling points and preferable heating temperatures of various metal alkoxides and the heating temperatures of ferrite cores.
  • the aforesaid apparatus is further provided with another branch flow path 58, alkoxide trap 61', heater therefor 62, flow-meter 60 and control valve 59' as shown by the broken line in FIG. 5.
  • the strip in the thermal decomposition furnace is maintained at about 500 C, and, for example, aluminum triethoxide is charged into one alkoxide trap 61 and is heated to about 160-180 C while silicon tetraethoxide is charged into the other alkoxide trap 61' and is heated to -30 C.
  • nitrogen gas is flowed through each of the main pipe, the branch flow path 58 and the branch flow path 58 at rates of 5 l/min, 3 l/min and 10 l/min, respectively, and the individual alkoxides are thermally decomposed to contact a mixed vapor of the two alkoxides with the ferrite strip, whereby a non-magnetic oxide film composed of aluminum oxide and silicon oxide can be formed on the ferrite strip.
  • the growth rate in thickness of the film is about 250 A./min.
  • FIG. 7 shows the variation in growth rate of the oxide film when, in the above-mentioned embodiment, the heating temperature of the silicon tetraethoxide is made 25 C and the heating temperature of the aluminum ethoxide is varied within the rage from 160 to 180 C.
  • the thus obtained film comprising the mixture of aluminum oxide and silicon oxide is higher in hardness and more chemically stable than a film of pure aluminum oxide or pure silicon oxide obtained in the same manner as above. Accordingly, when a spacer for head gap is constructed by such mixed oxide film as mentioned above, the head gap portion can be enhanced in wear resistance.
  • FIG. 8 is a curve showing the relationship between the thermal expansion coefficient and the composition of a mixed oxide film comprising aluminum oxide and silicon oxide.
  • the thermal expansion coefficient of pure silicon oxide is 6.7 X l0' C and considerably differs from that of the ferrite 90 X 10 C.
  • the thermal expansion coefficient of a mixed oxide film comprising said silicon oxide and an equimolar amount of aluminum oxide is about 40 X 10'/ C, and thus is considerably close to that of the ferrite.
  • various combinations of metal alkoxides may be used so far as they can form oxide films, which are non-magnetic, are high in hardness and mechanical strength and have a thermal expansion coefficient close to that of the ferrite.
  • a film of a mixture comprising substantially equal amounts of zirconium oxide and silicon oxide which has been formed according to the same process as in the above-mentioned embodiment by use of zirconium tetraethoxide and silicon tetraethoxide, has a thermal expansion coefficient of about 8-9 X l0"/ c, and is substantially the same in other mechanical and chemical properties as the aforesaid film of a mixture comprising aluminum oxide and silicon oxide.
  • a ferrite tip bearing thereon a film consisting of at least one kind of magnetic oxides formed in the above-mentioned manner is processed into a head tip according to such steps as shown in FIG. 4.
  • TAB LE 2 Combinations of alkoxides preferable for use in the present invention and preferable heating temperatures Hunting temperature of ferrite Combination and heating temperature of alkoxides strip, C,
  • AI(OC2II5)J 160 (1,); Si(OCzII5)4 (room temperature)" 400-500 Zr(0C li )4 0,); Sl(OCzlis)4 (room termpeaturo)... 500-600 i-Ti(0C ll1)4 (80 0,); 81(002115) (room temperature) 400-500 i-Al(0() lI1)3 0,); t-Ti(()C;l-I (80 0,) 400-500 l-Tl1(0C4Ilp)3 (80 SI(OC2H5)4 (room temperature) 500-600
  • adhesives such as glass, synthetic resins, etc. are used. However, synthetic resins swell undesirably due to organic substances, and therefore the use of glass is preferable.
  • the two ferrite strips 43 and 43' are contacted each other while interposing therebetween the non-magnetic oxide film 47, as shown in FIG. 4, and then fused glass is flowed into the gap between the two ferrite strips.
  • the magnetic head obtained by practicing the present invention in the above-mentioned manner bears the non-magnetic oxide film directly on the thoroughly polished surface of the ferrite. Further, as said film, there may be selected an oxide film which is close in thermal expansion coefficient to the ferrite. Accordingly, it is possible to form a spacer for head gap which is firmly bonded to the core body and is difficulty peeled off therefrom.
  • the thickness of the oxide film constituting the above-mentioned spacer can be controlled uniformly and precisely.
  • the variation in thickness of said film is about :t 0.02;.t.
  • the variation in gap width of the whole gap is i 0.1;tper 5 mm. According to the present invention, therefore, it is quite easy to obtain ahead core having a head gap of less than l;1..
  • An improvement in a process for producing a magnetic head by using a head tip having a magnetic gap regulated in width by means of a spacer composed of a non-magnetic oxide film which improvement comprises:
  • metal alkoxide is at least one member selected from the group consisting of alkoxides of metals of aluminum, silicon, titanium, zirconium and hafnium.
  • An improvement in a process for producing a magnetic head by using a head tip having a magnetic gap regulated in width by means of a spacer composed of a non-magnetic metal oxide film which improvement comprises:
  • a step in which the vapor of said vaporized alkoxide is conselected from the group consisting of vaporized alkoxides of metals of silicon, titanium, zirconium and hafnium.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Magnetic Heads (AREA)
US874292A 1968-11-08 1969-11-05 Process for producing magnetic head Expired - Lifetime US3656229A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8125668 1968-11-08
JP1462169A JPS4840401B1 (de) 1969-02-28 1969-02-28

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Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3836392A (en) * 1971-07-07 1974-09-17 Sandvik Ab Process for increasing the resistance to wear of the surface of hard metal cemented carbide parts subject to wear
US4182643A (en) * 1977-07-05 1980-01-08 Control Data Corporation Method of forming gaps in magnetic heads
EP0031432A2 (de) * 1979-12-26 1981-07-08 International Business Machines Corporation Zusammenbau von Magnetkopf und Halterung
EP0094708A1 (de) * 1982-05-19 1983-11-23 Koninklijke Philips Electronics N.V. Mit Hilfe von Glas verkitteter Magnetkopf und Verfahren zu dessen Herstellung
US4512862A (en) * 1983-08-08 1985-04-23 International Business Machines Corporation Method of making a thin film insulator
USRE32110E (en) * 1971-05-26 1986-04-15 General Electric Co. Aluminum oxide coated cemented carbide product
US4641213A (en) * 1983-07-16 1987-02-03 Alps Electric Co., Ltd. Magnetic head
US4695512A (en) * 1984-11-22 1987-09-22 Alps Electric Co., Ltd. Magnetic head for perpendicular magnetic recording
US4808463A (en) * 1983-12-27 1989-02-28 Kyocera Corporation Substrate for magnetic disks
US4808455A (en) * 1985-11-20 1989-02-28 Sumitomo Special Metals Co., Ltd. Magnetic recording disc and process for producing the same
US5350629A (en) * 1993-03-01 1994-09-27 Storage Technology Corporation Magnetoresistive device and barrier formation process

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2866011A (en) * 1954-07-13 1958-12-23 Clevite Corp Magnetic transducer head
US3098126A (en) * 1960-01-11 1963-07-16 Minnesota Mining & Mfg Magnetic transducer device
US3126615A (en) * 1957-08-28 1964-03-31 Method of manufacturing multiple
US3330694A (en) * 1961-10-12 1967-07-11 Motorola Inc Vapor deposition process
US3458926A (en) * 1965-10-08 1969-08-05 Ibm Method of forming a glass filled gap

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2866011A (en) * 1954-07-13 1958-12-23 Clevite Corp Magnetic transducer head
US3126615A (en) * 1957-08-28 1964-03-31 Method of manufacturing multiple
US3098126A (en) * 1960-01-11 1963-07-16 Minnesota Mining & Mfg Magnetic transducer device
US3330694A (en) * 1961-10-12 1967-07-11 Motorola Inc Vapor deposition process
US3458926A (en) * 1965-10-08 1969-08-05 Ibm Method of forming a glass filled gap

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE32110E (en) * 1971-05-26 1986-04-15 General Electric Co. Aluminum oxide coated cemented carbide product
US3836392A (en) * 1971-07-07 1974-09-17 Sandvik Ab Process for increasing the resistance to wear of the surface of hard metal cemented carbide parts subject to wear
US4182643A (en) * 1977-07-05 1980-01-08 Control Data Corporation Method of forming gaps in magnetic heads
EP0031432A3 (en) * 1979-12-26 1981-12-30 International Business Machines Corporation Magnetic head mount assembly
EP0031432A2 (de) * 1979-12-26 1981-07-08 International Business Machines Corporation Zusammenbau von Magnetkopf und Halterung
EP0094708A1 (de) * 1982-05-19 1983-11-23 Koninklijke Philips Electronics N.V. Mit Hilfe von Glas verkitteter Magnetkopf und Verfahren zu dessen Herstellung
US4641213A (en) * 1983-07-16 1987-02-03 Alps Electric Co., Ltd. Magnetic head
US4512862A (en) * 1983-08-08 1985-04-23 International Business Machines Corporation Method of making a thin film insulator
US4808463A (en) * 1983-12-27 1989-02-28 Kyocera Corporation Substrate for magnetic disks
US4695512A (en) * 1984-11-22 1987-09-22 Alps Electric Co., Ltd. Magnetic head for perpendicular magnetic recording
US4808455A (en) * 1985-11-20 1989-02-28 Sumitomo Special Metals Co., Ltd. Magnetic recording disc and process for producing the same
US5350629A (en) * 1993-03-01 1994-09-27 Storage Technology Corporation Magnetoresistive device and barrier formation process
US5505834A (en) * 1993-03-01 1996-04-09 Storage Technology Corporation Magnetoresistive device and barrier formation process

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Publication number Publication date
DE1956217A1 (de) 1970-05-21
NL148171B (nl) 1975-12-15
NL6916827A (de) 1970-05-12
DE1956217C3 (de) 1973-11-22
DE1956217B2 (de) 1973-04-26

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