US3336494A - X-ray tube with alloy target - Google Patents

X-ray tube with alloy target Download PDF

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Publication number
US3336494A
US3336494A US308503A US30850363A US3336494A US 3336494 A US3336494 A US 3336494A US 308503 A US308503 A US 308503A US 30850363 A US30850363 A US 30850363A US 3336494 A US3336494 A US 3336494A
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target
ray tube
ray
rays
characteristic
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Expired - Lifetime
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US308503A
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Nagashima Shinichi
Tuiki Morihiro
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Yawata Iron and Steel Co Ltd
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Yawata Iron and Steel Co Ltd
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes

Definitions

  • FIG.3 X-RAY TUBE WITH ALLOY TARGET Filed Sept. 12. 1963.
  • FIG. 1 A first figure.
  • This invention relates in general to an X-ray tube and more particularly to an X-ray with a target made of an alloy which can be used in X-ray diffraction analysis.
  • the conventional target in an X-ray tube used for the above-described analysis and measurement is made of pure metal but this type of X-ray tube requires very complicated procedures by the X-ray operator for analytical measurement using two or more kinds of characteristic X-ray radiations.
  • This invention seeks to provide an excellent solution to the problem of eliminating the difliculty arising from the operation of the X-ray tube, by replacing the conventional pure metal target with a new target composed of two or more metallic elements.
  • An object of the present invention is to provide an X- ray tube which assures successful analysis of metallurgical structure and the making of pole figure diagrams by applying characteristic X-rays by means of a common simple tube with extreme ease and at a high speed, without the necessity of following such troublesome procedures as changing tubes or readjustment of the relative position of the tube and the specimen to be tested.
  • FIGS. 1A and 1B are diagrams of an arrangement for an X-ray method of stress measurement using X-ray diffraction analysis
  • FIG. 3 is a representationof a pole figure diagram for mild steel.
  • FIG. 4 is a representation of a photographic back reflection pattern of pure iron taken with an X-ray tube in accordance with this invention.
  • a Geiger-Muller counter may be employed.
  • the combined use of a scintillation counter tube or applied to a specimen Namely, the continuous spectrum of X-rays is applied primarily to save photography in the Laue method using a single crystal, while characteristic X-rays are used for such various roent-genographies or measurements as the powder method or the rotating crystal method etc., applicable to analysis of the structure of a specimen.
  • the present invention is designed for easy and quick X-ray diffraction measurement, for which different characteristic X-rays are preferably applied for the diffraction analysis of the structure of a substance or the making of a pole figure diagram, by employing only a common single X-ray tube which contains a metallic alloy target composed of two or more metallic elements and from which two or more kinds of characteristic X-rays can be generated.
  • a common single X-ray tube which contains a metallic alloy target composed of two or more metallic elements and from which two or more kinds of characteristic X-rays can be generated.
  • the target of the conventional X-ray tube is made of a single pure metal.
  • metals usually used as the material of the conventional target are tungsten for continuous spectrum X-ray methods, and chromium, iron, cobalt, nickel, copper, and molybdenum for characteristic X-ray methods.
  • the characteristic X-ray of a certain wave length is applied, but it contains a continuous spectrum of X-rays and some other rays with undesired wave lengths. It is desirable to elimi nate such unwanted components by employing a suitable filter or crystal monochrometer, even when a pure metal target is used. For this reason, it is the usual practice to employ high purity metal for the target material of an X-ray tube.
  • the target made of such high purity metal, is sealed in an X-ray tube to which high tension is applied to cause generation of X-rays, which in turn are applied to the X-ray camera or X-ray diffractometer to be combined for photography or measurement.
  • X-ray tube to which high tension is applied to cause generation of X-rays, which in turn are applied to the X-ray camera or X-ray diffractometer to be combined for photography or measurement.
  • most of the measurements can be successfully performed by applying a single characteristic X-ray, but some of them should preferably be conducted twice for each specimen with two different characteristic X-rays for a particular type of measurement.
  • residual stress in plane 211 is measured by applying thereto a characteristic X-ray generated from the chromium target (Cr-Km), and then similar stress in another plane 310 is measured at the same position of the same specimen by applying another characteristic radiation, generated from another-target of cobalt (CO-Ker).
  • Cr-Km chromium target
  • CO-Ker another characteristic radiation
  • FIG. 1 which is a diagram of an arrangement which is the same as that which can be used according .to this invention, an X-ray tube is positioned to beam X-rays on and a counter 4 are provided in the positions shown.
  • the specimen 2 is placed in a position normal to a direction (represented by solid line) corresponding to the direction of incidence of X-rays directed therein for taking a roentgenogram on the film 3 on which a circular diffraction pattern is formed by X-rays, diffracted in the direction indicated by the arrow. Then, the specimen is inclined to an angle of 45 relative to the direction of incidence of the X-rays, as illustrated by the broken lines, to form a similar image on the film, thus enabling the tester to calculate stress on a certain crystal plane from the angular positions of a pair of diffraction lines for two different positions of the specimen, i.e.
  • the X-ray tube is replaced by another tube with the target of different metal, and the position of the camera is readjusted accordingly to obtain two additional roentgenograms at the same two different positions of the specimen, 90 and 45 relative to the line of incidence of the X- rays, to find the stress in a second crystal plane, which is deemed to be the residual stress.
  • the method described above can also be followed in the same manner for another measurement with a Geiger counter tube as illustrated in FIG. 1B, in which the Geiger counter is moved an angle of 20 from 158 to 164, and the angle of the diffraction lines, 20, are measured.
  • Stress in the plane 310 is determined using a cobalt target from two different values of diffraction angle 20,, as determined from two consecutive measurements, conducted at two different angular positions of the specimen, 90 and 45, and another value of stress in the plane 211 is obtained by applying another characteristic X-ray, generated by a chromium target, substituted for the former X-r-ay tube with a cobalt target.
  • the method of stress measurement involving two consecutive X-ray applications requires highly complicated procedures, because two different characteristic X-rays must be applied to the same specimen, in addition to the required change of the target and readjustment of relative position of the camera and the X-ray apparatus for every change of the target.
  • the present invention has as a primary object removal of the described drawback of the troublesome operation necessary in conventional practice, and assures successful consecutive measurements, described hereinafter, with a common single X-ray tube in a very short time and without reduction in the accuracy of the result obtained.
  • the combination of metallic elements for the target may vary according to the object of the particular measurement; for example, for measurement of residual stress of iron and steel, a Cr-Co alloy target is employed, and for X-ray pole figure measurement, an Ag-Fe or Mo- Fe target is used.
  • the alloy target can have more than two elements according to this invention. For example, for an X-ray tube with a target made of more than two metallic elements, different characteristic X- rays, corresponding to all individual metallic elements, can be irradiated at one time, and can be selectively applied to the specimen to be inspected by joint use of a scintillation counter or a proportional counter and a pulse height analyzer.
  • FIG. 2 is a longitudinal cross-sectional view of the X-ray tube comprised of a sealing glass tube 5, an X-ray beam aperture 6, heater leads 7 extending through the glass tube 5, a target 8 on an anode 9, which in turn is on an anode base 10 having an inlet and outlet 11 for anode cooling water, and a shield 12 over the heater and target.
  • the space 12 inside the X-ray tube, is kept under a vacuum.
  • FIG. 4 shows a roentgenogram on the same film on which are represented diffractions at two different crystal planes 310 and 211 of pure iron, caused by the application of X-rays generated by an X-ray tube wherein an alloy target made of Cr-Co elements (ratio of the mixture 1:1) is employed.
  • the outer pair of dark and light diffraction rings and the inner pair of such rings represent the double rings 211 and 310 caused by chromium K04 and Ka characteristic X-rays and by cobalt- Koz and Ka characteristic X-rays respectively.
  • an alloy target of Mo-Fe and Co-Fe, etc. of the two-element type can be used, and for a three-element type target, a combination of Co-Cu-Fe is recommended as an embodiment of this invention.
  • a sealed reflection type X-ray tube fixed at a second position in said system for emitting a beam of X-rays in a fixed direction toward said one position, said X-ray tube having a target of an alloy taken from the group consisting of Mo-Fe, Cr-Co, Fe-Ag and Co-Cu-Fe.

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  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
US308503A 1962-09-15 1963-09-12 X-ray tube with alloy target Expired - Lifetime US3336494A (en)

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GB (1) GB1063386A (es)
NL (1) NL297881A (es)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3743841A (en) * 1971-05-25 1973-07-03 Du Pont Method of dual wavelength x-ray analysis
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer
US3944823A (en) * 1970-03-16 1976-03-16 Nippon Hoso Kyokai X-Ray topograph reproducing apparatus
EP0127229A1 (en) * 1983-05-25 1984-12-05 Koninklijke Philips Electronics N.V. X-ray tube for generating soft X-rays
WO1992020090A1 (de) * 1991-04-30 1992-11-12 Jules Hendrix Röntgenröhre
EP0767967A1 (en) * 1995-04-28 1997-04-16 Varian Associates, Inc. High output stationary x-ray target with flexible support structure
US20060239408A1 (en) * 2005-04-21 2006-10-26 Bruker Axs Inc. Multiple-position x-ray tube for diffractometer
DE102010043028A1 (de) * 2010-10-27 2012-05-03 Bruker Axs Gmbh Verfahren und Vorrichtung zur röntgendiffraktometrischen Analyse bei unterschiedlichen Wellenlängen ohne Wechsel der Röntgenquelle
CN103474317A (zh) * 2013-09-25 2013-12-25 四川艺精科技集团有限公司 一种发出多种金属特征x射线的x射线管

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4000433A (en) * 1973-11-19 1976-12-28 Siemens Aktiengesellschaft X-ray tube for microstructure analysis
NL8301839A (nl) * 1983-05-25 1984-12-17 Philips Nv Roentgenbuis met twee opvolgende lagen anodemateriaal.

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2168780A (en) * 1930-12-06 1939-08-08 Dimitry E Oishevsky X-ray tube
US2298335A (en) * 1940-09-10 1942-10-13 Gen Electric X Ray Corp Multiple target anode
US3136907A (en) * 1961-01-05 1964-06-09 Plansee Metallwerk Anticathodes for X-ray tubes

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE472661C (de) * 1920-12-21 1929-03-04 Westinghouse Lamp Co Verfahren zur Herstellung von Antikathoden
DE392703C (de) * 1922-05-03 1924-03-24 Ludwig Ascher Dr Verfahren zur Untersuchung von Stoffen aller Art mittels Roentgenstrahlen
FR615280A (fr) * 1925-09-14 1927-01-04 Philips Nv Anticathode pour des tubes à rayons chi
DE581227C (de) * 1931-05-23 1933-07-24 C H F Mueller Akt Ges Anode fuer Hochvakuumentladungsgefaesse, insbesondere fuer Roentgenroehren
DE719317C (de) * 1941-01-06 1942-04-04 Skoda Kp Einrichtung zur sekundaeren Roentgenanalyse von Werkstoffen
GB574109A (en) * 1943-01-11 1945-12-20 British Thomson Houston Co Ltd Improvements in and relating to anode structures for electronic apparatus
GB858416A (en) * 1956-07-16 1961-01-11 Raymond Edward Victor Ely Improvements in x-ray tubes
NL256491A (es) * 1959-10-12

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2168780A (en) * 1930-12-06 1939-08-08 Dimitry E Oishevsky X-ray tube
US2298335A (en) * 1940-09-10 1942-10-13 Gen Electric X Ray Corp Multiple target anode
US3136907A (en) * 1961-01-05 1964-06-09 Plansee Metallwerk Anticathodes for X-ray tubes

Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3944823A (en) * 1970-03-16 1976-03-16 Nippon Hoso Kyokai X-Ray topograph reproducing apparatus
US3743841A (en) * 1971-05-25 1973-07-03 Du Pont Method of dual wavelength x-ray analysis
US3920984A (en) * 1974-04-08 1975-11-18 Machlett Lab Inc X-ray energy analyzer
EP0127229A1 (en) * 1983-05-25 1984-12-05 Koninklijke Philips Electronics N.V. X-ray tube for generating soft X-rays
WO1992020090A1 (de) * 1991-04-30 1992-11-12 Jules Hendrix Röntgenröhre
EP0767967A4 (en) * 1995-04-28 1997-10-01 Varian Associates HIGH FLOW STATIONARY X-RAY TARGET WITH FLEXIBLE SUPPORT STRUCTURE
EP0767967A1 (en) * 1995-04-28 1997-04-16 Varian Associates, Inc. High output stationary x-ray target with flexible support structure
US20060239408A1 (en) * 2005-04-21 2006-10-26 Bruker Axs Inc. Multiple-position x-ray tube for diffractometer
US7248672B2 (en) * 2005-04-21 2007-07-24 Bruker Axs, Inc. Multiple-position x-ray tube for diffractometer
DE102010043028A1 (de) * 2010-10-27 2012-05-03 Bruker Axs Gmbh Verfahren und Vorrichtung zur röntgendiffraktometrischen Analyse bei unterschiedlichen Wellenlängen ohne Wechsel der Röntgenquelle
DE102010043028B4 (de) * 2010-10-27 2012-07-19 Bruker Axs Gmbh Verfahren und Vorrichtung zur röntgendiffraktometrischen Analyse bei unterschiedlichen Wellenlängen ohne Wechsel der Röntgenquelle
US8867704B2 (en) 2010-10-27 2014-10-21 Bruker Axs Gmbh Method for X-ray diffractometry analysis at differing wavelengths without exchanging the X-ray source
CN103474317A (zh) * 2013-09-25 2013-12-25 四川艺精科技集团有限公司 一种发出多种金属特征x射线的x射线管

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NL297881A (es)
DE1248174B (de) 1967-08-24
GB1063386A (en) 1967-03-30

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