US20190204590A1 - Instrument for moving and positioning of optical elements with nanometric mechanical stability and resolution in synchroton light source beamlines - Google Patents

Instrument for moving and positioning of optical elements with nanometric mechanical stability and resolution in synchroton light source beamlines Download PDF

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Publication number
US20190204590A1
US20190204590A1 US16/331,925 US201716331925A US2019204590A1 US 20190204590 A1 US20190204590 A1 US 20190204590A1 US 201716331925 A US201716331925 A US 201716331925A US 2019204590 A1 US2019204590 A1 US 2019204590A1
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Prior art keywords
instrument
mounting structure
complementary
relation
axis
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Abandoned
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US16/331,925
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Inventor
Renan Ramalho Geraldes
Ricardo MALAGODI CALIARI
Marlon SAVERI SILVA
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Centro Nacional de Pesquisa em Energia e Materiais CNPEM
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Centro Nacional de Pesquisa em Energia e Materiais CNPEM
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Priority claimed from BR102016020900A external-priority patent/BR102016020900A2/pt
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Priority claimed from BR102017019178-8A external-priority patent/BR102017019178B1/pt
Publication of US20190204590A1 publication Critical patent/US20190204590A1/en
Assigned to CENTRO NACIONAL DE PESQUISA EM ENERGIA E MATERIAIS reassignment CENTRO NACIONAL DE PESQUISA EM ENERGIA E MATERIAIS ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: MALAGODI CALIARI, Ricardo, RAMALHO GERALDES, Renan, SAVERI SILVA, Marlon
Abandoned legal-status Critical Current

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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/003—Alignment of optical elements
    • G02B7/005—Motorised alignment
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details
    • H—ELECTRICITY
    • H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02K—DYNAMO-ELECTRIC MACHINES
    • H02K41/00—Propulsion systems in which a rigid body is moved along a path due to dynamo-electric interaction between the body and a magnetic field travelling along the path
    • H02K41/02—Linear motors; Sectional motors
    • H02K41/035—DC motors; Unipolar motors
    • H02K41/0352—Unipolar motors
    • H02K41/0354—Lorentz force motors, e.g. voice coil motors

Definitions

  • the disclosure is related to a novel instrument for moving and positioning of optical elements with nanometric mechanical stability and resolution in synchrotron light source beamlines comprised of:
  • a mounting structure in which one (or more) optical element(s) is mounted, and is movable in relation to the reference structure;
  • balance mass that is movable in relation to the reference structure, and undergoes the reaction force from the moving means of the mounting structure
  • An optical element of a synchrotron light source beamline which may be a mirror, a diffraction crystal, a diffraction grating, a compound refractive lens (CRL), a Fresnell Zone Plate (FZP), etc.
  • a monochromator is an optical instrument that selects a narrow band of wavelengths (or energy) of light, or other radiation, from a broader range of wavelengths in the input of the instrument entry. It is important to note that it is generally possible to vary this band selection by means of distinct alignments of movements of the monochromator element, and accordingly, the delivery of the wavelength of interest by the instrument.
  • An instrument capable of delivering monochromatic (or quasi-monochromatic, considering the existence of a band) light has many uses in scientific studies and in optics, since the materials properties may depend on or be investigated through their different interactions with different wavelengths. Although there are many ways to select a narrow band of wavelengths (that would be perceived on the visible range as a pure color), these forms are limited due to the range of radiation energy.
  • monochromators may resort to both the dispersion phenomenon, as in a prism, and the diffraction phenomenon, from a diffraction grating or a material with crystalline structure, to spatially separate the wavelengths or to ensure specific conditions of constructive interference for the radiation.
  • output slots are typically integral parts of the monochromator.
  • synchrotrons The laboratories of synchrotron light, hereinafter only referred to as synchrotrons, are research facilities where broad range and high brightness electromagnetic radiation is generated from a storage ring.
  • high-energy electrons in relativistic conditions are capable of controllably emitting photons, the so-called synchrotron radiation, from interactions with powerful magnetic fields of bending magnets or insertion devices (undulators and wigglers).
  • FELs free electron lasers
  • synchrotrons Some of the research fields on synchrotrons include: condensed matter physics, materials science, chemistry, biology, and medicine. As such, the experiments might cover applications that explore from subnanometric regions, within a cell, for instance, to samples of many centimeters in size, as in analysis of medical or veterinarian images. Thus, in addition to research aims, synchrotrons are also used for industrial applications, such as the micro-fabrication of devices.
  • new generation synchrotron light sources started their operations. These new generation synchrotrons are characterized for very high brightness, or more specifically, for an ultra-low emittance, wherein the light source diffraction limit may be achieved by photons below a determined energy level. Therefore, this very low emittance is related to a very small light source (in the order of few micrometers for X rays, for example), and with very low divergence. For this new characteristic to be possible and useful, extreme levels of stability are required for both the accelerator and the experimental stations, the so-called beamlines.
  • Double-crystal monochromators are a kind of instrument commonly utilized in X rays beamlines for energies from few keV.
  • the principle underlying these instruments is that a given condition of Bragg's diffraction may be obtained in two subsequent crystals, in order to select a narrow band of energy from the input (incident) beam, that has a broad range of energy, and to allow for the monochromatic beam leaving the instrument to be held in a constant position, regardless the variation of the Bragg's angle for different energies.
  • the schematic diagram is shown in the FIG. 1 .
  • the Bragg's diffraction is a geometric phenomenon, since the condition of constructive interference for the selected radiation is dependent of the angle (named, for this reason, to as Bragg's angle) between the incident beam and the crystalline planes of the crystal. Accordingly, the determination of the energy for an experiment is related to the choice of the Bragg's angle on the monochromator, that is, the rotation of the crystals in relation to the incident beam.
  • the advantages of the DCMs in relation to other types of X ray monochromators is to allow the separation (offset) between the incident and monochromatic beams to be kept constant, through the variation of the separation (gap) distance between the crystals as a function of the Bragg's angle.
  • a basic DCM has, in addition to the main free degree of freedom for the Bragg's angle, three relative free degrees of freedom between the crystals: gap, pitch and roll, which may be combined in a single crystal or distributed according to any desired combination.
  • the mechanisms responsible for these degrees of freedom should present not only sufficiently fine moving resolution, but also suitable mechanical stability, to avoid undesirable dynamic effects, which may cause errors on the energy selection, reduction of the photon flow and/or shifts in the direction of propagation of the monochromatic beam in relation to the incident beam.
  • the mechanisms of these degrees of freedom typically utilize high-resolution mechanical actuators, such as piezoelectric actuators and micro motors. Once integrated to feedback signals, these mechanisms may compensate misalignments resulting from limitations of mounting, heat and/or gravitational effects, and parasitic movements on the gap mechanism.
  • FIG. 3 illustrates these three adjustment movements (y′, Rx′ and Rz′) of the second crystal in relation to the first, highlighting the possible use of local or outer feedback signals, from position or beam sensors, respectively.
  • DCMs are limited in terms of stability of the relative parallelism between the crystals, that is, in the pitch and roll.
  • the best equipment have difficulties in dealing with angular variations higher than 100 nrad RMS (analyzed in a frequency band up to 2.5 kHz).
  • Few vertical DCMs have already demonstrated a performance of approximately 50 nrad RMS under special conditions, that is, with the moving mechanisms being completely stopped. It is important to emphasize that DCMs of horizontal offset, that is, with vertical rotation axis, are less impacted by gravitational effects, and can present slightly better results, typically by a factor of 2.
  • the existing technology is based on mechanical projects focusing on upmost stiffness, while, contradictorily, the relative degrees of freedom are typically obtained from the stacking of individual movement mechanisms for gap, pitch and roll.
  • This approach is limited by the finite stiffness of the middle parts and of the mechanical connections, which quickly deteriorates the mounting effective stiffness.
  • the levels of stability required are so low that these adjustment mechanisms need to offer a high capability to reject disturbances (noises). These disturbances are caused by vibrations from the ground, sources of neighboring vibrations such as vacuum pumps, and DCM internal vibration sources, such as cooling systems, motors and actuators, and bearings.
  • the disclosure provides a synchrotron light source beamline instrument that meets the high demands of the new generation of synchrotron light sources.
  • the instrument proposed in this disclosure is characterized for:
  • a positioning means which measures the position of the mounting structure directly relative to the reference structure for greater accuracy
  • a main loop feedback control including the positioning means and the moving means, wherein the interferometer information is used to control the position of the mounting structure relative to the base by means of the moving means.
  • the active feedback can be improved (broader control band, typically above 100 Hz) with the disclosure of this instrument due to the use of the balance mass and a suitable dynamic architecture.
  • the balance mass acts as a low-pass filter in the path of the reaction forces, such that only the direct path dynamics of the forces in the mounting structure limits the possible bandwidth.
  • the suitable dynamics depends on low (or close to zero) stiffness between the mounting structure and balance mass, therefore, the actuation means should be a low-stiffness actuator (inherently complacent actuator).
  • critical degrees of freedom are controlled by means of feedback loop of the sufficiently high main loop bandwidth, allowing for high disturbance rejection and high reference tracking capability.
  • a further embodiment of the instrument according to the disclosure is characterized for comprising a complementary structure attached in a movable manner to the reference structure, and a complementary moving means of this complementary structure in relation to the reference structure, both the mounting structure and the balance mass being attached in a movable manner to this complementary structure, rather than to the reference structure.
  • the maximum offset of the complementary structure in relation to the reference structure is greater than the maximum offsets of the mounting structure and the balance mass in relation to the complementary structure, thus allowing for, due to that combination of levels, broader range of movement of the mounting structure in relation to the reference structure.
  • the mounting structure is attached to the complementary structure by a first spring means
  • the balance mass in turn, is attached to the complementary structure by a second spring means
  • the complementary structure is attached to the main structure by means of a third spring means.
  • These spring means are still preferably a leaf spring, or a combination of leaf springs, to give movement capabilities of interest with suitable dynamics.
  • An embodiment of the instrument according to the disclosure is characterized for having the main rotative structure around an axis perpendicular to the incident beam, and having the complementary structure movable in relation to the reference structure in only one translation, in the plane of the photon beams and perpendicular to the rotation axis of the main structure, such that the third set of leaf springs is little rigid in the direction of offset, but rigid in the other directions perpendicular to the direction of offset, as well as rigid to rotations.
  • the mounting structure is preferably movable in relation to the complementary structure in only one translation, in parallel with the moving direction of the complementary structure in relation to the reference structure, but also in two rotations, around the axes perpendicular to the axis de translation, such that the second set of leaf springs is little rigid in the direction of translation, and in the two perpendicular rotations, but rigid in the two directions perpendicular to the direction of offset, as well as rigid in the rotation around this.
  • the balance mass is preferably movable in relation to the complementary structure in only one translation, in parallel with the moving direction of the complementary structure in relation to the reference structure, but also in the two rotations, around the axes perpendicular to the axis of translation, such that the third set of leaf springs is little rigid in the direction of translation, and in the two perpendicular rotations, but rigid in the two directions perpendicular to the direction of offset, as well as rigid in the rotation around this.
  • the moving means between the mounting structure and balance mass is preferably performed by three Lorentz type actuators (voice-coils), capable of acting on three low-stiffness degrees of freedom of the mounting structure and of the balance mass.
  • an embodiment of the instrument is characterized for having the complementary mounting structure rigidly attached to the reference structure, and to which is mounted a complementary optical element.
  • the measurement means comprises three (or more) position sensors, such as interferometers, metering in the three degrees of freedom of interest the position of the mounting structure directly related to the complementary mounting structure, so as to increase the measure accuracy between the optical elements.
  • the instrument according to the disclosure and the above detailed description is especially advantageous in the embodiment of a double-crystal monochromator (DCM), wherein the optical elements are crystals, fixed to the mounting structure and to the complementary mounting structure. Moreover, it is desirable to utilize more than one pair of crystals, with different crystalline orientations in the same instrument. Thus, it is perfectly possible that more than one crystal is rigidly mounted on the mounting structure, whereas their complementary pairs are rigidly mounted on the complementary mounting structure.
  • the embodiment of the instrument according to the disclosure as a DCM with control of main feedback loop with high bandwidth is capable of satisfying the demands of stability of new generation of synchrotron light source mounted DCMs (as described in the section Backgrounds).
  • FIG. 1 illustrates the situation in which given condition of Bragg diffraction occurs in two subsequent crystals, filtering an incident beam of wide range, and delivering a monochromatic beam;
  • FIG. 2 illustrates the principle of a DCM, in which the separation (gap) between the two crystals changes due to the rotation angle (Bragg's angle), to keep the position of the constant monochromatic beam;
  • FIG. 3 shows a scheme with a possible configuration to three basic relative-adjustment movements between two crystals of a DCM and signals of local or outer feedback, from the position or beam sensors, respectively, an important difference in the manner of local feedback being highlighted between Figures (a) and (b).
  • FIG. 4 shows possible embodiments of the instrument, according to the disclosure
  • FIG. 1 illustrates the situation in which given condition of Bragg diffraction occurs in two subsequent crystals, filtering an incident beam of wide range, and delivering a monochromatic beam. It is also indicated a base coordinate system (xyz) and the one coordinate system rotationed (xy′z′) around Bragg's angle (Rx), shown in the example on the x-axis.
  • FIG. 2 illustrates the principle of a DCM, in which the separation (gap) between the two crystals varies as function of the rotation angle (Bragg's angle), to keep the position of the constant monochromatic beam, in relation to the incident beam with a fixed separation (offset). It is possible to see, for a given Bragg's angle ⁇ 1 , less than the other arbitrary Bragg's angle ⁇ 2 , the correspondent gap (gap 1 ) is smaller than the gap (gap 2 ) corresponding to ⁇ 2 .
  • FIG. 3 shows two crystals of a DCM in a given Bragg's angle, with the essential relative adjustments between the first and second crystals, namely: gap (y′), pitch (Rx′), and roll (Rz′) (in which the indication ′ concerns the rotational coordinate system, according to Bragg's angle).
  • FIG. 3( a ) shows signals of feedback typically utilized, namely: local feedback, typically performed with the moving mechanism of the crystal and metering the position of the crystal in relation to its support; and external feedback, utilizing the signal of a beam sensor downstream the DCM for actuation on the adjustment mechanisms of the crystal.
  • local feedback typically performed with the moving mechanism of the crystal and metering the position of the crystal in relation to its support
  • external feedback utilizing the signal of a beam sensor downstream the DCM for actuation on the adjustment mechanisms of the crystal.
  • FIG. 3 shows two crystals of a DCM in a given Bragg's angle, with the essential relative adjustments between the first and second crystals, namely: gap (y′
  • 3( b ) also presents both local and outer feedback signals, but emphasizes that, according to the present disclosure, the position metering in the local feedback should be made between the crystals, or between their mounting structures, not in relation to a support of one of the crystals, which brings no direct information related to the position and stability of the complementary crystal.
  • the speed of the feedback system should also be high, that is, around 10 kHz. As these speeds are not typically available on beam sensors, the interferometer related to the reference structure was put as mandatory. However, if the signal of a beam sensor exhibits the needed accuracy and speed characteristics, this signal could replace the local interferometer of the instrument.
  • FIG. 4 shows possible embodiments of the instrument, according to the present disclosure.
  • FIG. 4( a ) shows an essential embodiment of a beamline instrument, according to the present disclosure, in which the optical element ( 3 ) is rigidly mounted to the reference structure ( 2 ), which position in relation to the reference structure ( 1 ) is measured by means of the interferometer ( 6 ).
  • the movement of the mounting structure ( 2 ) occurs through the moving means ( 4 ) due to the position measurement of the interferometer ( 6 ), both integrated to the system of main feedback loop of the instrument.
  • the moving means forces ( 4 ) needed to moving the mounting structure ( 2 ), react in a balance mass ( 5 ), acting as a dynamic filter and allows for the bandwidth of the feedback system to be only limited by the inner dynamics of the mounting structure ( 2 ), and of the optical element ( 3 ), and not by the dynamics (resonances) of the other components of the instrument, as it is the case of the already existing instruments.
  • Both mounting structure ( 2 ) and balance mass ( 5 ) attachment to the reference structure are preferably made by spring means (l 1 and l 2 ), which are able to ensure suitable stiffness properties, that is, to define free and restrict degrees of freedom, according to the movements of interest of the optical element in relation to the photon beam, as well as eliminate non-linearities resulting from mechanical guides with friction.
  • FIG. 4( b ) differs from the FIG. 4( a ) only due to the inclusion of a complementary structure between the reference structure ( 1 ) and the assembly formed by the mounting structure ( 2 ) and the balance mass ( 5 ), aiming at increasing the amplitude of movement between the mounting structure ( 2 ) and the reference structure ( 1 ), since the spring means necessarily present limited amplitude of movement.
  • Systems of two (or more) levels are, in fact, common in equipment from several areas demanding great dynamic range, that is, many orders of magnitude between the resolution (and/or accuracy) and the range of a given movement.
  • FIG. 4( c ) schematically shows the embodiment of the instrument, according to the present disclosure, constituted as a DCM, for which were added to the reference structure ( 1 ): a complementary mounting structure ( 9 ), and a complementary optical element ( 10 ).
  • the photon beam propagates through the z-axis, coplanarly to the rotation axis of the reference structure ( 1 ) (x-axis), hitting the first crystal of the DCM, the complementary optical element ( 10 ).
  • the first crystal ( 10 ) is rigidly fixed to the complementary mounting structure ( 9 ), which is rigidly fixed to the main structure ( 1 ), that is, there are no relative free degrees of freedom for the adjustment between the crystal ( 10 ) and the main structure ( 1 ).
  • the complementary structure ( 7 ) is attached to the main structure ( 1 ) through 5 (or 6 ) folded leaf springs (l 3 ), giving a single relative free degree of freedom of translation between these structures, whose function is to allow for the adjustment of the gap at a first level.
  • the actuation means ( 8 ) of the complementary structure ( 7 ) may be performed in different manners, as for example via the stepper, servomotor or linear motor, among others.
  • both the mounting structure ( 2 ) to which the second crystal, the optical element ( 3 ), is rigidly fixed, and the balance mass ( 5 ) are attached to the complementary structure ( 7 ) by means of a set of 3 folded leaf springs (l 1 and l 2 ), giving three relative degrees of freedom between them and the complementary structure ( 7 ), namely: gap (second level), pitch and roll.
  • the folded leaf springs by adequately projecting the folded leaf springs, they can be combined to embody mechanical guides only with desired free degrees of freedom, by suppressing the movement of the elements in the non-controllable degrees of freedom due to the characteristics of high stiffness.
  • the moving means ( 4 ) is performed as three Lorentz type actuators (voice coils), which have their forces actuating between the mounting structure ( 2 ) and balance mass ( 5 ), providing an “inner” dynamics of forces to adjust the accuracy of the gap and to control the parallelism between the crystals, avoiding that these forces are propagated as disturbances for ( 1 ), ( 7 ), ( 9 ), and ( 10 ).
  • Lorentz type actuators voice coils
  • the feedback is provided by the interferometer ( 6 ), performed with 3 (or 4) interferometric distance sensors, that can be combined to measure the distance and two angles of interest between the metrological references of the two crystals, that is, the mounting structure ( 2 ) and complementary mounting structure ( 9 ).
  • the interferometric distance sensors contemplate: the characteristics of great dynamic range, being capable of metering with resolution and nanometric accuracy over tens of millimeters; and high speeds of measurement, allowing for the high stability and high dynamic performance required in the new generation synchrotron light source beamline mounted DCMs.
  • the instrument of the present disclosure can be an instrument to position mirrors, FZPs, CRLs, steps of manipulation of samples, slots, detectors, or any other system of high-mechanical-performance beamlines, wherein the quick and accurate positioning and/or high stability are needed.

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Mounting And Adjusting Of Optical Elements (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
  • Particle Accelerators (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
US16/331,925 2016-09-09 2017-09-06 Instrument for moving and positioning of optical elements with nanometric mechanical stability and resolution in synchroton light source beamlines Abandoned US20190204590A1 (en)

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BR102016020900-5 2016-09-09
BR102016020900A BR102016020900A2 (pt) 2016-09-09 2016-09-09 método de controle de grau de liberdade em sistemas mecatrônicos e monocromador de duplo cristal
BR102017019178-8A BR102017019178B1 (pt) 2017-09-06 2017-09-06 Instrumento para movimentação e posicionamento de elementos ópticos com resolução e estabilidade mecânica nanométricas em linhas de luz
PCT/BR2017/050262 WO2018045441A1 (pt) 2016-09-09 2017-09-06 Instrumento para movimentação e posicionamento de elementos ópticos com resolução e estabilidade mecânica nanométricas em linhas de luz
BR102017019178-8 2017-09-06

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WO2024105657A1 (en) * 2022-11-18 2024-05-23 Orbotech Ltd. Vertical motion axis for imaging optical head

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JP2590418B2 (ja) * 1992-06-25 1997-03-12 工業技術院長 ブタン液送システム
US5283682A (en) * 1992-10-06 1994-02-01 Ball Corporation Reactionless scanning and positioning system
EP1321822A1 (en) * 2001-12-21 2003-06-25 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
US7126671B2 (en) 2003-04-04 2006-10-24 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8358039B2 (en) * 2008-10-17 2013-01-22 Massachusetts Institute Of Technology High-scan rate positioner for scanned probe microscopy
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