US20170205277A1 - Uneven brightness measuring apparatus - Google Patents

Uneven brightness measuring apparatus Download PDF

Info

Publication number
US20170205277A1
US20170205277A1 US15/397,796 US201715397796A US2017205277A1 US 20170205277 A1 US20170205277 A1 US 20170205277A1 US 201715397796 A US201715397796 A US 201715397796A US 2017205277 A1 US2017205277 A1 US 2017205277A1
Authority
US
United States
Prior art keywords
measuring device
brightness measuring
brightness
measurement data
display area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US15/397,796
Other languages
English (en)
Inventor
Hideyo Ohtsuki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Assigned to MITSUBISHI ELECTRIC CORPORATION reassignment MITSUBISHI ELECTRIC CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: OHTSUKI, HIDEYO
Publication of US20170205277A1 publication Critical patent/US20170205277A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/04—Optical or mechanical part supplementary adjustable parts
    • G01J1/0403—Mechanical elements; Supports for optical elements; Scanning arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/0266—Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247—Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources

Definitions

  • the present invention relates to an uneven brightness measuring apparatus that measures the brightness distribution in a display area of a display.
  • Displays such as liquid crystal displays find applications in various technical fields including notebook computers, televisions, and mobile phones.
  • the distribution (unevenness) in the lightness (brightness) or color (chromaticity) in a display surface is an issue, leading to demands for apparatuses that measure uneven brightness or uneven chromaticity with high definition.
  • Measurement equipment manufacturers have developed measurement apparatuses as the measurement apparatuses for quantitatively evaluating uneven brightness or uneven chromaticity.
  • the 2D color analyzer for luminance measurement (CA-2000 front Konica Minolta. Inc., see Japanese Patent Application Laid-Open No. 2009-156789) is capable of collectively measuring in-plane brightness distribution as in photographing.
  • This measurement apparatus obtains a resolution of 980 ⁇ 980 dots as a measurement result and can collectively obtain 980 ⁇ 980 pieces of brightness data in one measurement.
  • Displays such as high definition televisions have recently been required to have higher definition, and correspondingly, the number of pixels in a display area of such a display is on the rise.
  • the resolution of the measurement apparatus of Japanese Patent Application Laid-Open No. 2009-156789 is restricted to the resolution of an imaging element. In measuring a sample with a resolution higher than that of the imaging element, thus, the measurement apparatus may yield a relatively rough measurement result.
  • the present invention has an object to provide an uneven brightness measuring apparatus capable of measuring a high-resolution sample with high definition.
  • a first uneven brightness measuring apparatus includes a brightness measuring device, a jig, and a data combiner.
  • the brightness measuring device measures an in-plane brightness of a display surface of a measurement sample.
  • the brightness measuring device is mounted on the jig.
  • the jig includes a rotation mechanism to rotate the brightness measuring device about a nodal point of the brightness measuring device.
  • the data combiner combines first measurement data of a first display area in the display surface and second measurement data of a second display area in the display surface adjacent to the first display area.
  • the first measurement data and the second measurement data are pieces of data obtained by the brightness measuring device.
  • the first measurement data and the second measurement data are pieces of data obtained through measurements by the brightness measuring device rotated in different positions by the rotation mechanism.
  • the brightness measuring device rotates about the nodal point and measures the first display area and the second display area, thus providing continuity to the obtained first measurement data and second measurement data. Combining these pieces of data thus enables measurement of the brightness distribution of a high-resolution measurement sample with high definition.
  • a second uneven brightness measuring apparatus includes a brightness measuring device and a data combiner.
  • the brightness measuring device measures an in-plane brightness of a display surface of a measurement sample.
  • the data combiner combines first measurement data of a first display area in the display surface and second measurement data of a second display area in the display surface adjacent to the first display area.
  • the first measurement data and the second measurement data are obtained by the brightness measuring device.
  • the brightness measuring device includes a rotation mechanism to rotate the brightness measuring device about a nodal point of the brightness measuring device.
  • the first measurement data and the second measurement data arc pieces of data obtained through measurements by the brightness measuring device rotated in different positions by the rotation mechanism,
  • the brightness measuring device rotates about the nodal point and measures the first display area and the second display area, thus providing continuity to the obtained first measurement data and second measurement data. Combining these pieces of data thus enables measurement of the brightness distribution of a high-resolution measurement sample with high definition.
  • FIG. 1 illustrates an outline of uneven brightness measurement according to a first underlying technique
  • FIG. 2 illustrates an outline of uneven brightness measurement according to a second underlying technique
  • FIG. 3 is a view for explaining a configuration of an uneven brightness measuring apparatus according to a first preferred embodiment and a positional relationship between the uneven brightness measuring apparatus and a measurement sample;
  • FIG. 4 illustrates a hardware configuration of a computing unit
  • FIG. 5 is a flowchart illustrating a procedure of measuring the in-plane brightness of a measurement sample with the uneven brightness measuring apparatus according to the first preferred embodiment
  • FIG, 6 is a perspective view for explaining a method for aligning a nodal point of a brightness measuring device
  • FIGS. 7A, 7B, and 7C are top views for explaining the method for aligning the nodal point of the brightness measuring device
  • FIGS. 8A, 8B, and 8C are views for explaining a measurement method by the uneven brightness measuring apparatus according to the first preferred embodiment
  • FIG. 9 illustrates a brightness measurement result before correction of a first display area
  • FIG. 10 illustrates an image for finding a boundary of a display area
  • FIG. 11 illustrates a positional relationship between a display area and the brightness measuring device in brightness measurement
  • FIG. 12 illustrates a configuration of an uneven brightness measuring apparatus according to a second preferred embodiment.
  • FIG. 1 illustrates an outline of uneven brightness measurement according to a first underlying technique.
  • a brightness measuring device 1 is arranged to squarely face a measurement sample 2 and measures the brightness distribution in a display surface of the measurement sample 2 at a time.
  • the brightness measuring device 1 is, for example, a 2D color analyzer for luminance measurement (CA-2000 from Konica Minolta Inc.) publicly known as an in-plane brightness measuring device.
  • the measurement sample 2 is, for example, a 7-inch diagonal WVGA liquid crystal display.
  • a relatively coarse resolution may be obtained in a measurement result if the measuring element of the brightness measuring device 1 has a resolution lower than the resolution of the measurement sample 2 .
  • FIG. 2 illustrates an outline of uneven brightness measurement according to a second underlying technique. This method involves dividing a display surface of a measurement sample 2 into a plurality of areas, measuring a brightness distribution for every divided area, and then combining pieces of measurement data.
  • the display area of the measurement sample 2 is divided into a left half and a right half respectively as a first display area 2 a and a second display area 2 b.
  • pieces of measurement data of the respective divided areas are combined for easy understanding of the whole picture of the brightness distribution in a display surface.
  • the first display area 2 a and the second display area 2 b are misaligned in the direction of observation due to the setting of the brightness measuring device 1 , resulting in no continuity between the measurement data of the first display area 2 a and the measurement data of the second display area 2 b . Consequently, while the pieces of measurement data of the central portions of the first display area 2 a and the second display area 2 b can be compared with the pieces of measurement data of their adjacent areas, the measurement data of the boundary portion between the first display area 2 a and the second display area 2 b cannot be compared with the pieces of measurement data of its adjacent areas.
  • the present invention therefore has devised a way to obtain high-definition measurement data of a high-resolution measurement sample with an existing uneven brightness measuring apparatus, which will be described below.
  • FIG. 3 is a view for explaining a configuration of an uneven brightness measuring apparatus 101 according to a first preferred embodiment of the present invention and a positional relationship between the uneven brightness measuring apparatus 101 and a measurement sample 2 .
  • FIG. 3 and the following figures described in this specification components similar to those of FIGS. 1 and 2 described in “A. Underlying Techniques” are denoted by' similar reference signs.
  • the uneven brightness measuring apparatus 101 includes a brightness measuring device 1 , a jig 4 , on which the brightness measuring device 1 is mounted, a tripod 3 , on which the jig 4 is placed, and a computing unit 6 .
  • the brightness measuring device 1 Used as the brightness measuring device 1 is, for example, a 2D color analyzer for luminance measurement (CA-2000 from Konica Minolta Inc.) publicly known as an in-plane brightness measuring apparatus.
  • the brightness measuring device 1 includes an objective lens and a CCD sensor (not shown) and measures the in-plane brightness or in-plane chromaticity of the measurement sample 2 .
  • the brightness measuring device 1 is equipped with a telephoto lens and has an angle of view of approximately ⁇ 4°, where the angle of view represents a measurement range of the telephoto lens.
  • Used as the measurement sample 2 is, for example, a 7-inch diagonal WVGA liquid crystal display.
  • the measurement sample 2 is placed such that the direction normal to its display surface is horizontal and that the long sides of its display area are horizontal.
  • the uneven brightness measuring apparatus 101 is placed so as to squarely face the measurement sample 2 and observe the central portion of the display surface of the measurement sample 2 from the direction normal to the display surface.
  • the jig 4 has a rotation mechanism that rotates about a rotating, shaft 5 in the directions indicated by an arrow 5 D.
  • the brightness measuring device 1 can thus rotate about e rotating shaft 5 while being fixed to the jig 4 .
  • the jig 4 has a slide mechanism 41 that slides the brightness measuring device 1 in the directions indicated by an arrow 41 D.
  • the brightness measuring device 1 can thus slide in the directions of the arrow 41 D while being fixed to the jig 4 .
  • the directions of the arrow 41 D are made parallel to the line normal to the display surface of the measurement sample 2 , with the uneven brightness measuring apparatus 101 arranged to squarely face the measurement sample 2 .
  • the brightness measuring device 1 can thus be caused to slide by the slide mechanism 41 in parallel with the line normal to the display surface of the measurement sample 2 .
  • the computing unit 6 includes a data determiner 61 , a trapezoidal distortion corrector 62 , and a data combiner 63 .
  • the data determiner 61 determines measurement data of each divided area from the measurement data of the brightness measuring device 1 .
  • the trapezoidal distortion corrector 62 corrects a trapezoidal distortion of the measurement data of the brightness measuring device 1 .
  • the data combiner 63 combines pieces of measurement data of the divided display areas of the measurement sample 2 , which will be described below, thereby creating measurement data of an entire display surface of the measurement sample 2 .
  • FIG. 4 illustrates a hardware configuration of the computing unit 6 .
  • the computing unit 6 is implemented by an input interface (I/F) 71 , which obtains measurement data from the uneven brightness measuring apparatus I, a processor 72 , and a memory 73 .
  • the data determiner 61 , the trapezoidal distortion corrector 62 , arid the data combiner 63 are implemented as functions of the processor 72 by the processor 72 such as a central processing unit (CPU) executing a software program stored in the memory 73 such as a random access memory (RAM).
  • CPU central processing unit
  • RAM random access memory
  • the position of a nodal point of the brightness measuring device 1 is adjusted such that the nodal point coincides with the rotating shaft 5 of the jig 4 (step S 1 ).
  • the nodal point is the center of a focal point of an objective lens of the brightness measuring device 1 .
  • FIG. 6 is a perspective view for describing a method for aligning the nodal point of the, brightness measuring device 1 .
  • FIGS. 7A, 7B, and 7C are top views for explaining the method for aligning the nodal point of the brightness measuring device 1 .
  • Rods 81 and 82 are prepared as auxiliary parts for aligning the nodal point.
  • the rods 81 and 82 are placed vertically on an optical axis of the brightness measuring device 1 . In this case, the rods 81 and 82 are observed overlapping each other from the brightness measuring device 1 as illustrated in FIG. 7A .
  • the nodal point is indicated by P in FIGS. 7A, 7B, and 7C .
  • the brightness measuring device 1 is rotated by ⁇ , for example, approximately 3° about the rotating shaft 5 ( FIG. 7B ).
  • the nodal point P does not coincide with the rotating shaft 5 , and thus, the rods 81 and 82 are observed not overlapping each other from the brightness measuring device 1 in this state.
  • the brightness reasuring device 1 is moved back and forth on the jig 4 by the slide mechanism 41 to find a position in the brightness measuring device 1 at which the rods 81 and 82 are observed overlapping each other from the brightness measuring device 1 .
  • the nodal point P of the brightness measuring device 1 coincides with the rotating shaft 5 ( FIG. 7C ). Since the slide mechanism 41 is aimed at aligning the nodal point P of the brightness measuring device 1 with the rotating shaft 5 of the jig 4 , it suffices that the jig 4 includes a mechanism that moves the brightness measuring device 1 relative to the rotating shaft 5 of the jig 4 .
  • such a mechanism may be a moving mechanism such as a mechanism that adjusts a position stepwise, in addition to the slide mechanism 41 .
  • Causing the nodal point P of the brightness measuring device 1 to coincide with the rotating shaft 5 eliminates an effect of parallax on the pieces of measurement data of the display areas 2 a and 2 b , which will be described in a subsequent step, thus providing continuity to these pieces of data. As a result, these pieces of data can be combined to obtain measurement data of the entire display area.
  • Step S 1 of FIG. 5 is performed as described above. Subsequently, after the alignment of the nodal point P, the brightness of the measurement sample 2 is measured.
  • the display area of the measurement sample 2 is divided into a plurality of areas, and uneven brightness is measured for every divided area.
  • the display area of the measurement sample 2 is divided into two areas, a first display area 2 a in a left half and a second display area 2 b in a right half
  • the display area can be divided in any other way.
  • the display area may be divided into three or four areas or may be divided vertically.
  • the brightness measuring device 1 can measure higher-resolution measurement sample 2 by dividing a display area into more pieces. In this measurement, uneven brightness is measured during white display of the measurement sample 2 . Alternatively, uneven brightness may be measured during gray or black display.
  • FIGS. 8A, 8B, and 8C are views for explaining a method for measuring the brightness of the measurement sample 2 by the brightness measuring device 1 .
  • the brightness measuring device 1 is rotated by the rotation mechanism of the jig 4 by 3° from the position in which the brightness measuring device 1 squarely faces the measurement sample 2 , and measures the brightness distribution of the first display area 2 a side (step S 2 ).
  • FIG. 8A illustrates the positional relationship between the measurement sample 2 and the brightness measuring device 1 in this state. Description is made as “the brightness distribution of the first display area 2 a side” above because this step, not only the brightness distribution of the first display area 2 a but also the brightness distribution of a partial area of the second display area 2 b adjacent to the first display area 2 a is measured.
  • the data determiner 61 determines the measurement data (first measurement data) of the first display area 2 a from the pieces of measurement data obtained in step S 2 (step S 3 ). A specific example of this determination method will be described below.
  • the brightness measuring device 1 obliquely measures the brightness of the first display area 2 a side without squarely facing the first display area 2 a .
  • the measurers measurement data (first measurement data) of the first display area 2 a is the measurement data of a trapezoidal area. That is to say, a trapezoidal distortion occurs in the measurement data.
  • the trapezoidal distortion corrector 62 thus performs a computation of correcting the trapezoidal distortion (step S 4 ). A specific example of this correction computation will be described below.
  • FIG. 8B illustrates a positional relationship between the measurement sample 2 and the brightness measuring device 1 in this state. Description is made as “the brightness distribution of the second display area 2 b side” above because in this step, not only the brightness distribution of the second display area 2 b but also the brightness distribution of a partial area of the first display area 2 a adjacent to the second display area 2 b is measured.
  • the data determiner 61 determines the measurement data of the second display area 2 b from the pieces of measurement data obtained in step S 5 (step S 6 ).
  • the determination method is similar to that of step S 3 , a specific example of which will be described below.
  • a measurement result of the second display area 2 b is also a trapezoidal shape, similarly to the measurement result of the first display area 2 a illustrated in FIG. 9 .
  • a trapezoidal shape obtained by horizontally mirroring the measurement result of the first display area 2 a illustrated in FIG. 9 is obtained.
  • the trapezoidal distortion corrector 62 thus also performs a computation of correcting the measurement result of the second display area 2 b (step S 7 ). This correction computation is similar to that of step S 4 , a specific example of which will be described below.
  • the data combiner 63 combines the measurement data of the first display area 2 a , which has been corrected in step S 4 , and the measurement data of the second display area 2 b , which has been corrected in step S 7 , thus obtaining measurement data on the brightness distribution of the entire display surface of the measurement sample 2 (step S 8 ).
  • a measurement value of a boundary portion between the first display area 2 a and the second display area 2 b is included in the measurement data of the first display area 2 a as well as the measurement data of the second display area 2 b .
  • Both the pieces of measurement data have been measured by the brightness measuring device 1 rotating about the nodal point P in different rotational positions, and thus, the directions of the measurement point and the brightness measuring device 1 are identical in both the measurements. There is accordingly no effect of the viewing angle characteristics of the measurement sample 2 , thus obtaining the same value for both the pieces of measurement data of the boundary portion between the first display area 2 a and the second display area 2 b.
  • Both the pieces of measurement data are combined such that the portions with the same value overlap each other with respect to the boundary portion between the first display area 2 a and the second display area 2 b , thus obtaining measurement data on the brightness distribution of the entire display surface of the measurement sample 2 ( FIG. 8C ).
  • the uneven brightness measuring apparatus 101 includes the brightness measuring device 1 , the jig 4 , and the data combiner 63 .
  • the brightness measuring device 1 measures the in-plane brightness of the display surface of the measurement sample 2 .
  • the brightness measuring device 1 is mounted on the jig 4 .
  • the jig 4 includes the rotation mechanism that rotates the brightness measuring device 1 about the nodal point P of the brightness measuring device 1 .
  • the data combiner 63 combines the first measurement data of the first display area 2 a in the display area, which is obtained by the brightness measuring device 1 , and the second measurement data of the second display area 2 b in the display area adjacent to the first display area 2 a , which is obtained by the brightness measuring device 1 .
  • the first measurement data and the second measurement data which are pieces of data obtained through the measurements by the brightness measuring device 1 rotated in different positions by the rotation mechanism, are continuous data free from parallax. Combining these pieces of data thus obtains the measurement data on the uneven brightness of the entire display surface of the measurement sample 2 . This enables brightness measurement with high definition if the measurement sample 2 has a resolution higher than the resolution of the measurement element of the brightness measuring device 1 .
  • FIG. 10 illustrates an image displayed on the display surface of the measurement sample 2 to find the boundary.
  • the image has a white line at a central portion of the display area, that is, at a boundary between the first display area 2 a and the second display area 2 b.
  • the brightness measuring device 1 After measuring the brightness of the first display area 2 a side, the brightness measuring device 1 measures the brightness of the image illustrated in FIG. 10 displayed on the measurement sample 2 while keeping its rotational position. This achieves, in the brightness data of 980 ⁇ 980 dots, linearly shaped data indicating high brightness corresponding, to the line at the central portion. The linearly shaped data is located at the central portion of the measurement sample 2 , and thus, this data is used to determine the brightness data of the first display area 2 a.
  • the brightness measuring device 1 measures the brightness of the image illustrated in FIG. 10 displayed on the measurement sample 2 while keeping its rotational position, and determines the brightness data of the second display area 2 b.
  • the method for identifying a boundary of a display area is not limited to the method above.
  • the boundary of a display area may be calculated from, for example, the rotation angle of the brightness measuring device 1 in the brightness measurements of the first display area 2 a and the second display area 2 b , the distance between the brightness measuring device 1 and the measurement sample 2 , and the lens performance of the brightness measuring device 1 .
  • the correction of a trapezoidal distortion of the measurement data of the first display area 2 a is similar to the correction of a trapezoidal distortion of the measurement data of the second display area 2 b , and thus, only the correction of a trapezoidal distortion of the measurement data of the second display area 2 b will be described here.
  • FIG. 11 illustrates a positional relationship between the second display area 2 b and the brightness measuring device 1 in the brightness measurement of the second display area 2 b (represented by a plane S herein).
  • the brightness measuring device 1 tilts by an angle ⁇ from the direction in which the brightness measuring device 1 squarely faces the second display area 2 b of the measurement sample 2 and then measures the brightness of the second display area 2 b .
  • the brightness distribution within an imaging range is projected onto an xy plane squarely facing the brightness measuring device 1 , so that the measurement data is recorded.
  • the brightness measuring device 1 When the origin points of an x-axis and a y-axis are set at the positions facing the brightness measuring device 1 and a z-axis is set to be perpendicular to the xy plane, the brightness measuring device 1 is positioned at a point Z (0, 0, L) on the z-axis.
  • the brightness value of a measurement point A 1 (p, q, 0) is t brightness value of a point A 2 on the measurement sample 2 . Now, the coordinates of the point A 2 are obtained.
  • the measurement sample 2 is actually present on the plane S represented by an expression below.
  • the point A 2 can be computed as an intersection of the plane S and a straight line AZ, and the coordinates of the point A 2 (x2, y2, z2) are as follows.
  • An appropriate point A 2 can be moved to be located on the XY plane through rotation about the Y axis by ⁇ .
  • the point A 2 after being moved is a point A 3 (x3, y3, z3), it is as follows.
  • rotation ⁇ ⁇ matrix [ cos ⁇ ⁇ ⁇ 0 - sin ⁇ ⁇ ⁇ 0 1 0 sin ⁇ ⁇ ⁇ 0 cos ⁇ ⁇ ⁇ ]
  • x p ⁇ L ⁇ ⁇ cos 2 ⁇ ⁇ ⁇ L ⁇ ⁇ cos ⁇ ⁇ ⁇ - p ⁇ ⁇ sin ⁇ ⁇ ⁇ - L ⁇ ( 1 - L ⁇ ⁇ cos ⁇ ⁇ ⁇ L ⁇ ⁇ cos ⁇ ⁇ ⁇ ⁇ sin ⁇ ⁇ ⁇ - p ⁇ ⁇ sin 2 ⁇ ⁇ ⁇ )
  • the brightness value of an appropriate point A 1 in the measurement data is actually the brightness value of the point A 2 on the measurement sample 2 , Replacing this brightness value with the brightness value of the point A 3 on the xy plane enables the correction of a trapezoidal distortion.
  • the value of a required location is subjected to, for example, linear interpolation computation on the basis of the pieces of measurement data of the respective points calculated above, thus obtaining measurement data of an appropriate point. This completes the correction computation.
  • the correction computation described above is merely an example, and any other correction method may be used.
  • the uneven brightness measuring apparatus 101 includes the trapezoidal distortion corrector 62 that corrects a trapezoidal distortion of the measurement data, which occurs as a result of the brightness measuring device 1 not squarely facing a measurement area, arid therefore can obtain accurate measurement data whose trapezoidal distortion has been corrected.
  • FIG. 12 illustrates the configuration of an uneven brightness measuring apparatus 102 according to a second preferred embodiment.
  • the uneven brightness measuring apparatus 102 includes a computing unit 6 as in the first preferred embodiment, which is not illustrated in FIG. 12 .
  • the uneven brightness measuring apparatus 102 includes a tripod 3 , a jig 4 B, which is fixed to the tripod 3 , a brightness measuring device 1 , which is mounted on the jig 4 B, and a computing unit 6 (not shown).
  • the brightness measuring device 1 is mounted on the jig 413 with a screw 7 .
  • the brightness measuring device 1 is rotatable about the screw 7 serving as a rotating shaft.
  • the jig 4 B includes a rotation mechanism that rotates the brightness measuring device 1 about the screw 7 serving as a rotating shaft.
  • the position in the brightness measuring device 1 at which the screw is mounted is set in advance such that the rotating shaft of the screw 7 coincides with the nodal point P of the brightness measuring device 1 , thus eliminating the step of aligning the nodal point P illustrated in step S 1 of FIG. 5 .
  • the jig 4 B does not require a slide mechanism 41 for the alignment.
  • the rotating shaft of the rotation mechanism is preset to overlap the nodal point of the brightness measuring device 1 , thus omitting the alignment of the nodal point.
  • the rotating shaft is caused to serve as the rotating shaft of the screw 7 for mounting the brightness measuring device 1 on the jig 4 B, that is, the rotating shaft of the screw 7 is caused to overlap the nodal point of the brightness measuring device 1 , thus eliminating the need for providing an additional rotation mechanism in the jig 4 B, which simplifies the configuration of the jig 4 B.
  • the brightness measuring device 1 itself may include a rotation mechanism.
  • the rotating shaft of the rotation mechanism is set to overlap the nodal point of the brightness measuring device 1 .
  • the brightness measuring device 1 includes a rotation mechanism that rotates the brightness measuring device 1 about the nodal point of the brightness measuring device 1 .
  • the jig 4 B is not required.
  • the data determiner 61 , the trapezoidal distortion corrector 62 , and the data combiner 63 are implemented by the processor 72 of FIG. 4 operating in accordance with the software program stored in the memory 73 .
  • the data determiner 61 , the trapezoidal distortion corrector 62 , and the data combiner 63 may be implemented by a signal processing circuit that implements this operation by an electric circuit that is hardware.
  • processing circuit can be used to express the concept in which the data determiner 61 , the trapezoidal distortion corrector 62 , and the data combiner 63 , which are software, are combined with the data determiner 61 , the trapezoidal distortion corrector 62 , and the data combiner 63 , which are hardware.

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Studio Devices (AREA)
US15/397,796 2016-01-19 2017-01-04 Uneven brightness measuring apparatus Abandoned US20170205277A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016007616A JP6726967B2 (ja) 2016-01-19 2016-01-19 輝度ムラ測定装置
JP2016-007616 2016-01-19

Publications (1)

Publication Number Publication Date
US20170205277A1 true US20170205277A1 (en) 2017-07-20

Family

ID=59313732

Family Applications (1)

Application Number Title Priority Date Filing Date
US15/397,796 Abandoned US20170205277A1 (en) 2016-01-19 2017-01-04 Uneven brightness measuring apparatus

Country Status (2)

Country Link
US (1) US20170205277A1 (ja)
JP (1) JP6726967B2 (ja)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019106636A1 (en) * 2017-12-03 2019-06-06 Lumus Ltd. Optical device testing method and apparatus
US11454590B2 (en) 2018-06-21 2022-09-27 Lumus Ltd. Measurement technique for refractive index inhomogeneity between plates of a lightguide optical element (LOE)
US11656472B2 (en) 2017-10-22 2023-05-23 Lumus Ltd. Head-mounted augmented reality device employing an optical bench
US11729359B2 (en) 2019-12-08 2023-08-15 Lumus Ltd. Optical systems with compact image projector
US11747137B2 (en) 2020-11-18 2023-09-05 Lumus Ltd. Optical-based validation of orientations of internal facets
US11762169B2 (en) 2017-12-03 2023-09-19 Lumus Ltd. Optical device alignment methods
US11927734B2 (en) 2016-11-08 2024-03-12 Lumus Ltd. Light-guide device with optical cutoff edge and corresponding production methods
US12019249B2 (en) 2020-11-30 2024-06-25 Lumus Ltd. Optical systems and methods for eye tracking based on redirecting light from eye using an optical arrangement associated with a light-guide optical element

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018025625A1 (ja) * 2016-08-01 2018-02-08 ソニー株式会社 光学装置および情報処理方法
KR102219834B1 (ko) * 2018-08-30 2021-02-24 주식회사 엘지화학 광축 미세 측정을 통한 디스플레이 패널의 얼룩 검증방법

Citations (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4754334A (en) * 1987-01-08 1988-06-28 Management Graphics, Inc. Image recorder having automatic alignment method and apparatus
US5499040A (en) * 1994-06-27 1996-03-12 Radius Inc. Method and apparatus for display calibration and control
US5657073A (en) * 1995-06-01 1997-08-12 Panoramic Viewing Systems, Inc. Seamless multi-camera panoramic imaging with distortion correction and selectable field of view
US5764209A (en) * 1992-03-16 1998-06-09 Photon Dynamics, Inc. Flat panel display inspection system
US6181378B1 (en) * 1996-06-14 2001-01-30 Asahi Kogaku Kogyo Kabushiki Kaisha Image reading device
US20020024640A1 (en) * 2000-08-29 2002-02-28 Olympus Optical Co., Ltd. Image projection display apparatus using plural projectors and projected image compensation apparatus
US20020041383A1 (en) * 2000-08-16 2002-04-11 Lewis Clarence A. Distortion free image capture system and method
US6445362B1 (en) * 1999-08-05 2002-09-03 Microvision, Inc. Scanned display with variation compensation
US20020122113A1 (en) * 1999-08-09 2002-09-05 Foote Jonathan T. Method and system for compensating for parallax in multiple camera systems
US6456339B1 (en) * 1998-07-31 2002-09-24 Massachusetts Institute Of Technology Super-resolution display
US20020180726A1 (en) * 2000-11-06 2002-12-05 Jianbo Shi Paper-based remote sketching system
US6958810B2 (en) * 1998-06-30 2005-10-25 Jjl Technologies Llc Methods for characterizing gems or precious stones using a probe having a plurality of light receivers
US20060007531A1 (en) * 2002-09-30 2006-01-12 Doron Korengut Inspection system with oblique viewing angle
US20080068562A1 (en) * 2006-09-19 2008-03-20 Fuji Xerox Co., Ltd. Image processing system, image processing method, and program product therefor
US20080158241A1 (en) * 2007-01-02 2008-07-03 Samsung Sdi Co., Ltd. Method of optimizing brightness of liquid crystal display panel
US7472997B2 (en) * 2004-08-03 2009-01-06 Seiko Epson Corporation Multi-projection display and projector unit
US20100117929A1 (en) * 2008-11-10 2010-05-13 Seiko Epson Corporation Multi-display system, information processor, and image data processing method in multi-display system
US7763836B2 (en) * 2006-04-21 2010-07-27 Mersive Technologies, Inc. Projector calibration using validated and corrected image fiducials
US7866832B2 (en) * 2006-02-15 2011-01-11 Mersive Technologies, Llc Multi-projector intensity blending system
US7893393B2 (en) * 2006-04-21 2011-02-22 Mersive Technologies, Inc. System and method for calibrating an image projection system
US7926957B2 (en) * 2003-10-15 2011-04-19 Seiko Epson Corporation Multi-projection display
US7949202B2 (en) * 2005-02-14 2011-05-24 Seiko Epson Corporation Image processing system, projector, and image processing method
US20110242493A1 (en) * 2010-04-01 2011-10-06 Canon Kabushiki Kaisha Projection system, control method for projection system, and projection apparatus
US20120001931A1 (en) * 2010-07-02 2012-01-05 Hon Hai Precision Industry Co., Ltd. Adjusting system, method and projector including the same
US8251512B2 (en) * 2004-07-08 2012-08-28 Imax Corporation Equipment and methods for the display of high resolution images using multiple projection displays
US20130222386A1 (en) * 2012-02-23 2013-08-29 Canon Kabushiki Kaisha Image processing for projection on a projection screen
US8531485B2 (en) * 2009-10-29 2013-09-10 Immersion Corporation Systems and methods for compensating for visual distortion caused by surface features on a display
US20130278486A1 (en) * 2012-04-23 2013-10-24 Empire Technology Development Llc Distortion-correcting deformable displays
US20140078121A1 (en) * 2012-09-19 2014-03-20 Funai Electric Co., Ltd. Image Display Apparatus and Image Scanning Apparatus
US8730320B2 (en) * 2007-10-17 2014-05-20 Panasonic Corporation Lighting apparatus
US20140139730A1 (en) * 2011-07-01 2014-05-22 Qinetiq Limited Casing
US8749782B1 (en) * 2006-12-19 2014-06-10 J.A. Woollam Co., Inc. DLP base small spot investigation system
US8866902B2 (en) * 2010-02-26 2014-10-21 Seiko Epson Corporation Correction information calculating device, image processing apparatus, image display system, and image correcting method
US20140362242A1 (en) * 2012-11-16 2014-12-11 Panasonic Intellectual Property Corporation Of America Camera drive device
US8957964B2 (en) * 2006-07-18 2015-02-17 Fuji Xerox Co., Ltd. Large-object remote composite image annotation system
US20150109533A1 (en) * 2012-03-13 2015-04-23 Nec Display Solutions, Ltd. Projection type display device and method for producing recorded images
US20150130893A1 (en) * 2012-06-06 2015-05-14 Sony Corporation Image processing apparatus, image processing method, and program
US20150331302A1 (en) * 2013-01-28 2015-11-19 JVC Kenwood Corporation Projection device, image correction method, and computer-readable recording medium
US9241143B2 (en) * 2008-01-29 2016-01-19 At&T Intellectual Property I, L.P. Output correction for visual projection devices
US9241141B1 (en) * 2011-12-23 2016-01-19 Amazon Technologies, Inc. Projection block extraction
US20160104434A1 (en) * 2014-10-09 2016-04-14 Nec Display Solutions, Ltd. Display apparatus, gradation correction map generating device, gradation correction map generating method, and program
US9325956B2 (en) * 2013-04-30 2016-04-26 Disney Enterprises, Inc. Non-linear photometric projector compensation
US20160124296A1 (en) * 2013-03-26 2016-05-05 Entaniya Co., Ltd. Panoramic imaging head, and imaging system using same
US9443294B2 (en) * 2012-11-27 2016-09-13 Ricoh Company, Limited Image correction system, image correction method, and computer program product
US20170230580A1 (en) * 2016-02-10 2017-08-10 Panasonic Intellectual Property Management Co., Ltd. Monitoring camera and swing correction method
US20170344543A1 (en) * 2015-01-06 2017-11-30 Hitachi Maxell, Ltd. Image display device, image display method and image display system

Patent Citations (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4754334A (en) * 1987-01-08 1988-06-28 Management Graphics, Inc. Image recorder having automatic alignment method and apparatus
US5764209A (en) * 1992-03-16 1998-06-09 Photon Dynamics, Inc. Flat panel display inspection system
US5499040A (en) * 1994-06-27 1996-03-12 Radius Inc. Method and apparatus for display calibration and control
US5657073A (en) * 1995-06-01 1997-08-12 Panoramic Viewing Systems, Inc. Seamless multi-camera panoramic imaging with distortion correction and selectable field of view
US6181378B1 (en) * 1996-06-14 2001-01-30 Asahi Kogaku Kogyo Kabushiki Kaisha Image reading device
US6958810B2 (en) * 1998-06-30 2005-10-25 Jjl Technologies Llc Methods for characterizing gems or precious stones using a probe having a plurality of light receivers
US6456339B1 (en) * 1998-07-31 2002-09-24 Massachusetts Institute Of Technology Super-resolution display
US6445362B1 (en) * 1999-08-05 2002-09-03 Microvision, Inc. Scanned display with variation compensation
US20020122113A1 (en) * 1999-08-09 2002-09-05 Foote Jonathan T. Method and system for compensating for parallax in multiple camera systems
US20020041383A1 (en) * 2000-08-16 2002-04-11 Lewis Clarence A. Distortion free image capture system and method
US20020024640A1 (en) * 2000-08-29 2002-02-28 Olympus Optical Co., Ltd. Image projection display apparatus using plural projectors and projected image compensation apparatus
US20020180726A1 (en) * 2000-11-06 2002-12-05 Jianbo Shi Paper-based remote sketching system
US20060007531A1 (en) * 2002-09-30 2006-01-12 Doron Korengut Inspection system with oblique viewing angle
US7926957B2 (en) * 2003-10-15 2011-04-19 Seiko Epson Corporation Multi-projection display
US8251512B2 (en) * 2004-07-08 2012-08-28 Imax Corporation Equipment and methods for the display of high resolution images using multiple projection displays
US7472997B2 (en) * 2004-08-03 2009-01-06 Seiko Epson Corporation Multi-projection display and projector unit
US7949202B2 (en) * 2005-02-14 2011-05-24 Seiko Epson Corporation Image processing system, projector, and image processing method
US7866832B2 (en) * 2006-02-15 2011-01-11 Mersive Technologies, Llc Multi-projector intensity blending system
US7763836B2 (en) * 2006-04-21 2010-07-27 Mersive Technologies, Inc. Projector calibration using validated and corrected image fiducials
US7893393B2 (en) * 2006-04-21 2011-02-22 Mersive Technologies, Inc. System and method for calibrating an image projection system
US8957964B2 (en) * 2006-07-18 2015-02-17 Fuji Xerox Co., Ltd. Large-object remote composite image annotation system
US20080068562A1 (en) * 2006-09-19 2008-03-20 Fuji Xerox Co., Ltd. Image processing system, image processing method, and program product therefor
US8749782B1 (en) * 2006-12-19 2014-06-10 J.A. Woollam Co., Inc. DLP base small spot investigation system
US20080158241A1 (en) * 2007-01-02 2008-07-03 Samsung Sdi Co., Ltd. Method of optimizing brightness of liquid crystal display panel
US8730320B2 (en) * 2007-10-17 2014-05-20 Panasonic Corporation Lighting apparatus
US9241143B2 (en) * 2008-01-29 2016-01-19 At&T Intellectual Property I, L.P. Output correction for visual projection devices
US20100117929A1 (en) * 2008-11-10 2010-05-13 Seiko Epson Corporation Multi-display system, information processor, and image data processing method in multi-display system
US8531485B2 (en) * 2009-10-29 2013-09-10 Immersion Corporation Systems and methods for compensating for visual distortion caused by surface features on a display
US8866902B2 (en) * 2010-02-26 2014-10-21 Seiko Epson Corporation Correction information calculating device, image processing apparatus, image display system, and image correcting method
US20110242493A1 (en) * 2010-04-01 2011-10-06 Canon Kabushiki Kaisha Projection system, control method for projection system, and projection apparatus
US20120001931A1 (en) * 2010-07-02 2012-01-05 Hon Hai Precision Industry Co., Ltd. Adjusting system, method and projector including the same
US20140139730A1 (en) * 2011-07-01 2014-05-22 Qinetiq Limited Casing
US9241141B1 (en) * 2011-12-23 2016-01-19 Amazon Technologies, Inc. Projection block extraction
US20130222386A1 (en) * 2012-02-23 2013-08-29 Canon Kabushiki Kaisha Image processing for projection on a projection screen
US20150109533A1 (en) * 2012-03-13 2015-04-23 Nec Display Solutions, Ltd. Projection type display device and method for producing recorded images
US20130278486A1 (en) * 2012-04-23 2013-10-24 Empire Technology Development Llc Distortion-correcting deformable displays
US20150130893A1 (en) * 2012-06-06 2015-05-14 Sony Corporation Image processing apparatus, image processing method, and program
US20140078121A1 (en) * 2012-09-19 2014-03-20 Funai Electric Co., Ltd. Image Display Apparatus and Image Scanning Apparatus
US20140362242A1 (en) * 2012-11-16 2014-12-11 Panasonic Intellectual Property Corporation Of America Camera drive device
US9443294B2 (en) * 2012-11-27 2016-09-13 Ricoh Company, Limited Image correction system, image correction method, and computer program product
US20150331302A1 (en) * 2013-01-28 2015-11-19 JVC Kenwood Corporation Projection device, image correction method, and computer-readable recording medium
US9726965B2 (en) * 2013-01-28 2017-08-08 JVC Kenwood Corporation Projection device, image correction method, and computer-readable recording medium
US20160124296A1 (en) * 2013-03-26 2016-05-05 Entaniya Co., Ltd. Panoramic imaging head, and imaging system using same
US9325956B2 (en) * 2013-04-30 2016-04-26 Disney Enterprises, Inc. Non-linear photometric projector compensation
US20160104434A1 (en) * 2014-10-09 2016-04-14 Nec Display Solutions, Ltd. Display apparatus, gradation correction map generating device, gradation correction map generating method, and program
US20170344543A1 (en) * 2015-01-06 2017-11-30 Hitachi Maxell, Ltd. Image display device, image display method and image display system
US20170230580A1 (en) * 2016-02-10 2017-08-10 Panasonic Intellectual Property Management Co., Ltd. Monitoring camera and swing correction method

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11927734B2 (en) 2016-11-08 2024-03-12 Lumus Ltd. Light-guide device with optical cutoff edge and corresponding production methods
US11656472B2 (en) 2017-10-22 2023-05-23 Lumus Ltd. Head-mounted augmented reality device employing an optical bench
WO2019106636A1 (en) * 2017-12-03 2019-06-06 Lumus Ltd. Optical device testing method and apparatus
US11226261B2 (en) 2017-12-03 2022-01-18 Lumus Ltd. Optical device testing method and apparatus
TWI804534B (zh) * 2017-12-03 2023-06-11 以色列商魯姆斯有限公司 光學器件測試方法和存儲介質
US11762169B2 (en) 2017-12-03 2023-09-19 Lumus Ltd. Optical device alignment methods
US11454590B2 (en) 2018-06-21 2022-09-27 Lumus Ltd. Measurement technique for refractive index inhomogeneity between plates of a lightguide optical element (LOE)
US11729359B2 (en) 2019-12-08 2023-08-15 Lumus Ltd. Optical systems with compact image projector
US11747137B2 (en) 2020-11-18 2023-09-05 Lumus Ltd. Optical-based validation of orientations of internal facets
US12019249B2 (en) 2020-11-30 2024-06-25 Lumus Ltd. Optical systems and methods for eye tracking based on redirecting light from eye using an optical arrangement associated with a light-guide optical element

Also Published As

Publication number Publication date
JP6726967B2 (ja) 2020-07-22
JP2017129394A (ja) 2017-07-27

Similar Documents

Publication Publication Date Title
US20170205277A1 (en) Uneven brightness measuring apparatus
EP3287986B1 (en) Image correction method of projector and image correction system
EP3937486A1 (en) Projector keystone correction method, apparatus, and system, and readable storage medium
US9870601B2 (en) System and method for displaying panoramic image using single look-up table
TWI617177B (zh) ３ｄ多孔徑成像裝置
US9800850B2 (en) Projection display with multi-channel optics with non-circular overall aperture
EP1417833B1 (en) Method and system for correcting keystoning in a projector arbitrarily oriented with respect to a display surface
US20170142337A1 (en) Stabilization based on accelerometer data
US7583307B2 (en) Autostereoscopic display
JP3937024B2 (ja) モアレ縞を用いたずれ、パタ−ンの回転、ゆがみ、位置ずれ検出方法
JP4540322B2 (ja) 画像間対応点検出装置および画像間対応点検出方法
US9892488B1 (en) Multi-camera frame stitching
US20130070055A1 (en) System and method for improving methods of manufacturing stereoscopic image sensors
US10063792B1 (en) Formatting stitched panoramic frames for transmission
CN109855603B (zh) 一种聚焦测量方法及终端
US20090040312A1 (en) Calibration apparatus and method thereof
US7995098B2 (en) Systems and methods for measuring spatial and angular performance of a visual display
US10209091B2 (en) Measurement tool, calibration method, calibration apparatus, and computer-readable recording medium
US11012633B2 (en) Image capturing apparatus, image capturing method, and image processing apparatus
WO2016204068A1 (ja) 画像処理装置および画像処理方法、ならびにプロジェクションシステム
CN114187366A (zh) 一种相机安装校正方法、装置、电子设备及存储介质
TW201703506A (zh) 一種攝影機之自動校正系統及其自動校正方法
JP2004228619A (ja) プロジェクタの映像の歪み調整方法
US7834996B2 (en) Inspection apparatus and method
US20050058367A1 (en) Image transformation method and apparatus, image recognition apparatus, robot control apparatus and image projection apparatus

Legal Events

Date Code Title Description
AS Assignment

Owner name: MITSUBISHI ELECTRIC CORPORATION, JAPAN

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNOR:OHTSUKI, HIDEYO;REEL/FRAME:040836/0232

Effective date: 20161209

STPP Information on status: patent application and granting procedure in general

Free format text: NON FINAL ACTION MAILED

STPP Information on status: patent application and granting procedure in general

Free format text: RESPONSE TO NON-FINAL OFFICE ACTION ENTERED AND FORWARDED TO EXAMINER

STPP Information on status: patent application and granting procedure in general

Free format text: FINAL REJECTION MAILED

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION