US20110278724A1 - Chip package and method for forming the same - Google Patents

Chip package and method for forming the same Download PDF

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Publication number
US20110278724A1
US20110278724A1 US13/105,775 US201113105775A US2011278724A1 US 20110278724 A1 US20110278724 A1 US 20110278724A1 US 201113105775 A US201113105775 A US 201113105775A US 2011278724 A1 US2011278724 A1 US 2011278724A1
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Prior art keywords
semiconductor substrate
chip package
forming
conducting
substrate
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US13/105,775
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US8507321B2 (en
Inventor
Chao-Yen Lin
Yi-Hang Lin
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XinTec Inc
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XinTec Inc
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Assigned to XINTEC INC. reassignment XINTEC INC. ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: LIN, CHAO-YEN, LIN, YI-HANG
Priority to US13/105,775 priority Critical patent/US8507321B2/en
Application filed by XinTec Inc filed Critical XinTec Inc
Publication of US20110278724A1 publication Critical patent/US20110278724A1/en
Priority to US13/950,101 priority patent/US8952501B2/en
Priority to US13/959,567 priority patent/US9030011B2/en
Priority to US13/964,999 priority patent/US9209124B2/en
Publication of US8507321B2 publication Critical patent/US8507321B2/en
Application granted granted Critical
Priority to US14/337,121 priority patent/US9196594B2/en
Priority to US14/339,360 priority patent/US9437478B2/en
Priority to US14/339,341 priority patent/US8963312B2/en
Priority to US14/339,355 priority patent/US9355975B2/en
Priority to US14/339,323 priority patent/US9425134B2/en
Priority to US14/958,155 priority patent/US9355970B2/en
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Definitions

  • the present invention relates to a chip package and forming method thereof, and in particular relates to a chip package of a sensing chip.
  • An embodiment of the invention provides a chip package which includes: a carrier substrate; a semiconductor substrate having an upper surface and a lower surface, disposed overlying the carrier substrate; a device region or sensing region located on the upper surface of the semiconductor substrate; a conducting pad located on the upper surface of the semiconductor substrate; a conducting layer electrically connected to the conducting pad and extending from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and an insulating layer located between the conducting layer and the semiconductor substrate.
  • An embodiment of the invention provides a method for forming a chip package, which includes: providing a semiconductor substrate having an upper surface and a lower surface, wherein the semiconductor substrate comprises at least a device region or sensing region and at least a conducting pad on the upper surface of the semiconductor substrate; providing a carrier substrate and disposing the semiconductor substrate overlying the carrier substrate; forming a recess from the upper surface of the semiconductor substrate; forming an insulating layer overlying the upper surface of the semiconductor substrate and within the recess; forming a conducting layer overlying the insulating layer, wherein the conducting layer is electrically connected to the conducting pad and extends from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and dicing the carrier substrate from a bottom of the recess to form a plurality of separate chip packages.
  • FIGS. 1A-1D are cross-sectional views showing the steps of forming a chip package in accordance with an embodiment of the present invention.
  • FIG. 2 is a cross-sectional view showing a chip package in accordance with an embodiment of the present invention.
  • first layer “on,” “overlying,” (and like descriptions) a second layer include embodiments where the first and second layers are in direct contact and those where one or more layers are interposing the first and second layers.
  • a chip package according to an embodiment of the present invention may be used to package a sensing chip.
  • the chip package of the embodiments of the invention may be applied to active or passive devices, or electronic components with digital or analog circuits, such as opto electronic devices, micro electro mechanical systems (MEMS), micro fluidic systems, and physical sensors for detecting heat, light, or pressure.
  • MEMS micro electro mechanical systems
  • WSP wafer scale package
  • semiconductor chips such as image sensor devices, light-emitting diodes (LEDs), solar cells, RF circuits, accelerators, gyroscopes, micro actuators, surface acoustic wave devices, pressure sensors, ink printer heads, or power IC chips.
  • the wafer scale package process mentioned above mainly means that after the package process is accomplished during the wafer stage, the wafer with chips is cut to obtain separate independent packages.
  • separate independent chips may be redistributed overlying a supporting wafer and then be packaged, which may also be referred to as a wafer scale package process.
  • the above mentioned wafer scale package process may also be adapted to form chip packages of multi-layer integrated circuit devices by stacking a plurality of wafers having integrated circuits.
  • FIGS. 1A-1D are cross-sectional views showing the steps of forming a chip package according to an embodiment of the present invention.
  • a semiconductor substrate 100 is provided, which includes an upper surface 100 a and a lower surface 100 b.
  • the semiconductor substrate 100 is, for example, a silicon substrate.
  • the semiconductor substrate 100 is a silicon wafer which is suitable for the proceeding of a wafer-level packaging.
  • a device region or sensing region 102 is formed in the semiconductor substrate 100 .
  • the semiconductor substrate 100 includes a plurality of device regions or sensing regions 102 therein.
  • the device region or sensing region 102 is, for example, a sensing region such as a fingerprint recognition region.
  • the device region or sensing region 102 is located on the upper surface 100 a of the semiconductor substrate 100 .
  • the device region or sensing region 102 may be partially formed above the upper surface 100 a of the semiconductor substrate 100 .
  • the device region or sensing region 102 is completely formed in the semiconductor substrate 100 and exposed at the upper surface 100 a thereof.
  • the semiconductor substrate 100 further includes a conducting pad 104 thereon.
  • the conducting pad 104 is electrically connected to the device region or sensing region 102 through an interconnection (not shown).
  • the semiconductor substrate 100 may be optionally thinned to facilitate following manufacturing processes.
  • a temporary substrate 106 may be disposed overlying the upper surface 100 a of the semiconductor substrate 100 .
  • the temporary substrate 106 may be fixed on the upper surface 100 a of the semiconductor substrate 100 by an adhesion layer 108 .
  • a thinning process including, for example, a mechanical grinding process or a chemical mechanical polishing process, may be performed to the lower surface 100 b of the semiconductor substrate 100 by using the temporary substrate 106 as a support.
  • the temporary substrate 106 may be a glass substrate or a silicon wafer.
  • a carrier substrate 110 is disposed overlying the lower surface 100 b of the semiconductor substrate 100 .
  • the carrier substrate 110 may be a semiconductor substrate or a glass substrate.
  • the temporary substrate 106 is removed.
  • the adhesion layer 108 under the temporary substrate 106 is completely removed from the upper surface 100 a of the semiconductor substrate 100 .
  • the device region or sensing region 102 is substantially and directly exposed without any other material layer formed thereon.
  • a recess (or notch) 114 is formed along a direction from the upper surface 100 a towards the lower surface 100 b of the semiconductor substrate 100 .
  • the recess 114 completely penetrates the semiconductor substrate 100 and extends into the carrier substrate 110 .
  • an insulating material is deposited overlying the upper surface 100 a and a sidewall and a bottom of the recess 114 and is patterned to be an insulating layer 116 .
  • a patterned conducting layer 118 is formed overlying the insulating layer 116 .
  • the conducting layer 118 is electrically connected to the conducting pad 104 and extends from the upper surface 100 a of the semiconductor substrate 100 to the sidewall and the bottom of the recess 114 . If the recess 114 penetrates the semiconductor substrate 100 and extends into the carrier substrate 110 , the conducting layer 118 and the insulating layer 116 are further extended into the carrier substrate 110 . In addition, in one embodiment, in the carrier substrate 110 , a portion of the conducting layer 118 and the insulating layer 116 are substantially horizontally disposed. That is, they are substantially parallel to the upper surface 100 a of the semiconductor substrate 100 . This is due to the fact that, in one embodiment, the bottom of the formed recess 114 is substantially parallel to the upper surface 100 a of the semiconductor substrate 100 .
  • the carrier substrate 110 is diced from the bottom of the recess 114 to form a plurality of separate chip packages 10 .
  • the conducting layer 118 electrically connected to the conducting pad 104 , extends overlying a sidewall of the chip package 10 (that is, extend from the upper surface 100 a of the semiconductor substrate 100 to a sidewall of the semiconductor substrate 100 ), the conducting path may be led downwardly from the upper surface 100 a of the semiconductor substrate 100 through the sidewall.
  • the packaging process of the chip package 10 during the packaging process of the chip package 10 , only two patterning processes are performed (that is, the patterning process of the insulating layer 116 and the patterning process of the conducting layer 118 ), which significantly simplifies the packaging process of the chip package and reduces fabrication time and cost. In addition, because the packaging process of the chip is significantly simplified, reliability of the formed chip package is also improved.
  • the formed chip package 10 may be further disposed overlying a circuit board 120 .
  • the circuit board 120 includes a contact pad 122 thereon, which is electrically connected to wires in the circuit board 120 and serves as a contact point with the device region or sensing region 102 in the chip package.
  • a solder ball 124 may be formed on a corner between the carrier substrate 110 and the circuit board 120 . The solder ball 124 is electrically connected to the conducting layer 118 and the contact pad 122 simultaneously, forming a conducting path between the conducting layer 118 and the contact pad 122 .
  • embodiments of the invention are not limited to adopt the solder ball 124 to form the conducting path between the device region or sensing region 102 and the circuit board 120 .
  • another conducting structure such as a conducting layer, conducting bump, or solder wire may be adopted to replace the solder ball 124 .
  • a solder wire 126 is used to replace the solder ball 124 .
  • any conducting structure suitable for forming the conducting path between the contact pad 122 and the conducting layer 118 is within the scope of the embodiments of the present invention.
  • a recess is formed on a front surface of the chip (that is, a same side that the device region or sensing region is formed on) and a conducting layer electrically connecting the device region or sensing region is formed along a sidewall of the recess.
  • the desired conducting wire may be successfully formed and the required patterning process steps of the chip packaging process may be largely reduced. Thus, fabrication time and costs are significantly reduced.

Abstract

An embodiment of the invention provides a chip package which includes: a carrier substrate; a semiconductor substrate having an upper surface and a lower surface, disposed overlying the carrier substrate; a device region or sensing region located on the upper surface of the semiconductor substrate; a conducting pad located on the upper surface of the semiconductor substrate; a conducting layer electrically connected to the conducting pad and extending from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and an insulating layer located between the conducting layer and the semiconductor substrate.

Description

    CROSS REFERENCE TO RELATED APPLICATIONS
  • This Application claims the benefit of U.S. Provisional Application No. 61/333,459, filed on May 11, 2010, the entirety of which is incorporated by reference herein.
    • BACKGROUND OF THE INVENTION
  • 1. Field of the Invention
  • The present invention relates to a chip package and forming method thereof, and in particular relates to a chip package of a sensing chip.
  • 2. Description of the Related Art
  • Conventional manufacturing processes of chip packages concern a plurality of patterning processes and material deposition processes, which not only cost a lot, but also require long processing time.
  • Therefore, a simplified and fast chip packaging technique is desired.
    • BRIEF SUMMARY OF THE INVENTION
  • An embodiment of the invention provides a chip package which includes: a carrier substrate; a semiconductor substrate having an upper surface and a lower surface, disposed overlying the carrier substrate; a device region or sensing region located on the upper surface of the semiconductor substrate; a conducting pad located on the upper surface of the semiconductor substrate; a conducting layer electrically connected to the conducting pad and extending from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and an insulating layer located between the conducting layer and the semiconductor substrate.
  • An embodiment of the invention provides a method for forming a chip package, which includes: providing a semiconductor substrate having an upper surface and a lower surface, wherein the semiconductor substrate comprises at least a device region or sensing region and at least a conducting pad on the upper surface of the semiconductor substrate; providing a carrier substrate and disposing the semiconductor substrate overlying the carrier substrate; forming a recess from the upper surface of the semiconductor substrate; forming an insulating layer overlying the upper surface of the semiconductor substrate and within the recess; forming a conducting layer overlying the insulating layer, wherein the conducting layer is electrically connected to the conducting pad and extends from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and dicing the carrier substrate from a bottom of the recess to form a plurality of separate chip packages.
  • A detailed description is given in the following embodiments with reference to the accompanying drawings.
    • BRIEF DESCRIPTION OF THE DRAWINGS
  • The present invention can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:
  • FIGS. 1A-1D are cross-sectional views showing the steps of forming a chip package in accordance with an embodiment of the present invention; and
  • FIG. 2 is a cross-sectional view showing a chip package in accordance with an embodiment of the present invention.
    •  DETAILED DESCRIPTION OF THE INVENTION
  • The following description is of the best-contemplated mode of carrying out the invention. This description is made for the purpose of illustrating the general principles of the invention and should not be taken in a limiting sense. The scope of the invention is best determined by reference to the appended claims.
  • It is understood, that the following disclosure provides many different embodiments, or examples, for implementing different features of the invention. Specific examples of components and arrangements are described below to simplify the present disclosure. These are, of course, merely examples and are not intended to be limiting. In addition, the present disclosure may repeat reference numbers and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed. Furthermore, descriptions of a first layer “on,” “overlying,” (and like descriptions) a second layer, include embodiments where the first and second layers are in direct contact and those where one or more layers are interposing the first and second layers.
  • A chip package according to an embodiment of the present invention may be used to package a sensing chip. However, embodiments of the invention are not limited thereto. For example, the chip package of the embodiments of the invention may be applied to active or passive devices, or electronic components with digital or analog circuits, such as opto electronic devices, micro electro mechanical systems (MEMS), micro fluidic systems, and physical sensors for detecting heat, light, or pressure. Particularly, a wafer scale package (WSP) process may be applied to package semiconductor chips, such as image sensor devices, light-emitting diodes (LEDs), solar cells, RF circuits, accelerators, gyroscopes, micro actuators, surface acoustic wave devices, pressure sensors, ink printer heads, or power IC chips.
  • The wafer scale package process mentioned above mainly means that after the package process is accomplished during the wafer stage, the wafer with chips is cut to obtain separate independent packages. However, in a specific embodiment, separate independent chips may be redistributed overlying a supporting wafer and then be packaged, which may also be referred to as a wafer scale package process. In addition, the above mentioned wafer scale package process may also be adapted to form chip packages of multi-layer integrated circuit devices by stacking a plurality of wafers having integrated circuits.
  • FIGS. 1A-1D are cross-sectional views showing the steps of forming a chip package according to an embodiment of the present invention. As shown in FIG. 1A, a semiconductor substrate 100 is provided, which includes an upper surface 100 a and a lower surface 100 b. The semiconductor substrate 100 is, for example, a silicon substrate. In one embodiment, the semiconductor substrate 100 is a silicon wafer which is suitable for the proceeding of a wafer-level packaging.
  • As shown in FIG. 1A, a device region or sensing region 102 is formed in the semiconductor substrate 100. In one embodiment, the semiconductor substrate 100 includes a plurality of device regions or sensing regions 102 therein. In one embodiment, the device region or sensing region 102 is, for example, a sensing region such as a fingerprint recognition region. The device region or sensing region 102 is located on the upper surface 100 a of the semiconductor substrate 100. In one embodiment, the device region or sensing region 102 may be partially formed above the upper surface 100 a of the semiconductor substrate 100. Alternatively, in another embodiment, the device region or sensing region 102 is completely formed in the semiconductor substrate 100 and exposed at the upper surface 100 a thereof.
  • As shown in FIG. 1A, the semiconductor substrate 100 further includes a conducting pad 104 thereon. Typically, the conducting pad 104 is electrically connected to the device region or sensing region 102 through an interconnection (not shown).
  • Next, the semiconductor substrate 100 may be optionally thinned to facilitate following manufacturing processes. For example, as shown in FIG. 1B, in one embodiment, a temporary substrate 106 may be disposed overlying the upper surface 100 a of the semiconductor substrate 100. For example, the temporary substrate 106 may be fixed on the upper surface 100 a of the semiconductor substrate 100 by an adhesion layer 108. Then, a thinning process including, for example, a mechanical grinding process or a chemical mechanical polishing process, may be performed to the lower surface 100 b of the semiconductor substrate 100 by using the temporary substrate 106 as a support. In one embodiment, the temporary substrate 106 may be a glass substrate or a silicon wafer.
  • As shown in FIG. 1B, after the temporary substrate 106 is optionally disposed and the thinning process of the semiconductor substrate 100 is optionally performed, a carrier substrate 110 is disposed overlying the lower surface 100 b of the semiconductor substrate 100. In one embodiment, the carrier substrate 110 may be a semiconductor substrate or a glass substrate.
  • Next, as shown in FIG. 1C, the temporary substrate 106 is removed. In one embodiment, the adhesion layer 108 under the temporary substrate 106 is completely removed from the upper surface 100 a of the semiconductor substrate 100. In this case, the device region or sensing region 102 is substantially and directly exposed without any other material layer formed thereon.
  • Next, a recess (or notch) 114 is formed along a direction from the upper surface 100 a towards the lower surface 100 b of the semiconductor substrate 100. In one embodiment, the recess 114 completely penetrates the semiconductor substrate 100 and extends into the carrier substrate 110. Then, an insulating material is deposited overlying the upper surface 100 a and a sidewall and a bottom of the recess 114 and is patterned to be an insulating layer 116. Then, a patterned conducting layer 118 is formed overlying the insulating layer 116.
  • As shown in FIG. 1C, the conducting layer 118 is electrically connected to the conducting pad 104 and extends from the upper surface 100 a of the semiconductor substrate 100 to the sidewall and the bottom of the recess 114. If the recess 114 penetrates the semiconductor substrate 100 and extends into the carrier substrate 110, the conducting layer 118 and the insulating layer 116 are further extended into the carrier substrate 110. In addition, in one embodiment, in the carrier substrate 110, a portion of the conducting layer 118 and the insulating layer 116 are substantially horizontally disposed. That is, they are substantially parallel to the upper surface 100 a of the semiconductor substrate 100. This is due to the fact that, in one embodiment, the bottom of the formed recess 114 is substantially parallel to the upper surface 100 a of the semiconductor substrate 100.
  • Next, as shown in FIG. 1 C, in one embodiment, the carrier substrate 110 is diced from the bottom of the recess 114 to form a plurality of separate chip packages 10. Because the conducting layer 118, electrically connected to the conducting pad 104, extends overlying a sidewall of the chip package 10 (that is, extend from the upper surface 100 a of the semiconductor substrate 100 to a sidewall of the semiconductor substrate 100), the conducting path may be led downwardly from the upper surface 100 a of the semiconductor substrate 100 through the sidewall. In one embodiment, during the packaging process of the chip package 10, only two patterning processes are performed (that is, the patterning process of the insulating layer 116 and the patterning process of the conducting layer 118), which significantly simplifies the packaging process of the chip package and reduces fabrication time and cost. In addition, because the packaging process of the chip is significantly simplified, reliability of the formed chip package is also improved.
  • As shown in FIG. 1D, in one embodiment, the formed chip package 10 may be further disposed overlying a circuit board 120. In one embodiment, the circuit board 120 includes a contact pad 122 thereon, which is electrically connected to wires in the circuit board 120 and serves as a contact point with the device region or sensing region 102 in the chip package. As shown in the embodiment in FIG. 1D, a solder ball 124 may be formed on a corner between the carrier substrate 110 and the circuit board 120. The solder ball 124 is electrically connected to the conducting layer 118 and the contact pad 122 simultaneously, forming a conducting path between the conducting layer 118 and the contact pad 122.
  • It should be appreciated that embodiments of the invention are not limited to adopt the solder ball 124 to form the conducting path between the device region or sensing region 102 and the circuit board 120. In another embodiment, another conducting structure such as a conducting layer, conducting bump, or solder wire may be adopted to replace the solder ball 124. For example, in the embodiment shown in FIG. 2, a solder wire 126 is used to replace the solder ball 124. Thus, any conducting structure suitable for forming the conducting path between the contact pad 122 and the conducting layer 118 is within the scope of the embodiments of the present invention.
  • In the embodiment of the invention, a recess is formed on a front surface of the chip (that is, a same side that the device region or sensing region is formed on) and a conducting layer electrically connecting the device region or sensing region is formed along a sidewall of the recess. The desired conducting wire may be successfully formed and the required patterning process steps of the chip packaging process may be largely reduced. Thus, fabrication time and costs are significantly reduced.
  • While the invention has been described by way of example and in terms of the preferred embodiments, it is to be understood that the invention is not limited to the disclosed embodiments. To the contrary, it is intended to cover various modifications and similar arrangements (as would be apparent to those skilled in the art). Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements.

Claims (20)

1. A chip package, comprising:
a carrier substrate;
a semiconductor substrate having an upper surface and a lower surface, disposed overlying the carrier substrate;
a device region or sensing region located on the upper surface of the semiconductor substrate;
a conducting pad located on the upper surface of the semiconductor substrate;
a conducting layer electrically connected to the conducting pad and extending from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and
an insulating layer located between the conducting layer and the semiconductor substrate.
2. The chip package as claimed in claim 1, wherein the sidewall of the semiconductor substrate inclines toward the upper surface of the semiconductor substrate.
3. The chip package as claimed in claim 1, wherein the device region or sensing region is substantially and directly exposed.
4. The chip package as claimed in claim 1, wherein the conducting layer extends into the carrier substrate.
5. The chip package as claimed in claim 4, wherein the conducting layer extending into the carrier substrate comprises a portion, wherein the portion is substantially parallel to the upper surface of the semiconductor substrate.
6. The chip package as claimed in claim 1, wherein the insulating layer extends into the carrier substrate.
7. The chip package as claimed in claim 1, further comprising a circuit board, wherein the carrier substrate is disposed overlying the circuit board, and the conducting layer is electrically connected to a contact pad on the circuit board through a conducting structure.
8. The chip package as claimed in claim 7, wherein the conducting structure comprises a solder ball or a solder wire.
9. The chip package as claimed in claim 8, wherein the conducting structure is a solder ball, and the solder ball is located on a corner between the carrier substrate and the circuit board.
10. The chip package as claimed in claim 1, wherein the device region or sensing region comprises a fingerprint recognition region.
11. A method for forming a chip package, comprising:
providing a semiconductor substrate having an upper surface and a lower surface, wherein the semiconductor substrate comprises at least a device region or sensing region and at least a conducting pad on the upper surface of the semiconductor substrate;
providing a carrier substrate and disposing the semiconductor substrate overlying the carrier substrate;
forming a recess from the upper surface of the semiconductor substrate;
forming an insulating layer overlying the upper surface of the semiconductor substrate and within the recess;
forming a conducting layer overlying the insulating layer, wherein the conducting layer is electrically connected to the conducting pad and extends from the upper surface of the semiconductor substrate to a sidewall of the semiconductor substrate; and
dicing the carrier substrate from a bottom of the recess to form a plurality of separate chip packages.
12. The method for forming a chip package as claimed in claim 11, wherein the recess extends into the carrier substrate.
13. The method for forming a chip package as claimed in claim 11, wherein the conducting layer extends on the bottom of the recess.
14. The method for forming a chip package as claimed in claim 11, further comprising thinning the semiconductor substrate before the recess is formed.
15. The method for forming a chip package as claimed in claim 14, wherein the step of thinning the semiconductor substrate comprises:
disposing a temporary substrate overlying the upper surface of the semiconductor substrate before the semiconductor substrate is disposed overlying the carrier substrate; and
thinning the semiconductor substrate from the lower surface of the semiconductor substrate by using the temporary substrate as a support.
16. The method for forming a chip package as claimed in claim 15, further comprising removing the temporary substrate before the recess is formed.
17. The method for forming a chip package as claimed in claim 11, further comprising:
providing a circuit board having a contact pad;
disposing the carrier substrate overlying the circuit board; and
forming a conducting structure, wherein the conducting structure is electrically connected to the contact pad and the conducting layer.
18. The method for forming a chip package as claimed in claim 17, wherein the conducting structure comprises a solder ball or a solder wire.
19. The method for forming a chip package as claimed in claim 18, wherein the conducting structure is a solder ball, and the solder ball is located on a corner between the carrier substrate and the circuit board.
20. The method for forming a chip package as claimed in claim 11, wherein the device region or sensing region is substantially and directly exposed.
US13/105,775 2010-05-11 2011-05-11 Chip package and method for forming the same Active US8507321B2 (en)

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US13/105,775 US8507321B2 (en) 2010-05-11 2011-05-11 Chip package and method for forming the same
US13/950,101 US8952501B2 (en) 2010-05-11 2013-07-24 Chip package and method for forming the same
US13/959,567 US9030011B2 (en) 2010-05-11 2013-08-05 Chip package and method for forming the same
US13/964,999 US9209124B2 (en) 2010-05-11 2013-08-12 Chip package
US14/337,121 US9196594B2 (en) 2010-05-11 2014-07-21 Chip package and method for forming the same
US14/339,360 US9437478B2 (en) 2010-05-11 2014-07-23 Chip package and method for forming the same
US14/339,341 US8963312B2 (en) 2010-05-11 2014-07-23 Stacked chip package and method for forming the same
US14/339,355 US9355975B2 (en) 2010-05-11 2014-07-23 Chip package and method for forming the same
US14/339,323 US9425134B2 (en) 2010-05-11 2014-07-23 Chip package
US14/958,155 US9355970B2 (en) 2010-05-11 2015-12-03 Chip package and method for forming the same

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Cited By (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140210069A1 (en) * 2013-01-31 2014-07-31 Pixart Imaging Incorporation Chip package and manufacturing method thereof
CN103985683A (en) * 2013-02-08 2014-08-13 精材科技股份有限公司 Chip package
EP2838114A3 (en) * 2013-08-12 2015-04-08 Xintec Inc. Chip package
US9196594B2 (en) 2010-05-11 2015-11-24 Xintec Inc. Chip package and method for forming the same
US9209124B2 (en) 2010-05-11 2015-12-08 Xintec Inc. Chip package
US9355975B2 (en) 2010-05-11 2016-05-31 Xintec Inc. Chip package and method for forming the same
US9425134B2 (en) 2010-05-11 2016-08-23 Xintec Inc. Chip package
US9437478B2 (en) 2010-05-11 2016-09-06 Xintec Inc. Chip package and method for forming the same
JP2016534454A (en) * 2013-08-23 2016-11-04 フィンガープリント カーズ アーベー Connection pad for fingerprint detection system
US10096643B2 (en) 2014-07-01 2018-10-09 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US10108837B2 (en) 2014-07-01 2018-10-23 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US10133907B2 (en) 2014-07-01 2018-11-20 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US11004816B2 (en) * 2018-08-28 2021-05-11 Industrial Technology Research Institute Hetero-integrated structure

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8952501B2 (en) 2010-05-11 2015-02-10 Xintec, Inc. Chip package and method for forming the same
US9334158B2 (en) * 2012-05-22 2016-05-10 Xintec Inc. Chip package and method for forming the same
TWI549243B (en) * 2013-03-07 2016-09-11 精材科技股份有限公司 Semiconductor structure and manufacturing method thereof
TWI546921B (en) * 2013-03-14 2016-08-21 精材科技股份有限公司 Chip package and method for forming the same
CN104241213B (en) * 2013-06-21 2016-12-28 茂丞科技股份有限公司 Ultrathin Full face type sensing device and manufacture method thereof
CN204045565U (en) * 2013-07-24 2014-12-24 精材科技股份有限公司 Wafer encapsulation body
TWI576973B (en) * 2013-07-24 2017-04-01 精材科技股份有限公司 Chip package and method for forming the same
DE112013007584T5 (en) 2013-11-27 2016-08-18 Hewlett-Packard Development Company, L.P. Printhead with bondpad surrounded by a partition
US20150187728A1 (en) * 2013-12-27 2015-07-02 Kesvakumar V.C. Muniandy Emiconductor device with die top power connections
TWI575779B (en) * 2014-03-31 2017-03-21 精材科技股份有限公司 Chip package and method for forming the same
CN104332452B (en) * 2014-08-20 2017-04-19 深圳市汇顶科技股份有限公司 Chip packaging module
US9576177B2 (en) * 2014-12-11 2017-02-21 Fingerprint Cards Ab Fingerprint sensing device
TWI582677B (en) 2014-12-15 2017-05-11 精材科技股份有限公司 Chip package and manufacturing method thereof
CN105181230A (en) * 2015-08-06 2015-12-23 苏州敏芯微电子技术有限公司 Pressure sensor and packaging method thereof
CN107134435A (en) * 2016-02-29 2017-09-05 茂丞科技股份有限公司 Fingerprint sensing encapsulation module and its manufacture method
SG10201702885PA (en) * 2016-04-20 2017-11-29 Lam Res Corp Apparatus for measuring condition of electroplating cell components and associated methods
TWI617992B (en) * 2016-06-29 2018-03-11 關鍵禾芯科技股份有限公司 Fingerprint identification device andmanufacturing method thereof
CN106206423B (en) * 2016-09-08 2019-01-04 华进半导体封装先导技术研发中心有限公司 Chip package side wall plants ball technique
CN108121933B (en) * 2016-11-28 2022-02-25 中芯国际集成电路制造(上海)有限公司 Semiconductor device, preparation method thereof and electronic device
KR102435517B1 (en) * 2018-04-12 2022-08-22 에스케이하이닉스 주식회사 Chip stack package
TWI714328B (en) 2018-11-01 2020-12-21 精材科技股份有限公司 Manufacturing method of chip package and chip package
TWI739697B (en) * 2020-01-02 2021-09-11 精材科技股份有限公司 Chip package and method for forming the same
US11437337B2 (en) 2020-04-13 2022-09-06 Alibaba Group Holding Limited Using electrical connections that traverse scribe lines to connect devices on a chip

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7271024B2 (en) * 2005-05-25 2007-09-18 Siliconware Precision Industries Co., Ltd. Method for fabricating sensor semiconductor device
US20080001241A1 (en) * 2006-03-01 2008-01-03 Tessera, Inc. Structure and method of making lidded chips
US7424136B2 (en) * 2005-10-18 2008-09-09 Authentec, Inc. Finger sensing with enhanced mounting and associated methods

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2118994A1 (en) 1993-06-21 1994-12-22 Claude L. Bertin Polyimide-insulated cube package of stacked semiconductor device chips
JP2002151546A (en) 2000-11-08 2002-05-24 Mitsubishi Heavy Ind Ltd Electrode structure, signal take out structure and electrode forming method of ic chip
EP2287916A3 (en) * 2001-08-24 2012-01-25 Schott AG Method of contacting and housing integrated circuits
TWI232560B (en) * 2002-04-23 2005-05-11 Sanyo Electric Co Semiconductor device and its manufacture
JP2004363400A (en) 2003-06-05 2004-12-24 Sanyo Electric Co Ltd Semiconductor device and its manufacturing process
SG120123A1 (en) * 2003-09-30 2006-03-28 Micron Technology Inc Castellated chip-scale packages and methods for fabricating the same
US7199345B1 (en) 2004-03-26 2007-04-03 Itt Manufacturing Enterprises Inc. Low profile wire bond for an electron sensing device in an image intensifier tube
TWI264807B (en) * 2005-03-02 2006-10-21 Advanced Semiconductor Eng Semiconductor package and method for manufacturing the same
TWI313050B (en) 2006-10-18 2009-08-01 Advanced Semiconductor Eng Semiconductor chip package manufacturing method and structure thereof
CN101246893A (en) * 2007-02-13 2008-08-20 精材科技股份有限公司 Integrated circuit package body with large conductive area and its production method
EP2575166A3 (en) * 2007-03-05 2014-04-09 Invensas Corporation Chips having rear contacts connected by through vias to front contacts
TW200839982A (en) * 2007-03-19 2008-10-01 Xintec Inc Integrated circuit package and method for fabricating thereof
CN100552963C (en) * 2007-03-28 2009-10-21 精材科技股份有限公司 Integrated circuit package body and preparation method thereof
US20080315407A1 (en) 2007-06-20 2008-12-25 Vertical Circuits, Inc. Three-dimensional circuitry formed on integrated circuit device using two-dimensional fabrication
US8097929B2 (en) * 2008-05-23 2012-01-17 Chia-Sheng Lin Electronics device package and fabrication method thereof
JP5486376B2 (en) 2010-03-31 2014-05-07 ルネサスエレクトロニクス株式会社 Semiconductor device
US8952501B2 (en) * 2010-05-11 2015-02-10 Xintec, Inc. Chip package and method for forming the same
CN105244330B (en) 2010-05-11 2019-01-22 精材科技股份有限公司 Wafer encapsulation body
US8803326B2 (en) 2011-11-15 2014-08-12 Xintec Inc. Chip package
US8981578B2 (en) 2012-04-30 2015-03-17 Apple Inc. Sensor array package
US9281292B2 (en) 2012-06-25 2016-03-08 Intel Corporation Single layer low cost wafer level packaging for SFF SiP

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7271024B2 (en) * 2005-05-25 2007-09-18 Siliconware Precision Industries Co., Ltd. Method for fabricating sensor semiconductor device
US7424136B2 (en) * 2005-10-18 2008-09-09 Authentec, Inc. Finger sensing with enhanced mounting and associated methods
US20080001241A1 (en) * 2006-03-01 2008-01-03 Tessera, Inc. Structure and method of making lidded chips

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9209124B2 (en) 2010-05-11 2015-12-08 Xintec Inc. Chip package
US9437478B2 (en) 2010-05-11 2016-09-06 Xintec Inc. Chip package and method for forming the same
US9425134B2 (en) 2010-05-11 2016-08-23 Xintec Inc. Chip package
US9355975B2 (en) 2010-05-11 2016-05-31 Xintec Inc. Chip package and method for forming the same
US9196594B2 (en) 2010-05-11 2015-11-24 Xintec Inc. Chip package and method for forming the same
US9142529B2 (en) * 2013-01-31 2015-09-22 Pixart Imaging Incorporation Chip package with improved heat dissipation and manufacturing method thereof
US20140210069A1 (en) * 2013-01-31 2014-07-31 Pixart Imaging Incorporation Chip package and manufacturing method thereof
CN103985683A (en) * 2013-02-08 2014-08-13 精材科技股份有限公司 Chip package
EP2838114A3 (en) * 2013-08-12 2015-04-08 Xintec Inc. Chip package
JP2016534454A (en) * 2013-08-23 2016-11-04 フィンガープリント カーズ アーベー Connection pad for fingerprint detection system
US10096643B2 (en) 2014-07-01 2018-10-09 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US10108837B2 (en) 2014-07-01 2018-10-23 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US10133907B2 (en) 2014-07-01 2018-11-20 China Wafer Level Csp Co., Ltd. Fingerprint recognition chip packaging structure and packaging method
US11004816B2 (en) * 2018-08-28 2021-05-11 Industrial Technology Research Institute Hetero-integrated structure

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US9196594B2 (en) 2015-11-24
CN102244047B (en) 2015-09-23
TW201140779A (en) 2011-11-16
TWI541968B (en) 2016-07-11
CN105226035B (en) 2018-06-05
US9030011B2 (en) 2015-05-12
TWI619218B (en) 2018-03-21
US20130320532A1 (en) 2013-12-05
CN105244330B (en) 2019-01-22
CN105226035A (en) 2016-01-06
CN102244047A (en) 2011-11-16
TW201545297A (en) 2015-12-01
US20140328523A1 (en) 2014-11-06
TWI536525B (en) 2016-06-01
US8507321B2 (en) 2013-08-13

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