US20070227892A1 - Fluid injection apparatus and fabrication method thereof - Google Patents
Fluid injection apparatus and fabrication method thereof Download PDFInfo
- Publication number
- US20070227892A1 US20070227892A1 US11/696,094 US69609407A US2007227892A1 US 20070227892 A1 US20070227892 A1 US 20070227892A1 US 69609407 A US69609407 A US 69609407A US 2007227892 A1 US2007227892 A1 US 2007227892A1
- Authority
- US
- United States
- Prior art keywords
- layer
- injection apparatus
- forming
- fluid injection
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/02—Electroplating of selected surface areas
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/32—Coating with nickel, cobalt or mixtures thereof with phosphorus or boron
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/31—Coating with metals
- C23C18/42—Coating with noble metals
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/48—After-treatment of electroplated surfaces
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/54—Electroplating of non-metallic surfaces
- C25D5/56—Electroplating of non-metallic surfaces of plastics
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Mechanical Engineering (AREA)
- Particle Formation And Scattering Control In Inkjet Printers (AREA)
- Weting (AREA)
- Chemically Coating (AREA)
Abstract
A method for forming a fluid injection apparatus is disclosed. A patterned sacrificial layer is formed overlying a substrate. A electroplate seed layer is formed on the patterned sacrificial layer. A structural layer is formed overlying the electroplate seed layer and the substrate. The structural layer is patterned to form a nozzle. The electroplate seed layer in the nozzle is removed. The sacrificial layer is removed to form a fluid chamber. A protective layer is formed to selectively cover the structural layer and the electroplate seed layer.
Description
- 1. Field of the Invention
- The invention relates to a fluid injection apparatus and fabrication methods thereof, and more particularly to a micro fluid injection apparatus and fabrication methods thereof.
- 2. Description of the Related Art
- Micro fluid injection apparatuses have been widely used in digital apparatuses, such as inkjet printers or others. With the development of micro system engineering, micro fluid injection apparatuses are used in a wide variety of applications, such as fuel injection systems, cell sorting, drug delivery systems, print lithography or micro jet propulsion systems.
-
FIG. 1 shows a conventionalfluid injection apparatus 100. Referring toFIG. 1 , afluid chamber 104 and amanifold 106 are formed in asubstrate 102. Anelectroplate seed layer 108 is formed on thesubstrate 102, and astructural layer 110 is formed on theelectroplate seed layer 108. A portion of theelectroplate seed layer 108, is however, exposed, thus, contacting ink in thefluid injection apparatus 100. The electroplate seed layer reacts with the ink, such that the ink deteriorates and theelectroplate seed layer 108 peels off. - A detailed description is given in the following embodiments with reference to the accompanying drawings. These and other problems are generally solved or circumvented, and technical advantages are generally achieved, by preferred illustrative embodiments of the invention, which provide a fluid injection apparatus.
- A method for forming a fluid injection apparatus is disclosed. An embodiment of method for forming a fluid injection device comprises forming a patterned sacrificial layer is overlying on a substrate. An electroplate seed layer is formed on the patterned sacrificial layer. A structural layer is formed overlying the electroplate seed layer and the substrate. The structural layer is patterned to form a nozzle. The electroplate seed layer in the nozzle is removed. The sacrificial layer is removed to form a fluid chamber. A protective layer is formed to selectively cover the structural layer and the electroplate seed layer.
- The invention further provides a method for forming a fluid injection apparatus. A patterned sacrificial layer is formed overlying a substrate. A electroplate seed layer is formed to at least cover the patterned sacrificial layer. A structural layer is formed overlying the electroplate seed layer and the substrate by electroplating. The structural layer is patterned to form a nozzle. The electroplate seed layer in the nozzle is removed. The substrate is patterned to form a manifold exposing the sacrificial layer. The sacrificial layer is removed to form a fluid chamber. A protective layer is formed to cover the structural layer and the electroplate seed layer by electroless plating, and fills an interface between the structural layer and the electroplate seed layer, wherein the protective layer comprises a nickel layer directly contacting the structural layer and the electroplate seed layer, and a gold layer overlying the nickel layer.
- The invention further provides a fluid injection apparatus, comprising a substrate, a structural layer disposed overlying the substrate to form a fluid chamber, wherein the structural layer comprises a nozzle, a electroplate seed layer disposed on an inner sidewall of the fluid chamber, and a protective layer having chemical resistance covering the electroplate seed layer, the structural layer and a interface therebetween.
- The invention can be more fully understood by reading the subsequent detailed description and examples with references made to the accompanying drawings, wherein:
-
FIG. 1 shows a conventional fluid injection apparatus. -
FIG. 2A˜FIG . 2F show intermediate cross sections of a fluid injection apparatus of an embodiment of the invention. - The following description discloses the best-contemplated mode of carrying out the invention. This description is made for the purpose of illustrating the general principles of the invention and should not be taken in a limiting sense. The scope of the invention is best determined by reference to the appended claims.
- In this specification, expressions such as “overlying the substrate”, “above the layer”, or “on the film” simply denote a relative positional relationship with respect to the surface of the base layer, regardless of the existence of intermediate layers. Accordingly, these expressions may indicate not only the direct contact of layers, but also, a non-contact state of one or more laminated layers.
-
FIG. 2A˜FIG . 2F show intermediate cross sections of a fluid injection apparatus of an embodiment of the invention. Referring toFIG. 2A , asubstrate 200, such as silicon substrate or glass substrate, is provided. Preferably, thesubstrate 200 is a silicon substrate. Agate 202, for example comprising polysilicon or metal, is formed on thesubstrate 200. Next, a firstdielectric layer 204, such as silicon oxide, silicon nitride or silicon oxynitride, is formed to cover thegate 202 and a portion of thesubstrate 200. A firstconductive layer 206, such as Al or Cu, is formed on the firstdielectric layer 204 and a portion of thesubstrate 200, wherein a portion of the firstconductive layer 206 on opposite sides of thegate 202 respectively acts as asource 207 and adrain 209. Thegate 202, thesource 207, thedrain 209 and other related elements constitute afluid control device 213 of an embodiment of the invention. - Thereafter, a second
dielectric layer 208, such as silicon oxide, silicon nitride or silicon oxynitride, is formed on a portion of the firstconductive layer 206, the firstdielectric layer 204 and thesubstrate 200. It is noticed that the seconddielectric layer 208 exposes a portion of the firstconductive layer 206 and thedrain 209 to form a via. Aresistance layer 216 is formed to cover a portion of the firstconductive layer 206 and thesource 207. Next, a secondconductive layer 218, such as Al or Cu, is formed on theresistance layer 216, wherein the secondconductive layer 218 directly contacts theresistance layer 216. Next, lithography and etching are utilized to pattern the secondconductive layer 218 and theresistance layer 216. Thereafter, a portion of the secondconductive layer 218 overlying a heating device area is etched to expose a portion of theresistance layer 216. Thus, theresistance layer 216 and the firstconductive layer 206 thereunder constitute aheating device 215. Apassivation layer 220, such as SiC or SiN, is formed on the secondconductive layer 218 and theresistance layer 216, and a metalprotective layer 222, such as Ta, is formed on a portion of theresistance layer 216 overlying theheating device 215. Thereafter, thepassivation layer 222 is patterned to form acontact pad 217. - Next, dielectric materials, such as oxide, or a macromolecular compound, such as photoresist is formed on the
first side 201 of thesubstrate 200 by, for example deposition or coating, and then patterned by lithography and etching to form asacrificial layer 224. In this embodiment of the invention, the first side indicates the side where thefluid controlling device 213 is disposed. Preferably, thesacrificial layer 224 is about 2 μm˜100 μm thick. - Referring to
FIG. 2B , aelectroplate seed layer 226 is formed on thepassivation layer 220 and thesacrificial layer 224 by, for example plasma vapor deposition. Preferably, theelectroplate seed layer 226 comprises a Ti layer and a Cu layer disposed on the Ti layer. The Ti layer, preferably having a thickness of less than about 1000 Å, is for increasing adhesion between theelectroplate seed layer 226 and a layer thereunder. The Cu layer, preferably having a thickness of about 2000 Ř8000 Å, is for electroplate seeding. Alternatively, in another embodiment of the invention, theelectroplate seed layer 226 comprises a Ti layer and a Ni layer disposed on the Ti layer. - Referring to
FIG. 2C , photoresist materials are deposited on theelectroplate seed layer 226 and thepad 217, and then patterned to form a patternedphotoresist layer 228 at a location predetermined to form a nozzle. - Next, a
structural layer 230, for example comprising Ni, is formed on theelectroplate seed layer 226 by, for example an electroplating process, wherein the portion of theelectroplate seed layer 226 covered by the patterned resistlayer 228 is not reacted in the electroplating solution during the electroplating process. Thus, thestructural layer 230 is formed on a portion of theelectroplate seed layer 226 uncovered by the patterned resistlayer 228. Preferably, thestructural layer 230 is about 5 μm˜100 μm thick. - Referring to
FIG. 2D , the patternedphotoresist layer 228 is removed by, for example development, stripper or plasma ashing, and anozzle 232 in thestructural layer 230 is formed. Next, a portion of theelectroplate seed layer 226 within thenozzle 232 is removed by, for example etching. Note that formation of thenozzle 232 is not limited to the described method. Thenozzle 232 can also be formed by patterning thestructural layer 230 with lithography and etching. Preferably, thestructural layer 230 is about 10 μm˜100 μm thick. - Referring to
FIG. 2E , thesecond side 203 of thesubstrate 200 is patterned by, for example, photolithography, etching and/or sand blasting to form a manifold 234, wherein thesacrificial layer 224 is exposed. Next, thesacrificial layer 224 is removed through the manifold 234 by, for example etching, to form afluid chamber 236 connected to themanifold 234. The invention, however, is not limited thereto. Thesacrificial layer 234 can be removed through thenozzle 232 before formation of themanifold 234. When thesacrificial layer 234 is formed of macromolecular compound, it can be removed by plasma ashing or stripper. - Next, referring to
FIG. 2F , aprotective layer 238, such as a stack of Ni layer and a Au layer, is formed to selectively cover thestructural layer 230, the exposedelectroplate seed layer 226 and/or the interface thereof by electroless plating. Preferably theprotective layer 238 is about 3000 Ř8000 Šthick. Note that theprotective layer 238 is required to have good adhesion tostructural layer 230 and theelectroplate seed layer 226. The process for forming theprotective layer 238 can comprise the steps below. First, a nickel layer is formed on thestructural layer 230 and the exposedelectroplate seed layer 226 by electroless plating. Next, a gold layer is formed on the nickel layer by electroless plating. Thus, theprotective layer 238 comprising the nickel layer having good adhesion to thestructural layer 230 thereunder, and the gold layer having good chemical resistance is formed. - Since the
structural layer 230, theelectroplate seed layer 226 and/or the interface thereof are covered by theprotective layer 238 having good chemical resistance, the structure of thefluid chamber 236 and themanifold 234 of the fluid injection apparatus are not easily eroded when contacting to a ink for a long duration. Thus, the fluid injection apparatus may have higher stability and increased life. - While the invention has been described by way of example and in terms of the preferred embodiments, it is to be understood that the invention is not limited to the disclosed embodiments. To the contrary, it is intended to cover various modifications and similar arrangements (as would be apparent to those skilled in the art). Therefore, the scope of the appended claims should be accorded the broadest interpretation so as to encompass all such modifications and similar arrangements.
Claims (20)
1. A method for forming a fluid injection apparatus, comprising:
providing a substrate;
forming a patterned sacrificial layer overlying the substrate;
forming a electroplate seed layer, at least covering the patterned sacrificial layer;
forming a structural layer overlying the electroplate seed layer and the substrate;
patterning the structural layer to form a nozzle;
removing the electroplate seed layer in the nozzle;
removing the sacrificial layer to form a fluid chamber; and
forming a protective layer, selectively covering the structural layer and the electroplate seed layer.
2. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein the protective layer has chemical resistance.
3. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein the electroplate seed layer comprising a Ti layer and a Cu layer overlying the Ti layer.
4. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein the protective layer has good adhesion to the structural layer and the electroplate seed layer.
5. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein the protective layer comprises a nickel layer directly contacting the structural layer and the electroplate seed layer, and a gold layer overlying the nickel layer.
6. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein forming a protective layer, selectively covering the structural layer and the electroplate seed layer is accomplished by electroless plating.
7. The method for forming a fluid injection apparatus as claimed in claim 1 , wherein the structural layer comprises nickel.
8. The method for forming a fluid injection apparatus as claimed in claim 1 , further comprising patterning the substrate to form a manifold connecting the fluid chamber.
9. The method for forming a fluid injection apparatus as claimed in claim 1 , before forming a patterned sacrificial layer overlying the substrate, further comprising forming a fluid driving device overlying the substrate.
10. A method for forming a fluid injection apparatus, comprising:
providing a substrate;
forming a patterned sacrificial layer overlying the substrate;
forming a electroplate seed layer, at least covering the patterned sacrificial layer;
electroplating a structural layer overlying the electroplate seed layer and the substrate;
patterning the structural layer to form a nozzle;
removing the electroplate seed layer in the nozzle;
patterning the substrate to form a manifold exposing the sacrificial layer;
removing the sacrificial layer to form a fluid chamber; and
electroless plating a protective layer, covering the structural layer and the electroplate seed layer, and filling a interface between the structural layer and the electroplate seed layer, wherein the protective layer comprises a nickel layer directly contacting the structural layer and the electroplate seed layer, and a gold layer overlying the nickel layer.
11. The method for forming a fluid injection apparatus as claimed in claim 10 , wherein the patterned sacrificial layer comprises polymer.
12. The method for forming a fluid injection apparatus as claimed in claim 10 , wherein the structural layer comprises nickel.
13. A fluid injection apparatus, comprising:
a substrate;
a structural layer disposed overlying the substrate to form a fluid chamber, wherein the structural layer comprises a nozzle;
a electroplate seed layer disposed on an inner sidewall of the fluid chamber; and
a protective layer having chemical resistance covering the electroplate seed layer, the structural layer and a interface therebetween.
14. The fluid injection apparatus as claimed in claim 13 , wherein the electroplate seed layer comprises a Ti layer and a Cu layer overlying the Ti layer.
15. The fluid injection apparatus as claimed in claim 13 , wherein the protective layer has good adhesion to the structural layer and the electroplate seed layer.
16. The fluid injection apparatus as claimed in claim 13 , wherein the protective layer comprises a nickel layer directly contacting the structural layer and the electroplate seed layer, and a gold layer overlying the nickel layer.
17. The fluid injection apparatus as claimed in claim 13 , wherein the structural layer comprises nickel.
18. The fluid injection apparatus as claimed in claim 13 , wherein the substrate is a silicon substrate.
19. The fluid injection apparatus as claimed in claim 13 , further comprising a fluid driving device disposed overlying the substrate.
20. The fluid injection apparatus as claimed in claim 13 , further comprising a manifold disposed in the substrate, connecting the fluid chamber.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TWTW95111933 | 2006-04-04 | ||
TW095111933A TWI272190B (en) | 2006-04-04 | 2006-04-04 | Fluid injection apparatus and fabrication thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
US20070227892A1 true US20070227892A1 (en) | 2007-10-04 |
Family
ID=38441173
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US11/696,094 Abandoned US20070227892A1 (en) | 2006-04-04 | 2007-04-03 | Fluid injection apparatus and fabrication method thereof |
Country Status (2)
Country | Link |
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US (1) | US20070227892A1 (en) |
TW (1) | TWI272190B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109402686A (en) * | 2018-11-22 | 2019-03-01 | 宁波华昊汽车饰件有限公司 | It is a kind of convenient for it is anti-plated use and anti-coating cleaning resistance plate tooling |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6886919B2 (en) * | 2002-10-21 | 2005-05-03 | Samsung Electronics Co., Ltd. | Monolithic ink-jet printhead having a tapered nozzle and method for manufacturing the same |
-
2006
- 2006-04-04 TW TW095111933A patent/TWI272190B/en not_active IP Right Cessation
-
2007
- 2007-04-03 US US11/696,094 patent/US20070227892A1/en not_active Abandoned
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6886919B2 (en) * | 2002-10-21 | 2005-05-03 | Samsung Electronics Co., Ltd. | Monolithic ink-jet printhead having a tapered nozzle and method for manufacturing the same |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109402686A (en) * | 2018-11-22 | 2019-03-01 | 宁波华昊汽车饰件有限公司 | It is a kind of convenient for it is anti-plated use and anti-coating cleaning resistance plate tooling |
Also Published As
Publication number | Publication date |
---|---|
TW200738476A (en) | 2007-10-16 |
TWI272190B (en) | 2007-02-01 |
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Legal Events
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AS | Assignment |
Owner name: BENQ CORPORATION, TAIWAN Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SHEN, GUANG-REN;CHEN, WEI-LIN;REEL/FRAME:019124/0544 Effective date: 20070321 |
|
STCB | Information on status: application discontinuation |
Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION |