US20020140074A1 - Contact member stacking system and method - Google Patents

Contact member stacking system and method Download PDF

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Publication number
US20020140074A1
US20020140074A1 US09/819,171 US81917101A US2002140074A1 US 20020140074 A1 US20020140074 A1 US 20020140074A1 US 81917101 A US81917101 A US 81917101A US 2002140074 A1 US2002140074 A1 US 2002140074A1
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contact
integrated circuit
members
packaged integrated
leads
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US6462408B1 (en
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James Wehrly
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Tamiras Per Pte Ltd LLC
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Entorian Technologies Inc
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Priority to US10/092,104 priority patent/US6806120B2/en
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Priority to US10/814,531 priority patent/US6893899B2/en
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Assigned to TAMIRAS PER PTE. LTD., LLC reassignment TAMIRAS PER PTE. LTD., LLC MERGER (SEE DOCUMENT FOR DETAILS). Assignors: OVID DATA CO. LLC
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/10Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers
    • H01L25/105Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices having separate containers the devices being of a type provided for in group H01L27/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/10All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/10All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/1011All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
    • H01L2225/1017All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support
    • H01L2225/1029All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement the lowermost container comprising a device support the support being a lead frame
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2225/00Details relating to assemblies covered by the group H01L25/00 but not provided for in its subgroups
    • H01L2225/03All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00
    • H01L2225/10All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers
    • H01L2225/1005All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00
    • H01L2225/1011All the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/648 and H10K99/00 the devices having separate containers the devices being of a type provided for in group H01L27/00 the containers being in a stacked arrangement
    • H01L2225/1047Details of electrical connections between containers
    • H01L2225/107Indirect electrical connections, e.g. via an interposer, a flexible substrate, using TAB
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Definitions

  • the present invention relates to aggregating integrated circuits and, in particular, to stacking integrated circuits.
  • a variety of techniques are used to stack integrated circuits. Some require that the circuits be encapsulated in special packages, while others use circuits in conventional packages. In some cases, the leads alone of packaged circuits have been used to create the stack and interconnect its constituent elements. In other techniques, structural elements such as rails are used to create the stack and interconnect the constituent elements.
  • Circuit boards in vertical orientations have been used to provide interconnection between stack elements.
  • U.S. Pat. No. Re. 36,916 to Moshayedi a technique is described for creating a multi-chip module from surface-mount packaged memory chips that purportedly uses sideboards to mount the assembly to the main or motherboard.
  • the devices are interconnected on their lead-emergent sides through printed circuit boards (PCBs) oriented vertically to a carrier or motherboard that is contacted by connective sites along the bottom edge of the PCBs.
  • PCBs printed circuit boards
  • Other systems purport to use sideboard structures such as Japanese Patent Laid-open Publication No. Hei 6-77644 which discloses vertical PCBs used as side boards to interconnect packaged circuit members of the stack.
  • rail-like structures used to provide interconnection and structural integrity to the aggregated stack.
  • the rails are either discrete elements that are added to the structure or are crafted from specific orientations of the leads of the constituent circuit packages.
  • U.S. Pat. No. 5,266,834 to Nishi et al. one depicted embodiment illustrates a stack created by selective orientation of the leads of particularly configured stack elements, while in U.S. Pat. No. 5,343,075 to Nishino, a stack of semiconductor devices is created with contact plates having connective lines on inner surfaces to connect the elements of the stack.
  • the flexible circuits include an array of flexible conductors supported by insulating sheets. Terminal portions of the flexible conductors are bent and positioned to interconnect appropriate leads of respective upper and lower IC packages.
  • the present invention provides a system and method for selectively stacking and interconnecting individual integrated circuit devices to create a high-density integrated circuit module. It is principally designed for use with memory circuits, but can be employed to advantage with any type of packaged and leaded integrated circuit where area conservation and use of duplicative circuitry are present considerations.
  • conventional thin small outline packaged (TSOP) memory circuits are vertically stacked one above the other.
  • the stack consists of two packaged integrated circuits (ICs), but alternatives may employ greater numbers of ICs.
  • the constituent IC elements act in concert to provide an assembly of memory capacity approximately equal to the sum of the capacities of the ICs that constitute the assembly.
  • the IC elements of the stack are electrically connected through individual contact members that connect corresponding leads of IC elements positioned adjacently in the stack.
  • the contact members are composed of lead frame material.
  • two TSOP memory circuits are differentially enabled by extension of a conductive runner from one contact member positioned at the no-connect (N/C) lead of the lower TSOP to another contact member connected to chip-enable lead of the upper TSOP.
  • a carrier frame of lead frame material is configured to present an opening into which opening project plural lead-like contact members that correspond to the leads of an IC element.
  • the contact members contact the leads of the lower IC element of the stack while the leads of the upper IC of the assembly contact the upper surfaces of the contact members.
  • the stack is assembled using typical surface mount equipment and, after assembly, the carrier portion of the frame is removed to leave the plurality of contact members in place between selected leads.
  • FIG. 1 is a cross-sectional view of a circuit module devised in accordance with the present invention.
  • FIG. 2 is a cross-sectional view of a connection between two integrated circuits in the embodiment depicted in FIG. 1.
  • FIG. 3 depicts a contact member according to a preferred embodiment of the present invention.
  • FIG. 4 is an upper plan view of the carrier frame of a preferred embodiment of the present invention.
  • FIG. 5 is a perspective view of a stacked module under construction according to a preferred method of the present invention.
  • FIG. 6 is an upper plan view of a stacked module under construction according to a preferred embodiment of the present invention.
  • FIG. 7 shows an enlarged detail from FIG. 5.
  • FIG. 8 depicts a sectional view of the contact member and conductive structure along line A-A of FIG. 6.
  • FIG. 9 depicts a sectional view of the contact member and conductive runner structure along line C-C of FIG. 6.
  • FIG. 10 depicts a sectional view of the contact member and conductive runner structure along line B-B of FIG. 6.
  • FIG. 11 depicts a carrier frame bed employed by a preferred embodiment of the present invention.
  • FIG. 1 depicts a high-density memory module 10 devised in accordance with the present invention.
  • the present invention is adaptable to a variety of IC circuits and, in its preferred implementation, memory circuits of a variety of capacities.
  • Module 10 is created with upper IC 12 and lower IC 14 .
  • ICs 12 and 14 are, in the depicted preferred embodiment, plastic encapsulated memory circuits disposed in thin small outline packages known as TSOPs.
  • Other package types may be used with the present invention as well as, packaged circuits other than memories, but, as described here as preferred examples, the invention is advantageously implemented with memories in TSOP packaging.
  • Each IC has a lower surface 16 , upper surface 18 and periphery 20 .
  • Each of ICs 12 and 14 include an integrated circuit 26 encapsulated by a plastic body 22 .
  • contact members 24 provide connection between corresponding leads on ICs 12 and 14 .
  • the bodies 20 of IC 12 and IC 14 are in direct contact with top surface 18 of lower IC 14 in direct contact with lower surface 16 of upper IC 12 .
  • a thermal media or adhesive may be employed to encourage heat transference between ICs 12 and 14 in the thermal path to a mounting board.
  • leads such as illustrated lead 22 , provide a connective pathway for the electronics of the circuitry chip 26 embedded within plastic casing 23 of exemplar IC 12 .
  • Lead 22 of upper IC 12 is shown as having foot 30 , shoulder 34 and a transit section 36 .
  • Shoulder 34 can extend from and include the planar part of lead 22 emergent from peripheral wall 20 (i.e., the “head” of the shoulder identified by reference 35 ) to the end of the curvature into transit section 36 .
  • Lead 22 of lower IC 14 is referenced to illustrate the outer surface 28 and inner surface 32 present in leads 22 of both upper IC 12 and lower IC 14 .
  • Cuter surface 28 and inner surface 32 extend along the topological features of foot, transit section and shoulder and head identified with respect to lead 22 of upper IC 12 and it will be understood by those of skill in the art that the two surfaces, inner and outer, are exhibited by leads of TSOPs and other leaded packaged integrated circuits. These features of leads 22 are present in conventional TSOP packaged memory circuits available from most major suppliers of memories such as Samsung and Micron Technology, for example.
  • Foot 30 is provided to allow the mounting of the TSOP on the surface of a printed circuit or other carrier or signal transit board Shoulder 34 arises from providing foot 30 for surface mount connection of the IC, while transit section 36 of lead 22 connects shoulder 34 with foot 30 .
  • lead 22 and, in particular, transit section 36 are surfaces from which heat from internal chip 26 is dissipated by local air convection. Transit section 36 is often a substantially straight path but may exhibit curvature.
  • the present invention interposes contact members such as exemplar contact member 24 shown in FIG. 2 between selected leads of module 10 .
  • a contact member is disposed between each pair of corresponding leads in the assembly.
  • contact member 24 is comprised of lead frame material.
  • a material known in the art as alloy 42 is one preferred material for contact members 24 . It should be recognized, however, that other conductive materials may be used for contact members 24 .
  • contact member 24 is derived from a frame carrier, the configuration of a contact member 24 exhibits an approximately rectangular cross-section as shown at reference 39 in FIG. 3 and has first and second major surfaces identified by reference numerals 40 and 41 , respectively.
  • first major surface 40 of contact member 24 is disposed to contact inner surface 32 of lead 22 of upper IC 12 and second major surface 41 of contact member 24 is disposed to contact outer surface 28 of lead 22 of lower IC 14 .
  • This contact between contact member 24 and leads 22 is realized, in a preferred embodiment, with solder at the contact therebetween.
  • illustrated contact member 24 contacts foot 30 of example lead 22 of upper IC 12 and shoulder 34 of example lead 22 of lower IC 14 .
  • contact member 24 is configured to fit beneath lead 22 of upper IC 12 and above lead 22 of lower IC 14 . While being in contact with the leads, it should be understood that the contact members 24 (as well as later described modified contact members 25 and 27 ) may have an extent greater or lesser as well as coincident with the feet of the leads of ICs 12 and 14 .
  • contact member 24 does not lift lower surface 16 of upper IC 12 from upper surface 18 of lower IC 14 when positioned to contact the inner surface 32 of lead 22 of upper IC 12 and outer surface 28 of lead 22 of lower IC 14 .
  • contact member 24 does not lift lower surface 16 of upper IC 12 from upper surface 18 of lower IC 14 when positioned to contact the inner surface 32 of lead 22 of upper IC 12 and outer surface 28 of lead 22 of lower IC 14 .
  • thermally conductive media adhesives or layers between ICs 12 and 14 but the consequent distancing between lower surface 16 of upper IC 12 from upper surface 18 of lower IC 14 is a function of that interposed layer.
  • FIG. 4 depicts a carrier frame 42 employed in a preferred embodiment of the present invention to construct module 10 .
  • carrier frame 42 has a window 44 into which extend from body 46 of carrier frame 42 , a plurality of contact members 24 .
  • carrier frame 42 is photo-etched or created with progressive die forming. If photo-etched, frame 42 will be further processed through a forming die.
  • Use of known material such as alloy 42 for carrier frame 42 allows coefficients of thermal expansion to be matched with the ICs employed in the module.
  • IC 12 is positioned to make contact with the first major surfaces 40 of contact members 24 with the inner surfaces 32 of the feet 30 of its leads 22 .
  • Carrier frame 42 is set upon lower IC 14 to realize contact between the outer surfaces 28 of leads 22 of lower IC 14 and the second major surfaces 41 of contact members 24 .
  • pick & place and other similar tools provide well known techniques for implementing the assembly step in the method of the present invention.
  • the connections are solder realized through any of several well-known methods including solder flux and reflow oven for example.
  • the contact members are cut-away from carrier frame 42 to free the assembled module 10 .
  • the body portion 46 of the frame 42 is removed after assembly by cutting, punching, milling, laser trimming or any of the techniques well understood in the art.
  • Carrier frame 42 may provide dimples or other similar features for simplified removal of the module.
  • Conductive runner 48 extends, in a preferred embodiment, from a modified contact member that corresponds to a no-connect lead of the constituent ICs of the module to a modified contact member that corresponds in position to the chip-enable lead of the upper ICs of module 10 .
  • Such conductive runners can be used for isolation or selective enablement on either side of the module where appropriate.
  • conductive runner 48 extends from N/C lead number 15 to chip-enable (CE) lead number 19 .
  • CE chip-enable
  • conductive runner 48 can contact the N/C lead of either the lower IC or both ICs, but contacts only the CE lead of upper IC 12 . Consequently, the signal to enable upper IC 12 of module 10 can be applied to the N/C lead of lower IC 14 and conveyed by conductive runner 48 to the CE lead of upper IC 12 .
  • Other similar enablement schemes can be effectuated with conductive runner 48 positioned to provide differential enablement corresponding to the topology and internals of the ICs that make up module 10 .
  • FIG. 5 is a perspective view of a stacked module under construction according to a preferred method of the present invention.
  • Carrier frame 42 is shown having multiple contact members 24 extending into window 44 .
  • Lower IC 14 is positioned to allow contact members 24 to contact the outer surfaces 28 of leads 22
  • upper IC 12 is set down on carrier frame 42 to allow contact members 24 to contact inner surfaces 32 of leads 22 .
  • FIG. 6 is an upper plan view of a stacked module under construction according to a preferred embodiment of the present invention.
  • FIG. 6 depicts upper IC 12 placed upon the array of contact members 24 that extend into window 44 from carrier frame 42 .
  • FIG. 7 shows an enlarged detail depicting an area that illustrates the conductive runner 48 .
  • Depicted lead 22 (15) is the lead of upper IC 12 at position 15 along line A-A of FIG. 6.
  • Lead 22 (15) is a N/C lead as is the corresponding lead 22 (15) of lower IC 14 shown positioned below modified contact member 25 that merges into conductive runner 48 shown extending behind leads 22 (16) , 22 (17) , 22 (18) , and 22 (19) to merge with modified contact member 27 .
  • Depicted lead 22 (19) is the lead of upper IC 12 at position 19 along line B-B of FIG. 6 and is, in a preferred embodiment, the chip-enable lead for upper IC 12 . As shown in further detail in later FIG.
  • modified contact member 27 does not contact the corresponding lead 22 (19) of lower IC 14 . Consequently, a chip-enable signal intended to enable upper IC 12 , may be applied to lead 22 (15) of lower IC 14 through that lead's contact with a main or motherboard. That enable signal may then be conveyed through conductive runner 48 to lead 22 (19) of upper IC 12 .
  • FIG. 8 depicts a sectional view of the contact member and conductive structure along line A-A of FIG. 6.
  • FIG. 8 illustrates the contact member and lead relationship at lead 22 (15) shown earlier in FIG. 7.
  • modified contact member 25 contacts corresponding leads 22 (15) of upper and lower ICs 12 and 14 , respectively.
  • conductive runner 48 merges into modified contact member 25 to convey a chip enable signal supplied to lead 22 (15) of lower IC 14 to chip enable lead 22 (19) of upper IC 12 .
  • modified contact member 25 may, in alternative embodiments, contact just lead 22 (15) of lower IC 14 .
  • Modified contact member 25 need merely be in position to acquire a chip-enable signal supplied to a N/C lead of lower IC 14 .
  • module 10 is mounted to a main board through mounting the feet of the leads of the lower IC of module 10 .
  • upper IC 12 and lower IC 14 can be separated by a thermal material 50 which, in a preferred embodiment, may be a thermally conductive adhesive although other thermally conductive materials may occupy this position.
  • FIG. 9 depicts a sectional view of the contact member and conductive runner structure along line C-C of FIG. 6. As shown in FIG. 9, contact member 24 contacts corresponding leads 22 (17) of upper IC 12 and lower IC 14 . Also shown is conductive runner 48 as it passes underneath lead 22 (17) and distanced from contact with contact member 24 at this site.
  • FIG. 10 depicts a sectional view of the contact member and conductive runner structure along line B-B of FIG. 6.
  • modified contact member 27 is shown in contact with lead 22 (19) of upper IC 12 .
  • the signal applied to modified contact 25 shown in FIG. 8 has been conveyed along conductive runner 48 that merges with modified contact member 27 in the vicinity of lead 22 (19) .
  • modified contact member 27 is distanced from lead 22 (19) of lower IC 14 by insulative material 51 although in alternative constructions, other methods of avoiding contact are available such as simple distance.
  • Lead 22 (19) is the chip-enable position on a TSOP in a preferred embodiment.
  • the chip-enable signal intended for enablement of upper IC 12 has been applied to foot 30 of lead 22 (15) of lower IC 14 and conveyed along conductive runner 48 to modified contract member 27 which conveys the enable signal to the chip-enable lead of upper IC 12 .
  • contact member structures 24 provide structural and fabrication advantages not found in previous structures. For example, such a method and structure exploits the existing lead assemblage of the constituent ICs to craft a module defining cage or framework.
  • leads are provided by the TSOP manufacturer to enable surface mounting (SMT) of the TSOP
  • contact member structures 24 of the present invention provides advantages to the lead assemblage, namely, a low capacitance conductive pathway that allows superior thermal performance and simple stack construction and interconnectivity with structural integrity and appropriate height.
  • FIG. 11 illustrates a lead frame-material carrier panel 52 consisting of multiple carrier frame areas 42 .
  • solder paste a combination of solder and flux
  • the solder paste is applied to one side of the carrier panel 52 .
  • the solder paste is applied to the members of the carrier panel that will become the contact members 24 .
  • upper IC 12 is positioned with its feet 30 in contact with the solder paste.
  • a common surface mount pick & place tool is suitable.
  • the assembly is then processed through a reflow oven to create solder joints at the contact areas.
  • solder paste is not applied to areas where no joint is intended.
  • the lower side of the carrier frame area 42 feature that will, in the finished preferred embodiment, become modified contact member 27 through which the chip select signal is applied to upper IC 12 at lead 22 (19) , no solder paste is applied.
  • Lower ICs 14 are placed onto the lower side of the carrier panel 52 so that the shoulder of IC leads 22 are in contact with the solder paste applied to contact members.
  • the assembly is then processed again through a reflow oven.
  • the lower side may be processed first followed by the upper side assembly process.
  • a holding fixture is incorporated to hold and locate the ICs for either side.
  • Solder paste is then applied to both sides of carrier panel 52 which is subsequently placed into the fixture with the leads of the ICs in the fixture contacting one side of the carrier panel 52 .
  • the other side of the carrier panel is then populated with pick & place techniques.
  • the entire assembly is then processed through a reflow oven creating solder connections on both upper and lower sides with one pass.
  • the resulting assembly is an array of stacked devices inter-connected by the lead frame carrier.
  • Individual modules 10 are then singulated from the carrier panel or frame at the place where the ends of leads 22 of upper ICs 12 meet the lead frame carrier area 42 . This can be accomplished by any of several known methods including but not limited to mechanical punch, abrasive saw, milling, laser cutting, and mechanical fatigue.

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

A system and method for selectively stacking and interconnecting individual integrated circuit devices to create a high-density integrated circuit module. In a preferred embodiment, conventional thin small outline packaged (TSOP) memory circuits are vertically stacked one above the other. The constituent IC elements act in concert to provide an assembly of memory capacity approximately equal to the sum of the capacities of the ICs that constitute the assembly. The IC elements of the stack are electrically connected through individual contact members that connect corresponding leads of IC elements positioned adjacently in the stack. In a preferred embodiment, the contact members are composed of lead frame material. Methods for creating stacked integrated circuit modules are provided that provide reasonable cost, mass production techniques to produce modules. In a preferred method, a carrier frame of lead frame material is configured to present an opening into which opening project plural lead-like contact members that correspond to the leads of an IC element. The contact members contact the leads of the lower IC element of the stack while the leads of the upper IC of the assembly contact the upper surfaces of the contact members. The stack is assembled using typical surface mount equipment and, after assembly, the carrier portion of the frame is removed to leave the plurality of contact members in place between selected leads.

Description

    TECHNICAL FIELD
  • The present invention relates to aggregating integrated circuits and, in particular, to stacking integrated circuits. [0001]
  • BACKGROUND OF THE INVENTION
  • A variety of techniques are used to stack integrated circuits. Some require that the circuits be encapsulated in special packages, while others use circuits in conventional packages. In some cases, the leads alone of packaged circuits have been used to create the stack and interconnect its constituent elements. In other techniques, structural elements such as rails are used to create the stack and interconnect the constituent elements. [0002]
  • Circuit boards in vertical orientations have been used to provide interconnection between stack elements. For example, in U.S. Pat. No. Re. 36,916 to Moshayedi, a technique is described for creating a multi-chip module from surface-mount packaged memory chips that purportedly uses sideboards to mount the assembly to the main or motherboard. The devices are interconnected on their lead-emergent sides through printed circuit boards (PCBs) oriented vertically to a carrier or motherboard that is contacted by connective sites along the bottom edge of the PCBs. Other systems purport to use sideboard structures such as Japanese Patent Laid-open Publication No. Hei 6-77644 which discloses vertical PCBs used as side boards to interconnect packaged circuit members of the stack. [0003]
  • Others have stacked integrated circuits without casings or carrier plates. Electrical conductors are provided at the edges of the semiconductor bodies and extended perpendicularly to the planes of the circuit bodies. Such a system is shown in U.S. Pat. No. 3,746,934 to Stein. [0004]
  • Still others have stacked packaged circuits using interconnection packages similar to the packages within which the integrated circuits of the stack are contained to route functionally similar terminal leads in non-corresponding lead positions. An example is found in U.S. Pat. No. 4,398,235 to Lutz et al. Simple piggyback stacking of DIPs has been shown in U.S. Pat. No. 4,521,828 to Fanning. [0005]
  • Some more recent methods have employed rail-like structures used to provide interconnection and structural integrity to the aggregated stack. The rails are either discrete elements that are added to the structure or are crafted from specific orientations of the leads of the constituent circuit packages. For example, in U.S. Pat. No. 5,266,834 to Nishi et al., one depicted embodiment illustrates a stack created by selective orientation of the leads of particularly configured stack elements, while in U.S. Pat. No. 5,343,075 to Nishino, a stack of semiconductor devices is created with contact plates having connective lines on inner surfaces to connect the elements of the stack. [0006]
  • More sophisticated techniques have been recently developed for stacking integrated circuits. The assignee of the present invention has developed a variety of such techniques for stacking integrated circuits. In one such method, multiple conventional ICs are stacked and external leads are interconnected with one another by means of a rail assembly. The rails are made of flat strips of metal and the rails define apertures that receive the leads of the discrete IC packages. An example of this system is shown in U.S. Pat. No. 5,778,522 assigned to the assignee of the present invention. [0007]
  • An even more recent technique developed by the assignee of the present invention interconnects conventionally packaged ICs with flexible circuits disposed between stack elements. The flexible circuits include an array of flexible conductors supported by insulating sheets. Terminal portions of the flexible conductors are bent and positioned to interconnect appropriate leads of respective upper and lower IC packages. [0008]
  • Some of the previously described systems have required encapsulation of the constituent ICs in special packages. Still others have added rails that must be custom-fabricated for the application. Many have relied upon connections that substantially coincide with the vertical orientation of the stack and thus require more materials. Many techniques add excessive height to the stack. Others that use PCBs have inhibited heat dissipation of the stack. Most have deficiencies that add expense or complexity or thermal inefficiency to stacked integrated circuits. What is needed, therefore, is a technique and system for stacking integrated circuits that provides a thermally efficient, robust structure while not adding excessive height to the stack yet allowing production at reasonable cost with easily understood and managed materials and methods. [0009]
  • SUMMARY OF THE INVENTION
  • The present invention provides a system and method for selectively stacking and interconnecting individual integrated circuit devices to create a high-density integrated circuit module. It is principally designed for use with memory circuits, but can be employed to advantage with any type of packaged and leaded integrated circuit where area conservation and use of duplicative circuitry are present considerations. [0010]
  • In a preferred embodiment, conventional thin small outline packaged (TSOP) memory circuits are vertically stacked one above the other. The stack consists of two packaged integrated circuits (ICs), but alternatives may employ greater numbers of ICs. In a stacked module created in accordance with the present invention, the constituent IC elements act in concert to provide an assembly of memory capacity approximately equal to the sum of the capacities of the ICs that constitute the assembly. The IC elements of the stack are electrically connected through individual contact members that connect corresponding leads of IC elements positioned adjacently in the stack. In a preferred embodiment, the contact members are composed of lead frame material. In a preferred embodiment, two TSOP memory circuits are differentially enabled by extension of a conductive runner from one contact member positioned at the no-connect (N/C) lead of the lower TSOP to another contact member connected to chip-enable lead of the upper TSOP. [0011]
  • Methods for creating stacked integrated circuit modules are provided that provide reasonable cost, mass production techniques to produce modules. In a preferred method, a carrier frame of lead frame material is configured to present an opening into which opening project plural lead-like contact members that correspond to the leads of an IC element. The contact members contact the leads of the lower IC element of the stack while the leads of the upper IC of the assembly contact the upper surfaces of the contact members. The stack is assembled using typical surface mount equipment and, after assembly, the carrier portion of the frame is removed to leave the plurality of contact members in place between selected leads.[0012]
  • BRIEF DESCRIPTION OF THE DRAWINGS
  • FIG. 1 is a cross-sectional view of a circuit module devised in accordance with the present invention. [0013]
  • FIG. 2 is a cross-sectional view of a connection between two integrated circuits in the embodiment depicted in FIG. 1. [0014]
  • FIG. 3 depicts a contact member according to a preferred embodiment of the present invention. [0015]
  • FIG. 4 is an upper plan view of the carrier frame of a preferred embodiment of the present invention. [0016]
  • FIG. 5 is a perspective view of a stacked module under construction according to a preferred method of the present invention. [0017]
  • FIG. 6 is an upper plan view of a stacked module under construction according to a preferred embodiment of the present invention. [0018]
  • FIG. 7 shows an enlarged detail from FIG. 5. [0019]
  • FIG. 8 depicts a sectional view of the contact member and conductive structure along line A-A of FIG. 6. [0020]
  • FIG. 9 depicts a sectional view of the contact member and conductive runner structure along line C-C of FIG. 6. [0021]
  • FIG. 10 depicts a sectional view of the contact member and conductive runner structure along line B-B of FIG. 6. [0022]
  • FIG. 11 depicts a carrier frame bed employed by a preferred embodiment of the present invention.[0023]
  • DETAILED DESCRIPTION OF EMBODIMENTS
  • FIG. 1 depicts a high-[0024] density memory module 10 devised in accordance with the present invention. The present invention is adaptable to a variety of IC circuits and, in its preferred implementation, memory circuits of a variety of capacities. Module 10 is created with upper IC 12 and lower IC 14. Each of ICs 12 and 14 are, in the depicted preferred embodiment, plastic encapsulated memory circuits disposed in thin small outline packages known as TSOPs. Other package types may be used with the present invention as well as, packaged circuits other than memories, but, as described here as preferred examples, the invention is advantageously implemented with memories in TSOP packaging. Each IC has a lower surface 16, upper surface 18 and periphery 20. Each of ICs 12 and 14 include an integrated circuit 26 encapsulated by a plastic body 22. As shown, contact members 24 provide connection between corresponding leads on ICs 12 and 14. In this embodiment, due to the configuration of contact members 24, the bodies 20 of IC 12 and IC 14 are in direct contact with top surface 18 of lower IC 14 in direct contact with lower surface 16 of upper IC 12. In alternative embodiments, a thermal media or adhesive may be employed to encourage heat transference between ICs 12 and 14 in the thermal path to a mounting board.
  • As depicted in FIG. 2, emergent from package [0025] peripheral wall 20, leads such as illustrated lead 22, provide a connective pathway for the electronics of the circuitry chip 26 embedded within plastic casing 23 of exemplar IC 12. Lead 22 of upper IC 12 is shown as having foot 30, shoulder 34 and a transit section 36. Shoulder 34 can extend from and include the planar part of lead 22 emergent from peripheral wall 20 (i.e., the “head” of the shoulder identified by reference 35) to the end of the curvature into transit section 36. Lead 22 of lower IC 14 is referenced to illustrate the outer surface 28 and inner surface 32 present in leads 22 of both upper IC 12 and lower IC 14. Cuter surface 28 and inner surface 32 extend along the topological features of foot, transit section and shoulder and head identified with respect to lead 22 of upper IC 12 and it will be understood by those of skill in the art that the two surfaces, inner and outer, are exhibited by leads of TSOPs and other leaded packaged integrated circuits. These features of leads 22 are present in conventional TSOP packaged memory circuits available from most major suppliers of memories such as Samsung and Micron Technology, for example. Foot 30 is provided to allow the mounting of the TSOP on the surface of a printed circuit or other carrier or signal transit board Shoulder 34 arises from providing foot 30 for surface mount connection of the IC, while transit section 36 of lead 22 connects shoulder 34 with foot 30. In practice, lead 22 and, in particular, transit section 36 are surfaces from which heat from internal chip 26 is dissipated by local air convection. Transit section 36 is often a substantially straight path but may exhibit curvature.
  • The present invention interposes contact members such as [0026] exemplar contact member 24 shown in FIG. 2 between selected leads of module 10. In a preferred embodiment, a contact member is disposed between each pair of corresponding leads in the assembly. In a preferred embodiment, contact member 24 is comprised of lead frame material. A material known in the art as alloy 42 is one preferred material for contact members 24. It should be recognized, however, that other conductive materials may be used for contact members 24.
  • In a preferred embodiment, because [0027] contact member 24 is derived from a frame carrier, the configuration of a contact member 24 exhibits an approximately rectangular cross-section as shown at reference 39 in FIG. 3 and has first and second major surfaces identified by reference numerals 40 and 41, respectively. In a preferred embodiment of module 10, first major surface 40 of contact member 24 is disposed to contact inner surface 32 of lead 22 of upper IC 12 and second major surface 41 of contact member 24 is disposed to contact outer surface 28 of lead 22 of lower IC 14. This contact between contact member 24 and leads 22 is realized, in a preferred embodiment, with solder at the contact therebetween. In this depicted embodiment, illustrated contact member 24 contacts foot 30 of example lead 22 of upper IC 12 and shoulder 34 of example lead 22 of lower IC 14. In a preferred embodiment, contact member 24 is configured to fit beneath lead 22 of upper IC 12 and above lead 22 of lower IC 14. While being in contact with the leads, it should be understood that the contact members 24 (as well as later described modified contact members 25 and 27) may have an extent greater or lesser as well as coincident with the feet of the leads of ICs 12 and 14.
  • In a basic preferred embodiment, [0028] contact member 24 does not lift lower surface 16 of upper IC 12 from upper surface 18 of lower IC 14 when positioned to contact the inner surface 32 of lead 22 of upper IC 12 and outer surface 28 of lead 22 of lower IC 14. There are alternative embodiments of the present invention that employ thermally conductive media adhesives or layers between ICs 12 and 14, but the consequent distancing between lower surface 16 of upper IC 12 from upper surface 18 of lower IC 14 is a function of that interposed layer.
  • FIG. 4 depicts a [0029] carrier frame 42 employed in a preferred embodiment of the present invention to construct module 10. As shown in FIG. 4, carrier frame 42 has a window 44 into which extend from body 46 of carrier frame 42, a plurality of contact members 24. In a preferred embodiment, carrier frame 42 is photo-etched or created with progressive die forming. If photo-etched, frame 42 will be further processed through a forming die. Use of known material such as alloy 42 for carrier frame 42 allows coefficients of thermal expansion to be matched with the ICs employed in the module.
  • In a two-IC module, [0030] IC 12 is positioned to make contact with the first major surfaces 40 of contact members 24 with the inner surfaces 32 of the feet 30 of its leads 22. Carrier frame 42 is set upon lower IC 14 to realize contact between the outer surfaces 28 of leads 22 of lower IC 14 and the second major surfaces 41 of contact members 24. As those of skill will recognize, pick & place and other similar tools provide well known techniques for implementing the assembly step in the method of the present invention. The connections are solder realized through any of several well-known methods including solder flux and reflow oven for example. After assembly, the contact members are cut-away from carrier frame 42 to free the assembled module 10. The body portion 46 of the frame 42 is removed after assembly by cutting, punching, milling, laser trimming or any of the techniques well understood in the art. Carrier frame 42 may provide dimples or other similar features for simplified removal of the module.
  • [0031] Conductive runner 48 extends, in a preferred embodiment, from a modified contact member that corresponds to a no-connect lead of the constituent ICs of the module to a modified contact member that corresponds in position to the chip-enable lead of the upper ICs of module 10. Such conductive runners can be used for isolation or selective enablement on either side of the module where appropriate.
  • In a preferred embodiment that employs standard TSOPs as the constituent ICs of the module, [0032] conductive runner 48 extends from N/C lead number 15 to chip-enable (CE) lead number 19. To provide the selective enablement of the constituent ICs, conductive runner 48 can contact the N/C lead of either the lower IC or both ICs, but contacts only the CE lead of upper IC 12. Consequently, the signal to enable upper IC 12 of module 10 can be applied to the N/C lead of lower IC 14 and conveyed by conductive runner 48 to the CE lead of upper IC 12. Other similar enablement schemes can be effectuated with conductive runner 48 positioned to provide differential enablement corresponding to the topology and internals of the ICs that make up module 10.
  • FIG. 5 is a perspective view of a stacked module under construction according to a preferred method of the present invention. [0033] Carrier frame 42 is shown having multiple contact members 24 extending into window 44. Lower IC 14 is positioned to allow contact members 24 to contact the outer surfaces 28 of leads 22, while upper IC 12 is set down on carrier frame 42 to allow contact members 24 to contact inner surfaces 32 of leads 22.
  • FIG. 6 is an upper plan view of a stacked module under construction according to a preferred embodiment of the present invention. FIG. 6 depicts [0034] upper IC 12 placed upon the array of contact members 24 that extend into window 44 from carrier frame 42.
  • FIG. 7 shows an enlarged detail depicting an area that illustrates the [0035] conductive runner 48. Depicted lead 22 (15) is the lead of upper IC 12 at position 15 along line A-A of FIG. 6. Lead 22 (15) is a N/C lead as is the corresponding lead 22 (15) of lower IC 14 shown positioned below modified contact member 25 that merges into conductive runner 48 shown extending behind leads 22 (16), 22 (17), 22 (18), and 22 (19) to merge with modified contact member 27. Depicted lead 22 (19) is the lead of upper IC 12 at position 19 along line B-B of FIG. 6 and is, in a preferred embodiment, the chip-enable lead for upper IC 12. As shown in further detail in later FIG. 10, modified contact member 27 does not contact the corresponding lead 22 (19) of lower IC 14. Consequently, a chip-enable signal intended to enable upper IC 12, may be applied to lead 22 (15) of lower IC 14 through that lead's contact with a main or motherboard. That enable signal may then be conveyed through conductive runner 48 to lead 22 (19) of upper IC 12.
  • FIG. 8 depicts a sectional view of the contact member and conductive structure along line A-A of FIG. 6. FIG. 8 illustrates the contact member and lead relationship at [0036] lead 22 (15) shown earlier in FIG. 7. As shown in FIG. 8, modified contact member 25 contacts corresponding leads 22 (15) of upper and lower ICs 12 and 14, respectively. It should be understood that conductive runner 48 merges into modified contact member 25 to convey a chip enable signal supplied to lead 22 (15) of lower IC 14 to chip enable lead 22 (19) of upper IC 12. This is a preferred embodiment view, but those of skill in the art will recognize that modified contact member 25 may, in alternative embodiments, contact just lead 22 (15) of lower IC 14. Modified contact member 25 need merely be in position to acquire a chip-enable signal supplied to a N/C lead of lower IC 14. Conventionally, module 10 is mounted to a main board through mounting the feet of the leads of the lower IC of module 10. As shown in FIG. 8, upper IC 12 and lower IC 14 can be separated by a thermal material 50 which, in a preferred embodiment, may be a thermally conductive adhesive although other thermally conductive materials may occupy this position.
  • FIG. 9 depicts a sectional view of the contact member and conductive runner structure along line C-C of FIG. 6. As shown in FIG. 9, [0037] contact member 24 contacts corresponding leads 22 (17) of upper IC 12 and lower IC 14. Also shown is conductive runner 48 as it passes underneath lead 22 (17) and distanced from contact with contact member 24 at this site.
  • FIG. 10 depicts a sectional view of the contact member and conductive runner structure along line B-B of FIG. 6. As shown in FIG. 10, modified [0038] contact member 27 is shown in contact with lead 22 (19) of upper IC 12. The signal applied to modified contact 25 shown in FIG. 8 has been conveyed along conductive runner 48 that merges with modified contact member 27 in the vicinity of lead 22 (19). In a preferred embodiment, modified contact member 27 is distanced from lead 22 (19) of lower IC 14 by insulative material 51 although in alternative constructions, other methods of avoiding contact are available such as simple distance. Lead 22 (19) is the chip-enable position on a TSOP in a preferred embodiment. Consequently, the chip-enable signal intended for enablement of upper IC 12 has been applied to foot 30 of lead 22 (15) of lower IC 14 and conveyed along conductive runner 48 to modified contract member 27 which conveys the enable signal to the chip-enable lead of upper IC 12.
  • The provision of the contact member structures provides structural and fabrication advantages not found in previous structures. For example, such a method and structure exploits the existing lead assemblage of the constituent ICs to craft a module defining cage or framework. Although the leads are provided by the TSOP manufacturer to enable surface mounting (SMT) of the TSOP, employment of [0039] contact member structures 24 of the present invention provides advantages to the lead assemblage, namely, a low capacitance conductive pathway that allows superior thermal performance and simple stack construction and interconnectivity with structural integrity and appropriate height.
  • FIG. 11 illustrates a lead frame-[0040] material carrier panel 52 consisting of multiple carrier frame areas 42. In one method of a preferred embodiment of the invention, solder paste, a combination of solder and flux, is applied to one side of the carrier panel 52. The solder paste is applied to the members of the carrier panel that will become the contact members 24. Once the solder paste has been applied, upper IC 12 is positioned with its feet 30 in contact with the solder paste. As those of skill will recognize, although many techniques are available for that placement, a common surface mount pick & place tool is suitable. The assembly is then processed through a reflow oven to create solder joints at the contact areas.
  • The resulting assembly is inverted and solder paste applied to the lower surface of [0041] carrier panel 52. Solder paste is not applied to areas where no joint is intended. For example, on the lower side of the carrier frame area 42 feature that will, in the finished preferred embodiment, become modified contact member 27 through which the chip select signal is applied to upper IC 12 at lead 22 (19), no solder paste is applied. Lower ICs 14 are placed onto the lower side of the carrier panel 52 so that the shoulder of IC leads 22 are in contact with the solder paste applied to contact members. The assembly is then processed again through a reflow oven. Alternatively, the lower side may be processed first followed by the upper side assembly process.
  • In an alternative method, a holding fixture is incorporated to hold and locate the ICs for either side. Solder paste is then applied to both sides of [0042] carrier panel 52 which is subsequently placed into the fixture with the leads of the ICs in the fixture contacting one side of the carrier panel 52. The other side of the carrier panel is then populated with pick & place techniques. The entire assembly is then processed through a reflow oven creating solder connections on both upper and lower sides with one pass.
  • The resulting assembly is an array of stacked devices inter-connected by the lead frame carrier. [0043] Individual modules 10 are then singulated from the carrier panel or frame at the place where the ends of leads 22 of upper ICs 12 meet the lead frame carrier area 42. This can be accomplished by any of several known methods including but not limited to mechanical punch, abrasive saw, milling, laser cutting, and mechanical fatigue.
  • Although the present invention has been described in detail, it will be apparent that those skilled in the art that the invention may be embodied in a variety of specific forms and that various changes, substitutions and alterations can be made without departing from the spirit and scope of the invention. The described embodiments are only illustrative and not restrictive and the scope of the invention is, therefore, indicated by the following claims. [0044]

Claims (21)

We claim:
1. A circuit module comprised of:
a first packaged integrated circuit and a second packaged integrated circuit, each of the first and second packaged integrated circuits having an upper surface, a lower surface and a peripheral wall, emergent from first and second sides of said peripheral wall are leads that each have a shoulder and foot and an inner surface and an outer surface;
first and second contact members, each having a first major surface and a second major surface, the first contact member being disposed to provide electrical communication between corresponding first leads emergent from first sides of the first and second packaged integrated circuits, respectively and the second contact member being disposed to provide electrical communication between corresponding second leads emergent from second sides of the first and second packaged integrated circuits respectively by contact between the first major surface of the first contact member and the inner surface of the first lead of the first packaged integrated circuit and contact between the first major surface of the second contact member and the inner surface of the second lead of the first packaged integrated circuit while the second major surface of the first contact member is in contact with the outer surface of the first lead of the second packaged integrated circuit and the second major surface of the second contact member is in contact with the outer surface of the second lead of the second packaged integrated circuit to provided electrical communication between the first and second packaged integrated circuits of the module.
2. The module of claim 1 in which the contact between the first and second major surfaces of the contact members and the inner and outer surfaces of the first and second leads is electrical contact effectuated by solder.
3. The module of claim 2 in which the upper surface of the second packaged integrated circuit is in contact with the lower surface of the first packaged integrated circuit (FIRST ON TOP).
4. The module of claim 2 in which the upper surface of the second packaged integrated circuit is separated from the lower surface of the first packaged integrated circuit by thermal media.
5. A circuit module comprised of:
a first packaged integrated circuit in electrical communication with a second packaged integrated circuit, each of the first and second packaged integrated circuits having a peripheral wall, emergent from first and second sides of said peripheral wall are leads that each have an outer surface and an inner surface;
a plurality of individual contact members for providing the electrical communication between corresponding leads of the first and second packaged integrated circuits, the contact members being configured to have first and second major sides and being disposed to contact on their first major sides, the inner surface of leads of the first packaged integrated circuit and contact on their second major sides, the outer surface of leads of the second packaged integrated circuit.
6. The circuit module of claim 5 in which the first and second packaged integrated circuits each have upper and lower surfaces and the upper surface of the second packaged integrated circuit is in contact with the lower surface of the first packaged integrated circuit.
7. The circuit module of claim 5 in which the first and second packaged integrated circuits are separated by a thermal adhesive.
8. The circuit module of claim 5 in which the contact members are composed of lead frame material.
9. The circuit module of claim 8 in which the contact members are composed of alloy 42.
10. The circuit module of claim 5 in which the contact members exhibit a rectangular cross section.
11. The module of claim 5 in which a conductive runner merges with a first selected contact member in contact with a no connect lead of the second packaged integrated circuit to convey a select signal to a chip enable lead of the first packaged integrated circuit.
12. A high-density memory module comprising:
a first TSOP;
a second TSOP positioned in conjunction with the first TSOP to align corresponding leads of the first and second TSOPs;
a plurality of contact members, each contact member having upper and lower major surfaces and each selected contact member being disposed to contact with its upper major surface, the inner surface of a selected lead of the first TSOP and contact with its lower major surface, the outer surface of a corresponding selected lead of the second TSOP.
13. The module of claim 12 in which the first and second TSOPs are positioned to realized contact between their respective bodies.
14. The module of claim 12 in which the first and second TSOPs are separated by a thermally conductive medium.
15. The module of claim 14 in which the thermally conductive medium is an adhesive.
16. The module of claim 12 in which the contact between major surfaces of the contact members and the leads of the TSOPs is realized with solder.
17. A method of creating a stack of integrated circuits selectively connected to provide increased memory density in an application, the method comprising the steps of:
providing a carrier frame configured to have a plurality of members emergent into a window within the carrier frame;
applying a solder-containing compound to the first side of the members;
placing a first integrated circuit in contact with the members;
processing the combination of the first integrated circuit and the carrier frame with a heat source to create solder connections between the members and the first integrated circuit;
applying a solder-containing compound to the second side of the members of the carrier frame;
placing a second integrated circuit in contact with the members;
processing the combination of the first integrated circuit and the carrier frame with a heat source to create solder connections between the members and the second integrated circuit.
18. The method of claim 17 in which multiple iterations of the carrier frame are created in a carrier bed.
19. The method of claim 17 in which the resulting assembly of the carrier frame and the first and second integrated circuits is further processed by separation of the members from the carrier frame.
20. The method of claim 17 in which the carrier frame has indents between the body of the carrier frame and the members to simplify later separation of the carrier frame body from the members.
21. The method of claim 17 in which the first and second integrated circuits are placed in contact with the members with a pick and place tool.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050260787A1 (en) * 2004-05-13 2005-11-24 St Assembly Test Services Dual row leadframe and fabrication method
US20080185695A1 (en) * 2007-02-07 2008-08-07 Kim Hong Hyoun Package-on-package device and method for manufacturing the same by using a leadframe

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7298031B1 (en) 2000-08-09 2007-11-20 Micron Technology, Inc. Multiple substrate microelectronic devices and methods of manufacture
US6607937B1 (en) * 2000-08-23 2003-08-19 Micron Technology, Inc. Stacked microelectronic dies and methods for stacking microelectronic dies
US6462408B1 (en) * 2001-03-27 2002-10-08 Staktek Group, L.P. Contact member stacking system and method
US6843421B2 (en) * 2001-08-13 2005-01-18 Matrix Semiconductor, Inc. Molded memory module and method of making the module absent a substrate support
US20060255446A1 (en) 2001-10-26 2006-11-16 Staktek Group, L.P. Stacked modules and method
US7656678B2 (en) 2001-10-26 2010-02-02 Entorian Technologies, Lp Stacked module systems
US6690088B2 (en) * 2002-01-31 2004-02-10 Macintyre Donald M. Integrated circuit package stacking structure
US6707142B2 (en) * 2002-04-24 2004-03-16 Barun Electronics Co., Ltd. Package stacked semiconductor device having pin linking means
US6856010B2 (en) * 2002-12-05 2005-02-15 Staktek Group L.P. Thin scale outline package
US7388280B2 (en) * 2005-02-22 2008-06-17 Stats Chippac Ltd. Package stacking lead frame system
US7242091B2 (en) * 2005-03-02 2007-07-10 Stats Chippac Ltd. Stacked semiconductor packages and method therefor
US7098073B1 (en) 2005-04-18 2006-08-29 Freescale Semiconductor, Inc. Method for stacking an integrated circuit on another integrated circuit
US7196427B2 (en) 2005-04-18 2007-03-27 Freescale Semiconductor, Inc. Structure having an integrated circuit on another integrated circuit with an intervening bent adhesive element
US7033861B1 (en) * 2005-05-18 2006-04-25 Staktek Group L.P. Stacked module systems and method
JP4508016B2 (en) * 2005-07-07 2010-07-21 パナソニック株式会社 Component mounting method
JP4386007B2 (en) * 2005-07-07 2009-12-16 パナソニック株式会社 Component mounting apparatus and component mounting method
US7304382B2 (en) * 2006-01-11 2007-12-04 Staktek Group L.P. Managed memory component
US7292450B2 (en) * 2006-01-31 2007-11-06 Microsoft Corporation High density surface mount part array layout and assembly technique
US7375418B2 (en) * 2006-06-14 2008-05-20 Entorian Technologies, Lp Interposer stacking system and method
US7446403B2 (en) * 2006-06-14 2008-11-04 Entorian Technologies, Lp Carrier structure stacking system and method
US7417310B2 (en) * 2006-11-02 2008-08-26 Entorian Technologies, Lp Circuit module having force resistant construction
US7692311B2 (en) * 2007-11-21 2010-04-06 Powertech Technology Inc. POP (package-on-package) device encapsulating soldered joints between external leads
US8225475B2 (en) * 2008-12-10 2012-07-24 Omnetics Connector Corporation Alignment device for fine pitch connector leads
US8207015B2 (en) * 2010-04-30 2012-06-26 Stats Chippac Ltd. Integrated circuit packaging system with package-on-package and method of manufacture thereof
USD692896S1 (en) * 2011-11-15 2013-11-05 Connectblue Ab Module
USD668658S1 (en) * 2011-11-15 2012-10-09 Connectblue Ab Module
USD680545S1 (en) * 2011-11-15 2013-04-23 Connectblue Ab Module
USD689053S1 (en) * 2011-11-15 2013-09-03 Connectblue Ab Module
USD680119S1 (en) * 2011-11-15 2013-04-16 Connectblue Ab Module
USD668659S1 (en) * 2011-11-15 2012-10-09 Connectblue Ab Module
DE102015008503A1 (en) * 2015-07-03 2017-01-05 TE Connectivity Sensors Germany GmbH Electrical component and manufacturing method for producing such an electrical component

Family Cites Families (199)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US36916A (en) 1862-11-11 Improvement in coupling thills to axles
US3313986A (en) 1959-05-06 1967-04-11 Texas Instruments Inc Interconnecting miniature circuit modules
US3246386A (en) 1962-01-26 1966-04-19 Corning Glass Works Electrical connected component and method
US3290559A (en) 1964-06-16 1966-12-06 Internat Energy Conversion Inc Modular assembly for functional electronic blocks
US3287606A (en) 1964-12-16 1966-11-22 Sperry Rand Corp Packaging device for readily receiving and removing electrical components having a plurality of connecting leads
US3436604A (en) 1966-04-25 1969-04-01 Texas Instruments Inc Complex integrated circuit array and method for fabricating same
US3377516A (en) 1966-08-04 1968-04-09 Hughes Aircraft Co Cordwood package with removable plugs
US3403300A (en) 1966-09-01 1968-09-24 Magnavox Co Electronic module
US3535595A (en) 1967-11-09 1970-10-20 Ferroxcube Corp Universal cord-wood module
US3515949A (en) 1967-11-22 1970-06-02 Bunker Ramo 3-d flatpack module packaging technique
US3614541A (en) 1969-04-08 1971-10-19 North American Rockwell Package for an electronic assembly
US3713893A (en) 1969-11-20 1973-01-30 Gould Inc Integrated solar cell array
US3614546A (en) 1970-01-07 1971-10-19 Rca Corp Shielded semiconductor device
US3671812A (en) 1970-07-01 1972-06-20 Martin Marietta Corp High density packaging of electronic components in three-dimensional modules
US3739462A (en) 1971-01-06 1973-06-19 Texas Instruments Inc Method for encapsulating discrete semiconductor chips
US3727064A (en) 1971-03-17 1973-04-10 Monsanto Co Opto-isolator devices and method for the fabrication thereof
US3746934A (en) 1971-05-06 1973-07-17 Siemens Ag Stack arrangement of semiconductor chips
GB1423779A (en) 1972-02-14 1976-02-04 Hewlett Packard Co Photon isolators
US4017963A (en) 1973-02-26 1977-04-19 Signetics Corporation Semiconductor assembly and method
US3949274A (en) 1974-05-30 1976-04-06 International Business Machines Corporation Packaging and interconnection for superconductive circuitry
US3959579A (en) 1974-08-19 1976-05-25 International Business Machines Corporation Apertured semi-conductor device mounted on a substrate
US4103318A (en) 1977-05-06 1978-07-25 Ford Motor Company Electronic multichip module
US4116519A (en) 1977-08-02 1978-09-26 Amp Incorporated Electrical connections for chip carriers
US4116518A (en) 1977-08-31 1978-09-26 Ncr Corporation Clip for paralleling packaged integrated circuit chips
US4158745A (en) 1977-10-27 1979-06-19 Amp Incorporated Lead frame having integral terminal tabs
US4139726A (en) 1978-01-16 1979-02-13 Allen-Bradley Company Packaged microcircuit and method for assembly thereof
GB1553065A (en) 1978-01-28 1979-09-19 Int Computers Ltd Circuit structures including integrated circuits
US4241493A (en) 1978-12-22 1980-12-30 Andrulitis William B Method of fabricating solar cell modules
SU834957A1 (en) 1979-03-12 1981-05-30 Предприятие П/Я А-7438 Device for feeding printed circuit boards
YU121680A (en) 1979-05-08 1983-04-30 Saint Gobain Vitrage Method of manufacturing solar photocell panels
US4288841A (en) 1979-09-20 1981-09-08 Bell Telephone Laboratories, Incorporated Double cavity semiconductor chip carrier
US4379259A (en) 1980-03-12 1983-04-05 National Semiconductor Corporation Process of performing burn-in and parallel functional testing of integrated circuit memories in an environmental chamber
US4364620A (en) 1980-09-05 1982-12-21 Mostek Corporation Socket for housing a plurality of integrated circuits
US4398235A (en) 1980-09-11 1983-08-09 General Motors Corporation Vertical integrated circuit package integration
US4371912A (en) 1980-10-01 1983-02-01 Motorola, Inc. Method of mounting interrelated components
US4437235A (en) 1980-12-29 1984-03-20 Honeywell Information Systems Inc. Integrated circuit package
US4331258A (en) 1981-03-05 1982-05-25 Raychem Corporation Sealing cover for an hermetically sealed container
US4394712A (en) 1981-03-18 1983-07-19 General Electric Company Alignment-enhancing feed-through conductors for stackable silicon-on-sapphire wafers
US4451973A (en) 1981-04-28 1984-06-05 Matsushita Electronics Corporation Method for manufacturing a plastic encapsulated semiconductor device and a lead frame therefor
US4406508A (en) 1981-07-02 1983-09-27 Thomas & Betts Corporation Dual-in-line package assembly
US4525921A (en) 1981-07-13 1985-07-02 Irvine Sensors Corporation High-density electronic processing package-structure and fabrication
JPS58112348A (en) 1981-12-25 1983-07-04 Fujitsu Ltd Semiconductor device
JPS58219757A (en) 1982-06-16 1983-12-21 Toshiba Corp Semiconductor device
GB2123216B (en) 1982-06-19 1985-12-18 Ferranti Plc Electrical circuit assemblies
EP0115514B1 (en) 1982-08-10 1986-11-12 BROWN, David, Frank Chip carrier
US4761681A (en) 1982-09-08 1988-08-02 Texas Instruments Incorporated Method for fabricating a semiconductor contact and interconnect structure using orientation dependent etching and thermomigration
US4633573A (en) 1982-10-12 1987-01-06 Aegis, Inc. Microcircuit package and sealing method
US4521828A (en) 1982-12-23 1985-06-04 At&T Technologies, Inc. Component module for piggyback mounting on a circuit package having dual-in-line leads
JPS59154033A (en) * 1983-02-22 1984-09-03 Michio Osada Method and apparatus for eliminating flash at stem edge surface in semiconductor lead frame
US4630172A (en) 1983-03-09 1986-12-16 Printed Circuits International Semiconductor chip carrier package with a heat sink
US4574331A (en) 1983-05-31 1986-03-04 Trw Inc. Multi-element circuit construction
US4770640A (en) 1983-06-24 1988-09-13 Walter Howard F Electrical interconnection device for integrated circuits
US4712129A (en) 1983-12-12 1987-12-08 Texas Instruments Incorporated Integrated circuit device with textured bar cover
US4642735A (en) 1984-02-27 1987-02-10 General Electric Company Frequency synthesizer module
US4722060A (en) 1984-03-22 1988-01-26 Thomson Components-Mostek Corporation Integrated-circuit leadframe adapted for a simultaneous bonding operation
KR890004820B1 (en) 1984-03-28 1989-11-27 인터내셔널 비지네스 머신즈 코포레이션 Stacked double density memory module using industry standard memory chips
US4680617A (en) 1984-05-23 1987-07-14 Ross Milton I Encapsulated electronic circuit device, and method and apparatus for making same
JPS60254762A (en) 1984-05-31 1985-12-16 Fujitsu Ltd Package for semiconductor element
US4638406A (en) 1984-10-04 1987-01-20 Motorola, Inc. Discrete component mounting assembly
US4733461A (en) 1984-12-28 1988-03-29 Micro Co., Ltd. Method of stacking printed circuit boards
JPS61163652A (en) 1985-01-15 1986-07-24 Matsushita Electric Works Ltd Semiconductor device
JPS61219143A (en) 1985-03-25 1986-09-29 Nec Corp Manufacture of resin sealed type semiconductor device
FR2580136B1 (en) 1985-04-05 1988-10-14 Radiotechnique Compelec
US4862245A (en) 1985-04-18 1989-08-29 International Business Machines Corporation Package semiconductor chip
US4631573A (en) 1985-05-24 1986-12-23 Sundstrand Corporation Cooled stack of electrically isolated semiconductors
JPS61287155A (en) 1985-06-14 1986-12-17 Hitachi Ltd Semiconductor device
US5049527A (en) 1985-06-25 1991-09-17 Hewlett-Packard Company Optical isolator
EP0218796B1 (en) 1985-08-16 1990-10-31 Dai-Ichi Seiko Co. Ltd. Semiconductor device comprising a plug-in-type package
US4696525A (en) * 1985-12-13 1987-09-29 Amp Incorporated Socket for stacking integrated circuit packages
US4684975A (en) 1985-12-16 1987-08-04 National Semiconductor Corporation Molded semiconductor package having improved heat dissipation
JPS62230027A (en) 1986-03-31 1987-10-08 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device
US4706166A (en) 1986-04-25 1987-11-10 Irvine Sensors Corporation High-density electronic modules--process and product
US5031072A (en) 1986-08-01 1991-07-09 Texas Instruments Incorporated Baseboard for orthogonal chip mount
US4763188A (en) 1986-08-08 1988-08-09 Thomas Johnson Packaging system for multiple semiconductor devices
JPH0777247B2 (en) 1986-09-17 1995-08-16 富士通株式会社 Method for manufacturing semiconductor device
JPS63117451A (en) 1986-11-06 1988-05-21 Oki Electric Ind Co Ltd Semiconductor device
US4878106A (en) 1986-12-02 1989-10-31 Anton Piller Gmbh & Co. Kg Semiconductor circuit packages for use in high power applications and method of making the same
JPS63153849A (en) 1986-12-17 1988-06-27 Nec Corp Semiconductor device
US4839717A (en) 1986-12-19 1989-06-13 Fairchild Semiconductor Corporation Ceramic package for high frequency semiconductor devices
US4764846A (en) 1987-01-05 1988-08-16 Irvine Sensors Corporation High density electronic package comprising stacked sub-modules
US4829403A (en) 1987-01-20 1989-05-09 Harding Ade Yemi S K Packaging arrangement for energy dissipating devices
US4855868A (en) 1987-01-20 1989-08-08 Harding Ade Yemi S K Preformed packaging arrangement for energy dissipating devices
US4868712A (en) 1987-02-04 1989-09-19 Woodman John K Three dimensional integrated circuit package
US4821007A (en) 1987-02-06 1989-04-11 Tektronix, Inc. Strip line circuit component and method of manufacture
US4862249A (en) 1987-04-17 1989-08-29 Xoc Devices, Inc. Packaging system for stacking integrated circuits
US4953005A (en) 1987-04-17 1990-08-28 Xoc Devices, Inc. Packaging system for stacking integrated circuits
US4796078A (en) 1987-06-15 1989-01-03 International Business Machines Corporation Peripheral/area wire bonding technique
US5138438A (en) * 1987-06-24 1992-08-11 Akita Electronics Co. Ltd. Lead connections means for stacked tab packaged IC chips
US4771366A (en) 1987-07-06 1988-09-13 International Business Machines Corporation Ceramic card assembly having enhanced power distribution and cooling
IT1214254B (en) 1987-09-23 1990-01-10 Sgs Microelettonica S P A SEMICONDUCTOR DEVICE IN PLASTIC OR CERAMIC CONTAINER WITH "CHIPS" FIXED ON BOTH SIDES OF THE CENTRAL ISLAND OF THE "FRAME".
US5016138A (en) 1987-10-27 1991-05-14 Woodman John K Three dimensional integrated circuit package
US4983533A (en) 1987-10-28 1991-01-08 Irvine Sensors Corporation High-density electronic modules - process and product
FR2625038B1 (en) 1987-12-22 1990-08-17 Cit Alcatel METHOD AND DEVICE FOR COOLING AN INTEGRATED CIRCUIT HOUSING
US5198888A (en) 1987-12-28 1993-03-30 Hitachi, Ltd. Semiconductor stacked device
US4833568A (en) 1988-01-29 1989-05-23 Berhold G Mark Three-dimensional circuit component assembly and method corresponding thereto
US4841355A (en) 1988-02-10 1989-06-20 Amdahl Corporation Three-dimensional microelectronic package for semiconductor chips
US4891789A (en) 1988-03-03 1990-01-02 Bull Hn Information Systems, Inc. Surface mounted multilayer memory printed circuit board
KR970011649B1 (en) 1988-03-10 1997-07-12 가부시끼가이샤 히다찌세이사꾸쇼 Process of producing semiconductor device
US5001545A (en) 1988-09-09 1991-03-19 Motorola, Inc. Formed top contact for non-flat semiconductor devices
US5138434A (en) 1991-01-22 1992-08-11 Micron Technology, Inc. Packaging for semiconductor logic devices
US4956694A (en) 1988-11-04 1990-09-11 Dense-Pac Microsystems, Inc. Integrated circuit chip stacking
US4996583A (en) 1989-02-15 1991-02-26 Matsushita Electric Industrial Co., Ltd. Stack type semiconductor package
JP2855719B2 (en) 1989-03-20 1999-02-10 セイコーエプソン株式会社 Semiconductor device
US5266834A (en) 1989-03-13 1993-11-30 Hitachi Ltd. Semiconductor device and an electronic device with the semiconductor devices mounted thereon
JP2572840B2 (en) 1989-03-30 1997-01-16 三菱電機株式会社 Semiconductor device and radiation fin
US5108553A (en) 1989-04-04 1992-04-28 Olin Corporation G-tab manufacturing process and the product produced thereby
FR2645680B1 (en) 1989-04-07 1994-04-29 Thomson Microelectronics Sa Sg ENCAPSULATION OF ELECTRONIC MODULES AND MANUFACTURING METHOD
DE3911711A1 (en) 1989-04-10 1990-10-11 Ibm MODULE STRUCTURE WITH INTEGRATED SEMICONDUCTOR CHIP AND CHIP CARRIER
US4953060A (en) 1989-05-05 1990-08-28 Ncr Corporation Stackable integrated circuit chip package with improved heat removal
JPH0671061B2 (en) 1989-05-22 1994-09-07 株式会社東芝 Resin-sealed semiconductor device
US5104820A (en) 1989-07-07 1992-04-14 Irvine Sensors Corporation Method of fabricating electronic circuitry unit containing stacked IC layers having lead rerouting
US5057903A (en) 1989-07-17 1991-10-15 Microelectronics And Computer Technology Corporation Thermal heat sink encapsulated integrated circuit
US5231304A (en) 1989-07-27 1993-07-27 Grumman Aerospace Corporation Framed chip hybrid stacked layer assembly
US4948645A (en) 1989-08-01 1990-08-14 Rogers Corporation Tape automated bonding and method of making the same
US5155068A (en) 1989-08-31 1992-10-13 Sharp Kabushiki Kaisha Method for manufacturing an IC module for an IC card whereby an IC device and surrounding encapsulant are thinned by material removal
US5200362A (en) 1989-09-06 1993-04-06 Motorola, Inc. Method of attaching conductive traces to an encapsulated semiconductor die using a removable transfer film
JP2530056B2 (en) 1989-09-14 1996-09-04 株式会社東芝 Resin-sealed semiconductor device and manufacturing method thereof
US5068708A (en) 1989-10-02 1991-11-26 Advanced Micro Devices, Inc. Ground plane for plastic encapsulated integrated circuit die packages
US5012323A (en) 1989-11-20 1991-04-30 Micron Technology, Inc. Double-die semiconductor package having a back-bonded die and a face-bonded die interconnected on a single leadframe
JP2797557B2 (en) 1989-11-28 1998-09-17 日本電気株式会社 Integrated circuit device having shield function and manufacturing method
US5175612A (en) 1989-12-19 1992-12-29 Lsi Logic Corporation Heat sink for semiconductor device assembly
US5014113A (en) 1989-12-27 1991-05-07 Motorola, Inc. Multiple layer lead frame
US4997517A (en) 1990-01-09 1991-03-05 Olin Corporation Multi-metal layer interconnect tape for tape automated bonding
JPH03227541A (en) 1990-02-01 1991-10-08 Hitachi Ltd Semiconductor device
US5041015A (en) 1990-03-30 1991-08-20 Cal Flex, Inc. Electrical jumper assembly
US5058265A (en) 1990-05-10 1991-10-22 Rockwell International Corporation Method for packaging a board of electronic components
US5147815A (en) * 1990-05-14 1992-09-15 Motorola, Inc. Method for fabricating a multichip semiconductor device having two interdigitated leadframes
US5065277A (en) 1990-07-13 1991-11-12 Sun Microsystems, Inc. Three dimensional packaging arrangement for computer systems and the like
US5140745A (en) 1990-07-23 1992-08-25 Mckenzie Jr Joseph A Method for forming traces on side edges of printed circuit boards and devices formed thereby
US5499160A (en) 1990-08-01 1996-03-12 Staktek Corporation High density integrated circuit module with snap-on rail assemblies
US5377077A (en) 1990-08-01 1994-12-27 Staktek Corporation Ultra high density integrated circuit packages method and apparatus
US5367766A (en) 1990-08-01 1994-11-29 Staktek Corporation Ultra high density integrated circuit packages method
EP0509065A1 (en) 1990-08-01 1992-10-21 Staktek Corporation Ultra high density integrated circuit packages, method and apparatus
US5446620A (en) 1990-08-01 1995-08-29 Staktek Corporation Ultra high density integrated circuit packages
US5475920A (en) 1990-08-01 1995-12-19 Burns; Carmen D. Method of assembling ultra high density integrated circuit packages
US5043794A (en) 1990-09-24 1991-08-27 At&T Bell Laboratories Integrated circuit package and compact assemblies thereof
JPH04179264A (en) 1990-11-14 1992-06-25 Hitachi Ltd Resin-sealed semiconductor device
US5107328A (en) 1991-02-13 1992-04-21 Micron Technology, Inc. Packaging means for a semiconductor die having particular shelf structure
JPH04284661A (en) 1991-03-13 1992-10-09 Toshiba Corp Semiconductor device
US5099393A (en) 1991-03-25 1992-03-24 International Business Machines Corporation Electronic package for high density applications
US5151559A (en) 1991-05-02 1992-09-29 International Business Machines Corporation Planarized thin film surface covered wire bonded semiconductor package
US5086018A (en) 1991-05-02 1992-02-04 International Business Machines Corporation Method of making a planarized thin film covered wire bonded semiconductor package
US5138430A (en) 1991-06-06 1992-08-11 International Business Machines Corporation High performance versatile thermally enhanced IC chip mounting
US5176255A (en) 1991-06-19 1993-01-05 North American Specialties Corporation Lead frame for integrated circuits or the like and method of manufacture
JPH0513666A (en) 1991-06-29 1993-01-22 Sony Corp Complex semiconductor device
US5214307A (en) 1991-07-08 1993-05-25 Micron Technology, Inc. Lead frame for semiconductor devices having improved adhesive bond line control
US5311401A (en) 1991-07-09 1994-05-10 Hughes Aircraft Company Stacked chip assembly and manufacturing method therefor
US5448450A (en) 1991-08-15 1995-09-05 Staktek Corporation Lead-on-chip integrated circuit apparatus
US5221642A (en) 1991-08-15 1993-06-22 Staktek Corporation Lead-on-chip integrated circuit fabrication method
US5239447A (en) 1991-09-13 1993-08-24 International Business Machines Corporation Stepped electronic device package
US5168926A (en) 1991-09-25 1992-12-08 Intel Corporation Heat sink design integrating interface material
JPH0715969B2 (en) 1991-09-30 1995-02-22 インターナショナル・ビジネス・マシーンズ・コーポレイション Multi-chip integrated circuit package and system thereof
US5128831A (en) 1991-10-31 1992-07-07 Micron Technology, Inc. High-density electronic package comprising stacked sub-modules which are electrically interconnected by solder-filled vias
US5397916A (en) 1991-12-10 1995-03-14 Normington; Peter J. C. Semiconductor device including stacked die
US5281852A (en) 1991-12-10 1994-01-25 Normington Peter J C Semiconductor device including stacked die
US5241454A (en) 1992-01-22 1993-08-31 International Business Machines Corporation Mutlilayered flexible circuit package
US5262927A (en) 1992-02-07 1993-11-16 Lsi Logic Corporation Partially-molded, PCB chip carrier package
US5243133A (en) 1992-02-18 1993-09-07 International Business Machines, Inc. Ceramic chip carrier with lead frame or edge clip
US5222014A (en) 1992-03-02 1993-06-22 Motorola, Inc. Three-dimensional multi-chip pad array carrier
US5313096A (en) 1992-03-16 1994-05-17 Dense-Pac Microsystems, Inc. IC chip package having chip attached to and wire bonded within an overlying substrate
US5214845A (en) 1992-05-11 1993-06-01 Micron Technology, Inc. Method for producing high speed integrated circuits
US5279991A (en) 1992-05-15 1994-01-18 Irvine Sensors Corporation Method for fabricating stacks of IC chips by segmenting a larger stack
MY114547A (en) 1992-05-25 2002-11-30 Hitachi Ltd Thin type semiconductor device, module structure using the device and method of mounting the device on board
US5247423A (en) 1992-05-26 1993-09-21 Motorola, Inc. Stacking three dimensional leadless multi-chip module and method for making the same
US5371866A (en) 1992-06-01 1994-12-06 Staktek Corporation Simulcast standard multichip memory addressing system
US5273940A (en) 1992-06-15 1993-12-28 Motorola, Inc. Multiple chip package with thinned semiconductor chips
US5236117A (en) 1992-06-22 1993-08-17 Staktek Corporation Impact solder method and apparatus
US5343366A (en) 1992-06-24 1994-08-30 International Business Machines Corporation Packages for stacked integrated circuit chip cubes
US5804870A (en) 1992-06-26 1998-09-08 Staktek Corporation Hermetically sealed integrated circuit lead-on package configuration
FR2694840B1 (en) 1992-08-13 1994-09-09 Commissariat Energie Atomique Three-dimensional multi-chip module.
US5313097A (en) 1992-11-16 1994-05-17 International Business Machines, Corp. High density memory module
JPH06175558A (en) 1992-12-03 1994-06-24 Toyo Ink Mfg Co Ltd Production of volume phase type hologram
US5347428A (en) 1992-12-03 1994-09-13 Irvine Sensors Corporation Module comprising IC memory stack dedicated to and structurally combined with an IC microprocessor chip
US5484959A (en) 1992-12-11 1996-01-16 Staktek Corporation High density lead-on-package fabrication method and apparatus
US6205654B1 (en) 1992-12-11 2001-03-27 Staktek Group L.P. Method of manufacturing a surface mount package
US5801437A (en) 1993-03-29 1998-09-01 Staktek Corporation Three-dimensional warp-resistant integrated circuit module method and apparatus
US5455740A (en) 1994-03-07 1995-10-03 Staktek Corporation Bus communication system for stacked high density integrated circuit packages
US5369056A (en) 1993-03-29 1994-11-29 Staktek Corporation Warp-resistent ultra-thin integrated circuit package fabrication method
US5644161A (en) 1993-03-29 1997-07-01 Staktek Corporation Ultra-high density warp-resistant memory module
US5523619A (en) 1993-11-03 1996-06-04 International Business Machines Corporation High density memory structure
US5384689A (en) 1993-12-20 1995-01-24 Shen; Ming-Tung Integrated circuit chip including superimposed upper and lower printed circuit boards
US5380681A (en) 1994-03-21 1995-01-10 United Microelectronics Corporation Three-dimensional multichip package and methods of fabricating
JP3167868B2 (en) 1994-10-17 2001-05-21 理研軽金属工業株式会社 Fire extinguisher box
US5592364A (en) 1995-01-24 1997-01-07 Staktek Corporation High density integrated circuit module with complex electrical interconnect rails
US5588205A (en) 1995-01-24 1996-12-31 Staktek Corporation Method of manufacturing a high density integrated circuit module having complex electrical interconnect rails
US5615475A (en) 1995-01-30 1997-04-01 Staktek Corporation Method of manufacturing an integrated package having a pair of die on a common lead frame
US5616475A (en) * 1995-02-03 1997-04-01 The Regents Of The University Of California Human T-cell leukemia virus transcription modulators and screening assays
US5514907A (en) 1995-03-21 1996-05-07 Simple Technology Incorporated Apparatus for stacking semiconductor chips
US5612570A (en) 1995-04-13 1997-03-18 Dense-Pac Microsystems, Inc. Chip stack and method of making same
JP3296130B2 (en) * 1995-04-13 2002-06-24 松下電器産業株式会社 Electronic component soldering method
US5657537A (en) 1995-05-30 1997-08-19 General Electric Company Method for fabricating a stack of two dimensional circuit modules
US6025642A (en) 1995-08-17 2000-02-15 Staktek Corporation Ultra high density integrated circuit packages
JPH09260568A (en) 1996-03-27 1997-10-03 Mitsubishi Electric Corp Semiconductor device and its manufacture
US5778522A (en) 1996-05-20 1998-07-14 Staktek Corporation Method of manufacturing a high density integrated circuit module with complex electrical interconnect rails having electrical interconnect strain relief
US6133637A (en) * 1997-01-24 2000-10-17 Rohm Co., Ltd. Semiconductor device having a plurality of semiconductor chips
US6028352A (en) 1997-06-13 2000-02-22 Irvine Sensors Corporation IC stack utilizing secondary leadframes
US6310392B1 (en) 1998-12-28 2001-10-30 Staktek Group, L.P. Stacked micro ball grid array packages
US6388336B1 (en) * 1999-09-15 2002-05-14 Texas Instruments Incorporated Multichip semiconductor assembly
US6462408B1 (en) * 2001-03-27 2002-10-08 Staktek Group, L.P. Contact member stacking system and method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050260787A1 (en) * 2004-05-13 2005-11-24 St Assembly Test Services Dual row leadframe and fabrication method
US7060536B2 (en) * 2004-05-13 2006-06-13 St Assembly Test Services Ltd. Dual row leadframe and fabrication method
US20080185695A1 (en) * 2007-02-07 2008-08-07 Kim Hong Hyoun Package-on-package device and method for manufacturing the same by using a leadframe

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US6806120B2 (en) 2004-10-19
US20020142515A1 (en) 2002-10-03
US6462408B1 (en) 2002-10-08
US6893899B2 (en) 2005-05-17
US20040183206A1 (en) 2004-09-23

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