US11340301B2 - Apparatus and method for diagnosing current sensor - Google Patents

Apparatus and method for diagnosing current sensor Download PDF

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US11340301B2
US11340301B2 US16/964,272 US201916964272A US11340301B2 US 11340301 B2 US11340301 B2 US 11340301B2 US 201916964272 A US201916964272 A US 201916964272A US 11340301 B2 US11340301 B2 US 11340301B2
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cell assembly
voltage
current
current sensor
measured
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US20210033679A1 (en
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Ho-Yun Chang
Sang-jin Lee
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LG Energy Solution Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G01R31/3842—Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K13/00—Thermometers specially adapted for specific purposes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/12—Measuring rate of change
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/367—Software therefor, e.g. for battery testing using modelling or look-up tables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/374—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with means for correcting the measurement for temperature or ageing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/04—Testing or calibrating of apparatus covered by the other groups of this subclass of instruments for measuring time integral of power or current
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Definitions

  • the present disclosure relates to an apparatus and method for diagnosing a current sensor, and more particularly, to an apparatus and method for diagnosing a current sensor, which may effectively diagnose whether a current sensor provided to a battery pack is normal.
  • the secondary batteries used in electric vehicles or hybrid electric vehicles are high-power, high-capacity secondary batteries, and many studies are being conducted thereon.
  • peripheral components and devices related to the secondary batteries is being conducted. That is, research is being conducted on various components and devices such as a cell assembly prepared by connecting a plurality of secondary batteries into a single module, a battery management system (BMS) for controlling the charging and discharging of the cell assembly and monitoring a state of each secondary battery, a battery pack prepared by integrating the cell assembly and the BMS into a pack, and a current sensor for measuring a charging and discharging current flowing through the cell assembly.
  • BMS battery management system
  • the current sensor is provided on a charging and discharging path to measure a charging and discharging current, and a lot of researches are being conducted thereon.
  • the current sensor it is important to transmit an accurate measured current value to the BMS in order to prevent overcharging or overdischarging of the battery.
  • the BMS in order for the BMS to estimate a state of charge (SOC) or a state of health (SOH) of the battery and to perform an effective cell balancing operation, the current sensor must transmit accurate measured current values to the BMS.
  • SOC state of charge
  • SOH state of health
  • the present disclosure is designed to solve the problems of the related art, and therefore the present disclosure is directed to providing an improved apparatus and method for diagnosing a current sensor, which may effectively diagnose where a current sensor provided to a battery pack is normal, based on an error between a change value of a voltage-based SOC and a change value of a current-based SOC.
  • an apparatus for diagnosing a current sensor provided on a charging and discharging path for supplying a charging and discharging current to a cell assembly comprising: a voltage measuring unit electrically connected to the cell assembly to measure a voltage across both ends of the cell assembly; a current measuring unit electrically connected to the current sensor to receive an electric signal from the current sensor and measure a current flowing through the charging and discharging path based on the electric signal; and a processor configured to calculate a voltage-based amount of change in charge to the cell assembly based on the measured voltage at each of at least two preset reference times by the voltage measuring unit, calculate a current-based amount of change in charge to the cell assembly based on the measured current at the at least two preset reference times by the current measuring unit, and diagnose the current sensor based on the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly.
  • the processor may be configured to compare the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly, and diagnose that the current sensor is in a normal state when a difference between the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly is within a normal range.
  • the apparatus for diagnosing a current sensor may further comprise a temperature measuring unit electrically connected to the cell assembly and configured to measure a temperature of the cell assembly at each of the at least two preset reference times.
  • the processor may be configured to calculate the voltage-based amount of change in charge to the cell assembly based on the measured voltage and the temperature measured at each of the at least two preset reference times by the temperature measuring unit and change the normal range according to a difference between the measured temperatures of the cell assembly measured at each of the at least two preset reference times.
  • the at least two preset reference times may include a charging initiation time and a charging completion time.
  • the processor may be configured to calculate the voltage-based amount of change in charge to the cell assembly by comparing a first amount of charge in the cell assembly corresponding to the measured voltage of the cell assembly at the charging initiation time to a second amount of charge in the cell assembly corresponding to a measured voltage of the cell assembly at the charging completion time.
  • the processor may be configured to calculate the current-based amount of change in charge to the cell assembly by accumulating the measured current of the cell assembly from the charging initiation time to the charging completion time.
  • the apparatus for diagnosing a current sensor may further comprise a memory device configured to store a look-up table, which predefines an amount of charge to the cell assembly corresponding to either (i) the voltage across both ends of the cell assembly or (ii) a combination of both the voltage across both ends of the cell assembly and a temperature of the cell assembly.
  • BMS battery management system
  • a battery pack comprising the apparatus for diagnosing a current sensor according to any of the embodiments of the present disclosure.
  • a method for diagnosing a current sensor provided on a charging and discharging path for supplying a charging and discharging current to a cell assembly comprising: measuring a voltage across both ends of the cell assembly at each of at least two preset reference times; measuring a current flowing through the charging and discharging path, on which the current sensor is provided, during each of the at least two preset reference times; and calculating a voltage-based amount of change in charge to the cell assembly based on the measured voltage of the cell assembly at each of the at least two preset reference times; calculating a current-based amount of change in charge to the cell assembly based on the measured current accumulatively at each of the at least two preset reference times; and diagnosing the current sensor based on the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly.
  • Diagnosing the current sensor may include comparing the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly, and determining that the current sensor is in a normal state when a difference between the voltage-based amount of change in charge to the cell assembly and the current-based amount of change in charge to the cell assembly is within a normal range.
  • the method may further include measuring a temperature of the cell assembly at each of the at least two preset reference times.
  • Diagnosing the current sensor may include calculating the voltage-based amount of change in charge to the cell assembly based on the measured voltage and the measured temperature at each of the at least two preset reference times.
  • the method may further include changing the normal range according to a difference between the measured temperatures of the cell assembly measured at each of the at least two preset reference times.
  • the at least two preset reference times may include a charging initiation time and a charging completion time.
  • Diagnosing the current sensor may include calculating the voltage-based amount of change in charge to the cell assembly by comparing a first amount of charge in the cell assembly corresponding to the measured voltage of the cell assembly at the charging initiation time to a second amount of charge in the cell assembly corresponding to the measured voltage of the cell assembly at the charging completion time.
  • Diagnosing the current sensor may include calculating the current-based amount of change in charge to the cell assembly by accumulating the measured current of the cell assembly from the charging initiation time to the charging completion time.
  • an improved apparatus and method for diagnosing a current sensor which may measure the accuracy of the current sensor by calculating the error of the current sensor.
  • the present disclosure may have various effects other than the above, and other effects of the present disclosure may be understood from the following description and more clearly figured out by the embodiments of the present disclosure.
  • FIG. 1 is a diagram schematically showing a functional configuration of an apparatus for diagnosing a current sensor according to an embodiment of the present disclosure.
  • FIG. 2 is a diagram schematically showing that the apparatus for diagnosing a current sensor according to an embodiment of the present disclosure is connected to some components of a battery pack.
  • FIG. 3 shows a measured voltage referenced by a processor according to an embodiment of the present disclosure.
  • FIG. 4 shows a voltage-charged charge amount look-up table reference by the processor according to an embodiment of the present disclosure.
  • FIG. 5 is a schematic flowchart for illustrating a method for diagnosing a current sensor according to another embodiment of the present disclosure.
  • FIG. 6 is a schematic flowchart for illustrating a method for diagnosing a current sensor according to still another embodiment of the present disclosure.
  • processor refers to a unit that processes at least one function or operation, and may be implemented by hardware, software, or a combination of hardware and software.
  • An apparatus for diagnosing a current sensor may be a device for diagnosing a current sensor provided to a battery pack that includes at least one secondary battery.
  • the current sensor may be provided on a charging and discharging path for supplying a charging and discharging current to a cell assembly provided in the battery pack. More specifically, as shown in FIG. 2 , the current sensor according to an embodiment of the present disclosure may be provided between a negative electrode terminal of the cell assembly and a negative electrode terminal of the battery pack.
  • FIG. 1 is a diagram schematically showing a functional configuration of an apparatus for diagnosing a current sensor according to an embodiment of the present disclosure
  • FIG. 2 is a diagram schematically showing that the apparatus for diagnosing a current sensor according to an embodiment of the present disclosure is connected to some components of a battery pack.
  • an apparatus 1 for diagnosing a current sensor includes a voltage measuring unit 100 , a current measuring unit 200 and a processor 300 .
  • the voltage measuring unit 100 may be electrically connected to the cell assembly 10 .
  • the voltage measuring unit 100 may be electrically connected to both ends of the cell assembly 10 so as to transmit and receive an electric signal.
  • the voltage measuring unit 100 may be electrically connected to both ends of each cell provided in the cell assembly 10 so as to transmit and receive an electric signal.
  • the voltage measuring unit 100 may be configured to measure a both-end voltage of the cell assembly 10 . More specifically, the voltage measuring unit 100 may measure the both-end voltage of the cell assembly 10 based on the electric signal received from both ends of the cell assembly 10 . In addition, the voltage measuring unit 100 may measure a both-end voltage of each cell based on the electric signal received from both ends of each cell.
  • the voltage measuring unit 100 may be electrically connected to the processor 300 to transmit and receive an electric signal.
  • the voltage measuring unit 100 may measure a potential difference between a positive electrode terminal of the cell assembly 10 and a negative electrode terminal of the cell assembly 10 at a time interval under the control of the processor 300 and transmit a signal indicating the magnitude of the measured voltage to the processor 300 .
  • the voltage measuring unit 100 may be implemented using a voltage measuring circuit generally used in the art.
  • the current measuring unit 200 may be electrically connected to a current sensor 30 to receive an electric signal from the current sensor 30 .
  • the current measuring unit 200 may be configured to measure a current flowing through a charging and discharging path based on the electric signal received from the current sensor 30 .
  • the current measuring unit 200 may be electrically connected to both ends of the current sensor 30 .
  • one end of the current sensor 30 may be electrically connected to the negative electrode terminal of the cell assembly 10 .
  • the current measuring unit 200 may measure a both-end voltage of the current sensor 30 and measure the current flowing through the charging and discharging path based on the both-end voltage of the current sensor 30 .
  • the current measuring unit 200 may measure the current flowing through the charging and discharging path using the Ohm's law.
  • the current measuring unit 200 may be electrically connected to the processor 300 to transmit and receive an electric signal.
  • the current measuring unit 200 may repeatedly measure the magnitude of a charge current or a discharge current of the current sensor 30 at time intervals under the control of the processor 300 and output a signal indicating the magnitude of the measured current to the processor 300 .
  • the current sensor 30 may be implemented using a hall sensor or a sensing resistor generally used in the art. The hall sensor or the sensing resistor may be installed on a line through which the current flows.
  • the processor 300 may receive the measured voltage from the voltage measuring unit 100 .
  • the processor 300 may receive the both-end voltage of the cell assembly 10 from the voltage measuring unit 100 .
  • the processor 300 may calculate a change value of a voltage-based charged charge amount based on the measured voltages measured at two or more preset reference times. More specifically, the processor 300 may receive the measured voltage with a time difference from the voltage measuring unit 100 .
  • the time difference may be a difference between the at least two preset reference times. That is, the reference time may mean at least two different viewpoints.
  • a period during the reference time may mean a period during the at least two different viewpoints. For example, the reference time may mean t 0 and t 1 , and the period during the reference time may mean the period from t 0 to t 1 .
  • the processor 300 may receive the measured voltage measured at t 0 from the voltage measuring unit 100 .
  • the processor 300 may receive the measured voltage measured at t 1 from the voltage measuring unit 100 .
  • the processor 300 may calculate the change value of the voltage-based charged charge amount based on a charged charge amount corresponding to the measured voltage measured at t 0 and a charged charge amount corresponding to the measured voltage measured at t 1 . The process of calculating the change value of the voltage-based charged charge amount will be explained later in detail.
  • the processor 300 may receive the measured current from the current measuring unit 200 .
  • the processor 300 may receive the measured current flowing through the charging and discharging path from the current measuring unit 200 .
  • the processor 300 may calculate a change value of a current-based charged charge amount based on the measured current accumulated during the preset reference time. More specifically, the processor 300 may calculate an accumulated measured current value by integrating the measured current during the reference time based on the measured current received from the current measuring unit 200 .
  • the reference time may be set in advance. For example, if the preset reference times are t 0 and t 1 , the processor 300 may receive the measured current measured from t 0 to t 1 from the current measuring unit 200 .
  • the processor 300 may calculate the change value of the current-based charged charge amount based on a charged charge amount corresponding to the measured current accumulated from t 0 to t 1 . The process of calculating the change value of the current-based charged charge amount will be explained later in detail.
  • the processor 300 may be configured to diagnose the current sensor 30 based on the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount. More specifically, the processor 300 may diagnose that the current sensor 30 is normal if a comparison result between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount falls within a normal range. On the contrary, the processor 300 may diagnose that the current sensor 30 is in an abnormal state if the comparison result between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount does not fall within the normal range.
  • the normal range is a preset range and may be a reference range with which the processor 300 may diagnose that the current sensor 30 is in a normal state.
  • the apparatus 1 for diagnosing a current sensor may further include a temperature measuring unit 500 as shown in FIGS. 1 and 2 .
  • the temperature measuring unit 500 may be electrically connected to the cell assembly 10 to transmit and receive an electric signal. Alternatively, the temperature measuring unit 500 may be mounted to the cell assembly 10 to be electrically connected to the cell assembly 10 . Through this configuration, the temperature measuring unit 500 may measure a temperature of the cell assembly 10 and each cell provided in the cell assembly 10 .
  • the temperature measuring unit 500 may be electrically coupled to the processor 300 to transmit and receive an electric signal.
  • the temperature measuring unit 500 may repeatedly measure the temperature of the cell assembly 10 at a time interval and output a signal indicating the magnitude of the measured temperature to the processor 300 .
  • the temperature measuring unit 500 may be implemented using a thermocouple generally used in the art.
  • the apparatus 1 for diagnosing a current sensor may further include a memory device 400 .
  • the memory device 400 may be electrically connected to the processor 300 to transmit and receive an electric signal.
  • the memory device 400 may store a look-up table, which defines charged charge amounts corresponding to both-end voltages and/or temperatures of the cell assembly 10 , in advance.
  • the look-up table stored in the memory device 400 may be a table in which charged charge amounts corresponding to both-end voltages and temperatures of the cell assembly 10 are defined.
  • the processor 300 may estimate a state of charge (SOC) (for example, a charged charge amount) of the cell assembly 10 by using the voltage measurement value, the current measurement value and the temperature measurement value of the cell assembly 10 received from the voltage measuring unit 100 , the current measuring unit 200 and the temperature measuring unit 500 , and monitor the estimated SOC. That is, the processor 300 may estimate the SOC and monitor the estimated SOC while the cell assembly 10 is charged or discharged, by using the look-up table stored in the memory device 400 .
  • SOC state of charge
  • the processor 300 may estimate the SOC of the cell assembly 10 by integrating the charge current and the discharge current of the cell assembly 10 .
  • an initial value of the SOC when the charging or discharging of the cell assembly 10 is initiated may be determined using an open circuit voltage (OCV) of the cell assembly 10 measured before the charging or discharging is initiated.
  • the processor 300 may estimate the SOC corresponding to the OCV of the cell assembly 10 by using a look-up table that defines SOC at each temperature and each OCV of the cell assembly 10 .
  • the look-up table stored in the memory device 400 may be a table in which charged charge amounts corresponding to temperatures and OCVs of the cell assembly 10 are defined.
  • the processor 300 may estimate the SOC of the cell assembly 10 by using an extended Kalman filter.
  • the extended Kalman filter refers to a mathematical algorithm that adaptively estimates the SOC of the cell assembly 10 using the voltage, current and temperature of the battery cell.
  • the estimation of SOC using the extended Kalman filter may be referenced by, for example, “Extended Kalman filtering for battery management systems of LiPB-based hybrid electric vehicle (HEV) battery packs Parts 1, 2 and 3” (Journal of Power Source 134, 2004, p. 252-261) written by Gregory L. Plett.
  • the SOC of the cell assembly 10 may also be determined using other known methods capable of estimating the SOC by selectively utilizing voltage, current and temperature of the cell assembly 10 , besides the current integration method or the extended Kalman filter described above.
  • the processor 300 may compare the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount, and diagnose that the current sensor 30 is in a normal state if a difference between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount is an error falling within the normal range. That is, the processor 300 may diagnose that the current sensor 30 is in a normal state if the difference between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount falls within the normal range.
  • the processor 300 may measure a measurement error of the current sensor 30 by using the difference between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount.
  • ⁇ SOC(V) represents the change value [Ah] of the voltage-based charged charge amount
  • ⁇ SOC(I) represents the change value [Ah] of the current-based charged charge amount
  • ⁇ represents the error rate between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount.
  • the unit of ⁇ SOC(V) and ⁇ SOC(I) may be [Ah]
  • the unit of ⁇ may be [%].
  • ⁇ SOC(V) may be a difference between a voltage-based charged charge amount measured at t 1 and a voltage-based charged charge amount measured at t 0 .
  • ⁇ SOC(I) may be a current-based charged charge amount accumulated during the period from t 0 to t 1 .
  • the processor 300 may diagnose that the current sensor 30 is in a normal state if the error rate ⁇ falls within a normal range. In addition, the processor 300 may diagnose that the current sensor 30 is in an abnormal state if the error rate ( ⁇ ) does not fall within the normal range.
  • the normal range is a preset reference range
  • the processor 300 may diagnose the state of the current sensor 30 based on whether the error rate ( ⁇ ), which is a difference between the calculated change value of the voltage-based charged charge amount and the calculated change value of the current-based charged charge amount, falls within the normal range.
  • the normal range may be increased or decreased based on the temperature of the cell assembly 10 measured during the time when the current is measured.
  • the processor 300 may calculate the change value of the voltage-based charged charge amount by comparing a charged charge amount corresponding to a measured voltage of the cell assembly 10 at a charging initiation time and a charged charge amount corresponding to a measured voltage of the cell assembly 10 at charging completion time.
  • ⁇ SOC( V ) SOC( t 1) ⁇ SOC( t 0) ⁇ Equation 2>
  • ⁇ SOC(V) represents the change value of the voltage-based charged charge amount
  • t 0 represents the charging initiation time point
  • t 1 represents the charging completion time point
  • SOC(t 0 ) represents the charged charge amount cell corresponding to the measured voltage of the assembly 10 measured at the charging initiation time point t 0
  • SOC(t 1 ) represents the charged charge amount corresponding to the measured voltage of the cell assembly 10 measured at the charging completion time point t 1 .
  • the processor 300 may calculate the change value of the current-based charged charge amount by integrating the measured current of the cell assembly 10 from the charging initiation time point t 0 to the charging completion time point t 1 .
  • the processor 300 may calculate the change value of the voltage-based charged charge amount by comparing the charged charge amount corresponding to the measured voltage and the measured temperature of the cell assembly 10 at the charging initiation time and the charged charge amount corresponding to the measured voltage and the measured temperature of the cell assembly 10 at the charging completion time.
  • SOC(t 0 ) of Equation 2 represents the charged charge amount corresponding to the measured voltage and the measured temperature of the cell assembly 10 measured at the charging initiation time point t 0
  • SOC(t 1 ) represents the charged charge amount corresponding to the measured voltage and the measured temperature of the cell assembly 10 measured at the charging completion time point t 1 .
  • ⁇ SOC( I ) ⁇ t0 t1 Idt ⁇ Equation 3>
  • ⁇ SOC(I) represents the change value of the current-based charged charge amount
  • t 0 represents the charging initiation time point
  • t 1 represents the charging completion time point
  • I represents the measured current.
  • the charging device 50 may be electrically connected to a positive electrode terminal of the battery pack and a negative electrode terminal of a battery pack so that the cell assembly 10 is charged by the charging device 50 .
  • the processor 300 may calculate the change value of the current-based charged charge amount by integrating the measured current of the cell assembly 10 from the charging initiation time point t 0 to the charging completion time point t 1 .
  • the processor 300 may calculate the error rate ( ⁇ ) by putting the change value ( ⁇ SOC(V)) of the voltage-based charged charge amount calculated through Equation 2 and the change value ( ⁇ SOC(I)) of the current-based charged charge amount calculated through Equation 3 into Equation 1.
  • the processor 300 may diagnose the state of the current sensor 30 based on whether the calculated error rate ( ⁇ ) falls within the normal range.
  • the processor 300 may be electrically connected to a superordinate control device 70 to exchange an electric signal with the superordinate control device 70 as shown in FIG. 2 .
  • the processor 300 may transmit the diagnostic result of the current sensor 30 to the superordinate control device 70 .
  • the processor 300 may transmit an alarm to the superordinate control device 70 if the current sensor 30 is in an abnormal state.
  • the processor 300 may be implemented to optionally include a processor 300 , an application-specific integrated circuit (ASIC), another chipset, a logic circuit, a register, a communication modem and/or a data processing device, which are known in the art, to perform the above operations.
  • ASIC application-specific integrated circuit
  • the memory device 400 is not particularly limited as long as it is a storage medium capable of recording and erasing data.
  • the memory device 400 may be a RAM, a ROM, a register, a hard disk, an optical recording medium or a magnetic recording medium.
  • the memory device 400 may also be electrically connected to the processor 300 through, for example, a data bus so as to be accessible by the processor 300 .
  • the memory device 400 may store and/or update and/or erase and/or transmit a program including various control logics executed by the processor 300 and/or data generated when the control logic is executed.
  • FIG. 3 shows a measured voltage referenced by the processor according to an embodiment of the present disclosure
  • FIG. 4 shows a voltage-charged charge amount look-up table reference by the processor according to an embodiment of the present disclosure.
  • the unit of voltage is [V]
  • the unit of time (t) is [h]
  • the unit of charged charge amount is [Ah].
  • the processor 300 may calculate the change value of the voltage-based charged charge amount based on the measured voltage received with a time difference during the preset reference time. More specifically, the processor 300 may receive the measured voltage with a time difference from the voltage measuring unit 100 .
  • the time difference may be a difference of the preset reference times.
  • the processor 300 may receive the measured voltage a [V] measured at t 0 from the voltage measuring unit 100 as shown in the graph of FIG. 3 .
  • the processor 300 may receive the measured voltage b [V] measured at t 1 from the voltage measuring unit 100 .
  • the processor 300 may calculate that the change value of the voltage-based charged charge amount is 30 [Ah], based on the charged charge amount 10 [Ah] corresponding to the measured voltage 3.2 [V] measured at t 0 and the charged charge amount 40 [Ah] corresponding to the measured voltage 4.0 [V] measured at t 1 .
  • the processor 300 may calculate the change value of the current-based charged charge amount by integrating the current amount flowing in the cell assembly 10 during the period of t 0 to t 1 . In this case, the processor 300 may calculate the change value of the current-based charged charge amount by using Equation 3 described above.
  • the change value of the voltage-based charged charge amount calculated by the processor 300 is 30 [Ah].
  • the change value of the current-based charged charge amount calculated by the processor 300 during the period of t 0 to t 1 using Equation 3 is 27 [Ah].
  • the error rate ( ⁇ ) may be calculated as 10[%].
  • the normal range is set to ⁇ 5[%] to +5[%]
  • the calculated error rate ( ⁇ ) does not fall within the normal range, and thus the processor 300 may determine that the current sensor 30 is in an abnormal state.
  • the change value of the voltage-based charged charge amount calculated by the processor 300 at the preset reference times t 0 and t 1 is 30 [Ah] as in the former example.
  • the change value of the current-based charged charge amount calculated by the processor 300 during the period of t 0 to t 1 using Equation 3 is 29 [Ah].
  • the error rate ( ⁇ ) may be calculated as 3.3[%].
  • the processor 300 may determine that the current sensor 30 is in a normal state.
  • the processor 300 may estimate the voltage-based charged charge amount based on the measured voltage and the measured temperature of the cell assembly 10 .
  • the processor 300 may estimate the voltage-based charged charge amounts corresponding to the measured voltage and the measured temperature of the cell assembly 10 by using the look-up table defining charged charge amounts corresponding to voltages and temperatures, which is stored in the memory device 400 . That is, the processor 300 may estimate the voltage-based charged charge amounts according to the voltages and the temperatures of the cell assembly 10 measured at two or more preset reference times and calculate the change value of the voltage-based charged charge amount by computing the difference between the estimated voltage-based charged charge amounts.
  • the preset reference times are t 0 and t 1 , respectively.
  • the voltage measuring unit 100 may measure the voltage of the cell assembly 10 at t 0 and t 1 , respectively.
  • the temperature measuring unit 500 may also measure the temperature of the cell assembly 10 at t 0 and t 1 , respectively.
  • the processor 300 may estimate the voltage-based charged charge amount according to the voltage and the temperature of the cell assembly 10 measured at t 0 by using the look-up table stored in the memory device 400 .
  • the processor 300 may estimate the voltage-based charged charge amount according to the voltage and the temperature of the cell assembly 10 measured at t 1 by using the look-up table stored in the memory device 400 .
  • the processor 300 may calculate a change value of the voltage-based charged charge amount by calculating a difference between the voltage-based charged charge amount at t 0 and the voltage-based charged charge amount at t 1 .
  • the processor 300 may estimate the measured voltage 3.2 [V] of the cell assembly 10 measured at t 0 and the charged voltage amount 10 [Ah] corresponding to the measured temperature. In addition, the processor 300 may estimate the measured voltage 4.0 [V] of the cell assembly 10 measured at t 1 and the charged voltage amount 40 [Ah] corresponding to the measured temperature. Also, the processor 300 may calculate that the change value of the voltage-based charged charge amount is 30 [Ah], based on the estimated charge amount (10 [Ah]) at t 0 and the charged charge amount (40 [Ah]) at t 1 .
  • the processor 300 may set the normal range in consideration of the temperature of the cell assembly 10 .
  • the processor 300 may accurately diagnose the state of the current sensor based on the difference between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount by increasing or decreasing the normal range according to the temperature of the cell assembly 10 .
  • the processor 300 may change the normal range according to the difference between the temperatures of the cell assembly 10 measured at the preset reference times. That is, the normal range may be changed according to the temperatures of the cell assembly 10 measured at the preset reference times.
  • the charged charge amount of the cell assembly 10 may be estimated based on the temperature and the voltage of the cell assembly 10 .
  • the change value of the voltage-based charged charge amount may be changed according to the temperature of the cell assembly 10 .
  • the processor 300 may change the size of the normal range according to the measured temperature of the cell assembly 10 in order to correct that the change value of the voltage-based charged charge amount is changed according to the temperature. This will be described in detail with reference to Table 1.
  • the memory device 400 may store a reference table as shown in Table 1 below.
  • Table 1 is a look-up table in which voltages according to SOCs and temperatures of the battery cells are mapped, the look-up table being stored in the memory device 400 according to an embodiment of the present disclosure. That is, Table 1 is a result of measuring the voltage of the cell assembly 10 by varying the SOC (%) in the temperature range ( ⁇ 20[° C.] to 35[° C.]) within which the battery cell is generally used.
  • the cell assembly 10 may be configured to include one battery cell.
  • the processor 300 may estimate that the SOC of the cell assembly 10 is 76[%]. In addition, when the temperature of the cell assembly 10 is ⁇ 20[° C.] and the voltage is 3.968 [V], the processor 300 may estimate that the SOC of the cell assembly 10 is 78%.
  • the processor 300 may estimate that the SOC of the cell assembly 10 is lower as the temperature of the cell assembly 10 rises. In other words, although the voltage of the cell assembly 10 is the same at both time points, the processor 300 may estimate that the SOC of the cell assembly 10 is higher as the temperature of the cell assembly 10 is lowered.
  • the preset reference times are t 0 and t 1 , respectively.
  • the processor 300 may estimate that the SOC of the cell assembly 10 is 74[%] with reference to Table 1.
  • the processor 300 may estimate that the SOC of the cell assembly 10 is 78[%] with reference to Table 1. In this case, the difference between the SOC at t 0 and the SOC at t 1 of the cell assembly 10 is 4[%].
  • the SOC may be estimated differently according to the measured voltage of the cell assembly 10 .
  • the processor 300 may estimate that the SOC of the cell assembly 10 is 76[%] with reference to Table 1. In this case, the difference between the SOC at t 0 and the SOC at t 1 of the cell assembly 10 is 2[%].
  • the difference between the SOCs when the temperature of the cell assembly 10 is ⁇ 20[° C.] at t 0 and t 1 is greater than the difference between the SOCs when the temperature of the cell assembly 10 at ⁇ 20[° C.] at t 0 and the temperature of the cell assembly 10 is 35[° C.] at t 1 . That is, as the measured temperature of the cell assembly 10 is higher, the SOC may be lower even though the measured voltage is the same. Thus, as the difference between the measured temperatures of the cell assembly 10 measured at the preset reference times (at least two times) increases, the change value of the voltage-based charged charge amount of the cell assembly 10 may be smaller.
  • the processor 300 may change the size of the normal range according to the difference between the temperatures of the cell assembly 10 respectively measured at the preset reference times in order to correct that the change value of the voltage-based charged charge amount is changed due to the temperature.
  • the processor 300 may set the size of the normal range as a reference size if the temperature of the cell assembly 10 measured at two or more preset reference times is the same. For example, the processor 300 may set the range of ⁇ 5[%] to 5[%] as the reference size of the normal range. In this case, if the error rate between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount is within the normal range, the processor 300 may diagnose that the current sensor is in a normal state.
  • the processor 300 may reduce the size of the normal range to be smaller than the reference size. For example, if the temperature of the cell assembly 10 measured at t 0 is ⁇ 20[° C.] and the temperature of the cell assembly 10 measured at t 1 is 35[° C.], the processor 300 may reduce the size of the normal range to be smaller than the reference size.
  • the processor 300 may increase the size of the normal range to be greater than the reference size. For example, if the temperature of the cell assembly 10 measured at t 0 is 35[° C.] and the temperature of the cell assembly 10 measured at t 1 is ⁇ 20[° C.], the processor 300 may increase the size of the normal range to be greater than the reference size.
  • the processor 300 may increase the size of the normal range if the measured temperature of the cell assembly 10 measured at a completion time (for example, t 1 ) is lower than the measured temperature of the cell assembly 10 measured at an initiation time (for example, t 0 ). On the contrary, the processor 300 may reduce the size of the normal range if the measured temperature of the cell assembly 10 measured at the completion time (for example, t 1 ) is higher than the measured temperature of the cell assembly 10 measured at the initiation time (for example, t 0 ).
  • the apparatus for diagnosing a current sensor may diagnose the state of the current sensor more accurately since it changes the normal range based on the temperature of the cell assembly 10 even when the temperature of the cell assembly 10 changes, while the cell assembly 10 is being charged or discharged.
  • the current sensor diagnosing apparatus may be applied to a battery management system (BMS). That is, the BMS according to the present disclosure may include the current sensor diagnosing apparatus of the present disclosure as described above. In this configuration, at least a part of the components of the current sensor diagnostic apparatus according to the present disclosure may be implemented by supplementing or adding functionality of components included in the conventional BMS. For example, the processor 300 and the memory device 400 of the current sensor diagnosing apparatus according to the present disclosure may be implemented as components of the BMS.
  • the current sensor diagnosis apparatus may be provided to a battery pack. That is, the battery pack according to the present disclosure may include the current sensor diagnosing apparatus of the present disclosure as described above.
  • the battery pack may include at least one secondary battery, the current sensor diagnosing apparatus, electrical components (including a BMS, a relay, a fuse, and the like), and a case.
  • FIG. 5 is a schematic flowchart for illustrating a method for diagnosing a current sensor according to another embodiment of the present disclosure.
  • each step may be performed by any component of the apparatus for diagnosing a current sensor according to the present disclosure as described above.
  • the method for diagnosing a current sensor includes a voltage measuring step (S 100 ), a current measuring step (S 110 ), a step of calculating the change value of the voltage-based charged charge amount (S 120 ), a step of calculating the change value of the current-based charged charge amount (S 130 ) and a current sensor diagnosing step (S 140 ).
  • the voltage measuring step (S 100 ) is a step of measuring a both-end voltage of the cell assembly 10 . That is, in the voltage measuring step (S 100 ), the both-end voltage of the cell assembly 10 may be measured at each preset reference time. For example, seeing the embodiment of FIG. 3 , in the voltage measuring step (S 100 ), the both-end voltage of the cell assembly 10 may be measured at t 0 and t 1 , respectively.
  • the current measuring step (S 110 ) is a step of measuring a current flowing through the charging and discharging path.
  • the charging and discharging path is a large current path along to which the cell assembly 10 is connected, and a current sensor to be diagnosed may be installed at the charging and discharging path. That is, in the current measuring step (S 110 ), the current flowing through the charging and discharging path equipped with the current sensor may be measured during the preset reference time. For example, seeing the embodiment FIG. 3 , in the current measuring step (S 110 ), the current flowing through the charging and discharging path may be measured during t 0 to t 1 , respectively.
  • the step of calculating the change value of the voltage-based charged charge amount (S 120 ) is a step of calculating a change value of the voltage-based charged charge amount based on the both-end voltages of the cell assembly 10 respectively measured at the preset reference times.
  • the change value of the voltage-based charged charge amount may be calculated by comparing the charged charge amount corresponding to the measured voltage of the cell assembly at the charging initiation time and the charged charge amount corresponding to the measured voltage of the cell assembly at the charging completion time.
  • the voltage-based charged charge amount at t 0 may be estimated based on the both-end voltage of the cell assembly 10 measured at t 0 .
  • the voltage-based charged charge amount at t 1 may be estimated based on the both-end voltage of the cell assembly 10 measured at t 1 .
  • the change value of the voltage-based charged charge amount may be calculated according to the difference between the estimated voltage-based charged charge amount at t 0 and the estimated voltage-based charged charge amount at t 1 .
  • the step of calculating the change value of the current-based charged charge amount (S 130 ) is a step of calculating a change value of the current-based charged charge amount based on the current measured during the preset reference time.
  • the change value of the current-based charged charge amount may be calculated based on the current accumulated during the preset reference time.
  • the change value of the current-based charged charge amount may be calculated based on the current amount accumulated during the period of t 0 to t 1 .
  • the current sensor diagnosing step (S 140 ) is a step of diagnosing the current sensor by comparing an error rate between the calculated change value of the voltage-based charged charge amount and the calculated change value of the current-based charged charge amount with the normal range.
  • an error rate between the change value of the voltage-based charged charge amount and the change value of the current-based charged charge amount may be calculated.
  • the state of the current sensor may be diagnosed according to whether the calculated error rate belongs to the normal range.
  • the calculated error rate falls within the normal range, it may be diagnosed that the current sensor is in a normal state. On the contrary, if the calculated error rate does not fall with the normal range, it may be diagnosed that the current sensor is in an abnormal state.
  • FIG. 6 is a schematic flowchart for illustrating a method for diagnosing a current sensor according to still another embodiment of the present disclosure.
  • each step may be performed by any component of the current sensor diagnosing apparatus according to the present disclosure as described above.
  • the method for diagnosing a current sensor may include a voltage and temperature measuring step (S 200 ), a current measuring step (S 210 ), a step of calculating the change value of the voltage-based charged charge amount (S 220 ), a step of calculating the change value of the current-based charged charge amount (S 230 ), a normal range changing step (S 240 ) and a current sensor diagnosing step (S 250 ).
  • the voltage and temperature measuring step (S 200 ) is a step of measuring a both-end voltage and a temperature of the cell assembly 10 . That is, the voltage and temperature measuring step (S 200 ) further measures the temperature of the cell assembly, compared to the voltage measuring step (S 100 ) of FIG. 5 .
  • the both-end voltage and the temperature of the cell assembly 10 may be measured at t 0 and t 1 , respectively.
  • the current measuring step (S 210 ) is a step of measuring a current flowing through the charging and discharging path. That is, the current measuring step (S 210 ) is the same step as the current measuring step (S 110 ) of FIG. 5 , and the current flowing through the charging and discharging path equipped with the current sensor may be measured during the preset reference time. For example, seeing the embodiment of FIG. 3 , in the current measuring step (S 210 ), the current flowing through the charging and discharging path during the period of t 0 to t 1 may be measured.
  • the step of calculating the change value of the voltage-based charged charge amount (S 220 ) is a step of calculating the change value of the voltage-based charged charge amount based on the both-end voltage and the temperature of the cell assembly 10 measured at each preset reference time.
  • the change value of the voltage-based charged charge amount may be calculated based on the both-end voltage and the temperature of the cell assembly 10 , unlike the step of calculating the change value of the voltage-based charged charge amount (S 120 ) of FIG. 5 .
  • the voltage-based charged charge amount at t 0 may be estimated based on the both-end voltage and the temperature of the cell assembly 10 measured at t 0 .
  • the voltage-based charged charge amount at t 1 may be estimated based on the both-end voltage and the temperature of the cell assembly 10 measured at t 1 .
  • the change value of the voltage-based charged charge amount may be calculated according to the difference between the estimated voltage-based charged charge amount at t 0 and the estimated voltage-based charged charge amount at t 1 .
  • the look-up table stored in the memory device 400 may be used.
  • the look-up table stored in the memory device 400 may be a table in which charged charge amounts corresponding to both-end voltages and temperatures are defined.
  • the step of calculating the change value of the current-based charged charge amount (S 230 ) is a step of calculating the change value of the current-based charged charge amount based on the current measured during the preset reference time.
  • the step of calculating the change value of the current-based charged charge amount (S 230 ) as shown in FIG. 6 is the same step as the step of calculating the change value of the current-based charged charge amount (S 130 ) as shown in FIG. 5 , and the change value of the current-based charged charge amount may be calculated based on the current accumulated during the preset reference time.
  • the normal range changing step (S 240 ) is a step of changing the normal range based on the measured temperature, and the normal range may be changed according to the temperatures of the cell assembly 10 measured at the preset reference times, respectively.
  • the normal range may be changed.
  • the normal range is a preset range and may be a reference range within which the processor 300 may diagnose that the current sensor 30 is in a normal state.
  • the normal range may be set to have a reference size if the temperatures of the cell assembly 10 measured at two or more preset reference times are the same.
  • the normal range may be set to be ⁇ 5[%] to 5[%].
  • the range of ⁇ 5[%] to 5[%] may be the reference size.
  • the size of the normal range may be reduced compared to the reference size. For example, if the temperature of the cell assembly 10 measured at t 0 is ⁇ 20[° C.] and the temperature of the cell assembly 10 measured at t 1 is 35[° C.], since the temperature of the cell assembly 10 measured at t 0 is lower than the temperature of assembly 10 measured at t 1 , the size of the normal range may be reduced to be smaller than the reference size.
  • the size of the normal range may be increased compared to the reference size. For example, if the temperature of the cell assembly 10 measured at t 0 is 35[° C.] and the temperature of the cell assembly 10 measured at t 1 is ⁇ 20[° C.], the size of the normal range may be increased to be greater than the reference size.
  • the current sensor diagnosing step (S 250 ) is a step of diagnosing the current sensor by comparing an error rate between the calculated change value of the voltage-based charged charge amount and the calculated change value of the current-based charged charge amount with the normal range. That is, the current sensor diagnosing step (S 250 ) is a step of diagnosing the state of the current sensor depending on whether the error rate between the calculated change value of the voltage-based charged charge amount and the calculated change value of the current-based charged charge amount falls within the normal range set in the normal range changing step (S 240 ).
  • the current sensor diagnosing step (S 250 ) of FIG. 6 if the calculated error rate falls within the normal range, the current sensor may be diagnosed as being in the normal state, like the current sensor diagnosing step (S 140 ) of FIG. 5 . In addition, if the calculated error rate does not fall within the normal range, the current sensor may be diagnosed as being in an abnormal state.
  • the state of the current sensor may be diagnosed more accurately according to the temperature change of the cell assembly 10 .
  • the processor may be implemented as a set of program modules.
  • the program modules may be stored in a memory device and executed by a processor.
  • the types of various control logics of the processor there is no particular limitation on the types of various control logics of the processor, as long as one or more control logics are combined and the combined control logic is written in a computer-readable code system so that the computer-readable access is possible.
  • the recording medium includes at least one selected from the group consisting of a ROM, a RAM, a register, a CD-ROM, a magnetic tape, a hard disk, a floppy disk and an optical data recording device.
  • the code system may be stored and executed in a distributed manner on computers connected through a network.
  • functional programs, code and segments for implementing the combined control logics may be easily inferred by programmers in the technical field to which the present disclosure belongs.

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  • Engineering & Computer Science (AREA)
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  • Secondary Cells (AREA)
  • Charge And Discharge Circuits For Batteries Or The Like (AREA)
  • Measurement Of Current Or Voltage (AREA)
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EP3748388A1 (en) 2020-12-09
PL3748388T3 (pl) 2024-04-02
CN111758042A (zh) 2020-10-09
JP2021511495A (ja) 2021-05-06
KR20200002016A (ko) 2020-01-07
KR102427331B1 (ko) 2022-07-29
WO2020005025A1 (ko) 2020-01-02
HUE064850T2 (hu) 2024-04-28
JP7078293B2 (ja) 2022-05-31
EP3748388A4 (en) 2021-04-21
ES2969299T3 (es) 2024-05-17
US20210033679A1 (en) 2021-02-04

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