TWM649510U - Wafer notch positioning machine - Google Patents

Wafer notch positioning machine Download PDF

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Publication number
TWM649510U
TWM649510U TW112210714U TW112210714U TWM649510U TW M649510 U TWM649510 U TW M649510U TW 112210714 U TW112210714 U TW 112210714U TW 112210714 U TW112210714 U TW 112210714U TW M649510 U TWM649510 U TW M649510U
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Taiwan
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wafer
base
laser
positioning device
top surface
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TW112210714U
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Chinese (zh)
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彭薪容
游宗哲
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盛詮科技股份有限公司
彭薪容
游宗哲
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Priority to TW112210714U priority Critical patent/TWM649510U/en
Publication of TWM649510U publication Critical patent/TWM649510U/en

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Abstract

本新型係一種晶圓缺口定位機,其包含一基座,基座頂面設置有一移動台,移動台可相對於基座移動及旋轉;一雷射定位裝置,其設置於基座的頂面;一視覺定位裝置,其設置於基座的頂面;使用時將一貼覆有層晶圓翹曲調控膜且具有缺口的超薄型晶圓放置於移動台上,移動台吸附晶圓後,移動晶圓至靠近於視覺定位裝置的感測鏡頭下方位置,藉由感測鏡頭擷取晶圓的圖像並判斷缺口的位置,再利用移動台旋轉晶圓至預定位置,藉此達到精準定位晶圓之功效。The new model is a wafer notch positioning machine, which includes a base. A moving platform is provided on the top surface of the base. The moving platform can move and rotate relative to the base; a laser positioning device is installed on the top surface of the base. ; A visual positioning device, which is installed on the top surface of the base; when used, an ultra-thin wafer with a gap and covered with a layer of wafer warpage control film is placed on the moving table, and the moving table absorbs the wafer , move the wafer to a position close to the bottom of the sensing lens of the visual positioning device, capture the image of the wafer through the sensing lens and determine the position of the gap, and then use the moving stage to rotate the wafer to the predetermined position, thereby achieving precision The function of positioning the wafer.

Description

晶圓缺口定位機Wafer notch positioning machine

本新型係涉及一種定位裝置,尤指一種用於偵測晶圓缺口位置之晶圓缺口定位機。The present invention relates to a positioning device, in particular to a wafer gap positioning machine for detecting the position of a wafer gap.

現有技術的晶圓於加工時,為了能夠幫助後續加工確定晶圓的擺放位置,會在晶圓的側邊形成一缺口用以定位使用,以缺口作為判斷晶圓方向的一個基準點,具體而言,請參閱圖6所示,將一晶圓90放置於一定位機台91,定位機台91上設置有雷射定位儀92,雷射定位儀92會由上而下朝向晶圓90的邊緣投射雷射光,此時定位機台91會旋轉晶圓90,直至雷射光射穿過晶圓90的缺口位置,則可確認目前晶圓90的擺放方向並將晶圓90定位。When processing wafers in the prior art, in order to help subsequent processing determine the placement of the wafer, a notch will be formed on the side of the wafer for positioning, and the notch is used as a reference point to determine the direction of the wafer. Specifically, Referring to FIG. 6 , a wafer 90 is placed on a positioning machine 91 . The positioning machine 91 is provided with a laser positioner 92 , and the laser positioner 92 faces the wafer 90 from top to bottom. The edge of the wafer 90 projects a laser light. At this time, the positioning machine 91 will rotate the wafer 90 until the laser light passes through the gap position of the wafer 90. Then the current placement direction of the wafer 90 can be confirmed and the wafer 90 can be positioned.

然而,現今部分的晶圓90具有透明、超厚、超薄及翹曲等型態,尤其是超薄的晶圓90,當將其放置於定位機台91上時,會產生翹曲現象,簡言之,從側面視之晶圓90並不會呈水平狀,即整體呈非正圓型態,因此周圍會有高低起伏的外觀形狀,如此當雷射光投射至晶圓90時,將產生定位錯誤或甚至無法定位之現象,而為了解決前述問題,通常會在晶圓90上再貼覆一層晶圓翹曲調控膜(圖式中未示),以減少晶圓90封裝後所產生變形翹曲之程度,但因為設置了晶圓翹曲調控膜之後,會導致雷射光產生反射而無法有效定位出缺口的位置;因此,針對前述的問題,實有待加以改良。However, some of today's wafers 90 are transparent, ultra-thick, ultra-thin, and warped. Especially the ultra-thin wafer 90 will cause warping when it is placed on the positioning machine 91. In short, the wafer 90 will not be horizontal when viewed from the side, that is, it will not be a perfect circle as a whole, so there will be an undulating appearance around it. In this way, when the laser light is projected onto the wafer 90, it will produce Positioning errors or even inability to position. In order to solve the aforementioned problems, a layer of wafer warpage control film (not shown in the figure) is usually attached to the wafer 90 to reduce the deformation of the wafer 90 after packaging. However, due to the installation of the wafer warpage control film, the laser light will be reflected and the position of the notch cannot be effectively located; therefore, the aforementioned problems need to be improved.

有鑒於現有技術的缺點及不足,本新型提供一種晶圓缺口定位機,其藉由於基座上設置視覺定位裝置,達到以影像辨識晶圓並定位之目的。In view of the shortcomings and shortcomings of the existing technology, the present invention provides a wafer notch positioning machine, which achieves the purpose of identifying and positioning the wafer with images by providing a visual positioning device on the base.

為達上述之創作目的,本新型所採用的技術手段為設計一種晶圓缺口定位機,其包含: 一基座,其具有一頂面,該頂面設置有一移動台,該移動台可相對於該基座移動及旋轉; 一雷射定位裝置,其設置於該基座的該頂面,且該雷射定位裝置的位置對應於該移動台的位置; 一視覺定位裝置,其設置於該基座的該頂面,該視覺定位裝置的位置對應於該移動台的位置。 In order to achieve the above creative purpose, the technical means used in this new model is to design a wafer notch positioning machine, which includes: A base with a top surface, the top surface is provided with a moving platform, the moving platform can move and rotate relative to the base; A laser positioning device, which is disposed on the top surface of the base, and the position of the laser positioning device corresponds to the position of the mobile platform; A visual positioning device is provided on the top surface of the base, and the position of the visual positioning device corresponds to the position of the mobile platform.

進一步而言,所述之晶圓缺口定位機,其中該視覺定位裝置包含一支撐架及一感測鏡頭,該支撐架設置於該基座的該頂面,該感測鏡頭設置於該支撐架上。Furthermore, in the wafer gap positioning machine, the visual positioning device includes a support frame and a sensing lens. The support frame is disposed on the top surface of the base, and the sensing lens is disposed on the support frame. superior.

進一步而言,所述之晶圓缺口定位機,其中該感測鏡頭為CCD鏡頭。Furthermore, in the wafer notch positioning machine, the sensing lens is a CCD lens.

進一步而言,所述之晶圓缺口定位機,其中該雷射定位裝置包含一雷射固定架及一雷射偵測器,該雷射固定架設置於該基座的該頂面,該雷射偵測器固設於該雷射固定架。Furthermore, in the wafer notch positioning machine, the laser positioning device includes a laser fixture and a laser detector, the laser fixture is disposed on the top surface of the base, and the laser The laser detector is fixed on the laser fixture.

進一步而言,所述之晶圓缺口定位機,其中該移動台為具有吸附並旋轉功能之晶圓吸附盤。Furthermore, in the wafer notch positioning machine, the moving platform is a wafer suction disk with suction and rotation functions.

本新型的優點在於,當晶圓為貼覆一層晶圓翹曲調控膜且具有缺口的超薄型之晶圓時,則可利用移動台吸附晶圓後,移動晶圓至靠近於視覺定位裝置的感測鏡頭下方位置,藉由感測鏡頭擷取晶圓的圖像並判斷缺口的位置,再利用移動台旋轉晶圓至預定位置,藉此達到定位晶圓之功效;當晶圓為小尺寸且硬質之晶圓時,因為放置於移動台上其外緣並不會產生下凹之現象,或是下凹現象非常輕微時,則可依據需求單獨應用雷射定位裝置或視覺定位裝置對晶圓進行定位動作,具有機台整合性及便利性提升之優點。The advantage of this new method is that when the wafer is an ultra-thin wafer that is coated with a layer of wafer warpage control film and has a gap, the moving stage can be used to absorb the wafer and then move the wafer close to the visual positioning device. Under the sensing lens, the sensing lens captures the image of the wafer and determines the position of the notch, and then uses the moving stage to rotate the wafer to a predetermined position, thereby achieving the effect of positioning the wafer; when the wafer is small For large and hard wafers, the outer edge of the wafer will not be concave because it is placed on the moving table, or if the concave phenomenon is very slight, a laser positioning device or a visual positioning device can be used separately according to the needs. The wafer performs positioning action, which has the advantages of improved machine integration and convenience.

以下配合圖式以及本新型之較佳實施例,進一步闡述本新型為達成預定創作目的所採取的技術手段。The technical means adopted by the present invention to achieve the predetermined creative purpose will be further described below with reference to the drawings and preferred embodiments of the present invention.

請參閱圖1所示,本新型之晶圓缺口定位機包含一基座10、一雷射定位裝置20及一視覺定位裝置30。Please refer to FIG. 1 . The new wafer notch positioning machine of the present invention includes a base 10 , a laser positioning device 20 and a visual positioning device 30 .

請參閱圖1及圖2所示,基座10具有一頂面11,頂面11設置有一移動台12,移動台12可相對於基座10移動及旋轉,前述移動台12可移動及旋轉之機構為現有技術之應用,故不詳述,在本實施例中,移動台12為具有吸附並旋轉功能之晶圓吸附盤,但不以此為限,移動台12之形式可依使用者需求作改變。Please refer to Figures 1 and 2. The base 10 has a top surface 11. The top surface 11 is provided with a moving platform 12. The moving platform 12 can move and rotate relative to the base 10. The moving platform 12 can move and rotate. The mechanism is an application of existing technology, so it will not be described in detail. In this embodiment, the mobile platform 12 is a wafer suction disc with adsorption and rotation functions, but it is not limited to this. The form of the mobile platform 12 can be based on the user's needs. make changes.

請參閱圖1至圖3所示,雷射定位裝置20包含一雷射固定架21及一雷射偵測器22,雷射固定架21設置於基座10的頂面11,雷射偵測器22固設於雷射固定架21,且雷射定位裝置20的位置對應於移動台12的位置,前述位置對應所指為雷射偵測器22所投射出之雷射光可有效對準目標物之位置,在本實施例中,雷射偵測器22為向下投射雷射光,但不以此為限,其設置方式可依使用者需求作改變。Please refer to FIGS. 1 to 3 . The laser positioning device 20 includes a laser fixing bracket 21 and a laser detector 22 . The laser fixing bracket 21 is disposed on the top surface 11 of the base 10 . The device 22 is fixed on the laser fixing frame 21, and the position of the laser positioning device 20 corresponds to the position of the mobile platform 12. The foregoing corresponding position indicates that the laser light projected by the laser detector 22 can effectively aim at the target. Regarding the position of the object, in this embodiment, the laser detector 22 projects laser light downward, but it is not limited to this, and its arrangement can be changed according to the user's needs.

視覺定位裝置30包含一支撐架31及一感測鏡頭32,支撐架31設置於基座10的頂面11,感測鏡頭32為CCD鏡頭,其設置於支撐架31上,且視覺定位裝置30的位置對應於移動台12的位置,前述位置對應所指為感測鏡頭32可有效擷取放置於移動台12上物品之影像,在本實施例中,感測鏡頭32為朝向下方方向,但不以此為限,其設置方式可依使用者需求作改變。The visual positioning device 30 includes a supporting frame 31 and a sensing lens 32. The supporting frame 31 is arranged on the top surface 11 of the base 10. The sensing lens 32 is a CCD lens, which is arranged on the supporting frame 31. The visual positioning device 30 The position corresponds to the position of the moving platform 12. The aforementioned position corresponds to the sensing lens 32 that can effectively capture the image of the object placed on the moving platform 12. In this embodiment, the sensing lens 32 is facing downward, but Not limited to this, the setting method can be changed according to the user's needs.

本新型使用時,請參閱圖4及圖5所示,以對具有缺口41的超薄型晶圓40進行定位為例說明,但不以此為限,因為晶圓40為超薄型,故會於晶圓40上再貼覆一層晶圓翹曲調控膜(圖式中未示)以減少其翹曲,晶圓40放置於移動台12並吸附固定後,移動台12移動晶圓40至靠近於視覺定位裝置30的感測鏡頭32下方位置,藉由感測鏡頭32擷取晶圓40的圖像並判斷缺口41的位置,再利用移動台12旋轉晶圓40至預定位置,藉此達到定位晶圓40之功效,故可解決先前技術因為貼了晶圓翹曲調控膜而無法定位之問題。When using the present invention, please refer to Figures 4 and 5, taking the positioning of the ultra-thin wafer 40 with the notch 41 as an example, but it is not limited to this, because the wafer 40 is ultra-thin, so A layer of wafer warpage control film (not shown in the figure) will be affixed to the wafer 40 to reduce its warpage. After the wafer 40 is placed on the moving stage 12 and adsorbed and fixed, the moving stage 12 moves the wafer 40 to Close to the position below the sensing lens 32 of the visual positioning device 30, the sensing lens 32 captures the image of the wafer 40 and determines the position of the notch 41, and then uses the moving stage 12 to rotate the wafer 40 to a predetermined position. The effect of positioning the wafer 40 is achieved, thereby solving the problem of inability to position the wafer due to the pasting of the wafer warpage control film in the previous technology.

前述過程中,當晶圓40為小尺寸且硬質之晶圓40時,因為放置於移動台12上其外緣並不會產生下凹之現象,或是下凹現象非常輕微時,則可依據需求單獨應用雷射定位裝置20或視覺定位裝置30對晶圓40進行定位動作,具有機台整合性及便利性提升之優點。In the foregoing process, when the wafer 40 is a small-sized and hard wafer 40, the outer edge of the wafer 40 will not be concave because it is placed on the moving stage 12, or when the concave phenomenon is very slight, it can be based on It is necessary to separately use the laser positioning device 20 or the visual positioning device 30 to position the wafer 40, which has the advantages of improved machine integration and convenience.

以上所述僅是本新型之較佳實施例而已,並非對本新型做任何形式上的限制,雖然本新型已以較佳實施例揭露如上,然而並非用以限定本新型,任何所屬技術領域中具有通常知識者,在不脫離本新型技術方案的範圍內,當可利用上述揭示的技術內容作出些許更動或修飾作為等同變化的等效實施例,但凡是未脫離本新型技術方案的內容,依據本新型的技術實質對以上實施例所做的任何簡單修改、等同變化與修飾,均仍屬於本新型技術方案的範圍內。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention in any form. Although the present invention has been disclosed above with preferred embodiments, they are not intended to limit the present invention. Any technical field that has A person with ordinary knowledge, without departing from the scope of the technical solution of the present invention, can use the technical content disclosed above to make some changes or modifications as equivalent embodiments of equivalent changes. However, any content that does not depart from the technical solution of the present invention shall be based on this Novel Technical Substance Any simple modifications, equivalent changes and modifications made to the above embodiments still fall within the scope of the new technical solution.

10:基座 11:頂面 12:移動台 20:雷射定位裝置 21:雷射固定架 22:雷射偵測器 30:視覺定位裝置 31:支撐架 32:感測鏡頭 40:晶圓 41:缺口 90:晶圓 91:定位機台 92:雷射定位儀 10: base 11:Top surface 12:Mobile station 20:Laser positioning device 21:Laser holder 22:Laser detector 30:Visual positioning device 31: Support frame 32: Sensing lens 40:wafer 41: Gap 90:wafer 91: Positioning machine 92:Laser locator

圖1為本新型之立體外觀圖。 圖2為本新型之局部分解圖。 圖3為本新型之另一局部分解圖。 圖4為本新型之使用示意圖。 圖5為本新型之另一使用示意圖。 圖6為現有技術示意圖。 Figure 1 is a three-dimensional appearance view of the new model. Figure 2 is a partially exploded view of the new model. Figure 3 is another partially exploded view of the present invention. Figure 4 is a schematic diagram of the use of this new type. Figure 5 is another usage diagram of this new type. Figure 6 is a schematic diagram of the prior art.

10:基座 10: base

11:頂面 11:Top surface

12:移動台 12:Mobile station

20:雷射定位裝置 20:Laser positioning device

30:視覺定位裝置 30:Visual positioning device

Claims (5)

一種晶圓缺口定位機,其包含: 一基座,其具有一頂面,該頂面設置有一移動台,該移動台可相對於該基座移動及旋轉; 一雷射定位裝置,其設置於該基座的該頂面,且該雷射定位裝置的位置對應於該移動台的位置; 一視覺定位裝置,其設置於該基座的該頂面,該視覺定位裝置的位置對應於該移動台的位置。 A wafer notch positioning machine, which includes: A base with a top surface, the top surface is provided with a moving platform, the moving platform can move and rotate relative to the base; A laser positioning device, which is disposed on the top surface of the base, and the position of the laser positioning device corresponds to the position of the mobile platform; A visual positioning device is provided on the top surface of the base, and the position of the visual positioning device corresponds to the position of the mobile platform. 如請求項1所述之晶圓缺口定位機,其中該視覺定位裝置包含一支撐架及一感測鏡頭,該支撐架設置於該基座的該頂面,該感測鏡頭設置於該支撐架上。The wafer gap positioning machine according to claim 1, wherein the visual positioning device includes a support frame and a sensing lens. The support frame is disposed on the top surface of the base, and the sensing lens is disposed on the support frame. superior. 如請求項2所述之晶圓缺口定位機,其中該感測鏡頭為CCD鏡頭。The wafer notch positioning machine as described in claim 2, wherein the sensing lens is a CCD lens. 如請求項1至3中任一項所述之晶圓缺口定位機,其中該雷射定位裝置包含一雷射固定架及一雷射偵測器,該雷射固定架設置於該基座的該頂面,該雷射偵測器固設於該雷射固定架。The wafer notch positioning machine as described in any one of claims 1 to 3, wherein the laser positioning device includes a laser holder and a laser detector, and the laser holder is installed on the base On the top surface, the laser detector is fixed on the laser fixing frame. 如請求項4所述之晶圓缺口定位機,其中該移動台為具有吸附並旋轉功能之晶圓吸附盤。The wafer notch positioning machine as described in claim 4, wherein the mobile platform is a wafer suction disk with suction and rotation functions.
TW112210714U 2023-10-03 2023-10-03 Wafer notch positioning machine TWM649510U (en)

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