TWM637086U - Parallelism of assembling detection device and system thereof - Google Patents

Parallelism of assembling detection device and system thereof Download PDF

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TWM637086U
TWM637086U TW111208130U TW111208130U TWM637086U TW M637086 U TWM637086 U TW M637086U TW 111208130 U TW111208130 U TW 111208130U TW 111208130 U TW111208130 U TW 111208130U TW M637086 U TWM637086 U TW M637086U
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light
assembly
reflective
specified
incident light
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TW111208130U
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Chinese (zh)
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梁世音
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儀銳實業有限公司
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Priority to TW111208130U priority Critical patent/TWM637086U/en
Publication of TWM637086U publication Critical patent/TWM637086U/en
Priority to CN202321573163.XU priority patent/CN220039391U/en

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Abstract

組裝平行度檢測裝置包括發光元件、第一及第二反射元件、以及準直儀。發光元件產生截面具有指定形狀的指定光線。第一反射元件具有第一反射面反射第一入射光以產生第一反射光。第二反射元件具有第二反射面反射第二入射光以產生第二反射光,且第一反射面朝向第二反射面。準直儀設置於第一及第二反射元件之間,且具有分光鏡將指定光線分為第一及第二入射光,具有第一出光口供第一入射光發射至第一反射元件,具有第二出光口供第二入射光發射至第二反射元件,第一及第二出光口之出光方向相反。觀測窗口用於呈現第一及第二反射光。The assembled parallelism detection device includes a light-emitting element, a first and a second reflective element, and a collimator. A light emitting element produces a specified light with a specified shape in cross-section. The first reflective element has a first reflective surface to reflect the first incident light to generate first reflected light. The second reflective element has a second reflective surface to reflect the second incident light to generate second reflected light, and the first reflective surface faces the second reflective surface. The collimator is arranged between the first and second reflective elements, and has a beam splitter to divide the specified light into first and second incident light, has a first light outlet for emitting the first incident light to the first reflective element, and has a second The two light outlets are used for the second incident light to be emitted to the second reflective element, and the directions of light output from the first and second light outlets are opposite. The observation window is used to present the first and second reflected light.

Description

組裝平行度檢測裝置及其系統Assembling the parallelism detection device and its system

本創作關於鏡頭組裝,特別是一種組裝平行度檢測裝置及其系統。 This creation is about lens assembly, especially an assembly parallelism detection device and its system.

隨著科技的發展,手機已經廣泛應用於人們的日常生活當中,而絕大部分的手機都安裝有用於照相或指紋辨識的相機鏡頭。 With the development of technology, mobile phones have been widely used in people's daily life, and most of the mobile phones are equipped with camera lenses for taking pictures or fingerprint recognition.

在組裝鏡頭時,鏡片組裝吸嘴與鏡筒放置平台二者之間的平行度決定了鏡片組裝的平行度,高畫素的鏡頭對於鏡片堆疊平行度的要求也是越小越好。所以調整吸嘴與平台兩者之間的平行度極為重要。目前的調整方法通常是用量錶測頭先接觸吸嘴並移動量錶,將移動量調整至最小表示水平調整完成,再將量錶測頭移至平台上並移動也是將移動量調整至最小,調整完成後代表兩者平行度為最佳狀態。然而,目前使用的接觸式量錶為單點接觸,量測時為一條線,如果面積較大需要量測多次。 When assembling the lens, the parallelism between the lens assembly suction nozzle and the lens barrel placement platform determines the parallelism of the lens assembly, and the higher the resolution of the lens, the smaller the parallelism requirement for lens stacking, the better. Therefore, it is extremely important to adjust the parallelism between the nozzle and the platform. The current adjustment method is usually to use the gauge head to touch the suction nozzle first and move the gauge. Adjusting the movement amount to the minimum indicates that the level adjustment is completed, and then moving the gauge probe to the platform and moving it also adjusts the movement amount to the minimum. After the adjustment is completed, it means that the parallelism between the two is in the best state. However, the currently used contact gauge is a single-point contact, and the measurement is a line. If the area is large, it needs to be measured multiple times.

有鑑於此,本創作提出一種鏡片組裝平行度調整系統,透過光學準直儀產生一個平行光來校正組裝吸嘴與平台的平行度。本創作是一種光學非接觸式的調整系統。本創作提出的鏡片組裝平行度調整系統相較於使用接觸式量錶的方式具有更高的精準度。 In view of this, this creation proposes a lens assembly parallelism adjustment system, which generates a parallel light through an optical collimator to correct the parallelism between the assembly nozzle and the platform. This creation is an optical non-contact adjustment system. The lens assembly parallelism adjustment system proposed by this creation has higher accuracy than the method of using a contact scale.

依據本創作一實施例的一種組裝平行度檢測裝置,適用於校正第一組裝元件及第二組裝元件之間的平行度。所述組裝平行度檢測裝置 包括發光元件、第一反射元件、第二反射元件以及準直儀。發光元件產生指定光線,指定光線之截面具有指定形狀。第一反射元件設置在第一組裝元件,且具有第一反射面反射第一入射光以產生第一反射光。第二反射元件設置在第二組裝元件,且具有第二反射面反射第二入射光以產生第二反射光,且第一反射面朝向第二反射面。準直儀設置於第一反射元件及第二反射元件之間。準直儀包括入光口、分光鏡、第一出光口、第二出光口及觀測窗口。入光口接收指定光線。分光鏡將指定光線分為第一入射光及第二入射光。第一出光口,供第一入射光發射至第一反射元件,並接收第一反射光。第二出光口供第二入射光發射至第二反射元件,並接收第二反射光,且第一出光口之出光方向相反於第二出光口之出光方向。觀測窗口用於呈現第一反射光及第二反射光。 An assembly parallelism detection device according to an embodiment of the present invention is suitable for correcting the parallelism between the first assembly component and the second assembly component. The assembly parallelism detection device It includes a light emitting element, a first reflective element, a second reflective element and a collimator. The light-emitting element generates specified light, and the cross-section of the specified light has a specified shape. The first reflective element is arranged on the first assembly element, and has a first reflective surface to reflect the first incident light to generate first reflected light. The second reflective element is arranged on the second assembly element, and has a second reflective surface to reflect the second incident light to generate second reflected light, and the first reflective surface faces the second reflective surface. The collimator is disposed between the first reflective element and the second reflective element. The collimator includes a light entrance, a beam splitter, a first light exit, a second light exit and an observation window. The light entrance receives the specified light. The beam splitter divides the specified light into the first incident light and the second incident light. The first light outlet is used for emitting the first incident light to the first reflection element and receiving the first reflected light. The second light outlet is used for emitting the second incident light to the second reflection element and receiving the second reflected light, and the light output direction of the first light output port is opposite to the light output direction of the second light output port. The observation window is used to display the first reflected light and the second reflected light.

依據本創作一實施例的一種組裝平行度檢測系統,適用於檢測鏡片與設置面之間的平行度。所述組裝平行度檢測系統包括第一元件、第二元件、發光元件以及準直儀。第一元件用於吸附鏡片。第二元件具有設置面供設置鏡片。發光元件產生指定光線,指定光線之截面具有指定形狀。準直儀設置於第一元件及第二元件之間,且設置於指定光線之行進路徑上以接收指定光線。準直儀用於將指定光線分光為第一入射光及第二入射光,第一入射光以第一方向射至第一元件,第二光線以第二方向射至第二元件,且第一方向相反於第二方向。準直儀更用於接收並呈現第一反射光及第二反射光,第一入射光與該第一反射光的行進方向相反,第二入射光與該第二反射光的行進方向相反。 An assembly parallelism inspection system according to an embodiment of the present invention is suitable for inspecting the parallelism between the lens and the installation surface. The assembly parallelism detection system includes a first component, a second component, a light emitting component and a collimator. The first element is used for absorbing the lens. The second element has a setting surface for setting the lens. The light-emitting element generates specified light, and the cross-section of the specified light has a specified shape. The collimator is arranged between the first element and the second element, and is arranged on the traveling path of the specified light to receive the specified light. The collimator is used to split the specified light into first incident light and second incident light, the first incident light hits the first element in the first direction, the second light hits the second element in the second direction, and the first The direction is opposite to the second direction. The collimator is further used for receiving and presenting the first reflected light and the second reflected light, the traveling direction of the first incident light is opposite to that of the first reflected light, and the traveling direction of the second incident light is opposite to that of the second reflected light.

綜上所述,本創作提出的組裝平行度檢測裝置及其系統,透 過具有兩個出光口的準直儀檢測組裝件之間的平行度,相較於傳統使用量錶確認平行度的檢測方式具有更高的精確度。 In summary, the assembly parallelism detection device and system proposed in this creation, through The parallelism between assemblies is detected by a collimator with two light outlets, which has higher accuracy than the traditional detection method of using a gauge to confirm the parallelism.

以上之關於本揭露內容之說明及以下之實施方式之說明係用以示範與解釋本創作之精神與原理,並且提供本創作之專利申請範圍更進一步之解釋。 The above description about the content of this disclosure and the following description of the implementation are used to demonstrate and explain the spirit and principle of this creation, and to provide a further explanation of the patent application scope of this creation.

100:組裝平行度檢測裝置 100: Assembling the parallelism detection device

200:組裝平行度檢測系統 200: Assembling the parallelism detection system

10:第一組裝元件 10: The first assembly components

20:第二組裝元件 20: The second assembly component

30:第一反射元件 30: The first reflective element

301:第一反射面 301: the first reflective surface

40:第二組裝元件 40: The second assembly element

401:第二反射面 401: second reflective surface

50:準直儀 50: collimator

51:入光口 51: light entrance

52:分光鏡 52: beam splitter

53:分光鏡 53: beam splitter

54:第一出光口 54: The first light outlet

55:第二出光口 55: Second light outlet

56:觀測窗口 56: Observation window

60:光源 60: light source

A1:第一入射光 A1: The first incident light

A2:第一反射光 A2: First reflected light

B1:第二入射光 B1: Second incident light

B2:第二反射光 B2: Second reflected light

圖1是本創作一實施例的組裝平行度檢測裝置的側視圖;圖2是本創作一實施例的準直儀的架構示意圖;圖3是本創作一實施例的組裝平行度檢測系統的架構示意圖;圖4是在準直儀觀測到的第二反射光的示意圖;圖5是在準直儀觀測到的第一反射光及第二反射光的示意圖;以及圖6是在準直儀觀測到的第一反射光及第二反射光彼此重合的示意圖。 Fig. 1 is a side view of an assembly parallelism detection device of an embodiment of the invention; Fig. 2 is a schematic diagram of the structure of a collimator of an embodiment of the invention; Fig. 3 is a structure of an assembly parallelism detection system of an embodiment of the invention Schematic diagram; Figure 4 is a schematic diagram of the second reflected light observed at the collimator; Figure 5 is a schematic diagram of the first reflected light and the second reflected light observed at the collimator; and Figure 6 is observed at the collimator A schematic diagram of overlapping of the first reflected light and the second reflected light.

以下在實施方式中詳細敘述本創作之詳細特徵以及特點,其內容足以使任何熟習相關技藝者了解本創作之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本創作相關之構想及特點。以下之實施例係進一步詳細說明本創作之觀點,但非以任何觀點限制本創作之範疇。 The detailed features and characteristics of this creation are described in detail below in the implementation mode. The content is enough to enable anyone familiar with the relevant arts to understand the technical content of this creation and implement it accordingly. According to the content disclosed in this specification, the patent scope and drawings , anyone who is familiar with the related art can easily understand the ideas and features related to this creation. The following examples are to further describe the viewpoints of this creation in detail, but not to limit the scope of this creation in any way.

圖1是本創作一實施例的組裝平行度檢測裝置的架構示意圖。組裝平行度檢測裝置100適用於校正第一組裝元件10及第二組裝元件20之間的平行度。第一組裝元件10例如是鏡頭吸嘴,第二組裝元件20 例如是鏡筒放置平台。組裝平行度檢測裝置100包括發光元件(未繪示於圖1)、第一反射元件30、第二反射元件40以及準直儀50)。 FIG. 1 is a schematic structural diagram of an assembly parallelism detection device according to an embodiment of the present invention. The assembly parallelism detection device 100 is suitable for correcting the parallelism between the first assembly component 10 and the second assembly component 20 . The first assembly element 10 is, for example, a lens nozzle, and the second assembly element 20 is An example is the lens barrel placement platform. The assembled parallelism detection device 100 includes a light emitting element (not shown in FIG. 1 ), a first reflective element 30 , a second reflective element 40 and a collimator 50 ).

發光元件產生指定光線。指定光線之截面具有指定形狀。在一實施例中,發光元件包括光源及遮罩。遮罩具有鏤空部分,光源的光線透過鏤空部分形成截面具有指定形狀的指定光線。在一實施例中,所述指定形狀為十字形,但本創作不限制指定形狀。 A light emitting element produces a specified light. Specifies that the cross-section of the ray has the specified shape. In one embodiment, the light emitting element includes a light source and a shade. The mask has a hollow part, and the light from the light source passes through the hollow part to form a specified light with a specified cross-section. In one embodiment, the specified shape is a cross, but the invention does not limit the specified shape.

第一反射元件30設置在第一組裝元件10,且具有第一反射面301反射第一入射光A1以產生第一反射光A2。第二反射元件40設置在第二組裝元件20,且具有第二反射面401反射第二入射光B1以產生第二反射光B2。如圖1所示,第一反射面301朝向第二反射面401。在一實施例中,第一反射元件30及第二反射元件40為玻璃,但本創作不限制反射元件30,40的組成材料。需注意的是,為了清楚且同時呈現入射光及反射光,因此圖1分開繪製二者。實務上,第一入射光A1和第一反射光A2的路徑相同,第二入射光B1和第二反射光B2的路徑相同。 The first reflective element 30 is disposed on the first assembly element 10 and has a first reflective surface 301 to reflect the first incident light A1 to generate the first reflected light A2. The second reflective element 40 is disposed on the second assembly element 20 and has a second reflective surface 401 to reflect the second incident light B1 to generate the second reflected light B2. As shown in FIG. 1 , the first reflective surface 301 faces the second reflective surface 401 . In one embodiment, the first reflective element 30 and the second reflective element 40 are glass, but the invention does not limit the composition materials of the reflective elements 30 , 40 . It should be noted that, in order to present both incident light and reflected light clearly, FIG. 1 draws them separately. In practice, the paths of the first incident light A1 and the first reflected light A2 are the same, and the paths of the second incident light B1 and the second reflected light B2 are the same.

準直儀50設置於第一反射元件30及第二反射元件40之間。由於圖1為側視圖,因此僅繪視準直儀50的一部份。請參考圖2,圖2是本創作一實施例的準直儀的架構示意圖,並且包含圖1側視圖未繪示的發光元件60。 The collimator 50 is disposed between the first reflective element 30 and the second reflective element 40 . Since FIG. 1 is a side view, only a part of the collimator 50 is shown. Please refer to FIG. 2 . FIG. 2 is a schematic structural diagram of a collimator according to an embodiment of the present invention, and includes a light emitting element 60 not shown in the side view of FIG. 1 .

如圖2所示,準直儀50包括入光口51、分光鏡52、分光鏡53、第一出光口54、第二出光口55以及觀測窗口56。 As shown in FIG. 2 , the collimator 50 includes a light entrance 51 , a beam splitter 52 , a beam splitter 53 , a first light exit 54 , a second light exit 55 and an observation window 56 .

入光口51接收發光元件60產生的指定光線。 The light entrance 51 receives the specified light generated by the light emitting element 60 .

分光鏡52用於將指定光線轉換為平行光,分光鏡53用於將 平行光分為第一入射光A1及第二入射光B1。 The beam splitter 52 is used to convert the specified light into parallel light, and the beam splitter 53 is used to convert The parallel light is divided into first incident light A1 and second incident light B1.

請一併參考圖1及圖2。第一出光口54供第一入射光A1發射至第一反射元件30,並接收第一反射元件30產生的第一反射光A2。第二出光口55供第二入射光B1發射至第二反射元件40,並接收第二反射光B2。第一出光口54之出光方向相反於第二出光口55之出光方向。 Please refer to Figure 1 and Figure 2 together. The first light outlet 54 is used for emitting the first incident light A1 to the first reflective element 30 and receiving the first reflected light A2 generated by the first reflective element 30 . The second light outlet 55 is used for emitting the second incident light B1 to the second reflective element 40 and receiving the second reflected light B2. The light output direction of the first light output port 54 is opposite to the light output direction of the second light output port 55 .

第一反射光A2循第一入射光A1的路徑通過第一出光口54返回到反光鏡53,再被折射到觀測窗口56。第二反射光B2循第二入射光B1的路徑通過第二出光口55返回到反光鏡53,再被折射到觀測窗口56。因此觀測窗口56呈現第一反射光A2及第二反射光B2。綜合圖1及圖2可知,第一入射光A1與第二入射光B1二者的行進方向相反。此外,第一入射光A1及第二入射光B1的每一者的截面皆會符合指定光線的指定形狀(如十字形)。第一反射光A2及第二反射光B2的每一者的截面也會符合指定形狀。因此,透過在觀測窗口56檢視第一反射光A2形成的指定形狀和第二反射光B2形成的指定形狀,並判斷二者是否重合,可用於判斷第一反射元件30和第二反射元件40的平行度。因為第一反射元件30設置在第一組裝元件10上,第二反射元件40設置在第二組裝元件20上,因此第一反射元件30和第二反射元件40的平行度相當於第一組裝元件10和第二組裝元件20的平行度,從而確保使用第一組裝元件10和第二組裝元件20組裝鏡頭時具有足夠的平行度。 The first reflected light A2 returns to the mirror 53 through the first light outlet 54 along the path of the first incident light A1 , and is refracted to the observation window 56 . The second reflected light B2 returns to the mirror 53 through the second light outlet 55 along the path of the second incident light B1 , and is refracted to the observation window 56 . Therefore, the observation window 56 presents the first reflected light A2 and the second reflected light B2. From FIG. 1 and FIG. 2 , it can be known that the traveling directions of the first incident light A1 and the second incident light B1 are opposite. In addition, the cross section of each of the first incident light A1 and the second incident light B1 conforms to the specified shape (such as a cross) of the specified light. The cross section of each of the first reflected light A2 and the second reflected light B2 also conforms to the specified shape. Therefore, inspecting the specified shape formed by the first reflected light A2 and the specified shape formed by the second reflected light B2 through the observation window 56, and judging whether the two overlap can be used to judge the shape of the first reflective element 30 and the second reflective element 40. parallelism. Because the first reflective element 30 is arranged on the first assembly element 10, and the second reflective element 40 is arranged on the second assembly element 20, the parallelism between the first reflective element 30 and the second reflective element 40 is equivalent to that of the first assembly element. 10 and the second assembly element 20, so as to ensure sufficient parallelism when using the first assembly element 10 and the second assembly element 20 to assemble the lens.

為清楚理解本實施例的組裝平行度檢測裝置100如何用於組裝系統,請參考圖3,圖3是本創作一實施例的組裝平行度檢測系統200的架構示意圖。 In order to clearly understand how the assembly parallelism detection device 100 of this embodiment is used in an assembly system, please refer to FIG. 3 , which is a schematic structural diagram of an assembly parallelism detection system 200 according to an embodiment of the present invention.

組裝平行度檢測系統200適用於檢測鏡片與設置面之間的平行度。所述組裝平行度檢測系統200包括第一元件、第二元件、發光元件(未繪示)以及準直儀。換言之,組裝平行度檢測系統200相當於將第一組裝元件10及第二組裝元件20整合至前述的組裝平行度檢測裝置100。 The assembled parallelism detection system 200 is suitable for detecting the parallelism between the lens and the setting surface. The assembly parallelism detection system 200 includes a first component, a second component, a light emitting component (not shown) and a collimator. In other words, the assembly parallelism detection system 200 is equivalent to integrating the first assembly component 10 and the second assembly component 20 into the aforementioned assembly parallelism detection device 100 .

第一元件用於在平行度檢測完成之後吸附鏡片。第二元件具有設置面,用於在平行度檢測完成之後供設置鏡片。所述平行度檢測係確認第一元件在空間中佔據的平面與第二元件在空間中佔據的平面,二者處於平行狀態。 The first element is used to absorb the lens after the parallelism detection is completed. The second element has a setting surface for setting the lens after the parallelism detection is completed. The parallelism detection is to confirm that the plane occupied by the first element and the plane occupied by the second element are parallel.

請參考圖3。在一實施例中,第一元件包括第一組裝元件10及第一反射元件30。第一組裝元件10例如是吸嘴,可在平行度檢測完成之後,吸附鏡片進行組裝。第一反射元件30例如是玻璃。第一反射元件30設置在第一組裝元件10且位於第一組裝元件10及準直儀50的第一出光口54之間。第一反射元件30具有第一反射面301反射第一入射光A1以產生第一反射光A2。在一實施例中,第一元件更包括調整裝置,調整裝置用於調整第一組裝元件10的傾斜角度。所述調整裝置例如是調整螺絲。 Please refer to Figure 3. In one embodiment, the first component includes a first assembly component 10 and a first reflective component 30 . The first assembly element 10 is, for example, a suction nozzle, which can absorb the lens for assembly after the parallelism detection is completed. The first reflective element 30 is, for example, glass. The first reflective element 30 is disposed on the first assembly element 10 and located between the first assembly element 10 and the first light outlet 54 of the collimator 50 . The first reflective element 30 has a first reflective surface 301 to reflect the first incident light A1 to generate the first reflected light A2. In one embodiment, the first component further includes an adjustment device for adjusting the inclination angle of the first assembly component 10 . The adjusting device is, for example, an adjusting screw.

在一實施例中,第二元件包括第二組裝元件20及第二反射元件40。第二組裝元件20例如是組裝平台或基板,其具有設置面以供鏡片組裝時設置。第二反射元件40例如是玻璃。第二反射元件40設置在第二組裝元件20且位於第二組裝元件20及準直儀50的第二出光口55之間。第二反射元件40具有第二反射面401反射第二入射光B1以產生第二反射光B2。在一實施例中,第二元件更包括調整裝置,調整裝置用於調整第二組裝元件20的傾斜角度。所述調整裝置例如是調整螺絲。 In one embodiment, the second element includes a second assembly element 20 and a second reflective element 40 . The second assembling element 20 is, for example, an assembling platform or a base plate, which has a setting surface for setting when the lens is assembled. The second reflective element 40 is, for example, glass. The second reflective element 40 is disposed on the second assembly element 20 and located between the second assembly element 20 and the second light outlet 55 of the collimator 50 . The second reflective element 40 has a second reflective surface 401 to reflect the second incident light B1 to generate the second reflected light B2. In one embodiment, the second component further includes an adjustment device for adjusting the inclination angle of the second assembly component 20 . The adjusting device is, for example, an adjusting screw.

發光元件的實施方式如前文所述,在此不重複。 The implementation of the light emitting element is as described above and will not be repeated here.

準直儀50設置於第一元件及第二元件之間,且設置於指定光線之行進路徑上以接收指定光線。準直儀50用於將指定光線分光為第一入射光A1及第二入射光B1,第一入射光A1以第一方向射至第一元件,第二入射光B1以第二方向射至第二元件,且第一方向相反於第二方向。第一方向是從第一出光口54到第一反射元件30。第二方向是從第二出光口55到第二反射元件40。準直儀50更用於接收並呈現第一反射光A2及第二反射光B2,第一入射光A1與第一反射光A2的行進方向相反,第二入射光B1與第二反射光B2的行進方向相反。 The collimator 50 is arranged between the first element and the second element, and is arranged on the traveling path of the specified light to receive the specified light. The collimator 50 is used to split the specified light into first incident light A1 and second incident light B1, the first incident light A1 strikes the first element in the first direction, and the second incident light B1 strikes the first component in the second direction. Two elements, and the first direction is opposite to the second direction. The first direction is from the first light outlet 54 to the first reflective element 30 . The second direction is from the second light outlet 55 to the second reflective element 40 . The collimator 50 is further used for receiving and presenting the first reflected light A2 and the second reflected light B2. Travel in the opposite direction.

以下說明本創作一實施例的組裝平行度檢測系統200的應用步驟。 The application steps of the assembled parallelism detection system 200 according to an embodiment of the invention are described below.

首先,在組裝平台(即第二組裝元件20)放置一塊玻璃(即第二反射元件40),準直儀50的觀測窗口56會顯示出一個白色十字,如圖4所示。圖4是在準直儀觀測到的第二反射光B2的示意圖。 First, place a piece of glass (ie, the second reflective element 40 ) on the assembly platform (ie, the second assembly element 20 ), and the observation window 56 of the collimator 50 will display a white cross, as shown in FIG. 4 . FIG. 4 is a schematic diagram of the second reflected light B2 observed by the collimator.

然後,將組裝吸嘴(即第一組裝元件10)也吸附一塊玻璃(即第一反射元件30),在準直儀50的觀測窗口56會顯示第二個白色十字,如圖5所示。圖5是在準直儀50的觀測窗口56觀測到的第一反射光A2及第二反射光B2的示意圖。第一反射光A2對應的十字形在圖5中的右方。第二反射光B2對應的十字形在圖5的中央位置。由圖5可看出,第一反射光A2與第二反射光B2對應的兩個十字形未對齊,因此代表第一反射元件30和第二反射元件40之間的平行度尚未調整完畢。相當於第一組裝元件10和第二組裝元件20兩者不平行。 Then, the assembly suction nozzle (ie, the first assembly element 10 ) also absorbs a piece of glass (ie, the first reflective element 30 ), and a second white cross will be displayed on the observation window 56 of the collimator 50 , as shown in FIG. 5 . FIG. 5 is a schematic diagram of the first reflected light A2 and the second reflected light B2 observed at the observation window 56 of the collimator 50 . The cross corresponding to the first reflected light A2 is on the right side in FIG. 5 . The cross corresponding to the second reflected light B2 is in the center of FIG. 5 . It can be seen from FIG. 5 that the two crosses corresponding to the first reflected light A2 and the second reflected light B2 are not aligned, which means that the parallelism between the first reflective element 30 and the second reflective element 40 has not been adjusted yet. It is equivalent to that the first assembly element 10 and the second assembly element 20 are not parallel.

準直儀50上觀測到的兩個十字形的相對位置關係相當於組 裝吸嘴與組裝平台之間的平行度。此時可以使用組裝吸嘴與組裝平台其中一者作為基準,調整另一者的調整裝置(如螺絲),使得第一反射光A2與第二反射光B2的兩個十字互相重合,代表組裝吸嘴與組裝平台之間達成平行。圖6是在準直儀50上觀測到的第一反射光及第二反射光彼此重合的示意圖。 The relative position relationship of two crosses observed on the collimator 50 is equivalent to the group Parallelism between the loading nozzle and the assembly platform. At this time, one of the assembly suction nozzle and the assembly platform can be used as a reference, and the adjustment device (such as a screw) of the other can be adjusted so that the two crosses of the first reflected light A2 and the second reflected light B2 coincide with each other, which means that the assembly suction A parallel is achieved between the mouth and the assembly platform. FIG. 6 is a schematic diagram of overlapping of the first reflected light and the second reflected light observed on the collimator 50 .

綜上所述,本創作提出的組裝平行度檢測裝置及其系統,透過具有兩個出光口的準直儀檢測組裝件之間的平行度,相較於傳統使用量錶確認平行度的檢測方式具有更高的精確度。 In summary, the assembly parallelism detection device and system proposed in this creation detects the parallelism between assemblies through a collimator with two light outlets, compared with the traditional detection method of using a scale to confirm parallelism with higher precision.

雖然本創作以前述之實施例揭露如上,然其並非用以限定本創作。在不脫離本創作之精神和範圍內,所為之更動與潤飾,均屬本創作之專利保護範圍。關於本創作所界定之保護範圍請參考所附之申請專利範圍。 Although the invention is disclosed as above with the aforementioned embodiments, it is not intended to limit the invention. Without departing from the spirit and scope of this creation, all changes and modifications are within the scope of patent protection of this creation. For the scope of protection defined by this creation, please refer to the attached scope of patent application.

100:組裝平行度檢測裝置 100: Assembling the parallelism detection device

10:第一組裝元件 10: The first assembly components

20:第二組裝元件 20: The second assembly component

30:第一反射元件 30: The first reflective element

301:第一反射面 301: the first reflective surface

40:第二組裝元件 40: The second assembly element

401:第二反射面 401: second reflective surface

50:準直儀 50: collimator

54:第一出光口 54: The first light outlet

55:第二出光口 55: Second light outlet

A1:第一入射光 A1: The first incident light

A2:第一反射光 A2: First reflected light

B1:第二入射光 B1: Second incident light

B2:第二反射光 B2: Second reflected light

Claims (10)

一種組裝平行度檢測裝置,適用於校正第一組裝元件及第二組裝元件之間的平行度,該組裝平行度檢測裝置包括:發光元件,產生指定光線,該指定光線之截面具有指定形狀;第一反射元件,設置在該第一組裝元件,且具有第一反射面反射第一入射光以產生第一反射光;第二反射元件,設置在該第二組裝元件,且具有第二反射面反射第二入射光以產生第二反射光,且該第一反射面朝向該第二反射面;以及準直儀,設置於該第一反射元件及該第二反射元件之間,該準直儀包括:入光口,接收該指定光線;分光鏡,將該指定光線分光為該第一入射光及該第二入射光;第一出光口,供該第一入射光發射至該第一反射元件,並接收該第一反射光;第二出光口,供該第二入射光發射至該第二反射元件,並接收該第二反射光,且該第一出光口之出光方向相反於該第二出光口之出光方向;及觀測窗口,用於呈現該第一反射光及該第二反射光。 An assembly parallelism detection device is suitable for correcting the parallelism between a first assembly component and a second assembly component. The assembly parallelism detection device includes: a light emitting element that generates a specified light, and the cross section of the specified light has a specified shape; A reflective element is arranged on the first assembly element and has a first reflective surface to reflect the first incident light to generate first reflected light; a second reflective element is arranged on the second assembly element and has a second reflective surface to reflect The second incident light is used to generate the second reflected light, and the first reflective surface faces the second reflective surface; and a collimator is arranged between the first reflective element and the second reflective element, and the collimator includes : a light entrance for receiving the specified light; a beam splitter for splitting the specified light into the first incident light and the second incident light; a first light exit for emitting the first incident light to the first reflective element, and receive the first reflected light; the second light outlet is used to transmit the second incident light to the second reflective element and receive the second reflected light, and the light output direction of the first light output port is opposite to the second light output a light emitting direction of the mouth; and an observation window for displaying the first reflected light and the second reflected light. 如請求項1的組裝平行度檢測裝置,其中該第一反射元件及該第二反射元件為玻璃。 The assembled parallelism detection device according to claim 1, wherein the first reflective element and the second reflective element are glass. 如請求項1的組裝平行度檢測裝置,其中該發光元件包括光源及遮罩,該遮罩具有一鏤空部分,該光源的光線透過該鏤空部分形成該指定光線。 The assembled parallelism detection device according to claim 1, wherein the light-emitting element includes a light source and a shield, and the shield has a hollow portion, and the light of the light source passes through the hollow portion to form the specified light. 如請求項1的組裝平行度檢測裝置,其中該指定形狀為十字形。 The assembly parallelism detection device according to claim 1, wherein the specified shape is a cross. 一種組裝平行度檢測系統,適用於檢測鏡片與設置面之間的平行度,該組裝平行度檢測系統包括:第一元件,用於吸附該鏡片;第二元件,具有該設置面供設置該鏡片;發光元件,產生指定光線,該指定光線之截面具有指定形狀;以及準直儀,設置於該第一元件及該第二元件之間,且設置於該指定光線之行進路徑上以接收該指定光線;其中該準直儀用於將該指定光線分光為第一入射光及第二入射光,該第一入射光以第一方向射至該第一元件,該第二入射光以第二方向射至該第二元件,且該第一方向相反於該第二方向;及該準直儀更用於接收並呈現第一反射光及第二反射光,該第一入射光與該第一反射光的行進方向相反,該第二入射光與該第二反射光的行進方向相反。 An assembly parallelism detection system is suitable for detecting the parallelism between a lens and a setting surface. The assembly parallelism detection system includes: a first component for absorbing the lens; a second component with the setting surface for setting the lens ; a light-emitting element that generates a specified light, the cross-section of the specified light has a specified shape; and a collimator disposed between the first element and the second element, and disposed on the travel path of the specified light to receive the specified Light; wherein the collimator is used to split the specified light into first incident light and second incident light, the first incident light hits the first element in a first direction, and the second incident light hits the first element in a second direction and the collimator is further used to receive and present the first reflected light and the second reflected light, the first incident light and the first reflected light The traveling direction of the light is opposite, and the traveling direction of the second incident light is opposite to that of the second reflected light. 如請求項5的組裝平行度檢測系統,其中該第一元件包括第一組裝元件及第一反射元件,該第一反射元件設置在第一組裝元件且位於該第一組裝元件及該準直儀之間,該第一反射元件具有第一反射面反射該第一入射光以產生該第一反射光;以及該第二元件包括第二組裝元件及第二反射元件,該第二反射元件設置在第二組裝元件且位於該第二組裝元件及該準直儀之間,該第二反射元件具有第二反射面反射該第二入射光以產生該第二反射光。 The assembly parallelism detection system according to claim 5, wherein the first element includes a first assembly element and a first reflection element, and the first reflection element is arranged on the first assembly element and is located between the first assembly element and the collimator Between, the first reflective element has a first reflective surface to reflect the first incident light to generate the first reflected light; and the second element includes a second assembly element and a second reflective element, the second reflective element is arranged on The second assembly element is located between the second assembly element and the collimator, and the second reflection element has a second reflection surface to reflect the second incident light to generate the second reflection light. 如請求項6的組裝平行度檢測系統,其中該第一元件包括調整裝置,該調整裝置用於調整該第一組裝元件的傾斜角度。 The assembly parallelism detection system according to claim 6, wherein the first component includes an adjustment device, and the adjustment device is used to adjust the inclination angle of the first assembly component. 如請求項6的組裝平行度檢測系統,其中該第二元件包括調整裝置,該調整裝置用於調整該第二組裝元件的傾斜角度。 The assembly parallelism detection system according to claim 6, wherein the second component includes an adjustment device, and the adjustment device is used to adjust the inclination angle of the second assembly component. 如請求項6的組裝平行度檢測系統,其中該第一反射元件及該第二反射元件為玻璃。 The assembled parallelism detection system according to claim 6, wherein the first reflective element and the second reflective element are glass. 如請求項5的組裝平行度檢測系統,其中該發光元件包括光源及遮罩,該遮罩具有一鏤空部分,該光源的光線透過該鏤空部分形成該指定光線。The assembled parallelism detection system according to claim 5, wherein the light-emitting element includes a light source and a shield, and the shield has a hollow portion, and the light of the light source passes through the hollow portion to form the specified light.
TW111208130U 2022-07-29 2022-07-29 Parallelism of assembling detection device and system thereof TWM637086U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116592795A (en) * 2023-07-14 2023-08-15 浙江至格科技有限公司 AR lens parallelism measuring method and system

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116592795A (en) * 2023-07-14 2023-08-15 浙江至格科技有限公司 AR lens parallelism measuring method and system
CN116592795B (en) * 2023-07-14 2023-09-26 浙江至格科技有限公司 AR lens parallelism measuring method and system

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