TWM637086U - Parallelism of assembling detection device and system thereof - Google Patents
Parallelism of assembling detection device and system thereof Download PDFInfo
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Abstract
組裝平行度檢測裝置包括發光元件、第一及第二反射元件、以及準直儀。發光元件產生截面具有指定形狀的指定光線。第一反射元件具有第一反射面反射第一入射光以產生第一反射光。第二反射元件具有第二反射面反射第二入射光以產生第二反射光,且第一反射面朝向第二反射面。準直儀設置於第一及第二反射元件之間,且具有分光鏡將指定光線分為第一及第二入射光,具有第一出光口供第一入射光發射至第一反射元件,具有第二出光口供第二入射光發射至第二反射元件,第一及第二出光口之出光方向相反。觀測窗口用於呈現第一及第二反射光。The assembled parallelism detection device includes a light-emitting element, a first and a second reflective element, and a collimator. A light emitting element produces a specified light with a specified shape in cross-section. The first reflective element has a first reflective surface to reflect the first incident light to generate first reflected light. The second reflective element has a second reflective surface to reflect the second incident light to generate second reflected light, and the first reflective surface faces the second reflective surface. The collimator is arranged between the first and second reflective elements, and has a beam splitter to divide the specified light into first and second incident light, has a first light outlet for emitting the first incident light to the first reflective element, and has a second The two light outlets are used for the second incident light to be emitted to the second reflective element, and the directions of light output from the first and second light outlets are opposite. The observation window is used to present the first and second reflected light.
Description
本創作關於鏡頭組裝,特別是一種組裝平行度檢測裝置及其系統。 This creation is about lens assembly, especially an assembly parallelism detection device and its system.
隨著科技的發展,手機已經廣泛應用於人們的日常生活當中,而絕大部分的手機都安裝有用於照相或指紋辨識的相機鏡頭。 With the development of technology, mobile phones have been widely used in people's daily life, and most of the mobile phones are equipped with camera lenses for taking pictures or fingerprint recognition.
在組裝鏡頭時,鏡片組裝吸嘴與鏡筒放置平台二者之間的平行度決定了鏡片組裝的平行度,高畫素的鏡頭對於鏡片堆疊平行度的要求也是越小越好。所以調整吸嘴與平台兩者之間的平行度極為重要。目前的調整方法通常是用量錶測頭先接觸吸嘴並移動量錶,將移動量調整至最小表示水平調整完成,再將量錶測頭移至平台上並移動也是將移動量調整至最小,調整完成後代表兩者平行度為最佳狀態。然而,目前使用的接觸式量錶為單點接觸,量測時為一條線,如果面積較大需要量測多次。 When assembling the lens, the parallelism between the lens assembly suction nozzle and the lens barrel placement platform determines the parallelism of the lens assembly, and the higher the resolution of the lens, the smaller the parallelism requirement for lens stacking, the better. Therefore, it is extremely important to adjust the parallelism between the nozzle and the platform. The current adjustment method is usually to use the gauge head to touch the suction nozzle first and move the gauge. Adjusting the movement amount to the minimum indicates that the level adjustment is completed, and then moving the gauge probe to the platform and moving it also adjusts the movement amount to the minimum. After the adjustment is completed, it means that the parallelism between the two is in the best state. However, the currently used contact gauge is a single-point contact, and the measurement is a line. If the area is large, it needs to be measured multiple times.
有鑑於此,本創作提出一種鏡片組裝平行度調整系統,透過光學準直儀產生一個平行光來校正組裝吸嘴與平台的平行度。本創作是一種光學非接觸式的調整系統。本創作提出的鏡片組裝平行度調整系統相較於使用接觸式量錶的方式具有更高的精準度。 In view of this, this creation proposes a lens assembly parallelism adjustment system, which generates a parallel light through an optical collimator to correct the parallelism between the assembly nozzle and the platform. This creation is an optical non-contact adjustment system. The lens assembly parallelism adjustment system proposed by this creation has higher accuracy than the method of using a contact scale.
依據本創作一實施例的一種組裝平行度檢測裝置,適用於校正第一組裝元件及第二組裝元件之間的平行度。所述組裝平行度檢測裝置 包括發光元件、第一反射元件、第二反射元件以及準直儀。發光元件產生指定光線,指定光線之截面具有指定形狀。第一反射元件設置在第一組裝元件,且具有第一反射面反射第一入射光以產生第一反射光。第二反射元件設置在第二組裝元件,且具有第二反射面反射第二入射光以產生第二反射光,且第一反射面朝向第二反射面。準直儀設置於第一反射元件及第二反射元件之間。準直儀包括入光口、分光鏡、第一出光口、第二出光口及觀測窗口。入光口接收指定光線。分光鏡將指定光線分為第一入射光及第二入射光。第一出光口,供第一入射光發射至第一反射元件,並接收第一反射光。第二出光口供第二入射光發射至第二反射元件,並接收第二反射光,且第一出光口之出光方向相反於第二出光口之出光方向。觀測窗口用於呈現第一反射光及第二反射光。 An assembly parallelism detection device according to an embodiment of the present invention is suitable for correcting the parallelism between the first assembly component and the second assembly component. The assembly parallelism detection device It includes a light emitting element, a first reflective element, a second reflective element and a collimator. The light-emitting element generates specified light, and the cross-section of the specified light has a specified shape. The first reflective element is arranged on the first assembly element, and has a first reflective surface to reflect the first incident light to generate first reflected light. The second reflective element is arranged on the second assembly element, and has a second reflective surface to reflect the second incident light to generate second reflected light, and the first reflective surface faces the second reflective surface. The collimator is disposed between the first reflective element and the second reflective element. The collimator includes a light entrance, a beam splitter, a first light exit, a second light exit and an observation window. The light entrance receives the specified light. The beam splitter divides the specified light into the first incident light and the second incident light. The first light outlet is used for emitting the first incident light to the first reflection element and receiving the first reflected light. The second light outlet is used for emitting the second incident light to the second reflection element and receiving the second reflected light, and the light output direction of the first light output port is opposite to the light output direction of the second light output port. The observation window is used to display the first reflected light and the second reflected light.
依據本創作一實施例的一種組裝平行度檢測系統,適用於檢測鏡片與設置面之間的平行度。所述組裝平行度檢測系統包括第一元件、第二元件、發光元件以及準直儀。第一元件用於吸附鏡片。第二元件具有設置面供設置鏡片。發光元件產生指定光線,指定光線之截面具有指定形狀。準直儀設置於第一元件及第二元件之間,且設置於指定光線之行進路徑上以接收指定光線。準直儀用於將指定光線分光為第一入射光及第二入射光,第一入射光以第一方向射至第一元件,第二光線以第二方向射至第二元件,且第一方向相反於第二方向。準直儀更用於接收並呈現第一反射光及第二反射光,第一入射光與該第一反射光的行進方向相反,第二入射光與該第二反射光的行進方向相反。 An assembly parallelism inspection system according to an embodiment of the present invention is suitable for inspecting the parallelism between the lens and the installation surface. The assembly parallelism detection system includes a first component, a second component, a light emitting component and a collimator. The first element is used for absorbing the lens. The second element has a setting surface for setting the lens. The light-emitting element generates specified light, and the cross-section of the specified light has a specified shape. The collimator is arranged between the first element and the second element, and is arranged on the traveling path of the specified light to receive the specified light. The collimator is used to split the specified light into first incident light and second incident light, the first incident light hits the first element in the first direction, the second light hits the second element in the second direction, and the first The direction is opposite to the second direction. The collimator is further used for receiving and presenting the first reflected light and the second reflected light, the traveling direction of the first incident light is opposite to that of the first reflected light, and the traveling direction of the second incident light is opposite to that of the second reflected light.
綜上所述,本創作提出的組裝平行度檢測裝置及其系統,透 過具有兩個出光口的準直儀檢測組裝件之間的平行度,相較於傳統使用量錶確認平行度的檢測方式具有更高的精確度。 In summary, the assembly parallelism detection device and system proposed in this creation, through The parallelism between assemblies is detected by a collimator with two light outlets, which has higher accuracy than the traditional detection method of using a gauge to confirm the parallelism.
以上之關於本揭露內容之說明及以下之實施方式之說明係用以示範與解釋本創作之精神與原理,並且提供本創作之專利申請範圍更進一步之解釋。 The above description about the content of this disclosure and the following description of the implementation are used to demonstrate and explain the spirit and principle of this creation, and to provide a further explanation of the patent application scope of this creation.
100:組裝平行度檢測裝置 100: Assembling the parallelism detection device
200:組裝平行度檢測系統 200: Assembling the parallelism detection system
10:第一組裝元件 10: The first assembly components
20:第二組裝元件 20: The second assembly component
30:第一反射元件 30: The first reflective element
301:第一反射面 301: the first reflective surface
40:第二組裝元件 40: The second assembly element
401:第二反射面 401: second reflective surface
50:準直儀 50: collimator
51:入光口 51: light entrance
52:分光鏡 52: beam splitter
53:分光鏡 53: beam splitter
54:第一出光口 54: The first light outlet
55:第二出光口 55: Second light outlet
56:觀測窗口 56: Observation window
60:光源 60: light source
A1:第一入射光 A1: The first incident light
A2:第一反射光 A2: First reflected light
B1:第二入射光 B1: Second incident light
B2:第二反射光 B2: Second reflected light
圖1是本創作一實施例的組裝平行度檢測裝置的側視圖;圖2是本創作一實施例的準直儀的架構示意圖;圖3是本創作一實施例的組裝平行度檢測系統的架構示意圖;圖4是在準直儀觀測到的第二反射光的示意圖;圖5是在準直儀觀測到的第一反射光及第二反射光的示意圖;以及圖6是在準直儀觀測到的第一反射光及第二反射光彼此重合的示意圖。 Fig. 1 is a side view of an assembly parallelism detection device of an embodiment of the invention; Fig. 2 is a schematic diagram of the structure of a collimator of an embodiment of the invention; Fig. 3 is a structure of an assembly parallelism detection system of an embodiment of the invention Schematic diagram; Figure 4 is a schematic diagram of the second reflected light observed at the collimator; Figure 5 is a schematic diagram of the first reflected light and the second reflected light observed at the collimator; and Figure 6 is observed at the collimator A schematic diagram of overlapping of the first reflected light and the second reflected light.
以下在實施方式中詳細敘述本創作之詳細特徵以及特點,其內容足以使任何熟習相關技藝者了解本創作之技術內容並據以實施,且根據本說明書所揭露之內容、申請專利範圍及圖式,任何熟習相關技藝者可輕易地理解本創作相關之構想及特點。以下之實施例係進一步詳細說明本創作之觀點,但非以任何觀點限制本創作之範疇。 The detailed features and characteristics of this creation are described in detail below in the implementation mode. The content is enough to enable anyone familiar with the relevant arts to understand the technical content of this creation and implement it accordingly. According to the content disclosed in this specification, the patent scope and drawings , anyone who is familiar with the related art can easily understand the ideas and features related to this creation. The following examples are to further describe the viewpoints of this creation in detail, but not to limit the scope of this creation in any way.
圖1是本創作一實施例的組裝平行度檢測裝置的架構示意圖。組裝平行度檢測裝置100適用於校正第一組裝元件10及第二組裝元件20之間的平行度。第一組裝元件10例如是鏡頭吸嘴,第二組裝元件20
例如是鏡筒放置平台。組裝平行度檢測裝置100包括發光元件(未繪示於圖1)、第一反射元件30、第二反射元件40以及準直儀50)。
FIG. 1 is a schematic structural diagram of an assembly parallelism detection device according to an embodiment of the present invention. The assembly
發光元件產生指定光線。指定光線之截面具有指定形狀。在一實施例中,發光元件包括光源及遮罩。遮罩具有鏤空部分,光源的光線透過鏤空部分形成截面具有指定形狀的指定光線。在一實施例中,所述指定形狀為十字形,但本創作不限制指定形狀。 A light emitting element produces a specified light. Specifies that the cross-section of the ray has the specified shape. In one embodiment, the light emitting element includes a light source and a shade. The mask has a hollow part, and the light from the light source passes through the hollow part to form a specified light with a specified cross-section. In one embodiment, the specified shape is a cross, but the invention does not limit the specified shape.
第一反射元件30設置在第一組裝元件10,且具有第一反射面301反射第一入射光A1以產生第一反射光A2。第二反射元件40設置在第二組裝元件20,且具有第二反射面401反射第二入射光B1以產生第二反射光B2。如圖1所示,第一反射面301朝向第二反射面401。在一實施例中,第一反射元件30及第二反射元件40為玻璃,但本創作不限制反射元件30,40的組成材料。需注意的是,為了清楚且同時呈現入射光及反射光,因此圖1分開繪製二者。實務上,第一入射光A1和第一反射光A2的路徑相同,第二入射光B1和第二反射光B2的路徑相同。
The first
準直儀50設置於第一反射元件30及第二反射元件40之間。由於圖1為側視圖,因此僅繪視準直儀50的一部份。請參考圖2,圖2是本創作一實施例的準直儀的架構示意圖,並且包含圖1側視圖未繪示的發光元件60。
The
如圖2所示,準直儀50包括入光口51、分光鏡52、分光鏡53、第一出光口54、第二出光口55以及觀測窗口56。
As shown in FIG. 2 , the
入光口51接收發光元件60產生的指定光線。
The
分光鏡52用於將指定光線轉換為平行光,分光鏡53用於將
平行光分為第一入射光A1及第二入射光B1。
The
請一併參考圖1及圖2。第一出光口54供第一入射光A1發射至第一反射元件30,並接收第一反射元件30產生的第一反射光A2。第二出光口55供第二入射光B1發射至第二反射元件40,並接收第二反射光B2。第一出光口54之出光方向相反於第二出光口55之出光方向。
Please refer to Figure 1 and Figure 2 together. The
第一反射光A2循第一入射光A1的路徑通過第一出光口54返回到反光鏡53,再被折射到觀測窗口56。第二反射光B2循第二入射光B1的路徑通過第二出光口55返回到反光鏡53,再被折射到觀測窗口56。因此觀測窗口56呈現第一反射光A2及第二反射光B2。綜合圖1及圖2可知,第一入射光A1與第二入射光B1二者的行進方向相反。此外,第一入射光A1及第二入射光B1的每一者的截面皆會符合指定光線的指定形狀(如十字形)。第一反射光A2及第二反射光B2的每一者的截面也會符合指定形狀。因此,透過在觀測窗口56檢視第一反射光A2形成的指定形狀和第二反射光B2形成的指定形狀,並判斷二者是否重合,可用於判斷第一反射元件30和第二反射元件40的平行度。因為第一反射元件30設置在第一組裝元件10上,第二反射元件40設置在第二組裝元件20上,因此第一反射元件30和第二反射元件40的平行度相當於第一組裝元件10和第二組裝元件20的平行度,從而確保使用第一組裝元件10和第二組裝元件20組裝鏡頭時具有足夠的平行度。
The first reflected light A2 returns to the
為清楚理解本實施例的組裝平行度檢測裝置100如何用於組裝系統,請參考圖3,圖3是本創作一實施例的組裝平行度檢測系統200的架構示意圖。
In order to clearly understand how the assembly
組裝平行度檢測系統200適用於檢測鏡片與設置面之間的平行度。所述組裝平行度檢測系統200包括第一元件、第二元件、發光元件(未繪示)以及準直儀。換言之,組裝平行度檢測系統200相當於將第一組裝元件10及第二組裝元件20整合至前述的組裝平行度檢測裝置100。
The assembled
第一元件用於在平行度檢測完成之後吸附鏡片。第二元件具有設置面,用於在平行度檢測完成之後供設置鏡片。所述平行度檢測係確認第一元件在空間中佔據的平面與第二元件在空間中佔據的平面,二者處於平行狀態。 The first element is used to absorb the lens after the parallelism detection is completed. The second element has a setting surface for setting the lens after the parallelism detection is completed. The parallelism detection is to confirm that the plane occupied by the first element and the plane occupied by the second element are parallel.
請參考圖3。在一實施例中,第一元件包括第一組裝元件10及第一反射元件30。第一組裝元件10例如是吸嘴,可在平行度檢測完成之後,吸附鏡片進行組裝。第一反射元件30例如是玻璃。第一反射元件30設置在第一組裝元件10且位於第一組裝元件10及準直儀50的第一出光口54之間。第一反射元件30具有第一反射面301反射第一入射光A1以產生第一反射光A2。在一實施例中,第一元件更包括調整裝置,調整裝置用於調整第一組裝元件10的傾斜角度。所述調整裝置例如是調整螺絲。
Please refer to Figure 3. In one embodiment, the first component includes a
在一實施例中,第二元件包括第二組裝元件20及第二反射元件40。第二組裝元件20例如是組裝平台或基板,其具有設置面以供鏡片組裝時設置。第二反射元件40例如是玻璃。第二反射元件40設置在第二組裝元件20且位於第二組裝元件20及準直儀50的第二出光口55之間。第二反射元件40具有第二反射面401反射第二入射光B1以產生第二反射光B2。在一實施例中,第二元件更包括調整裝置,調整裝置用於調整第二組裝元件20的傾斜角度。所述調整裝置例如是調整螺絲。
In one embodiment, the second element includes a
發光元件的實施方式如前文所述,在此不重複。 The implementation of the light emitting element is as described above and will not be repeated here.
準直儀50設置於第一元件及第二元件之間,且設置於指定光線之行進路徑上以接收指定光線。準直儀50用於將指定光線分光為第一入射光A1及第二入射光B1,第一入射光A1以第一方向射至第一元件,第二入射光B1以第二方向射至第二元件,且第一方向相反於第二方向。第一方向是從第一出光口54到第一反射元件30。第二方向是從第二出光口55到第二反射元件40。準直儀50更用於接收並呈現第一反射光A2及第二反射光B2,第一入射光A1與第一反射光A2的行進方向相反,第二入射光B1與第二反射光B2的行進方向相反。
The
以下說明本創作一實施例的組裝平行度檢測系統200的應用步驟。
The application steps of the assembled
首先,在組裝平台(即第二組裝元件20)放置一塊玻璃(即第二反射元件40),準直儀50的觀測窗口56會顯示出一個白色十字,如圖4所示。圖4是在準直儀觀測到的第二反射光B2的示意圖。
First, place a piece of glass (ie, the second reflective element 40 ) on the assembly platform (ie, the second assembly element 20 ), and the
然後,將組裝吸嘴(即第一組裝元件10)也吸附一塊玻璃(即第一反射元件30),在準直儀50的觀測窗口56會顯示第二個白色十字,如圖5所示。圖5是在準直儀50的觀測窗口56觀測到的第一反射光A2及第二反射光B2的示意圖。第一反射光A2對應的十字形在圖5中的右方。第二反射光B2對應的十字形在圖5的中央位置。由圖5可看出,第一反射光A2與第二反射光B2對應的兩個十字形未對齊,因此代表第一反射元件30和第二反射元件40之間的平行度尚未調整完畢。相當於第一組裝元件10和第二組裝元件20兩者不平行。
Then, the assembly suction nozzle (ie, the first assembly element 10 ) also absorbs a piece of glass (ie, the first reflective element 30 ), and a second white cross will be displayed on the
準直儀50上觀測到的兩個十字形的相對位置關係相當於組
裝吸嘴與組裝平台之間的平行度。此時可以使用組裝吸嘴與組裝平台其中一者作為基準,調整另一者的調整裝置(如螺絲),使得第一反射光A2與第二反射光B2的兩個十字互相重合,代表組裝吸嘴與組裝平台之間達成平行。圖6是在準直儀50上觀測到的第一反射光及第二反射光彼此重合的示意圖。
The relative position relationship of two crosses observed on the
綜上所述,本創作提出的組裝平行度檢測裝置及其系統,透過具有兩個出光口的準直儀檢測組裝件之間的平行度,相較於傳統使用量錶確認平行度的檢測方式具有更高的精確度。 In summary, the assembly parallelism detection device and system proposed in this creation detects the parallelism between assemblies through a collimator with two light outlets, compared with the traditional detection method of using a scale to confirm parallelism with higher precision.
雖然本創作以前述之實施例揭露如上,然其並非用以限定本創作。在不脫離本創作之精神和範圍內,所為之更動與潤飾,均屬本創作之專利保護範圍。關於本創作所界定之保護範圍請參考所附之申請專利範圍。 Although the invention is disclosed as above with the aforementioned embodiments, it is not intended to limit the invention. Without departing from the spirit and scope of this creation, all changes and modifications are within the scope of patent protection of this creation. For the scope of protection defined by this creation, please refer to the attached scope of patent application.
100:組裝平行度檢測裝置 100: Assembling the parallelism detection device
10:第一組裝元件 10: The first assembly components
20:第二組裝元件 20: The second assembly component
30:第一反射元件 30: The first reflective element
301:第一反射面 301: the first reflective surface
40:第二組裝元件 40: The second assembly element
401:第二反射面 401: second reflective surface
50:準直儀 50: collimator
54:第一出光口 54: The first light outlet
55:第二出光口 55: Second light outlet
A1:第一入射光 A1: The first incident light
A2:第一反射光 A2: First reflected light
B1:第二入射光 B1: Second incident light
B2:第二反射光 B2: Second reflected light
Claims (10)
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CN116592795A (en) * | 2023-07-14 | 2023-08-15 | 浙江至格科技有限公司 | AR lens parallelism measuring method and system |
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CN116592795A (en) * | 2023-07-14 | 2023-08-15 | 浙江至格科技有限公司 | AR lens parallelism measuring method and system |
CN116592795B (en) * | 2023-07-14 | 2023-09-26 | 浙江至格科技有限公司 | AR lens parallelism measuring method and system |
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