TWM631619U - Test plate and electronic component testing equipment using the same - Google Patents
Test plate and electronic component testing equipment using the same Download PDFInfo
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- TWM631619U TWM631619U TW111205728U TW111205728U TWM631619U TW M631619 U TWM631619 U TW M631619U TW 111205728 U TW111205728 U TW 111205728U TW 111205728 U TW111205728 U TW 111205728U TW M631619 U TWM631619 U TW M631619U
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- plate
- electronic parts
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- disk
- disk body
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- 238000012360 testing method Methods 0.000 title claims abstract description 50
- 239000012528 membrane Substances 0.000 claims abstract description 11
- 239000011796 hollow space material Substances 0.000 claims abstract description 7
- 239000000463 material Substances 0.000 claims abstract description 5
- 230000007246 mechanism Effects 0.000 claims description 29
- 238000001514 detection method Methods 0.000 claims description 12
- 238000000034 method Methods 0.000 claims description 8
- 238000007789 sealing Methods 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 3
- 229920002457 flexible plastic Polymers 0.000 claims description 2
- 238000004804 winding Methods 0.000 claims 2
- 229920003023 plastic Polymers 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 3
- 230000000704 physical effect Effects 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
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Abstract
本創作提供一種測盤及使用該測盤的電子零件測試設備,該測盤包括:一盤體外周緣設有環列等間隔佈設的多數個凹設的容槽,每一容槽朝盤體中心各導通設於盤體安裝時為下表面的凹設的氣道之一端,在該盤體上設有以肋體隔設的多數個鏤空區間,各肋體一端連接該盤體的外緣部,另一端連接位於盤體中央的一固定部,該固定部設有用來將該盤體固定的定位孔;在該盤體安裝時為上表面的一側,設有一膜件,其為可撓性的膠材所構成,其覆蓋各肋體間的該鏤空區間;藉此使避免造成電子零件卡塞。The present invention provides a measuring plate and electronic parts testing equipment using the measuring plate. The measuring plate includes: a plurality of concave grooves arranged in a ring and at equal intervals on the periphery of the plate body, each groove facing the center of the plate body Each conduction is provided at one end of the concave air channel on the lower surface of the disc body when it is installed, and a plurality of hollowed-out sections separated by ribs are arranged on the disc body, and one end of each rib body is connected to the outer edge of the disc body. The other end is connected to a fixing part located in the center of the disc body, and the fixing part is provided with a positioning hole for fixing the disc body; when the disc body is installed, one side of the upper surface is provided with a membrane part, which is flexible It is composed of plastic material, which covers the hollow space between each rib, thereby avoiding jamming of electronic parts.
Description
本創作係有關於一種測盤及使用該測盤的電子零件測試設備, 尤指一種使用在電子零件檢測中用以搬送待測零件進行測試檢查的測盤及使用該測盤的電子零件測試設備。 This creation is about a test plate and electronic parts testing equipment using the test plate, In particular, it refers to a test disc used in the inspection of electronic parts to transport the parts to be tested for testing and inspection, and electronic parts testing equipment using the test disc.
一般電子零件在製造完成後通常需經過測試以確定其物理特性,完成物理特性檢測的電子零件則予以進行包裝或分類收集,此類電子零件例如電容、LED等類電子零件;執行此類檢測工作的設備,例如公告號碼第I619658號的「電子元件分選方法及裝置」專利申請案即是一種經過檢測再分類收集的先前技術;此類設備通常採用圓盤狀的測盤,在其外周緣設有環列等間隔佈設的凹設容槽,藉由在間歇旋轉的運轉下,搬送位於該容槽中的電子元件經過檢測儀器,使電子元件經過檢測後再予以載入包裝帶或依不同的物理特性作分類收集。General electronic parts usually need to be tested to determine their physical characteristics after manufacturing, and electronic parts that have completed physical characteristics testing are packaged or collected by classification. Such electronic parts such as capacitors, LEDs and other electronic parts; perform such testing work For example, the patent application "Method and Apparatus for Sorting Electronic Components" of Public Notice No. I619658 is a prior art that has undergone testing and re-sorting collection; There are concave cavities arranged in a ring row at equal intervals. Through the operation of intermittent rotation, the electronic components located in the cavities are transported through the testing instrument, so that the electronic components are tested and then loaded into the packaging tape or according to different requirements. The physical properties are collected by classification.
先前技術所採用的測盤為了作間歇旋轉搬送,一個高速的旋轉搬送可以使單位時間的檢測效率提高,因此業者常將該圓形的測盤設成具有肋部的鏤空狀,藉減少材料而減輕重量,使在進行高速間歇旋轉時可以更輕省,但因測盤高速間歇旋轉會產生震動,加上此類檢測的電子零件通常屬於細小的部件,容易在搬送過程中跳脫出容槽,並落入該肋部所形成的鏤空區間中,並造成卡塞在測盤與機座間,仍有待改善之處!The measuring plate used in the prior art is used for intermittent rotating transportation, and a high-speed rotating transportation can improve the detection efficiency per unit time. Therefore, manufacturers often set the circular measuring plate into a hollow shape with ribs to reduce the material. Reduce weight, so that it can be lighter when performing high-speed intermittent rotation. However, due to the high-speed intermittent rotation of the measuring disc, vibration will occur. In addition, the electronic parts for such detection are usually small parts, which are easy to jump out of the container during the transportation process. , and fell into the hollow area formed by the rib, and caused a jam between the measuring plate and the base, there is still room for improvement!
爰此,本創作之目的,在於提供一種改善先前技術至少一項缺失的測盤。Therefore, the purpose of this creation is to provide a test plate that improves at least one missing item in the prior art.
本創作之另一目的,在於提供一種使用如所述測盤的電子零件測試設備。Another object of the present invention is to provide an electronic component testing device using the test disk.
依據本創作目的之測盤,包括:一盤體外周緣設有環列等間隔佈設的多數個凹設的容槽,每一容槽朝盤體中心各導通設於盤體安裝時為下表面的凹設的氣道之一端,在該盤體上設有以肋體隔設的多數個鏤空區間,各肋體一端連接該盤體的外緣部,另一端連接位於盤體中央的一固定部,該固定部設有用來將該盤體固定的定位孔;在該盤體安裝時為上表面的一側,設有一膜件,其為可撓性的膠材所構成,其覆蓋各肋體間的該鏤空區間。The measuring plate according to the purpose of this creation includes: a plurality of concave accommodating grooves arranged in a ring and at equal intervals are arranged on the periphery of the outer body of the disk body, and each accommodating groove is connected to the center of the disk body and is provided on the lower surface when the disk body is installed. One end of the concave air channel is provided with a plurality of hollow sections separated by ribs on the plate body, one end of each rib body is connected to the outer edge of the plate body, and the other end is connected to a fixed part located in the center of the plate body, The fixing part is provided with a positioning hole for fixing the plate body; when the plate body is installed, one side of the upper surface is provided with a membrane member, which is formed of a flexible plastic material and covers the space between the ribs. of the hollowed-out interval.
依據本創作另一目的之電子零件測試設備,包括:使用如所述測盤。Another object of the present invention is to test equipment for electronic parts, including: using the test disk.
本創作實施例之測盤及使用該測盤的電子零件測試設備,由於在該盤體安裝時為上表面的一側,設有一膜件,其覆蓋各肋體間的該鏤空區間,故當電子零件在搬送過程中跳脫時,可避免落入該鏤空區間中防止造成卡塞In the test disk and the electronic parts testing equipment using the test disk in the present invention, since the disk body is installed on the side of the upper surface, a membrane is provided, which covers the hollow space between the ribs. When the electronic parts jump out during the conveying process, it can avoid falling into the hollow area to prevent jamming
請參閱圖1〜4,本創作實施例之測盤1為一圓盤狀,其盤體11外周緣設有環列等間隔佈設的多數個凹設的容槽12,每一容槽12朝盤體11中心各導通設於盤體11安裝時為下表面的凹設的氣道13之一端,在該盤體11上設有以肋體14隔設的多數個鏤空區間15,各肋體14一端連接該盤體11的外緣部16,另一端連接位於盤體11中央的一固定部17,該固定部17設有用來將該盤體11固定的定位孔18;
在該盤體11安裝時為上表面的一側,設有一膜件2,其為可撓性的透明膠材所構成,其呈一環形面積21並在中央形成鏤空的空設區間22,該環形面積21覆蓋各肋體14及各肋體14間的該鏤空區間15,該環形面積21外周緣23並覆蓋一部份該盤體11的該外緣部16,該環形面積21內周緣24並覆蓋一部份該盤體11的該固定部17,而使該盤體11的該定位孔18於該膜件2鏤空的該空設區間22中被顯露。
Please refer to FIGS. 1 to 4 , the
請參閱圖5,本創作實施例之測盤1可以使用在例如圖中的電子零件測試設備A中,該電子零件測試設備A設有一供料裝置A1、一檢測機構A2、及包括兩個分選機構A31、A32的一分選裝置A3,該檢測機構A2供設置本創作實施例之該測盤1,電子零件由該供料裝置A1被輸送至該檢測機構A2的該測盤1被作間歇旋轉搬送,並在搬送過程中被檢測其物理特性,再依據不同的物理特性排送至該分選裝置A3的兩個分選機構A31、A32其中之一,再經該分選機構31或該分選機構32分別以特定的管路送至特定的收集容器收集。Please refer to FIG. 5 , the
請參閱圖6,本創作實施例之測盤1亦可以使用在例如圖中的電子零件測試設備B中,該電子零件測試設備B設有一供料裝置B1、一檢測機構B2、及設有載帶B31、封膜機構B32和捲收機構B33的一載帶裝置B3,該檢測機構B2供設置本創作實施例之該測盤1,電子零件由該供料裝置B1被輸送至該檢測機構B2的該測盤1被作間歇旋轉搬送,並在搬送過程中被檢測其物理特性,再載入至該載帶裝置B3的該載帶B31被容置,再經該封膜機構B32封裝後由該捲收機構B33予以收集。Please refer to FIG. 6 , the
本創作實施例測盤及使用該測盤的電子零件測試設備,由於在該盤體11安裝時為上表面的一側,設有一膜件2,其覆蓋各肋體14間的該鏤空區間15,故當電子零件在搬送過程中跳脫時,可避免落入該鏤空區間15中防止造成卡塞。The measuring plate and the electronic parts testing equipment using the measuring plate in the present creative embodiment, since the
惟以上所述者,僅為本創作之實施例而已,當不能以此限定本創作實施之範圍,凡是依本創作申請專利範圍及專利說明書內容所作之簡單的等效變化與修飾,皆仍屬本創作專利涵蓋之範圍內。However, the above are only examples of this creation, and should not limit the scope of implementation of this creation. All simple equivalent changes and modifications made according to the patent scope of this creation and the content of the patent specification are still included. covered by this creative patent.
1:測盤 11:盤體 12:容槽 13:氣道 14:肋道 15:鏤空區間 16:外緣部 17:固定部 18:定位孔 2:膜件 21:環形面積 22:空設區間 23:外周緣 24:內周緣 A:電子零件測試設備 A1:供料裝置 A2:檢測機構 A3:分選裝置 A31:分選機構 A32:分選機構 B:電子零件測試設備 B1:供料裝置 B2:檢測機構 B3:載帶裝置 B31:載帶 B32:封膜機構 B33:捲收機構 1: Test plate 11: Disc body 12: Container 13: Airway 14: Ribs 15: Hollow interval 16: Outer edge 17: Fixed part 18: Positioning hole 2: Membrane parts 21: annular area 22: Empty set interval 23: Outer perimeter 24: Inner perimeter A: Electronic parts testing equipment A1: Feeding device A2: Testing agency A3: Sorting device A31: Sorting agency A32: Sorting agency B: Electronic parts testing equipment B1: Feeding device B2: Testing agency B3: Carrier tape device B31: Carrier tape B32: Membrane sealing mechanism B33: Rewinding mechanism
圖1係一種測盤的立體示意圖,用以說明本創作實施例。 圖2係該測盤另一側面的示意圖。 圖3係該測盤的立體分解示意圖。 圖4係該測盤外周緣部份的容槽立體示意圖。 圖5係使用該測盤的電子零件測試設備的實施例示意圖。 圖6係使用該測盤的另一電子零件測試設備的實施例示意圖。 FIG. 1 is a three-dimensional schematic diagram of a measuring plate, which is used to illustrate an embodiment of the present invention. Figure 2 is a schematic view of the other side of the measuring plate. FIG. 3 is a schematic exploded perspective view of the measuring plate. FIG. 4 is a three-dimensional schematic view of the accommodating groove of the outer peripheral portion of the measuring disc. FIG. 5 is a schematic diagram of an embodiment of an electronic component testing apparatus using the test disc. FIG. 6 is a schematic diagram of an embodiment of another electronic part testing apparatus using the test disc.
1:測盤 1: Test plate
11:盤體 11: Disc body
12:容槽 12: Container
14:肋道 14: Ribs
15:鏤空區間 15: Hollow interval
16:外緣部 16: Outer edge
17:固定部 17: Fixed part
18:定位孔 18: Positioning hole
2:膜件 2: Membrane parts
21:環形面積 21: annular area
22:空設區間 22: Empty set interval
23:外周緣 23: Outer perimeter
24:內周緣 24: Inner perimeter
Claims (6)
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TW111205728U TWM631619U (en) | 2022-05-31 | 2022-05-31 | Test plate and electronic component testing equipment using the same |
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TW111205728U TWM631619U (en) | 2022-05-31 | 2022-05-31 | Test plate and electronic component testing equipment using the same |
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