TWM628897U - Optical detection apparatus - Google Patents

Optical detection apparatus Download PDF

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Publication number
TWM628897U
TWM628897U TW111203472U TW111203472U TWM628897U TW M628897 U TWM628897 U TW M628897U TW 111203472 U TW111203472 U TW 111203472U TW 111203472 U TW111203472 U TW 111203472U TW M628897 U TWM628897 U TW M628897U
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tested
light
indicator light
sample
detection device
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TW111203472U
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Chinese (zh)
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林于凱
康振方
江俊德
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大陸商蘇州嘉皇電子有限公司
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Publication of TWM628897U publication Critical patent/TWM628897U/en

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Abstract

An optical detection apparatus used for detecting a sample to be tested includes an optical module, a control module, and an arithmetic module. The optical module includes a camera, an indicator light fixture, and a sample fixture. The camera receives an indicator light from the indicator light fixture, and the camera detects a light from the sample to be tested and then generates an image signal. The control module is used to control the camera and the indicator light fixture. The arithmetic module receives the image signal and generates a brightness distribution result.

Description

光學檢測裝置Optical detection device

本創作係有關一種光學檢測裝置,尤指可依據對應待測樣品之分色的亮度分布結果,判斷待測樣品是否存在異常。The present invention relates to an optical detection device, in particular, it can judge whether there is any abnormality in the sample to be tested according to the result of the brightness distribution corresponding to the color separation of the sample to be tested.

近年來,隨著自動化生產的蓬勃發展之下,生產業界創造出所謂的自動光學檢測(automated optical inspection, AOI)為一種高速高精度光學影像檢測系統,其運用機器視覺作為檢測標準技術,作為改良傳統上以人力使用光學儀器進行檢測的缺點。一般來說,在待測物件(例如:半導體晶片)製作完成後,必須經過標準的檢測流程,利用自動光學檢測裝置檢測待測物件的外觀,篩選排除外觀具有明顯瑕疵的物件,繼而進行物件之光學功能測試。更明確地說,自動光學檢測系統由光學檢測機台的運作來進行,在檢測過程中,是以光線照射待測物件或是直接擷取來自待測物所發出的光,再通過影像感測器單元擷取待測物件之圖像來進行瑕疵的判斷。In recent years, with the vigorous development of automated production, the production industry has created the so-called automated optical inspection (AOI), which is a high-speed and high-precision optical image inspection system, which uses machine vision as a standard inspection technology. Disadvantages of inspections traditionally performed manually using optical instruments. Generally speaking, after the object to be tested (such as a semiconductor wafer) is fabricated, it must go through a standard inspection process, using an automatic optical inspection device to detect the appearance of the object to be tested, and screen out the objects with obvious defects in appearance, and then carry out the inspection of the objects. Optical function test. More specifically, the automatic optical inspection system is carried out by the operation of the optical inspection machine. During the inspection process, the object to be tested is illuminated with light or the light emitted from the object to be tested is directly captured, and then image sensing is performed. The detector unit captures the image of the object to be tested to judge the defect.

在現有技術中,自動光學檢測大多採用面掃描攝影裝置來擷取待測物件的影像。面掃描攝影裝置主要包含一鏡頭及一攝影機,鏡頭的視野範圍將待測物件納入而進行拍攝。然而,面掃描攝影裝置的影像解析度受限於鏡頭和攝影機的解析度,因此當視野範圍越大,影像解析度越差,且其還具有取像速度慢的缺點,因此難以滿足產業需求。In the prior art, most of the automatic optical inspection uses an area scanning camera to capture the image of the object to be inspected. The area scanning photographing device mainly includes a lens and a camera, and the field of view of the lens includes the object to be measured for shooting. However, the image resolution of the area scan photographing device is limited by the resolution of the lens and the camera. Therefore, the larger the field of view, the worse the image resolution, and it also has the disadvantage of slow image acquisition, so it is difficult to meet the needs of the industry.

為此,如何設計出一種光學檢測裝置,特別是解決現有技術之前述技術問題,乃為本案創作人所研究的重要課題。Therefore, how to design an optical detection device, especially how to solve the aforementioned technical problems in the prior art, is an important subject studied by the author of this case.

本創作之目的在於提供一種光學檢測裝置,可以解決現有技術之影像解析度差以及取像速度慢的技術問題,達到提高檢測準確率以及提高檢測效率之目的。The purpose of this creation is to provide an optical detection device, which can solve the technical problems of poor image resolution and slow image acquisition speed in the prior art, and achieve the purpose of improving the detection accuracy and the detection efficiency.

為了達到前述目的,本創作所提出的光學檢測裝置應用於檢測待測樣品,且光學檢測裝置包括光學模組、控制模組以及運算模組。其中,所述光學模組包括相機、指示燈治具以及待測樣品治具。待測樣品治具用以配置待測樣品;相機用以接收指示燈治具發出的指示光,且相機檢測待測樣品發出的待測光之後,產生圖像訊號。所述控制模組耦接光學模組,用以控制相機以及指示燈治具。所述運算模組耦接控制模組,運算模組接收圖像訊號,且產生亮度分布結果。其中,運算模組依據指示光以及亮度分布結果,判斷待測樣品是否存在異常。In order to achieve the aforementioned purpose, the optical detection device proposed in the present invention is applied to detect the sample to be tested, and the optical detection device includes an optical module, a control module and an operation module. Wherein, the optical module includes a camera, an indicator light fixture and a test sample fixture. The sample fixture to be tested is used to configure the sample to be tested; the camera is used to receive the indicator light from the indicator light fixture, and the camera generates an image signal after detecting the light to be measured from the sample to be tested. The control module is coupled to the optical module for controlling the camera and the indicator light fixture. The computing module is coupled to the control module, and the computing module receives the image signal and generates a brightness distribution result. Wherein, the operation module determines whether the sample to be tested is abnormal according to the indication light and the result of the brightness distribution.

進一步而言,所述之光學檢測裝置中,光學模組更包括支架,支架配置於指示燈治具以及待測樣品治具之外,且支架將相機固設於指示燈治具以及待測樣品治具之上。Further, in the optical detection device, the optical module further includes a bracket, the bracket is arranged outside the indicator light fixture and the sample to be tested fixture, and the bracket fixes the camera on the indicator light fixture and the sample to be tested. on the fixture.

進一步而言,所述之光學檢測裝置中,光學模組更包括鏡頭,鏡頭配置於相機之下,且用以調整對應待測樣品之光圈以及焦距之其中至少一者。Further, in the optical detection device, the optical module further includes a lens, and the lens is disposed under the camera and used to adjust at least one of the aperture and the focal length corresponding to the sample to be tested.

進一步而言,所述之光學檢測裝置中,光學模組更包括外殼以及遮光罩;其中,外殼罩設於相機、指示燈治具以及待測樣品治具之外,且遮光罩配置於外殼之上。Further, in the optical detection device, the optical module further includes a casing and a light shield; wherein, the casing is arranged outside the camera, the indicator light fixture and the sample fixture to be tested, and the light shield is arranged on the outer casing. superior.

進一步而言,所述之光學檢測裝置中,指示光包括紅指示光、綠指示光以及藍指示光的其中至少一者。Further, in the optical detection device, the indicator light includes at least one of red indicator light, green indicator light and blue indicator light.

進一步而言,所述之光學檢測裝置中,待測光包括紅待測光、綠待測光以及藍待測光的其中至少一者。Further, in the optical detection device, the light to be measured includes at least one of red light to be measured, green light to be measured, and blue light to be measured.

進一步而言,所述之光學檢測裝置中,控制模組包括單晶片控制器、發光二極體晶片控制器以及踏板;其中,踏板耦接單晶片控制器,單晶片控制器耦接發光二極體晶片控制器,發光二極體晶片控制器耦接指示燈治具。Further, in the optical detection device, the control module includes a single-chip controller, a light-emitting diode chip controller, and a pedal; wherein, the pedal is coupled to the single-chip controller, and the single-chip controller is coupled to the light-emitting diode The body chip controller, the light emitting diode chip controller is coupled to the indicator light fixture.

進一步而言,所述之光學檢測裝置中,運算模組包括電腦主機,電腦主機耦接控制模組,且接收圖像訊號,以產生亮度分布結果。Further, in the optical detection device, the computing module includes a computer host, and the computer host is coupled to the control module and receives image signals to generate luminance distribution results.

進一步而言,所述之光學檢測裝置中,運算模組更包括鍵盤以及滑鼠;其中,鍵盤以及滑鼠分別地耦接至電腦主機。Further, in the optical detection device, the computing module further includes a keyboard and a mouse; wherein the keyboard and the mouse are respectively coupled to the computer host.

進一步而言,所述之光學檢測裝置中,運算模組更包括螢幕,螢幕耦接電腦主機,且用以顯示亮度分布結果。Further, in the optical detection device, the operation module further includes a screen, and the screen is coupled to the computer host and used to display the result of the luminance distribution.

在使用本創作所述之光學檢測裝置時,所述指示燈治具可以依據控制模組之控制以發出紅、藍、綠的至少一者的指示光,繼而使得所述相機受到控制模組之控制,而被適配為對應適合頻譜之檢測模式(例如調整感測器之敏感度的峰值波長區間等),可以使得運算模組準確地獲得所述亮度分布結果,且節省了資料擷取量使得取像速度較快,繼而運算模組依據指示光以及亮度分布結果,以判斷待測樣品是否存在異常。由於所述檢測模式係可調整地搭配指示燈治具而改變,使得像基於取像時可以針對特定的頻譜進行取像以及分析,故不易有解析度不高而致使難以檢測待測樣品的問題。When using the optical detection device described in this creation, the indicator light fixture can emit at least one indicator light of red, blue and green according to the control of the control module, so that the camera is controlled by the control module. control, and is adapted to the detection mode corresponding to the appropriate spectrum (for example, adjusting the peak wavelength range of the sensitivity of the sensor, etc.), so that the computing module can accurately obtain the brightness distribution result and save the amount of data acquisition The image acquisition speed is faster, and then the operation module determines whether the sample to be tested is abnormal according to the indication light and the result of the brightness distribution. Because the detection mode can be adjusted with the indicator light fixture, so that the image can be captured and analyzed for a specific spectrum when the image is captured, so it is not easy to have the problem of low resolution and difficulty in detecting the sample to be tested. .

為此,本創作所述之光學檢測裝置可以解決現有技術之影像解析度差以及取像速度慢的技術問題,達到提高檢測準確率以及提高檢測效率之目的。Therefore, the optical detection device described in this creation can solve the technical problems of poor image resolution and slow image acquisition speed in the prior art, so as to achieve the purpose of improving detection accuracy and improving detection efficiency.

為了能更進一步瞭解本創作為達成預定目的所採取之技術、手段及功效,請參閱以下有關本創作之詳細說明與附圖,相信本創作特徵與特點,當可由此得一深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本創作加以限制者。In order to have a better understanding of the techniques, means and effects of this creation to achieve the intended purpose, please refer to the following detailed descriptions and accompanying drawings of this creation. I believe that the features and characteristics of this creation can be used to gain an in-depth and specific understanding. , however, the attached drawings are only for reference and description, and are not intended to limit the creation.

以下係藉由特定的具體實施例說明本創作之實施方式,熟悉此技術之人士可由本說明書所揭示之內容輕易地瞭解本創作之其他優點及功效。本創作亦可藉由其他不同的具體實例加以施行或應用,本創作說明書中的各項細節亦可基於不同觀點與應用在不悖離本創作之精神下進行各種修飾與變更。The following describes the implementation of the present invention through specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification. This creation can also be implemented or applied through other different specific examples, and various details in this creation specification can also be modified and changed based on different viewpoints and applications without departing from the spirit of this creation.

須知,本說明書所附圖式繪示之結構、比例、大小、元件數量等,均僅用以配合說明書所揭示之內容,以供熟悉此技術之人士瞭解與閱讀,並非用以限定本創作可實施之限定條件,故不具技術上之實質意義,任何結構之修飾、比例關係之改變或大小之調整,在不影響本創作所能產生之功效及所能達成之目的下,均應落在本創作所揭示之技術內容得能涵蓋之範圍內。It should be noted that the structure, proportion, size, number of components, etc. shown in the drawings in this specification are only used to cooperate with the content disclosed in the specification for the understanding and reading of those who are familiar with this technology, and are not intended to limit the possibilities of this creation. The limited conditions for implementation, so it has no technical significance. Any modification of the structure, change of the proportional relationship or adjustment of the size, without affecting the effect and the purpose that this creation can produce, shall fall within the scope of this work. The technical content disclosed by the creation must be within the scope of coverage.

茲有關本創作之技術內容及詳細說明,配合圖式說明如下。The technical content and detailed description of this creation are described below in conjunction with the drawings.

請參閱圖1所示,為本創作光學檢測裝置之第一實施例的系統架構圖。本創作所提出的光學檢測裝置應用於檢測待測樣品(圖中未示),且光學檢測裝置包括光學模組10、控制模組20以及運算模組30。其中,所述光學模組10包括相機11、指示燈治具12以及待測樣品治具13。待測樣品治具13用以配置待測樣品100(如圖3所示)。相機11用以接收指示燈治具12發出的指示光,且相機11檢測待測樣品100發出的待測光之後,產生圖像訊號。所述控制模組20耦接光學模組10,用以控制相機11以及指示燈治具12。所述運算模組30耦接控制模組20,運算模組30接收圖像訊號,且產生亮度分布結果。其中,運算模組30依據指示光以及亮度分布結果,判斷待測樣品100是否存在異常。Please refer to FIG. 1 , which is a system structure diagram of a first embodiment of an optical detection device of the present creation. The optical detection device proposed in the present invention is applied to detect a sample to be tested (not shown in the figure), and the optical detection device includes an optical module 10 , a control module 20 and an operation module 30 . The optical module 10 includes a camera 11 , an indicator light fixture 12 and a sample fixture 13 to be tested. The test sample fixture 13 is used to configure the test sample 100 (as shown in FIG. 3 ). The camera 11 is used for receiving the indicator light emitted by the indicator light fixture 12 , and the camera 11 generates an image signal after detecting the light to be measured emitted by the sample to be tested 100 . The control module 20 is coupled to the optical module 10 for controlling the camera 11 and the indicator light fixture 12 . The computing module 30 is coupled to the control module 20, and the computing module 30 receives the image signal and generates a brightness distribution result. The computing module 30 determines whether the sample to be tested 100 is abnormal according to the indication light and the brightness distribution result.

進一步而言,在本創作之所述第一實施例中,所述指示光包括紅指示光、綠指示光以及藍指示光的其中至少一者(例如光學之三原色)。所述待測光包括紅待測光、綠待測光以及藍待測光的其中至少一者,例如可見光範疇之紅光發光二極體(例如:鋁砷化鎵(AlGaAs)、砷化鎵磷化物(GaAsP)、磷化銦鎵鋁(AlGaInP)、磷化鎵摻雜氧化鋅(GaP:ZnO))、綠光發光二極體(例如:銦氮化鎵(InGaN)、氮化鎵(GaN)、磷化鎵(GaP)、磷化銦鎵鋁(AlGaInP)、鋁磷化鎵(lGaP))、藍光發光二極體(例如:硒化鋅(ZnSe)、銦氮化鎵(InGaN)、碳化矽(SiC))等。且所述待測樣品100之發光晶粒形式亦可包括有機發光二極體(organic light-emitting diode, OLED)。Further, in the first embodiment of the present invention, the indicator light includes at least one of red indicator light, green indicator light, and blue indicator light (eg, the three primary colors of optics). The light to be measured includes at least one of red light to be measured, green light to be measured, and blue light to be measured, such as red light-emitting diodes in the visible light range (for example: aluminum gallium arsenide (AlGaAs), gallium arsenide phosphide (GaAsP) ), Indium Gallium Aluminum Phosphide (AlGaInP), Gallium Phosphide Doped Zinc Oxide (GaP:ZnO)), Green Light Emitting Diodes (eg: Indium Gallium Nitride (InGaN), Gallium Nitride (GaN), Phosphorus Gallium Alide (GaP), Aluminum Indium Gallium Phosphide (AlGaInP), Aluminum Gallium Phosphide (lGaP), Blue Light Emitting Diodes (eg: Zinc Selenide (ZnSe), Indium Gallium Nitride (InGaN), Silicon Carbide ( SiC)) etc. In addition, the light-emitting die form of the sample to be tested 100 may also include organic light-emitting diodes (OLEDs).

請參閱圖2以及圖3所示,其中,圖2為本創作光學檢測裝置之第二實施例的系統架構圖,圖3為本創作光學檢測裝置之光學模組的架構示意圖。Please refer to FIG. 2 and FIG. 3 , wherein, FIG. 2 is a system structure diagram of a second embodiment of the optical detection device for creating the optical detection device, and FIG. 3 is a schematic structural diagram of an optical module of the optical detection device for creating the optical device.

在本創作之所述第二實施例中,與前述第一實施例大致相同,惟光學模組10更包括支架14、鏡頭15、外殼16以及遮光罩17,控制模組20包括單晶片控制器21、發光二極體晶片控制器22以及踏板23,且運算模組30包括電腦主機31、鍵盤32、滑鼠33以及螢幕34。其中,踏板23耦接單晶片控制器21,單晶片控制器21耦接發光二極體晶片控制器22,發光二極體晶片控制器22耦接指示燈治具12。進一步而言,支架14配置於指示燈治具12以及待測樣品治具13之外,且支架14將相機11固設於指示燈治具12以及待測樣品治具13之上。鏡頭15配置於相機11之下,且用以調整對應待測樣品100之光圈以及焦距之其中至少一者。外殼16罩設於相機11、指示燈治具12以及待測樣品治具13之外,且遮光罩17配置於外殼16之上。進一步而言,電腦主機31耦接控制模組20,且接收圖像訊號以產生亮度分布結果。鍵盤32以及滑鼠33分別地耦接至電腦主機31,用以供使用者對電腦主機31施予指令。螢幕34耦接電腦主機31,且用以顯示亮度分布結果。In the second embodiment of the present invention, it is substantially the same as the aforementioned first embodiment, except that the optical module 10 further includes a bracket 14 , a lens 15 , a housing 16 and a light shield 17 , and the control module 20 includes a single-chip controller 21 . The LED chip controller 22 and the pedal 23 , and the operation module 30 includes a computer host 31 , a keyboard 32 , a mouse 33 and a screen 34 . The pedal 23 is coupled to the single chip controller 21 , the single chip controller 21 is coupled to the LED chip controller 22 , and the LED chip controller 22 is coupled to the indicator light fixture 12 . Further, the bracket 14 is disposed outside the indicator light fixture 12 and the sample fixture 13 to be tested, and the bracket 14 fixes the camera 11 on the indicator light fixture 12 and the sample fixture 13 to be tested. The lens 15 is disposed below the camera 11 and is used to adjust at least one of the aperture and the focal length corresponding to the sample to be tested 100 . The housing 16 covers the camera 11 , the indicator light fixture 12 and the sample fixture 13 to be tested, and the light shield 17 is disposed on the housing 16 . Further, the computer host 31 is coupled to the control module 20 and receives the image signal to generate the luminance distribution result. The keyboard 32 and the mouse 33 are respectively coupled to the computer host 31 for the user to give instructions to the computer host 31 . The screen 34 is coupled to the computer host 31 and used to display the result of the luminance distribution.

在使用本創作所述之光學檢測裝置時,所述指示燈治具12可以依據控制模組20之控制以發出紅、藍、綠的至少一者的指示光,繼而使得所述相機11受到控制模組20之控制,而被適配為對應適合頻譜之檢測模式(例如調整感測器之敏感度的峰值波長區間等),可以使得運算模組30準確地獲得所述亮度分布結果,且節省了資料擷取量使得取像速度較快,繼而運算模組30依據指示光以及亮度分布結果,以判斷待測樣品100是否存在異常。由於所述檢測模式係可調整地搭配指示燈治具12而改變,使得像基於取像時可以針對特定的頻譜進行取像以及分析,故不易有解析度不高而致使難以檢測待測樣品100的問題。When using the optical detection device described in this work, the indicator light fixture 12 can emit at least one indicator light of red, blue and green according to the control of the control module 20, so that the camera 11 can be controlled The control of the module 20 is adapted to correspond to the detection mode suitable for the spectrum (for example, adjusting the peak wavelength range of the sensitivity of the sensor, etc.), so that the computing module 30 can accurately obtain the brightness distribution result, and save In order to reduce the data acquisition amount, the image acquisition speed is faster, and then the operation module 30 determines whether the sample to be tested 100 is abnormal or not according to the indication light and the brightness distribution result. Since the detection mode can be adjusted in combination with the indicator light fixture 12, the image can be captured and analyzed for a specific spectrum when the image is captured, so it is difficult to detect the sample 100 to be tested due to low resolution. The problem.

為此,本創作所述之光學檢測裝置可以解決現有技術之影像解析度差以及取像速度慢的技術問題,達到提高檢測準確率以及提高檢測效率之目的。Therefore, the optical detection device described in this creation can solve the technical problems of poor image resolution and slow image acquisition speed in the prior art, so as to achieve the purpose of improving detection accuracy and improving detection efficiency.

以上所述,僅為本創作較佳具體實施例之詳細說明與圖式,惟本創作之特徵並不侷限於此,並非用以限制本創作,本創作之所有範圍應以下述之申請專利範圍為準,凡合於本創作申請專利範圍之精神與其類似變化之實施例,皆應包括於本創作之範疇中,任何熟悉該項技藝者在本創作之領域內,可輕易思及之變化或修飾皆可涵蓋在以下本案之專利範圍。The above is only the detailed description and drawings of the preferred specific embodiments of this creation, but the features of this creation are not limited to this, and are not intended to limit this creation. The entire scope of this creation shall be the following patent application scope All the embodiments that conform to the spirit of the patented scope of this creation and its similar changes shall be included in the scope of this creation. Modifications can all be covered by the following patent scope of this case.

10:光學模組 11:相機 12:指示燈治具 13:待測樣品治具 14:支架 15:鏡頭 16:外殼 17:遮光罩 20:控制模組 21:單晶片控制器 22:發光二極體晶片控制器 23:踏板 30:運算模組 31:電腦主機 32:鍵盤 33:滑鼠 34:螢幕 100:待測樣品 10: Optical module 11: Camera 12: Indicator light fixture 13: Sample fixture to be tested 14: Bracket 15: Lens 16: Shell 17: Hood 20: Control Module 21: Single chip controller 22: LED chip controller 23: Pedal 30: Operation module 31: computer host 32: Keyboard 33: Mouse 34: Screen 100: sample to be tested

圖1為本創作光學檢測裝置之第一實施例的系統架構圖;FIG. 1 is a system architecture diagram of a first embodiment of the creation of an optical detection device;

圖2為本創作光學檢測裝置之第二實施例的系統架構圖;以及FIG. 2 is a system architecture diagram of a second embodiment of the creation of an optical detection device; and

圖3為本創作光學檢測裝置之光學模組的架構示意圖。FIG. 3 is a schematic structural diagram of an optical module for creating an optical detection device.

10:光學模組 10: Optical module

11:相機 11: Camera

12:指示燈治具 12: Indicator light fixture

13:待測樣品治具 13: Sample fixture to be tested

20:控制模組 20: Control Module

30:運算模組 30: Operation module

Claims (10)

一種光學檢測裝置,應用於檢測一待測樣品,包括: 一光學模組,包括一相機、一指示燈治具以及一待測樣品治具;其中,該待測樣品治具用以配置該待測樣品;該相機用以接收該指示燈治具發出的一指示光,且該相機檢測該待測樣品發出的一待測光之後,產生一圖像訊號; 一控制模組,耦接該光學模組,用以控制該相機以及該指示燈治具;以及 一運算模組,耦接該控制模組,該運算模組接收該圖像訊號,且產生一亮度分布結果; 其中,該運算模組依據該指示光以及該亮度分布結果,判斷該待測樣品是否存在異常。 An optical detection device, used for detecting a sample to be tested, comprising: An optical module includes a camera, an indicator light fixture and a sample fixture to be tested; wherein, the sample fixture to be tested is used to configure the sample to be tested; the camera is used to receive the light emitted by the indicator light fixture an indicator light, and the camera generates an image signal after detecting a light to be measured emitted by the sample to be tested; a control module, coupled to the optical module, for controlling the camera and the indicator light fixture; and an operation module, coupled to the control module, the operation module receives the image signal and generates a brightness distribution result; Wherein, the operation module determines whether the sample to be tested is abnormal according to the indication light and the result of the brightness distribution. 如請求項1所述之光學檢測裝置,其中,該光學模組更包括一支架,該支架配置於該指示燈治具以及該待測樣品治具之外,且該支架將該相機固設於該指示燈治具以及該待測樣品治具之上。The optical detection device according to claim 1, wherein the optical module further comprises a bracket, the bracket is disposed outside the indicator light fixture and the sample fixture to be tested, and the bracket fixes the camera on the on the indicator light fixture and the sample fixture to be tested. 如請求項1所述之光學檢測裝置,其中,該光學模組更包括一鏡頭,該鏡頭配置於該相機之下,且用以調整對應該待測樣品之光圈以及焦距之其中至少一者。The optical detection device according to claim 1, wherein the optical module further comprises a lens, which is disposed under the camera and used to adjust at least one of the aperture and the focal length corresponding to the sample to be tested. 如請求項1所述之光學檢測裝置,其中,該光學模組更包括一外殼以及一遮光罩;其中,該外殼罩設於該相機、該指示燈治具以及該待測樣品治具之外,且該遮光罩配置於該外殼之上。The optical detection device according to claim 1, wherein the optical module further comprises a casing and a light shield; wherein, the casing is provided outside the camera, the indicator light fixture and the sample fixture to be tested , and the light shield is arranged on the casing. 如請求項1所述之光學檢測裝置,其中,該指示光包括紅指示光、綠指示光以及藍指示光的其中至少一者。The optical detection device of claim 1, wherein the indicator light includes at least one of red indicator light, green indicator light, and blue indicator light. 如請求項1所述之光學檢測裝置,其中,該待測光包括紅待測光、綠待測光以及藍待測光的其中至少一者。The optical detection device of claim 1, wherein the light to be measured includes at least one of red light to be measured, green light to be measured, and blue light to be measured. 如請求項1所述之光學檢測裝置,其中,該控制模組包括一單晶片控制器、一發光二極體晶片控制器以及一踏板;其中,該踏板耦接該單晶片控制器,該單晶片控制器耦接該發光二極體晶片控制器,該發光二極體晶片控制器耦接該指示燈治具。The optical detection device of claim 1, wherein the control module comprises a single-chip controller, a light-emitting diode chip controller, and a pedal; wherein, the pedal is coupled to the single-chip controller, and the single-chip controller The chip controller is coupled to the light-emitting diode chip controller, and the light-emitting diode chip controller is coupled to the indicator light fixture. 如請求項1所述之光學檢測裝置,其中,該運算模組包括一電腦主機,該電腦主機耦接該控制模組,且接收該圖像訊號,以產生該亮度分布結果。The optical detection device of claim 1, wherein the computing module comprises a computer host, the computer host is coupled to the control module, and receives the image signal to generate the luminance distribution result. 如請求項8所述之光學檢測裝置,其中,該運算模組更包括一鍵盤以及一滑鼠;其中,該鍵盤以及該滑鼠分別地耦接至該電腦主機。The optical detection device of claim 8, wherein the computing module further comprises a keyboard and a mouse; wherein the keyboard and the mouse are respectively coupled to the computer host. 如請求項8所述之光學檢測裝置,其中,該運算模組更包括一螢幕,該螢幕耦接該電腦主機,且用以顯示該亮度分布結果。The optical detection device according to claim 8, wherein the computing module further comprises a screen, which is coupled to the computer host and used for displaying the luminance distribution result.
TW111203472U 2022-04-07 2022-04-07 Optical detection apparatus TWM628897U (en)

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