TWM623249U - Micro point measuring device - Google Patents
Micro point measuring device Download PDFInfo
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- TWM623249U TWM623249U TW110210770U TW110210770U TWM623249U TW M623249 U TWM623249 U TW M623249U TW 110210770 U TW110210770 U TW 110210770U TW 110210770 U TW110210770 U TW 110210770U TW M623249 U TWM623249 U TW M623249U
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本創作是關於測式電子元件之點測裝置,特別是指一種具有探針用以檢測發光二極體等半導體晶粒之微型點測裝置。This creation is about a testing device for testing electronic components, especially a micro-point testing device with probes for detecting semiconductor chips such as light-emitting diodes.
請參閱圖1,係為台灣專利第I526702號「用於測試電子元件之點測裝置」,具有一三軸位移調整座1,係設置於一檢測設備上(圖未示),包括有一X軸位移調整模組2,一Y軸位移調整模組3及一Z軸位移調整模組4,該X軸位移調整模組2、Y軸位移調整模組3及Z軸位移調整模組4可分別在X軸向、Y軸向及Z軸向上進行位移之調整。並具有一升降驅動器5組設於三軸位移調整坐1上,該三軸位移調整座1可對該升降驅動器5進行三軸向之位移調整,並有一連接架6藉由滑軌與滑座耦接於該三軸位移調整座1,且對應連接該升降驅動器5,使升降驅動器5可驅動該連接架6進行升降作動,又有U型的一固定架7固設於該連接架6,該連接架6活接一活動座8,該活動座8之前端設有一探針夾持座9,該探針夾持座9係用於夾持一探針A,該探針A係可頂抵發光二極體的一LED晶粒之頂面,以檢測發光二極體之LED晶粒之性能。Please refer to FIG. 1, which is Taiwan Patent No. I526702 "Point Test Device for Testing Electronic Components", with a three-axis
由於前述用於測試電子元件之點測裝置之X軸位移調整模組2,Y軸位移調整模組3及Z軸位移調整模組4,都是藉由滑軌與滑座互相配合方式,使X軸位移調整模組2、Y軸位移調整模組3及Z軸位移調整模組4分別可在X軸向、Y軸向及Z軸向上進行位移之調整,導致整體體積及重量大,相對地製造上需要大量材料以致無法降低生產成本。Because the X-axis
爰此,本創作的主要目的,係在於解決習知具三軸位移調整座之點測裝置,其藉由滑軌與滑座互相配合方式,使X軸位移調整模組、Y軸位移調整模組及Z軸位移調整模組分別可在X軸向、Y軸向及Z軸向上進行位移之調整,導致調整座整體體積龐大,製造成本相對提高之缺撼,進而研發出一種微型點測裝置,可達到體積小節省成本及結構簡單好操作之優點。Therefore, the main purpose of this creation is to solve the conventional point measuring device with a three-axis displacement adjustment seat, which makes the X-axis displacement adjustment module and the Y-axis displacement adjustment module cooperate with each other through the sliding rail and the sliding seat. The group and Z-axis displacement adjustment module can adjust the displacement in the X-axis, Y-axis and Z-axis respectively, which leads to the large overall volume of the adjustment seat and the relatively high manufacturing cost. , can achieve the advantages of small size, cost saving, simple structure and easy operation.
為達上述目的,本創作揭露一種微型點測裝置,係設於檢測設備上,包括:一載座及一點測機構,該載座具有一容置空間;該點測機構係組配在該載座的容置空間,該點測機構具有一導電支架以夾接一探針,該探針係對一晶圓的一LED晶粒進行點測,該點測機構包含一夾座夾接該導電支架,該夾座組配於該容置空間並受一前後移動單元之驅動可前後位移,及受一左右移動件之驅動可左右位移並受一上下移動單元之驅動可上下位移。In order to achieve the above-mentioned purpose, the present invention discloses a micro-point measuring device, which is installed on the testing equipment, including: a carrier and a point-pointing mechanism, the carrier has an accommodating space; the point-pointing mechanism is assembled on the carrier. The accommodating space of the seat, the point-measuring mechanism has a conductive support to clamp a probe, the probe is used to point an LED die of a wafer, and the point-measuring mechanism includes a clamp seat to clamp the conductive The bracket, the clip seat is assembled in the accommodating space and can be displaced back and forth by a front and rear moving unit, and can be displaced left and right by a left and right moving member, and can be moved up and down by a vertical moving unit.
在應用實施上,該載座的容置空間與該載座的右壁面之一透孔相通,該夾座凸伸出於該載座的透孔。In application implementation, the accommodating space of the carrier is communicated with a through hole on the right wall surface of the carrier, and the clip seat protrudes from the through hole of the carrier.
在應用實施上,該前後移動單元係包含一螺桿螺接在該載座的左壁面,該螺桿左側設一第一轉輪,該螺桿的右側與該夾座連接,旋轉該第一轉輪可帶動該夾座前後位移。In application, the front and rear moving unit includes a screw screwed on the left wall surface of the carrier, a first wheel is arranged on the left side of the screw, and the right side of the screw is connected with the clamping seat. Rotating the first wheel can Drive the clamp base to move back and forth.
在應用實施上,該載座的前側面設有一壁孔,該左右移動件具有不同方向的一第一端部與一第二端部,該第一端部與該第二端部互為90°,該第一端部與該載座的長度方向同向並樞接一第二轉輪,該第二轉輪中心的一螺桿係穿過該左右移動件、該壁孔並與該夾座連接,該左右移動件的第二端部係伸入於該壁孔與該夾座螺合,旋轉該第二轉輪可帶動該夾座左右移位。 In application, the front side of the carrier is provided with a wall hole, the left and right moving parts have a first end and a second end in different directions, and the first end and the second end are 90 degrees from each other. °, the first end is in the same direction as the length of the carrier and is pivotally connected to a second runner. A screw in the center of the second runner passes through the left and right moving parts, the wall hole and is connected to the clamping seat connected, the second end of the left and right moving piece is protruded into the wall hole and screwed together with the clamping base, and rotating the second wheel can drive the clamping base to move left and right.
在應用實施上,該導電支架具有橫向的一連接端與直向的一夾接端,該連接端受該夾座的一開口向上之夾槽夾制,該夾接端係夾接一探針,該探針具有橫向的一組合端與該導電支架的夾接端連接及一作用端,該組合端與該作用端互為一夾角,該夾角大於90°。 In application implementation, the conductive support has a transverse connecting end and a straight clamping end, the connecting end is clamped by a clamping groove with an upward opening of the clamping base, and the clamping end is clamped to a probe , the probe has a transverse combination end connected with the clamping end of the conductive support and an action end, the combination end and the action end form an included angle with each other, and the included angle is greater than 90°.
在應用實施上,該載座的右壁面上方設有內部中空的一凸腹,該上下移動單元包含有一齒輪組裝設在該凸腹,該夾座的後方連接一板體,該齒輪組設有一調整螺絲,旋轉該調整螺絲可驅動該齒輪組帶動該板體上下位移。 In application, a convex belly with a hollow interior is provided above the right wall of the carrier, the up-and-down moving unit includes a gear assembled on the convex belly, the rear of the clamp is connected to a plate, and the gear set is provided with a Adjusting the screw, and rotating the adjusting screw can drive the gear set to drive the plate body to move up and down.
在應用實施上,該載座的後壁面設有一穿槽可露出該板體,並設有一彈性調整單元及一螺釘,該螺釘穿過該穿槽並連接該板體,該彈性調整單元設有可軸向拉伸的一彈性件,該彈性件的一端係勾接在該載座的後壁面,該彈性件的另一端係與該螺釘連接,旋轉該螺釘可微調該板體於該載座的前後位置。 In application implementation, the rear wall of the carrier is provided with a through slot to expose the plate body, and is provided with an elastic adjustment unit and a screw, the screw passes through the through slot and is connected to the plate body, and the elastic adjustment unit is provided with An elastic piece that can be stretched axially, one end of the elastic piece is hooked on the rear wall of the carrier, the other end of the elastic piece is connected with the screw, and the screw can be rotated to fine-tune the plate body on the carrier the front and rear positions.
藉此,本創作於載座的右側設前後移動單元,第一螺桿螺接在載座的左壁面,第一螺桿的左側設第一轉輪,第一螺桿的右側與夾座連接,旋轉該第一轉輪可帶動該夾座前後位移,並帶動導電支架前後位移,進而可整第一探針的前後位置。接著於載座的前壁面設左右移動件,其第一端部樞接第二轉輪,第二轉輪中心的螺桿與夾座連接,左右移動件的第二端部與夾座螺合,旋轉第二轉輪可帶動左右移動件左右位移,並帶動夾座左右位移,進而可調整探針的左右位置。又上下移動單元其板體連接在導電支架後面,載座的凸腹具有齒輪組,齒輪組設有調整螺絲,旋轉該調整螺絲可帶動齒輪組以調整板體上下位移,而調整導電支架上下移動,進而可調整探針上下位置,如此結構,相較於習知我國專利第I526702號用於測試電子元件之點測裝置,藉由滑軌與滑座互相配合方式,使X軸位移調整模組、Y軸位移調整模組及Z軸位移調整模組分別可在X軸向、Y軸向及Z軸向上進行位移之調整,而大大縮小整體之體積及重量,可微型化降低製造成本,並達到精簡好操作功能。Thereby, the present invention is provided with a front and rear moving unit on the right side of the carrier, the first screw is screwed on the left wall of the carrier, the left side of the first screw is provided with a first runner, and the right side of the first screw is connected with the clamping base, and rotates the The first runner can drive the clamping base to move back and forth, and drive the conductive support to move back and forth, so that the front and rear positions of the first probe can be adjusted. Then, a left and right moving piece is arranged on the front wall of the carrier, the first end of which is pivotally connected to the second runner, the screw in the center of the second runner is connected with the clamping base, and the second end of the left and right moving piece is screwed with the clamping base, Rotating the second wheel can drive the left and right moving parts to move left and right, and drive the clamping base to move left and right, so that the left and right positions of the probe can be adjusted. The plate body of the up and down moving unit is connected to the back of the conductive bracket. The convex belly of the carrier is provided with a gear group, and the gear group is provided with an adjustment screw. Rotating the adjustment screw can drive the gear group to adjust the up and down displacement of the plate body, and adjust the conductive bracket to move up and down. , and then the upper and lower positions of the probe can be adjusted. With this structure, compared with the conventional point measuring device used for testing electronic components in Chinese Patent No. I526702, the X-axis displacement adjustment module can be adjusted by the mutual cooperation between the sliding rail and the sliding seat. , The Y-axis displacement adjustment module and the Z-axis displacement adjustment module can adjust the displacement in the X-axis, Y-axis and Z-axis respectively, and greatly reduce the overall volume and weight, which can miniaturize and reduce the manufacturing cost. To achieve a streamlined operation function.
茲配合圖式將本創作實施例詳細說明如下,其所附圖式主要為簡化之示意圖,僅以示意方式說明本創作之基本結構,因此在該等圖式中僅標示與本創作有關之元件,且所顯示之元件並非以實施時之數目、形狀、尺寸比例等加以繪製,其實際實施時之規格尺寸實為一種選擇性之設計,且其元件佈局形態有可能更為複雜。The embodiments of the present creation are described in detail as follows in conjunction with the drawings. The accompanying drawings are mainly simplified schematic diagrams, and only illustrate the basic structure of the present creation in a schematic way. Therefore, only the elements related to the present creation are indicated in these drawings. , and the displayed components are not drawn according to the number, shape, size ratio, etc. of the actual implementation. The size of the actual implementation is a selective design, and the layout of the components may be more complicated.
以下各實施例的說明是參考附加的圖式,用以例示本創作可據以實施的特定實施例。本創作所提到的方向用語,例如「上」、「下」、「前」、「後」、「左」、「右」、「內」、「外」、「側面」等,僅是參考附加圖式的方向。因此,使用的方向用語是用以說明及理解本創作,而非用以限制本創作。另外,在說明書中,除非明確地描述為相反的,否則詞語“包括”將被理解為意指包括所述元件,但是不排除任何其它元件。The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the invention may be implemented. The direction terms mentioned in this creation, such as "up", "down", "front", "rear", "left", "right", "inside", "outside", "sideways", etc., are for reference only Additional schema orientation. Therefore, the directional terms used are used to describe and understand the creation, not to limit the creation. Additionally, in the specification, unless explicitly described to the contrary, the word "comprising" will be understood to mean the inclusion of stated elements but not the exclusion of any other elements.
請參閱圖2~圖4,本創作微型點測裝置,係設於檢測設備上,包括有一載座10及一點測機構20。該載座為10為一矩形體,具有一前壁面11、一後壁面12、一左壁面13、一右壁面14,載座10的內部具有一容置空間15,該容置空間15貫通該載座10的右壁面14,該載座10的前壁面11的左右側分別設有一第一壁孔111與一第二壁孔112,該載座10的後壁面12設有內外相通一穿槽121,該載座10的右壁面14設有內部中空的一凸腹141及一透孔142。Please refer to FIG. 2 to FIG. 4 . The micro-point measuring device of the present invention is installed on the testing equipment, and includes a
該點測機構20,包含有一夾座21、一前後移動單元22、一左右移動件23、一上下移動單元24、一彈性調整單元25、一導電支架26及一探針27。The point-
該夾座21,係組配在該載座10的的容置空間15,該夾座21的一端並凸伸出於載座10之右壁面14的透孔142,該夾座21設有開口向上的一夾槽211,該夾槽211係夾接該導電支架26,該導電支架26具有橫向的一連接端261與縱向的一夾接端262,該連接端261與該夾座21之夾槽211配合,該導電支架26的夾接端262係夾接該探針27,該探針27具有橫向的一組合端271及一作用端272,探針27的組合端271被導電支架26的夾接端262夾接,探針27的作用端272與組合端271互為一夾角a,該夾角a大於90°,該作用端272的端部係用以點測一晶圓100頂部的一LED晶粒,可再參閱圖4、圖5。The
在實施應用上,該前後移動單元22係包含有一第一螺桿221螺接在該載座10的左壁面13,該第一螺桿221的左側設一第一轉輪222,第一螺桿221的右側與夾座21連接,旋轉該第一轉輪222可帶動該夾座21前後位移。In practical application, the front and rear moving
該左右移動件23,為一桿體設於該載座10的前壁面11,該左右移動件23的長度方向與該載座10的長度方向同向,係橫向組配在該載座10的前壁面11,該左右移動件23具有不同方向的一第一端部231與一第二端部232,該第一端部231與該第二端部232互為90°,該第一端部231與該載座10的長度方向同向並樞接有一第二轉輪233,第二轉輪233中心的螺桿234係穿過左右移動件23及第一壁孔111並與夾座21連接,該左右移動件23的第二端部232係伸入於載座10的第二壁孔112並與夾座21螺合,旋轉第二轉輪233可帶動左右移動件23左右移位,進而帶動夾座21左右位移。The left-right moving
該上下移動單元24,包含有一板體241貼設並連接在導電支架26的後面,該載座10的凸腹141內部設有一齒輪組242,並有一蓋板243蓋設在齒輪組242的上方,該齒輪組242設有縱向的一調整螺絲244,旋轉該調整螺絲244可帶動該齒輪組242以調整該板體241上下位移,進而調整該導電支架26上下移動。The up-and-down moving
該彈性調整單元25,包含一螺釘251穿過載座10的穿槽121,並與該板體241連接,及可軸向拉伸的一彈性件252,該彈性件252的一端係勾接在載座10的後壁面12,彈性件252的另一端係與該螺釘251連接,旋轉該螺釘251可微調該板體241於該載座10之前後位置。The
藉上述之結構,在操作時,可透過旋轉該第一轉輪222帶動該夾座21前後位移,並帶動該導電支架26前後位移,進而可調整該第一探針27的前後位置。而當旋轉該第二轉輪233時,可帶動該左右移動件23左右位移,並驅動該夾座21左右位移,進而帶動該導電支架26產生左右位移,可調整探針27左右位置。With the above structure, during operation, the
又,旋轉上下移動單元24的調整螺絲244可驅動齒輪組242作動,使板體241上下位移進而帶動該導電支架26產生上下位移,該導電支架26並帶動該探針27上下位移,如此可調整該探針27的上下位置。In addition, rotating the adjusting
請再參閱圖6及圖7,分別為顯示本創作(圖6所示)與習知專利第I526702號(圖7所示)用於測試電子元件之點測裝置之體積大小的比較圖。可以清楚看出本創作於載座10的左側設前後移動單元22,其第一螺桿221螺接在載座10的左壁面13,第一螺桿221的左側設第一轉輪222,第一螺桿221的右側與夾座21連接,旋轉該第一轉輪222可帶動該夾座21前後位移,並帶動導電支架26前後位移,進而可調整第一探針27的前後位置。接著於載座10的前壁面11設左右移動件23,其第一端部231樞接第二轉輪233,第二轉輪233中心的螺桿234與夾座21連接,左右移動件23的第二端部232與夾座21螺合,旋轉第二轉輪233可帶動左右移動件23左右位移,並帶動夾座21左右位移,進而可調整探針27的左右位置。又上下移動單元24其板體241連接在導電支架26後面,載座10的凸腹141具有齒輪組242,齒輪組242設有調整螺絲244,旋轉該調整螺絲244可帶動齒輪組242以調整板體241上下位移,而調整導電支架26上下移動,進而可調整探針27上下位置。Please refer to FIG. 6 and FIG. 7 , which are respectively a comparison diagram showing the volume size of the pointing device used for testing electronic components between the present invention (shown in FIG. 6 ) and the prior art patent No. I526702 (shown in FIG. 7 ). It can be clearly seen that the front and rear moving
如此結構,相較於習知專利第I526702號用於測試電子元件之點測裝置,藉由滑軌與滑座互相配合方式,使X軸位移調整模組、Y軸位移調整模組及Z軸位移調整模組分別可在X軸向、Y軸向及Z軸向上進行位移之調整,而大大縮小60%~85%的整體之體積及重量,可微型化且降低製造成本,並達到精簡好操作功能。With such a structure, compared with the conventional point measuring device used for testing electronic components in Patent No. I526702, the X-axis displacement adjustment module, the Y-axis displacement adjustment module and the Z-axis are formed by the mutual cooperation of the sliding rail and the sliding seat. The displacement adjustment module can adjust the displacement in the X-axis, Y-axis and Z-axis respectively, and greatly reduce the overall volume and weight by 60%~85%, which can miniaturize and reduce the manufacturing cost, and achieve a streamlined Operation function.
惟以上所述者,僅為本創作之較佳實施例而已,當不能以此限定本創作實施之範圍,即大凡依本創作申請專利範圍及創作說明內容所作之簡單的等效變化與修飾,皆仍屬本創作專利涵蓋之範圍內。However, the above are only the preferred embodiments of this creation, and should not limit the scope of implementation of this creation, that is, simple equivalent changes and modifications made according to the scope of the patent application for this creation and the contents of the description of the creation, All are still within the scope of this creative patent.
習知部分Knowledge part
1:三軸位移調整器1: Three-axis displacement adjuster
2:X軸位移調整模組2: X-axis displacement adjustment module
3:Y軸位移調整模組3: Y-axis displacement adjustment module
4:Z軸位移調整模組4: Z-axis displacement adjustment module
5:升降驅動器5: Lifting the drive
6:連接架6: Connecting frame
7:固定架7: Fixed frame
8:活動座8: Active seat
9:探針夾持座9: Probe holder
A:探針A: Probe
本創作部分This creative part
10:載座10: Carrier
11:前壁面11: Front wall
111:第一壁孔111: first wall hole
112:第二壁孔112: Second wall hole
12:後壁面12: Back wall
121:穿槽121: Grooving
13:左壁面13: Left wall
14:右壁面14: Right wall
141:凸腹141: Convex belly
142:透孔142: Through hole
15:容置空間15: Accommodating space
20:點測機構20: Point measuring mechanism
21:夾座21: clip seat
211:夾槽211: clip slot
22:前後移動單元22: Moving the unit forward and backward
221:第一螺桿221: The first screw
222:第一轉輪222: The first runner
23:左右移動件23: Left and right moving parts
231:第一端部231: First End
232:第二端部232: Second End
233:第二轉輪233: Second Wheel
234:螺桿234: Screw
24:上下移動單元24: Move the unit up and down
241:板體241: Board body
242:齒輪組242: Gear Set
243:蓋板243: Cover
244:調整螺絲244: Adjustment screw
25:彈性調整單元25: Elastic adjustment unit
251:螺釘251: Screws
252:彈性件252: Elastic
26:導電支架26: Conductive bracket
261:連接端261: Connection end
262:夾接端262: Clamp end
27:探針27: Probe
271:組合端271: Combination end
272:作用端272: Action end
圖1為專利第I526702號用於測試電子元件之點測裝置的立體圖。 圖2為本創作實施例的立體圖。 圖3為本創作實施例另一方向的立體圖。 圖4為本創作實施例探針與晶圓接觸的部分詳圖。 圖5為圖4的部分放大圖。 圖6、圖7為顯示本創作與習知專利第I526702號用於測試電子元件之點測裝置之體積大小比較圖。 FIG. 1 is a perspective view of a pointing device for testing electronic components in Patent No. I526702. FIG. 2 is a perspective view of a creative embodiment. FIG. 3 is a perspective view of another direction of the inventive example. FIG. 4 is a partial detailed view of the contact between the probe and the wafer according to an embodiment of the present invention. FIG. 5 is a partial enlarged view of FIG. 4 . FIG. 6 and FIG. 7 are diagrams showing the comparison of the volume and size of the point measuring device used for testing electronic components in the present invention and the prior art patent No. I526702.
10:載座 10: Carrier
11:前壁面 11: Front wall
111:第一壁孔 111: first wall hole
112:第二壁孔 112: Second wall hole
12:後壁面 12: Back wall
13:左壁面 13: Left wall
14:右壁面 14: Right wall
141:凸腹 141: Convex belly
142:透孔 142: Through hole
15:容置空間 15: Accommodating space
20:點測機構 20: Point measuring mechanism
21:夾座 21: clip seat
211:夾槽 211: clip slot
22:前後移動單元 22: Moving the unit forward and backward
221:第一螺桿 221: The first screw
222:第一轉輪 222: The first runner
23:左右移動件 23: Left and right moving parts
231:第一端部 231: First End
232:第二端部 232: Second End
233:第二轉輪 233: Second Wheel
234:螺桿 234: Screw
24:上下移動單元 24: Move the unit up and down
241:板體 241: Board body
242:齒輪組 242: Gear Set
243:蓋板 243: Cover
244:調整螺絲 244: Adjustment screw
26:導電支架 26: Conductive bracket
261:連接端 261: Connection end
262:夾接端 262: Clamp end
27:探針 27: Probe
271:組合端 271: Combination end
272:作用端 272: Action end
Claims (7)
Priority Applications (1)
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TW110210770U TWM623249U (en) | 2021-09-10 | 2021-09-10 | Micro point measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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TW110210770U TWM623249U (en) | 2021-09-10 | 2021-09-10 | Micro point measuring device |
Publications (1)
Publication Number | Publication Date |
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TWM623249U true TWM623249U (en) | 2022-02-11 |
Family
ID=81324383
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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Country Status (1)
Country | Link |
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TW (1) | TWM623249U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114859213A (en) * | 2022-07-05 | 2022-08-05 | 深圳市标谱半导体科技有限公司 | Test needle adjusting part and chip test equipment |
-
2021
- 2021-09-10 TW TW110210770U patent/TWM623249U/en unknown
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114859213A (en) * | 2022-07-05 | 2022-08-05 | 深圳市标谱半导体科技有限公司 | Test needle adjusting part and chip test equipment |
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