TWM576079U - Semiconductor cleaning device - Google Patents
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Abstract
本新型在於提供一種能提高清潔效果與效率,減少清潔耗材與縮短清潔時間的半導體清洗裝置。其技術手段:為一種半導體清洗裝置,其包括有承載平台及清潔組件,承載平台能供承載半導體晶片用,清潔組件能供對半導體晶片進行高壓沖洗和吹氣乾燥用,其特徵在於:承載平台包括承載台、主要驅動裝置;而清潔組件包括驅動裝置、高壓噴頭組及取像裝置。 The present invention provides a semiconductor cleaning device that can improve cleaning efficiency and efficiency, reduce cleaning consumables, and shorten cleaning time. The technical means is: a semiconductor cleaning device comprising a carrying platform and a cleaning assembly, the carrying platform can be used for carrying a semiconductor wafer, and the cleaning component can be used for high-pressure washing and blowing drying of the semiconductor wafer, characterized in that: the carrying platform The utility model comprises a carrying platform and a main driving device; and the cleaning component comprises a driving device, a high-pressure nozzle group and an image capturing device.
Description
本新型涉及一種半導體製程中的清洗裝置結構,尤指一種半導體清洗裝置。 The present invention relates to a structure of a cleaning device in a semiconductor process, and more particularly to a semiconductor cleaning device.
當前由於消費性電子產品的盛行,導致出現對於可攜式[Portability]及多功能[Multi-function]的大量需求,以致於微電子構裝逐漸往朝小尺寸、高性能、及降低成本前進發展。 At present, due to the prevalence of consumer electronics products, there is a large demand for portable [Portability] and multi-function [Multi-function], so that microelectronics construction is gradually moving toward smaller size, high performance, and lowering costs. .
晶圓級構裝[Wafer Level Package;簡稱WLP]具備縮小構裝尺寸的優勢,配合上面板級封裝[Panel Level Package;簡稱PLP]可達到大幅降低成本的目的,剛好迎合行動電子產品的市場趨勢。 Wafer Level Package (WLP) has the advantage of reducing the size of the package. With the Panel Level Package (PLP), the cost can be greatly reduced. It just caters to the market trend of mobile electronic products. .
晶圓級構裝的各種製程中,一般都會有一清洗間隙[gap]的過程,目前傳統清洗機一般多為使用流水線式清洗機、與旋轉式清洗機。 In the various processes of the wafer level assembly, there is generally a process of cleaning the gap [gap]. At present, the conventional cleaning machine generally uses a line cleaning machine and a rotary cleaning machine.
流水線式清洗機的耗液體量大、噴頭高度及角度受限、機台體積大、清洗時間長,清洗間隙距離需大於120μm,連續式流線移動會使大部分藥液、或藥水噴灑在無效區,而維修時須整台停機,對生產效率影響非常大。 The line-type cleaning machine consumes a large amount of liquid, the nozzle height and angle are limited, the machine is bulky, and the cleaning time is long. The cleaning gap distance needs to be greater than 120 μm. The continuous streamline movement will cause most of the liquid medicine or the syrup to be sprayed ineffective. District, and the whole machine must be shut down during maintenance, which has a great impact on production efficiency.
旋轉式清洗機為通過離心力將藥液、或藥水帶離被洗物,但離心力於在圓心處無作用,導致圓心至外圍的清洗效果不同;離心力在高速旋轉下才能發揮較大作用,在高速旋轉下,需大量補充藥液、或藥水,且高速旋轉下大部分藥液、或藥水會噴灑在無效區,導致藥液、或藥水尚 未進入被洗區域的間隙,就會被甩出,增加耗材使用量以及清洗時間,而且旋轉式清洗機皆是搭配一或多組移動擺臂,擺臂移動路徑為圓弧狀,行程受限,無法移動至被洗物的每個位置。 The rotary cleaning machine removes the chemical liquid or the medicinal water away from the laundry by centrifugal force, but the centrifugal force has no effect at the center of the circle, and the cleaning effect from the center of the circle to the periphery is different; the centrifugal force can play a large role under high-speed rotation, at a high speed. Under the rotation, a large amount of liquid medicine or syrup should be replenished, and most of the liquid medicine or the syrup will be sprayed in the ineffective area at high speed, resulting in the liquid medicine or the medicine water still being sprayed. If you do not enter the gap of the area to be washed, it will be thrown out, increasing the consumption of the consumables and the cleaning time. Moreover, the rotary cleaning machine is equipped with one or more sets of moving swing arms, and the swing arm moves in an arc shape with limited travel. Cannot move to each position of the laundry.
最重要的問題是,當前清洗的間隙大多小於120um,毛細作用力大,間隙中的藥液、或藥水難以排出,導致清洗不易,兩者的清洗效果,並不能有效符合當前業者的應用需求,對良率的提昇幫助低下。 The most important problem is that the gap of the current cleaning is mostly less than 120um, the capillary force is large, the liquid medicine or the medicine in the gap is difficult to discharge, which makes the cleaning difficult, and the cleaning effect of the two cannot effectively meet the application requirements of the current industry. Helps improve the yield.
有鑑於此,如何提供一種能解決前述問題,縮短清潔時間、減少清潔耗材消耗,並確保清潔效果與效率的半導體清洗裝置結構,便成為本新型欲改進的課題。 In view of the above, how to provide a semiconductor cleaning device structure that can solve the aforementioned problems, shorten the cleaning time, reduce the consumption of cleaning consumables, and ensure the cleaning effect and efficiency has become a problem to be improved by the present invention.
本新型目的在於提供一種能提高清潔效果與效率,減少清潔耗材與縮短清潔時間的半導體清洗裝置。 The purpose of the present invention is to provide a semiconductor cleaning device capable of improving cleaning efficiency and efficiency, reducing cleaning consumables, and shortening cleaning time.
為解決上述問題及達到本新型的目的,本新型裝置方面的第一種技術手段是這樣實現的,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述承載平台(100),其包括有一承載台(1)、以及一主要驅動裝置(2);所述承載台(1),其能供承載定位該半導體晶片(10)用;所述主要驅動裝置(2),其包括有一位於底端的主要縱向驅動裝置(21)、及一設於該主要縱向驅動裝置(21)與該承載台(1)間的主要橫向驅動裝置(22);所述主要縱向驅動裝置(21),能帶動該主要縱向驅動裝置(21),使其上的該承載台(1)在水平面(A)上做縱向移動;所述該主要橫向驅動裝置(22),能帶動該承載台(1)在水平面(A)上做橫向移動。 In order to solve the above problems and achieve the object of the present invention, the first technical means of the novel device is realized by a semiconductor cleaning device comprising a carrying platform (100) and a mounting platform (100). a top cleaning assembly (200) for carrying a semiconductor wafer (10) for high pressure rinsing and blow drying of the semiconductor wafer (10) The utility model is characterized in that: the carrying platform (100) comprises a carrying platform (1) and a main driving device (2); the carrying platform (1) can be used for carrying and positioning the semiconductor wafer (10); The main driving device (2) comprises a main longitudinal driving device (21) at the bottom end, and a main lateral driving device (22) disposed between the main longitudinal driving device (21) and the carrying platform (1) The main longitudinal driving device (21) is capable of driving the main longitudinal driving device (21) such that the loading platform (1) thereon is longitudinally moved on a horizontal plane (A); the main lateral driving device (22), can drive the carrying platform (1) to move laterally on the horizontal plane (A)
更優選的是,所述承載平台(100),其還包括有一次要驅動 裝置(3),其包括有設於該承載台(1)與該主要驅動裝置(2)間的一旋轉馬達(31)、及一支架(32),該旋轉馬達(31)能帶動該承載台(1)旋轉,該支架(32)為位於該旋轉馬達(31)外;所述支架(32),其還包括有以三腳架型態設置於該承載台(1)與該主要驅動裝置(2)間的三支可動伸縮單元(321),該可動伸縮單元(321)能配合帶動該承載台(1)以水平面(A)為基準,做至少一方向的面偏轉。 More preferably, the carrying platform (100) further includes a drive once The device (3) includes a rotating motor (31) disposed between the carrying platform (1) and the main driving device (2), and a bracket (32) capable of driving the bearing The table (1) rotates, the bracket (32) is located outside the rotating motor (31); the bracket (32) further includes a tripod type disposed on the carrying platform (1) and the main driving device ( 2) Three movable telescopic units (321), which can cooperate to drive the stage (1) to deflect at least one direction based on the horizontal plane (A).
更優選的是,所述清潔組件(200),其包括有驅動裝置(4)、一高壓噴頭組(5)、以及一取像裝置(6);所述驅動裝置(4),其能供承載帶動該高壓噴頭組(5)用;所述高壓噴頭組(5),其設置於該驅動裝置(4)上,能被該驅動裝置(4)帶動做至少一方向的立體移動,並能對該半導體晶片(10)進行高壓沖洗、吹氣乾燥其中之一的動作,且包括有至少一可調整角度的噴頭(51);所述取像裝置(6),其設於該承載平台(100)上方,能對該承載平台(100)上所承載的該半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,使該高壓噴頭組(5)能依據前述沖洗運行路徑進行沖洗。 More preferably, the cleaning assembly (200) includes a driving device (4), a high pressure head group (5), and an image capturing device (6); the driving device (4) is capable of Carrying the high-pressure nozzle group (5); the high-pressure nozzle group (5) is disposed on the driving device (4), can be driven by the driving device (4) to perform at least one direction of stereoscopic movement, and can Performing an action of one of high pressure rinsing and blowing drying on the semiconductor wafer (10), and including at least one adjustable angle nozzle (51); and the image capturing device (6) disposed on the carrying platform ( 100) above, the semiconductor wafer (10) carried on the carrying platform (100) can be imaged to calculate a flow path and then set a flushing operation path, so that the high pressure nozzle group (5) can be operated according to the flushing operation path. rinse.
更優選的是,所述驅動裝置(4),其還包括有一縱向驅動裝置(41)、一設於該縱向驅動裝置(41)底端的橫向驅動裝置(42)、及一設於該橫向驅動裝置(42)上的垂直驅動裝置(43),該垂直驅動裝置(43)能供承載帶動該高壓噴頭組(5)用。 More preferably, the driving device (4) further includes a longitudinal driving device (41), a lateral driving device (42) disposed at a bottom end of the longitudinal driving device (41), and a lateral driving device A vertical drive (43) on the device (42), the vertical drive (43) can be used to carry the high pressure spray head set (5).
本新型裝置方面的第二種技術手段是這樣實現的,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述清潔組件(200),其包括有驅動裝置(4)、一高壓噴頭組(5)、以及一取像裝置(6);所述驅動裝置(4),其能供承載帶動該高壓噴頭組(5)用;所述高壓 噴頭組(5),其設置於該驅動裝置(4)上,能被該驅動裝置(4)帶動做至少一方向的立體移動,並能對該半導體晶片(10)進行高壓沖洗、吹氣乾燥其中之一的動作,且包括有至少一可調整角度的噴頭(51);所述取像裝置(6),其設於該承載平台(100)上方,能對該承載平台(100)上所承載的該半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,使該高壓噴頭組(5)能依據前述沖洗運行路徑進行沖洗。 The second technical means of the novel device is implemented as a semiconductor cleaning device comprising a carrying platform (100) and a cleaning assembly (200) disposed at the top end of the carrying platform (100), the bearing The platform (100) can be used for carrying a semiconductor wafer (10), and the cleaning assembly (200) can be used for high-pressure rinsing and air-drying of the semiconductor wafer (10), characterized in that the cleaning component (200), The utility model comprises a driving device (4), a high-pressure nozzle group (5), and an image capturing device (6); the driving device (4) can be used for carrying the high-pressure nozzle group (5); high pressure a nozzle group (5) disposed on the driving device (4), capable of being driven by the driving device (4) to perform at least one direction of stereoscopic movement, and capable of performing high pressure washing and blowing drying on the semiconductor wafer (10) One of the actions, and includes at least one adjustable angle nozzle (51); the image capturing device (6) is disposed above the carrying platform (100) and can be mounted on the carrying platform (100) The semiconductor wafer (10) carried is imaged to calculate a flow path and then set a flushing operation path, so that the high pressure nozzle group (5) can be flushed according to the aforementioned flushing operation path.
更優選的是,所述驅動裝置(4),其還包括有一縱向驅動裝置(41)、一設於該縱向驅動裝置(41)底端的橫向驅動裝置(42)、及一設於該橫向驅動裝置(42)上的垂直驅動裝置(43),該垂直驅動裝置(43)能供承載帶動該高壓噴頭組(5)用。 More preferably, the driving device (4) further includes a longitudinal driving device (41), a lateral driving device (42) disposed at a bottom end of the longitudinal driving device (41), and a lateral driving device A vertical drive (43) on the device (42), the vertical drive (43) can be used to carry the high pressure spray head set (5).
更優選的是,所述承載平台(100),其包括有一承載台(1)、以及一主要驅動裝置(2);所述承載台(1),其能供承載定位該半導體晶片(10)用;所述主要驅動裝置(2),其包括有一位於底端的主要縱向驅動裝置(21)、及一設於該主要縱向驅動裝置(21)與該承載台(1)間的主要橫向驅動裝置(22);所述主要縱向驅動裝置(21),能帶動該主要縱向驅動裝置(21),使其上的該承載台(1)在水平面(A)上做縱向移動;所述該主要橫向驅動裝置(22),能帶動該承載台(1)在水平面(A)上做橫向移動。 More preferably, the carrying platform (100) includes a carrying platform (1) and a main driving device (2); the carrying platform (1) is capable of carrying and positioning the semiconductor wafer (10) The main driving device (2) includes a main longitudinal driving device (21) at the bottom end, and a main lateral driving device disposed between the main longitudinal driving device (21) and the carrying platform (1) (22); the main longitudinal driving device (21) capable of driving the main longitudinal driving device (21) such that the loading platform (1) thereon is longitudinally moved on a horizontal plane (A); The driving device (22) can drive the carrying platform (1) to move laterally on the horizontal plane (A).
更優選的是,所述承載平台(100),其還包括有一次要驅動裝置(3),其包括有設於該承載台(1)與該主要驅動裝置(2)間的一旋轉馬達(31)、及一支架(32),該旋轉馬達(31)能帶動該承載台(1)旋轉,該支架(32)為位於該旋轉馬達(31)外;所述支架(32),其還包括有以三腳架型態設置於該承載台(1)與該主要驅動裝置(2)間的三支可動伸縮單元(321),該可動伸縮單元(321)能配合帶動該承載台(1)以水平面(A)為基準,做至少一方向的面偏轉。 More preferably, the carrying platform (100) further includes a primary driving device (3) including a rotating motor disposed between the loading platform (1) and the main driving device (2) 31), and a bracket (32), the rotating motor (31) can drive the loading platform (1) to rotate, the bracket (32) is located outside the rotating motor (31); the bracket (32), which is further The utility model comprises three movable telescopic units (321) arranged on the tripod type between the carrying platform (1) and the main driving device (2), and the movable telescopic unit (321) can cooperate to drive the loading platform (1) The horizontal plane (A) is the reference, and the surface deflection of at least one direction is performed.
本新型裝置方面的第三種技術手段是這樣實現的,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述承載平台(100),其包括有一承載台(1)、以及一主要驅動裝置(2);所述承載台(1),其能供承載定位該半導體晶片(10)用;所述主要驅動裝置(2),其包括有一位於底端的主要縱向驅動裝置(21)、及一設於該主要縱向驅動裝置(21)與該承載台(1)間的主要橫向驅動裝置(22);所述主要縱向驅動裝置(21),能帶動該主要縱向驅動裝置(21),使其上的該承載台(1)在水平面(A)上做縱向移動;所述該主要橫向驅動裝置(22),能帶動該承載台(1)在水平面(A)上做橫向移動;所述清潔組件(200),其包括有驅動裝置(4)、一高壓噴頭組(5)、以及一取像裝置(6);所述驅動裝置(4),其能供承載帶動該高壓噴頭組(5)用;所述高壓噴頭組(5),其設置於該驅動裝置(4)上,能被該驅動裝置(4)帶動做至少一方向的立體移動,並能對該半導體晶片(10)進行高壓沖洗、吹氣乾燥其中之一的動作,且包括有至少一可調整角度的噴頭(51);所述取像裝置(6),其設於該承載平台(100)上方,能對該承載平台(100)上所承載的該半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,使該高壓噴頭組(5)能依據前述沖洗運行路徑進行沖洗。 A third technical means for the novel device is realized as a semiconductor cleaning device comprising a carrying platform (100) and a cleaning assembly (200) disposed at the top end of the carrying platform (100), the bearing The platform (100) can be used for carrying a semiconductor wafer (10), and the cleaning assembly (200) can be used for high-pressure rinsing and air-drying of the semiconductor wafer (10), characterized in that: the carrying platform (100), The utility model comprises a carrying platform (1) and a main driving device (2); the carrying platform (1) is capable of carrying and positioning the semiconductor wafer (10); the main driving device (2) comprises There is a main longitudinal driving device (21) at the bottom end, and a main lateral driving device (22) disposed between the main longitudinal driving device (21) and the carrying platform (1); the main longitudinal driving device (21) The main longitudinal driving device (21) can be driven to longitudinally move the loading platform (1) on the horizontal plane (A); the main lateral driving device (22) can drive the loading platform (1) Moving laterally on the horizontal plane (A); the cleaning assembly (200) comprising a drive (4) a high pressure nozzle group (5), and an image capturing device (6); the driving device (4) capable of carrying the high pressure nozzle group (5) for carrying; the high pressure nozzle group (5) And being disposed on the driving device (4), capable of being driven by the driving device (4) to perform at least one direction of stereoscopic movement, and capable of performing high pressure washing and blowing drying on the semiconductor wafer (10). Acting, and including at least one adjustable angle nozzle (51); the image capturing device (6) disposed above the carrying platform (100), capable of carrying the semiconductor on the carrying platform (100) The wafer (10) is imaged to calculate a flow path and then set a flushing operation path so that the high pressure head group (5) can be flushed according to the aforementioned flushing operation path.
更優選的是,所述承載平台(100),其還包括有一次要驅動裝置(3),其包括有設於該承載台(1)與該主要驅動裝置(2)間的一旋轉馬達(31)、及一支架(32),該旋轉馬達(31)能帶動該承載台(1)旋轉,該支架(32)為位於該旋轉馬達(31)外;所述支架(32),其還包括有以三腳架型態設置於該承載台(1)與該主要驅動裝置(2)間的三支可動伸縮單元(321),該可動伸縮單元(321)能配合帶動該承載台(1)以水平面(A)為基準,做至少一方向的面偏 轉。 More preferably, the carrying platform (100) further includes a primary driving device (3) including a rotating motor disposed between the loading platform (1) and the main driving device (2) 31), and a bracket (32), the rotating motor (31) can drive the loading platform (1) to rotate, the bracket (32) is located outside the rotating motor (31); the bracket (32), which is further The utility model comprises three movable telescopic units (321) arranged on the tripod type between the carrying platform (1) and the main driving device (2), and the movable telescopic unit (321) can cooperate to drive the loading platform (1) The horizontal plane (A) is the reference, and the surface deviation of at least one direction is made. turn.
更優選的是,所述驅動裝置(4),其還包括有一縱向驅動裝置(41)、一設於該縱向驅動裝置(41)底端的橫向驅動裝置(42)、及一設於該橫向驅動裝置(42)上的垂直驅動裝置(43),該垂直驅動裝置(43)能供承載帶動該高壓噴頭組(5)用。 More preferably, the driving device (4) further includes a longitudinal driving device (41), a lateral driving device (42) disposed at a bottom end of the longitudinal driving device (41), and a lateral driving device A vertical drive (43) on the device (42), the vertical drive (43) can be used to carry the high pressure spray head set (5).
與現有技術相比,本新型的效果如下所示:綜上所述,根據本新型半導體清潔裝置方面,為利用承載平台(100)及清潔組件(200)的配合,有別於傳統半導體清潔裝置,能確保清潔效果與效率,同時減少清潔耗材消耗,並縮短清潔時間,有別於傳統半導體清潔裝置,移動式的高壓沖洗,能配合各種半導體製程,讓半導體晶片(10)能確實地被清潔,但又不會浪費耗材,並縮短工時。 Compared with the prior art, the effects of the present invention are as follows: In summary, according to the novel semiconductor cleaning device, in order to utilize the cooperation of the carrying platform (100) and the cleaning assembly (200), it is different from the conventional semiconductor cleaning device. It can ensure the cleaning effect and efficiency, reduce the consumption of cleaning consumables, and shorten the cleaning time. It is different from the traditional semiconductor cleaning device, mobile high-pressure flushing, can cooperate with various semiconductor processes, so that the semiconductor wafer (10) can be reliably cleaned. But it will not waste consumables and shorten working hours.
1‧‧‧承載台 1‧‧‧bearing station
2‧‧‧主要驅動裝置 2‧‧‧Main drive unit
21‧‧‧主要縱向驅動裝置 21‧‧‧Main longitudinal drive
22‧‧‧主要橫向驅動裝置 22‧‧‧Main transverse drive
3‧‧‧次要驅動裝置 3‧‧‧Secondary drive
31‧‧‧旋轉馬達 31‧‧‧Rotary motor
32‧‧‧支架 32‧‧‧ bracket
321‧‧‧可動伸縮單元 321‧‧‧ movable telescopic unit
4‧‧‧驅動裝置 4‧‧‧ drive
41‧‧‧縱向驅動裝置 41‧‧‧Longitudinal drive
42‧‧‧橫向驅動裝置 42‧‧‧Transverse drive
43‧‧‧垂直驅動裝置 43‧‧‧Vertical drive
5‧‧‧高壓噴頭組 5‧‧‧High pressure nozzle group
51‧‧‧噴頭 51‧‧‧ sprinkler
6‧‧‧取像裝置 6‧‧‧Image capture device
10‧‧‧半導體晶片 10‧‧‧Semiconductor wafer
100‧‧‧承載平台 100‧‧‧Loading platform
200‧‧‧清潔組件 200‧‧‧ cleaning components
A‧‧‧水平面 A‧‧‧ water level
第1圖:本新型的立體示意圖。 Figure 1: A perspective view of the novel.
第2圖:本新型的分解示意圖。 Figure 2: An exploded view of the novel.
第3圖:為第2圖中清潔組件的分解示意圖。 Figure 3: is an exploded view of the cleaning assembly in Figure 2.
第4圖:為第2圖中承載台和次要驅動裝置的分解示意圖。 Fig. 4 is an exploded perspective view of the carrier and the secondary driving device in Fig. 2.
第5圖:為第2圖中主要驅動裝置的分解示意圖。 Fig. 5 is an exploded perspective view of the main driving device in Fig. 2.
第6圖:本新型中主要驅動裝置作動時的立體實施示意圖。 Fig. 6 is a perspective view showing the three-dimensional implementation of the main driving device in the present invention.
第7圖:本新型中主要驅動裝置往另一方向作動時的立體實施示意圖。 Fig. 7 is a perspective view showing the three-dimensional implementation of the main driving device in the other direction.
第8圖:本新型中次要驅動裝置作動時的立體實施示意圖。 Fig. 8 is a perspective view showing the three-dimensional implementation of the driving device of the present invention.
第9圖:本新型中清潔組件縱向作動時的立體實施示意圖。 Fig. 9 is a perspective view showing the three-dimensional implementation of the cleaning assembly in the longitudinal direction of the present invention.
第10圖:本新型中清潔組件橫向作動時的立體實施示意圖。 Fig. 10 is a perspective view showing the three-dimensional implementation of the cleaning assembly in the lateral movement of the present invention.
第11圖:本新型中清潔組件垂直作動與調整噴頭時的立體實施示意圖。 Figure 11: Schematic diagram of the three-dimensional implementation of the cleaning assembly in the vertical movement and adjustment of the nozzle.
以下依據圖面所示的實施例詳細說明如後:請參閱第1圖至第11圖,關於清潔裝置方面,本新型的第一技術方案,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述承載平台(100),其包括有一承載台(1)、以及一主要驅動裝置(2);所述承載台(1),其能供承載定位該半導體晶片(10)用;所述主要驅動裝置(2),其包括有一位於底端的主要縱向驅動裝置(21)、及一設於該主要縱向驅動裝置(21)與該承載台(1)間的主要橫向驅動裝置(22);所述主要縱向驅動裝置(21),能帶動該主要縱向驅動裝置(21),使其上的該承載台(1)在水平面(A)上做縱向移動;所述該主要橫向驅動裝置(22),能帶動該承載台(1)在水平面(A)上做橫向移動。 The following is a detailed description of the embodiment shown in the drawings. Referring to FIG. 1 to FIG. 11 , with respect to the cleaning device, the first technical solution of the present invention is a semiconductor cleaning device including a carrying platform (100). And a cleaning assembly (200) disposed on a top end of the carrying platform (100), the carrying platform (100) being capable of carrying a semiconductor wafer (10), the cleaning assembly (200) being capable of being used for the semiconductor wafer (10) Carrying out high pressure washing and blowing drying, characterized in that: the carrying platform (100) comprises a carrying platform (1), and a main driving device (2); the carrying platform (1), which can For carrying and positioning the semiconductor wafer (10); the main driving device (2) comprises a main longitudinal driving device (21) at the bottom end, and a main longitudinal driving device (21) and the carrying table (1) a main lateral drive unit (22); the main longitudinal drive unit (21) capable of driving the main longitudinal drive unit (21) such that the stage (1) on the horizontal plane (A) Performing a longitudinal movement; the main lateral drive device (22) can drive the carrier (1) at Make lateral movement on a plane (A).
其中,通過此種承載平台(100)的應用,利用承載台(1)來承載定位半導體晶片(10),利用主要驅動裝置(2)來帶動承載台(1),通過主要縱向驅動裝置(21)與主要橫向驅動裝置(22)的應用,能帶動承載台(1)及次要驅動裝置(3)作縱向與橫向運動,讓清潔動作能多元化,以配合不同的清潔需要,避免應用範圍受到限制,能使承載台(1)上的半導體晶片(10),被清潔組件(200)順利地高壓沖洗和吹氣乾燥,半導體晶片(10)能順利地被完整吹氣乾燥。 Through the application of the carrying platform (100), the carrying platform (1) is used to carry the positioning semiconductor wafer (10), and the main driving device (2) is used to drive the carrying platform (1) through the main longitudinal driving device (21). ) and the application of the main lateral driving device (22), can drive the carrying platform (1) and the secondary driving device (3) for longitudinal and lateral movement, so that the cleaning action can be diversified to meet different cleaning needs and avoid the application range. Restricted, the semiconductor wafer (10) on the carrying table (1) can be smoothly washed by high pressure and blown by the cleaning assembly (200), and the semiconductor wafer (10) can be smoothly blown dry.
其次,本新型半導體清潔裝置,與傳統半導體清潔裝置不同,應用上無問題,能在確保清潔效果與效率的同時,減少清潔耗材消耗,並且縮短清潔時間,維修時無須整台停機,對生產效率影響非常小。 Secondly, the novel semiconductor cleaning device is different from the conventional semiconductor cleaning device in that it has no problem in application, can reduce the cleaning consumable consumption while ensuring the cleaning effect and efficiency, and shortens the cleaning time, and does not require a whole shutdown during maintenance, and the production efficiency The impact is very small.
請參閱第1圖至第11圖,關於清潔裝置方面,本新型的第二 技術方案,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述清潔組件(200),其包括有驅動裝置(4)、一高壓噴頭組(5)、以及一取像裝置(6);所述驅動裝置(4),其能供承載帶動該高壓噴頭組(5)用;所述高壓噴頭組(5),其設置於該驅動裝置(4)上,能被該驅動裝置(4)帶動做至少一方向的立體移動,並能對該半導體晶片(10)進行高壓沖洗、吹氣乾燥其中之一的動作,且包括有至少一可調整角度的噴頭(51);所述取像裝置(6),其設於該承載平台(100)上方,能對該承載平台(100)上所承載的該半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,使該高壓噴頭組(5)能依據前述沖洗運行路徑進行沖洗。 Please refer to Figures 1 to 11, for the second aspect of the cleaning device. The technical solution is a semiconductor cleaning device comprising a carrying platform (100) and a cleaning assembly (200) disposed at a top end of the carrying platform (100), the carrying platform (100) capable of carrying a semiconductor wafer (10) The cleaning assembly (200) can be used for high pressure rinsing and air drying of the semiconductor wafer (10), characterized in that the cleaning assembly (200) comprises a driving device (4) and a high pressure nozzle. a group (5), and an image capturing device (6); the driving device (4) capable of carrying the high pressure head group (5) for carrying; the high pressure head group (5) disposed on the driving The device (4) can be driven by the driving device (4) to perform at least one direction of stereoscopic movement, and can perform high-pressure flushing and air-drying of the semiconductor wafer (10), and includes at least one An angle-adjustable nozzle (51); the image capturing device (6) is disposed above the carrying platform (100), and can capture the semiconductor wafer (10) carried on the carrying platform (100), After the flow path is calculated, the flushing operation path is set, so that the high pressure nozzle group (5) can enter according to the aforementioned flushing operation path. Rinse.
其中,通過此種清潔組件(200)的應用,利用驅動裝置(4)來帶動高壓噴頭組(5)移動,以完整清潔半導體晶片(10),利用高壓噴頭組(5),對半導體晶片(10)進行高壓沖洗與噴氣乾燥,利用取像裝置(6)對承載平台(100)上所承載的半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,以依據沖洗運行路徑進行沖洗,確保每次的清潔都正常運作,相對於傳統半導體清潔裝置,能配合現在的應用需求,清潔效率更高。 Wherein, through the application of the cleaning assembly (200), the driving device (4) is used to drive the high-pressure nozzle group (5) to move to completely clean the semiconductor wafer (10), and the high-voltage nozzle group (5) is used to 10) performing high pressure rinsing and air jet drying, taking image of the semiconductor wafer (10) carried on the carrying platform (100) by using the image capturing device (6), and calculating a flow path to set a flushing operation path according to the rinsing operation path. Rinse to ensure that every cleaning is working properly, compared to traditional semiconductor cleaning devices, can meet the needs of today's applications, cleaning efficiency is higher.
請參閱第1圖至第11圖,關於清潔裝置方面,本新型的第三技術方案,為一種半導體清潔裝置,其包括有一承載平台(100)、及一設於該承載平台(100)頂端的清潔組件(200),該承載平台(100)能供承載半導體晶片(10)用,該清潔組件(200)能供對該半導體晶片(10)進行高壓沖洗和吹氣乾燥用,其特徵在於:所述承載平台(100),其包括有一承載台(1)、以及一主要驅動裝置(2);所述承載台(1),其能供承載定位該半導體晶片(10)用;所述主要驅動裝置(2),其包括有一位於底端的主要縱向驅動裝置(21)、及一設 於該主要縱向驅動裝置(21)與該承載台(1)間的主要橫向驅動裝置(22);所述主要縱向驅動裝置(21),能帶動該主要縱向驅動裝置(21),使其上的該承載台(1)在水平面(A)上做縱向移動;所述該主要橫向驅動裝置(22),能帶動該承載台(1)在水平面(A)上做橫向移動;所述清潔組件(200),其包括有驅動裝置(4)、一高壓噴頭組(5)、以及一取像裝置(6);所述驅動裝置(4),其能供承載帶動該高壓噴頭組(5)用;所述高壓噴頭組(5),其設置於該驅動裝置(4)上,能被該驅動裝置(4)帶動做至少一方向的立體移動,並能對該半導體晶片(10)進行高壓沖洗、吹氣乾燥其中之一的動作,且包括有至少一可調整角度的噴頭(51);所述取像裝置(6),其設於該承載平台(100)上方,能對該承載平台(100)上所承載的該半導體晶片(10)取像,以計算流道後設定出沖洗運行路徑,使該高壓噴頭組(5)能依據前述沖洗運行路徑進行沖洗。 Referring to FIGS. 1 to 11 , a third aspect of the present invention relates to a semiconductor cleaning device including a carrier platform (100) and a top portion of the carrier platform (100). A cleaning assembly (200) for carrying a semiconductor wafer (10) for performing high pressure rinsing and blow drying of the semiconductor wafer (10), characterized in that: The carrying platform (100) includes a carrying platform (1) and a main driving device (2); the carrying platform (1) can be used for carrying and positioning the semiconductor wafer (10); a driving device (2) comprising a main longitudinal driving device (21) at the bottom end, and a device a main lateral driving device (22) between the main longitudinal driving device (21) and the carrying platform (1); the main longitudinal driving device (21) capable of driving the main longitudinal driving device (21) The loading platform (1) is longitudinally moved on a horizontal plane (A); the main lateral driving device (22) can drive the loading platform (1) to move laterally on the horizontal plane (A); the cleaning assembly (200), comprising a driving device (4), a high pressure nozzle group (5), and an image capturing device (6); the driving device (4) capable of carrying the high pressure nozzle group (5) The high-pressure nozzle group (5) is disposed on the driving device (4), can be driven by the driving device (4) to perform at least one direction of stereoscopic movement, and can perform high voltage on the semiconductor wafer (10) Flushing, blowing and drying one of the actions, and including at least one adjustable angle nozzle (51); the image capturing device (6) is disposed above the carrying platform (100), the loading platform can be The semiconductor wafer (10) carried on (100) is imaged, and the flushing operation path is set after calculating the flow channel, so that the high pressure nozzle group (5) can be based on the front Rinse rinse running path.
其中,將本新型的第一和第二技術方案整合,成為本新型的第三技術方案,將第一技術方案中的承載平台(100),與第二技術方案中的清潔組件(200)做更為有效的結合,讓本新型半導體清潔裝置,能配合應用的範圍更加廣泛,能配合實施不同的清潔方法,增加整體的應用性。 The first and second technical solutions of the present invention are integrated into the third technical solution of the present invention, and the carrying platform (100) in the first technical solution and the cleaning component (200) in the second technical solution are The more effective combination allows the new semiconductor cleaning device to be used in a wider range of applications, and can be used in conjunction with different cleaning methods to increase overall application.
請參閱第5圖至第7圖,所述承載平台(100),其還包括有一次要驅動裝置(3),其包括有設於該承載台(1)與該主要驅動裝置(2)間的一旋轉馬達(31)、及一支架(32),該旋轉馬達(31)能帶動該承載台(1)旋轉,該支架(32)為位於該旋轉馬達(31)外;所述支架(32),其還包括有以三腳架型態設置於該承載台(1)與該主要驅動裝置(2)間的三支可動伸縮單元(321),該可動伸縮單元(321)能配合帶動該承載台(1)以水平面(A)為基準,做至少一方向的面偏轉。 Referring to FIG. 5 to FIG. 7 , the carrying platform (100) further includes a primary driving device (3), which is disposed between the loading platform (1) and the main driving device (2). a rotating motor (31), and a bracket (32), the rotating motor (31) can drive the loading platform (1) to rotate, the bracket (32) is located outside the rotating motor (31); 32), further comprising three movable telescopic units (321) disposed on the tripod type between the carrying platform (1) and the main driving device (2), the movable telescopic unit (321) can cooperate to drive the bearing The stage (1) is deflected in at least one direction based on the horizontal plane (A).
其中,通過次要驅動裝置(3)的旋轉馬達(31)與支架(32)應用,讓承載台(1)能夠旋轉,以更有效地乾燥,避免發生乾燥不佳的問題。 Among them, the application of the rotating motor (31) of the secondary driving device (3) and the bracket (32) allows the carrying table (1) to be rotated to more effectively dry, avoiding the problem of poor drying.
其次,通過三腳架型態設的可動伸縮單元(321)應用,除了能提供穩定的支撐之外,還能便於控制承載台(1)的面偏轉,讓操作上能配合各種應用需要,不用擔心會有無法應用的問題發生。 Secondly, the application of the movable telescopic unit (321) provided by the tripod type can not only provide stable support, but also facilitate the control of the surface deflection of the carrying platform (1), so that the operation can meet various application needs, and there is no need to worry about There are problems that cannot be applied.
請參閱第3圖、第9圖至第11圖,所述驅動裝置(4),其還包括有一縱向驅動裝置(41)、一設於該縱向驅動裝置(41)底端的橫向驅動裝置(42)、及一設於該橫向驅動裝置(42)上的垂直驅動裝置(43),該垂直驅動裝置(43)能供承載帶動該高壓噴頭組(5)用。 Referring to FIG. 3, FIG. 9 to FIG. 11, the driving device (4) further includes a longitudinal driving device (41) and a lateral driving device (42) disposed at a bottom end of the longitudinal driving device (41). And a vertical driving device (43) disposed on the lateral driving device (42), the vertical driving device (43) being capable of carrying the high pressure nozzle group (5).
其中,通過縱向驅動裝置(41)的應用,能帶動高壓噴頭組(5)作縱向移動,而橫向驅動裝置(42)的應用,能帶動高壓噴頭組(5)作橫向移動,且垂直驅動裝置(43)的應用,能帶動高壓噴頭組(5)垂直移動,以調整對半導體晶片(10)進行清潔時的壓力,如此一來,便能快速且自由地調整高壓噴頭組(5)的位置,能實現清潔過程全程高壓沖洗,及更清晰與準確的取像。 Wherein, the application of the longitudinal driving device (41) can drive the high-pressure nozzle group (5) for longitudinal movement, and the application of the lateral driving device (42) can drive the high-pressure nozzle group (5) for lateral movement, and the vertical driving device The application of (43) can drive the high-pressure nozzle group (5) to move vertically to adjust the pressure when cleaning the semiconductor wafer (10), so that the position of the high-pressure nozzle group (5) can be quickly and freely adjusted. It can realize high-pressure washing in the whole process of cleaning, and clearer and more accurate image taking.
以上依據圖式所示的實施例詳細說明本新型的構造、特徵及作用效果;惟以上所述僅為本新型之較佳實施例,但本新型不以圖面所示限定實施範圍,因此舉凡與本新型意旨相符的修飾性變化,只要在均等效果的範圍內都應涵屬於本新型專利範圍內。 The structure, features and effects of the present invention are described in detail above with reference to the embodiments shown in the drawings. However, the above description is only a preferred embodiment of the present invention, but the present invention does not limit the scope of implementation as shown in the drawings. Modification changes consistent with the meaning of the present invention are intended to fall within the scope of the present invention as long as they are within the scope of equal effect.
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