TWM574234U - Optical flaw detection system and its material placement system - Google Patents

Optical flaw detection system and its material placement system Download PDF

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Publication number
TWM574234U
TWM574234U TW107214538U TW107214538U TWM574234U TW M574234 U TWM574234 U TW M574234U TW 107214538 U TW107214538 U TW 107214538U TW 107214538 U TW107214538 U TW 107214538U TW M574234 U TWM574234 U TW M574234U
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zone
area
detection
detected
waiting
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TW107214538U
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陳文生
李彥志
杞美瑜
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聯策科技股份有限公司
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Publication of TWM574234U publication Critical patent/TWM574234U/en

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Abstract

本創作提供一種光學式瑕疵檢測系統,包含:至少一平台,用以承載複數個待檢測物;一上料擺放系統,將複數個待檢測物一次性擺放至該平台;一影像拍攝系統,依序拍攝該等待檢測物之複數個檢測影像;一處理單元,接收該等檢測影像,以檢測出該等待檢測物之檢測結果;以及一下料擺放系統,從該平台一次性拾起該等待檢測物,以擺放至一下料區;其特徵在於:該下料區包含複數個區域,該等區域之相鄰排列包含該等待檢測物之所有檢測結果的組合,該處理單元根據該等待檢測物之檢測結果,以控制該下料擺放系統將拾起的該等待檢測物移動對應至複數個目標區域,而該等目標區域之相鄰排列相應於該等待檢測物之檢測結果,俾使該下料擺放系統將該等待檢測物一次性擺放至該等目標區域。 The present invention provides an optical detection system comprising: at least one platform for carrying a plurality of objects to be detected; and a loading and placing system for placing a plurality of objects to be detected on the platform at a time; an image capturing system And sequentially capturing the plurality of detection images of the waiting detection object; a processing unit receiving the detection images to detect the detection result of the waiting detection object; and a sampling placement system, picking up the device from the platform at a time Waiting for the detection object to be placed in the sampling area; characterized in that the blanking area comprises a plurality of regions, and the adjacent arrangement of the regions comprises a combination of all the detection results of the waiting for detection, the processing unit according to the waiting The detection result of the detection object is controlled to control the feeding placement system to move the picked up waiting object to the plurality of target areas, and the adjacent arrangement of the target areas corresponds to the detection result of the waiting detection object, The blank placement system causes the waiting for detection to be placed in the target area at one time.

Description

光學式瑕疵檢測系統及其下料擺放系統 Optical flaw detection system and its blank placement system

本創作係關於一種光學式瑕疵檢測系統,更明確地說明,本創作是一種包含一下料擺放系統之光學式瑕疵檢測系統,該下料擺放系統依複數個待檢測物之疵檢檢測結果,可從檢測平台一次性拾起該等待檢測物且分類地將該等待檢測物一次性擺放至一下料區。 This creation is about an optical detection system. It is more clearly stated that this creation is an optical detection system including a sampling system. The blank placement system is based on the inspection results of a plurality of objects to be detected. The waiting test object can be picked up from the detection platform at a time and the waiting test object can be placed in a sorted manner to the sampling area at one time.

首先參考第一圖及第二圖,係分別顯示習知光學式瑕疵檢測系統之系統架構圖與系統方塊圖。習知光學式瑕疵檢測系統包含一影像拍攝系統10,分別從平台L2、平台R3所承載的待檢測物L5與待檢測物R6拍攝檢測影像,其中該平台L2、平台R3可分別被平台驅動機構4驅動在一往復方向上運動。該影像拍攝系統10包括:一具有鏡頭12之相機11,該相機11定義一光路藉以拍攝待檢測物L5與待檢測物R6。該待檢測物1以電路板為例,在其上可分布複數個零件或其佈線。此外,該影像拍攝系統10配置各種輔助光源與光學零件,用以讓待檢測物L5與待檢測物R6的瑕疵與缺陷可以顯現於檢測影像。這些輔助光源與光學零件包含:一偏光鏡13,配置於該相機11的光路以濾掉雜散光源;一分光鏡14,配置於該相機1的光路;一正光 源15,搭配該分光鏡14以提供該待檢測物的正光源供相機11拍攝取像;以及,一左側光源17與一右側光源16,從旁提供待檢測物的拍攝輔助光。 Referring first to the first and second figures, a system architecture diagram and a system block diagram of a conventional optical detection system are respectively shown. The conventional optical sputum detection system includes an image capturing system 10, which respectively detects a detected image from the object to be detected L5 and the object to be detected R6 carried by the platform L2 and the platform R3, wherein the platform L2 and the platform R3 are respectively driven by the platform driving mechanism. The 4 drive moves in a reciprocating direction. The image capturing system 10 includes a camera 11 having a lens 12 that defines an optical path for capturing an object to be detected L5 and an object to be detected R6. The object to be detected 1 is exemplified by a circuit board on which a plurality of parts or wirings thereof can be distributed. In addition, the image capturing system 10 is configured with various auxiliary light sources and optical components for allowing defects and defects of the object to be detected L5 and the object to be detected R6 to appear on the detected image. The auxiliary light source and the optical component include: a polarizer 13 disposed on the optical path of the camera 11 to filter out the stray light source; a beam splitter 14 disposed on the optical path of the camera 1; The source 15 is provided with the spectroscope 14 to provide the positive light source of the object to be detected for the camera 11 to take a picture; and a left side light source 17 and a right side light source 16 provide the auxiliary light for detecting the object to be detected from the side.

此外,習知光學式瑕疵檢測系統進一步包含一相機驅動機構18,該相機驅動機構18驅動該影像拍攝系統10在垂直該等平台2、3的往復方向上來回移動,使該影像拍攝系統10的該相機11分別對準待檢測物L5與待檢測物R6,以拍攝檢測影像。 In addition, the conventional optical detection system further includes a camera driving mechanism 18 that drives the image capturing system 10 to move back and forth in the reciprocating direction of the platforms 2, 3 vertically, so that the image capturing system 10 The camera 11 is respectively aligned with the object to be detected L5 and the object to be detected R6 to capture a detected image.

請同時參考第三A圖及第三B圖,係分別顯示習知光學式瑕疵檢測系統包含上料擺放系統與下料擺放系統之俯視圖及示意圖。知光學式瑕疵檢測系統進一步包含一上料擺放系統30,配置一上料手臂L31與一上料手臂R32;以及,一下料擺放系統40,配置一下料手臂L41與一下料手臂R42。上料擺放系統30的該上料手臂L31與上料手臂R32可從上料區50中一次性拾起待檢測物L5、待檢測物R6,並將該上料手臂L31與上料手臂R32移動至該平台L2、平台R3的上方後,再一次性擺放待檢測物L5、待檢測物R6至該平台L2、平台R3上。 Please refer to the third A map and the third B map at the same time, which respectively show a top view and a schematic diagram of the conventional optical pick-up detection system including the loading placement system and the blank placement system. The optical sputum detection system further includes a loading and unloading system 30, a loading arm L31 and a loading arm R32, and a blanking system 40 for arranging the lower arm L41 and the lower arm R42. The loading arm L31 and the loading arm R32 of the loading and unloading system 30 can pick up the object to be detected L5 and the object to be detected R6 from the loading area 50 at a time, and the feeding arm L31 and the feeding arm R32. After moving to the top of the platform L2 and the platform R3, the object to be detected L5 and the object to be detected R6 are placed on the platform L2 and the platform R3 at a time.

繼續參考第三A圖及第三B圖,當該相機驅動機構18驅動該影像拍攝系統10的該相機對準待檢測物L5後,平台驅動機構(圖未示)驅動該平台L2在往復方向上移動。直到該平台L2移至虛線位置時,該相機即完成拍攝待檢測物L5的檢測影像;當該平台L2移回原來位置時,該相機驅動機構18將驅動該影像拍攝系統10的該相機對準待檢測物R6。當該相機驅動機構18驅動該影像拍攝系統10的該相機對準待檢測物R6後,平台驅動機構驅動該平台R3在往復方向上移動。直到該平台R3移至虛線位置時,該相機即完成拍攝待檢測物R6的檢測影像。 With continued reference to the third A and third B, after the camera driving mechanism 18 drives the camera of the image capturing system 10 to be aligned with the object to be detected L5, the platform driving mechanism (not shown) drives the platform L2 in the reciprocating direction. Move on. Until the platform L2 moves to the dotted line position, the camera completes the detection image of the object L5 to be detected; when the platform L2 moves back to the original position, the camera driving mechanism 18 aligns the camera that drives the image capturing system 10 The analyte R6 is to be detected. When the camera driving mechanism 18 drives the camera of the image capturing system 10 to be aligned with the object to be detected R6, the platform driving mechanism drives the platform R3 to move in the reciprocating direction. Until the platform R3 moves to the dotted line position, the camera completes the detection image of the object to be detected R6.

繼續參考第三A圖及第三B圖,影像拍攝系統10拍攝的該等檢測影像將用以判斷待檢測物L5、待檢測物R6為OK件或NG件,其中,OK件表示該待檢測物無瑕疵,NG件表示該待檢測物存在瑕疵。雖然習知光學式瑕疵檢測系統科一次量測多個待檢測物,但從平台上將待檢測物L5、待檢測物R6移至一下料區60之後,還是要依照檢測影像的檢測結果去分類出OK件與NG件。 With reference to the third A and third B images, the detected images captured by the image capturing system 10 are used to determine that the object to be detected L5 and the object to be detected R6 are OK or NG, wherein the OK indicates that the image is to be detected. The object is flawless, and the NG member indicates the presence of defects in the object to be detected. Although the conventional optical sputum detection system is capable of measuring a plurality of objects to be detected at one time, after moving the object to be detected L5 and the object to be detected R6 from the platform to the lower region 60, it is still classified according to the detection result of the detected image. OK and NG pieces.

在一種習知下料擺放系統40中,該下料手臂L41與下料手臂R42可從該平台L2、平台R3上一次性拾起待檢測物L5、待檢測物R6,並將該下料手臂L41與下料手臂R42移動至該下料區60的上方後,再一次性擺放待檢測物L5、待檢測物R6至該下料區60上。此一習知下料擺放方式,在下料區60中未分類出OK件與NG件,使得後續操作人員必須根據電腦紀錄下料區60中OK件與NG件的位置,再靠人力去區分,雖然一次性下料可以省到整體的下料擺放時間,但是之後需要人力去做分料動作,將很沒有效率。 In a conventional blank placement system 40, the blanking arm L41 and the lowering arm R42 can pick up the object to be detected L5 and the object to be detected R6 from the platform L2 and the platform R3 at a time, and the blanking is performed. After the arm L41 and the blanking arm R42 are moved to the upper portion of the blanking zone 60, the object to be detected L5 and the object to be detected R6 are placed on the blanking zone 60 at a time. According to the conventional method of placing the material, the OK part and the NG part are not classified in the blanking area 60, so that the follow-up operator must distinguish the position of the OK part and the NG part in the loading area 60 according to the computer, and then rely on the manpower to distinguish Although the one-time cutting can save the overall unloading time, it will be inefficient to use manpower to do the feeding action.

在另一種習知下料擺放系統40中,該下料手臂L41與下料手臂R42可分別獨立執行擺放動作,並在該下料區60中區分用以擺放OK件的OK區與用以擺放NG件的NG區。因此,該下料手臂L41與下料手臂R42可從該平台L2、平台R3上一次性拾起待檢測物L5、待檢測物R6,並將該下料手臂L41與下料手臂R42移動至該下料區60的上方後,將依檢測結果執行複雜且多次的擺放動作。以下請參考第四圖至第五圖,分別顯示習知下料手臂(L、R)依不同的檢測結果所執行的擺放動作。 In another conventional blank placement system 40, the blanking arm L41 and the lowering arm R42 can independently perform the placing action, and distinguish the OK zone for placing the OK component in the blanking zone 60. Used to place the NG area of the NG part. Therefore, the blanking arm L41 and the lowering arm R42 can pick up the object to be detected L5 and the object to be detected R6 from the platform L2 and the platform R3 at one time, and move the blanking arm L41 and the blanking arm R42 to the After the upper portion of the blanking area 60, a complicated and multiple placement operation will be performed according to the detection result. Please refer to the fourth to fifth figures below to show the placement actions performed by the conventional cutting arm (L, R) according to different test results.

請參考第四圖(a)至(b),顯示習知下料手臂(L、R)將依檢測結果(OK件、NG件)擺放至習知下料區60(OK區、NG區)的示意圖。當下料 手臂(L、R)所拾起的待檢測物(L、R)的檢測結果為(OK件、NG件),則下料手臂(L、R)在下料區60上方分別對準正確的分類區,下料手臂(L、R)可同時執行下料擺放動作,將(OK件、NG件)擺放至下料區60(OK區、NG區)中。 Please refer to the fourth figure (a) to (b), showing that the conventional unloading arm (L, R) will be placed according to the test result (OK piece, NG piece) to the conventional unloading area 60 (OK area, NG area) Schematic diagram of ). When cutting When the detection result of the object to be detected (L, R) picked up by the arm (L, R) is (OK, NG), the blanking arm (L, R) is aligned with the correct classification above the blanking area 60, respectively. In the area, the unloading arm (L, R) can perform the blanking action at the same time, and place the (OK piece, NG part) into the blanking area 60 (OK area, NG area).

請參考第五圖(a)至(e),顯示習知下料手臂(L、R)將依檢測結果(OK件、OK件)擺放至習知下料區(OK區、NG區)的示意圖。當下料手臂(L、R)所拾起的待檢測物(L、R)的檢測結果為(OK件、OK件),則在下料區60上方,下料手臂L對準正確的OK區,但下料手臂R對準錯誤的NG區。因此,下料手臂L先執行下料擺放動作,如第五圖(a)至(b);接著下料手臂(L、R)往左移使下料手臂R對準正確的OK區,如第五圖(c);接著下料手臂R才執行下料擺放動作,如第五圖(d)至(e)。 Please refer to the fifth figure (a) to (e), showing that the conventional unloading arm (L, R) will be placed according to the test results (OK, OK) to the conventional unloading area (OK area, NG area) Schematic diagram. When the detection result of the object to be detected (L, R) picked up by the blanking arm (L, R) is (OK, OK), the blanking arm L is aligned with the correct OK zone above the blanking area 60. However, the blanking arm R is aligned with the wrong NG zone. Therefore, the blanking arm L first performs the blanking action, as shown in the fifth figure (a) to (b); then the lowering arm (L, R) is moved to the left to align the blanking arm R with the correct OK zone. As shown in the fifth figure (c); then the blanking arm R performs the blanking action, as shown in the fifth (d) to (e).

請參考第六圖(a)至(g),顯示習知下料手臂(L、R)將依檢測結果(NG件、OK件)擺放至習知下料區60(OK區、NG區)的示意圖。當下料手臂(L、R)所拾起的待檢測物(L、R)的檢測結果為(NG件、OK件),則下料手臂(L、R)在下料區60上方分別對準錯誤的分類區,如第六圖(a)。因此,下料手臂(L、R)往左移使下料手臂R對準正確的OK區,如第六圖(b);接著下料手臂R執行下料擺放動作,如第六圖(c)至(d);接著下料手臂(L、R)往右移使下料手臂L對準正確的NG區,如第六圖(e);接著下料手臂L才執行下料擺放動作,如第六圖(f)至(g)。 Please refer to the sixth figure (a) to (g), showing that the conventional unloading arm (L, R) will be placed according to the test results (NG parts, OK pieces) to the conventional unloading area 60 (OK area, NG area) Schematic diagram of ). When the detection result of the object to be detected (L, R) picked up by the blanking arm (L, R) is (NG, OK), the blanking arms (L, R) are respectively aligned incorrectly above the blanking area 60. The classification area, as shown in Figure 6 (a). Therefore, the blanking arm (L, R) is moved to the left to align the blanking arm R with the correct OK zone, as shown in the sixth figure (b); then the blanking arm R performs the blanking action, as shown in the sixth figure ( c) to (d); then the shifting arm (L, R) is moved to the right to align the blanking arm L with the correct NG zone, as shown in the sixth figure (e); then the blanking arm L is used to perform the blanking placement. Action, as shown in the sixth figure (f) to (g).

請參考第七圖(a)至(e),顯示習知下料手臂(L、R)將依檢測結果(NG件、NG件)擺放至習知下料區60(OK區、NG區)的示意圖。當下料手臂(L、R)所拾起的待檢測物(L、R)的檢測結果為(NG件、NG件),則在下料區60上方,下料手臂R對準正確的NG區,但下料手臂L對準錯誤的OK區。 因此,下料手臂R先執行下料擺放動作,如第七圖(a)至(b);接著下料手臂(L、R)往右移使下料手臂L對準正確的NG區,如第七圖(c);接著下料手臂L才執行下料擺放動作,如第七圖(d)至(e)。 Please refer to the seventh figure (a) to (e), showing that the conventional unloading arm (L, R) will be placed according to the test results (NG pieces, NG pieces) to the conventional unloading area 60 (OK area, NG area) Schematic diagram of ). When the detection result of the object to be detected (L, R) picked up by the blanking arm (L, R) is (NG member, NG member), the feeding arm R is aligned with the correct NG region above the blanking region 60, However, the blanking arm L is aligned with the wrong OK zone. Therefore, the blanking arm R first performs the blanking action, as shown in the seventh figure (a) to (b); then the lowering arm (L, R) is moved to the right to align the blanking arm L with the correct NG zone. As shown in the seventh figure (c); then the blanking arm L performs the blanking action, as shown in the seventh (d) to (e).

此另一習知下料擺放方式,下料手臂(L、R)的下料擺放動作需要一片一片因應OK件或NG件的檢測結果,分別對準正確的分類區,而造成整體的下料擺放時間過長,以及下料手臂(L、R)的位移與擺放操作過於繁瑣。 In another conventional method of placing the material, the blanking action of the blanking arm (L, R) requires a piece of the detection result of the OK piece or the NG piece to be aligned with the correct classification area, thereby causing the overall The cutting time is too long, and the displacement and placement of the cutting arm (L, R) is too cumbersome.

因此,本創作若能提供一種光學式瑕疵檢測系統及其下料擺放系統,可快速地一次性下料擺放並同時正確地擺放至分類區,以提高後續的作業效率,將具有產業的實用性。 Therefore, if the present invention can provide an optical sputum detection system and its blank placement system, it can be quickly placed at one time and placed correctly in the classification area at the same time, so as to improve the subsequent work efficiency, and the industry will be Practicality.

本創作的目的是提供一種光學式瑕疵檢測系統及其下料擺放系統,可快速地一次性下料擺放並同時正確地擺放至分類區,以提高後續的作業效率。 The purpose of this creation is to provide an optical sputum detection system and a blank placement system that can be quickly placed at one time and placed correctly in the classification area to improve subsequent work efficiency.

為了達到上述創作目的,本創作提供一種光學式瑕疵檢測系統,包含:至少一平台,用以承載複數個待檢測物;一上料擺放系統,將複數個待檢測物一次性擺放至該平台;一影像拍攝系統,依序拍攝該等待檢測物之複數個檢測影像;一處理單元,接收該等檢測影像,以檢測出該等待檢測物之檢測結果;以及一下料擺放系統,從該平台一次性拾起該等待檢測物,以擺放至一下料區;其特徵在於:該下料區包含複數個區域,該等區域之相鄰排列包含該等待檢測物之所有檢測結果的組合,該處理單 元根據該等待檢測物之檢測結果,以控制該下料擺放系統將拾起的該等待檢測物移動對應至複數個目標區域,而該等目標區域之相鄰排列相應於該等待檢測物之檢測結果,俾使該下料擺放系統將該等待檢測物一次性擺放至該等目標區域。 In order to achieve the above-mentioned creative purpose, the present invention provides an optical flaw detection system comprising: at least one platform for carrying a plurality of objects to be detected; and a loading and placing system for placing a plurality of objects to be detected at one time a platform; an image capturing system sequentially capturing a plurality of detected images of the waiting for detecting; a processing unit receiving the detected images to detect a detection result of the waiting for detecting; and a sampling system, The platform picks up the waiting test object at a time to be placed in the sampling area; the discharging area includes a plurality of areas, and the adjacent arrangement of the areas includes a combination of all the detection results of the waiting for the detecting object. The processing order And according to the detection result of the waiting for detecting object, controlling the feeding placement system to move the picked up waiting object to the plurality of target areas, and the adjacent arrangement of the target areas corresponds to the waiting for detecting object The detection result is such that the blank placement system places the waiting test object in the target area at one time.

其中,該檢測結果包含OK件,以表示該待檢測物無瑕疵;以及NG件,以表示該待檢測物存在瑕疵。當該平台承載2個待檢測物,則該處理單元檢測出2個待檢測物之所有檢測結果的組合包含:[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件]。 Wherein, the detection result includes an OK member to indicate that the object to be detected is flawless; and an NG member to indicate that the object to be detected is present. When the platform carries two objects to be detected, the processing unit detects that the combination of all the detection results of the two objects to be detected includes: [OK, OK], [NG, NG], [OK, NG [] and [NG, OK].

其中,當該平台承載2個待檢測物,則該等區域之相鄰排列為選自以下排列之一:[OK區、OK區、NG區、NG區、OK區]、[NG區、NG區、OK區、OK區、NG區]、[NG區、OK區、OK區、NG區、NG區]以及[OK區、NG區、NG區、OK區、OK區],且該2個目標區域之相鄰排列包含:[OK區、OK區]、[NG區、NG區]、[OK區、NG區]以及[NG區、OK區],其中該OK區用以擺放OK件,該NG區用以擺放NG件。 Wherein, when the platform carries 2 objects to be detected, the adjacent arrangement of the regions is selected from one of the following arrangements: [OK area, OK area, NG area, NG area, OK area], [NG area, NG District, OK Zone, OK Zone, NG Zone], [NG Zone, OK Zone, OK Zone, NG Zone, NG Zone] and [OK Zone, NG Zone, NG Zone, OK Zone, OK Zone], and the 2 The adjacent arrangement of the target area includes: [OK area, OK area], [NG area, NG area], [OK area, NG area], and [NG area, OK area], wherein the OK area is used for placing OK pieces. The NG area is used to place NG pieces.

為了達到上述創作目的,本創作復提供的一種下料擺放系統,使用於一光學式瑕疵檢測系統,該光學式瑕疵檢測系統包含:至少一平台,用以承載複數個待檢測物;一影像拍攝系統,依序拍攝該等待檢測物之複數個檢測影像;以及,一處理單元,接收該等檢測影像,以檢測出該等待檢測物之檢測結果;其特徵在於:該下料擺放系統包含複數個下料手臂,該等下料手臂從該平台一次性拾起該等待檢測物,以擺放至一下料區;其中,該下料區包含複數個區域,該等區域之相鄰排列包含該等待檢測物之所有檢測結果的組合。 In order to achieve the above-mentioned creative purpose, the present invention provides a blank placement system for use in an optical detection system comprising: at least one platform for carrying a plurality of objects to be detected; an image a shooting system that sequentially captures a plurality of detection images of the waiting for detection; and a processing unit that receives the detection images to detect a detection result of the waiting detection object; wherein the blank placement system includes a plurality of blanking arms, the feeding arms picking up the waiting test object from the platform to be placed in the sampling area; wherein the blanking area comprises a plurality of regions, and adjacent rows of the regions include A combination of all the test results of the waiting test.

其中,該處理單元根據該等待檢測物之檢測結果,以控制該下料擺放系統將拾起的該等待檢測物移動對應至複數個目標區域,而該等目標區域之相鄰排列相應於該等待檢測物之檢測結果,俾使該下料擺放系統將該等待檢測物一次性擺放至該等目標區域。 The processing unit controls the feeding of the waiting object corresponding to the plurality of target areas according to the detection result of the waiting detection object, and the adjacent arrangement of the target areas corresponds to the Waiting for the detection result of the detection object, the cutting placement system places the waiting detection object to the target areas at one time.

其中,該檢測結果包含OK件,以表示該待檢測物無瑕疵;以及NG件,以表示該待檢測物存在瑕疵。當該平台承載2個待檢測物,則該處理單元檢測出2個待檢測物之所有檢測結果的組合包含:[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件]。 Wherein, the detection result includes an OK member to indicate that the object to be detected is flawless; and an NG member to indicate that the object to be detected is present. When the platform carries two objects to be detected, the processing unit detects that the combination of all the detection results of the two objects to be detected includes: [OK, OK], [NG, NG], [OK, NG [] and [NG, OK].

其中,當該平台承載2個待檢測物,則該等區域之相鄰排列為選自以下排列之一:[OK區、OK區、NG區、NG區、OK區]、[NG區、NG區、OK區、OK區、NG區]、[NG區、OK區、OK區、NG區、NG區]以及[OK區、NG區、NG區、OK區、OK區],且該2個目標區域之相鄰排列包含:[OK區、OK區]、[NG區、NG區]、[OK區、NG區]以及[NG區、OK區],其中該OK區用以擺放OK件,該NG區用以擺放NG件。 Wherein, when the platform carries 2 objects to be detected, the adjacent arrangement of the regions is selected from one of the following arrangements: [OK area, OK area, NG area, NG area, OK area], [NG area, NG District, OK Zone, OK Zone, NG Zone], [NG Zone, OK Zone, OK Zone, NG Zone, NG Zone] and [OK Zone, NG Zone, NG Zone, OK Zone, OK Zone], and the 2 The adjacent arrangement of the target area includes: [OK area, OK area], [NG area, NG area], [OK area, NG area], and [NG area, OK area], wherein the OK area is used for placing OK pieces. The NG area is used to place NG pieces.

根據本創作的光學式瑕疵檢測系統及其下料擺放系統,在下料擺放期間,可從檢測平台上一次性拾起複數個待檢測物,並根據該等待檢測物的檢測結果,將複數個待檢測物移至一下料區對應的下料位置後,再一次性擺放複數個待檢測物至正確的分料區,同時完成分類作業,大幅縮短整體的下料擺放時間,及簡化下料手臂的位移與擺放操作,又免除後續人力的分料動作。 According to the optical sputum detection system and the blank placement system of the present invention, during the placing of the blanking, a plurality of objects to be detected can be picked up from the detection platform at one time, and the plural number is detected according to the detection result of the waiting for the detection object. After the objects to be tested are moved to the corresponding unloading position in the lower material area, a plurality of objects to be tested are placed in one time to the correct dispensing area, and the sorting operation is completed at the same time, thereby greatly shortening the overall blanking time and simplifying The displacement and placement of the blanking arm eliminates the subsequent man-made material movement.

1‧‧‧處理單元 1‧‧‧Processing unit

2‧‧‧平台L 2‧‧‧ Platform L

3‧‧‧平台R 3‧‧‧ Platform R

4‧‧‧平台驅動機構 4‧‧‧ platform drive mechanism

5‧‧‧待檢測物L 5‧‧‧Test object L

6‧‧‧待檢測物R 6‧‧‧Testing object R

10‧‧‧影像拍攝系統 10‧‧‧Image Capture System

11‧‧‧相機 11‧‧‧ camera

12‧‧‧鏡頭 12‧‧‧ lens

13‧‧‧偏光鏡 13‧‧‧ polarizer

14‧‧‧分光鏡 14‧‧‧beam splitter

15‧‧‧正光源 15‧‧‧ positive light source

16‧‧‧右側光源 16‧‧‧right light source

17‧‧‧左側光源 17‧‧‧left light source

18‧‧‧相機驅動機構 18‧‧‧ camera drive mechanism

30‧‧‧上料擺放系統 30‧‧‧Loading system

31‧‧‧上料手臂L 31‧‧‧Loading arm L

32‧‧‧上料手臂R 32‧‧‧Feeding arm R

40‧‧‧下料擺放系統 40‧‧‧Unloading system

41‧‧‧下料手臂L 41‧‧‧Unloading arm L

42‧‧‧下料手臂R 42‧‧‧Unloading arm R

50‧‧‧上料區 50‧‧‧Feeding area

51‧‧‧訊號溝通模組 51‧‧‧Signal Communication Module

52‧‧‧平台L驅動機構 52‧‧‧ Platform L drive mechanism

53‧‧‧平台R驅動機構 53‧‧‧ Platform R drive mechanism

54‧‧‧移動控制裝置 54‧‧‧Mobile control unit

60‧‧‧下料區 60‧‧‧Unloading area

70‧‧‧下料區 70‧‧‧Unloading area

第一圖是習知光學式瑕疵檢測系統之系統架構圖。 The first figure is a system architecture diagram of a conventional optical helium detection system.

第二圖是習知光學式瑕疵檢測系統之系統方塊圖。 The second figure is a system block diagram of a conventional optical helium detection system.

第三A圖是習知光學式瑕疵檢測系統包含上料擺放系統與下料擺放系統之俯視圖。 The third A is a top view of the conventional optical pick-up detection system including the loading and unloading system.

第三B圖是習知光學式瑕疵檢測系統包含上料擺放系統與下料擺放系統之示意圖。 The third B is a schematic diagram of a conventional optical pick-up detection system including a loading placement system and a blank placement system.

第四圖(a)至(b)是習知下料手臂(L、R)將依檢測結果(OK件、NG件)擺放至習知下料區(OK區、NG區)的示意圖。 The fourth figures (a) to (b) are schematic diagrams in which the conventional unloading arm (L, R) is placed in the conventional unloading area (OK area, NG area) according to the detection result (OK piece, NG part).

第五圖(a)至(e)是習知下料手臂(L、R)將依檢測結果(OK件、OK件)擺放至習知下料區(OK區、NG區)的示意圖。 The fifth diagrams (a) to (e) are schematic diagrams in which the conventional unloading arm (L, R) is placed according to the detection result (OK piece, OK piece) to the conventional unloading area (OK area, NG area).

第六圖(a)至(g)是習知下料手臂(L、R)將依檢測結果(NG件、OK件)擺放至習知下料區(OK區、NG區)的示意圖。 The sixth figure (a) to (g) is a schematic diagram of the conventional cutting arm (L, R) placed according to the detection result (NG piece, OK piece) to the conventional unloading area (OK area, NG area).

第七圖(a)至(e)是習知下料手臂(L、R)將依檢測結果(NG件、NG件)擺放至習知下料區(OK區、NG區)的示意圖。 The seventh diagrams (a) to (e) are schematic diagrams in which the conventional unloading arm (L, R) is placed according to the detection result (NG member, NG member) to the conventional unloading area (OK area, NG area).

第八圖是本創作下料擺放系統及本創作下料區之示意圖。 The eighth picture is a schematic diagram of the creation and placement system of the creation and the blanking area of the creation.

第九圖是本創作光學式瑕疵檢測系統之系統方塊圖。 The ninth figure is a system block diagram of the optical tweezers detection system of the present invention.

第十圖(a)至(b)是本創作下料手臂(L、R)將檢測結果(OK件、OK件)定位至對應本創作下料區的(OK區、OK區)的示意圖。 The tenth pictures (a) to (b) are schematic diagrams in which the creation arm (L, R) of the present creation position (OK, OK) is positioned to correspond to the creation area (OK area, OK area).

第十一圖(a)至(b)是本創作下料手臂(L、R)將檢測結果(OK件、NG件)定位至對應本創作下料區的(OK區、NG區)的示意圖。 Figure 11 (a) to (b) are schematic diagrams of positioning the detection result (OK, NG) of the creation arm (L, R) to the corresponding blanking area (OK area, NG area) .

第十二圖(a)至(b)是本創作下料手臂(L、R)將檢測結果(NG件、OK件) 定位至對應本創作下料區的(NG區、OK區)的示意圖。 Figure 12 (a) to (b) are the results of the detection of the blanking arm (L, R) (NG, OK) Positioned to the schematic diagram of the (NG area, OK area) corresponding to the creation blanking area.

第十三圖(a)至(b)是本創作下料手臂(L、R)將檢測結果(NG件、NG件)定位至對應本創作下料區的(NG區、NG區)的示意圖。 The thirteenth picture (a) to (b) is a schematic diagram of the positioning of the blanking arm (L, R) to locate the detection result (NG piece, NG piece) corresponding to the creation area (NG area, NG area) .

第十四A圖是本創作下料手臂(L、M、R)依各檢測結果的下料位置對應本創作下料區[OK區、NG區、OK區、OK區、OK區、NG區、NG區、NG區、OK區、NG區]的示意圖。 The fourteenth A picture shows that the blanking position of the creation arm (L, M, R) according to each test result corresponds to the creation blanking area [OK area, NG area, OK area, OK area, OK area, NG area). , NG area, NG area, OK area, NG area].

第十四B圖是本創作下料手臂(L、M、R)依各檢測結果的下料位置對應本創作下料區[NG區、OK區、NG區、NG區、NG區、OK區、OK區、OK區、NG區、OK區]的示意圖。 The fourteenth B-picture is the blanking position of the creation arm (L, M, R) according to each test result corresponding to the creation blanking area [NG area, OK area, NG area, NG area, NG area, OK area) , OK area, OK area, NG area, OK area].

首先參考第八圖,係顯示本創作下料擺放系統及本創作下料區之示意圖。在本創作的實施例中,一種光學式瑕疵檢測系統包含一影像拍攝系統10,如第二圖所示,可從至少一平台所承載的複數個待檢測物依序拍攝複數個檢測影像,其中該平台可為單一載台,同時承載該等待檢測物;或者,如第八圖所示包括平台L2、平台R3,係分別承載待檢測物L5與待檢測物R6。本創作光學式瑕疵檢測系統進一步包含:一上料擺放系統30,如第三A圖所示,與一下料擺放系統40,如第八圖所示。該上料擺放系統30包含一上料區50,且配置一上料手臂L31與一上料手臂R32可從該上料區50中一次性拾起待檢測物L5、待檢測物R6,並將該上料手臂L31與上料手臂R32移動至該平台L2、平台R3的上方後,再一次性擺放待檢測物L5、待檢測物R6至該平台L2、平台R3上。其中,該一次性拾起動作與一次性擺放動 作,是指上料手臂(L、R)定位後,不再位移的情況下同時拾起與同時擺放待檢測物L5、待檢測物R6。 Referring first to the eighth figure, it is a schematic diagram showing the creation and placement of the creation and the blanking area of the creation. In an embodiment of the present invention, an optical imaging system includes an image capturing system 10, as shown in the second figure, which can sequentially capture a plurality of detected images from a plurality of objects to be detected carried by at least one platform, wherein The platform may be a single stage and carry the waiting object; or, as shown in FIG. 8 , the platform L2 and the platform R3 respectively carry the object to be detected L5 and the object to be detected R6. The optical tweezers detection system of the present invention further comprises: a loading arrangement system 30, as shown in FIG. 3A, and a placement system 40, as shown in the eighth figure. The loading and unloading system 30 includes a loading area 50, and a loading arm L31 and a loading arm R32 are configured to pick up the object to be detected L5 and the object to be detected R6 from the loading area 50 at a time. After the loading arm L31 and the loading arm R32 are moved to the upper side of the platform L2 and the platform R3, the object to be detected L5 and the object to be detected R6 are placed on the platform L2 and the platform R3 at a time. Among them, the one-time pick-up action and one-time swing For example, after the positioning arm (L, R) is positioned, the object to be detected L5 and the object to be detected R6 are simultaneously picked up and simultaneously placed without being displaced.

請參考第八圖,本創作下料擺放系統40包含一下料區70,且配置一下料手臂L41與一下料手臂R42,可從該平台L2、平台R3上一次性拾起待檢測物L5、待檢測物R6,並將該上料手臂L31與上料手臂R32移動定位至對應該下料區70的擺放位置後,再一次性擺放待檢測物L5、待檢測物R6至該下料區70中。其中,該一次性拾起動作與一次性擺放動作,是指下料手臂(L、R)定位至該平台L2、平台R3上或定位至對應該下料區70的擺放位置後,不再位移的情況下同時拾起與同時擺放待檢測物L5、待檢測物R6。本創作下料擺放系統40的一下料區70包含複數個區域,如OK區與NG區,該等區域之相鄰排列包含該待檢測物L5、待檢測物R6之所有檢測結果的組合。以2個待檢測物5、6為例,經本創作光學式瑕疵檢測系統檢測後的所有檢測結果的組合包含[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件],其中OK件,以表示該待檢測物無瑕疵,應擺放至OK區;以及NG件,以表示該待檢測物存在瑕疵,應擺放至NG區。 Referring to the eighth figure, the creation placing system 40 includes a lower material zone 70, and a lower arm L41 and a lower arm R42 are arranged, and the object to be detected L5 can be picked up from the platform L2 and the platform R3 at a time. After the object R6 is to be detected, and the loading arm L31 and the loading arm R32 are moved and positioned to correspond to the placement position of the blanking area 70, the object to be detected L5 and the object to be detected R6 are placed at a time to the blanking. In area 70. Wherein, the one-time picking up action and the one-time placing action means that after the blanking arm (L, R) is positioned on the platform L2, the platform R3 or positioned to correspond to the placement position of the blanking area 70, In the case of re-displacement, the object to be detected L5 and the object to be detected R6 are simultaneously picked up and placed. The blanking zone 70 of the present writing placement system 40 includes a plurality of regions, such as an OK zone and an NG zone, and the adjacent arrangement of the zones includes a combination of all the detection results of the object to be detected L5 and the object to be detected R6. Taking two objects to be detected 5 and 6 as an example, the combination of all the test results detected by the optical tweezers detection system of the present invention includes [OK, OK], [NG, NG], [OK, NG] ] and [NG pieces, OK pieces], of which OK pieces, to indicate that the object to be tested is flawless, should be placed in the OK area; and NG pieces to indicate that the object to be detected exists, should be placed in the NG area.

請參考第九圖,顯示本創作光學式瑕疵檢測系統之系統方塊圖。本創作光學式瑕疵檢測系統包含一處理單元1,該處理單元1接收該影像拍攝系統10依序拍攝複數個待檢測物的複數個檢測影像,並判斷每一待檢測物的檢測影像以檢測出該待檢測物為OK件或NG件之檢測結果。該處理單元1包含一移動控制裝置54,該處理單元1透過移動控制裝置54控制相機驅動機構18、上料擺放系統30、下料擺放系統40、平台L驅動機構52與平台R驅動機構53,以控制系統的檢測流程。其中移動控制裝置54透過訊號溝通 模組51以控制上料擺放系統30的上料手臂(L、R)與下料擺放系統40的下料手臂(L、R)以執行一次性拾起動作與一次性擺放動作。此外,平台L驅動機構52與平台R驅動機構53分別驅動平台L2、平台R3在往復方向上來回移動,而相機驅動機構18驅動該影像拍攝系統10在垂直該等平台2、3的往復方向上來回移動,使該影像拍攝系統10的該相機11分別對準待檢測物L5與待檢測物R6,以拍攝檢測影像,如第八圖所示。 Please refer to the ninth figure to show the system block diagram of the optical tweezers detection system. The optical 瑕疵 detection system of the present invention comprises a processing unit 1 , and the processing unit 1 receives the plurality of detection images of the plurality of objects to be detected, and determines the detection image of each object to be detected to detect the image. The object to be detected is the detection result of the OK piece or the NG piece. The processing unit 1 includes a movement control device 54 that controls the camera driving mechanism 18, the loading placement system 30, the blank placement system 40, the platform L driving mechanism 52, and the platform R driving mechanism through the movement control device 54. 53, to control the detection process of the system. Where the mobile control device 54 communicates through the signal The module 51 controls the loading arms (L, R) of the loading placement system 30 and the blanking arms (L, R) of the blanking placement system 40 to perform a one-time pick-up action and a one-time placement action. In addition, the platform L driving mechanism 52 and the platform R driving mechanism 53 respectively drive the platform L2 and the platform R3 to move back and forth in the reciprocating direction, and the camera driving mechanism 18 drives the image capturing system 10 in the reciprocating direction of the platforms 2, 3 vertically. Moving back and forth, the camera 11 of the image capturing system 10 is respectively aligned with the object to be detected L5 and the object to be detected R6 to capture a detected image, as shown in the eighth figure.

本創作為解決習知下料擺放系統的問題,以規劃下料擺放系統40的一下料區70包含複數個區域,如OK區與NG區,該等區域之相鄰排列包含該待檢測物L5、待檢測物R6之所有檢測結果的組合。以2個待檢測物5、6為例,經本創作光學式瑕疵檢測系統檢測後的所有檢測結果的組合包含[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件]。因此,在本創作的一種實施例,下料區70包含複數個區域,該等區域的一種相鄰排列方式為[OK區、OK區、NG區、NG區、OK區]。以下請參考第十圖至第十三圖,分別顯示下料手臂(L、R)一次性拾起2個待檢測物5、6後,依不同的檢測結果定位至對應該下料區70不同的擺放位置所執行的一次性擺放動作。 The present invention is to solve the problem of the conventional blanking system, and the blanking area 70 of the planned blanking placement system 40 includes a plurality of regions, such as an OK zone and an NG zone, and the adjacent arrangement of the zones includes the to-be-detected A combination of all the detection results of the substance L5 and the object to be detected R6. Taking two objects to be detected 5 and 6 as an example, the combination of all the test results detected by the optical tweezers detection system of the present invention includes [OK, OK], [NG, NG], [OK, NG] ] and [NG pieces, OK pieces]. Therefore, in one embodiment of the present creation, the blanking zone 70 includes a plurality of regions, and an adjacent arrangement of the regions is [OK zone, OK zone, NG zone, NG zone, OK zone]. Please refer to the tenth to thirteenth figures below, respectively, showing that the blanking arm (L, R) picks up two objects to be detected 5 and 6 at a time, and then locates to the corresponding blanking area 70 according to different detection results. The one-time placement action performed by the placed position.

請參考第十圖(a)至(b),顯示本創作下料手臂(L、R)將依檢測結果(OK件、OK件)定位至對應本創作下料區70(OK區、OK區)的示意圖。該處理單元1接收該影像拍攝系統10依序拍攝待檢測物(L、R)的檢測影像,並檢測出待檢測物(L、R)的檢測結果為(OK件、OK件)。該處理單元1控制下料手臂(L、R)一次性拾起的待檢測物(L、R),並根據檢測結果為(OK件、OK件)位移下料手臂(L、R)定位至下料區70對準正確的分類區(OK區、OK 區),如第十圖(a)所示。因此,下料手臂(L、R)可同時執行一次性下料擺放動作,將(OK件、OK件)擺放至下料區70的(OK區、OK區)中,如第十圖(b)所示。 Please refer to the tenth (a) to (b), showing that the creation arm (L, R) will be positioned according to the test result (OK, OK) to the corresponding writing area 70 (OK area, OK area) Schematic diagram of ). The processing unit 1 receives the detected image of the object to be detected (L, R) by the image capturing system 10, and detects that the detection result of the object to be detected (L, R) is (OK, OK). The processing unit 1 controls the object to be detected (L, R) picked up by the blanking arm (L, R) at a time, and according to the detection result, the displacement arm (L, R) is positioned (OK, OK) to The blanking area 70 is aligned with the correct classification area (OK area, OK) Area), as shown in Figure 10 (a). Therefore, the blanking arm (L, R) can simultaneously perform a one-time blanking and placing action, and (OK, OK) is placed in the (OK area, OK area) of the blanking area 70, as shown in the tenth figure. (b) is shown.

請參考第十一圖(a)至(b),顯示本創作下料手臂(L、R)將依檢測結果(OK件、NG件)定位至對應本創作下料區70(OK區、NG區)的示意圖。該處理單元1接收該影像拍攝系統10依序拍攝待檢測物(L、R)的檢測影像,並檢測出待檢測物(L、R)的檢測結果為(OK件、NG件)。該處理單元1控制下料手臂(L、R)一次性拾起的待檢測物(L、R),並根據檢測結果為(OK件、NG件)位移下料手臂(L、R)定位至下料區70對準正確的分類區(OK區、NG區),如第十一圖(a)所示。因此,下料手臂(L、R)可同時執行一次性下料擺放動作,將(OK件、NG件)擺放至下料區70的(OK區、NG區)中,如第十一圖(b)所示。 Please refer to the eleventh figure (a) to (b), showing that the creation arm (L, R) will be positioned according to the test result (OK, NG) to the corresponding creation area 70 (OK area, NG) Schematic diagram of the area). The processing unit 1 receives the detected image of the object to be detected (L, R) by the image capturing system 10, and detects that the detection result of the object to be detected (L, R) is (OK, NG). The processing unit 1 controls the object to be detected (L, R) picked up by the blanking arm (L, R) at one time, and according to the detection result, the displacement arm (L, R) is positioned (OK, NG) to The blanking zone 70 is aligned with the correct sorting zone (OK zone, NG zone) as shown in Fig. 11(a). Therefore, the blanking arm (L, R) can simultaneously perform a one-time blanking and placing action, and put (OK, NG) into the (OK area, NG area) of the blanking area 70, such as the eleventh Figure (b) shows.

請參考第十二圖(a)至(b),顯示本創作下料手臂(L、R)將依檢測結果(NG件、OK件)定位至對應本創作下料區70(NG區、OK區)的示意圖。該處理單元1接收該影像拍攝系統10依序拍攝待檢測物(L、R)的檢測影像,並檢測出待檢測物(L、R)的檢測結果為(NG件、OK件)。該處理單元1控制下料手臂(L、R)一次性拾起的待檢測物(L、R),並根據檢測結果為(NG件、OK件)位移下料手臂(L、R)定位至下料區70對準正確的分類區(NG區、OK區),如第十二圖(a)所示。因此,下料手臂(L、R)可同時執行一次性下料擺放動作,將(NG件、OK件)擺放至下料區70的(NG區、OK區)中,如第十二圖(b)所示。 Please refer to the twelfth figure (a) to (b), showing that the creation arm (L, R) will be positioned according to the test result (NG piece, OK piece) to correspond to the creation blanking area 70 (NG area, OK) Schematic diagram of the area). The processing unit 1 receives the detected image of the object to be detected (L, R) by the image capturing system 10, and detects that the detection result of the object to be detected (L, R) is (NG, OK). The processing unit 1 controls the object to be detected (L, R) picked up by the blanking arm (L, R) at a time, and according to the detection result, the displacement arm (L, R) is positioned (NG, OK) to The blanking zone 70 is aligned with the correct sorting zone (NG zone, OK zone) as shown in Fig. 12(a). Therefore, the blanking arm (L, R) can simultaneously perform a one-time blanking and placing action, and place the (NG member, OK member) in the (NG area, OK area) of the blanking area 70, such as the twelfth Figure (b) shows.

請參考第十三圖(a)至(b),顯示本創作下料手臂(L、R)將依 檢測結果(NG件、NG件)定位至對應本創作下料區70(NG區、NG區)的示意圖。該處理單元1接收該影像拍攝系統10依序拍攝待檢測物(L、R)的檢測影像,並檢測出待檢測物(L、R)的檢測結果為(NG件、NG件)。該處理單元1控制下料手臂(L、R)一次性拾起的待檢測物(L、R),並根據檢測結果為(NG件、NG件)位移下料手臂(L、R)定位至下料區70對準正確的分類區(NG區、NG區),如第十三圖(a)所示。因此,下料手臂(L、R)可同時執行一次性下料擺放動作,將(NG件、NG件)擺放至下料區70的(NG區、NG區)中,如第十三圖(b)所示。 Please refer to the thirteenth figure (a) to (b), showing that the creation arm (L, R) will be The detection results (NG pieces, NG pieces) are positioned to correspond to the schematic drawing area 70 (NG area, NG area). The processing unit 1 receives the detected image of the object to be detected (L, R) by the image capturing system 10, and detects that the detection result of the object to be detected (L, R) is (NG, NG). The processing unit 1 controls the object to be detected (L, R) picked up by the blanking arm (L, R) at one time, and according to the detection result, the displacement arm (L, R) of the (NG member, NG member) is positioned to The blanking zone 70 is aligned with the correct sorting zone (NG zone, NG zone) as shown in Fig. 13(a). Therefore, the blanking arm (L, R) can simultaneously perform a one-time blanking and placing action, and place the (NG member, NG member) in the (NG area, NG area) of the blanking area 70, such as the thirteenth Figure (b) shows.

在本創作的不同實施例中,以2個待檢測物為例,下料區70包含複數個區域,該等區域的另一種相鄰排列方式為[NG區、NG區、OK區、OK區、NG區];該等區域的再一種相鄰排列方式為[NG區、OK區、OK區、NG區、NG區];該等區域的又一種相鄰排列方式為[OK區、NG區、NG區、OK區、OK區]。 In different embodiments of the present creation, taking two objects to be detected as an example, the blanking area 70 includes a plurality of regions, and another adjacent arrangement manner of the regions is [NG region, NG region, OK region, and OK region. , NG area]; another adjacent arrangement of these areas is [NG area, OK area, OK area, NG area, NG area]; another adjacent arrangement of these areas is [OK area, NG area , NG area, OK area, OK area].

熟悉本技術領域之人士可以理解,當平台上可同時擺放3個待檢測物時,上料擺放系統30與下料擺放系統40需同時配置3個上料手臂(L、M、R)與3個下料手臂(L、M、R),且本創作光學式瑕疵檢測系統可同時檢測出3個待檢測物的檢測結果。下表一列表了3個下料手臂(L、M、R)所拾起3個待檢測物的所有檢測結果,其中,八種檢測結果分別對應3個下料手臂(L、M、R)應位移定位的八個下料位置。 Those skilled in the art can understand that when three objects to be detected can be placed on the platform at the same time, the loading and unloading system 30 and the blanking and placing system 40 need to be equipped with three loading arms (L, M, R). ) With 3 blanking arms (L, M, R), and the creative optical detection system can simultaneously detect the detection results of three objects to be detected. Table 1 below lists all the test results of 3 objects to be tested picked up by 3 blanking arms (L, M, R). Among them, 8 test results correspond to 3 blanking arms (L, M, R). The eight blanking positions that should be positioned by displacement.

因此,以3個待檢測物為例,本創作下料區70包含複數個區域,該等區域的一種相鄰排列方式為[OK區、NG區、OK區、OK區、OK區、NG區、NG區、NG區、OK區、NG區],如第十四A圖所示;以及該等區域 的另一種相鄰排列方式為[NG區、OK區、NG區、NG區、NG區、OK區、OK區、OK區、NG區、OK區],如第十四B圖所示。此外,第十四A圖與第十四B圖同時標示3個下料手臂(L、M、R)以下料手臂M所對應的下料位置,例如:下料手臂(L、M、R)的檢測結果為[OK件、OK件、OK件],則3個下料手臂(L、M、R)的下料手臂M應位移定位至下料位置①,所以3個下料手臂(L、M、R)可對應到下料區70的相鄰排列[OK區、OK區、OK區];下料手臂(L、M、R)的檢測結果為[NG件、OK件、NG件],則3個下料手臂(L、M、R)的下料手臂M應位移定位至下料位置⑥,所以3個下料手臂(L、M、R)可對應到下料區70的相鄰排列[NG區、OK區、NG區]。 Therefore, taking the three objects to be detected as an example, the creation blanking area 70 includes a plurality of regions, and an adjacent arrangement manner of the regions is [OK zone, NG zone, OK zone, OK zone, OK zone, and NG zone). , NG zone, NG zone, OK zone, NG zone], as shown in Figure 14A; and such zones Another adjacent arrangement is [NG area, OK area, NG area, NG area, NG area, OK area, OK area, OK area, NG area, OK area], as shown in Fig. 14B. In addition, the fourteenth A picture and the fourteenth B picture simultaneously indicate the blanking positions corresponding to the arm M of the three blanking arms (L, M, R), for example: the blanking arm (L, M, R) The detection result is [OK, OK, OK], then the blanking arm M of the three blanking arms (L, M, R) should be displaced to the blanking position 1, so 3 blanking arms (L , M, R) can correspond to the adjacent arrangement of the blanking area 70 [OK area, OK area, OK area]; the detection result of the blanking arm (L, M, R) is [NG pieces, OK pieces, NG pieces] ], the blanking arm M of the three blanking arms (L, M, R) should be displaced to the blanking position 6, so the three blanking arms (L, M, R) can correspond to the blanking zone 70. Arranged adjacently [NG area, OK area, NG area].

Claims (10)

一種光學式瑕疵檢測系統,包含:至少一平台,用以承載複數個待檢測物;一上料擺放系統,將複數個待檢測物一次性擺放至該平台;一影像拍攝系統,依序拍攝該等待檢測物之複數個檢測影像;一處理單元,接收該等檢測影像,以檢測出該等待檢測物之檢測結果;以及一下料擺放系統,從該平台一次性拾起該等待檢測物,以擺放至一下料區;其特徵在於:該下料區包含複數個區域,該等區域之相鄰排列包含該等待檢測物之所有檢測結果的組合,該處理單元根據該等待檢測物之檢測結果,以控制該下料擺放系統將拾起的該等待檢測物移動對應至複數個目標區域,而該等目標區域之相鄰排列相應於該等待檢測物之檢測結果,俾使該下料擺放系統將該等待檢測物一次性擺放至該等目標區域。 An optical detection system includes: at least one platform for carrying a plurality of objects to be detected; and a loading and placing system for placing a plurality of objects to be detected on the platform at a time; an image capturing system, in order Shooting a plurality of detection images of the waiting for detection; a processing unit receiving the detection images to detect the detection result of the waiting detection object; and a sampling placement system for picking up the waiting detection object from the platform at a time Positioning to the next material zone; wherein the blanking zone comprises a plurality of regions, the adjacent arrangement of the regions comprising a combination of all the detection results of the waiting for the detection object, the processing unit according to the waiting detection object The detection result is controlled to control the feeding placement system to move the picked up waiting object corresponding to the plurality of target areas, and the adjacent arrangement of the target areas corresponds to the detection result of the waiting for detecting object, so that the lowering The material placement system places the waiting detectors in the target area at one time. 如申請專利範圍第1項所述之光學式瑕疵檢測系統,其中該檢測結果包含OK件,以表示該待檢測物無瑕疵;以及NG件,以表示該待檢測物存在瑕疵。 The optical flaw detection system according to claim 1, wherein the detection result includes an OK member to indicate that the object to be detected is flawless; and an NG member to indicate that the object to be detected exists in the flaw. 如申請專利範圍第2項所述之光學式瑕疵檢測系統,其中該平台承載2個待檢測物,則該等區域之相鄰排列為選自以下排列之一:[OK區、OK區、NG區、NG區、OK區]、[NG區、NG區、OK區、OK區、NG區]、[NG區、OK區、OK區、NG區、NG區]以及[OK區、NG區、NG區、OK區、OK區],其中該OK區用以擺放OK件,該NG區用以擺放NG件。 The optical enthalpy detection system of claim 2, wherein the platform carries two objects to be detected, and the adjacent arrangement of the regions is selected from one of the following arrangements: [OK area, OK area, NG District, NG District, OK Zone], [NG Zone, NG Zone, OK Zone, OK Zone, NG Zone], [NG Zone, OK Zone, OK Zone, NG Zone, NG Zone] and [OK Zone, NG Zone, NG area, OK area, OK area], where the OK area is used for placing OK pieces, and the NG area is used for placing NG pieces. 如申請專利範圍第2項所述之光學式瑕疵檢測系統,其中該平台承載2個 待檢測物,則該處理單元檢測出2個待檢測物之所有檢測結果的組合包含:[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件]。 The optical flaw detection system according to claim 2, wherein the platform carries 2 For the object to be detected, the processing unit detects that the combination of all the detection results of the two objects to be detected includes: [OK, OK], [NG, NG], [OK, NG], and [NG] , OK pieces]. 如申請專利範圍第2項所述之光學式瑕疵檢測系統,其中該平台承載2個待檢測物,則該2個目標區域之相鄰排列包含:[OK區、OK區]、[NG區、NG區]、[OK區、NG區]以及[NG區、OK區],其中該OK區用以擺放OK件,該NG區用以擺放NG件。 The optical enthalpy detection system according to claim 2, wherein the platform carries two objects to be detected, and the adjacent arrangement of the two target areas comprises: [OK area, OK area], [NG area, NG area], [OK area, NG area] and [NG area, OK area], where the OK area is used for placing OK pieces, and the NG area is used for placing NG pieces. 一種下料擺放系統,使用於一光學式瑕疵檢測系統,該光學式瑕疵檢測系統包含:至少一平台,用以承載複數個待檢測物;一影像拍攝系統,依序拍攝該等待檢測物之複數個檢測影像;以及,一處理單元,接收該等檢測影像,以檢測出該等待檢測物之檢測結果;其特徵在於:該下料擺放系統包含複數個下料手臂,該等下料手臂從該平台一次性拾起該等待檢測物,以擺放至一下料區;其中,該下料區包含複數個區域,該等區域之相鄰排列包含該等待檢測物之所有檢測結果的組合。 A blank placement system for use in an optical detection system comprising: at least one platform for carrying a plurality of objects to be detected; and an image capture system for sequentially photographing the waiting for detection a plurality of detection images; and a processing unit receiving the detection images to detect the detection result of the waiting detection object; wherein the blank placement system comprises a plurality of blanking arms, the cutting arms The waiting for detecting object is picked up from the platform at a time to be placed in the sampling area; wherein the blanking area includes a plurality of regions, and the adjacent arrangement of the regions includes a combination of all the detection results of the waiting for the detecting object. 如申請專利範圍第6項所述之下料擺放系統,其中該處理單元根據該等待檢測物之檢測結果,以控制該下料擺放系統將拾起的該等待檢測物移動對應至複數個目標區域,而該等目標區域之相鄰排列相應於該等待檢測物之檢測結果,俾使該下料擺放系統將該等待檢測物一次性擺放至該等目標區域。 The material placement system as described in claim 6 , wherein the processing unit controls the blank placement system to move the picked up detection object corresponding to the plurality of materials according to the detection result of the waiting detection object The target area, and the adjacent arrangement of the target areas corresponds to the detection result of the waiting for detection, so that the blank placement system positions the waiting detection object to the target areas at one time. 如申請專利範圍第6項所述之下料擺放系統,其中該檢測結果包含OK件,以表示該待檢測物無瑕疵;以及NG件,以表示該待檢測物存在瑕疵。 The material placement system as described in claim 6 wherein the detection result includes an OK member to indicate that the object to be inspected is flawless; and an NG member to indicate that the object to be detected is present. 如申請專利範圍第8項所述之下料擺放系統,其中該平台承載2個待檢測 物,則該等區域之相鄰排列為選自以下排列之一:[OK區、OK區、NG區、NG區、OK區]、[NG區、NG區、OK區、OK區、NG區]、[NG區、OK區、OK區、NG區、NG區]以及[OK區、NG區、NG區、OK區、OK區],其中該OK區用以擺放OK件,該NG區用以擺放NG件。 For example, the material placement system described in item 8 of the patent application scope, wherein the platform carries 2 to be tested The adjacent arrangement of the regions is selected from one of the following arrangements: [OK zone, OK zone, NG zone, NG zone, OK zone], [NG zone, NG zone, OK zone, OK zone, NG zone) ], [NG Zone, OK Zone, OK Zone, NG Zone, NG Zone] and [OK Zone, NG Zone, NG Zone, OK Zone, OK Zone], where the OK zone is used to place OK pieces, the NG zone Used to place NG pieces. 如申請專利範圍第8項所述之下料擺放系統,其中該平台承載2個待檢測物,則該處理單元檢測出2個待檢測物之所有檢測結果的組合包含:[OK件、OK件]、[NG件、NG件]、[OK件、NG件]以及[NG件、OK件]。 For example, in the material placement system described in Item 8 of the patent application, wherein the platform carries two objects to be detected, the processing unit detects that the combination of all the detection results of the two objects to be detected includes: [OK, OK [], [NG, NG], [OK, NG] and [NG, OK].
TW107214538U 2018-10-26 2018-10-26 Optical flaw detection system and its material placement system TWM574234U (en)

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