TWM568752U - Machining system - Google Patents

Machining system Download PDF

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Publication number
TWM568752U
TWM568752U TW107208518U TW107208518U TWM568752U TW M568752 U TWM568752 U TW M568752U TW 107208518 U TW107208518 U TW 107208518U TW 107208518 U TW107208518 U TW 107208518U TW M568752 U TWM568752 U TW M568752U
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Taiwan
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processing
machining
point
height
workpiece
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TW107208518U
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Chinese (zh)
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蔡侑庭
林儀婷
沈彥廷
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新代科技股份有限公司
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Priority to TW107208518U priority Critical patent/TWM568752U/en
Publication of TWM568752U publication Critical patent/TWM568752U/en

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  • Length Measuring Devices By Optical Means (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

The utility model provides a machining system, which includes a workpiece platform, a height measuring unit, a machining head and an axis control unit. An unmachined workpiece is arranged on the workpiece platform. The height measuring unit is used to measure the height of the unmachined workpiece. The machining head is connected to the height measuring unit through a machining mechanism, and the machining head is capable of machining the unmachined workpiece. The axis control unit sets a machining mechanism information of the machining mechanism. The height measuring unit, controlled by the axis control unit, measures the height of the unmachined workpiece on a machining path in the first place. The axis control unit further adjusts machining height and rotation angle of the machining head according to the plane height measured in advance. Thus, the axis control unit controls the machining head to machine the unmachined workpiece along the machining path.

Description

加工系統Processing system

本創作是有關於一種加工系統,尤其是指一種可以事先沿著待加工工件的加工路徑進行掃描其工件高度再對待加工工件進行加工,以減少加工時間的預先測高補償的加工系統。The present invention relates to a processing system, in particular to a processing system that can scan a workpiece height along a machining path of a workpiece to be processed before processing the workpiece to reduce the processing time.

近代工業中,為了對產品進行更精密的作業如點膠、雷射切割等,加工機台已是工廠內不可或缺的設備。由於進行量產時工件或半成品可能會因為製造過程時的各種因素造成一致性不佳,工件或半成品的表面可能會有平整度不一的現象,因此為了能夠順利對表面不平整的工件或半成品進行加工處理,現有的加工機台的加工頭旁會直接裝設一個測高裝置,這種測高裝置可用於量測工件或半成品於加工機台的工件平台上的高度以防止加工機台上的加工頭與這些工件或半成品碰撞而造成損壞,其中測高裝置通常裝設在加工頭的一側,例如是與加工頭共同固定於一支機械臂上,如此一來即可藉由一支機械臂同時控制加工頭與測高裝置並減少機台設計的困難度,但該方式會造成測高裝置的活動維度受限,因此無法於加工時即預先偵測其加工物件高度。In modern industry, processing machines are indispensable equipment in the factory for more precise operations such as dispensing and laser cutting. Since the workpiece or semi-finished product may be inconsistent due to various factors in the manufacturing process during mass production, the surface of the workpiece or semi-finished product may have flatness, so in order to smoothly smooth the surface or semi-finished product For processing, an altimetry device is directly installed next to the processing head of the existing processing machine. This altimetry device can be used to measure the height of the workpiece or semi-finished product on the workpiece platform of the processing machine to prevent the processing machine. The processing head collides with these workpieces or semi-finished products to cause damage. The height measuring device is usually installed on one side of the processing head, for example, fixed to a robot arm together with the processing head, so that one can be used by one The robot arm simultaneously controls the machining head and the height measuring device and reduces the difficulty of the machine design. However, this method causes the height dimension of the height measuring device to be limited, so that the height of the processed object cannot be detected in advance during processing.

在運用現有的加工機台進行加工作業時,會先移動測高裝置對準工件或半成品上的待加工處進行平面高度量測以得到高度量測值,之後將這些高度量測值進行運算並補償至加工頭的加工高度,再移動加工頭到待加工處進行加工。舉例而言,當工件上的待加工處為多個點時,加工機台例如是先移動測高裝置量測第一個待加工點的高度後,之後再移動加工頭對第一個待加工點進行加工,而後加工機台再移動測高裝置到工件上的第二個待加工點進行高度量測,再移動加工頭對第二個待加工點進行加工,以此依序進行各待加工點的高度量測與加工,因此該先前技術則需先測高,測高後再點膠或雷射切割,測高與加工是無法同時進行的,而造成加工時間的增加。When using the existing processing machine for machining operations, the height measuring device is first aligned with the workpiece to be processed on the workpiece or the semi-finished product to measure the height of the plane to obtain the height measurement value, and then the height measurement values are calculated and Compensate to the machining height of the machining head, and then move the machining head to the machining place for processing. For example, when the workpiece to be processed is a plurality of points on the workpiece, the processing machine, for example, first moves the height measuring device to measure the height of the first point to be processed, and then moves the processing head to the first to be processed. The point is processed, and the processing machine then moves the height measuring device to the second point to be processed on the workpiece for height measurement, and then moves the processing head to process the second point to be processed, thereby sequentially processing each to be processed. The height measurement and processing of the point, so the prior art needs to be measured first, after the height measurement and then the glue or laser cutting, the height measurement and the processing can not be carried out at the same time, resulting in an increase in processing time.

此外,當工件上的待加工處的型態為多條線段或是需連續進行加工時,首先需向加工機台輸入工件的加工路徑資訊,例如加工路徑的轉折處座標,加工機台再移動測高裝置至這些轉折處進行高度量測,之後再移動加工頭沿加工路徑進行加工作業,但此種方式由於僅對各加工路徑上的轉折處進行高度量測,若各轉折處之間的加工路徑有高度變化存在時,加工頭極有可能在沿加工路徑移動時撞擊到工件造成加工頭或工件的損壞。為了預防上述情況的發生,加工機台也可設計成先控制測高裝置沿加工路徑進行整體加工路徑的高度量測,再將高度量測結果補償至加工路徑資訊進行加工高度修正,最後加工頭再沿修正後的加工路徑對工件或半成品進行加工,然而這樣一來需掃描加工路徑兩次,故將會大幅增加加工所需時間。因此,無論是上述哪一種加工狀況,目前都需要一種新的加工系統以減少加工時間並可同時降低加工頭撞擊工件或半成品的可能性。In addition, when the type of the workpiece to be processed on the workpiece is a plurality of line segments or needs to be continuously processed, it is first necessary to input the machining path information of the workpiece to the processing machine, for example, the coordinate of the turning point of the machining path, and the processing machine moves again. The height measuring device measures the height of the turning point, and then moves the processing head along the processing path for processing, but this method only measures the height of the turning point on each processing path, if between the turning points When there is a height change in the machining path, it is highly probable that the machining head will hit the workpiece as it moves along the machining path, causing damage to the machining head or workpiece. In order to prevent the above situation, the processing machine can also be designed to first control the height measuring device to measure the height of the overall machining path along the machining path, and then compensate the height measurement result to the machining path information for machining height correction, and finally the machining head. The workpiece or semi-finished product is processed along the corrected machining path. However, the machining path needs to be scanned twice, which will greatly increase the processing time. Therefore, no matter which of the above processing conditions, a new processing system is currently required to reduce the processing time and at the same time reduce the possibility of the processing head hitting the workpiece or the semi-finished product.

”先前技術”段落只是用來幫助了解本創作內容,因此在“先前技術”段落所揭露的內容可能包含一些沒有構成所屬技術領域中具有通常知識者所知道的習知技術。在“先前技術”段落所揭露的內容,不代表該內容或者本創作一個或多個實施例所要解決的問題,在本創作申請前已被所屬技術領域中具有通常知識者所知曉或認知。The "previous technical" paragraphs are only intended to aid in understanding the content of the present work, and thus the disclosure of the "previous technical" paragraphs may contain some conventional techniques that are not known to those of ordinary skill in the art. The matters disclosed in the "Prior Art" section, which do not represent the subject matter or problems to be solved by one or more embodiments of the present invention, are known or recognized by those of ordinary skill in the art prior to the present application.

本創作的主要目的是提供一種加工系統,藉由事先沿著待加工工件的加工軌跡進行量測待加工工件的高度,再對待加工工件進行加工,可降低加工所需時間並減少加工頭與待加工工件撞擊的可能性。The main purpose of this creation is to provide a machining system that measures the height of the workpiece to be machined by machining along the machining path of the workpiece to be machined, and then processes the workpiece to reduce the time required for machining and reduce the processing head and waiting The possibility of machining a workpiece impact.

本創作的另一目的在於利用測高單元的旋轉平台,因應加工點的位置改變角度,提早預判出下個加工點的高度,減少加工頭所需要移動的距離,以及高度檢測流程的時間。傳統的檢測時間為探頭掃描加上塗膠過程,兩倍的加工時間,預判測高可在掃描的同時直接塗膠。Another purpose of this creation is to use the rotating platform of the altimetry unit to change the angle of the machining point in advance, to pre-determine the height of the next machining point, to reduce the distance that the machining head needs to move, and the time of the height detection process. The traditional detection time is the probe scanning plus the glue coating process, twice the processing time, and the pre-determined height can be directly applied while scanning.

本創作的再一目的是透過測高單元會先經過加工路徑,掃描得到工件高度後,回傳給加工頭,預判高度流程有效避免撞針。A further object of the creation is that the height measuring unit first passes through the machining path, scans the height of the workpiece, and then returns it to the processing head, and predicts the height process to effectively avoid the striker.

本創作的又一目的在於可應用於點膠機、銲接機或雷射切割機等需要偵測加工高度的工具機上,不限制工具機的種類與廠牌,只要加工頭需要Z軸方向的高度偵測,此軟硬體設計皆可適用。Another purpose of this creation is that it can be applied to a machine tool that needs to detect the processing height, such as a dispenser, a welding machine or a laser cutting machine, without limiting the type of the machine tool and the brand, as long as the machining head needs the Z-axis direction. Highly detectable, this soft and hard design is applicable.

為達上述目的,本創作揭露一種加工系統,包括工件平台、測高單元、加工頭以及軸控單元。工件平台用以承載待加工工件。測高單元用以量測待加工工件的平面高度。加工頭用以加工待加工工件,並透過加工機構與測高單元連接。軸控單元用以設定加工機構的加工機構資訊,藉此,軸控單元用以控制測高單元在待加工工件的一加工路徑上預先量測待加工工件的平面高度,並控制加工頭依據測高單元所預先量測到待加工工件在加工路徑上的平面高度以調整加工高度及旋轉角度,進一步在加工路徑上對待加工工件進行加工。To achieve the above objectives, the present disclosure discloses a processing system including a workpiece platform, a height measuring unit, a machining head, and a shaft control unit. The workpiece platform is used to carry the workpiece to be processed. The altimetry unit is used to measure the plane height of the workpiece to be machined. The machining head is used to machine the workpiece to be processed and connected to the altimeter unit through the machining mechanism. The axis control unit is used to set the processing mechanism information of the processing mechanism, whereby the axis control unit is configured to control the height measuring unit to pre-measure the plane height of the workpiece to be processed on a machining path of the workpiece to be processed, and control the machining head according to the measurement. The high unit pre-measures the plane height of the workpiece to be processed on the machining path to adjust the machining height and the rotation angle, and further processes the workpiece to be processed on the machining path.

基於上述,本創作的實施例至少具有以下其中一個優點或功效。本創作的加工系統中,加工頭與承載平台透過連桿機構樞接使得連桿機構可沿著加工頭旋轉,軸控單元控制測高單元在待加工工件的加工路徑上預先量測待加工工件的平面高度,並依據測高單元所預先量測到待加工工件在加工路徑上的平面高度以調整加工頭的加工高度及旋轉角度,因此可降低加工所需時間並減少加工頭與待加工工件撞擊的可能性。Based on the above, the embodiment of the present creation has at least one of the following advantages or effects. In the processing system of the present invention, the processing head and the carrying platform are pivotally connected through the link mechanism so that the link mechanism can rotate along the processing head, and the axis control unit controls the altimetry unit to pre-measure the workpiece to be processed on the machining path of the workpiece to be processed. The height of the plane is adjusted according to the height of the plane of the workpiece to be machined on the machining path according to the height measuring unit to adjust the machining height and the rotation angle of the machining head, thereby reducing the processing time and reducing the machining head and the workpiece to be processed. The possibility of impact.

為讓本創作的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above features and advantages of the present invention more comprehensible, the following embodiments are described in detail with reference to the accompanying drawings.

有關本創作之前述及其他技術內容、特點與功效,在以下配合參考圖式之一較佳實施例的詳細說明中,將可清楚的呈現。以下實施例中所提到的方向用語,例如:上、下、左、右、前或後等,僅是參考附加圖式的方向或是圖式中各元件的相對位置。因此,使用的方向用語是用來說明並非用來限制本創作。The above and other technical contents, features and effects of the present invention will be apparent from the following detailed description of the preferred embodiments. The directional terms mentioned in the following embodiments, for example, up, down, left, right, front or rear, etc., are merely referenced to the direction of the additional drawings or the relative positions of the elements in the drawings. Therefore, the directional terminology used is used to illustrate that it is not intended to limit the creation.

請參考圖1,圖1是根據本創作所揭露的技術,表示加工系統的示意圖。加工系統10包括工件平台11、測高單元12、加工頭13、軸控單元14以及加工機構19,測高單元12係透過加工機構19與加工頭13連接,加工機構19包括承載平台16、連桿機構17以及移動機構18。待加工工件15配置於工件平台11上,測高單元12、加工頭13以及加工機構19於待加工工件15之上方,測高單元12設置於加工機構19中的承載平台16上,且用以量測待加工工件15的平面高度。承載平台16透過連桿機構17樞接於加工頭13,連桿機構17可沿加工頭13旋轉,換句話說,測高單元12可透過承載平台16以及連桿機構17於加工頭13周圍旋轉,即測高單元12可透過連桿機構17以加工頭13為圓心進行旋轉,測高單元12、加工頭13、承載平台16以及連桿機構17透過移動機構18於待加工工件15的上方移動。本實施例中,加工機構19的移動機構18例如是可在一個平行於工件平台11且位於待加工工件15上方的平面自由移動的載具,加工頭13結合於此載具,其中載具例如是藉由多個滑動方向不同的滑軌調整與待加工工件15的相對位置,然而移動機構18也可以機械臂等其他適當的機構加以實施,本創作並不以此為限。軸控單元14用以設定加工機構19的一加工機構資訊以控制加工機構19協助進行測高與加工,上述加工機構資訊可分別設定承載平台16、連桿機構17與移動機構18的其中至少一個加工參數,其中上述加工機構資訊可為承載平台16、連桿機構17與移動機構18之作動參數或訊息等,但不限於此,如此一來可降低使用者操作加工機構19的複雜度。因此軸控單元14可透過加工機構資訊控制承載平台16、連桿機構17與移動機構18的其中至少一個加工參數,藉此軸控單元14可用以控制測高單元12在待加工工件15的加工路徑151上預先量測待加工工件的平面高度,軸控單元14並控制加工頭13依據待加工工件15在加工路徑151上的平面高度以調整加工高度及旋轉角度,進一步在加工路徑151上對待加工工件15進行加工,換句話說,軸控單元14可用以控制測高單元12預先量測待加工工件的平面高度之同時控制加工頭13進行加工,其中,加工參數例如是加工頭13與測高單元12於工件平台11上的間距,此間距用以供軸控單元14進行動態微調加工頭13與測高單元12,或例如該加工參數也可以為加工頭13與測高單元12的距離,亦為連桿機構17的長度,然而操作者也可以輸入其他適當的加工參數至軸控單元14,例如測高裝置12、加工頭13、加工機構19的移動速度、加速或減速時間、或加加速度限制等,本創作並不以此為限。Please refer to FIG. 1. FIG. 1 is a schematic diagram showing a processing system according to the technology disclosed in the present application. The processing system 10 includes a workpiece platform 11, a height measuring unit 12, a processing head 13, a shaft control unit 14, and a processing mechanism 19. The height measuring unit 12 is connected to the processing head 13 through a processing mechanism 19, and the processing mechanism 19 includes a carrying platform 16, The lever mechanism 17 and the moving mechanism 18. The workpiece to be processed 15 is disposed on the workpiece platform 11, and the altimeter unit 12, the processing head 13 and the processing mechanism 19 are above the workpiece 15 to be processed, and the altimeter unit 12 is disposed on the carrying platform 16 in the processing mechanism 19, and is used for The plane height of the workpiece 15 to be processed is measured. The carrying platform 16 is pivotally connected to the processing head 13 via a link mechanism 17, and the link mechanism 17 is rotatable along the processing head 13. In other words, the altimetry unit 12 is rotatable around the processing head 13 through the carrying platform 16 and the link mechanism 17. That is, the altimeter unit 12 can be rotated by the processing mechanism 13 through the link mechanism 17, and the altimetry unit 12, the processing head 13, the carrying platform 16, and the link mechanism 17 are moved over the workpiece 15 to be processed through the moving mechanism 18. . In this embodiment, the moving mechanism 18 of the processing mechanism 19 is, for example, a carrier that is free to move in a plane parallel to the workpiece platform 11 and above the workpiece 15 to be processed, the processing head 13 being coupled to the carrier, wherein the carrier, for example The relative position of the workpiece 15 to be processed is adjusted by a plurality of slide rails having different sliding directions. However, the moving mechanism 18 can also be implemented by other suitable mechanisms such as a robot arm, and the present invention is not limited thereto. The axis control unit 14 is configured to set a processing mechanism information of the processing mechanism 19 to control the processing mechanism 19 to assist in height measurement and processing, and the processing mechanism information can respectively set at least one of the carrier platform 16, the link mechanism 17 and the moving mechanism 18. The processing parameter, wherein the processing mechanism information may be an operating parameter or message of the carrying platform 16, the link mechanism 17 and the moving mechanism 18, but is not limited thereto, thereby reducing the complexity of the user operating the processing mechanism 19. Therefore, the axis control unit 14 can control at least one of the processing parameters of the carrier platform 16, the link mechanism 17 and the moving mechanism 18 through the processing mechanism information, whereby the axis control unit 14 can be used to control the processing of the workpiece 15 to be processed by the height measuring unit 12. The plane height of the workpiece to be processed is pre-measured on the path 151, and the axis control unit 14 controls the processing head 13 to adjust the processing height and the rotation angle according to the plane height of the workpiece 15 to be processed on the processing path 151, and further treats the processing path 151. The processing workpiece 15 is processed, in other words, the axis control unit 14 can be used to control the height measuring unit 12 to pre-measure the plane height of the workpiece to be processed while controlling the processing head 13 for processing, wherein the processing parameters are, for example, the processing head 13 and the measurement The spacing of the high unit 12 on the workpiece platform 11 is used for the axis control unit 14 to dynamically fine-tune the processing head 13 and the altimeter unit 12, or for example, the processing parameter may also be the distance between the processing head 13 and the altimeter unit 12. Also, the length of the link mechanism 17, but the operator can also input other suitable processing parameters to the axis control unit 14, such as the height measuring device 12, the processing head 13 The movement speed of the processing mechanism 19, the acceleration or deceleration time, or the jerk limitation, etc., are not limited to this creation.

本實施例中,測高單元12例如是雷射位移計(Laser Displacement Meter),雷射位移計可發出雷射光照射工件表面並感測待加工工件表面所反射的光線,當待加工工件表面的高度不同時,雷射位移計內的感測器所接收到的光線其成像位置也有所不同,再藉由三角測量法計算後可得到待加工工件的平面高度量測結果。然而測高單元12也可採用其他形式的接觸式(例如三次元量測儀,CMM,Coordinate Measuring Machine)或非接觸式(例如CCD,Charge Coupled Device)高度量測儀器,本創作對此不加以限制。此外,加工頭13例如是點膠機的點膠針頭或點膠閥、金屬銲接機的銲接頭、雷射切割機的雷射切割頭或其他可直接對工件表面進行加工的裝置,軸控單元 14例如是具有單核心或多核心的中央處理單元(Central Processing Unit,CPU),或是其他可程式化之一般用途或特殊用途的微處理器(Microprocessor)、數位訊號處理器(Digital Signal Processor,DSP)、可程式化控制器、特殊應用積體電路(Application Specific Integrated Circuit,ASIC)或其他類似元件或上述元件的組合,本創作對此亦不加以限制。In this embodiment, the altimetry unit 12 is, for example, a Laser Displacement Meter, which emits laser light to illuminate the surface of the workpiece and sense the light reflected by the surface of the workpiece to be processed, when the surface of the workpiece to be processed is When the height is different, the position of the light received by the sensor in the laser displacement meter is different, and the plane height measurement result of the workpiece to be processed can be obtained by triangulation calculation. However, the altimeter unit 12 can also adopt other forms of contact (such as a CMM, Coordinate Measuring Machine) or a non-contact (such as CCD, Charge Coupled Device) height measuring instrument. limit. In addition, the processing head 13 is, for example, a dispensing needle or a dispensing valve of a dispenser, a welding head of a metal welding machine, a laser cutting head of a laser cutting machine or other device capable of directly processing a surface of a workpiece, and an axis control unit 14 For example, a central processing unit (CPU) having a single core or a multi-core, or other programmable general purpose or special purpose microprocessor (Microprocessor), digital signal processor (Digital Signal Processor, The DSP), the programmable controller, the Application Specific Integrated Circuit (ASIC) or other similar components or a combination of the above components are not limited in this creation.

圖2A至圖2D是根據本創作所揭露的技術,表示圖1的加工系統於一實施例中量測待加工工件的平面高度過程的示意圖,其中圖2A至圖2D中省略了部分元件以清楚繪示本創作技術量測待加工工件的平面高度的過程,相同的元件以相同的標號表示,在此不再贅述。請參考圖2A至圖2D並配合圖1,加工路徑151上具有起始點O以及第一加工點A與第二加工點B等兩個待加工位置,其中起始點O至第一加工點A的連線以及第一加工點A至第二加工點B的連線於第一加工點A的夾角θ大於或等於90度。首先,測高單元12先進行起始點O的平面高度的量測後沿加工路徑151量測起始點O與第一加工點A之間的平面高度,加工頭13隨後進行起始點O的加工。接著,加工機構19的移動機構18帶動測高單元12量測第一加工點A的平面高度,而加工頭13也透過移動機構18沿加工路徑151移動,請參考圖2A,該圖2A示意性地繪示測高單元12量測第一加工點A的平面高度的狀況。接著請參考圖2B,測高單元12完成第一加工點A的平面高度量測後傳送第一加工點A的平面高度給軸控單元14,軸控單元14藉由第一加工點A的平面高度調整加工頭13的加工高度,並控制加工機構19的連桿機構17直接樞轉承載平台16與測高單元12至朝向第一加工點A與第二加工點B之間的加工路徑151。請繼續參考圖2C,由於夾角θ大於或等於90度,因此當加工機構19的移動機構18移動加工頭13至第一加工點A進行加工作業時,測高單元12即因連桿機構17的關係可直接往前並量測第一加工點A與第二加工點B之間的加工路徑151的平面高度。參考圖2D,加工頭13完成第一加工點A的加工作業後,移動機構18移動測高單元12量測第二加工點B的平面高度,測高單元12完成第二加工點B的平面高度量測後傳送第二加工點B的平面高度給軸控單元14,以供軸控單元14控制加工頭13的加工高度。2A-2D are schematic diagrams showing the process of measuring the plane height of a workpiece to be processed in an embodiment of the processing system of FIG. 1 according to the technique disclosed in the present application, in which some components are omitted in FIGS. 2A to 2D. The process of measuring the plane height of the workpiece to be processed is shown in the present invention, and the same components are denoted by the same reference numerals and will not be described again. Referring to FIG. 2A to FIG. 2D and FIG. 1 , the processing path 151 has a starting point O and two processing positions, such as a first processing point A and a second processing point B, wherein the starting point O reaches the first processing point. The line connecting the line A and the line connecting the first processing point A to the second processing point B at the first processing point A is greater than or equal to 90 degrees. First, the altimetry unit 12 first performs the measurement of the plane height of the starting point O, and measures the plane height between the starting point O and the first processing point A along the processing path 151, and the processing head 13 then performs the starting point O. Processing. Then, the moving mechanism 18 of the processing mechanism 19 drives the height measuring unit 12 to measure the plane height of the first processing point A, and the processing head 13 also moves along the processing path 151 through the moving mechanism 18. Please refer to FIG. 2A, which is schematically illustrated in FIG. 2A. The condition in which the height measuring unit 12 measures the plane height of the first machining point A is shown. 2B, after the height measuring unit 12 completes the plane height measurement of the first machining point A, the plane height of the first machining point A is transmitted to the axis control unit 14, and the axis control unit 14 is planar by the first machining point A. The machining height of the machining head 13 is adjusted in height, and the linkage mechanism 17 of the machining mechanism 19 is controlled to directly pivot the carrier platform 16 and the altimeter unit 12 to a machining path 151 between the first machining point A and the second machining point B. Referring to FIG. 2C, since the angle θ is greater than or equal to 90 degrees, when the moving mechanism 18 of the processing mechanism 19 moves the processing head 13 to the first processing point A for processing, the height measuring unit 12 is due to the link mechanism 17 The relationship can be directly advanced and the plane height of the machining path 151 between the first machining point A and the second machining point B can be measured. Referring to FIG. 2D, after the processing head 13 completes the processing operation of the first processing point A, the moving mechanism 18 moves the altimetry unit 12 to measure the plane height of the second processing point B, and the altimetry unit 12 completes the plane height of the second processing point B. After the measurement, the plane height of the second machining point B is transmitted to the axis control unit 14 for the axis control unit 14 to control the machining height of the machining head 13.

圖3A至圖3D是根據本創作所揭露的技術,表示圖1的加工系統於另一實施例中量測待加工工件的平面高度的概要示意圖,其中圖3A至圖3D中省略了部分元件以清楚繪示本創作技術量測待加工工件的平面高度的過程,相同的元件以相同的標號表示,在此不再贅述。請先參考圖3A並配合圖1,本實施例中,加工路徑151上還包括第三加工點C,第一加工點A至第二加工點B的連線以及第二加工點B至第三加工點C的連線於第二加工點B的夾角δ小於90度。接著請參考圖3B,當測高單元12量測第二加工點B的平面高度後,測高單元12傳送第二加工點B的高度量測結果至軸控單元14,軸控單元14控制加工機構19的連桿機構17以樞轉測高單元12與承載平台16至第二加工點B與第三加工點C之間的加工路徑151上。請繼續參考圖3C,圖3C為圖3B中加工系統量測待加工工件的平面高度的俯視示意圖,本創作技術中,由於連桿機構17以加工頭13為圓心旋轉,且測高單元12僅能量測其正下方的工件15的平面高度,當測高單元12樞轉至第二加工點B與第三加工點C之間的加工路徑151時,由於夾角δ小於90度,測高單元12將會受限於連桿機構17的旋轉範圍而無法直接量測加工路徑151上的區段152的平面高度。此時軸控單元14會依據第二加工點B的平面高度計算區段152的高度補償資訊,並藉由此高度補償資訊調整加工頭13的加工高度,其中高度補償資訊例如是以一函數進行運算,該函數可為線性函式或非線性函數或及其他適當函式進行運算,推算出區段152的高度資訊以調整、修正加工頭13的加工高度。請參考圖3D,移動機構18帶動加工頭13至第二加工點B進行加工作業,軸控單元14控制連桿機構18樞轉以使測高單元12量測第二加工點B至第三加工點C之間的加工路徑151的平面高度。因此,根據本實施例的預測高度的步驟流程,可以應用於連續加工的製程中,而不會因加工機構19的機構限制而導致加工頭13撞擊工件15。舉例而言,在連續塗膠的過程中,將測高單元所預量的高度即時的回授給點膠頭,當測高單元掃描之後就可以帶動點膠頭直接塗膠,不需要等待測高單元掃描所有的加工路徑之後才切換塗膠作業,可以一邊量測塗膠的高度以及一邊進行塗膠,節省加工的時間。3A to 3D are schematic diagrams showing the planar height of the workpiece to be processed in another embodiment in accordance with the technique disclosed in the present disclosure, wherein some of the components are omitted in FIGS. 3A to 3D. The process of measuring the plane height of the workpiece to be processed is clearly illustrated in the present invention, and the same components are denoted by the same reference numerals and will not be described again. Referring to FIG. 3A and FIG. 1 together, in the embodiment, the processing path 151 further includes a third processing point C, a connection line from the first processing point A to the second processing point B, and a second processing point B to the third. The angle δ of the line connecting the processing point C to the second processing point B is less than 90 degrees. Referring to FIG. 3B, after the altimetry unit 12 measures the plane height of the second machining point B, the altimetry unit 12 transmits the height measurement result of the second machining point B to the axis control unit 14, and the axis control unit 14 controls the machining. The linkage 17 of the mechanism 19 pivots the acuity unit 12 and the carrier platform 16 to a processing path 151 between the second machining point B and the third machining point C. Please refer to FIG. 3C. FIG. 3C is a top plan view showing the plane height of the workpiece to be processed in the processing system of FIG. 3B. In the prior art, since the link mechanism 17 is rotated by the machining head 13, the height measuring unit 12 only The energy is measured as the plane height of the workpiece 15 directly below, and when the altimetry unit 12 is pivoted to the machining path 151 between the second machining point B and the third machining point C, since the angle δ is less than 90 degrees, the altimeter unit 12 will be limited by the range of rotation of the linkage mechanism 17 and will not directly measure the plane height of the section 152 on the machining path 151. At this time, the axis control unit 14 calculates the height compensation information of the section 152 according to the plane height of the second processing point B, and adjusts the processing height of the processing head 13 by using the height compensation information, wherein the height compensation information is performed, for example, by a function. The operation can be performed by a linear or non-linear function or other suitable function to derive the height information of the segment 152 to adjust and correct the processing height of the processing head 13. Referring to FIG. 3D, the moving mechanism 18 drives the processing head 13 to the second processing point B for processing. The axis control unit 14 controls the linkage mechanism 18 to pivot to cause the altimetry unit 12 to measure the second processing point B to the third processing. The plane height of the processing path 151 between points C. Therefore, the step flow of predicting the height according to the present embodiment can be applied to the process of continuous machining without causing the machining head 13 to strike the workpiece 15 due to the mechanism limitation of the machining mechanism 19. For example, in the process of continuous glue application, the height of the height measuring unit is instantaneously fed back to the dispensing head, and when the height measuring unit scans, the dispensing head can be directly coated, without waiting for testing. After the high unit scans all the processing paths, the glue application is switched, and the height of the glue can be measured and the glue can be applied while the processing time is saved.

圖4A至圖4D是根據本創作所揭露的技術,表示圖1的加工系統於再一實施例中量測待加工工件的平面高度的概要示意圖,其中圖4A至圖4D省略了部分元件以清楚繪示本創作技術量測待加工工件的平面高度的過程,相同的元件以相同的標號表示,在此不再贅述。請先參考圖4A並配合圖1,本實施例中,加工路徑151上還包括第三加工點C,第一加工點A至第二加工點B的連線以及第二加工點B至第三加工點C的連線於第二加工點B的夾角δ小於90度。接著請參考圖4B,當測高單元12量測第二加工點B的平面高度後,測高單元12傳送第二加工點B的高度量測結果至軸控單元14,軸控單元14控制移動機構18以使測高單元12與加工頭13朝遠離加工路徑151的方向移動,換句話說,移動機構18帶動測高單元12與加工頭13往遠離加工路徑151的方向位移後,移動機構18帶動測高單元12與加工頭13再往前,使測高單元12開始測高並且加工頭13進行加工,以確保所有加工路徑皆可被量測到,圖4B中例如是朝第二加工點B的右上方移動一段距離,但並不以此為限。繼續參考圖4C,軸控單元14控制連桿機構17樞轉測高單元12與承載平台16至朝向第二加工點B與第三加工點C之間的加工路徑151。參考圖4D,移動機構18移動加工頭13至第二加工點B進行加工作業的過程中,測高單元12同時量測第二加工點B至第三加工點C之間的加工路徑181的平面高度。因此,根據本實施例所揭露的預測高度的步驟流程,可以應用於連續加工的製程中,而不會因加工機構19的機構限制而導致加工頭13撞擊工件15。此外,本實施例所具備的優點與圖3A至圖3D所述的實施例雖大致相同,但圖3A至圖3D所述的實施例因較強調連桿機構17的直接旋轉,而造成測高單元12會有一區段152該無法量測其高度, 故才需要透過一函數進行高度補償資訊的運算,該圖3A至圖3D所述的實施例較適合當區段152的高度落差不大時,或移動機構18無法帶動測高單元12與加工頭13往遠離加工路徑151的方向位移時如怕撞到其他加工物件,更適合使用圖3A至圖3D所述的實施例,因此,與本實施例的使用情境上不完全相同。4A to 4D are schematic diagrams showing the planar height of the workpiece to be processed in the processing system of FIG. 1 according to the technique disclosed in the present disclosure, wherein some components are omitted in FIGS. 4A to 4D. The process of measuring the plane height of the workpiece to be processed is shown in the present invention, and the same components are denoted by the same reference numerals and will not be described again. Referring to FIG. 4A and FIG. 1 together, in the embodiment, the processing path 151 further includes a third processing point C, a connection line between the first processing point A and the second processing point B, and a second processing point B to the third. The angle δ of the line connecting the processing point C to the second processing point B is less than 90 degrees. Next, referring to FIG. 4B, after the altimetry unit 12 measures the plane height of the second machining point B, the altimetry unit 12 transmits the height measurement result of the second machining point B to the axis control unit 14, and the axis control unit 14 controls the movement. The mechanism 18 moves the height measuring unit 12 and the machining head 13 away from the machining path 151. In other words, after the moving mechanism 18 drives the height measuring unit 12 and the machining head 13 to be displaced away from the machining path 151, the moving mechanism 18 Driving the altimeter unit 12 and the machining head 13 further forward, causing the altimetry unit 12 to start the altimetry and the machining head 13 to process to ensure that all the machining paths can be measured, for example, in FIG. 4B toward the second machining point. B moves the upper right side of the distance, but not limited to this. With continued reference to FIG. 4C, the axis control unit 14 controls the linkage mechanism 17 to pivot the altimeter unit 12 and the carrier platform 16 to a machining path 151 between the second machining point B and the third machining point C. Referring to FIG. 4D, in the process in which the moving mechanism 18 moves the machining head 13 to the second machining point B for the machining operation, the height measuring unit 12 simultaneously measures the plane of the machining path 181 between the second machining point B and the third machining point C. height. Therefore, the step flow of predicting height according to the present embodiment can be applied to the process of continuous machining without causing the machining head 13 to strike the workpiece 15 due to the mechanism limitation of the machining mechanism 19. In addition, the advantages of the present embodiment are substantially the same as those of the embodiment described in FIGS. 3A to 3D, but the embodiment described in FIGS. 3A to 3D causes the height measurement due to the emphasis on the direct rotation of the link mechanism 17. The unit 12 has a section 152 which cannot measure its height, so that the operation of the height compensation information needs to be performed through a function. The embodiment described in FIGS. 3A to 3D is more suitable when the height difference of the section 152 is not large. If the moving mechanism 18 is unable to drive the height measuring unit 12 and the processing head 13 to move away from the processing path 151, if it is afraid to hit other processed objects, it is more suitable to use the embodiment described in FIGS. 3A to 3D, and therefore, The use of the embodiments is not completely the same.

惟以上所述者,僅為本創作之較佳實施例而已,當不能以此限定本創作實施之範圍,即大凡依本創作申請專利範圍及創作說明內容所作之簡單的等效變化與修飾,皆仍屬本創作涵蓋之範圍內。另外本創作的任一實施例或申請專利範圍不須達成本創作所揭露之全部目的或優點或特點。此外,摘要部分和標題僅是用來輔助專利文件搜尋之用,並非用來限制本創作之權利範圍。再者,說明書中提及的第一、第二...等,僅用以表示元件的名稱,並非用來限制元件數量上的上限或下限。However, the above descriptions are only preferred embodiments of the present invention, and the scope of the present invention cannot be limited by this, that is, the simple equivalent changes and modifications made by the applicant according to the scope of the patent application and the content of the creation description, They are still covered by this creation. In addition, any embodiment or application of the present invention is not required to achieve all of the objects or advantages or features disclosed in the present disclosure. In addition, the abstract sections and headings are only used to assist in the search for patent documents and are not intended to limit the scope of the invention. Furthermore, the first, second, etc. mentioned in the specification are only used to indicate the names of the components, and are not intended to limit the upper or lower limits of the number of components.

10‧‧‧加工系統10‧‧‧Processing system

11‧‧‧工件平台 11‧‧‧Workpiece platform

12‧‧‧測高單元 12‧‧‧ altimetry unit

13‧‧‧加工頭 13‧‧‧Processing head

14‧‧‧軸控單元 14‧‧‧Axis control unit

15‧‧‧待加工工件 15‧‧‧Workpieces to be machined

151‧‧‧加工路徑 151‧‧‧Processing path

152‧‧‧區段 Section 152‧‧‧

16‧‧‧承載平台 16‧‧‧Loading platform

17‧‧‧連桿機構 17‧‧‧ linkage mechanism

18‧‧‧移動機構 18‧‧‧Mobile agencies

19‧‧‧加工機構 19‧‧‧Processing institutions

A‧‧‧第一加工點 A‧‧‧First processing point

B‧‧‧第二加工點 B‧‧‧Second processing point

C‧‧‧第三加工點 C‧‧‧ third processing point

O‧‧‧起始點 O‧‧‧ starting point

θ、δ‧‧‧夾角 θ, δ‧‧‧ angle

圖1是根據本創作所揭露的技術,表示加工系統的示意圖; 圖2A至圖2D是根據本創作所揭露的技術,表示圖1的加工系統於一實施例中量測待加工工件的平面高度的示意圖; 圖3A至圖3D是根據本創作所揭露的技術,表示圖1的加工系統於另一實施例中量測待加工工件的平面高度的示意圖;以及 圖4A至圖4D是根據本創作所揭露的技術,表示圖1的加工系統於再一實施例中量測待加工工件的平面高度的示意圖。1 is a schematic diagram showing a processing system according to the technology disclosed in the present application; FIGS. 2A to 2D are diagrams showing the plane height of a workpiece to be processed in an embodiment of the processing system of FIG. 1 according to the technique disclosed in the present application. 3A to 3D are schematic views showing the plane height of the workpiece to be processed in another embodiment of the processing system of FIG. 1 according to the technique disclosed in the present invention; and FIGS. 4A to 4D are based on the present creation The disclosed technology represents a schematic diagram of the processing system of FIG. 1 measuring the planar height of the workpiece to be machined in yet another embodiment.

Claims (10)

一種加工系統,包括: 一工件平台,用以承載一待加工工件; 一測高單元,用以量測該待加工工件的一平面高度; 一加工頭,用以加工該待加工工件,並透過一加工機構與該測高單元連接;以及 一軸控單元,用以設定該加工機構的一加工機構資訊以控制該測高單元在該待加工工件的一加工路徑上預先量測該待加工工件的該平面高度,並控制該加工頭依據該測高單元所預先量測到該待加工工件在該加工路徑上的該平面高度以調整加工高度及旋轉角度,進一步在該加工路徑上對該待加工工件進行加工。A processing system comprising: a workpiece platform for carrying a workpiece to be processed; a height measuring unit for measuring a plane height of the workpiece to be processed; and a processing head for processing the workpiece to be processed and transmitting a processing mechanism is connected to the altimetry unit; and a shaft control unit is configured to set a processing mechanism information of the processing mechanism to control the altimetry unit to pre-measure the workpiece to be processed on a machining path of the workpiece to be processed Level of the plane, and controlling the processing head to pre-measure the plane height of the workpiece to be processed on the machining path according to the height measuring unit to adjust the machining height and the rotation angle, and further processing the workpiece on the machining path The workpiece is machined. 如申請專利範圍第1項所述的加工系統,其中該加工機構包括一承載平台、一連桿機構以及一移動機構,其中該測高單元設置於該承載平台,該承載平台透過該連桿機構樞接於該加工頭,該連桿機構可使該測高單元沿該加工頭旋轉。The processing system of claim 1, wherein the processing mechanism comprises a carrying platform, a connecting rod mechanism and a moving mechanism, wherein the altimetry unit is disposed on the carrying platform, and the carrying platform passes through the connecting rod mechanism The pivoting mechanism is coupled to the machining head, and the linkage mechanism rotates the altimetry unit along the machining head. 如申請專利範圍第2項所述的加工系統,其中該軸控單元可透過該加工機構資訊控制該承載平台、該連桿機構與該移動機構的其中至少一個加工參數。The processing system of claim 2, wherein the axis control unit controls the at least one processing parameter of the carrying platform, the link mechanism and the moving mechanism through the processing mechanism information. 如申請專利範圍第3項所述的加工系統,其中該加工參數可為該加工頭與該測高單元於該工件平台上的間距、該連桿機構的長度、或該測高裝置、該加工頭或該加工機構的移動速度、加速或減速時間或加加速度。The processing system of claim 3, wherein the processing parameter is a distance between the processing head and the height measuring unit on the workpiece platform, a length of the link mechanism, or the height measuring device, the processing The moving speed, acceleration or deceleration time or jerk of the head or the machining mechanism. 如申請專利範圍第2項所述的加工系統,其中該加工路徑還包括一第一加工點以及一第二加工點,當該測高單元量測該第一加工點的該平面高度後,該軸控單元控制該連桿機構旋轉該承載平台以及該測高單元至朝向該第一加工點與該第二加工點之間的該加工路徑。The processing system of claim 2, wherein the processing path further includes a first processing point and a second processing point, and after the altimetry unit measures the plane height of the first processing point, The axis control unit controls the linkage mechanism to rotate the carrier platform and the height measuring unit to the machining path between the first machining point and the second machining point. 如申請專利範圍第5項所述的加工系統,其中該加工路徑還包括一起始點,且該起始點至該第一加工點的連線以及該第一加工點至該第二加工點的連線於該第一加工點的夾角大於或等於90度。The processing system of claim 5, wherein the processing path further includes a starting point, and the connecting point of the starting point to the first processing point and the first processing point to the second processing point The angle of the connection to the first processing point is greater than or equal to 90 degrees. 如申請專利範圍第6項所述的加工系統,其中當該加工頭至該第一加工點進行加工作業時,該測高單元即因該連桿機構的關係可直接往前並量測該第一加工點與該第二加工點之間的該加工路徑的平面高度。The processing system of claim 6, wherein when the processing head performs the processing operation to the first processing point, the height measuring unit can directly advance and measure the relationship due to the relationship of the link mechanism. The plane height of the machining path between a machining point and the second machining point. 如申請專利範圍第5項所述的加工系統,其中該加工路徑還包括一第三加工點,且該第一加工點至該第二加工點的連線以及該第二加工點至該第三加工點的連線於該第二加工點的夾角小於90度。The processing system of claim 5, wherein the processing path further includes a third processing point, and the line connecting the first processing point to the second processing point and the second processing point to the third The angle of the line connecting the processing points to the second processing point is less than 90 degrees. 如申請專利範圍第8項所述的加工系統,其中當該測高單元量測該第二加工點的該平面高度後,該軸控單元依據該第二加工點的該平面高度以一函數計算一高度補償資訊並藉由該高度補償資訊調整該加工頭的該加工高度,其中該函數可為線性函數或非線性函數。The processing system of claim 8, wherein when the height measuring unit measures the plane height of the second processing point, the axis control unit calculates a function according to the plane height of the second processing point. A height compensation information is used to adjust the machining height of the machining head by the height compensation information, wherein the function can be a linear function or a nonlinear function. 如申請專利範圍第8項所述的加工系統,其中當該測高單元量測該第二加工點的該平面高度後,該軸控單元控制該測高單元與該加工頭朝偏離該加工路徑的方向移動後,且該軸控單元還控制該連桿機構旋轉該承載平台與該測高單元至朝向該第二加工點與該第三加工點的該加工路徑。The processing system of claim 8, wherein the axis control unit controls the height measuring unit and the processing head to deviate from the processing path after the height measuring unit measures the plane height of the second processing point After the direction is moved, the axis control unit further controls the link mechanism to rotate the carrying platform and the altimetry unit to the machining path toward the second machining point and the third machining point.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI670139B (en) * 2018-06-25 2019-09-01 新代科技股份有限公司 Machining system
TWI738601B (en) * 2020-07-28 2021-09-01 盟立自動化股份有限公司 Method for generating a movement path of a tool
CN113333911A (en) * 2021-05-25 2021-09-03 常州工学院 Mounting device and arc fuse wire material increase equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI670139B (en) * 2018-06-25 2019-09-01 新代科技股份有限公司 Machining system
TWI738601B (en) * 2020-07-28 2021-09-01 盟立自動化股份有限公司 Method for generating a movement path of a tool
US11415959B2 (en) 2020-07-28 2022-08-16 Mirle Automation Corporation Method for generating movement path of tool
CN113333911A (en) * 2021-05-25 2021-09-03 常州工学院 Mounting device and arc fuse wire material increase equipment
CN113333911B (en) * 2021-05-25 2024-03-01 常州工学院 Mounting device and arc fuse material adding equipment

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