TWM544708U - Light-emitting device - Google Patents

Light-emitting device Download PDF

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Publication number
TWM544708U
TWM544708U TW106202048U TW106202048U TWM544708U TW M544708 U TWM544708 U TW M544708U TW 106202048 U TW106202048 U TW 106202048U TW 106202048 U TW106202048 U TW 106202048U TW M544708 U TWM544708 U TW M544708U
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layer
light
substrate
emitting element
conductive oxide
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TW106202048U
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Chinese (zh)
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Yi-Hong Chen
Yong-Long Liang
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Tyntek Corp
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發光元件 Light-emitting element

本創作係有關一種發光元件,特別是有關一種利用線路的設計與對應的封裝製程,達成晶片尺寸封裝(Chip Scale Package)的發光元件。 The present invention relates to a light-emitting element, and more particularly to a light-emitting element that utilizes a circuit design and a corresponding packaging process to achieve a chip scale package.

在發光元件的技術領域中,發光二極體係為目前廣泛應用的產品,其可應用在各種技術領域上,且薄型化與小尺寸的應用越來越廣泛,使得越來越多產品朝向晶片尺寸封裝(Chip Scale Package)的技術發展。例如,目前許多應用發光二極體的產品使用覆晶封裝(flip chip Package)來縮小尺寸與薄型化達到晶片尺寸封裝。 In the technical field of light-emitting elements, the light-emitting diode system is currently widely used, and it can be applied to various technical fields, and the application of thinning and small-sized products is more and more extensive, so that more and more products are oriented toward the wafer size. Technology development of the Chip Scale Package. For example, many current applications using light-emitting diodes use a flip chip package to reduce the size and thickness to a wafer size package.

請參閱第1A圖,其係為習知發光二極體的結構示意圖。發光二極體1包含透明基板11、磊晶層12、13、絕緣層14以及電極15、16。第1A圖中的電極15、16係為水平式的電極結構,在製程上,其係以一金屬球17設置於電極16上方,以使電極15、16的高度一致。然而,在電極16上方設置金屬球17的製程不僅使得電極15、16高低的差異往往造成產品良率不佳,也增加了製造風險與成本。 Please refer to FIG. 1A, which is a schematic structural view of a conventional light-emitting diode. The light-emitting diode 1 includes a transparent substrate 11, epitaxial layers 12, 13, an insulating layer 14, and electrodes 15, 16. The electrodes 15, 16 in Fig. 1A are horizontal electrode structures, and in the process, a metal ball 17 is placed over the electrode 16 so that the heights of the electrodes 15, 16 are uniform. However, the process of arranging the metal balls 17 above the electrodes 16 not only makes the difference in the height of the electrodes 15, 16 often results in poor product yield, but also increases manufacturing risk and cost.

請參閱第1B圖,其係為第1A圖發光二極體結構的改良示意圖。為了克服第1A圖中設置金屬球17造成電極15、16高低落差的問題,在第1B圖的發光二極體1結構中係以絕緣層14形成一凹槽,並將電極16設置於凹槽中,以使電極15、16的高度一致。然而,此種製程不僅必須額外增加設置凹槽的程序,在覆晶封裝製程中所使用的基板11與第1A圖的覆晶製程亦都必須使用透光基板11,因而提升了電極15、16在封裝對準上的困難度。 Please refer to FIG. 1B, which is a schematic diagram of the structure of the light-emitting diode of FIG. 1A. In order to overcome the problem that the metal balls 17 in FIG. 1A are arranged to cause the electrodes 15 and 16 to have a high and low drop, in the structure of the light-emitting diode 1 of FIG. 1B, a groove is formed by the insulating layer 14, and the electrode 16 is placed in the groove. In order to make the heights of the electrodes 15, 16 coincide. However, such a process must not only add a procedure for providing a groove, but also the substrate 11 used in the flip chip process and the flip chip process of FIG. 1A must use the light-transmissive substrate 11, thereby raising the electrodes 15, 16 Difficulties in package alignment.

此外,在發光二極體的製程上一般係以打線電性連接電極,並將打線以及發光二極體本體封裝後,以黏接技術設置於電路板上以形成表面黏著元件(SMD)。一般而言,表面黏著元件的成品厚度有600um、400um、300um等規格厚度。然而,由於打線的製程需要在發光二極體的表面上使用銲球黏接打線,不僅佔用大量面積,後續更必須進行封裝的程序,因而使得發光二極體的整體體積變大,無法達到縮小尺寸與薄型化的目的。 In addition, in the process of the light-emitting diode, the electrode is generally electrically connected by wire bonding, and the wire and the body of the light-emitting diode are packaged, and then disposed on the circuit board by a bonding technology to form a surface-adhesive element (SMD). Generally, the finished thickness of the surface adhesive component has a thickness of 600 um, 400 um, 300 um, and the like. However, since the process of wire bonding requires the use of solder balls to bond wires on the surface of the light-emitting diode, not only a large amount of area is occupied, but also a package process must be performed later, so that the overall volume of the light-emitting diode becomes large and cannot be reduced. The purpose of size and thinning.

再者,使用覆晶封裝來縮小尺寸與薄型化的技術若使用共金製程的方式形成發光二極體的結構,在共金製程的設備使用上則具有更高的標準,因而也增加製造的成本。 Furthermore, the technique of using a flip-chip package to reduce the size and thickness is to form a structure of a light-emitting diode using a common gold process, and has a higher standard in the use of a common-gold process, thereby increasing manufacturing. cost.

據此,如何提供一種更接近晶片尺寸封裝的製程係為目前急需研究的課題。 Accordingly, how to provide a process system closer to the wafer size package is an urgent research topic.

有鑑於上述問題,本創作揭露一種發光元件,包括基板、接合金屬層、導電氧化層、磊晶層、絕緣層、第一歐母接觸層、第二歐母接觸層、第三歐母接觸層以及導線。接合金屬層設置於基板第一部份表面上。導電氧化層設置於接合金屬層上。磊晶層設置於導電氧化層第一部份表面上。絕緣層設置於接合金屬層、導電氧化層及磊晶層第一側邊,以及設置於磊晶層第一部份表面上。第一歐母接觸層設置於基板第二部份表面上。第二歐母接觸層設置於磊晶層第二部份表面上。第三歐母接觸層設置於導電氧化層第二部份表面上。導線電性連接第一歐母接觸層及第二歐母接觸層。 In view of the above problems, the present invention discloses a light-emitting element including a substrate, a bonding metal layer, a conductive oxide layer, an epitaxial layer, an insulating layer, a first mother-ion contact layer, a second mother-ion contact layer, and a third mother-ion contact layer. And wires. The bonding metal layer is disposed on the surface of the first portion of the substrate. A conductive oxide layer is disposed on the bonding metal layer. The epitaxial layer is disposed on the surface of the first portion of the conductive oxide layer. The insulating layer is disposed on the first side of the bonding metal layer, the conductive oxide layer and the epitaxial layer, and on the surface of the first portion of the epitaxial layer. The first ohmic contact layer is disposed on the surface of the second portion of the substrate. The second mother-ion contact layer is disposed on the surface of the second portion of the epitaxial layer. The third ohmic mother contact layer is disposed on the surface of the second portion of the conductive oxide layer. The wire is electrically connected to the first ohmic mother contact layer and the second ohmic mother contact layer.

承上所述,相較於習知技術中,設置金屬球在電極上方以及設置凹槽以使電極的高度一致,本創作藉由設置導線的製程,可更精準地控制電極高度,以避免產生電極高低落差的問題。再者,本創作發光元件藉由設置導線的製程連接歐母接觸層,而非使用打線連接,因而可減少打線製程所需的封裝程序,因而可減小發光元件體積。此外,本創作之發光元件在歐母接觸層上形成導線後,則可直接進行黏著至電路板上的步驟,因而可減少封裝的體積以及減少封裝程序所需使用的設備,進一步降低製造成本,達到簡化程序以及快速生產的功效,以便於廣泛地應用至晶片尺寸封裝的技術領域中。 According to the above, in the prior art, the metal ball is disposed above the electrode and the groove is arranged to make the height of the electrode uniform. This process can control the electrode height more accurately by setting the wire manufacturing process to avoid generation. The problem of high and low electrode drop. Furthermore, the present light-emitting element is connected to the mother-ion contact layer by a process of setting a wire instead of using a wire bonding, thereby reducing the packaging process required for the wire bonding process, thereby reducing the volume of the light-emitting component. In addition, after the light-emitting element of the present invention forms a wire on the mother-ion contact layer, the step of directly bonding to the circuit board can be performed, thereby reducing the volume of the package and reducing the equipment required for the packaging process, thereby further reducing the manufacturing cost. The simplification of the program and the efficiency of rapid production are achieved in order to be widely applied to the technical field of wafer size packaging.

1‧‧‧發光二極體 1‧‧‧Lighting diode

11‧‧‧基板 11‧‧‧Substrate

12、13‧‧‧磊晶層 12, 13‧‧‧ epitaxial layer

14‧‧‧絕緣層 14‧‧‧Insulation

15、16‧‧‧電極 15, 16‧‧‧ electrodes

17‧‧‧金屬球 17‧‧‧metal ball

3、4‧‧‧發光元件 3, 4‧‧‧Lighting elements

31‧‧‧第一基板 31‧‧‧First substrate

32、44‧‧‧磊晶層 32, 44‧‧‧ epitaxial layer

33、43‧‧‧導電氧化層 33, 43‧‧‧ conductive oxide layer

34‧‧‧第一接合金屬層 34‧‧‧First joint metal layer

35‧‧‧第二基板 35‧‧‧second substrate

36‧‧‧第二接合金屬層 36‧‧‧Second joint metal layer

37、371、372、451、452‧‧‧絕緣層 37, 371, 372, 451, 452 ‧ ‧ insulation

38、46‧‧‧導線 38, 46‧‧‧ wire

41‧‧‧基板 41‧‧‧Substrate

42‧‧‧接合金屬層 42‧‧‧Join metal layer

47‧‧‧不導電氧化層 47‧‧‧ Non-conductive oxide layer

471‧‧‧接孔 471‧‧‧Contact hole

E1‧‧‧第一歐母接觸層 E1‧‧‧ first European mother contact layer

E2‧‧‧第二歐母接觸層 E2‧‧‧Second European mother contact layer

E3‧‧‧第三歐母接觸層 E3‧‧‧ third European mother contact layer

S2、S4、S6、S8、S10、S12、S14、S16、S18、S20、S22、S24、S26、S28、S30‧‧‧步驟 S2, S4, S6, S8, S10, S12, S14, S16, S18, S20, S22, S24, S26, S28, S30‧‧

第1A圖係為習知發光二極體的結構示意圖;第1B圖係為第1A圖發光二極體結構的改良示意圖;第2圖係為本創作發光元件製造方法的流程圖;第3A圖至第3H圖係為本創作發光元件製程結構流程圖;第4圖係為本創作發光元件的結構示意圖;以及第5圖係為本創作另一發光元件的結構示意圖。 1A is a schematic structural view of a conventional light-emitting diode; FIG. 1B is a schematic diagram of a light-emitting diode structure of FIG. 1A; FIG. 2 is a flow chart of a method for manufacturing a light-emitting element; FIG. The 3H figure is a flow chart of the process structure of the creative light-emitting element; the fourth figure is a schematic structural view of the light-emitting element of the present invention; and the fifth figure is a schematic structural view of another light-emitting element.

請一併參閱第2圖及第3A圖至第3H圖,其係為本創作發光元件製造方法的流程圖以及製程結構流程圖。發光元件3之製造方法包括下列步驟:於步驟S2中,設置第一基板31。於步驟S4中,形成磊晶層32於第一基板31上。於步驟S6中,形成導電氧化層33於磊晶層32上。於步驟S8中,形成第一接合金屬層34於導電氧化層33上。於步驟S10中,設置第二基板35。於步驟S12中,形成第二接合金屬層36於第二基板35上。於步驟S14中,鍵結第一接合金屬層34及第二接合金屬層36。於步驟S16中,移除第一基板31。於步驟S18中,移除部分磊晶層32。於步驟S20中,移除部分第一接合金屬層34、第二接合金屬層36與導電氧化層33。於步驟S22中,形成絕緣層37,以包覆第二基板35、第一接合金屬層34、第二接合金屬層36、導電氧化層33與磊晶層32。於步驟S24中,移除於第二基板35、導電氧化層33與磊晶層32上之部分絕緣層37,以暴露部分第二基板35 的表面、導電氧化層33的表面與磊晶層32的表面。於步驟S26中,形成第一歐母接觸層E1於第二基板35的表面上,形成第二歐母接觸層E2於磊晶層32的表面上。於步驟S28中,形成第三歐母接觸層E3於導電氧化層33的表面上。於步驟S30中,形成一導線38,以連接第一歐母接觸層E1及第二歐母接觸層E2。 Please refer to FIG. 2 and FIG. 3A to FIG. 3H together, which is a flowchart of the manufacturing method of the light-emitting element and a flow chart of the process structure. The manufacturing method of the light-emitting element 3 includes the following steps: In step S2, the first substrate 31 is disposed. In step S4, an epitaxial layer 32 is formed on the first substrate 31. In step S6, a conductive oxide layer 33 is formed on the epitaxial layer 32. In step S8, a first bonding metal layer 34 is formed on the conductive oxide layer 33. In step S10, the second substrate 35 is disposed. In step S12, a second bonding metal layer 36 is formed on the second substrate 35. In step S14, the first bonding metal layer 34 and the second bonding metal layer 36 are bonded. In step S16, the first substrate 31 is removed. In step S18, a portion of the epitaxial layer 32 is removed. In step S20, a portion of the first bonding metal layer 34, the second bonding metal layer 36, and the conductive oxide layer 33 are removed. In step S22, an insulating layer 37 is formed to cover the second substrate 35, the first bonding metal layer 34, the second bonding metal layer 36, the conductive oxide layer 33, and the epitaxial layer 32. In step S24, a portion of the insulating layer 37 on the second substrate 35, the conductive oxide layer 33 and the epitaxial layer 32 is removed to expose a portion of the second substrate 35. The surface, the surface of the conductive oxide layer 33 and the surface of the epitaxial layer 32. In step S26, a first mother-ion contact layer E1 is formed on the surface of the second substrate 35, and a second mother-ion contact layer E2 is formed on the surface of the epitaxial layer 32. In step S28, a third mother-ion contact layer E3 is formed on the surface of the conductive oxide layer 33. In step S30, a wire 38 is formed to connect the first mother-ion contact layer E1 and the second mother-ion contact layer E2.

於本創作中,第二基板35包括不導電基板,並可使用透光基板或不透光基板。 In the present creation, the second substrate 35 includes a non-conductive substrate, and a light-transmitting substrate or an opaque substrate may be used.

在上述移除部分磊晶層32的步驟中,包括移除第一側邊以及第二側邊的磊晶層32,以暴露部分導電氧化層33的表面,以便於在形成絕緣層37後設置第三歐母接觸層E3。 In the step of removing a portion of the epitaxial layer 32, the epitaxial layer 32 of the first side and the second side is removed to expose a surface of the portion of the conductive oxide layer 33 so as to be disposed after the insulating layer 37 is formed. The third European mother contact layer E3.

移除部分第一接合金屬層34、第二接合金屬層36與導電氧化層33的步驟包括移除第一側邊的第一接合金屬層34、第一側邊的第二接合金屬層36以及第一側邊的導電氧化層33,以便於在移除之後形成絕緣層37,並於第二基板35的表面上設置第一歐母接觸層E1。 The step of removing a portion of the first bonding metal layer 34, the second bonding metal layer 36, and the conductive oxide layer 33 includes removing the first bonding metal layer 34 of the first side, the second bonding metal layer 36 of the first side, and The conductive oxide layer 33 on the first side is formed to form the insulating layer 37 after the removal, and the first mother-ion contact layer E1 is disposed on the surface of the second substrate 35.

需注意的是如第3F圖所示,在移除部分絕緣層37後,係形成絕緣層371、372,其係包覆部分第二基板35表面、部分磊晶層32表面,以及包覆第一側邊的第一接合金屬層34、第一側邊的第二接合金屬層36以及第一側邊的導電氧化層33。 It should be noted that, as shown in FIG. 3F, after removing a portion of the insulating layer 37, insulating layers 371, 372 are formed, which cover a portion of the surface of the second substrate 35, a portion of the surface of the epitaxial layer 32, and a cladding portion. A first bonding metal layer 34 on one side, a second bonding metal layer 36 on the first side, and a conductive oxide layer 33 on the first side.

此外,上述第一歐母接觸層E1、第二歐母接觸層E2及第三歐母接觸層E3並無設置順序的先後,而是可在形成絕緣層371、372後同時設置。 Further, the first ohmic mother contact layer E1, the second ohmic mother contact layer E2, and the third ohmic mother contact layer E3 are not provided in the order of the order, but may be provided simultaneously after the insulating layers 371 and 372 are formed.

於上述步驟中,更包括消減第二基板35之厚度,以便於減小發光元件3整體厚度。發光元件3的整體厚度係介於80至350微米之間,其實際的厚度可根據實務上的設計及需求製作,相較之下,其係遠小於習知技術中發光元件的厚度。第二基板35消減的厚度只需使銀膠或者錫膏可順利電性連接電路板與歐母接觸層的訊號即可,並以黏著技術黏貼發光元件3至電路板上。黏著技術包括表面黏著技術,於本創作中並不以此為限。 In the above steps, the thickness of the second substrate 35 is further reduced to reduce the overall thickness of the light-emitting element 3. The overall thickness of the light-emitting element 3 is between 80 and 350 microns, and its actual thickness can be made according to practical design and requirements, which is much smaller than the thickness of the light-emitting element in the prior art. The thickness of the second substrate 35 is reduced, so that the silver paste or the solder paste can be smoothly electrically connected to the signal of the circuit board and the mother-ion contact layer, and the light-emitting element 3 is adhered to the circuit board by an adhesive technique. Adhesion techniques include surface adhesion techniques and are not limited to this creation.

進一步而言,於本創作中導線38包括任何可以導電的材質,用於傳輸第一歐母接觸層E1及第二歐母接觸層E2的訊號。因此,藉由導線38傳輸第一歐母接觸層E1及第二歐母接觸層E2的導電而非以打線的製程連接第一歐母接觸層E1及第二歐母接觸層E2,可減少封裝發光元件的程序,據此,可達到縮小尺寸與薄型化的目的,並進一步應用於晶片尺寸封裝的技術領域中。 Further, in the present creation, the wire 38 includes any electrically conductive material for transmitting signals of the first mother-ion contact layer E1 and the second mother-ion contact layer E2. Therefore, the conduction of the first ohmic mother contact layer E1 and the second ohmic contact layer E2 is transmitted by the wires 38 instead of the first ohmic mother contact layer E1 and the second ohmic contact layer E2 by a wire bonding process, thereby reducing the package. The procedure of the light-emitting element can achieve the purpose of downsizing and thinning, and is further applied to the technical field of wafer size packaging.

請參閱第4圖,其係為本創作發光元件的結構示意圖。發光元件4包括基板41、接合金屬層42、導電氧化層43、磊晶層44、絕緣層451、452、第一歐母接觸層E1、第二歐母接觸層E2、第三歐母接觸層E3以及導線46。接合金屬層42設置於基板41第一部份表面上。導電氧化層43設置於接合金屬層42上。磊晶層44設置於導電氧化層43第一部份表面上。絕緣層451設置於接合金屬層42、導電氧化層43及磊晶層44第一側邊,以 及設置於磊晶層44第一部份表面上。第一歐母接觸層E1設置於基板41第二部份表面上。第二歐母接觸層E2設置於磊晶層44第二部份表面上。第三歐母接觸層E3設置於導電氧化層43第二部份表面上。導線46電性連接第一歐母接觸層E1及第二歐母接觸層E2。 Please refer to FIG. 4, which is a schematic structural view of the light-emitting element of the present invention. The light-emitting element 4 includes a substrate 41, a bonding metal layer 42, a conductive oxide layer 43, an epitaxial layer 44, an insulating layer 451, 452, a first mother-ion contact layer E1, a second mother-ion contact layer E2, and a third mother-ion contact layer. E3 and wire 46. The bonding metal layer 42 is disposed on the surface of the first portion of the substrate 41. The conductive oxide layer 43 is disposed on the bonding metal layer 42. The epitaxial layer 44 is disposed on the surface of the first portion of the conductive oxide layer 43. The insulating layer 451 is disposed on the first side of the bonding metal layer 42 , the conductive oxide layer 43 and the epitaxial layer 44 to And disposed on the surface of the first portion of the epitaxial layer 44. The first ohmic contact layer E1 is disposed on the surface of the second portion of the substrate 41. The second mother-ion contact layer E2 is disposed on the surface of the second portion of the epitaxial layer 44. The third ohmic mother contact layer E3 is disposed on the surface of the second portion of the conductive oxide layer 43. The wire 46 is electrically connected to the first ohmic mother contact layer E1 and the second ohmic mother contact layer E2.

請參閱第5圖,其係為本創作另一發光元件的結構示意圖。承上所述,本創作發光元件更包括一不導電氧化層47,設置於磊晶層44及導電氧化層43之間。不導電氧化層47包括氮化矽(SiNy)、氮氧化矽(SiON)或者二氧化矽至少一種以上。此外,不導電氧化層47包括至少一接孔471,連通44磊晶層及導電氧化層43,以便於和磊晶層44形成歐母接觸。再者,接孔471係為金屬材料,包括鋅化金(AuZn)、鈹化金(AuBe)、鉻(Cr)或金(Au)等金屬材料。 Please refer to FIG. 5, which is a schematic structural view of another light-emitting element of the present invention. As described above, the present light-emitting device further includes a non-conductive oxide layer 47 disposed between the epitaxial layer 44 and the conductive oxide layer 43. The non-conductive oxide layer 47 includes at least one of tantalum nitride (SiNy), bismuth oxynitride (SiON), or cerium oxide. In addition, the non-conductive oxide layer 47 includes at least one via 471, which communicates with the epitaxial layer and the conductive oxide layer 43 to form an epitaxial contact with the epitaxial layer 44. Further, the contact hole 471 is made of a metal material, and includes a metal material such as zinc aluminide (AuZn), gold telluride (AuBe), chromium (Cr), or gold (Au).

於本創作之一實施例中,基板41包括不導電基板。不導電基板包括陶瓷基板、氮化鋁基板或氧化鋁基板。此外,於本創作中,基板41可使用透光基板或不透光基板。 In one embodiment of the present invention, the substrate 41 includes a non-conductive substrate. The non-conductive substrate includes a ceramic substrate, an aluminum nitride substrate, or an alumina substrate. Further, in the present creation, the substrate 41 may use a light-transmitting substrate or an opaque substrate.

絕緣層451包括二氧化矽或氮化矽,用於隔絕第一歐母接觸層E1、第二歐母接觸層E2。於本創作之另一實施例中,絕緣層452更包括設置於磊晶層44第三部份表面上,以及設置於磊晶層44第二側邊以及第三歐母接觸層E3之間,進一步隔絕第三歐母接觸層E3以避免短路。 The insulating layer 451 includes hafnium oxide or tantalum nitride for isolating the first mother-ion contact layer E1 and the second mother-ion contact layer E2. In another embodiment of the present invention, the insulating layer 452 is further disposed on the surface of the third portion of the epitaxial layer 44, and disposed between the second side of the epitaxial layer 44 and the third mother-ion contact layer E3. The third Ether contact layer E3 is further insulated to avoid short circuits.

導線46的寬度小於打線製程中銲球的直徑。一般 而言,打線的製程其使用的銲球直徑係大於100um,但於本創作中,由於不需要使用打線的製程,因此可根據實務上的需求與設計,輕易地製作出各種寬度大小的導線,例如,寬度大於5微米以上的導線。相較之下,其係遠小於銲球的直徑,因而可達到節省成本的功效。 The width of the wire 46 is less than the diameter of the solder ball in the wire bonding process. general In terms of the wire bonding process, the diameter of the solder ball used is greater than 100um, but in this creation, since the process of wire bonding is not required, the wires of various widths can be easily fabricated according to the practical requirements and design. For example, wires having a width greater than 5 microns. In comparison, the system is much smaller than the diameter of the solder ball, thus achieving cost-saving effects.

發光元件4係以黏著技術黏接至一電路板,電路板電性連接第二歐母接觸層E2及第三歐母接觸層E3,並以銀膠或錫膏電性連接導線46以及第三歐母接觸層E3。於本創作中,發光元件4的整體厚度係介於80至350微米之間,其實際的厚度可根據實務上的設計及需求製作,相較於習知技術,可大幅減小發光元件的厚度。 The light-emitting element 4 is adhered to a circuit board by an adhesive technology, and the circuit board is electrically connected to the second mother-ion contact layer E2 and the third mother-ion contact layer E3, and electrically connected to the wire 46 and the third with silver paste or solder paste. Oumu contact layer E3. In the present invention, the overall thickness of the light-emitting element 4 is between 80 and 350 micrometers, and the actual thickness can be made according to practical design and requirements, and the thickness of the light-emitting component can be greatly reduced compared with the prior art. .

綜上所述,相較於習知技術中,設置金屬球在電極上方以及設置凹槽以使電極的高度一致,本創作藉由設置導線的製程,可更精準地控制電極高度,以避免產生電極高低落差的問題。再者,本創作發光元件藉由設置導線的製程連接歐母接觸層,而非使用打線連接,因而可減少打線製程所需的封裝程序,因而可減小發光元件體積。此外,本創作之發光元件在歐母接觸層上形成導線後,則可直接進行黏著至電路板上的步驟,因而可減少封裝的體積以及減少封裝程序所需使用的設備,進一步降低製造成本,達到簡化程序以及快速生產的功效,以便於廣泛地應用至晶片尺寸封裝的技術領域中。 In summary, compared with the prior art, the metal ball is disposed above the electrode and the groove is arranged to make the height of the electrode uniform. This process can control the electrode height more accurately by setting the wire manufacturing process to avoid generation. The problem of high and low electrode drop. Furthermore, the present light-emitting element is connected to the mother-ion contact layer by a process of setting a wire instead of using a wire bonding, thereby reducing the packaging process required for the wire bonding process, thereby reducing the volume of the light-emitting component. In addition, after the light-emitting element of the present invention forms a wire on the mother-ion contact layer, the step of directly bonding to the circuit board can be performed, thereby reducing the volume of the package and reducing the equipment required for the packaging process, thereby further reducing the manufacturing cost. The simplification of the program and the efficiency of rapid production are achieved in order to be widely applied to the technical field of wafer size packaging.

4‧‧‧發光元件 4‧‧‧Lighting elements

41‧‧‧基板 41‧‧‧Substrate

42‧‧‧接合金屬層 42‧‧‧Join metal layer

43‧‧‧導電氧化層 43‧‧‧conductive oxide layer

44‧‧‧磊晶層 44‧‧‧Elevation layer

451、452‧‧‧絕緣層 451, 452‧‧ ‧ insulation

46‧‧‧導線 46‧‧‧Wire

E1‧‧‧第一歐母接觸層 E1‧‧‧ first European mother contact layer

E2‧‧‧第二歐母接觸層 E2‧‧‧Second European mother contact layer

E3‧‧‧第三歐母接觸層 E3‧‧‧ third European mother contact layer

Claims (14)

一種發光元件,包括:一基板;一接合金屬層,設置於該基板之一第一部份表面上;一導電氧化層,設置於該接合金屬層上;一磊晶層,設置於該導電氧化層之一第一部份表面上;一絕緣層,設置於該接合金屬層、該導電氧化層及該磊晶層之一第一側邊,以及設置於該磊晶層之一第一部份表面上;一第一歐母接觸層,設置於該基板之一第二部份表面上;一第二歐母接觸層,設置於該磊晶層之一第二部份表面上;一第三歐母接觸層,設置於該導電氧化層之一第二部份表面上;以及一導線,電性連接該第一歐母接觸層及該第二歐母接觸層。 A light-emitting element comprises: a substrate; a bonding metal layer disposed on a surface of the first portion of the substrate; a conductive oxide layer disposed on the bonding metal layer; and an epitaxial layer disposed on the conductive oxide a first portion of the surface of the layer; an insulating layer disposed on the bonding metal layer, the conductive oxide layer and the first side of the epitaxial layer, and the first portion of the epitaxial layer a first ohmic contact layer disposed on a surface of a second portion of the substrate; a second ohmic contact layer disposed on a surface of the second portion of the epitaxial layer; An ohmic contact layer disposed on a surface of the second portion of the conductive oxide layer; and a wire electrically connected to the first ohmic mother contact layer and the second ohmic contact layer. 如申請專利範圍第1項所述之發光元件,其中該絕緣層包括二氧化矽或氮化矽。 The light-emitting element of claim 1, wherein the insulating layer comprises hafnium oxide or tantalum nitride. 如申請專利範圍第1項所述之發光元件,其中該絕緣層更包括設置於該磊晶層之一第三部份表面上,以及設置於該磊晶層之一第二側邊以及該第三歐母接觸層之間。 The light-emitting element of claim 1, wherein the insulating layer further comprises a surface disposed on a third portion of the epitaxial layer, and a second side of the epitaxial layer and the first Between three European mothers and the contact layer. 如申請專利範圍第1項所述之發光元件,其中該導線的寬度小於一銲球之一直徑。 The illuminating element of claim 1, wherein the wire has a width smaller than a diameter of one of the solder balls. 如申請專利範圍第1項所述之發光元件,更包括一電路板,電性連接該第二歐母接觸層及該第三歐母接觸層。 The illuminating device of claim 1, further comprising a circuit board electrically connecting the second ohmic mother contact layer and the third ohmic contact layer. 如申請專利範圍第5項所述之發光元件,其中該電路板係以銀膠或錫膏電性連接該導線以及該第三歐母接觸層。 The illuminating element of claim 5, wherein the circuit board is electrically connected to the wire and the third ohmic contact layer by a silver paste or a solder paste. 如申請專利範圍第1項所述之發光元件,其中該發光元件之一厚度介於80至350微米之間。 The light-emitting element of claim 1, wherein one of the light-emitting elements has a thickness of between 80 and 350 microns. 如申請專利範圍第1項所述之發光元件,其中該基板包括不導電基板。 The light-emitting element of claim 1, wherein the substrate comprises a non-conductive substrate. 如申請專利範圍第8項所述之發光元件,其中該不導電基板包括陶瓷基板、氮化鋁基板或氧化鋁基板。 The light-emitting element according to claim 8, wherein the non-conductive substrate comprises a ceramic substrate, an aluminum nitride substrate or an alumina substrate. 如申請專利範圍第1項所述之發光元件,其中該基板包括透光基板或不透光基板。 The light-emitting element of claim 1, wherein the substrate comprises a light-transmitting substrate or an opaque substrate. 申請專利範圍第1項所述之發光元件,更包括一不導電氧化層,設置於該磊晶層與該導電氧化層之間。 The light-emitting device of claim 1, further comprising a non-conductive oxide layer disposed between the epitaxial layer and the conductive oxide layer. 如申請專利範圍第11項所述之發光元件,其中該不導電氧化層包括至少一接孔,連通該磊晶層及該導電氧化層。 The illuminating element of claim 11, wherein the non-conductive oxide layer comprises at least one connection hole connecting the epitaxial layer and the conductive oxide layer. 如申請專利範圍第12項所述之發光元件,其中該接孔係為一金屬材料。 The light-emitting element of claim 12, wherein the connection hole is a metal material. 如申請專利範圍第13項所述之發光元件,其中該金屬材料包括鋅化金、鈹化金、鉻或金。 The light-emitting element of claim 13, wherein the metal material comprises zincated gold, gold telluride, chromium or gold.
TW106202048U 2017-02-13 2017-02-13 Light-emitting device TWM544708U (en)

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