TWM527961U - Two-stage electronic product inspection probe jig module - Google Patents

Two-stage electronic product inspection probe jig module Download PDF

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Publication number
TWM527961U
TWM527961U TW105206635U TW105206635U TWM527961U TW M527961 U TWM527961 U TW M527961U TW 105206635 U TW105206635 U TW 105206635U TW 105206635 U TW105206635 U TW 105206635U TW M527961 U TWM527961 U TW M527961U
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TW
Taiwan
Prior art keywords
electronic product
fixture
probe
test
detection probe
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TW105206635U
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Chinese (zh)
Inventor
Jun-Liang Cai
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En Diamond Technology Co Ltd
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Priority to TW105206635U priority Critical patent/TWM527961U/en
Publication of TWM527961U publication Critical patent/TWM527961U/en

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Description

兩段式電子產品檢測探針治具模組 Two-stage electronic product detection probe fixture module

本創作係一種兩段式電子產品檢測探針治具模組,尤指其藉測試裝置組件具有的兩段式水平移動與垂直下壓方式,借由搖桿裝置可驅動同步執行檢測運作,讓測試工作快捷有效完成,提升產品良率,提高效率者。 This creation is a two-stage electronic product detection probe fixture module, especially the two-stage horizontal movement and vertical depression mode of the test device assembly, and the rocker device can drive the synchronous execution detection operation, so that Test work is completed quickly and efficiently, improving product yield and improving efficiency.

按目前所使用的電子產品檢測裝置種類繁多,其因應各種不同的檢測項目及方式,設計具有該等電子產品的各式測試治具、夾具結構及定位裝置等等,諸如;專利公報公告編號第459590號的觸控液晶面板測試治具之改良結構,公告編號第492371號的待測物夾具結構,以及公告編號第594183號的液晶面板檢測定位裝置等,這些構造裝置的構型基本上都具有一定的立體空間型態,以配合各自的檢測機具。而且該等檢測裝置的各構件皆由治具上之探針直接下壓接觸電子產品做檢測,依序分別進行測試電子產品的置放、挾持及檢測動作,這樣整個檢測的流程會耗費一定的時間,亦容易產生碰撞進而產生不良品,因這樣檢測方式顯有不良品的問題,所以有必要加以改善,以達成在使用上的良好效能者。 According to the variety of electronic product testing devices currently used, various test fixtures, fixture structures and positioning devices having such electronic products are designed in response to various testing items and methods, such as; The improved structure of the touch panel of the touch panel of No. 459590, the structure of the fixture to be tested of the bulletin No. 492371, and the liquid crystal panel detecting and positioning device of the bulletin No. 594183, etc., the configurations of these constructing devices basically have A certain three-dimensional space type to match the respective inspection tools. Moreover, each component of the detecting device is directly pressed and contacted with the electronic product for testing, and the electronic product is placed, held and detected in sequence, so that the entire testing process will consume a certain amount of time. Time is also prone to collisions and defective products. Because of the problem of defective products, it is necessary to improve them to achieve good performance in use.

本創作一種兩段式電子產品檢測探針治具模組,乃針對目前 檢測使用機具的運作問題,提供一兩段式進行不同測試項目之檢測裝置,而能有效提高檢測效能與良率者。本創作之主要目的,在於藉該測試裝置具有的連桿組件及檢測構件,其中該連桿組件為一軸接的連桿組,該連桿組具有滾輪與斜面滑塊與相配合運作之線性軸承,能分別連動該檢測構件之測試器及其測試探針,使該測試探針分為水平橫移與垂直下壓兩段式運作,而同時對該電子產品治具內的電子產品進行不同項目的檢測工作,能達致良好的使用效能者。為了使 貴審查委員能更進一步瞭解本創作為達上述目的所採取之技術、手段及功效,請參閱以下有關本創作之詳細說明與圖式,相信本創作之目的、特徵與特點,當可由此得一深入且具體之瞭解,然而所附圖式僅提供參考與說明用,並非用來對本創作加以限制者。 This creation is a two-stage electronic product detection probe fixture module, which is aimed at the current Detecting the operation of the machine, providing one or two stages of testing devices for different test items, and effectively improving the detection efficiency and yield. The main purpose of the present invention is to use the connecting rod assembly and the detecting member of the testing device, wherein the connecting rod assembly is a shaft connecting rod set, and the connecting rod group has a linear bearing with a roller and a beveled slider and a matching operation. The tester and the test probe of the detecting component can be respectively linked, and the test probe is divided into two stages of horizontal traverse and vertical depression, and at the same time, different items of the electronic products in the electronic fixture are carried out. The testing work can achieve good performance. In order to enable your review board to further understand the techniques, means and functions of this creation for the above purposes, please refer to the following detailed description and drawings of this creation. I believe that the purpose, characteristics and characteristics of this creation can be An in-depth and specific understanding is provided, however, the drawings are provided for reference and description only and are not intended to limit the invention.

1‧‧‧兩段式探針治具模組 1‧‧‧Two-stage probe fixture module

10‧‧‧兩段式探針治具 10‧‧‧Two-stage probe fixture

11‧‧‧治具底座 11‧‧‧Jig base

111‧‧‧直下式線性軸承 111‧‧‧Direct linear bearing

12‧‧‧治具上蓋 12‧‧ ‧ fixture cover

121‧‧‧側向式線性軸承 121‧‧‧ Lateral linear bearings

13‧‧‧搖桿 13‧‧‧ rocker

14‧‧‧探針固定座鎖付底座 14‧‧‧Probe fixing seat lock base

141‧‧‧導柱 141‧‧‧ Guide column

142‧‧‧斜面底板 142‧‧‧Bevel bottom plate

15‧‧‧搖桿支撐座 15‧‧‧ rocker support

16‧‧‧連桿 16‧‧‧ Connecting rod

17‧‧‧水平滑塊 17‧‧‧ horizontal slider

18‧‧‧水平檔板 18‧‧‧ horizontal baffle

19‧‧‧滾輪 19‧‧‧Roller

2‧‧‧測試機台 2‧‧‧Testing machine

21‧‧‧面板凹槽 21‧‧‧ Panel recess

3‧‧‧電子產品 3‧‧‧Electronic products

4‧‧‧探針固定座 4‧‧‧ probe holder

第一圖係本創作一具體實施例之立體示意圖 The first figure is a perspective view of a specific embodiment of the present creation

第二圖係本創作之前視圖 The second picture is the previous view of this creation

第三圖係本創作之後視圖 The third picture is the view after the creation

第四圖係本創作之左視圖 The fourth picture is the left view of the creation

第五圖係本創作之右視圖 The fifth picture is the right view of the creation

第六圖係本創作之上視圖 The sixth picture is the top view of the creation

第七圖係本創作之下視圖 The seventh picture is the view below the creation

第八圖係本創作一具體實施例之立體示意圖 The eighth figure is a perspective view of a specific embodiment of the present creation

第九圖係本創作一具體實施例之另一立體使用示意圖 The ninth drawing is another schematic view of a three-dimensional use of a specific embodiment of the present invention.

茲就本創作的裝置及作用,配合圖式詳細說明如后,俾能更加了解;請參閱第一圖係本創作一具體實施例之立體示意圖,其包括有一兩段式探針治具模組1、一兩段式探針治具10及一測試機台2、電子產品3、一探針固定座4,該測試機台2係呈一平板,而在該平板上具有一面板凹槽21設置,藉以容納承載測試電子產品3(如第一圖所示)。兩段式探針治具10,樞接於該測試機台2上方,將電子產品3置入測試機台2其中之面板凹槽21,將該搖桿13軸接於搖桿支撐座15在啟始位置,如第九圖所示,實施例中約75度角度時,當下壓至如第九圖所示,實施例中約45度角度時,可驅動經由軸接之連桿16與軸接之水平滑塊17產生水平移動,而該水平滑塊17係由複數側向式線性軸承121螺接於治具上蓋12與直下式線性軸承111螺接於治具底座11進而產生平滑之移動,當再下壓至如第九圖所示,實施例中約15度角度時,將軸接之滾輪19移動同時旋轉,可驅動斜面底板142進而向下垂直移動(如第九圖所示),其中斜面底板142與探針固定座鎖付底座14是由複數導柱141同時垂直移動,探針固定座4其中之探針即可接觸電子產品3進行測試。 The device and function of the present invention can be better understood with reference to the detailed description of the drawings. Please refer to the first figure for a detailed embodiment of the present invention, which includes a two-stage probe fixture module. 1. A two-stage probe fixture 10 and a test machine 2, an electronic product 3, and a probe holder 4, the test machine 2 is a flat plate having a panel recess 21 on the flat plate. Set up to accommodate the test electronics 3 (as shown in the first figure). The two-stage probe fixture 10 is pivotally connected to the test machine 2, and the electronic product 3 is placed into the panel recess 21 of the test machine 2, and the rocker 13 is axially connected to the rocker support base 15 The starting position, as shown in the ninth figure, when the angle is about 75 degrees in the embodiment, when it is pressed down to an angle of about 45 degrees in the embodiment as shown in the ninth figure, the connecting rod 16 and the shaft via the shaft can be driven. The horizontal slider 17 is horizontally moved, and the horizontal slider 17 is screwed to the jig upper cover 12 and the straight type linear bearing 111 by the plurality of lateral linear bearings 121 to be screwed to the jig base 11 to generate smooth movement. When it is pressed down to the angle of about 15 degrees in the embodiment as shown in the ninth figure, the roller 19 of the shaft is moved and rotated simultaneously, and the inclined bottom plate 142 can be driven to move vertically downward (as shown in FIG. 9). The bevel base plate 142 and the probe fixing base lock base 14 are vertically moved by the plurality of guide posts 141, and the probes of the probe fixing base 4 can be in contact with the electronic product 3 for testing.

因此;本創作兩段式電子產品檢測探針治具模組之新型創作,極具新穎性及進步性,完全符合新型專利申請要件,爰依專利法提出申請,敬請詳查並賜准本案專利,以保障創作者之權益。 Therefore, the new creation of the two-stage electronic product detection probe fixture module is extremely novel and progressive, fully conforms to the requirements of the new patent application, and applies for the patent law. Please check and grant the case. Patents to protect the rights of creators.

惟,以上所述,僅為本創作最佳之一具體實施例之詳細說明與 圖式,本創作之特徵並不侷限於此,並非用以限制本創作,本創作之所有範圍應以下述之申請專利範圍為準,凡合於本創作申請專利範圍之精神與其類似變化之實施例,皆應包含於本創作之範疇中,任何熟悉該項技藝者在本創作之領域內,可輕易思及之變化或修飾皆可涵蓋在以下本案之專利範圍。 However, as described above, it is only a detailed description of one of the best embodiments of the present invention. Schematic, the characteristics of this creation are not limited to this, and are not intended to limit the creation of this creation. All the scope of this creation shall be subject to the following patent application scope, and the spirit of the scope of the patent application for this creation and its similar changes shall be implemented. All examples should be included in the scope of this creation. Anyone who is familiar with the art in this field of creation can easily think of changes or modifications that can be covered in the following patents.

1‧‧‧兩段式探針治具模組 1‧‧‧Two-stage probe fixture module

10‧‧‧兩段式探針治具 10‧‧‧Two-stage probe fixture

11‧‧‧治具底座 11‧‧‧Jig base

12‧‧‧治具上蓋 12‧‧ ‧ fixture cover

13‧‧‧搖桿 13‧‧‧ rocker

14‧‧‧探針固定座鎖付底座 14‧‧‧Probe fixing seat lock base

2‧‧‧測試機台 2‧‧‧Testing machine

21‧‧‧面板凹槽 21‧‧‧ Panel recess

3‧‧‧電子產品 3‧‧‧Electronic products

4‧‧‧探針固定座 4‧‧‧ probe holder

Claims (5)

一種兩段式電子產品檢測探針治具模組,係包括有一電子產品與測試機台、兩段式檢測探針治具,數種與複數兩段式檢測探針治具固定於電子產品檢測機台上,其中兩段式檢測探針治具,包括有一治具底座、一搖桿連動裝置及一測試裝置,其中;測試機台;係具有一電子產品設置,該電子產品測試治具的表面上,具有一凹槽或無凹槽;兩段式檢測探針治具;係具有一數種與複數檢測探針治具固定於電子產品檢測機台上;測試裝置;係具有一驅動組件及檢測構件,其中該驅動組件為一軸接的連桿組,設置該治具內,而檢測構件則為測試器及其測試探針,分別設置於該治具探針底座上測試電子產品進行檢測運作。 A two-stage electronic product detection probe fixture module comprises an electronic product and a test machine, a two-stage detection probe fixture, and a plurality of and two-stage detection probe fixtures fixed to the electronic product detection On the machine platform, the two-stage detection probe fixture comprises a fixture base, a rocker linkage device and a test device, wherein the test machine has an electronic product setting, and the electronic product test fixture On the surface, there is a groove or no groove; the two-stage detection probe fixture has a plurality of detection probes fixed on the electronic product testing machine; the test device has a driving component And the detecting component, wherein the driving component is a shaft connecting rod set, and the detecting component is a tester and a test probe thereof, respectively disposed on the fixture probe base to test the electronic product for detecting Operation. 依申請專利範圍第1項所述之兩段式電子產品檢測探針治具模組,其該搖桿軸接於搖桿支撐座在啟始位置,當下壓至45度時,可驅動經由軸接之連桿與軸接之水平滑塊產生水平移動。 According to the two-section electronic product detection probe fixture module described in claim 1, the rocker shaft is connected to the rocker support at the starting position, and can be driven through the shaft when pressed down to 45 degrees. The horizontal slider that connects the connecting rod and the shaft produces a horizontal movement. 依申請專利範圍第1項所述之兩段式電子產品檢測探針治具模組,其水平滑塊係由複數側向式線性軸承螺接於上蓋與直下式線性軸承螺接於治具底座進而產生平滑之移動。 According to the two-section electronic product detection probe fixture module described in claim 1, the horizontal slider is screwed to the upper cover and the straight type linear bearing by a plurality of lateral linear bearings. This produces a smooth movement. 依申請專利範圍第1項所述之兩段式電子產品檢測探針治具模組,其搖桿再下壓至15度時,將軸接之滾輪移動同時旋轉,可驅動斜面底板進而向下垂直移動。 According to the two-section electronic product detection probe fixture module described in the first paragraph of the patent application, when the rocker is pressed down to 15 degrees, the roller connected to the shaft is simultaneously rotated, and the inclined bottom plate can be driven to go down. Move vertically. 依申請專利範圍第1項所述之兩段式電子產品探針檢測治具模組,其中斜面底板與探針底座是由複數導柱同時垂直移動,測試裝置其中之探針即可接觸電子產品進行測試。 According to the two-section electronic product probe detection fixture module described in claim 1, wherein the inclined bottom plate and the probe base are vertically moved by the plurality of guide columns, and the probe of the test device can contact the electronic product. carry out testing.
TW105206635U 2016-05-09 2016-05-09 Two-stage electronic product inspection probe jig module TWM527961U (en)

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108195254A (en) * 2018-01-10 2018-06-22 广州市海乐精密机械有限责任公司 Assemble body opening internal jump ring slot relative position measurement instrument
TWI712799B (en) * 2019-11-22 2020-12-11 尹鑽科技有限公司 Two-stage stroke detection device and detection platform using the detection device
CN112578308A (en) * 2020-12-17 2021-03-30 东莞市鼎通精密科技股份有限公司 Electrical measurement and inspection device
CN113176426A (en) * 2021-05-07 2021-07-27 珠海市精实测控技术有限公司 Composite mechanism capable of realizing synchronous opposite movement of two sides

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108195254A (en) * 2018-01-10 2018-06-22 广州市海乐精密机械有限责任公司 Assemble body opening internal jump ring slot relative position measurement instrument
TWI712799B (en) * 2019-11-22 2020-12-11 尹鑽科技有限公司 Two-stage stroke detection device and detection platform using the detection device
CN112578308A (en) * 2020-12-17 2021-03-30 东莞市鼎通精密科技股份有限公司 Electrical measurement and inspection device
CN113176426A (en) * 2021-05-07 2021-07-27 珠海市精实测控技术有限公司 Composite mechanism capable of realizing synchronous opposite movement of two sides

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