TWI712799B - Two-stage stroke detection device and detection platform using the detection device - Google Patents

Two-stage stroke detection device and detection platform using the detection device Download PDF

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TWI712799B
TWI712799B TW108142564A TW108142564A TWI712799B TW I712799 B TWI712799 B TW I712799B TW 108142564 A TW108142564 A TW 108142564A TW 108142564 A TW108142564 A TW 108142564A TW I712799 B TWI712799 B TW I712799B
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base
detection device
support arm
spring
pressing rod
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TW108142564A
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TW202120929A (en
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蔡俊良
呂明憲
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尹鑽科技有限公司
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本發明係提供一種檢測裝置及使用該檢測裝置之檢測平台,而該檢測裝置包含一基座、一作動單元以及一探針座;當經按壓該作動單元之壓桿,將帶動一滑塊朝一斜面底座的方向水平運動,且使樞設於該滑塊上的一滾輪自該斜面底座的低端朝高端的方向滾動,使被設置在該探針座與該作動單元之一支撐臂之間的一彈簧逐漸地形成壓縮,並使該探針座垂直向下運動;而該檢測平台包含一該檢測裝置及一檢測板;而該檢測板具有一檢測區,且該檢測區上設有一待測物。The present invention provides a detection device and a detection platform using the detection device. The detection device includes a base, an actuation unit, and a probe holder; when the pressure rod of the actuation unit is pressed, a slider is driven toward one The direction of the inclined plane base moves horizontally, and a roller pivoted on the sliding block is rolled from the lower end of the inclined plane base toward the high end direction, so that it is arranged between the probe holder and a support arm of the actuating unit A spring gradually compresses and makes the probe holder move vertically downward; and the detection platform includes a detection device and a detection board; and the detection board has a detection area, and the detection area is provided with a waiting Measured object.

Description

兩段式行程之檢測裝置及使用該檢測裝置的檢測平台Two-stage stroke detection device and detection platform using the detection device

本發明係與電子產品測試技術相關,特別是指一種具有水平移動與垂直下壓等兩段式行程作動的檢測裝置,以及使用該檢測裝置的一檢測平台。 The present invention is related to electronic product testing technology, and particularly refers to a detection device with two-stage stroke actions such as horizontal movement and vertical depression, and a detection platform using the detection device.

因目前所使用的電子產品檢測模組種類繁多,而為了能夠在製造完成後進一步地確保產品可以正常且完整的運作,所以,在電子產品出貨之前都需要先經過一定程序性的電性檢測,於是便設計出符合特定電子產品的檢測模組,即如中華民國新型專利公告號第TWM527961U號乙案中(以下標號係引用於前述專利案實施例中所列的標號)所揭露的「兩段式電子產品檢測探針治具模組」,其包含一兩段式探針治具模組1、一兩段式探針治具10、一測試機台2、一電子產品3以及一探針固定座4。而該測試機台2係呈一平板,藉以容納承載測試電子產品3,該兩段式探針治具10係樞接於該測試機台2的上方。 Due to the wide variety of electronic product testing modules currently used, and in order to further ensure that the product can operate normally and completely after the manufacturing is completed, a certain procedural electrical test is required before the electronic product is shipped. , So I designed a detection module that meets specific electronic products, as disclosed in the Republic of China New Patent Announcement No. TWM527961U No. B (the following signs are quoted in the examples of the aforementioned patents). Sectional electronic product testing probe fixture module", which includes a two-section probe fixture module 1, a two-section probe fixture 10, a testing machine 2, an electronic product 3, and a probe Needle holder 4. The testing machine 2 is a flat plate for accommodating the test electronic product 3, and the two-section probe fixture 10 is pivotally connected to the testing machine 2.

而當進行檢測時,係先將該電子產品3置入該測試機台2之面板凹槽21,此時,該搖桿13則軸接於一搖桿支撐座15且位於一啟始位置;接著,當下壓該搖桿13呈一預定角度(約45度角度)時,即可驅動經由軸接的一連桿16與軸接的一水平滑塊17產生水平移動,而值得一提的是,該水平滑塊17係由複數側向式線性滑軌121螺接於一治具上蓋12與一直下式線性滑軌111螺接於一治具底座11,進而產生平滑之移動;接著,當軸接之滾輪19移動且同時旋轉時,係可驅動一斜面底板142產生向下垂直移動,而值得一提的是,該斜面底板142與探針固定 座鎖付底座14係由於複數導柱141同時垂直移動,使該探針固定座4之中的探針可經電性接設於待測的電子產品3之後,而能夠進行電性測試。 When testing, the electronic product 3 is first inserted into the panel groove 21 of the testing machine 2. At this time, the rocker 13 is pivotally connected to a rocker support base 15 and is located at a starting position; Then, when the rocker 13 is pressed down to a predetermined angle (about 45 degrees), a connecting rod 16 connected to the shaft and a horizontal sliding block 17 connected to the shaft can be driven to move horizontally, and it is worth mentioning that , The horizontal sliding block 17 is screwed to a fixture cover 12 by a plurality of lateral linear sliding rails 121 and a straight down linear sliding rail 111 is screwed to a fixture base 11 to produce smooth movement; then, when When the axle-connected roller 19 moves and rotates at the same time, it can drive an inclined bottom plate 142 to move vertically downward, and it is worth mentioning that the inclined bottom plate 142 is fixed to the probe Since the plurality of guide posts 141 move vertically at the same time, the holder-locking base 14 enables the probes in the probe holder 4 to be electrically connected to the electronic product 3 to be tested for electrical testing.

雖然,上述中華民國新型專利公告號第TWM527961U號所揭露的兩段式電子產品檢測探針治具模組,能使整體的檢測行程概分為一水平橫移以及一垂直下壓等兩段式檢測行程作動。然而,卻也因為僅單純藉由整體機構中各部件之間的連動關係產生水平橫移與垂直下壓等兩段式作動的關係,所以,如欲復歸至初始的待測位置時,則必須再針對治具上蓋12、搖桿13或探針固定座鎖付底座14等部件施力,直至產生一足以讓治具模組可回復至初始位置的抗力為止。 Although, the two-stage electronic product inspection probe jig module disclosed in the above-mentioned Republic of China Patent Publication No. TWM527961U can make the overall inspection stroke roughly divided into two stages, such as a horizontal movement and a vertical depression. Detect stroke movement. However, it is also because the two-stage actuation relationship of horizontal movement and vertical depression is generated only by the linkage relationship between the components in the overall mechanism. Therefore, if you want to return to the initial position to be measured, you must Then force is applied to the fixture upper cover 12, the rocker 13 or the probe holder lock base 14 and other components until a resistance force sufficient for the fixture module to return to the initial position is generated.

長此以往,除了將會讓整個檢測的流程徒增耗時費力之外,亦容易因為施力不當而對於檢測的治具模組產生磨損現象。緣此,至於要如何讓檢測的治具模組及其結合構件能克服前述的技術缺陷,實則有其需立即改善的空間。 If things go on like this, in addition to making the entire inspection process time-consuming and laborious, it is also prone to wear and tear on the inspection fixture module due to improper force. For this reason, as to how to make the inspection fixture module and its combined components overcome the aforementioned technical defects, there is actually room for immediate improvement.

有鑒於前,本發明係提供一種具有水平移動與垂直下壓等兩段式行程作動的檢測裝置。 In view of the foregoing, the present invention provides a detection device with two-stage stroke actions such as horizontal movement and vertical depression.

而為達到上述目的,本發明所提供的一種檢測裝置,其包含一基座、一作動單元以及一探針座。 To achieve the above objective, the present invention provides a detection device, which includes a base, an actuation unit and a probe holder.

而該基座係具有一底部以及圍繞於該底部的一周壁,進而形成一容置空間以及一連通於外部與該容置空間的通孔;而自該基座之周壁朝該容置空間的方向係凸伸一擋止部,且該擋止部係靠近於該基座之通孔處。 The base has a bottom and a peripheral wall surrounding the bottom, thereby forming an accommodating space and a through hole communicating with the outside and the accommodating space; and from the peripheral wall of the base toward the accommodating space A blocking portion protrudes in the direction, and the blocking portion is close to the through hole of the base.

而該作動單元係容設於該基座之容置空間,且該作動單元係包含一壓桿、一連桿、一支撐臂、一滑塊以及一滾輪;而該壓桿的中段係樞設於該基 座之周壁且對應於該通孔的位置,該壓桿的一端係可擺動地樞接於該連桿的一端,且該壓桿的另一端係凸伸於該基座;而該連桿的另一端係可擺動地樞接於該滑塊的一端;而該支撐臂的一端係可移動地跨設於該滑塊,且該支撐臂的另一端係朝相對於該連桿的反方向凸伸於該基座之通孔處;而該滑塊係可移動地設置在該基座之底部;而該滾輪係可轉動地樞設於該滑塊的底部。 The actuating unit is accommodated in the accommodating space of the base, and the actuating unit includes a pressing rod, a connecting rod, a supporting arm, a sliding block and a roller; and the middle section of the pressing rod is pivoted Yu Gaiji The peripheral wall of the seat corresponds to the position of the through hole, one end of the pressing rod is pivotally connected to one end of the connecting rod, and the other end of the pressing rod protrudes from the base; and the connecting rod The other end is pivotally connected to one end of the slider; and one end of the support arm movably straddles the slider, and the other end of the support arm protrudes in the opposite direction relative to the connecting rod. Extending at the through hole of the base; and the sliding block is movably arranged at the bottom of the base; and the roller system is rotatably pivoted at the bottom of the sliding block.

而該探針座係包含一斜面底座以及一彈簧。而該探針座係藉由一固定件經穿設於該作動單元之支撐臂的另一端後而固設於該斜面底座的一側,且該斜面底座的斜面段係朝向該作動單元之滾輪的方向;而該彈簧係設置於該探針座與該作動單元之支撐臂的另一端之間。 The probe base includes an inclined base and a spring. The probe base is fixed on one side of the inclined base by a fixing member passing through the other end of the supporting arm of the actuating unit, and the inclined section of the inclined base faces the roller of the actuating unit The direction; and the spring is provided between the probe holder and the other end of the supporting arm of the actuation unit.

其中,當經按壓該作動單元之壓桿,讓該壓桿與該基座二者之間的夾角大於一第一預定角度,使該連桿帶動該滑塊朝該探針座之斜面底座的方向移動,且使該支撐臂帶動該探針座朝遠離該基座的方向移動。 Wherein, when the pressing rod of the actuating unit is pressed, the angle between the pressing rod and the base is greater than a first predetermined angle, so that the connecting rod drives the slider toward the inclined base of the probe base Move in the direction, and make the support arm drive the probe holder to move away from the base.

其中,當該壓桿與該基座二者之間的夾角自該第一預定角度逐漸地改變至大於一第二預定角度,使樞設於該滑塊上的該滾輪係自該探針座之斜面底座的低端朝高端的方向滾動,讓被設置在該探針座與該作動單元之支撐臂之間的該彈簧逐漸地形成壓縮,並使該探針座朝該斜面底座的方向垂直移動。 Wherein, when the angle between the pressure rod and the base gradually changes from the first predetermined angle to greater than a second predetermined angle, the roller pivoted on the slider is attached to the probe base The lower end of the inclined base rolls toward the high end, so that the spring arranged between the probe holder and the support arm of the actuating unit is gradually compressed, and the probe base is perpendicular to the direction of the inclined base mobile.

較佳地,該作動單元設有一彈簧,係設置於該支撐臂與該基座之擋止部之間;而當經按壓該作動單元之壓桿,使該連桿帶動該滑塊朝該斜面底座的方向移動,且使該支撐臂帶動該探針座朝遠離該基座的方向移動,並讓被設置在該支撐臂與該基座之擋止部之間的該彈簧逐漸地形成壓縮狀態或拉伸狀態。 Preferably, the actuating unit is provided with a spring which is arranged between the support arm and the stop portion of the base; and when the pressing rod of the actuating unit is pressed, the connecting rod drives the slider toward the inclined surface The direction of the base moves, and the support arm drives the probe holder to move away from the base, and the spring arranged between the support arm and the stop portion of the base gradually forms a compressed state Or stretched state.

而本發明係又提供一種檢測平台,其包含一個前述的該檢測裝置以及一個檢測板;而該檢測板具有一個檢測區,且該檢測區上設有一待測物。 The present invention also provides a detection platform, which includes the aforementioned detection device and a detection board; and the detection board has a detection area, and the detection area is provided with a test object.

1:檢測平台 1 : Detection platform

2、2A:檢測裝置 2, 2A : detection device

3:檢測板 3 : Detection board

4:排針組 4 : Pin header group

5:檢測區 5 : Detection area

7:待測物 7 : DUT

10、10A:基座 10.10A : Base

11:底部 11 : bottom

12、12A:周壁 12, 12A : peripheral wall

13:容置空間 13 : Housing space

14:通孔 14 : Through hole

15:滑軌 15 : Slide rail

16、16A:擋止部 16, 16A : stop

17:上蓋 17 : Upper cover

18:磁扣件 18 : Magnetic fastener

20:作動單元 20 : Actuating unit

21、21A:壓桿 21, 21A : pressure bar

22:磁扣件 22 : Magnetic fastener

23、23A:連桿 23, 23A : connecting rod

24、24A:支撐臂 24, 24A : Support arm

240:限位孔 240 : limit hole

241、243:凹部 241, 243 : recess

25、25A:滑塊 25, 25A : Slider

250:限位桿 250 : Limit lever

27:滾輪 27 : Wheel

28:線性滑軌 28 : Linear slide

29、29A:彈簧 29, 29A : Spring

30:探針座 30 : Probe holder

303:凹部 303 : recess

31、31A:斜面底座 31, 31A : Inclined base

32:固定件 32 : fixed parts

33:彈簧 33 : Spring

θ1:第一預定角度 θ1 : The first predetermined angle

θ2:第一預定角度 θ2 : The first predetermined angle

圖1為本發明第一實施例之一種檢測裝置與使用該檢測裝置的一種檢測平台的立體示意圖。 FIG. 1 is a three-dimensional schematic diagram of a detection device and a detection platform using the detection device according to the first embodiment of the present invention.

圖2為圖1之該檢測裝置的立體暨部分剖視示意圖。 FIG. 2 is a three-dimensional and partial cross-sectional schematic diagram of the detection device of FIG. 1.

圖3為圖1之該檢測裝置的前視示意圖。 Fig. 3 is a schematic front view of the detection device of Fig. 1.

圖4為圖1之該檢測裝置的後視示意圖。 Fig. 4 is a schematic rear view of the detection device of Fig. 1.

圖5為圖1之該檢測裝置的左側視示意圖。 Fig. 5 is a schematic left side view of the detection device of Fig. 1.

圖6為圖1之該檢測裝置的右側視示意圖。 FIG. 6 is a schematic diagram of the right side view of the detection device of FIG. 1.

圖7為圖1之該檢測裝置的俯視示意圖。 FIG. 7 is a schematic top view of the detection device of FIG. 1.

圖8為圖1之該檢測裝置的仰視示意圖。 Fig. 8 is a schematic bottom view of the detection device of Fig. 1.

圖9為圖2之該檢測裝置的另一角度立體暨部分剖視示意圖。 FIG. 9 is another perspective and partial cross-sectional view of the detection device of FIG. 2.

圖10為圖5之該檢測裝置的左側視暨部分剖視示意圖。 FIG. 10 is a schematic diagram of a left side view and a partial cross-sectional view of the detection device of FIG. 5.

圖11為圖7之該檢測裝置的俯視暨部分剖視示意圖。 FIG. 11 is a top view and a partial cross-sectional view of the detection device of FIG. 7.

圖12係概同圖10,為該檢測裝置經水平運動後的位置暨部分剖視示意圖。 Fig. 12 is the same as Fig. 10, and is a schematic diagram of the position and partial cross-sectional view of the detection device after horizontal movement.

圖13係概同圖12,為該檢測裝置經水平運動及垂直向下運動後的位置暨部分剖視示意圖。 Fig. 13 is the same as Fig. 12, showing the position and partial cross-sectional view of the detecting device after horizontal movement and vertical downward movement.

圖14為圖13之俯視暨部分剖視示意圖。 Fig. 14 is a top view and a partial cross-sectional view of Fig. 13.

圖15為本發明第二實施例之另一種檢測裝置的立體暨部分構件示意圖。 15 is a schematic diagram of the three-dimensional and partial components of another detecting device according to the second embodiment of the present invention.

圖16為圖15之另一角度的立體暨部分剖視示意圖。 Fig. 16 is another perspective and partial cross-sectional view of Fig. 15.

圖17係概同圖15,為另一種檢測裝置經水平運動及垂直向下運動後的位置暨部分構件示意圖。 Fig. 17 is the same as Fig. 15 and is a schematic diagram of the position and partial components of another detection device after horizontal movement and vertical downward movement.

圖18為圖17之另一角度的立體暨部分剖視示意圖。 FIG. 18 is a perspective and partial cross-sectional view of FIG. 17 from another angle.

以下所列舉之若干實施例及其所配合之若干圖式,係為說明本發明之技術內容與特徵,諸如於本說明書內容中所提及之“上”、“下”、“左”、“右”、“內”、“外”、“頂”或“底”等方向性形容用語,僅為以正常使用方向為基準所表示之描述用語,並非用以作為限制本發明欲主張之申請專利範圍之用意,而又於本案專利說明書內容中所提及之“第一”、“第二”或“第三”等排序性用語,係僅用以辨識構件之描述性用語,亦非用以作為限制本發明所欲主張之技術特徵或其申請專利範圍之用意,在此合先敘明。 The following embodiments and their associated drawings are to illustrate the technical content and features of the present invention, such as "upper", "lower", "left" and "left" mentioned in the content of this specification. Directional adjectives such as "right", "inner", "outer", "top" or "bottom" are only descriptive terms based on the normal direction of use, and are not intended to limit the patent application of the present invention. The meaning of the scope, and the sequential terms such as "first", "second" or "third" mentioned in the patent specification of this case are only descriptive terms used to identify components, and are not used As the purpose of limiting the technical features of the present invention or the scope of the patent application, it is described here first.

請先參閱圖1,係為本發明第一實施例所揭露之一種檢測平台1,其包含一個檢測裝置2以及一個檢測板3。而該檢測板3係具有一個凹設的檢測區5,該檢測區5上係設有一待測物7Please refer to FIG. 1 first, which is a detection platform 1 disclosed in the first embodiment of the present invention, which includes a detection device 2 and a detection board 3 . The detection board 3 has a concave detection area 5 , and the detection area 5 is provided with an object 7 to be tested.

請再一併參閱圖2至圖14,於本發明第一實施例中,該檢測裝置2係包含:一個基座10、一個作動單元20以及一個探針座30Please refer to FIGS. 2 to 14 together. In the first embodiment of the present invention, the detection device 2 includes: a base 10 , an actuation unit 20, and a probe holder 30 .

而該基座10係具有一個底部11以及圍繞於該底部11的一個周壁12,進而形成一個容置空間13以及一個可連通於外部與該容置空間13的通孔14;而該基座10之底部11係組設有一個滑軌15。而值得一提的是,在本實施例中,該基座10之容置空間13係呈長形,該滑軌15係順著該容置空間13的長形方向設置,且對應於該通孔14處;此外,自該基座10之周壁12的相對兩側係各別朝該容置空 間13的方向徑向凸伸一擋止部16,較佳地,該二擋止部16係位於該基座10之通孔14處;此外,該基座10係覆設有一個上蓋17,且該上蓋17係埋設有一個磁扣件18The base 10 has a bottom 11 and a peripheral wall 12 surrounding the bottom 11 , thereby forming an accommodating space 13 and a through hole 14 that can communicate with the outside and the accommodating space 13 ; and the base 10 There is a slide rail 15 in the bottom 11 series. It is worth mentioning that in this embodiment, the accommodating space 13 of the base 10 is elongated, and the slide rail 15 is arranged along the longitudinal direction of the accommodating space 13 and corresponds to the passage Hole 14 ; in addition, from opposite sides of the peripheral wall 12 of the base 10 , a stopper 16 is projected radially toward the accommodating space 13 , preferably, the two stoppers 16 are located at the base 10 of the through hole 14; in addition, the base 10 is provided with a cover 17 overlying lines, lines 17 and the cover member 18 is embedded a magnetic fasteners.

而該作動單元20係容設於該基座10之容置空間13中,且該作動單元20係包含有一個壓桿21、一個磁扣件22、一個連桿23、一個支撐臂24、一個滑塊25、一個滾輪27、二個線性滑軌28以及二個彈簧29The actuating unit 20 is accommodated in the accommodating space 13 of the base 10 , and the actuating unit 20 includes a pressing rod 21 , a magnetic fastener 22 , a connecting rod 23 , a supporting arm 24 , and a Slide block 25 , one roller 27 , two linear slide rails 28 and two springs 29 .

而該壓桿21的中段係樞設於該基座10之周壁12且對應於該通孔14的位置,並使該壓桿21的一端係可擺動地樞接於該連桿23的一端,且該壓桿21的另一端係凸伸於該基座10用以便於使用者施力作動。而該磁扣件22係組設在該壓桿21上且相對應於該基座10之上蓋17的該磁扣件18的位置。 The middle section of the pressure rod 21 is pivoted on the peripheral wall 12 of the base 10 and corresponds to the position of the through hole 14 , so that one end of the pressure rod 21 is pivotally pivoted to one end of the connecting rod 23 , In addition, the other end of the pressure rod 21 protrudes from the base 10 to facilitate the user to apply force. The magnetic fastener 22 is assembled on the pressing rod 21 and corresponds to the position of the magnetic fastener 18 of the cover 17 on the base 10 .

而該連桿23的另一端係可擺動地樞接該於該滑塊25的一端。而該支撐臂24的一端係可移動地跨置於該滑塊25的上方,另一端則朝相對於該連桿23的反方向凸伸於該基座10之通孔14處;較佳地,該支撐臂24穿設有一呈長形的限位孔240,該滑塊25係設有一限位桿250且突伸於該支撐臂24之位孔240的位置。而該滑塊25係跨置於該基座10之滑軌15上並可沿著該滑軌15的長軸向滑移,且該支撐臂24長軸向的相對兩側係各別藉由一該線性滑軌28組設於該基座10之周壁12的內壁面,用以讓該支撐臂24可於該基座10之周壁12的內壁面上在一預定行程內往復滑移,當然也可僅設置一該線性滑軌28The other end of the connecting rod 23 is pivotally connected to one end of the slider 25 in a swingable manner. One end of the support arm 24 is movably straddled above the slider 25 , and the other end protrudes toward the through hole 14 of the base 10 in the opposite direction relative to the connecting rod 23 ; preferably The supporting arm 24 has an elongated limiting hole 240 through it , and the sliding block 25 is provided with a limiting rod 250 protruding from the position of the supporting arm 24 of the hole 240 . The slider 25 is straddled on the slide rail 15 of the base 10 and can slide along the long axis of the slide rail 15 , and the opposite sides of the long axis of the support arm 24 are respectively driven by A linear slide rail 28 is arranged on the inner wall surface of the peripheral wall 12 of the base 10 to allow the support arm 24 to slide back and forth within a predetermined stroke on the inner wall surface of the peripheral wall 12 of the base 10 , of course It is also possible to provide only one linear slide rail 28 .

而該滾輪27係可轉動地樞設於該滑塊25的底部。而該二彈簧29係各別設置於該支撐臂24與該基座10的該二擋止部16之間,較佳地,該二彈簧29的一端各別容置於該支撐臂24所凹設的二個凹部241,且該二彈簧29的另一端係各別抵設於該基座10的該二擋止部16,當然也可僅設置一該彈簧29The roller 27 is rotatably pivoted at the bottom of the slider 25 . The two springs 29 are respectively arranged between the supporting arm 24 and the two stopping portions 16 of the base 10. Preferably, one end of the two springs 29 is respectively accommodated in the concave of the supporting arm 24 . Two recesses 241 are provided , and the other ends of the two springs 29 are respectively abutted against the two stop portions 16 of the base 10 , of course, only one spring 29 can be provided.

而該探針座30係包含有一個斜面底座31以及二個彈簧33。而該探針座30的一端係各別藉由四個固定件32經穿設於該作動單元20之支撐臂24的另一端之後,使該等固定件32間隔地固設於該斜面底座31的兩側,當然也可僅設置一該固定件32。而該斜面底座31的斜面段係朝向該作動單元20之滾輪27的方向。而該二彈簧33係間隔設置於該探針座30與該作動單元20之支撐臂24的另一端之間,當然也可僅設置一該彈簧33;較佳地,該二彈簧33的一端係各別容置於該探針座30所凹設的二個凹部303,且該二彈簧33的另一端係各別容置於該作動單元20之支撐臂24的二個凹部243。而值得一提的是,該探針座30的另一端係用以提供組設於外部的一FFC(Flexible Flat Cable,軟體扁平排線)、一FPC(Flex Printed Circuit,軟性印刷電路板)或者複數金屬探針。 The probe base 30 includes an inclined base 31 and two springs 33 . And one end of the respective probe base 30 by four fixing members 32 disposed through the via actuating means support the other end 20 of the arm 24 after the fixing member 32 such that the spaced apart base fixed to the inclined surface 31 Of course, it is also possible to provide only one fixing member 32 on both sides. The inclined surface section of the inclined surface base 31 faces the direction of the roller 27 of the actuating unit 20 . The two springs 33 are arranged at intervals between the probe holder 30 and the other end of the support arm 24 of the actuating unit 20. Of course, only one spring 33 may be provided; preferably, one end of the two springs 33 is The two recesses 303 of the probe holder 30 are respectively accommodated, and the other ends of the two springs 33 are respectively accommodated in the two recesses 243 of the support arm 24 of the actuating unit 20 . It is worth mentioning that the other end of the probe base 30 is used to provide an FFC (Flexible Flat Cable), an FPC (Flex Printed Circuit, flexible printed circuit board) or Plural metal probes.

請再一併參閱圖1、圖5、圖10及圖11,當將該檢測裝置2應用於本發明第一實施例所揭露的該檢測平台1上並且進行檢測行程作動時,首先,係先將該檢測裝置2藉由該基座10組設在該檢測板3上,再將一個排針組4(於本實施例中係舉例複數金屬探針)組設於該檢測裝置2之探針座30的另一端,並且使該排針組4靠近於該檢測區5的位置,此時,該檢測裝置2之作動單元20的該壓桿21係因藉由該磁扣件22與該基座10之上蓋17的該磁扣件18相互磁吸而扣設固定。 Please refer to FIG. 1, FIG. 5, FIG. 10, and FIG. 11 together. When the detection device 2 is applied to the detection platform 1 disclosed in the first embodiment of the present invention and the detection stroke is performed, first, first The detection device 2 is assembled on the detection board 3 through the base 10 , and then a pin header group 4 (a plurality of metal probes is exemplified in this embodiment) is assembled on the probe of the detection device 2 The other end of the seat 30 , and the pin set 4 is close to the position of the detection area 5. At this time, the pressing rod 21 of the actuation unit 20 of the detection device 2 is caused by the magnetic fastener 22 and the base The magnetic fasteners 18 of the upper cover 17 of the seat 10 are magnetically attracted to each other to be fastened and fixed.

承上,請再一併參閱圖2及圖12,因此,當使用者經按壓該檢測裝置2之壓桿21,使該壓桿21之磁扣件22與該基座10之磁扣件18二者之間的磁吸扣設現象消除,並使該壓桿21與該基座10之上蓋17二者之間的夾角大於一第一預定角度θ1(本實施例中係舉例約大於45度,而其較佳的實施角度約介於15度至60度之間)時,由於該連桿23的二端各別樞接於該壓桿21與該滑塊25的關係,該連桿23係帶動該滑塊25朝該探針座30之斜面底座31的方向呈現水平橫移運動,同 時,亦間接使得該支撐臂24帶動該探針座30朝遠離該基座10的方向並朝該檢測平台1之檢測區5的方向水平橫移運動,而且也讓各別被設置在該支撐臂24與該基座10之該二擋止部16之間的該二彈簧29逐漸地形成壓縮狀態,進而讓該支撐臂24不再呈現水平橫移運動,也間接地讓該探針座30不再呈限水平橫移運動。 Deck, Please Referring to FIG. 2 and FIG. 12, therefore, when the user presses the lever by means of the detection of 21 2, so that the lever member 21 of the magnetic clasp 22 and the base 10 of the magnetic fasteners 18 The phenomenon of magnetic buckle between the two is eliminated, and the angle between the pressing rod 21 and the upper cover 17 of the base 10 is greater than a first predetermined angle θ1 (in this embodiment, for example, it is greater than 45 degrees. , And its preferred implementation angle is between 15 degrees and 60 degrees), because the two ends of the connecting rod 23 are pivotally connected to the pressing rod 21 and the sliding block 25 , the connecting rod 23 the drive system presents a horizontal traversing movement of the slider 25 in the direction of the inclined surface 30 of the probe holder base 31, while also indirectly, such that the support arm 24 to drive the probe toward a direction away from the seat 30 and the base 10 toward the The direction of the detection zone 5 of the detection platform 1 moves horizontally, and the two springs 29 respectively arranged between the support arm 24 and the two stop portions 16 of the base 10 are gradually formed in a compressed state Therefore, the support arm 24 no longer exhibits horizontal lateral movement, and indirectly, the probe holder 30 no longer exhibits a limited horizontal lateral movement.

承上,請再一併參閱圖9、圖13及圖14,接著,當使用者持續地按壓該檢測裝置2之壓桿21,使該壓桿21與該基座10之上蓋17二者之間的夾角自該第一預定角度θ1逐漸地改變至大於一第二預定角度θ2(本實施例中係舉例約大於75度,而其較佳的實施角度約介於60度至90度之間)時,由於,該滑塊25之限位桿250被限位干涉於該支撐臂24之呈長形的該限位孔240的另一側位置,以及被該支撐臂24與該基座10之周壁12的內壁面之間的該二線性滑軌28所限制滑移的關係,因此,係讓該滑塊25得以相對於該支撐臂24而繼續地朝向該探針座30之斜面底座31的高端方向運動,此時,因為樞設於該滑塊25上的該滾輪27係逐漸地自該探針座30之斜面底座31的低端朝高端的方向滾動的關係,而使該探針座30整體朝該檢測區5之待測物7的連接埠的方向呈現垂直向下運動,且使被設置在該探針座30與該作動單元20之支撐臂24之間的該二彈簧33逐漸地形成壓縮狀態,直至被裝設在該探針座30的該排針組4與該檢測區5之待測物7的連接埠二者之間形成電性接設之後,即能藉由該探針座30之排針組4中的複數金屬探針對於該檢測區5之待測物7進行電性檢測。較佳地,此時,該檢測裝置2之該壓桿21、該連桿23與該滑塊25三者構件之間係形成樞擺平衡點(亦或稱死點、反折點)。 Continuing, please refer to FIGS. 9, 13 and 14 together. Then, when the user continuously presses the pressure rod 21 of the detection device 2 , the pressure rod 21 and the upper cover 17 of the base 10 are both The included angle is gradually changed from the first predetermined angle θ1 to greater than a second predetermined angle θ2 (in this embodiment, for example, it is greater than 75 degrees, and the preferred implementation angle is between 60 degrees and 90 degrees. ) causes the slider stopper 25 of the stopper rod 250 is elongated to the interference limiting hole of the support arm 24 of the other side of the position 240, the support arm 24 and a base 10 with the The relationship between the two linear slide rails 28 between the inner wall surfaces of the peripheral wall 12 to limit the sliding movement, so that the slider 25 can continue to face the inclined base 31 of the probe holder 30 relative to the support arm 24 At this time, because the roller 27 pivoted on the slider 25 gradually rolls from the lower end of the inclined surface base 31 of the probe holder 30 toward the high end direction, the probe The seat 30 moves vertically downward toward the connection port of the test object 7 in the detection area 5 as a whole, and causes the two springs 33 arranged between the probe seat 30 and the support arm 24 of the actuation unit 20 The compressed state is gradually formed until an electrical connection is formed between the pin set 4 installed in the probe holder 30 and the connection port of the test object 7 in the detection zone 5 , that is, The plurality of metal probes in the pin header group 4 of the probe holder 30 perform electrical detection on the test object 7 in the detection area 5 . Preferably, at this time, the pressure rod 21 , the connecting rod 23 and the slider 25 of the detection device 2 form a pivot balance point (also called a dead point or a reflex point) between the three components.

承上,然後,當被設置在該探針座30與該作動單元20之支撐臂24之間的該二彈簧33係再次克服該檢測裝置2之該壓桿21、該連桿23與該滑塊25三者構件之間先前所形成的樞擺平衡點時,即自壓縮狀態逐漸地恢復為原始狀態, 且使樞設於該滑塊25上的該滾輪27係將自該探針座30之斜面底座31的高端朝低端的方向滾動復歸的關係,而讓該壓桿21與該基座10之上蓋17二者之間的夾角自該第二預定角度θ2逐漸地恢復至該第一預定角度θ1,使該探針座30整體朝遠離該檢測區5之待測物7的反方向呈現垂直向上復歸移動,進而讓該探針座30之排針組4與該檢測區5之待測物7的連接埠二者解掣。 And then, when the two springs 33 arranged between the probe holder 30 and the support arm 24 of the actuation unit 20 overcome the pressure rod 21 , the connecting rod 23 and the slide of the detection device 2 again When the previously formed pivotal balance point between the three components of the block 25 , that is, the self-compression state gradually returns to the original state, and the roller 27 pivoted on the slider 25 is moved from the probe base 30 The high end of the inclined base 31 rolls back toward the low end, and the angle between the pressure rod 21 and the upper cover 17 of the base 10 is gradually restored from the second predetermined angle θ2 to the first The predetermined angle θ1 causes the probe holder 30 to move vertically upwards in the opposite direction away from the test object 7 of the detection zone 5 , so that the needle row group 4 of the probe holder 30 and the detection zone 5 wait The two ports of the test object 7 are unlocked.

承上,此時,當各別被設置在該支撐臂24與該基座10之該二擋止部16之間的該二彈簧29係自壓縮狀態逐漸地恢復為原始狀態時,將讓該壓桿21與該基座10之上蓋17二者之間的夾角係自該第一預定角度θ1逐漸地恢復至初始角度,即再次藉由該連桿23帶動該滑塊25朝初始位置的方向呈現水平橫移運動,同時,亦使該支撐臂24帶動該探針座30朝遠離該檢測平台1之檢測區5的反方向水平橫移運動,直至該檢測裝置2之作動單元20的該壓桿21再次地藉由該磁扣件22與該基座10之上蓋17的該磁扣件18二者相互磁吸而扣設固定為止。 Continuing, at this time, when the two springs 29 respectively arranged between the supporting arm 24 and the two stopping portions 16 of the base 10 gradually return to the original state from the compressed state, the The angle between the pressing rod 21 and the upper cover 17 of the base 10 is gradually restored from the first predetermined angle θ1 to the initial angle, that is, the connecting rod 23 is again used to drive the slider 25 toward the initial position. It exhibits a horizontal traverse movement. At the same time, the support arm 24 also drives the probe holder 30 to move horizontally and traversely in the opposite direction away from the detection zone 5 of the detection platform 1 until the pressure of the actuation unit 20 of the detection device 2 The rod 21 is again fastened and fixed by the magnetic fastener 22 and the magnetic fastener 18 of the upper cover 17 of the base 10 magnetically attracting each other.

綜上,因此,將可藉由本發明第一實施例所揭露之檢測裝置2整體及其部件結構的技術特徵,除可達成預期之具有水平移動與垂直下壓等兩段式運動行程功效之外,亦可達到重複循環的檢測運動行程等技術功效。 In summary, therefore, the technical features of the entire detection device 2 and its component structure disclosed in the first embodiment of the present invention can be used to achieve the expected two-stage movement stroke effect such as horizontal movement and vertical depression. , It can also achieve the technical effects of repetitive loop detection of movement stroke.

請一併參閱圖15至圖18,係為本發明第二實施例之另一種檢測裝置2A且可應用於如本發明第一實施例所揭露之檢測平台,而該檢測裝置2A的主要結構係概同於前揭第一實施例,而其不同之處乃在於:而該二彈簧29A的一端係各別螺設於該支撐臂24A且靠近於該斜面底座31A的位置,而該二彈簧29A的另一端係各別螺設於該基座10A之周壁12A的該二擋止部16A且相對應於該斜面底座31A的位置。 Please also refer to FIGS. 15 to 18, which are another detection device 2A according to the second embodiment of the present invention and can be applied to the detection platform disclosed in the first embodiment of the present invention. The main structure of the detection device 2A is It is similar to the first embodiment disclosed above, but the difference is that one end of the two springs 29A is respectively screwed on the support arm 24A and close to the inclined base 31A , and the two springs 29A The other end is screwed on the two stop portions 16A of the peripheral wall 12A of the base 10A and corresponds to the position of the inclined base 31A .

而本發明第二實施例之另一種檢測裝置2A的技術功效乃在於,當經按壓該壓桿21A,使該連桿23A帶動該滑塊25A朝該斜面底座31A的方向呈現水平橫移運動時,此時,係使得各別被設置在該支撐臂24A與該基座10A之周壁12A之間的該二彈簧29A逐漸地自初始狀態形成拉伸狀態。 The technical effect of another detection device 2A of the second embodiment of the present invention is that when the pressing rod 21A is pressed, the connecting rod 23A drives the slider 25A to move horizontally in the direction of the inclined base 31A . At this time, the two springs 29A , which are respectively arranged between the support arm 24A and the peripheral wall 12A of the base 10A , gradually form a stretched state from the initial state.

1:檢測平台 1 : Detection platform

2:檢測裝置 2 : Detection device

3:檢測板 3 : Detection board

4:排針組 4 : Pin header group

5:檢測區 5 : Detection area

7:待測物 7 : DUT

Claims (10)

一種檢測裝置,其包含:一基座,係具有一底部以及圍繞於該底部的一周壁,進而形成一容置空間以及一連通於外部與該容置空間的通孔;而自該基座之周壁朝該容置空間的方向係凸伸一擋止部,且該擋止部係靠近於該基座之通孔處;一作動單元,係容設於該基座之容置空間;而該作動單元係包含一壓桿、一連桿、一支撐臂、一滑塊以及一滾輪;而該壓桿的中段係樞設於該基座之周壁且對應於該通孔的位置,該壓桿的一端係可擺動地樞接於該連桿的一端,且該壓桿的另一端係凸伸於該基座;而該連桿的另一端係可擺動地樞接於該滑塊的一端;而該支撐臂的一端係可移動地跨設於該滑塊,且該支撐臂的另一端係朝相對於該連桿的反方向凸伸於該基座之通孔處;而該滑塊係可移動地設置在該基座之底部;而該滾輪係可轉動地樞設於該滑塊的底部;以及一探針座,係包含一斜面底座以及一彈簧;而該探針座係藉由一固定件經穿設於該作動單元之支撐臂的另一端後而固設於該斜面底座的一側,且該斜面底座的斜面段係朝向該作動單元之滾輪的方向;而該彈簧係設置於該探針座與該作動單元之支撐臂的另一端之間;其中,當經按壓該作動單元之壓桿,讓該壓桿與該基座之間的夾角大於一第一預定角度,使該連桿帶動該滑塊朝該探針座之斜面底座的方向移動,且使該支撐臂帶動該探針座朝遠離該基座的方向移動; 其中,當經按壓該作動單元之壓桿,讓該壓桿與該基座之間的夾角自該第一預定角度逐漸地改變至大於一第二預定角度,使樞設於該滑塊上的該滾輪係自該探針座之斜面底座的低端朝高端的方向滾動,讓被設置在該探針座與該作動單元之支撐臂之間的該彈簧逐漸地形成壓縮,並使該探針座朝該斜面底座的方向垂直移動。 A detection device, comprising: a base having a bottom and a peripheral wall surrounding the bottom to form an accommodating space and a through hole communicating with the outside and the accommodating space; A stopper portion protrudes from the peripheral wall toward the accommodating space, and the stopper portion is close to the through hole of the base; an actuation unit is accommodated in the accommodating space of the base; and the actuation The unit includes a pressing rod, a connecting rod, a supporting arm, a sliding block and a roller; and the middle section of the pressing rod is pivoted on the peripheral wall of the base and corresponding to the position of the through hole. One end is pivotally connected to one end of the link in a swingable manner, and the other end of the pressing rod protrudes from the base; and the other end of the link is pivotally connected to one end of the slider in a swingable manner; and One end of the support arm movably straddles the slider, and the other end of the support arm protrudes at the through hole of the base in the opposite direction relative to the connecting rod; and the slider can be Movably disposed at the bottom of the base; and the roller system is rotatably pivoted at the bottom of the slider; and a probe base including an inclined base and a spring; and the probe base is driven by a The fixing member is fixed on one side of the inclined base after passing through the other end of the supporting arm of the actuating unit, and the inclined section of the inclined base is facing the direction of the roller of the actuating unit; and the spring is arranged on Between the probe holder and the other end of the supporting arm of the actuation unit; wherein, when the pressure rod of the actuation unit is pressed, the angle between the pressure rod and the base is greater than a first predetermined angle, so that the The connecting rod drives the slider to move in the direction of the inclined base of the probe base, and causes the support arm to drive the probe base to move away from the base; Wherein, when the pressing rod of the actuating unit is pressed, the angle between the pressing rod and the base is gradually changed from the first predetermined angle to greater than a second predetermined angle, so that the pivoted on the slider The roller system rolls from the low end of the inclined base of the probe holder toward the high end, so that the spring arranged between the probe holder and the support arm of the actuation unit is gradually compressed, and the probe The seat moves vertically in the direction of the inclined base. 如請求項1所述之檢測裝置,其中,該作動單元設有一彈簧,係設置於該支撐臂與該基座之擋止部之間;而當經按壓該作動單元之壓桿,使該壓桿與該基座之間的夾角大於該第一預定角度時,將讓被設置在該支撐臂與該基座之擋止部之間的該彈簧係逐漸地形成壓縮狀態。 The detection device according to claim 1, wherein the actuating unit is provided with a spring which is arranged between the supporting arm and the stop portion of the base; and when the pressing rod of the actuating unit is pressed, the pressing When the included angle between the rod and the base is greater than the first predetermined angle, the spring arranged between the support arm and the stop portion of the base will gradually form a compressed state. 如請求項2所述之檢測裝置,其中,該彈簧的一端係容置於該支撐臂所凹設的一凹部,且該彈簧的另一端係設於該基座之該擋止部。 The detection device according to claim 2, wherein one end of the spring is accommodated in a concave portion of the support arm, and the other end of the spring is set on the stop portion of the base. 如請求項1所述之檢測裝置,其中,該作動單元設有一彈簧,其一端係設置於該支撐臂且靠近於該斜面底座的位置,而該彈簧的另一端係設置於該基座之周壁的該擋止部且相對應於該斜面底座的位置;而當經按壓該作動單元之壓桿,使該壓桿與該基座二者之間的夾角大於該第一預定角度時,將讓被設置在該支撐臂與該基座之周壁之間的該彈簧係逐漸地形成拉伸狀態。 The detection device according to claim 1, wherein the actuating unit is provided with a spring, one end of which is arranged on the support arm and close to the inclined base, and the other end of the spring is arranged on the peripheral wall of the base The stop portion corresponds to the position of the inclined base; and when the pressing rod of the actuation unit is pressed so that the angle between the pressing rod and the base is greater than the first predetermined angle, it will let The spring system arranged between the support arm and the peripheral wall of the base gradually forms a stretched state. 如請求項1至4項其中任何一項所述之檢測裝置,其中,當經按壓該作動單元之壓桿,使該壓桿與該基座二者之間的夾角自該第一預定角度逐漸地改變至大於該第二預定角度時,該壓桿、該連桿與該滑塊三者構件之間係形成樞擺平衡點。 The detection device according to any one of claims 1 to 4, wherein when the pressing rod of the actuating unit is pressed, the angle between the pressing rod and the base gradually starts from the first predetermined angle When the ground is changed to be greater than the second predetermined angle, a pivotal balance point is formed between the three components of the pressure rod, the connecting rod and the slider. 如請求項5所述之檢測裝置,其中,該基座之底部係組設有一個滑軌,且該容置空間呈長形,而該滑軌係順著該容置空間的長形方向設置,而該作動單元之滑塊跨置於該基座之滑軌上並可沿著該滑軌滑移。 The detection device according to claim 5, wherein the bottom of the base is provided with a slide rail, and the accommodating space is elongated, and the slide rail is arranged along the longitudinal direction of the accommodating space , And the sliding block of the actuating unit straddles the sliding rail of the base and can slide along the sliding rail. 如請求項6所述之檢測裝置,其中,該作動單元之支撐臂的長軸向藉由一線性滑軌組設於該基座之周壁的內壁面,用以讓該支撐臂可於該基座之周壁的內壁面上在一預定行程內往復滑移。 The detection device according to claim 6, wherein the long axis of the support arm of the actuation unit is arranged on the inner wall surface of the peripheral wall of the base by a linear slide rail assembly, so that the support arm can be mounted on the base The inner wall surface of the peripheral wall of the seat slides back and forth within a predetermined stroke. 如請求項7所述之檢測裝置,其中,該基座設有一上蓋,且該上蓋設有一磁扣件;而該作動單元之壓桿係設有一磁扣件,且對應於該基座之上蓋的該磁扣件的位置。 The detection device according to claim 7, wherein the base is provided with an upper cover, and the upper cover is provided with a magnetic fastener; and the pressing rod of the actuation unit is provided with a magnetic fastener, and corresponds to the upper cover of the base The position of the magnetic fastener. 如請求項1至4項其中任何一項所述之檢測裝置,其中,該基座之底部係組設有一個滑軌,且該容置空間係呈長形,而該滑軌係順著該容置空間的長形方向設置,而該作動單元之滑塊係跨置於該基座之滑軌上並可沿著該滑軌滑移。 The detection device according to any one of claims 1 to 4, wherein the bottom of the base is provided with a slide rail, and the accommodating space is elongated, and the slide rail follows the The accommodating space is arranged in the long direction, and the sliding block of the actuating unit straddles the sliding rail of the base and can slide along the sliding rail. 如請求項9所述之檢測裝置,其中,該作動單元之支撐臂長軸向藉由一線性滑軌組設於該基座之周壁的內壁面,用以讓該支撐臂可於該基座之周壁的內壁面上在一預定行程內往復滑移。 The detection device according to claim 9, wherein the longitudinal axis of the support arm of the actuation unit is arranged on the inner wall surface of the peripheral wall of the base by a linear slide rail assembly, so that the support arm can be mounted on the base The inner wall of the peripheral wall slides back and forth within a predetermined stroke.
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