TWI804247B - Lifting type detection module and detection device using the detection module - Google Patents

Lifting type detection module and detection device using the detection module Download PDF

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Publication number
TWI804247B
TWI804247B TW111111050A TW111111050A TWI804247B TW I804247 B TWI804247 B TW I804247B TW 111111050 A TW111111050 A TW 111111050A TW 111111050 A TW111111050 A TW 111111050A TW I804247 B TWI804247 B TW I804247B
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base
detection module
slide rail
detection
support
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TW111111050A
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TW202338361A (en
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蔡俊良
游蕙華
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尹鑽科技有限公司
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本發明提供一種檢測裝置,係包含有一個板形基座、一個檢測模組以及一個驅動組,藉由該驅動組接收源自於外部的氣壓或者油壓等外部動力,讓該檢測模組之一個探針座逐漸地自其所對應的斜面段之低端朝向高端的方向往復運動的技術特徵,使該探針座上的複數導電金屬探針凸伸的一端各別電性接設在電子產品位於底部的檢測區位置,進而達到對該電子產品可進行背面或反向扎針之電性測試的功效,更能有效地改善並提升特殊規格電子產品之位在底部待測區域之電性檢測良率。The present invention provides a detection device, which includes a plate-shaped base, a detection module and a driving group, and the driving group receives external power such as air pressure or oil pressure from the outside to make the detection module The technical feature of a probe base gradually reciprocating from the low end to the high end of the corresponding slope section, so that the protruding ends of the plurality of conductive metal probes on the probe base are respectively electrically connected to the electronics. The product is located in the detection area at the bottom, so as to achieve the effect of electrical testing of the electronic product on the back or reverse needle, which can effectively improve and enhance the electrical detection of the electronic product with special specifications in the area to be tested at the bottom yield.

Description

升扎式檢測模組及使用該檢測模組之檢測裝置Lifting type detection module and detection device using the detection module

本發明係與電子產品測試技術相關,特別是指一種適用檢測電子產品之升扎式檢測模組及使用該檢測模組之檢測裝置。 The present invention is related to the testing technology of electronic products, in particular, it refers to a lifting type testing module suitable for testing electronic products and a testing device using the testing module.

目前所使用的電子產品檢測模組種類繁多,為了能夠在製造完成後進一步地確保產品可以正常且完整的運作,所以,在電子產品出貨之前都需要先經過一定程序性的電性檢測;然而,有時一些特殊規格的電子產品,其待測區域為在底部的關係,因此,要如何改善並適配於特殊規格電子產品之位在底部待測區域而有效地進行電性檢測,實則本發明亟欲改善之目的。 There are many types of electronic product testing modules currently in use. In order to further ensure the normal and complete operation of the product after the completion of the manufacturing, it is necessary to go through a certain program of electrical testing before the electronic product is shipped; however , sometimes for some electronic products with special specifications, the area to be tested is at the bottom. Therefore, how to improve and adapt to the position of electronic products with special specifications in the area to be tested at the bottom to effectively perform electrical testing is actually a fundamental problem. The invention is eager to improve the purpose.

而為了要解決先前技術所述之問題,本發明係提供一種檢測裝置,藉由其包含的一個適配於特殊規格電子產品之位在底部待測區域的檢測模組的技術特徵,將能有效地改善並提升特殊規格電子產品之電性檢測良率。 In order to solve the problems described in the prior art, the present invention provides a detection device, which can effectively Improve and enhance the electrical testing yield of electronic products with special specifications.

而為達成上述目的,本發明係又提供一種檢測裝置,包含有一個板形基座、一個檢測模組以及一個驅動組;而該至少一檢測模組係設置在該基座上,並自該基座之其中一短側邊朝著相對的另一短側邊 延伸設置;而該驅動組係連接該至少一檢測模組的一側,使該至少一檢測模組受到該驅動組之驅動而在該基座之二相對短側邊上往復滑移運動。其中,該至少一檢測模組係包括有一個基板、一個滑軌組、一個支撐座、一個防護支臂以及一個探針座;而該滑軌組係設置在該基板上,該支撐座係樞設在該滑軌組上並可在該滑軌組上往復滑移運動,此外,該支撐座係設有一個支柱,且該支柱樞設於一個制動桿,其中,該支撐座係具有一個斜面段;而該防護支臂其一端係連接於該支撐座之該制動桿,其相對的另一端係設有一個防護件;而該探針座係包括有一個扎針部、一個滾輪以及一個固定柱,該扎針部係位在該探針座的一側,且該扎針部係間隔設置複數個導電金屬探針,該滾輪係樞設在該探針座的另一側且對應於該支撐座之斜面段的位置,其中,該探針座係藉由該固定柱組設在該基板上。 In order to achieve the above object, the present invention provides a detection device, which includes a plate-shaped base, a detection module and a driving group; and the at least one detection module is arranged on the base, and from the One of the short sides of the base faces the opposite short side The drive group is connected to one side of the at least one detection module, so that the at least one detection module is driven by the drive group to reciprocate and slide on two relatively short sides of the base. Wherein, the at least one detection module system includes a base plate, a slide rail group, a support base, a protective arm and a probe base; and the slide rail assembly is arranged on the base plate, and the support base is pivoted It is arranged on the slide rail set and can slide back and forth on the slide rail set. In addition, the support seat is provided with a pillar, and the pillar is pivoted to a brake lever, wherein the support seat has a slope section; and one end of the protective support arm is connected to the brake lever of the support base, and the opposite end is provided with a protective piece; and the probe base includes a needle-punching part, a roller and a fixed column , the needle piercing part is located on one side of the probe seat, and the needle piercing part is provided with a plurality of conductive metal probes at intervals, the roller is pivoted on the other side of the probe seat and corresponds to the support seat The position of the slope section, wherein the probe base is set on the base plate through the fixing column.

本發明係藉由該檢測裝置之驅動組接收源自於外部的氣壓或者油壓等外部動力,然後讓該至少一檢測模組之探針座上的該滾輪逐漸地自其所對應的該支撐座之斜面段的低端朝向高端的方向往復運動的技術特徵,如此一來,係讓該探針座整體沿著該固定柱並朝向該電子產品檢測區的方向呈現向上拉升運動,直至該探針座之扎針部的該等直立型導電金屬探針凸伸的一端各別電性接設在該電子產品位於底部的檢測區位置,進而達到對於該電子產品進行背面或反向扎針之電性測試的功效,更能有效地改善並提升特殊規格電子產品之位在底部待測區域之電性檢測良率。 In the present invention, the drive group of the detection device receives external power such as air pressure or oil pressure from the outside, and then the rollers on the probe base of the at least one detection module gradually move from the corresponding support The technical feature that the low end of the slope section of the seat moves back and forth in the direction of the high end, so that the probe seat as a whole shows an upward movement along the fixed column and toward the direction of the electronic product detection area until the The protruding ends of the vertical conductive metal probes on the needle piercing part of the probe base are respectively electrically connected to the detection area at the bottom of the electronic product, so as to achieve the electrical connection of the back or reverse needle piercing of the electronic product. The performance of the performance test can effectively improve and enhance the electrical test yield of the special specification electronic product in the bottom area to be tested.

1:檢測裝置 1: Detection device

100:基座 100: base

200:檢測模組 200: detection module

300:驅動組 300: drive group

10:基板 10: Substrate

20:滑軌組 20: slide rail group

30:支撐座 30: Support seat

31:支柱 31: Pillar

33:制動桿 33: brake lever

331:彈簧 331: spring

35:斜面段 35: Inclined section

40:防護支臂 40: Protective arm

41:防護件 41: Protective parts

50:探針座 50: probe seat

51:扎針部 51: Acupuncture Department

511:針孔 511: pinhole

513:導電金屬探針 513: Conductive metal probe

53:電性檢測電路板 53:Electrical detection circuit board

55:滾輪 55:Roller

57:固定柱 57: fixed column

571:彈簧 571: spring

59:承載板 59: Loading board

90:電子產品檢測區 90:Electronic product testing area

圖1係為本發明較佳實施例之立體示意圖,主要係揭露一種檢測裝置且並未進行電性檢測前的狀態。 FIG. 1 is a three-dimensional schematic diagram of a preferred embodiment of the present invention, mainly disclosing a detection device in a state before electrical detection is performed.

圖2係為圖1另一方向的立體示意圖。 FIG. 2 is a schematic perspective view of another direction in FIG. 1 .

圖3係為圖1之部分構件放大暨立體示意圖,主要係揭露該檢測裝置之一種檢測模組及其主要子構件的狀態。 Fig. 3 is an enlarged and three-dimensional schematic diagram of some components in Fig. 1, which mainly discloses the state of a detection module of the detection device and its main sub-components.

圖4係為圖3之側視示意圖。 FIG. 4 is a schematic side view of FIG. 3 .

圖5係為圖4之部分構件剖視示意圖。 FIG. 5 is a schematic cross-sectional view of some components in FIG. 4 .

圖6係為類似圖3之立體示意圖,主要係揭露該檢測裝置之檢測模組已朝一電子產品檢測區的方向前進後的狀態。 FIG. 6 is a three-dimensional schematic view similar to FIG. 3 , which mainly discloses the state after the detection module of the detection device has advanced toward an electronic product detection area.

圖7係為圖6之側視示意圖。 FIG. 7 is a schematic side view of FIG. 6 .

圖8係為圖7之部分構件剖視示意圖。 FIG. 8 is a schematic cross-sectional view of some components in FIG. 7 .

圖9係為類似圖6之立體示意圖,主要係揭露該檢測裝置之檢測模組已朝該電子產品檢測區的方向進行電性導接後的狀態。。 FIG. 9 is a three-dimensional schematic view similar to FIG. 6, which mainly discloses the state after the detection module of the detection device has been electrically connected in the direction of the detection area of the electronic product. .

圖10係為圖9之側視示意圖。 FIG. 10 is a schematic side view of FIG. 9 .

圖11係為圖10之部分構件剖視示意圖。 FIG. 11 is a schematic cross-sectional view of some components in FIG. 10 .

申請人首先在此說明,於整篇說明書中,包括以下介紹的實施例以及申請專利範圍的各請求項中,有關方向性的名詞皆以本案〔圖示簡單說明〕中所列各圖式的方向為基準。其次,在以下將要介紹之實施例及圖式中,相同之元件標號,代表相同或近似之元件或其結構特 徵。而且,有關本發明的詳細構造、特點、組裝或使用、製造等方式,將於後續的實施方式詳細說明中予以描述,然,在本發明領域中具有通常知識者應能瞭解,該等詳細說明及本發明所列舉的實施例,係僅用於支持說明本發明實能據以實現,並非用以限制本發明之申請專利範圍。 The applicant first explains here that in the entire specification, including the embodiments described below and the claims of the scope of the patent application, the nouns related to direction are all represented by the figures listed in this case [simple description of illustrations] Orientation is the basis. Secondly, in the embodiments and drawings to be introduced below, the same component numbers represent the same or similar components or their structural features. sign. Moreover, the detailed structure, features, assembly or use, and manufacturing methods of the present invention will be described in the detailed description of the subsequent implementation. However, those with ordinary knowledge in the field of the present invention should understand that these detailed descriptions And the examples listed in the present invention are only used to support and illustrate how the present invention can be realized, and are not intended to limit the patent scope of the present invention.

請先參閱圖1以及圖2,為本發明較佳實施例所揭露之一種檢測裝置1,係適用於檢測一種電子產品(例如:顯示器或面板等),該檢測裝置1係包含一個呈長板型體的基座100、二個檢測模組200以及二個驅動組300;而該二檢測模組200係間隔設置在該基座100上,使該二檢測模組200係皆自該基座100之其中一短側邊朝著相對的另一短側邊延伸設置,較佳地,該二檢測模組200彼此之間係呈平行間隔設置;而該二驅動組300係各別連接於該二檢測模組200的其中一側,使任一該檢測模組200可受到所連接的該驅動組300之驅動而基於該基座100之二相對短側邊上往復滑移運動。 Please refer to Fig. 1 and Fig. 2 first, which is a detection device 1 disclosed in a preferred embodiment of the present invention, which is suitable for detecting an electronic product (such as a display or a panel, etc.), and the detection device 1 includes a long board The base 100 of the body, two detection modules 200 and two drive groups 300; and the two detection modules 200 are arranged at intervals on the base 100, so that the two detection modules 200 are all from the base One of the short sides of 100 is extended toward the opposite short side. Preferably, the two detection modules 200 are arranged in parallel and spaced apart from each other; and the two driving groups 300 are respectively connected to the One side of the two detection modules 200 enables any one of the detection modules 200 to be driven by the connected driving group 300 to reciprocate and slide on two relatively short sides of the base 100 .

此外,請再一併參閱圖1至圖5,任一該檢測模組200係包括一個基板10、一個滑軌組20、一個支撐座30、一個防護支臂40以及一個探針座50。 In addition, please refer to FIG. 1 to FIG. 5 together. Any of the detection modules 200 includes a base plate 10 , a slide rail set 20 , a support base 30 , a protective arm 40 and a probe base 50 .

而該基板10係設置在該基座100上且配合該基座100亦呈長板型體,使任一該檢測模組200藉由該基板10而可選擇性地裝設在該檢測裝置1之基座100上的預定位置;而該滑軌組20係設置在該基板10上,使該滑軌組20係自該基板10之其中一短側邊朝著相對的另一短側邊延伸設置,較佳地,該二滑軌組20彼此之間係呈平行間隔設置,且該 基板10的二相對短側邊之間的距離係小於或等於該檢測裝置1之基座100的二相對短側邊之間的距離。 And the substrate 10 is arranged on the base 100 and is also in the shape of a long plate in conjunction with the base 100, so that any of the detection modules 200 can be selectively installed on the detection device 1 through the substrate 10. and the slide rail set 20 is arranged on the base plate 10, so that the slide rail set 20 extends from one short side of the base plate 10 toward the opposite short side Setting, preferably, the two sliding rail groups 20 are arranged in parallel and spaced apart from each other, and the The distance between two relatively short sides of the substrate 10 is less than or equal to the distance between two relatively short sides of the base 100 of the detection device 1 .

而該支撐座30係樞設在該滑軌組20上,使該支撐座30係可在該滑軌組20上朝著相對的方向往復滑移運動,該支撐座30係組設有一個支柱31,該支柱31係樞設有二個制動桿33,使該防護支臂40的一端係連接於該支撐座30之該二制動桿33,此外,該支撐座30係具有一斜面段35;較佳地,該支撐座30之該二制動桿33係皆環覆一個彈簧331,使任一該彈簧331之一端係頂抵在該防護支臂40的一端,其中,該防護支臂40的相對另一端係組設有一個防護件41;更佳地,該支撐座30之支柱31的設置方向是幾近垂直於該滑軌組20的方向,且該支撐座30之該二制動桿33的設置方向係略為平行於該滑軌組20設置在該基板10的方向,使該防護支臂40可隨著該支撐座30在所對應樞設的該滑軌組20上朝著同一相對方向往復滑移運動。而值得一提的是,任一該檢測模組200之滑軌組20係可為線性滑軌、導柱或其均等配合結構所構成,使該支撐座30對應樞設於該滑軌組20的連接處,係配合該滑軌組20而由線性滑塊、導套、襯套或其均等配合結構所構成,此外,該支撐座30係可視實際情況僅設置一該制動桿33;當然,前述所列該等技術特徵係皆為凡所屬技術領域中具有通常知識者得經參酌本發明之較佳實施例後即能易於思及,或僅屬數量上之簡易變化,因此,皆非用以作為限定本發明所欲主張之技術特徵,合先敘明。 And the supporting seat 30 is pivotally arranged on the slide rail group 20, so that the supporting seat 30 can slide back and forth in opposite directions on the sliding rail group 20, and the supporting seat 30 is provided with a pillar 31, the pillar 31 is pivotally provided with two brake levers 33, so that one end of the protective arm 40 is connected to the two brake levers 33 of the support base 30, and the support base 30 has a slope section 35; Preferably, the two brake levers 33 of the support base 30 are all surrounded by a spring 331, so that one end of any one of the springs 331 is pressed against one end of the protective arm 40, wherein the protective arm 40 The opposite end is set with a guard 41; more preferably, the setting direction of the pillar 31 of the support base 30 is almost perpendicular to the direction of the slide rail group 20, and the two brake rods 33 of the support base 30 The installation direction is slightly parallel to the direction in which the slide rail set 20 is arranged on the base plate 10, so that the protective support arm 40 can face the same relative direction along with the support base 30 on the corresponding pivoted slide rail set 20. reciprocating sliding motion. It is worth mentioning that any of the slide rail sets 20 of the detection module 200 can be made of a linear slide rail, a guide post or an equivalent matching structure, so that the support base 30 is pivotally arranged on the slide rail set 20 The connection of the slide rail group 20 is made of a linear slide block, a guide bush, a bush or an equal matching structure thereof. In addition, the support seat 30 is only provided with a brake lever 33 depending on the actual situation; of course, These technical characteristics listed above are all those who have common knowledge in the technical field can easily think of after referring to the preferred embodiments of the present invention, or are only simple changes in quantity, therefore, it is not necessary to use To limit the technical features claimed by the present invention, they will be described first.

而該探針座50係包括有一個扎針部51、一個電性檢測電路板53、一個滾輪55、二個固定柱57;該扎針部51係位在該探針座50的 一側,且該扎針部51係穿設有複數間隔設置的針孔511,且任一該針孔511係組設有一個直立型導電金屬探針513,使任一該直立型導電金屬探針513的一端係凸伸於所對應的該針孔511處,而任一該直立型導電金屬探針513的另一端係電性導接於該電性檢測電路板53,其中,該電性檢測電路板53係可選擇性地容設在該扎針部51之中或者設置在該探針座50之外;而該滾輪55係樞設於該探針座50的另一側,且相對於該扎針部51的位置,其中,該探針座50之滾輪55係對應於該支撐座30之斜面段35的位置;而該探針座50係藉由該二固定柱57的一端係幾近垂直於該基板10並組設固定在該基板10之上,且該二固定柱57的另一端係各別貫穿該探針座50本體後而鎖固在一承載板59的位置,使該探針座50係可幾近同步地在該二固定柱57上往復滑移運動,較佳地,任一該固定柱57係環覆有一個彈簧571,使任一該彈簧571的二端係各別頂抵在該探針座50本體與該承載板59二者構件之間;而值得一提的是,任一該檢測模組200之探針座50的該滾輪55係可為培林、滾珠、承托轉軸、直線運動承軸或其均等配合結構所構成,只要是能達到往復樞轉運動的功效即可,此外,該探針座50係可視實際情況僅設置一該固定柱57;當然,前述所列該等技術特徵係皆為凡所屬技術領域中具有通常知識者得經參酌本發明之較佳實施例後即能易於思及,或僅屬數量上之簡易變化,因此,皆非用以作為限定本發明所欲主張之技術特徵,合先敘明。 And this probe base 50 system comprises a pricking part 51, an electrical detection circuit board 53, a roller 55, two fixed columns 57; One side, and the pinhole 51 is pierced with a plurality of pinholes 511 arranged at intervals, and any one of the pinholes 511 is set with an upright conductive metal probe 513, so that any one of the upright conductive metal probes One end of 513 protrudes from the corresponding pinhole 511, and the other end of any vertical conductive metal probe 513 is electrically connected to the electrical detection circuit board 53, wherein the electrical detection The circuit board 53 can be selectively accommodated in the needle part 51 or outside the probe base 50; The position of the piercing portion 51, wherein the roller 55 of the probe base 50 corresponds to the position of the slope section 35 of the support base 30; and the probe base 50 is almost vertical by one end of the two fixing columns 57 The base plate 10 is assembled and fixed on the base plate 10, and the other ends of the two fixing columns 57 are respectively penetrating through the body of the probe holder 50 and locked on a carrier plate 59, so that the probe The seat 50 can slide back and forth on the two fixed columns 57 almost synchronously. Preferably, any one of the fixed columns 57 is covered with a spring 571, so that the two ends of any one spring 571 are respectively But it is worth mentioning that the roller 55 of the probe holder 50 of any of the detection modules 200 can be bearings, ball bearings, etc. , supporting rotating shaft, linear motion bearing shaft or its equal matching structure, as long as it can achieve the effect of reciprocating pivotal movement, in addition, the probe base 50 is only provided with one fixed column 57 depending on the actual situation; of course The technical features listed above are all those who have ordinary knowledge in the technical field can easily think of it after referring to the preferred embodiments of the present invention, or are only simple changes in quantity, therefore, neither The technical features used to limit the claims of the present invention are described first.

以上為本發明較佳實施例所揭露之檢測裝置1及其各子構件的技術特徵,其後將繼續揭露若藉由本發明較佳實施例所揭露之檢 測裝置1進行一電子產品檢測區90位於底部時的電性檢測,而其主要作動及其所欲達成之功效在於: The above are the technical characteristics of the detection device 1 and its sub-components disclosed in the preferred embodiments of the present invention, and will continue to disclose the detection device 1 disclosed in the preferred embodiments of the present invention. The testing device 1 conducts electrical testing when the testing area 90 of an electronic product is at the bottom, and its main action and the effect it intends to achieve are:

其一,請再一併參閱圖1至圖8,首先,藉由啟動外部的氣壓或者油壓等外部動力並足以讓該檢測裝置1之該二驅動組300各別逕自地產生驅動,係讓各別受到該二驅動組300之驅動的該二檢測模組200在所對應的該滑軌組20上自初始位置朝電子產品的方向逐漸滑移靠近的技術特徵,直至任一該檢測模組200之防護支臂40的該防護件41與該探針座50之扎針部51係大致上各別靠近於該電子產品檢測區90之相對二側,且任一該檢測模組200之支撐座30上的該斜面段35抵接於該探針座50之滾輪55進而產生一擋制力後而略顯停滯,此時,讓該檢測裝置1之該二檢測模組200對於該電子產品檢測區90得以達到初始校正對位之功效。 One, please refer to Fig. 1 to Fig. 8 together again, at first, by starting the external power such as external air pressure or oil pressure and enough to allow this two drive groups 300 of this detection device 1 to generate drive respectively independently, make The technical feature that the two detection modules 200 respectively driven by the two drive groups 300 gradually slide closer to the electronic product from the initial position on the corresponding slide rail group 20 until any of the detection modules The protective member 41 of the protective support arm 40 of 200 and the needle piercing part 51 of the probe base 50 are respectively respectively close to the opposite sides of the electronic product detection area 90, and any support seat of the detection module 200 The slope section 35 on the 30 abuts against the roller 55 of the probe base 50 to generate a blocking force and stagnate slightly. At this time, the two detection modules 200 of the detection device 1 are allowed to detect the electronic product The area 90 can achieve the effect of initial alignment alignment.

其二,請再一併參閱圖6至圖8,而當該檢測裝置1之該二驅動組300持續接收源自於外部的氣壓或者油壓等外部動力時,此時,藉由任一該檢測模組200之支撐座30將持續地受到外部動力而推進,使得位於該支撐座30之該二制動桿33與該防護支臂40二者之間的該二彈簧331逐漸地產生壓縮形變的技術特徵,直至任一該檢測模組200之防護支臂40的該防護件41更為精準地對應並貼附於該電子產品檢測區90的正上方,如此一來,將能有效防止該電子產品呈現翹起或位移等現象,進而有效提升該電子產品在進行電性檢測時的穩定性。 Second, please refer to Fig. 6 to Fig. 8 again, and when the two driving groups 300 of the detection device 1 continue to receive external power such as air pressure or oil pressure from the outside, at this time, by any of the The support base 30 of the detection module 200 will be continuously pushed by external power, so that the two springs 331 between the two brake levers 33 of the support base 30 and the protective arm 40 will gradually produce compression deformation. Technical features, until the protective member 41 of the protective arm 40 of any of the detection modules 200 is more accurately corresponding and attached directly above the electronic product detection area 90, in this way, the electronic product will be effectively prevented from The product presents phenomena such as warping or displacement, which effectively improves the stability of the electronic product during electrical testing.

其三,請一併參閱圖1至圖11,而當該檢測裝置1之該二驅動組300持續接收源自於外部的氣壓或者油壓等外部動力時,此時, 藉由任一該檢測模組200之探針座50上的該滾輪55逐漸地自其所對應的該支撐座30之斜面段35的低端朝向高端的方向運動的技術特徵,如此一來,係讓該探針座50整體沿著該二固定柱57並朝向該電子產品檢測區90的方向呈現垂直向上運動,直至位於該探針座50本體與該承載板59二者之間的該二彈簧571逐漸地產生壓縮形變,且該探針座50之扎針部51的該等直立型導電金屬探針513凸伸的一端各別電性接設在該電子產品檢測區90的位置,進而達到對於該電子產品檢測區90可進行背面或反向扎針之電性測試的功效。同理可知,當該檢測裝置1之該二驅動組300不再接收源自於外部的氣壓或者油壓等外部動力時,將使該二驅動組300帶動該二檢測模組200之探針座50的該等直立型導電金屬探針513隨即自該電子產品檢測區90解掣,讓任一該檢測模組200之探針座50上的該滾輪55逐漸地自其所對應的該支撐座30之斜面段35的高端朝向低端的初始方向運動,並讓任一該檢測模組200之防護支臂40的該防護件41逐漸地遠離該電子產品檢測區90的正上方,直至該二檢測模組200復歸至初始位置為止,如此一來,將能達到對於若干相同型態之電子產品進行重複電性測試之功效。 Thirdly, please refer to Figures 1 to 11 together, and when the two driving groups 300 of the detection device 1 continue to receive external power such as air pressure or oil pressure from the outside, at this time, According to the technical feature that the roller 55 on the probe base 50 of any one of the detection modules 200 gradually moves from the low end of the corresponding slope section 35 of the support base 30 towards the high end, in this way, Let the probe base 50 move vertically upwards along the two fixing columns 57 and toward the electronic product testing area 90 until the two pins located between the probe base 50 body and the carrier plate 59 The spring 571 gradually generates compression deformation, and the protruding ends of the upright conductive metal probes 513 of the needle piercing part 51 of the probe base 50 are respectively electrically connected to the position of the electronic product detection area 90, thereby achieving For the electronic product detection area 90, the effect of the electrical test of backside or reverse needle sticking can be carried out. In the same way, when the two driving groups 300 of the detection device 1 no longer receive external power such as air pressure or oil pressure from the outside, the two driving groups 300 will drive the probe holders of the two detection modules 200 The vertical conductive metal probes 513 of 50 are released from the electronic product detection area 90 immediately, so that the rollers 55 on the probe base 50 of any one of the detection modules 200 are gradually released from the corresponding support bases. The high end of the slope section 35 of 30 moves toward the initial direction of the low end, and allows the guard 41 of any guard arm 40 of the detection module 200 to gradually move away from the electronic product detection area 90 directly above until the two Until the detection module 200 is returned to the initial position, in this way, the effect of repeated electrical tests on several electronic products of the same type can be achieved.

1:檢測裝置 1: Detection device

100:基座 100: base

200:檢測模組 200: detection module

300:驅動組 300: drive group

Claims (4)

一種檢測裝置,其包含:一基座;至少一檢測模組,係設置在該基座上,並自該基座之其中一短側邊朝著相對的另一短側邊延伸設置,其中,該至少一檢測模組係包含一基板、一滑軌組、一支撐座、一防護支臂與一探針座,該滑軌組係設置在該基板上,該支撐座係樞設在該滑軌組上並可在該滑軌組上往復滑移運動,該支撐座係設有一支柱,該支柱係樞設至少一制動桿,該支撐座係具有一斜面段,該防護支臂其一端係連接於該支撐座之該至少一制動桿,其相對的另一端係設有一防護件;而該探針座係包括有一扎針部、一滾輪以及至少一固定柱,該扎針部係位在該探針座的一側,且該扎針部係間隔設置複數導電金屬探針,該滾輪係樞設於該探針座的另一側,且對應於該支撐座之斜面段的位置,該探針座係藉由該至少一固定柱組設在該基板上;以及一驅動組,係連接該至少一檢測模組的一側,使該至少一檢測模組受到該驅動組之驅動而在該基座之二相對短側邊上往復滑移運動。 A detection device, which includes: a base; at least one detection module is arranged on the base and extends from one short side of the base toward the opposite short side, wherein, The at least one detection module includes a base plate, a slide rail set, a support base, a protective support arm and a probe base, the slide rail set is arranged on the base plate, and the support base is pivoted on the slide on the rail set and can reciprocate sliding movement on the slide rail set, the support seat is provided with a pillar, the pillar is pivoted with at least one brake lever, the support seat has a slope section, and one end of the protective support arm is The at least one brake lever connected to the support base has a guard at the opposite end; One side of the needle seat, and the needle part is provided with a plurality of conductive metal probes at intervals, the roller is pivoted on the other side of the probe seat, and corresponds to the position of the slope section of the support seat, the probe seat The at least one fixed column group is arranged on the substrate; and a driving group is connected to one side of the at least one detection module, so that the at least one detection module is driven by the driving group to move on the base bis reciprocating sliding motion on the relatively short sides. 如請求項1所述之檢測裝置,其中,該至少一檢測模組之滑軌組係自該基板之其中一短側邊朝著相對的另一短側邊 延伸設置,且該防護支臂係隨著該支撐座在該滑軌組上往復滑移運動。 The detection device according to claim 1, wherein the slide rail group of the at least one detection module is from one short side of the substrate to the opposite short side It is extended, and the protective support arm moves reciprocally on the slide rail set along with the support base. 如請求項2所述之檢測裝置,其中,該至少一檢測模組之支撐座的該至少一制動桿係環覆一彈簧,該彈簧之一端係頂抵在該防護支臂。 The detection device according to claim 2, wherein the at least one brake lever of the support seat of the at least one detection module is surrounded by a spring, and one end of the spring is pressed against the protective arm. 如請求項3所述之檢測裝置,其中,該至少一檢測模組之滑軌組係可為線性滑軌、導柱或其均等配合結構,且該支撐座對應樞設於該滑軌組的連接處,係配合該滑軌組而由線性滑塊、導套、襯套或其均等配合結構。 The detection device according to claim 3, wherein the slide rail assembly of the at least one detection module can be a linear slide rail, a guide post or an equivalent matching structure, and the support seat is correspondingly pivoted on the slide rail assembly The joints are made of linear sliders, guide bushes, bushings or their equal matching structures to match the slide rail group.
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Publication number Priority date Publication date Assignee Title
TWM411759U (en) * 2011-03-18 2011-09-11 Ta Liang Technology Co Ltd 8A) Pressure Mounting (CCTrCH)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWM411759U (en) * 2011-03-18 2011-09-11 Ta Liang Technology Co Ltd 8A) Pressure Mounting (CCTrCH)

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