TWM457872U - Optical inspecting apparatus - Google Patents

Optical inspecting apparatus Download PDF

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Publication number
TWM457872U
TWM457872U TW101224344U TW101224344U TWM457872U TW M457872 U TWM457872 U TW M457872U TW 101224344 U TW101224344 U TW 101224344U TW 101224344 U TW101224344 U TW 101224344U TW M457872 U TWM457872 U TW M457872U
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Taiwan
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optical
light intensity
housing
arm
detecting
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TW101224344U
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Chinese (zh)
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Fang-Jung Shiou
Geo-Ry Tang
Wei-Chih Hsu
Mu-Chiau Xie
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Univ Nat Taiwan Science Tech
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Priority to TW101224344U priority Critical patent/TWM457872U/en
Publication of TWM457872U publication Critical patent/TWM457872U/en

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Description

光學檢測裝置Optical detection device

本新型係有關於一種檢測裝置,特別是一種光學檢測裝置。The present invention relates to a detecting device, and more particularly to an optical detecting device.

近年來發光二極體(Light Emitting Diode,LED)的應用已經由小瓦數需求的指示燈、顯示器慢慢的到大瓦數需求的路燈上。與傳統燈泡相比,發光二極體應用在照明上具有壽命長、省電、環保、光源具有方向性、色彩多元、驅動電壓低、反應速率快等優點。In recent years, the application of Light Emitting Diode (LED) has been slowly changed from the indicator light and display of small wattage to the street lamp with large wattage demand. Compared with the traditional light bulb, the light-emitting diode has the advantages of long life, power saving, environmental protection, directionality of the light source, multiple colors, low driving voltage and fast reaction rate.

雖然發光二極體具有上述之優點,但為了兼顧發光二極體的品質,發光二極體在出廠前皆必需進行相關數據的檢測,例如光強度檢測、光譜檢測及光波長檢測。Although the light-emitting diode has the above advantages, in order to balance the quality of the light-emitting diode, the light-emitting diode must be subjected to detection of relevant data before shipment, such as light intensity detection, spectral detection, and optical wavelength detection.

以光強度檢測為例,以往光強度檢測設備僅能夠檢測發光二極體之二維的光強度數據。雖然量測二維的光強度所需的量測時間較短,但針對單一發光二極體之量測資料的完整度卻相較不足,如此一來,將導致發光二極體的測試數據呈現為良品,但實際產品上卻仍存在有缺陷,而造成後續應用上的不便。因此如何提升發光二極體檢測設備對發光二極體之檢測精準度將是業界應注重的問題之一。Taking the light intensity detection as an example, the conventional light intensity detecting device can only detect the two-dimensional light intensity data of the light emitting diode. Although the measurement time required to measure the two-dimensional light intensity is short, the integrity of the measurement data for the single light-emitting diode is insufficient, and thus the test data of the light-emitting diode is presented. As a good product, there are still defects in the actual product, which causes inconvenience in subsequent applications. Therefore, how to improve the detection accuracy of the light-emitting diode detection device for the light-emitting diode will be one of the problems that the industry should pay attention to.

本新型是關於一種光學檢測裝置,藉以提升發光二極體檢測設備對發光二極體之檢測精準度。The present invention relates to an optical detecting device for improving the detection accuracy of a light-emitting diode detection device for a light-emitting diode.

本新型所揭露之光學檢測裝置,用以檢測一光學待測物,其包含一光強度檢測模組。光強度檢測模組包含一基台、一承載台、一支臂及一光強度檢測元件。承載台可旋轉地設於基台。承載台用以承載光學待測物。支臂具有一第一端及一第二端。第一端樞設於基台。支臂之旋轉軸線與承載台之旋轉軸線相交。第二端與支臂之轉軸線保持一距離。光強度檢測元件設於支臂之第二端,且光強度檢測元件之移動路徑與承載台之旋轉軸線相交。The optical detecting device disclosed in the present invention is for detecting an optical test object, which comprises a light intensity detecting module. The light intensity detecting module comprises a base, a carrying platform, an arm and a light intensity detecting component. The carrier is rotatably disposed on the base. The carrier is used to carry an optical test object. The arm has a first end and a second end. The first end is pivoted to the base. The axis of rotation of the arm intersects the axis of rotation of the carrier. The second end is at a distance from the axis of rotation of the arm. The light intensity detecting element is disposed at the second end of the arm, and the moving path of the light intensity detecting element intersects the rotation axis of the stage.

根據上述本新型所揭露之光學檢測裝置,光強度檢測模組之支臂之旋轉軸線與承載台之旋轉軸線相交,使得設於支臂上之光強度檢測元件可檢測出承載台上之光學待測物的三維光強度分佈資訊,進而提升光學檢測裝置之檢測精準度。According to the optical detecting device disclosed in the present invention, the rotation axis of the arm of the light intensity detecting module intersects with the rotation axis of the carrying platform, so that the light intensity detecting element provided on the arm can detect the optical waiting on the carrying platform. The three-dimensional light intensity distribution information of the object is measured, thereby improving the detection accuracy of the optical detecting device.

以上之關於本新型內容之說明及以下之實施方式之說明係用以示範與解釋本新型之原理,並且提供本新型之專利申請範圍更進一步之解釋。The above description of the present invention and the following description of the embodiments are intended to illustrate and explain the principles of the present invention and to provide a further explanation of the scope of the invention.

請同時參閱第1圖至第4圖,第1圖為第一實施例所揭露之光學檢測裝置的系統方塊示意圖,第2圖為第1圖之光學檢測裝置的立體示意圖,第3圖為第1圖之光強度檢測模組的立體示意圖,第4圖為第1圖之光譜檢測模組的立體示意圖。第5A圖為第2圖之光強度檢測模組之光強度檢測元件位於光學待測物上方的側面示意圖。Please refer to FIG. 1 to FIG. 4 at the same time. FIG. 1 is a schematic block diagram of the optical detecting device disclosed in the first embodiment, and FIG. 2 is a perspective view of the optical detecting device of FIG. 1 , and FIG. 1 is a perspective view of the light intensity detecting module, and FIG. 4 is a perspective view of the spectrum detecting module of FIG. 1. Fig. 5A is a side view showing the light intensity detecting element of the light intensity detecting module of Fig. 2 located above the optical object to be tested.

本實施例之光學檢測裝置10,用以檢測一光學待測物60,光 學待測物60例如為發光二極體。此外,光學檢測裝置10可透過一控制卡30、一第一資料擷取卡40及一第二資料擷取卡50連接於電腦20,以利用電腦20來控制光學檢測裝置10。The optical detecting device 10 of the embodiment is configured to detect an optical object to be tested 60, and the light The object to be tested 60 is, for example, a light-emitting diode. In addition, the optical detecting device 10 can be connected to the computer 20 through a control card 30, a first data capture card 40 and a second data capture card 50 to control the optical detecting device 10 by using the computer 20.

光學檢測裝置10包含一底座70、一光強度檢測模組100、一電控模組200及一光譜檢測模組300。此外,光學檢測裝置10更包含一光纖400。The optical detecting device 10 includes a base 70, a light intensity detecting module 100, an electronic control module 200, and a spectrum detecting module 300. In addition, the optical detecting device 10 further includes an optical fiber 400.

光強度檢測模組100包含一基台110、一承載台120、一第一活動平台130、一支臂140及一光強度檢測元件150。此外,光強度檢測模組100更包含二驅動馬達160、二導電元件170及一第一殼體180。在本實施例中,二驅動馬達160以步進馬達為例,但並不以此為限。The light intensity detecting module 100 includes a base 110, a carrying platform 120, a first movable platform 130, an arm 140 and a light intensity detecting component 150. In addition, the light intensity detecting module 100 further includes two driving motors 160 , two conductive elements 170 , and a first housing 180 . In the present embodiment, the two-drive motor 160 is exemplified by a stepping motor, but is not limited thereto.

基台110設於底座70。The base 110 is disposed on the base 70.

承載台120可旋轉地設於基台110。承載台120用以承載光學待測物60。於實際操作上,光學待測物60之中心係對準於承載台120之旋轉軸線L1。二驅動馬達160之一用來驅動承載台120相對基台110轉動。The carrier 120 is rotatably disposed on the base 110. The carrying platform 120 is used to carry the optical test object 60. In practice, the center of the optical test object 60 is aligned with the rotation axis L1 of the stage 120. One of the two drive motors 160 is used to drive the carriage 120 to rotate relative to the base 110.

第一活動平台130可活動地設於基台110(可沿x軸及y軸之雙軸向移動)。第一活動平台130的活動方式並非用以限制本新型,在其他實施例中,第一活動平台130也可以係可沿x軸、y軸及z軸之方向移動。The first movable platform 130 is movably disposed on the base 110 (which is movable in both directions along the x-axis and the y-axis). The manner in which the first movable platform 130 is moved is not intended to limit the present invention. In other embodiments, the first movable platform 130 may also be movable in the directions of the x-axis, the y-axis, and the z-axis.

支臂140具有一第一端141及一第二端142。支臂140之第一端141樞設於第一活動平台130。支臂140之旋轉軸線L2與承載 台120之旋轉軸線L1相交。光強度檢測元件150設於支臂140之第二端142,並且光強度檢測元件150電性連接第一資料擷取卡40,用以將光學待測物60之光強度資訊傳至電腦20。支臂140之第二端142與支臂140之旋轉軸線L2保持一距離d(如第5A圖所示)。The arm 140 has a first end 141 and a second end 142. The first end 141 of the arm 140 is pivoted to the first movable platform 130. The rotation axis L2 of the arm 140 and the bearing The axis of rotation L1 of the table 120 intersects. The light intensity detecting component 150 is disposed at the second end 142 of the arm 140, and the light intensity detecting component 150 is electrically connected to the first data capturing card 40 for transmitting the light intensity information of the optical object to be tested 60 to the computer 20. The second end 142 of the arm 140 is maintained at a distance d from the axis of rotation L2 of the arm 140 (as shown in Figure 5A).

詳細來說,支臂140包含一樞轉件143及一支撐件144,而第一端141與第二端142分別位於樞轉件143及支撐件144。樞轉件143樞設於第一活動平台130。二驅動馬達160之另一用來驅動樞轉件143相對第一活動平台130轉動。支撐件144可位移地裝設於樞轉件143,並與樞轉件143之旋轉軸線保持距離d。光強度檢測元件150設於支撐件144。本實施例之光強度檢測元件150為光電晶體,用來檢測光學待測物60之光強度。此外,光強度檢測元件150之移動路徑M與承載台120之旋轉軸線L1相交。當光學待測物60之中心位於承載台120之旋轉軸線L1時,樞轉件143樞轉90度,使得光強度檢測元件150可自光學待測物60之一側位移至光學待測物60之正上方。In detail, the arm 140 includes a pivoting member 143 and a supporting member 144, and the first end 141 and the second end 142 are respectively located at the pivoting member 143 and the supporting member 144. The pivoting member 143 is pivoted to the first movable platform 130. The other of the two drive motors 160 is used to drive the pivoting member 143 to rotate relative to the first movable platform 130. The support member 144 is movably mounted to the pivot member 143 and maintains a distance d from the axis of rotation of the pivot member 143. The light intensity detecting element 150 is provided on the support 144. The light intensity detecting element 150 of the present embodiment is a photoelectric crystal for detecting the light intensity of the optical object to be tested 60. Further, the moving path M of the light intensity detecting element 150 intersects the rotation axis L1 of the stage 120. When the center of the optical test object 60 is located at the rotation axis L1 of the stage 120, the pivoting member 143 is pivoted by 90 degrees so that the light intensity detecting element 150 can be displaced from one side of the optical object to be tested 60 to the optical object to be tested 60. Just above it.

導電元件170一端固定於基台110,另一端固定於承載台120並與光學待測物60電性連接。The conductive element 170 is fixed to the base 110 at one end and fixed to the carrier 120 at the other end and electrically connected to the optical object 60.

第一殼體180設於底座70,並罩覆住基台110、承載台120、第一活動平台130、支臂140、光強度檢測元件150及光學待測物60。藉此,可避免環境光源照射至光強度檢測元件150而影響檢測的精準度。此外,第一殼體180具有一第一透孔181,第一透孔 181對應承載台120,故本實施例之第一透孔181位於光學待測物60之正上方。The first housing 180 is disposed on the base 70 and covers the base 110, the carrier 120, the first movable platform 130, the arm 140, the light intensity detecting element 150, and the optical object 60. Thereby, it is possible to prevent the ambient light source from being irradiated to the light intensity detecting element 150 to affect the accuracy of the detection. In addition, the first housing 180 has a first through hole 181, and the first through hole The first through hole 181 of the present embodiment is located directly above the optical object to be tested 60.

電控模組200包含一訊號傳輸介面210(例如為UMI-7761)、一驅動器220及一電源供應器230。訊號傳輸介面210電性連接控制卡30以及驅動器220。驅動器220電性連接二驅動馬達160,以利用電腦20來控制二驅動馬達160驅動承載台120及支臂140。電源供應器230與二導電元件170電性連接,二導電元件170與光學待測物60電性連接。電源供應器230用以供電給光學待測物60,以令光學待測物60發出光線。The electronic control module 200 includes a signal transmission interface 210 (for example, UMI-7761), a driver 220, and a power supply 230. The signal transmission interface 210 is electrically connected to the control card 30 and the driver 220. The driver 220 is electrically connected to the two driving motors 160 to control the two driving motors 160 to drive the carrying platform 120 and the arms 140 by using the computer 20. The power supply 230 is electrically connected to the two conductive elements 170, and the two conductive elements 170 are electrically connected to the optical object 60. The power supply 230 is used to supply power to the optical object to be tested 60 to cause the optical object to be tested 60 to emit light.

光譜檢測模組300包含一第二活動平台310、一第一反射鏡320、一第二反射鏡330、一光柵340、一光譜檢測元件350及一第二殼體360。第二活動平台310可相對第二殼體360活動地設於第二殼體360(可沿x軸及y軸之方向移動),但並不以此為限,在其他實施例中,第二活動平台310也可以係可活動地設於底座70。第一反射鏡320、第二反射鏡330、光柵340及光譜檢測元件350設於第二活動平台310。光譜檢測元件350電性連接第二資料擷取卡50,用以將光學待測物60之光譜特性資訊傳至電腦20。在本實施例中,光譜檢測元件350為電荷耦合元件(Charge Couple Device,CCD)線型感測器。第一反射鏡320與第二反射鏡330例如為球面鏡。The spectrum detecting module 300 includes a second movable platform 310, a first mirror 320, a second mirror 330, a grating 340, a spectral detecting component 350, and a second housing 360. The second movable platform 310 is movably disposed on the second housing 360 (movable in the direction of the x-axis and the y-axis) relative to the second housing 360, but is not limited thereto. In other embodiments, the second The movable platform 310 can also be movably disposed on the base 70. The first mirror 320, the second mirror 330, the grating 340, and the spectrum detecting element 350 are disposed on the second movable platform 310. The spectrum detecting component 350 is electrically connected to the second data capture card 50 for transmitting the spectral characteristic information of the optical analyte 60 to the computer 20. In the present embodiment, the spectrum detecting element 350 is a charge coupled device (CCD) line type sensor. The first mirror 320 and the second mirror 330 are, for example, spherical mirrors.

第二殼體360設於底座70,並罩覆住一第二活動平台310、一第一反射鏡320、一第二反射鏡330、一光柵340及一光譜檢測 元件350。第二殼體360具有一第二透孔361,第二透孔361對應第一反射鏡320。光纖400分別裝設於第一透孔181及第二透孔361,以將光學待測物60之光線傳導至光譜檢測模組300之第一反射鏡320上。The second housing 360 is disposed on the base 70 and covers a second movable platform 310, a first mirror 320, a second mirror 330, a grating 340, and a spectral detection. Element 350. The second housing 360 has a second through hole 361 corresponding to the first mirror 320. The optical fibers 400 are respectively disposed on the first through hole 181 and the second through hole 361 to conduct the light of the optical object to be tested 60 to the first mirror 320 of the spectrum detecting module 300.

藉此,光學待測物60之光線能依序經由第一反射鏡320、光柵340、第二反射鏡330反射至光譜檢測元件350,以令光譜檢測元件350感測光學待測物60的光譜特性。Thereby, the light of the optical analyte 60 can be sequentially reflected to the spectrum detecting element 350 via the first mirror 320, the grating 340, and the second mirror 330, so that the spectrum detecting element 350 senses the spectrum of the optical object 60. characteristic.

在本實施例中,光學檢測裝置10包含光譜檢測模組300,但並不以此為限,在其他實施例中,光學檢測裝置10也可以不包含光譜檢測模組300。In the present embodiment, the optical detection device 10 includes the spectral detection module 300, but is not limited thereto. In other embodiments, the optical detection device 10 may not include the spectral detection module 300.

接下來,描述本實施例之光學檢測裝置10如何檢測出光學待測物60之三維的光強度資訊。請參閱第5A圖與第5B圖,第5B圖為第2圖之光強度檢測模組之光強度檢測元件位於光學待測物一側的側面示意圖。Next, how the optical detecting device 10 of the present embodiment detects the three-dimensional light intensity information of the optical test object 60 will be described. Please refer to FIG. 5A and FIG. 5B , and FIG. 5B is a schematic side view of the light intensity detecting element of the light intensity detecting module of FIG. 2 on the side of the optical object to be tested.

首先,如第5A圖所示,光強度檢測元件150的初始位置在光學待測物60旁,並與光學待測物60之透光面底端保持相同水平高度。當承載台120旋轉時,光強度檢測元件150開始檢測光學待測物60最底部一圈之光強度。接著,當光強度檢測元件150每檢測一圈後,則透過樞轉件143將光強度檢測元件150提高一高度以檢測光學待測物60下一圈的光強度。接著,反覆進行上述步驟直到光強度檢測元件150位移至光學待測物60之正上方,也就是說,樞轉件143轉動了90度。如此一來,光學檢測裝置10則 能夠檢測到光學待測物60三維之光強度檢測資訊,進而能夠依據此三維之光強度檢測資料來判斷光學待測物60是否存在缺陷。First, as shown in Fig. 5A, the initial position of the light intensity detecting element 150 is adjacent to the optical object to be tested 60, and is maintained at the same level as the bottom end of the light transmitting surface of the optical object to be tested 60. When the stage 120 is rotated, the light intensity detecting element 150 starts detecting the light intensity of the bottommost circle of the optical object to be tested 60. Next, after each detection of the light intensity detecting element 150, the light intensity detecting element 150 is raised by the pivoting member 143 by a height to detect the light intensity of the next turn of the optical object to be tested 60. Next, the above steps are repeated until the light intensity detecting element 150 is displaced right above the optical object to be tested 60, that is, the pivoting member 143 is rotated by 90 degrees. In this way, the optical detecting device 10 The three-dimensional light intensity detection information of the optical test object 60 can be detected, and the optical test object 60 can be judged based on the three-dimensional light intensity detection data.

上述光強度檢測元件150位移的方向係自光學待測物60之底部位移至正上方,但並不以此為限,在其他實施例中,光強度檢測元件150位移的方向也可以自光學待測物60之正上方位移至光學待測物60之底部。The direction in which the light intensity detecting element 150 is displaced is displaced from the bottom of the optical object to be tested 60 to the upper side, but is not limited thereto. In other embodiments, the direction in which the light intensity detecting element 150 is displaced may also be optically treated. The measurement object 60 is displaced directly above the bottom of the optical sample to be tested 60.

然而,本實施例之光學檢測裝置10在檢測前可先進行位置校正,以提升光學待測物60之光強度檢測的精準度。請參閱第6A圖與第6B圖,第6A圖為第2圖之未完成校正之光學待測物的光強度分布圖,第6B圖為第2圖之完成校正之光學待測物的光強度分布圖。校正的方式為先將樞轉件143樞轉180度,使得光強度檢測元件150沿通過承載台120之旋轉軸線L1的路徑移動以獲得一條光學待測物60之光強度分佈曲線(實線)。接著,將承載台120轉動一角度後,再將樞轉件143樞轉180度,使得光強度檢測元件150沿通過承載台120之旋轉軸線L1的路徑移動以獲得另一條光學待測物60之光強度分佈曲線(虛線)。從這兩條光強度分佈曲線可判斷光學檢測裝置10是否校正完成。如第6A圖所示,這兩條光強度分佈曲線之強度最高的位置未重疊代表未完成校正,故需繼續調整光學待測物60與光學檢測裝置10間之相對位置直到校正完成。如第6B圖所示,這兩條光強度分佈曲線之強度最高的位置重疊代表已完成校正,故可開始進行光學待測物60之檢測。However, the optical detecting device 10 of the present embodiment can perform position correction before detecting to improve the accuracy of detecting the light intensity of the optical object to be tested 60. Please refer to FIG. 6A and FIG. 6B, FIG. 6A is a light intensity distribution diagram of the optical specimen to be uncorrected corrected in FIG. 2, and FIG. 6B is a light intensity of the optical specimen to be corrected according to FIG. Distribution. The correction is performed by first pivoting the pivoting member 143 by 180 degrees so that the light intensity detecting element 150 moves along the path passing through the rotation axis L1 of the loading table 120 to obtain a light intensity distribution curve (solid line) of an optical sample to be tested 60. . Next, after the stage 120 is rotated by an angle, the pivoting member 143 is pivoted by 180 degrees, so that the light intensity detecting element 150 moves along the path passing through the rotation axis L1 of the carrying platform 120 to obtain another optical object to be tested 60. Light intensity distribution curve (dashed line). From these two light intensity distribution curves, it can be judged whether or not the optical detecting device 10 is corrected. As shown in Fig. 6A, the positions where the highest intensity of the two light intensity distribution curves are not overlapped represent unfinished correction, so the relative position between the optical test object 60 and the optical detecting device 10 needs to be continuously adjusted until the correction is completed. As shown in Fig. 6B, the positional overlap of the two light intensity distribution curves having the highest intensity indicates that the correction has been completed, so that the detection of the optical test object 60 can be started.

根據上述本新型所揭露之光學檢測裝置,光強度檢測模組之 支臂之旋轉軸線與承載台之旋轉軸線相交,使得設於支臂上之光強度檢測元件可檢測出承載台上之光學待測物的三維光強度分佈資訊,進而提升光學檢測裝置之檢測精準度。According to the optical detecting device disclosed in the above novel, the light intensity detecting module The rotation axis of the arm intersects with the rotation axis of the carrier, so that the light intensity detecting component disposed on the arm can detect the three-dimensional light intensity distribution information of the optical object on the bearing platform, thereby improving the detection precision of the optical detecting device. degree.

此外,光纖連接光強度檢測模組與光譜檢測模組,使得擺放在光強度檢測模組內之光學待測物的光線可經光纖傳至光譜檢測模組,進而使光學檢測裝置除了可以檢測光學待測物之光強度資訊外,亦可檢測光學待測物之光譜特性。In addition, the optical fiber connection light intensity detecting module and the spectrum detecting module enable the light of the optical object to be tested placed in the light intensity detecting module to be transmitted to the spectrum detecting module through the optical fiber, thereby enabling the optical detecting device to detect In addition to the light intensity information of the optical test object, the spectral characteristics of the optical test object can also be detected.

雖然本新型之實施例揭露如上所述,然並非用以限定本新型,任何熟習相關技藝者,在不脫離本新型之精神和範圍內,舉凡依本新型申請範圍所述之形狀、構造、特徵及精神當可做些許之變更,因此本新型之專利保護範圍須視本說明書所附之申請專利範圍所界定者為準。Although the embodiments of the present invention are disclosed as described above, it is not intended to limit the present invention, and those skilled in the art can, without departing from the spirit and scope of the present invention, the shapes, structures, and features described in the scope of the present application. And the spirit of the invention is subject to change. Therefore, the scope of patent protection of the present invention is subject to the definition of the scope of the patent application attached to this specification.

10‧‧‧光學檢測裝置10‧‧‧Optical inspection device

20‧‧‧電腦20‧‧‧ computer

30‧‧‧控制卡30‧‧‧Control card

40‧‧‧第一資料擷取卡40‧‧‧First data capture card

50‧‧‧第二資料擷取卡50‧‧‧Second data capture card

60‧‧‧光學待測物60‧‧‧Optical test object

70‧‧‧底座70‧‧‧Base

100‧‧‧光強度檢測模組100‧‧‧Light intensity detection module

110‧‧‧基台110‧‧‧Abutment

120‧‧‧承載台120‧‧‧Loading station

130‧‧‧第一活動平台130‧‧‧First event platform

140‧‧‧支臂140‧‧‧ Arm

141‧‧‧第一端141‧‧‧ first end

142‧‧‧第二端142‧‧‧ second end

143‧‧‧樞轉件143‧‧‧ pivoting parts

144‧‧‧支撐件144‧‧‧Support

150‧‧‧光強度檢測元件150‧‧‧Light intensity detection component

160‧‧‧驅動馬達160‧‧‧Drive motor

170‧‧‧導電元件170‧‧‧Conductive components

180‧‧‧第一殼體180‧‧‧ first housing

181‧‧‧第一透孔181‧‧‧ first through hole

200‧‧‧電控模組200‧‧‧Electric control module

210‧‧‧訊號傳輸介面210‧‧‧Signal transmission interface

220‧‧‧驅動器220‧‧‧ drive

230‧‧‧電源供應器230‧‧‧Power supply

300‧‧‧光譜檢測模組300‧‧‧Spectrum detection module

310‧‧‧第二活動平台310‧‧‧Second event platform

320‧‧‧第一反射鏡320‧‧‧First mirror

330‧‧‧第二反射鏡330‧‧‧second mirror

340‧‧‧光柵340‧‧‧Raster

350‧‧‧光譜檢測元件350‧‧‧ Spectral detection components

360‧‧‧第二殼體360‧‧‧ second housing

361‧‧‧第二透孔361‧‧‧Second through hole

400‧‧‧光纖400‧‧‧ fiber

第1圖為第一實施例所揭露之光學檢測裝置的系統方塊示意圖。FIG. 1 is a block diagram showing the system of the optical detecting device disclosed in the first embodiment.

第2圖為第1圖之光學檢測裝置的立體示意圖。Fig. 2 is a perspective view showing the optical detecting device of Fig. 1.

第3圖為第1圖之光強度檢測模組的立體示意圖。Figure 3 is a perspective view of the light intensity detecting module of Figure 1.

第4圖為第1圖之光譜檢測模組的立體示意圖。Figure 4 is a perspective view of the spectrum detecting module of Figure 1.

第5A圖為第2圖之光強度檢測模組之光強度檢測元件位於光學待測物上方的側面示意圖。Fig. 5A is a side view showing the light intensity detecting element of the light intensity detecting module of Fig. 2 located above the optical object to be tested.

第5B圖為第2圖之光強度檢測模組之光強度檢測元件位於光學待測物一側的側面示意圖。Fig. 5B is a side view showing the light intensity detecting element of the light intensity detecting module of Fig. 2 on the side of the optical object to be tested.

第6A圖為第2圖之未完成校正之光學待測物的光強度分布圖。Fig. 6A is a light intensity distribution diagram of the optical test object which is not completed and corrected in Fig. 2.

第6B圖為第2圖之完成校正之光學待測物的光強度分布圖。Fig. 6B is a light intensity distribution diagram of the optical sample to be corrected which is completed in Fig. 2.

60‧‧‧光學待測物60‧‧‧Optical test object

100‧‧‧光強度檢測模組100‧‧‧Light intensity detection module

110‧‧‧基台110‧‧‧Abutment

120‧‧‧承載台120‧‧‧Loading station

130‧‧‧第一活動平台130‧‧‧First event platform

140‧‧‧支臂140‧‧‧ Arm

141‧‧‧第一端141‧‧‧ first end

142‧‧‧第二端142‧‧‧ second end

143‧‧‧樞轉件143‧‧‧ pivoting parts

144‧‧‧支撐件144‧‧‧Support

150‧‧‧光強度檢測元件150‧‧‧Light intensity detection component

160‧‧‧驅動馬達160‧‧‧Drive motor

170‧‧‧導電元件170‧‧‧Conductive components

Claims (10)

一種光學檢測裝置,用以檢測一光學待測物,包含一光強度檢測模組,該光強度檢測模組包含:一基台;一承載台,可旋轉地設於該基台,該承載台用以承載該光學待測物;一支臂,具有一第一端及一第二端,該第一端樞設於該基台,該支臂之旋轉軸線與該承載台之旋轉軸線相交,該第二端與該支臂之旋轉軸線保持一距離;以及一光強度檢測元件,設於該支臂之該第二端,且該光強度檢測元件之移動路徑與該承載台之旋轉軸線相交。 An optical detecting device for detecting an optical object to be tested, comprising a light intensity detecting module, the light intensity detecting module comprising: a base; a carrying platform rotatably disposed on the base, the carrying platform The arm has a first end and a second end, and the first end is pivotally disposed on the base, and the rotation axis of the arm intersects with the rotation axis of the carrier. The second end is at a distance from the axis of rotation of the arm; and a light intensity detecting element is disposed at the second end of the arm, and the moving path of the light intensity detecting element intersects the axis of rotation of the carrier . 如請求項1所述之光學檢測裝置,其中該支臂包含一樞轉件及一支撐件,該樞轉件樞設於該基台,該支撐件可位移地裝設於該樞轉件,該光強度檢測元件設於該支撐件。 The optical detecting device of claim 1, wherein the arm comprises a pivoting member and a supporting member, the pivoting member is pivotally mounted on the base, and the supporting member is movably mounted on the pivoting member. The light intensity detecting element is provided on the support. 如請求項1所述之光學檢測裝置,其中該光強度檢測元件為一光電晶體。 The optical detecting device of claim 1, wherein the light intensity detecting element is a photoelectric crystal. 如請求項1所述之光學檢測裝置,更包含一電控模組,包含一訊號傳輸介面及一驅動器,該光強度檢測模組更包含二驅動馬達,該訊號傳輸介面電性連接該驅動器,該驅動器電性連接該二驅動馬達,該二驅動馬達分別電性連接該承載台及該支臂,並用以驅動該承載台與該支臂旋轉。 The optical detection device of claim 1, further comprising an electronic control module comprising a signal transmission interface and a driver, the light intensity detection module further comprising two driving motors, wherein the signal transmission interface is electrically connected to the driver, The driver is electrically connected to the two driving motors, and the two driving motors are electrically connected to the carrying platform and the arm respectively, and are used for driving the carrying platform and the arm to rotate. 如請求項4所述之光學檢測裝置,其中該電控模組更包含一電 源供應器,該電源供應器用以電性連接該光學待測物。 The optical detecting device of claim 4, wherein the electronic control module further comprises an electric a power supply for electrically connecting the optical test object. 如請求項1所述之光學檢測裝置,其中該光強度檢測模組更包含一第一活動平台,該第一活動平台可相對該基台活動地設於該基台,該支臂樞設於該第一活動平台。 The optical detecting device of claim 1, wherein the light intensity detecting module further comprises a first movable platform, wherein the first movable platform is movably disposed on the base opposite to the base, and the arm is pivoted on the base The first activity platform. 如請求項1所述之光學檢測裝置,更包含一光譜檢測模組及一光纖,該光強度檢測模組更包含一第一殼體,遮蓋於該承載台及該支臂,該光譜檢測模組更包含一第二殼體,該光纖分別連接於該第一殼體與該第二殼體,用以令該第一殼體內之該光學待測物之光線導進該第二殼體。 The optical detection device of claim 1, further comprising a spectral detection module and an optical fiber, the light intensity detection module further comprising a first housing covering the loading platform and the arm, the spectral detection mode The group further includes a second housing, the optical fibers being respectively connected to the first housing and the second housing for guiding light of the optical test object in the first housing into the second housing. 如請求項7所述之光學檢測裝置,其中該第一殼體與該第二殼體分別包含一第一透孔及一第二透孔,該第一透孔對應該承載台,該光纖分別裝設於該第一透孔及該第二透孔。 The optical detecting device of claim 7, wherein the first housing and the second housing respectively comprise a first through hole and a second through hole, wherein the first through hole corresponds to the carrying platform, and the optical fibers respectively The first through hole and the second through hole are installed. 如請求項8所述之光學檢測裝置,其中該光譜檢測模組包含一第二活動平台、一第一反射鏡、一第二反射鏡、一光柵及一光譜檢測元件,該第二活動平台可相對該第二殼體活動地設於該第二殼體,該第一反射鏡、該第二反射鏡、該光柵及該光譜檢測元件設於該第二活動平台,該第二透孔對應該第一反射鏡,該第一反射鏡用以反射該光學待測物之光線,且依序經由該光柵、該第二反射鏡面反射至該光譜檢測元件,以令該光譜檢測元件感測該光學待測物的光譜特性。 The optical detecting device of claim 8, wherein the spectral detecting module comprises a second movable platform, a first reflecting mirror, a second reflecting mirror, a grating and a spectral detecting component, wherein the second movable platform can be The second housing is movably disposed on the second housing, the first mirror, the second mirror, the grating and the spectrum detecting component are disposed on the second movable platform, and the second through hole corresponds to a first mirror for reflecting the light of the optical object to be tested, and sequentially reflecting the light to the spectrum detecting element via the grating and the second mirror surface, so that the spectrum detecting element senses the light The spectral characteristics of the analyte. 如請求項7所述之光學檢測裝置,更包含一底座,該第一殼體與該第二殼體分別設於該底座。 The optical detecting device of claim 7, further comprising a base, the first housing and the second housing being respectively disposed on the base.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI562551B (en) * 2015-11-10 2016-12-11 Univ Nat Cheng Kung Fiber sensor system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI562551B (en) * 2015-11-10 2016-12-11 Univ Nat Cheng Kung Fiber sensor system

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