M373490 五、新型說明： 【新型所屬之技術領域】 本創作為-種記憶卡測試、寫人(測、寫）Μ的技術領域， 尤其指-種採用傾斜式滑道的設計，配合相._機械結構，制 置能進行記憶卡的自動化測、寫作業。 【先前技術】 測試人員。 基於上述原因， 般快閃式s己憶卡(例如sd卡、mini SD卡、顧c卡…等)在 •廠商出貨前，須至少通過二道的測試作業。第一遒為開卡測試， 確認記憶卡是否為m道為讀寫職，測試記憶卡是否能 -正常作業。習用的測試作業包括開卡測試與讀寫剛試皆是採用手 .動模式，測試機器為複數台與電腦連線的治具及設備。測試流程 依序為：以人工確認測試物數量、設定測試參數、連接測試治具、 =測試物放置_試治具處、進行開卡（或讀寫測試）、以及依測 \結果區分良品與不良品。上述每道流程料人卫手動模式，故 •敎量人員操作，同時也須大量測試治具及設備。因此以人工測 的工廠’常㈣情形工勒具有大量的測試設備及大量的 席因，部份廉商即開始研發自動化的測試機台。自 通常包括-供料裝置，負責容納待測記憶卡之料 I，倉眚取放接淛/含、I*M373490 V. New description: [New technical field] This creation is a technical field of memory card testing, writing (measuring, writing) ,, especially refers to the design of the inclined slide, with phase. Mechanical structure, manufacturing can carry out automatic measurement and writing of memory cards. [Prior Art] Tester. For the above reasons, the flash-like suffix card (such as sd card, mini SD card, Gu C card, etc.) must pass at least two test operations before the manufacturer ships. The first trick is to open the card test, confirm whether the memory card is m-channel for reading and writing, and test whether the memory card can be - normal operation. The custom test operations include card-opening test and reading and writing. The test is a manual mode. The test machine is a fixture and equipment for connecting multiple computers to a computer. The test process is in order: manually confirm the number of test objects, set test parameters, connect test fixtures, = test object placement _ test fixtures, open card (or read and write test), and according to the test results to distinguish good products from Defective product. Each of the above processes is designed to be manually operated, so it is necessary to perform a large number of test fixtures and equipment. Therefore, the manual test of the factory's 'normal (four) situation has a large number of test equipment and a large number of seats, and some of the low-cost business began to develop automated test machines. Since it usually consists of a feeding device, it is responsible for accommodating the material I to be tested, and the cartridge is taken and discharged.
動化測試機台通常丨 盤。一取放裝置，倉 貝測試記憶卡 载送待測/完測之記憶卡。一 M373490 盤。此類的自動化測試機台—次能測試的記憶卡數目愈多，機器 '的體積就愈大。再者該自動化職機妓具有複數_送裝置負 責將織卡由倾裝置料、送至職敕置處或者將測試完成 .的記憶卡由戦裝置再送败料裝置處，如此繁操作流程， 須配合數目|多的機器、感測器及複雜的電控系統，使得自動化 •測試機台的造價相當昂貴。 . 耻摘作人即思考如何設計-域積小結顧單、節省能 •源又確實穩定的測、寫裝置，主要負責進行記憶卡的測、寫自動 化作業。將記憶卡由自動供料模組移動至測試區，進行測、寫的 動乍及須】寫後良品及不良品的退出動作皆不以繁複之機翻 助’如此能雖簡單賴械設備絲記憶卡蝴試讀寫。 【新型内容】 本創作之主要目的是提供—種具有可調肖度之滑道式記憶卡 測、寫裝置’主妓設計—組職及寫人裝置能以簡易的機械系 #統，進行自動化記憶卡的測試寫入作業。主要是利用一組具有角 度的妓，讓記針能自麟至職區，侧試完錢再滑出滑 C而被收集，如此能減少負責移載記憶卡的機構件數量及複雜 度另外本創作一貫化的測試作業，與習用人工操作的測試作業 或與市售自動測試機台相較，能使測試效率大幅提昇且人員成本 大幅降低。 本創作之次要目的是提供一種體積小、成本低的測、寫裝 置，該測、寫裝置一次能進行至少8個記憶卡且連續性的測、寫 M373490 •作業，讓記憶卡測、寫效率有效提昇。另外整體的體積小，在有 '限的工薇空間内能放置更多數量的測、寫裝置，使得擺設機動性 提高成本相對降低。另外機器造價低，為市售自動化測試 裝置的十分之-或更少，對測、寫廠商設備投資的資金相對減少， 因此更具市場競爭力。 树上狀目的，本創作主要包括—妓模組、—自動供料 .模組、一探針及順序押板模組，一成品分辨模組。該滑道模組包 •括一模板單元，一可調式支撐桿以及一機架，該模板呈一傾斜角 度，以可調式支撐桿及絞鏈設置於機架處，該模板單元的上表面 具有數道滑道，每個滑道皆可供制、寫記憶卡滑動模板上端具 有自動供料模組，可將記憶卡推人滑道巾。聰針及順序押板模 組並排橫向跨設於前述滑道平台的上方位置，具有複數組彈簧探 針之探針裝置板’能適時下降與待測記憶卡電極相接觸，進行相 關的測、寫作業，於彈簧探針後設有記憶卡辅助固定桿以加強記 % 憶卡之穩定。各探針前下方滑道内適當位置裝設電磁鐵凸桿，能 適時作動使模板單元之複數滑道内記憶卡能將記憶卡定位阻擋或 流放。 滑道板尾端設有成品分辨模組，不良品得以因翻板翻起而掉落於 不良品收集盒内，良品則順由滑道流入良品料管内。 為使熟悉該項技藝人士瞭解本發明之目的、特徵及功效，茲藉 由下述具體實施例，並配合所附之圖式，對本創作詳加說明如後。 M373490 【實施方式】 如第一、一圖所為本創作之立翻及刪見圖。本創作具有 ’·角度之滑道式記憶卡測試裝置A包括有-滑道模組j、自動供料模 組2探針及順序押板模組3及一成品分辨模’组4，該滑道模組1 包括-模板單元U，-機架12，及可調式支雜14，雜板單元 -11是由賴15及可調支雜14支#呈_傾斜角度設置於機架12 處，該模板單元11社表面具有複數滑道13。本實細是利用滑 參道。I3具有斜度的特性，可使待測試記憶卡由自動供料模組2，以推 片單元21馬達211，帶動偏心輪軸组212，驅動平行推板組213， •將插接於料管座22之記憶卡料管23，以推月單元21，將記憶卡推 出料管座22外進人料13處，時即自向獨行。並設有電 磁鐵凸桿34’晴滑下之記憶卡於適纽置，供聰針及順序押板 模組3作業’探針裝置板311，前端裝設複數組彈脊探針⑽後 部設置複數組辅助固定桿313 ’以加強記憶卡與彈簧探針3ii2接 •觸的穩定；探針裝置板31卜上設有複數個凸塊3114，由探針單 元31，馬達3113轉動將傳動軸上設置凸輪3115與凸塊3114接 觸適時將探針教置板311藉由探針升降組m2導引下壓，進行測 寫作業，完成後凸輪3115回原位置；探針升降組312有回位彈簧 =22輔助，將探針裝置板311頂回原位；順序押板單元犯，於測試 或寫入作業完成後’由順序押板單元32，馬達3201轉動傳動軸 3202上裝置之複數個凸輪32〇4，與押板機構321上相對應之凸塊 3203接觸’藉由順序押板升降組犯2導引下降，使未測寫之記憶 M373490 =時iU，避免完成品滑出時，未測試的記針也滑出；等待 成&位電磁鐵凸桿34回復原位，押板機構321回原 j ’順序押板升降組322設有辅助上升彈簧3222頂回原位，使下 -片制、寫記憶切至制、寫位置。 測寫凡成各滑道13之記憶卡若為良品，則該滑道電磁鐵凸桿 作動下縮，良品由滑道滑入良品料管43 ;待良品收集完成’電 ‘磁鐵凸桿回復原位，若為不良品則翻板41翻起，不良品滑道之電 •磁鐵凸桿34作動下縮，不良品到落不良品收集盒42，收隼完成電 =桿回復原位’收料緩降單元啟動45下降，預留記憶卡= 如此本創作之顺寫人裝置A得糊進行記鮮 以下就各構件之詳細結構作一說明： ··’作 該滑道模组1主要目的使待記憶卡自動滑動至測試區，御 1 了條·物自崎行，^ -機举19 ，4。該滑道模組1主要包括一模板單元11， 機架12及可調式_ 14，該模板單幻丨是以可調式物 ，支標呈-傾斜角度設置於機架12處，該模板單元 :，也可採固疋角度之實施，因此該滑道模組1内可包括 調式支撐桿14軸定式切。鱗賴板單元11 -側邊是肋 鍵15拖接於機架12處，該模板單元11相對於絞鏈樞接處的、、 側邊則以可職瓣14結細2,纖板 M373490 圖）。欲職料，咖麵式切桿⑷吏 角度^附變模板單元u_斜歧，概至適當的 了曰加S己憶卡的滑動效果。 多種將胁触單元1丨之紐13 _方式有很 i如機械手臂的自動化方式、輸送帶的傳送· 實施例則採用最簡單料管插拔方式(如第 一在本 2，==姆23之繼22純。該自動供料模組 空二Γ::具有，’使料管_的記憶卡經該 二推片举峨藉由馬達21!帶動偏心輪轴組212媒動平行推 片組213，依雜出域卡於自祕料 2外，進續道η内。 記憶卡離_供棚組2時，_ 13 _會自然下滑而進 到測寫位置，以進行後續的測寫作業。 如第四圖所示，該複數個定位㈣鐵凸捍34，於彈簧探 下相對應位置裝設於模板單元U的底面；該電磁鐵凸桿& -伸縮功能頂針341，凸出於每一滑道13底部，此處的每一滑 13内則具有-阻擋孔13卜最初狀態時該伸縮頂針341是伸出於 滑道13内供記憶卡停留在被測寫的正確位置，當定位電磁鐵凸^ 34作動時(通電）’該伸縮頂針341會經由阻擔孔ΐ3ι處縮回滑^ 13下方，用以排放測試完成之記憶卡滑出滑道13處並可依各严 道測寫作業結果以排放時序配合成品分辨模組4，做為$ 口與月 品判別。 -义时、不良 M373490 如第五圖所示，探針及順序押板模組3說明： 探針及順序押板模組3，包含探針單元31、順序押板單元犯， 前後並排組合於基座33,橫跨裝設於模板單元u上方；該探針單 元31，有以絕緣材料製作探針座3111，用以固定彈簧探針幻12， 設置於探針裝置板311前端；其後有複數個辅助固定桿⑽，輔助 •固定桿313以壓桿3131及螺帽3132、彈簧期組成，調整螺帽 -對應彈簧可調整辅助固定桿313，對記憶卡的壓力；探針褒置板犯 鲁設置複數個凸塊3114，該探針單元3卜由馬達3113轉動抽上設 置相對於凸塊3114之凸輪3115接觸，藉由探針降組312，装有滑 軌組3121導引，將探針裝置板311同步帶動下降，而輔助固= 313先行接觸記憶卡固^，再使彈簧探針3112壓置於待測記憶卡 電極上面；順序押板單元32，以相同原理於押板機構321，^設 置複數個壓桿32H，壓桿3211以彈簧3213、螺帽3212組成，調 整螺帽3213對應彈簧3212，則可作為對記憶卡壓力娜，押板機 •構321也設置有複數個凸塊細，順序押板單元％，以馬達咖 轉動轉軸3202設置有對應於凸塊_立置的凸輪_接觸，藉 =升降早322,裝有滑軌组3221導制步下降，暫時將記憶卡固 疋於滑道13中被測寫記憶卡前一位置。 如第'、圖所7""，成品分辨模組4，包含翻板41，不良品收 :二:二料管43、良品料管架44、收料緩降單元45，測寫 广，·，广則相對滑道之電磁鐵凸桿34作動下縮，記憶卡 入良品料吕43 ’電磁鐵凸桿34回復，收料緩降單元45馬達, M373490 、轉動’帶動螺桿452使緩降桿、組453下降-位置，以供下一片記 卡存放’判疋為不良品者等良品存放完成，翻板Μ作動翻起， ，品對騎道13之電磁鐵凸桿34作動下縮，不良品掉入不良 σσ收集盒，電磁鐵凸桿34回復。 接著就本發明之作動流程作一說明：待測寫記憶卡呈堆疊方 •式放置於料管23中，將料管23插入料管座四内。當待測寫記憶 •卡由推片單元21 ’推人滑道13内時，_滑道13的斜面向下滑 鲁行’此時該電磁鐵凸桿Μ為凸出狀態，使待測、寫記憶卡依序排 列於滑道13内。進侧、糾，該探針及猶押減組3作動， 使得探針裝置板311下降使彈簧探針3112與待測寫記憶卡電極接 觸，並進行相關的測寫工作。完成後探針單元31上升，順序押板 單元啟動將押板機構下降，壓住測寫完成記憶卡之下-未測寫記 憶卡。 根據測試結果如為良品騎知賴赠道13的電雜凸桿％作 籲動下縮’將S己憶卡排入良品料管43，收集完成後電磁鐵凸桿^ -回復，收料緩降單元45啟動下降一位置，位下一良品記憶卡預留 空間。然後翻板41翻起’對應不良品滑道之電磁鐵凸桿34作動 下縮，則不良品掉入不良品收集盒42，收集完成後電磁鐵凸桿料 回復；最後押板機構321上升，下—制寫記憶卡移動至待測寫 位置；如此不斷循環進行，即能以自動化方式進行記憶卡的測寫 作業。 … 惟’以上所述者’僅為本創作之列舉實施例而已，當不能以 M373490 此限定本發明實施之範圍。即大凡依本發明申請專利範圍所作之 均等變化與修飾，皆應仍屬本創作專利涵蓋之範圍内。 【圖式簡單說明】 第一圖為本創作之立體圖； 第二圖為本創作之侧視圖； -第二圖為本創作自動供料模組結構示意圖； -第四圖為本創作模板單元上各模組組裝示意圖； • 第五圖為本創作之探針及順序押板模組局部剖面放大示意圖； 第六圖為本創作之探針裝置板、順序押板之剖面立體圖 第七圖為本創作之成品分辨模組的結構示意圖； 【主要元件符號說明】 A測寫裝置 1滑道模組 11模板單元 12機架 13滑道 131阻擋孔 14可調式支撐桿 15絞鍵 2自動供料模組 21推片單元 211馬達 212偏心輪軸組 213平行推板組 22料管座 23料管 3探針及順序押板模組 12 M373490 • 31探針單元 3111探針座 3113馬達 3115凸輪 312探針升降組 -3122彈簧 .3131壓桿 I 3133彈簧 3201馬達 3203凸塊 321押板機構 3212螺帽 322順序押板升降組 3222彈簧 φ 34 電磁鐵凸桿 .4成品分辨模組 41翻板 42不良品收集盒 44良品料管架 451馬達 453緩降桿組 311探針裝置板 3112彈簧探針 3114凸塊 3121滑執組 313輔助固定桿 3132螺帽 32順序押板單元 3202轉軸 3204凸輪 3211壓桿 3213彈簧 3221滑執組 33 基座 341頂針 411電磁鐵 43良品料管 45收料緩降單元 452螺桿組 13The dynamic test machine is usually a disk. A pick-and-place device, the warehouse test memory card carries the memory card to be tested/completed. A M373490 disk. This type of automated test machine - the more the number of memory cards that can be tested in a sub-test, the larger the size of the machine. Furthermore, the automated job machine has a plurality of _ delivery devices responsible for transporting the woven card from the tilting device to the job placement or the completion of the test. The memory card is sent to the smashing device by the device, such a complicated operation process, With the number of machines, sensors and complex electronic control systems, the automation and test machine is quite expensive. The shameful person is thinking about how to design - the domain product summary, save energy, and the source is really stable measurement and writing device, mainly responsible for the automatic measurement and writing of the memory card. Move the memory card from the automatic feeding module to the test area, and perform the measurement and writing movements and the required movements. After the writing, the exit actions of the good products and the defective products are not assisted by the complicated machine. Memory card test and read and write. [New content] The main purpose of this creation is to provide a kind of slide-type memory card measuring and writing device with adjustable audibility. The main design and the writing device can be automated with a simple mechanical system. The test of the memory card is written to the job. The main purpose is to use a set of angled cymbals, so that the needle can be collected from the Lin to the job area, and the side is tested and then slipped out and slipped. This can reduce the number and complexity of the components responsible for transferring the memory card. The consistent test work of the creation, compared with the manual test operation or the commercial automatic test machine, can greatly improve the test efficiency and greatly reduce the personnel cost. The second purpose of this creation is to provide a small and low-cost measuring and writing device. The measuring and writing device can perform at least 8 memory cards at a time and continuously measure and write M373490 • homework, so that the memory card can be tested and written. Efficiency is effectively improved. In addition, the overall volume is small, and a larger number of measuring and writing devices can be placed in the limited working space, which makes the maneuvering flexibility increase the cost relatively. In addition, the cost of the machine is low, and it is very low or less for the commercially available automated test equipment. The investment in testing and writing equipment for the manufacturer is relatively reduced, so it is more competitive in the market. For the purpose of the tree, the creation mainly includes -妓 module, automatic feeding, module, a probe and sequential pallet module, and a finished product resolution module. The slideway module package comprises a template unit, an adjustable support rod and a frame, the template is inclined at an angle, and the adjustable support rod and the hinge are disposed at the frame, and the upper surface of the template unit has Several slides, each slide can be used to make and write memory cards. The upper end of the sliding template has an automatic feeding module, which can push the memory card to the sliding towel. The Cong pin and the sequential plate assembly are arranged side by side across the above-mentioned slide platform. The probe device plate with the multi-array spring probe can be timely lowered to contact with the electrode of the memory card to be tested, and the relevant measurement is performed. Write the job, with a memory card auxiliary fixing rod behind the spring probe to enhance the stability of the memory card. Electromagnet lugs are installed at appropriate positions in the front and lower slides of each probe, so that the memory card in the plurality of slides of the template unit can block or discharge the memory card. A finished product resolution module is arranged at the end of the slide plate, and the defective product can be dropped into the defective product collection box due to the flipping of the flap, and the good product flows into the good material tube through the slide. In order to make the person skilled in the art understand the object, features and effects of the present invention, the present invention will be described in detail by the following specific embodiments and with the accompanying drawings. M373490 [Embodiment] As shown in the first and first figures, the drawings are shown in the original and the drawings. The creation of the slide-type memory card test device A includes a slide module j, an automatic feed module 2 probe and a sequence plate module 3 and a finished product resolution module group 4, the slide The track module 1 includes a template unit U, a frame 12, and an adjustable branch 14, and the board unit-11 is disposed at the frame 12 by the Lai 15 and the adjustable branch 14 The template unit 11 has a plurality of slides 13 on its surface. This is the use of the sliding track. I3 has a slope characteristic, which enables the memory card to be tested to be driven by the automatic feeding module 2, the pusher unit 21 motor 211, the eccentric axle set 212, and the parallel push plate set 213, which will be inserted into the tube holder. The memory card tube 23 of the 22, in the push unit 21, pushes the memory card out of the material tube holder 22 into the material material 13 when it is self-sufficient. The electromagnet lug 34' is provided with a memory card that is smooth and slippery, and is provided for the smart needle and the sequential pallet module 3 to operate the 'probe device board 311, and the front end is provided with a complex array of ridge probes (10). The multi-array auxiliary fixing rod 313' is used to strengthen the stability of the contact between the memory card and the spring probe 3ii2; the probe device board 31 is provided with a plurality of bumps 3114, which are rotated by the probe unit 31 and the motor 3113. When the cam 3115 is in contact with the bump 3114, the probe teaching plate 311 is guided and pressed by the probe lifting and lowering group m2 to perform a writing and writing operation, and the cam 3115 is returned to the original position after completion; the probe lifting group 312 has a return spring. = 22 assists, the probe device board 311 is returned to the original position; the sequential plate unit is guilty, after the test or write operation is completed, 'by the sequential plate unit 32, the motor 3201 rotates the plurality of cams 32 on the drive shaft 3202 〇4, contact with the corresponding bump 3203 on the slab mechanism 321 'by the sequential slab lift group 2 guides down, so that the unmeasured memory M373490 = time iU, to avoid the finished product slipping out, not tested The needle is also slipped out; waiting for the & position electromagnet lug 34 to reply Position, the holding plate mechanism 321 back to the original j 'order the holding plate 322 is provided with an auxiliary set of lifting springs 3222 rises back into place, the lower - manufactured sheet, cut to write system memory, writing position. If the memory card of each slide 13 is a good product, the slide electromagnet is slid down, and the good product is slid into the good material tube 43 by the slide; the [electric] magnet bump is restored after the good collection is completed. Position, if it is a defective product, the flap 41 is turned up, the electric slide of the defective product slides/magnet bumps 34 is actuated, and the defective product is dropped into the defective product collection box 42, and the completion of the electric power = the rod returns to the original position The descending unit starts 45 down, and the memory card is reserved = so the author of the creation of the device A is smeared and the following is a description of the detailed structure of each component: ·· The main purpose of the slide module 1 is After the memory card is automatically slid to the test area, the Royal 1 has a line of things from the line, ^ - machine lift 19, 4. The slide module 1 mainly includes a template unit 11, a frame 12 and an adjustable _14. The template single illusion is an adjustable object, and the support is disposed at an inclined angle at the frame 12. The template unit is: The implementation of the solid angle can also be adopted. Therefore, the slide module 1 can include a shaft-shaped cutting of the adjustable support rod 14. The scale plate unit 11 - the side is the rib key 15 is towed to the frame 12, the template unit 11 is pivoted relative to the hinge, and the side is thinned by the movable flap 14 2, the fiber plate M373490 ). For the job, the coffee-faced cutting rod (4) 角度 angle ^ attached template unit u_ slanting, to the appropriate sliding effect of the S-remember card. A variety of ways to touch the unit 1 _ 13 has a very automatic way such as robotic arm, conveyor belt transmission · The example is the simplest tube insertion and removal method (such as the first in this 2, == 23 The 22nd pure. The automatic feeding module is empty:: has, the memory card of the 'tube' is driven by the two pushes by the motor 21! The eccentric axle set 212 is driven by the parallel pusher group 213, the quarantine field card is outside the secret material 2, and the continuation path η. When the memory card is away from the shed group 2, _ 13 _ will naturally slide down to the test writing position for subsequent writing and writing operations. As shown in the fourth figure, the plurality of positioning (four) iron tenons 34 are mounted on the bottom surface of the template unit U at the corresponding position of the spring probe; the electromagnet lug & - telescopic function thimble 341 protrudes At the bottom of each slide 13, there is a barrier hole 13 in each slide 13 here. In the initial state, the telescopic ejector 341 is extended in the slide 13 for the memory card to stay in the correct position to be tested. When the positioning electromagnet protrusion 34 is actuated (energized), the telescopic thimble 341 is retracted under the sliding hole 13 through the resistance hole ΐ3, for discharging the test. The memory card slides out of the slide 13 and can be used according to the strict test results to match the finished product resolution module 4 with the discharge timing. It is judged as $ mouth and moon. - Yi Shi, bad M373490 as shown in the fifth figure The probe and the sequential pallet module 3 are illustrated: the probe and the sequential pallet module 3, including the probe unit 31 and the sequential pallet unit, are combined side by side with the base 33, and are installed across the template unit. Above the u; the probe unit 31 has a probe base 3111 made of an insulating material for fixing the spring probe phantom 12, and is disposed at the front end of the probe device board 311; and thereafter has a plurality of auxiliary fixing rods (10), auxiliary and fixed The rod 313 is composed of a pressing rod 3131 and a nut 3132, a spring period, the adjusting nut-corresponding spring can adjust the auxiliary fixing rod 313, and the pressure on the memory card; the probe mounting plate is arbitrarily set with a plurality of bumps 3114, the probe The needle unit 3 is rotated and pulled by the motor 3113 to be in contact with the cam 3115 of the bump 3114. By the probe descending group 312, the slide rail group 3121 is guided to synchronously drive the probe device board 311 to descend. Solid = 313 first contact memory card ^, then spring probe 3112 pressure Above the memory card electrode to be tested; the sequential plate unit 32, according to the same principle, the plate pressing mechanism 321, 321 is provided with a plurality of pressing bars 32H, the pressing bar 3211 is composed of a spring 3213 and a nut 3212, and the adjusting nut 3213 corresponds to the spring 3212. , can be used as the pressure on the memory card, the plate machine 321 is also provided with a plurality of bumps, the order of the plate unit %, with the motor coffee rotation shaft 3202 set with a cam corresponding to the bump _ vertical _ contact , borrowing = lifting early 322, with the slide rail group 3221 guiding step down, temporarily locking the memory card in the slide 13 to be tested before the memory card. For example, the ', the figure 7 "", the finished product resolution module 4, including the flap 41, the defective product collection: two: two material tube 43, good material tube rack 44, receiving material descending unit 45, measuring and writing, · Widely, the electromagnet lug 34 of the relative slide is actuated and shrunk, and the memory is stuck into the good material Lu 43 'electromagnet lug 34 is recovered, the receiving descending unit 45 motor, M373490, rotating 'carrying the screw 452 to slow down The rod and the group 453 are lowered-positioned, so that the next piece of the card is stored, and the good product such as the defective product is stored, and the flap is slammed and turned, and the electromagnet rod 34 of the riding lane 13 is moved downward. The defective product falls into the bad σσ collection box, and the electromagnet lug 34 returns. Next, a description will be given of the operation flow of the present invention: the memory card to be tested is placed in the stacking tube 23 in a stacking manner, and the material tube 23 is inserted into the material tube holder 4. When the memory to be tested is pushed into the slide 13 by the push unit 21', the oblique direction of the slide 13 is slid down. At this time, the electromagnet is tilted to make the test and write. The memory cards are sequentially arranged in the slide 13 . The side and the correction are activated, and the probe and the jumbo reduction group 3 are actuated to lower the probe device board 311 to contact the spring probe 3112 with the electrode of the memory card to be tested, and perform related writing and writing work. After completion, the probe unit 31 is raised, and the sequence plate unit is started to lower the pad mechanism, and the pressure writing is completed under the memory card-untested memory card. According to the test results, for the good product, the singularity of the electric spurs of the road 13 is used to make the squeezing down. The S-remember card is discharged into the good material tube 43. After the collection is completed, the electromagnet bulge ^ - reply, the collection is slow The down unit 45 starts to drop a position, and the next good memory card reserves space. Then, the flap 41 is turned up and the electromagnet lug 34 corresponding to the defective product slide is slid down, and the defective product is dropped into the defective product collection box 42. After the collection is completed, the electromagnet protruding rod material is restored; The next-writing memory card is moved to the position to be tested; thus, the looping operation is performed, that is, the writing and writing operation of the memory card can be performed in an automated manner. The above description is only for the enumerated embodiments of the present invention, and the scope of the present invention is not limited by M373490. That is, the equivalent changes and modifications made by the applicant in accordance with the scope of the patent application of the present invention are still within the scope of the present patent. [Simple diagram of the diagram] The first picture is a perspective view of the creation; the second picture is a side view of the creation; - the second picture is a schematic diagram of the structure of the automatic feeding module of the creation; - the fourth picture is the creation template unit Schematic diagram of assembly of each module; • The fifth figure is a partial cross-sectional enlarged view of the probe and the sequential plate module of the creation; the sixth picture is a cross-sectional perspective view of the probe device board and the sequential plate of the creation. Schematic diagram of the finished product resolution module; [Main component symbol description] A writing device 1 slide module 11 template unit 12 frame 13 slide 131 blocking hole 14 adjustable support rod 15 twisted key 2 automatic feeding mode Group 21 push unit 211 motor 212 eccentric axle set 213 parallel push plate set 22 material tube holder 23 material tube 3 probe and sequential plate assembly module 12 M373490 • 31 probe unit 3111 probe holder 3113 motor 3115 cam 312 probe Lifting group - 3122 spring. 3131 pressure bar I 3133 spring 3201 motor 3203 bump 321 paddle mechanism 3212 nut 322 sequential plate lifting group 3222 spring φ 34 electromagnet bulge. 4 finished product resolution module 41 flap 42 defective product Receive Box 44 good material pipe rack 451 motor 453 descending rod group 311 probe device board 3112 spring probe 3114 bump 3121 sliding group 313 auxiliary fixing rod 3132 nut 32 sequential plate unit 3202 shaft 3204 cam 3211 pressure rod 3213 spring 3221 slipper group 33 base 341 thimble 411 electromagnet 43 good material tube 45 receiving slowdown unit 452 screw set 13