M343793 八、新型說明： 【新型所屬之技術領域】 本創作為一種§己憶卡測試讀寫裝置的技術領域，尤其指一種採用 傾斜式滑道的設計，配合相關的機械結構，讓測試裝置能進行記憶卡 的自動化測試讀寫作業。 【先前技術】 -般快閃式記憶卡(例如SD卡' mini SD卡、_卡·.·等)在廠商 出，前’須至少通過二道的測試作業。第一道為開卡測試，確認記憶 卡是否為良品。第二道為讀寫測試，測試記憶卡是否能正常作業。習 用的測試作業包糊卡職與讀寫職皆是_手動模式，測試機器 為複數台與侧連線的治具及設備。職流程依料：以人工確認測 試物數量、設定職參數、連接職治具、_試滅置於測試治具 處:進行開卡（或讀寫職）、以及侧試結果區分良品料良品。上 述每道流程皆為人卫手動模式’故須大量人員操作，同時也須大量測 試治具及設備。因此以“職作㈣域，纽的廠内具有 大篁的測試設備及大量的測試人員。 基於上述原因，部份薇商即開始研發自動化的測試機台。自動化 職機台通常包括-供料裝置，負責容納待測記憶卡之料盤。一取放 裝置，負責取放細/完測之記憶卡。-摩錄置，負責測試記憶卡。 複數組載送裝置’負責於供料裝置與測试裝置間載送待測/完測之記憒 卡 收料裝置負貝谷納完測之5己十思卡的料盤。此類的自動化測試機 M343793 台一次能測試的記憶卡數目愈多，機器的體積就愈大。再者該自動化 測試機台須具有複數組載送裝置負責將記憶卡由供料裝置移出、送至 測試裝置處’或者將測試完成的記憶卡由測試裝置再送回收料裝置 處’如此繁複的操作流程，須配合數目眾多的機器、感測器及複雜的 電控系統，使得自動化測試機台的造價相當昂貴。 . 因此本創作人即思考如何設計-組結構簡單、節省能源又確實穩 .定的測試裝置’主要負責進行記憶卡的測試讀寫作業。將記憶卡移動 #置至測試區進行測試的動作，及測試後良品及不良品的退出動作皆不 以繁複之機構辅助’如此能以較簡單的機械設備完成記憶卡的測試讀 寫。 【新型内容】 本創作之主要目的是提供一種具有角度之滑道式記憶卡測試裝 置’主要纽計-組測試裝置能以自動化的機械系統，負責進行記憶 參卡的測試作業。主要是利用一組具有角度的滑道，讓記憶卡能自動滑 裏測減區’待取（成後再滑出滑道而被收集，如此能減少負責移載 記憶卡的機ϋ數量’降低構件數量及複雜度。另外本創作_貫化的測 試作業，與制人卫操作_試作業或與市f自動職機台相較，能 使測試效率大幅提昇且成本大幅降低。 本創作之:欠要目蚊提供—種_小、齡錢測試裝置 ，該測 試裝置-次能進行至少8個記憶卡且連續性_試作#，讓記憶卡測 ,式效率有效提4 #外整_體積小，在有限的工廠空制所能放置 M343793 •更多數量的測試裝置，使得測試效率相對提' 為傳統自動化測試裝置的十分之一戋更+外。另外機器造價較低， 金壓力相對減少，因此更具市場競爭力〔對剛試礙商設備投資的資 為達上述之目的，本創作主要包括—滑 閘門模組以及-探針模組。該滑道模、组包括—模21定模組、— 該模板呈-傾斜角度設置於機架處，該模板單元二=及一機架， 道’每個滑道皆可供待測記滑動。該固定棋組包==: =:壓二機構’該第一、第二麗板機構採緊鄰方式橫向跨設於前述 她早4，能適時·道上柯位置的鋼記憶卡暫咖定於滑道 内。該探針模組設置於前騎道平㈣下转置，具有複數組探針單 疋’該探針料錢壯雜細嫌卡相_，餘侧的測試作 ^該閘Η歡也浦向設置於前賴板單元處，鄰近前職定模組， 能適時作動使模板單元之複數滑道開啟或被關閉。 為使熟悉該項技藝人士瞭解本創作之目的、特徵及功效，兹藉由 ♦下述具體實施例，並配合所附之圖式，對本創作詳加說明如後。 【實施方式】 如弟一、二圖所示，為本創作之立體圖及侧視圖。本創作具有角度 之滑道式記憶卡測試裝置Α包括有一滑道模組1、一固定模組2、一問 門模組3及一探針模組4,該滑道模組1包括一模板單元η以及一機 架丨2，該模板單元11是呈一傾斜角度設置於機架12處，該模板單元 Η的上表面具有複數滑道13。本實施例是利用滑道13具有斜度的特 7 •M343793 性，細m錢卡放置於滑道13⑽卩自動能向下滑行。該固定模 組2包括-第—壓板機構21及第二顯機構22，該第一二壓 機構^、22採繁鄰方式橫向設置前述滑道模組丨之模板單元^處。 該弟一壓板機構21具有複數組施壓單元211，而第二壓板 稷數組施壓單元22〗。繁 οι ^ 早疋221 M-紐機構21用以暫時固定著待測試記憶 卡，以t、_針模組4與待測試記憶卡接觸而進行_乍業。該 壓板機構22雖然也是暫時固定另一個待測試記憶卡，但是目的是在避 免閘門換組3開啟時，未測試的記憶卡滑出。該閘門模組3，設置於 前述模板單元U的上表面，鄰緊著前述帽組2之第—壓板機構 21的侧邊’該_模組3具有一閘門單元3卜該閘門單Μ!能適當 產生橫向的位移，使得模板料n之複數滑道13被關閉或開啟，另 外該閘Η機構3有作為待測記憶卡之定位魏。該探針餘4設置於 前述模板單元11的下方位置，位置對應於第—壓板機制處，該探 針模組4具錢數峻針私41，聰解元41 _時上昇與待測 記憶卡相細。如此摘狀職置Α得_進行鎌卡的職工作。 以下就各構件之詳細結構作一說明： 、//㈤禮1主要目的使待記憶卡自紐動至測試區，待測試完 成後自動再關。為了使制纖卡能自騎行，糊侧採斜傾斜 方式設計。該滑道模组i主要包括—模板單元u及—機架12，該模 板單兀11是呈-傾斜角賴置於機架12處，該模板料u的上表面 具有複數滑道13。雜鱗元u _斜歧可翻定式射調整式。 M343793 在本實施例中則為-可調整式，因此該滑道模組〗内可進—步包括至 少為:組的可調式支雜組14。此時’該模板單元u —侧邊是樞接 :機架12處’該模板單元^相對於拖接處的另一側邊則以該可調整 式支_且14結合機架12的另一側邊，使該模板單元n傾斜一角度 (如第一圖）。欲調整角度時，轉動該可調整式支撐桿組14使其伸長或 縮短，即可改變模板單元11的傾斜角度。 述、σ構為本創作/f道她丨的基本架構，但為了使該滑道模組 彡成自動化及待測雜卡滑動時更為順暢穩定，該滑道模 組1、另包括有複數個料管機構15、第一送片機構16、第二送片機構 π、稷數個阻擋電磁㈣、以及_辅助導輪機構。 將待測記憶卡放模板單元11之滑道13 _方式有很多種， 例^财臂的自動化方式、輸送帶的傳送··等。但林實施例則採 131單手動的方式，即於每—個滑道13的前段區域(即進料區域） 具有-料管機構15，該料管機構15能供一可插拔之記憶卡多片式堆 豐辭插置。該料管機構15底部與滑道13底面之間具有-空隙，使 料g機構15内堆㈣制記憶卡域鎌依序滑人滑道η内。為了 使待測記憶卡缺順概續道13内，本創作另設計—第—送片機構 2來輔助待測記憶卡移動。如第―、三圖所示，該第一送片麟16 叹置於她早⑽處’緊鄰前述料管機構15處，目的使最低層的待 測此卡糊由料官機構15内被帶出。該第—送片機構Μ包括有— M343793 馬達161、一主動輪軸丨62、一從動輪軸163，該馬達161帶動主動輪 軸162轉動，該主動輪軸162的轴上具有複數個滾輪164，該複數滾 輪164為間隔設置。該模板單元11之每一個滑道13内皆具有一導引 孔131，該導引孔131延伸至料管機構15下方位置且寬度較窄。該主 動輪軸162之每一個滾輪164皆位於相對應的導引孔131内。該主動 ，輪軸162與從動輪軸163分別設置於模板單元η的下方及上方位置。 •當料管機構15内最底層之待測記憶卡落入滑道13内時，因滑道13 •有斜度會自然下滑而離開料管機構15。本實施例為增加平穩性，則由 滾輪164與待測記憶卡下面接觸，從動輪軸163由上方輔助導引順利 將待測記憶卡帶出料管機構15底部並送入滑道13内。 該模板單元11接近固定模組2的附近另具有一第二送片機構 17。該第二送片機構17的結構完全與前述第一送片機構16相同，故 不再就結構作一詳細描述。該第二送片機構17的目的是為使排列於滑 道13内的待測記憶卡能轉實進入固定模組2内之區域，以 鲁測試作業。 、、 該複數個阻擋電磁閥18設置於模板單元u ^ ^ π取木段區域的, ，’接近滑道13的出口處。該阻擋電磁閥18具有—伸縮頂針⑻ 每一阻擋電磁閥18位於-滑道13底部的相對處，此處的每一滑道 内貝]具有阻擋孔132。最初狀態時該伸縮頂針u 内，者β 、τ 181疋伸出於滑道: 18作純糊，該物針⑻ 處縮回喊13下方，賴排放測試完成之記憶卡滑出 捕助導輪機構19設置於模板單元後段局_抑，=处 •M343793 達191、輪軸192及複數辅助輪i93，該複輪辅助輪193採等間距分 佈於輪軸192處，每一輔助輪913對應一滑道13。該馬達191則負責 帶動輪軸192轉動。該輔助導輪機構19是幫助完測之記憶卡進入預備 退出滑道13處。 如第一、二、四圖所示，該固定模組2包括-第-壓板機構21 及第一壓板機構22，該第一壓板機構2卜第二壓板機構22的結構 •大致相同，本實施例先就第一壓板機構21作說明。該第-壓板機構 # 21包括稷數組施麗單元211及一升降單元212，每一個施壓單元2ΐι 位於-滑道13的上方位置。該升降單元212則負責將每一施壓單元 211同步π動下降，而使施壓單元211壓置於待測記憶卡頂部，以暫 時將記憶卡固定於滑道12處。該施壓單元21丨及升降單元212可為各 種方式設計，本實施例僅各提供一結構作說明，但並不因此限制本創 作之範圍。該升降單元212包括一壓板2121、一作動輪2122、以及一 機座2123，该機座2123處設有滑軌使得該壓板2121能平穩地上升或 下降。該壓板2121是供前述數施壓單元211設置之處，其上另具有數 - 突塊2124。該作動輪2122可接受外部的動力使之轉動，其輪軸上設 有數凸輪2125。該凸輪2125並與前述突塊2124相接觸。當作動輪2122 轉動時，利用凸輪2125與突塊2124的關係，即能帶動壓板2121上昇 或下降。如第五圖所示，該施壓單元211則包括有一緩衝頂柱2iu、 一彈簧2112以及一調整螺絲2113，該緩衝頂柱2111是由下而上插置 於該壓板2121處，該缓衝頂柱2111底部則包覆著橡膠，該緩衝頂柱 2111上半部則突出於壓板2121之上。該調整螺絲2113結合於緩衝頂 11 •M343793 .柱2m的上半部，該彈簧2112則套置於緩衝難2ιιι的下半部 圍。如此結構使得緩衝頂柱仙保有向上移動的彈性。故當該施 元m施壓於待測記憶卡頂部時，不會破壞到待測記憶卡，且 定測試探針與記憶卡的密合接觸。 該第二敵機構22的結構與第一壓板機構21相似，仍是 施壓=元221及-升降單元222所構成。由該升降單元怨帶動複 施壓單元221同步下降。該第二壓板機構22是為了在測試作業 後，前排的記憶卡滑出時，後排的待測記憶卡由第二壓板機構^ 固定著，待閘門模組3關閉後，該施壓單元221才上升，使待測記燒 卡進入待測區處。該施壓單元221結構與施壓單元2ιι相同，故不^ 描述。而升降單元222 結構仍與升降單元212相同，仍包括有〜 壓板222卜-作動輪2222。但本實施财，顧定模組2主要的細 來源馬達2224疋⑦置於第二壓板機構22處’並糊—時規皮帶 使付兩作絲2222及2122同步猶，由於齡的凸輪設計略為不同， 故施壓單元211及施壓單元221的升降時序並不相同。 如第-、六圖所示’該閘門模組3，設置於前賴板單元U的 上表面_緊著别述固定模組2處。該閘門模組3包括一閉門單元幻 及動力單το 32。該閘門單元31具有間隔設置的複數門板311及複 數缺口 312 ’亚採橫向設置於模板單元u上表面。動力單元％則能 適0W動閘Η單元31橫向移動，利用門板311阻擂或離開滑道13， 12 M343793 而達開啟或關閉的目的 如第五七圖所不，該探針模組4是設置於前述模板單元11 钉方位置，並對應著前述固定模組2之第—壓板機構21處。該探針 杈、且4主要^括複數組楝針單元41及_探針升降單元犯。該探針單 儿41疋由複數根彈貫楝針如所構成，該彈菁探針如的數目及分佈 位置則依剌之記憶卡規格而定。雜針單元&底部職與測試機台 的連接器連接。該探針升降單元4_時帶動複數組探針單元Μ上 升或下降，主要包括—平板421、一作動輪似、一機座柳、及一馬 達424摘座423處設有滑軌使得該平板421能平穩地上升或下降， 物則帶動作動輪422轉動，該作動輪422上具有複數凸輪來 :1板似的升降時序。而該複數組探針單元41則設置於平板421 =。另外於每-滑道13内的相對位置並具有一探針開口⑶，該探針 開口 133的位置是對應著前述探針單元4ι的所在之處。 接耆就本創作之作動流程作一說明：待測記憶卡呈堆疊方式放置 _4_插入料_ 15内。當待測記憶卡進入 ιΓΓ ^ 13 ^ 16 ^ ，3 ㈣的第^ 分佈㈣道13内。欲進行測試時，該固定 组3之第-排Γ機構21及第二壓板機構22作動，施壓鄰近閘門模 、 排待測記憶卡及第二排的待測記憶卡。之後，該探針模組 13 M343793 4作動，使得探針單元41上昇與第一排的待測記憶卡接觸，並進行相 關的測試工作。完成測試後，根據測試結果通知位於滑板單元u後段 的電磁阻擔閥18作動。之後揀針早元41下降，第一壓板機構21上升。 該閥門模組3呈開啟狀態，苐一排的測試完成之記憶卡滑過閘門單元 31進入滑道13的出口區域。此時將依預先設定狀態，該電磁阻擋閥 • 18使不良品暫時無法滑出，良品則先行滑出而被收集，之後再由另一 •組收集裝置移動至與滑道13的出口區域，而該電磁阻擋閥18則下降 籲使得不良品滑出而被收集。之後閘門模組3再度關閉，第二壓板機構 22上昇使第二排的待測記憶卡移動至第一排位置。如此不斷循環進 •行，即能以自動化方式進行記憶卡的測試作業。 惟，以上所述者，僅為本創作之列舉實施例而已，當不能以此限 疋本創作實施之範圍。即大凡依本創作申請專利範圍所作之均等變化 與修飾，皆應仍屬本創作專利涵蓋之範圍内。 【圖式簡單說明】 弟一圖為本創作之立體圖； 弟二圖為本創作之侧視圖； 第二圖為本創作模板單元之縱向剖面圖； 第四圖為本創作固定模組之立體圖； 第五圖為本創作之壓板她、關模組及探針模組之局部剖面放大示 意圖， M343793 第六圖為本創作之僅閘門模組與模板單元之間的結構平面示意圖 第七圖為本創作之探針模組之立體圖。 【主要元件符號說明】 A測試裝置 1 滑道模組 11模板單元 12機架 13滑道 131導引孔 132阻擋孔 133探針開口 14可調式支撐桿 15料管機構 16第一送片機構 161馬達 162主動輪轴 163從動輪軸 164滾輪 17第二送片機構 18阻擋電磁閥 181伸縮頂針 19輔助導輪機構 191馬達 192輪軸 2固定模組 193辅助輪 21第一壓板機構 211施壓單元 2111缓衝頂柱 2112彈簧 2113調整螺絲 212升降單元 2121壓板 2122作動輪 2123機座 2125凸輪 2124突塊 15 M343793 ~ 22第二壓板機構 221施壓單元 2221壓板 2224馬達 3閘門模組 • 31閘門單元 312 缺口 φ 4探針模組 ^ 41探針單元 ‘ 42探針升降單元 422作動輪 424馬達 222升降單元 2222作動輪 2225時規皮帶 311門板 32動力單元 411彈簧探針 421平板 423機座M343793 VIII. New description: [New technical field] This creation is a technical field of § recall card test and read device, especially a design using inclined slides, with relevant mechanical structure, so that the test device can Perform automated test and read and write operations on the memory card. [Prior Art] - The flash memory card (such as the SD card 'mini SD card, _ card, etc.) is issued by the manufacturer, and the previous one must pass at least two test operations. The first is the card opening test to confirm whether the memory card is a good one. The second is the read/write test to test whether the memory card can work normally. The custom test jobs are both in the manual mode and in the manual mode. The test machine is a jig and a device that is connected to the side and the side. The job process depends on: manually confirm the number of test items, set the job parameters, connect the work fixtures, _ test out at the test fixtures: open card (or read and write), and side test results to distinguish good products. Each of the above processes is a manual mode for human health. Therefore, a large number of personnel are required to operate, and a large number of test fixtures and equipment are also required. Therefore, in the "job (4) domain, New Zealand's factory has large test equipment and a large number of testers. For the above reasons, some of the company began to develop automated test machines. Automated machine stations usually include - feed The device is responsible for accommodating the tray of the memory card to be tested. A pick-and-place device is responsible for picking up the fine/finished memory card. - The recording device is responsible for testing the memory card. The complex array carrier device is responsible for the feeding device and The test equipment carries the test card/testing device to be tested/completed. The card-receiving device is negatively tested. The number of memory cards of the automatic testing machine M343793 can be tested at one time. The larger the size of the machine, the more the automated test machine must have a multi-array carrying device to remove the memory card from the feeding device and send it to the test device' or the test card can be sent back to the test device for recycling. At such a complicated operation procedure, it is necessary to cooperate with a large number of machines, sensors and complex electronic control systems, so that the cost of the automated test machine is quite expensive. Therefore, the creator thinks as The design-group structure is simple, energy-saving and stable. The test device is mainly responsible for testing and reading the memory card. The memory card is moved to the test area for testing, and the tested products and defective products. The exit action is not assisted by the complicated mechanism. [This can complete the test and read and write of the memory card with simple mechanical equipment. [New content] The main purpose of this creation is to provide a slide-type memory card test device with angles' The main button-group test device can be used to carry out the test work of the memory card with an automated mechanical system. The main purpose is to use a set of angled slides to allow the memory card to automatically slide the measurement area to be taken. Then slide out the chute and collect it, which can reduce the number of the machine responsible for transferring the memory card. 'Reducing the number and complexity of the components. In addition, the creation of the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Compared with the automatic job machine, the test efficiency can be greatly improved and the cost can be greatly reduced. The creation of this product: the lack of mosquitoes to provide a kind of _ small, age money test device, the test Set-time can carry out at least 8 memory cards and continuity_testing#, let the memory card test, the efficiency of the formula is effective 4 #外整_小小, can be placed in a limited factory air system M343793 • More number of tests The device makes the test efficiency relatively better than that of the traditional automatic test device. In addition, the machine cost is lower, the gold pressure is relatively reduced, so it is more competitive in the market. For the above purposes, the present invention mainly includes a sliding gate module and a probe module. The slide mold and the group include a mold 21 fixed module, and the template is disposed at an inclination angle at the frame. Template unit 2 = and a rack, the track 'each slide is available for the slide to be tested. The fixed chess package ==: =: pressure two mechanism' the first and second slate mechanisms adopt the adjacent mode laterally A steel memory card that is placed in the aforementioned 4, and can be placed in the chute. The probe module is arranged to be transposed in the front riding plane (four), and has a complex array probe single 疋 'the probe material is rich and succinct, and the remaining side is tested _, the remaining side of the test is made ^ It is installed at the front board unit, adjacent to the front-end module, and can be operated at the right time to make the plurality of slides of the template unit open or closed. In order to familiarize the person skilled in the art with the purpose, features and effects of the present invention, the present invention will be described in detail by the following specific embodiments and with the accompanying drawings. [Embodiment] As shown in the first and second figures of the brother, the perspective and side view of the creation are the first. The present invention has a slide-type memory card test device comprising a slide module 1, a fixed module 2, a door module 3 and a probe module 4, the slide module 1 including a template The unit η and a frame 丨 2 are disposed at an inclined angle at the frame 12, and the upper surface of the template unit 具有 has a plurality of slides 13. In this embodiment, the slide 13 has a slope of a special feature, and the thin m-card is placed on the slide 13 (10) and can automatically slide downward. The fixed mold set 2 includes a first-platen mechanism 21 and a second display mechanism 22, and the first two-pressure mechanism (^) 22 laterally sets the template unit of the slide module 采 in a conventional manner. The younger platen mechanism 21 has a complex array pressing unit 211, and the second platen array is pressed by the pressing unit 22. ο ο ^ 疋 疋 221 M-News mechanism 21 is used to temporarily fix the memory card to be tested, and the t and _ pin module 4 is in contact with the memory card to be tested. Although the platen mechanism 22 temporarily fixes another memory card to be tested, the purpose is to prevent the untested memory card from slipping out when the gate change group 3 is prevented from being opened. The gate module 3 is disposed on the upper surface of the template unit U, adjacent to the side of the first platen mechanism 21 of the cap group 2. The module 3 has a gate unit 3 and the gate unit can be Appropriate lateral displacement is generated such that the plurality of slides 13 of the template material n are closed or opened, and the gate mechanism 3 has the position Wei as the memory card to be tested. The probe 4 is disposed at a position below the template unit 11, and the position corresponds to the first platen mechanism. The probe module 4 has a money number of 41, and the Congjie element 41 _ rises with the memory card to be tested. Fine. So picking up the position of the job _ _ Leica's job. The following is a description of the detailed structure of each component: , / (5) The main purpose of the gift 1 is to move the card to the test area, and then automatically close after the test is completed. In order to make the fiber-made card self-riding, the paste side is designed in a diagonally inclined manner. The slide module i mainly comprises a template unit u and a frame 12, and the template unit 11 is placed at a tilt angle to the frame 12, and the upper surface of the template material u has a plurality of slides 13. Miscellaneous scales u _ skew can be adjusted to adjust the type. M343793 is -adjustable in this embodiment, so that the slide module can include at least: a group of adjustable branch groups 14. At this time, the template unit u is pivoted at the side: at the frame 12, the other side of the template unit is opposite to the tow, and the other side of the frame is combined with the adjustable branch _ and 14 On the side, the template unit n is tilted by an angle (as in the first figure). When the angle is to be adjusted, the tilting angle of the template unit 11 can be changed by rotating the adjustable support rod set 14 to be elongated or shortened. The sigmoid structure is the basic structure of the creation/f, but in order to make the slide module into automation and smoother and more stable when the card to be tested is slipped, the slide module 1 includes a plurality of The material pipe mechanism 15, the first film feed mechanism 16, the second film feed mechanism π, the number of blocking electromagnetic (four), and the _ auxiliary guide wheel mechanism. There are many ways to put the memory card to be tested into the slide 13 of the template unit 11 , such as the automatic method of the financial arm, the transmission of the conveyor belt, and the like. However, the Lin embodiment adopts a 131 manual mode, that is, in the front section of each slide 13 (ie, the feeding area), there is a material pipe mechanism 15, which can provide a pluggable memory card. Multi-chip piles of words are inserted. There is a gap between the bottom of the material pipe mechanism 15 and the bottom surface of the slideway 13, so that the memory card domain of the stack (4) in the material g mechanism 15 is sequentially slid into the human sliding channel η. In order to make the memory card to be tested lacking in the continuous channel 13, the creation of the present invention - the first feeding mechanism 2 to assist the movement of the memory card to be tested. As shown in the first and third figures, the first filming Lin 16 is placed at her early (10) 'close to the aforementioned material pipe mechanism 15 for the purpose of bringing the lowest layer of the card paste to be tested by the material officer 15 Out. The first feeding mechanism Μ includes a M343793 motor 161, a driving axle 丨62, and a driven axle 163. The motor 161 drives the driving axle 162 to rotate. The driving axle 162 has a plurality of rollers 164 on the shaft. The rollers 164 are spaced apart. Each of the slides 13 of the template unit 11 has a guiding hole 131 extending to a position below the tube mechanism 15 and having a narrow width. Each of the rollers 164 of the primary axle 162 is located in a corresponding guide hole 131. The active, axle 162 and driven axle 163 are respectively disposed below and above the template unit η. • When the bottommost memory card to be tested in the material pipe mechanism 15 falls into the chute 13, the slide pipe 13 will have a natural inclination to slide away from the material pipe mechanism 15. In order to increase the stability, the roller 164 is in contact with the underside of the memory card to be tested, and the driven wheel shaft 163 is smoothly guided by the upper side to smoothly feed the memory card to be tested to the bottom of the discharge pipe mechanism 15 and into the slide 13 . The template unit 11 has a second sheet feeding mechanism 17 in the vicinity of the fixed module 2. The structure of the second sheet feeding mechanism 17 is completely the same as that of the first sheet feeding mechanism 16, and therefore the structure will not be described in detail. The purpose of the second film feed mechanism 17 is to enable the memory card to be tested arranged in the slide 13 to be turned into an area in the fixed module 2 to test the operation. The plurality of blocking solenoid valves 18 are disposed in the template unit u ^ ^ π to take the wood section, and are close to the exit of the slide 13 . The blocking solenoid valve 18 has a telescopic ejector pin (8). Each blocking solenoid valve 18 is located at the opposite end of the bottom portion of the slide rail 13, where each slide inner tube has a blocking hole 132. In the initial state, the telescopic ejector pin u, β, τ 181 疋 protrudes from the slide: 18 as a pure paste, the object needle (8) is retracted under the shout 13 and the memory card of the discharge test is slid out of the catching guide wheel. The mechanism 19 is disposed at the rear of the template unit, the suffix, the M343793 191, the axle 192, and the plurality of auxiliary wheels i93. The multiple wheel auxiliary wheels 193 are equally spaced at the axle 192, and each of the auxiliary wheels 913 corresponds to a slide. 13. The motor 191 is responsible for driving the axle 192 to rotate. The auxiliary guide wheel mechanism 19 is for assisting the completed memory card to enter the preliminary exit chute 13. As shown in the first, second, and fourth figures, the fixed module 2 includes a first-platen mechanism 21 and a first platen mechanism 22. The structure of the first platen mechanism 2 and the second platen mechanism 22 are substantially the same. The first platen mechanism 21 will be described first. The first platen mechanism #21 includes a stacking unit 211 and a lifting unit 212, and each pressing unit 2 is located above the slide 13. The lifting unit 212 is responsible for synchronously π moving the pressing unit 211, and pressing the pressing unit 211 against the top of the memory card to be tested to temporarily fix the memory card to the slide 12. The pressure applying unit 21 and the lifting unit 212 can be designed in various ways. This embodiment only provides a structure for illustration, but does not limit the scope of the invention. The lifting unit 212 includes a pressing plate 2121, a driving wheel 2122, and a base 2123. The base 2123 is provided with a sliding rail so that the pressing plate 2121 can smoothly rise or fall. The platen 2121 is provided for the number of pressing units 211, and has a plurality of protrusions 2124 thereon. The actuating wheel 2122 can receive external power to rotate, and a plurality of cams 2125 are disposed on the axle. The cam 2125 is in contact with the aforementioned projection 2124. When the moving wheel 2122 is rotated, the relationship between the cam 2125 and the projection 2124 can drive the pressure plate 2121 to rise or fall. As shown in the fifth figure, the pressure applying unit 211 includes a buffer top post 2iu, a spring 2112, and an adjusting screw 2113. The buffer top post 2111 is inserted from the bottom to the bottom of the pressing plate 2121. The bottom of the top pillar 2111 is covered with rubber, and the upper half of the buffer top pillar 2111 protrudes above the pressure plate 2121. The adjusting screw 2113 is coupled to the upper half of the buffer top 11 • M343793 . The post 2 m, and the spring 2112 is placed over the lower half of the cushioning 2 ι. This structure allows the buffer top column to maintain the elasticity of upward movement. Therefore, when the device m is pressed against the top of the memory card to be tested, the memory card to be tested is not destroyed, and the test probe is in close contact with the memory card. The structure of the second enemy mechanism 22 is similar to that of the first platen mechanism 21, and is still composed of a pressing element 221 and a lifting unit 222. The lifting unit 221 causes the recompression unit 221 to descend synchronously. The second platen mechanism 22 is for fixing the memory card of the rear row to be tested by the second platen mechanism ^ after the test operation, after the memory card of the front row is slid out, the pressure applying unit is closed after the gate module 3 is closed. 221 is raised, so that the burnt card to be tested enters the area to be tested. The structure of the pressing unit 221 is the same as that of the pressing unit 2, and therefore will not be described. The structure of the lifting unit 222 is still the same as that of the lifting unit 212, and still includes a pressure plate 222-actuating wheel 2222. However, in this implementation, the main fine source motor 2224疋7 of the Guding module 2 is placed at the second platen mechanism 22 and pastes the timing belt to synchronize the two wires 2222 and 2122. The cam design of the age is slightly different. Therefore, the lifting and lowering timings of the pressing unit 211 and the pressing unit 221 are not the same. As shown in the first and sixth figures, the gate module 3 is disposed on the upper surface of the front panel unit U _ next to the fixed module 2 described above. The gate module 3 includes a closed door unit and a power unit το 32. The gate unit 31 has a plurality of door panels 311 and a plurality of gaps 312 ′ which are spaced apart from each other and disposed laterally on the upper surface of the template unit u. The power unit % can be moved laterally by the 0W movable gate unit 31, and the door panel 311 is used to block or leave the slide rails 13, 12 M343793 for the purpose of opening or closing. The probe module 4 is It is disposed at the nail position of the template unit 11 and corresponds to the first platen mechanism 21 of the fixed module 2. The probe 杈, and 4 mainly includes the complex array 楝 needle unit 41 and the _ probe lifting unit. The probe unit 41 is composed of a plurality of bullets, and the number and distribution of the probes are determined by the memory card specifications. The needle unit & bottom is connected to the connector of the test machine. The probe lifting unit 4_ drives the multi-array probe unit to rise or fall, and mainly includes a flat plate 421, a driving wheel, a machine seat, and a motor 424. The 421 can be smoothly raised or lowered, and the object is rotated by the driving wheel 422. The driving wheel 422 has a plurality of cams: a plate-like lifting timing. The complex array probe unit 41 is disposed on the flat panel 421 =. In addition, there is a probe opening (3) at a relative position in each of the slides 13, and the position of the probe opening 133 corresponds to where the aforementioned probe unit 4i is located. In the following, the operation flow of the creation is explained: the memory card to be tested is placed in a stacking manner _4_insert material_15. When the memory card to be tested enters the ιΓΓ ^ 13 ^ 16 ^ , 3 (four) of the ^ distribution (four) Road 13 . When the test is to be performed, the first-discharge mechanism 21 and the second platen mechanism 22 of the fixed group 3 are actuated to apply pressure to the adjacent gate mold, the memory card to be tested, and the second-row memory card to be tested. Thereafter, the probe module 13 M343793 4 is actuated to cause the probe unit 41 to rise in contact with the memory card to be tested in the first row and perform related test work. After the test is completed, the electromagnetic resistance valve 18 located at the rear of the slider unit u is notified based on the test result. Thereafter, the picking needle is lowered by the early element 41, and the first platen mechanism 21 is raised. The valve module 3 is in an open state, and the memory card of the test in one row slides through the gate unit 31 into the exit area of the slide 13 . At this time, according to the preset state, the electromagnetic blocking valve 18 makes the defective product temporarily unable to slide out, and the good product is first slipped out and collected, and then moved to the exit area of the slide 13 by another group collecting device. The electromagnetic blocking valve 18 is lowered to cause the defective product to slide out and be collected. Thereafter, the shutter module 3 is again closed, and the second platen mechanism 22 is raised to move the memory card to be tested of the second row to the first row position. In this way, the test of the memory card can be performed in an automated manner. However, the above-mentioned ones are only examples of the present invention, and cannot be limited to the scope of this creation. That is, the equal changes and modifications made by Dadu in accordance with the scope of patent application for this creation shall remain within the scope of this creation patent. [Simple diagram of the drawing] The picture of the brother is the perspective view of the creation; the second picture of the creation is the side view of the creation; the second picture is the longitudinal section of the creation template unit; the fourth picture is the perspective view of the creation of the fixed module; The fifth picture is a partial cross-sectional enlarged view of the clamping plate, the closing module and the probe module of the creation. M343793 The sixth drawing is a schematic plan view of the structure between the gate module and the template unit. A perspective view of the created probe module. [Main component symbol description] A test device 1 slide module 11 template unit 12 frame 13 slide 131 guide hole 132 blocking hole 133 probe opening 14 adjustable support rod 15 material tube mechanism 16 first film feeding mechanism 161 Motor 162 drive axle 163 driven axle 164 roller 17 second feed mechanism 18 blocking solenoid valve 181 telescopic thimble 19 auxiliary guide wheel mechanism 191 motor 192 axle 2 fixed module 193 auxiliary wheel 21 first platen mechanism 211 pressure unit 2111 Buffer top column 2112 spring 2113 adjustment screw 212 lifting unit 2121 pressure plate 2122 actuation wheel 2123 base 2125 cam 2124 projection 15 M343793 ~ 22 second pressure plate mechanism 221 pressure unit 2221 pressure plate 2224 motor 3 gate module • 31 gate unit 312 Notch φ 4 probe module ^ 41 probe unit ' 42 probe lifting unit 422 driving wheel 424 motor 222 lifting unit 2222 driving wheel 2225 timing belt 311 door 32 power unit 411 spring probe 421 plate 423 base
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