M348234 八、新型說明： 【新型所屬之技術領域】 構的=:::種探針卡’特別是關於-種具保護機 【先前技術】 探針卡的主體為一張具有一測試面以及一 面的印刷電路板(PCB)1丨繪示—種懸臂式探針卡= 圖’印刷電路板H)的測試面1G4上具有受固定環⑽固〜 的懸臂式探針H)6,用來與受測IC接觸，測試機接觸面= 上則具有多個接點（圖中未示），用來與測試機接觸，並 接跳線以及電容、電感等電路元件。懸臂式探針卡常用於 驅動IC的測試，該測試又分為兩種，一種為晶圓測 试’一種為切割晶圓封裝的TCP(Tape Carrier測試。 參照圖2，由於測試需求曰漸提高，使得印刷電路板 2〇的測試機接觸面上的電路元件26 m跳線25的數量大 增，空間佈局複雜度提高。為減低空間佈局複雜度，測試 機接觸面上常設有額外浮接或©定於印刷電路板2G上的載 板22及24，載板22及24係供焊接電路元件26或者跳線 25，並經由跳線25與測試機接觸面上的接點電性連接，因 此降低測試機接觸面上的空間佈局複雜I，然❿，由於跳 線=5以及载板22、24在實際使用時常受到拉扯，因此極 易以成未知的異常，且載板22、24與印刷電路板間的 跳線25及接點密度很高，發生異常時的維修十分困難。 M348234 【新型内容】 。本創作的目# ’在於提出一種具保護機構的lcd驅動 器懸臂式探針卡。 ^根據本創作，一種具保護機構的LCD驅動IC懸臂式 探針卡’包括-具有—測試面以及—測試機接觸面的印刷 =路板複數個固定環在該測試面上，固定複數個懸臂式 探針，一载板經由複數條跳線電性連接該測試機接觸面， 、及保°蒦板固定在該測試機接觸面上，用來保護該載板 及該些跳線。 較佳者，該保護板以透明材質製成，以方便測試及對 位。 、較佳者，該保護板設計成環狀，以避免在進行ccd測 試以光源判斷針尖時造成光源散射。 【實施方式】 圖3為本創作一實施例的示意圖，在印刷電路板汕的 測試機接觸面上增設保護板28。如圖所示，在印刷電路板 20的測„式機接觸面上的載板、跳線、電路元件等焊接完成 之後將保濩板28以鎖固機構3〇鎖合於測試機接觸面上， 以保δ蔓測试機接觸面上的跳線及電路元件。 圖4係圖3之實施例的上視圖，印刷電路板2〇上具有 載板24及22，並焊接有電路元件26，保護板28以壓克力 板製成’以鎖固機構3G鎖合在印刷電路板2()的測試機接 6 M348234 觸面上’為了方便測試及對位，本實施例之保護板28以透 明壓克力板製成。由於在使用CCD測試並判斷針尖時，需 要使用光源，為了避免光源散射，本實施例將保護板28設 片成環狀在其他實施例中，載板22和24可以是軟板（fpc) 或具彈性針的連接器（Connector)。 本創作提出之具保護機構的懸臂式探針卡在探針卡製 ，造完成交給使用者，以及之後探針卡交回廠商維修的期 間可以有效保證跳線、載板及PCB板之間的電路正常。 以上對於本創作之較佳實施例所作的敘述係為闡明之 目的，而無意限定本創作精確地為所揭露的形式，基於以 上的教導或從本創作的實施例學習而作修改或變化是可能 的，實施例係為解說本創作的原理以及讓熟習該項技術^ 以各種實施例利用本創作在實際應用上而選擇及敘述，M348234 VIII. New description: [New technical field] constituting =::: kind of probe card' especially related to - protection machine [previous technology] The main body of the probe card has a test surface and one side Printed circuit board (PCB) 1 丨 — 种 种 种 种 种 种 种 种 = 悬 悬 = = = 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷 印刷When the IC under test contacts, the contact surface of the tester = there are multiple contacts (not shown) for contact with the tester, and jumpers and circuit components such as capacitors and inductors. Cantilever probe cards are often used to test ICs. The test is divided into two types, one for wafer testing, 'a TCP for cutting wafer package (Tape Carrier test. See Figure 2, due to the increasing test requirements, The number of circuit elements 26 m jumpers 25 on the test machine contact surface of the printed circuit board 2 is greatly increased, and the space layout complexity is increased. To reduce the space layout complexity, the test machine contact surface is often provided with additional floating or © The carrier boards 22 and 24 are disposed on the printed circuit board 2G, and the carrier boards 22 and 24 are used to solder the circuit component 26 or the jumper 25, and are electrically connected to the contacts on the contact surface of the tester via the jumper 25, thereby reducing The space layout on the contact surface of the test machine is complicated, and then, since the jumper=5 and the carrier plates 22 and 24 are often pulled during actual use, it is easy to become an unknown abnormality, and the carrier plates 22, 24 and the printed circuit The jumper 25 between the boards and the density of the contacts are very high, and it is very difficult to repair when an abnormality occurs. M348234 [New content] The purpose of this creation is to propose a lcd-drive cantilever type probe card with a protection mechanism. Benchuang , an LCD driver IC cantilever probe card with a protection mechanism includes: a test surface and a test machine contact surface printing = a plurality of fixed rings on the test surface, a plurality of cantilever probes are fixed, A carrier board is electrically connected to the contact surface of the testing machine via a plurality of jumpers, and a retaining plate is fixed on the contact surface of the testing machine for protecting the carrier board and the jumpers. Preferably, the protection is provided. The plate is made of a transparent material to facilitate testing and alignment. Preferably, the protection plate is designed to be ring-shaped to avoid scattering of the light source when the ccd test is performed to determine the tip of the needle by the light source. A schematic diagram of an embodiment is shown in which a protective plate 28 is added to the contact surface of the test board of the printed circuit board. As shown, the carrier board, jumpers, and circuit components on the contact surface of the printed circuit board 20 are shown. After the welding is completed, the retaining plate 28 is locked to the contact surface of the testing machine by the locking mechanism 3 to ensure the jumper and circuit components on the contact surface of the δ vine tester. FIG. 4 is a diagram of the embodiment of FIG. Top view, printed circuit board 2 The carrier boards 24 and 22 are soldered with the circuit component 26, and the protection board 28 is made of an acrylic plate, and the test machine of the printed circuit board 2 (locked by the locking mechanism 3G is connected to the 6 M348234 contact surface) for convenience. In the test and alignment, the protection plate 28 of the embodiment is made of a transparent acrylic plate. Since the light source is used when testing and judging the needle tip by using the CCD, in order to avoid scattering of the light source, the protection plate 28 is formed into a piece in this embodiment. Rings In other embodiments, the carrier plates 22 and 24 may be soft boards (fpc) or connectors with elastic pins. The cantilever probe card with the protection mechanism proposed in the present invention is stuck in the probe. The circuit is completed and delivered to the user, and the period after the probe card is returned to the manufacturer for maintenance can effectively ensure the normal circuit between the jumper, the carrier board and the PCB board. The above description of the preferred embodiment of the present invention is for illustrative purposes, and is not intended to limit the present invention to the precise form disclosed. It is possible to make modifications or variations based on the above teachings or learning from the embodiments of the present invention. The embodiment is to explain the principle of the present invention and to familiarize the technology with the use of the present invention in various embodiments to select and describe in practical applications.
創作的技術思想企圖由以下的申請專·圍及其均等L來決 定_ 0 / N ► 【圖式簡單說明】 圖1係懸臂式探針的剖面圖； 圖2係習知探針卡的上視圖； 圖3係本創作一實施例的示意圖；以及 圖4係圖3之實施例的上視圖。 【主要元件符號說明】 10 印刷電路板 7 M348234The technical idea of creation is determined by the following application and its equal L. _ 0 / N ► [Simplified illustration] Figure 1 is a cross-sectional view of a cantilever probe; Figure 2 is a conventional probe card Figure 3 is a schematic view of an embodiment of the present invention; and Figure 4 is a top view of the embodiment of Figure 3. [Main component symbol description] 10 Printed circuit board 7 M348234
102 測試機接觸面 104 測試面 106 探針 108 固定環 20 印刷電路板 22 載板 24 載板 25 跳線 26 電路元件 28 保護板 30 鎖固機構102 Tester contact surface 104 Test surface 106 Probe 108 Retaining ring 20 Printed circuit board 22 Carrier board 24 Carrier board 25 Jumper 26 Circuit components 28 Protection board 30 Locking mechanism