M333565 八、新型說明： 【新型所屬之技術領域】 、本創作疋有關一種測試探針，特別是指一種接觸針 為孟合金材質所製作’兩接觸針之間得設置具有高傳 係數或高延展係數之軟導線或導線以傳輸其間訊號，以 此提昇整體耐磨耗性能及使用壽命者。 【先前技術】 習見之測試探針，如第1圖所示，該測試探針r 主要包括一兩端貫通的圓瞢M ^ ^ 11内設一彈菁‘ 弹只12的兩玄而各设置一接觸4+ 1 ^ - 认山*， 按觸針13、14，接觸針13、14 勺-=出圓㈣，其本體134、⑷位於圓管u内， 並和圓管11的内管壁lu保持滑動接觸。 β青參照第2圖所示，你q a r ν π1 糸该名見測試探針1組裝於户 * ^ ^ . 、矣在電路板（Load Board)22 上方的不思圖，當測試探針1 Π R 的下方接觸針14接觸到電 路板（Load Board)22 而内狳,士 ^ ^ J j 甩 吞服欲1 9 A 、’、 t ’接觸針14的本體141 克服h 12力而向内移動 ： 動接觸。 〃 u s u的内壁111滑 石月參ft?、弟3圖所示，作 具(―，下方接觸探針"且裝於治 B〇ard)2_而内縮，上方接総^ 4接觸到電路板（Load 壓測試而内縮。 、’十13文待測物魏（IC)23下 主要被用來測試待測 從該等圖示可知，測試探針工 5 M333565 物體23和電路板22㈤電氣訊號是否能正常導通，由於 測試探針i之接觸针13、14在測試過程中必需保持正常 =下㈣且能刪内壁ln保持滑動接觸，使訊號能 =護輪，以獲得正確的測試結果。為了增強測試探 曰I之接觸針13、14的使用壽命與準確性，一般的作法 .是在接觸針u、u的表面電鍍鎳層或金層3〇(如第3a 所不）H錢層或鍍金層均有—定厚度的限制， •用次數達到8萬〜1〇萬次後’鎳層或金層的表面仍 :、、、'^因為長期相對磨擦而消耗，不僅會導致阻抗增高， 而訊號的，輸效能也會相對降低，甚至產生錯誤結果。 . 尤其是使用在高頻（>1GHz)訊號的傳輸測試時中， :更容易因為接觸針13、14和圓管11的接合處加工尺寸 偏錢It層厚度料足，導致訊號傳輸* 果，影響更大。 、、'° 【新型内容】 =此’本創作旨在提供—種測試探針，係使接觸針 肢為金合金材質所製作Μ，不僅能減少二次電錢 之成本，而且更具而才磨性。 又 本創作之次一目的在提供一種測試探針，由於接觸 ::質為金ί金：表層不需再鍍金，即使接觸針因為長 广_用而伐，也月匕保持良好的訊號傳輸效能γ。 4本創作之再一目的在提供—種測試探針，其上、 邊觸針之間彳m置具有高傳㈣數或高延展係數之軟 6 M333565 導線，使兩接觸針 經由上接觸針到導 的距離可以縮短， 密合公差所影響。 本創作之又一 接觸針之間復可設 線，傳遞其間訊號 有關本創作之 的讯唬可以直接由上往下傳遞，不需 管再傳到下接觸針，因此，不但傳輸 而且不會受到接觸針和導管接合處的 目的在提供一種測試探針，在上、下 置具有高傳導係數或高彈性係數之導 配合參考圖式之 的呈現。 其他技術内容、特點與功效，在以下 較佳實施例的詳細說明中，將可清楚 【實施方式】 本創作之測試探針，如第4圖所示，該測試探針4, 匕括兩接觸針5、6、—提供該兩接觸針相對活動之導管？ 斜以及:介於該兩接觸針間之彈性元件8;其中，兩接觸 ?、6係由金合金材質所製作成型，其本體、η的管 =於導管7内，其前端凸出導管7,使其受力時可以在 =7内部相對滑動。相對滑動時，本體5卜61的外壁和 二官7的Λ壁71保持滑動接觸，使壓制上接觸針5之待測 的電氣訊號，經由上接觸針5傳遞到導管7的内壁Η， 再傳到下接觸針6，最後傳到電路板（Load Board)。 、由於接觸針5、ό為金合金材質，即使上、下接觸針$ ^長屑上下移動及一直接觸待測物品而有些微磨損 ，仍能保持良好的訊號傳輸效能。 、 M333565 明參照第5圖所示，係本創作之測試探針的另一實施 例’如圖所示，該測試探針1〇〇，除了具備兩接觸針1〇1 、102、一提供該兩接觸針相對活動之導管103、以及一 介於該兩接觸針間之彈性元件104外，復可在兩接觸針 101、102之本體底部設置一具有高傳導係數或高延展係 -數之軟導線相互連接。請同時參照第6圖，由於在兩 -接觸針101、1〇2之本體底部設置具有高傳導係數或高延 春展係數之軟導線105，當兩接觸針1〇1、1〇2受力而向内滑 • 動時，彈性元件104和軟導線1〇5可同時被壓縮變形，不 會影響軟導線105傳遞訊號的功能。如此，兩接觸針1〇1 • 、102之汛號傳遞，即可不受兩接觸針1〇1、1〇2和導管1〇3 ：之加工密合度公差所影響，而且透過軟導線105直接傳遞 • ，更此細短距離，使訊號的傳遞更為快速確實。 請參照第7圖所示，係本創作之測試探針的再一實施 例，如圖所示，本創作之測試探針2〇〇，其接觸針2〇1、 .202除了可以為圓柱型，亦可以為如圖所示之扁平柱型。 ^當接觸針201、202為扁平柱型時，其導管亦為扁平柱型 .導管。 請參照第8圖所示，係本創作之測試探針的又一實施 例，如圖所示，本創作之測試探針3〇〇，其接觸針3〇^、 302除了得藉由彈性元件303於導管3〇4内上下滑動外，兩 接觸針301、302更可透過公端和母端的插入式接觸來加 速傳遞其間訊號，如圖所示，在上接觸針3〇1的本體底端 設有一向下延伸之凸桿305，在下接觸針3〇2的本體底端 8 M333565 則权有一相對之凹槽306。請參照第9圖所示，當兩接觸 針3〇1、302叉力而向内滑動時，彈性元件303被壓縮，兩 接觸針3(H、地更可透過凸桿邮於凹槽3 對動 ，使其間電氣訊號直接傳遞。 動 技總請參照第_，係本創作使用具有公母端為插入式 =觸之賴探針娜其公端接觸針觀和母端接觸針搬 除了可以為圓柱型，亦可以為如圖所示之爲平柱型。 材質綜本創作之測試探針，其接觸針為金合金 …耗性及使用#命均大為提昇，而於兩接觸 有高傳導係數或高延展係數之軟導線或具 Γ彈性係數之導線，或者使兩接觸針以 二：而為插入式接觸等，均可使訊號的傳遞更為直接且 :速，又不會受到接觸針和導管内壁加工裕度的影塑， 収的結果更為精準確實，其確實具新穎性和進i性 其亚未見諸公開制，應有合於本國專利法之 ，爰依法提出申請，懇請賜准專利。 惟以上所述者，僅為本創作之較佳實_而已，舍 :以此限定本創作實施之範圍，即大凡依本創作申二 :利，圍及新型說明内容所作之簡單的 ： 飾’皆應仍屬本創作專利涵蓋之範“ 9 M333565 【圖式簡單說明】 :1:係習見挪試探針 第2圖係習見剛試探針之第視：面圖。 第3圖係習見滴i試探針使項示圖。 第3Α圖係習見”弟一使用示圖。 第4圖係探針之接觸針剖面示圖 第5圖係本創作之：面不圖。 第6圖係本創作之實施例剖面示圖。 第7圖係本創作之：二實施例透視使用示圖 第8圖係本創作之：三實施例立體示圖。 第9圖係本創作广實施例透視剖面示圖 第1〇圖係本創作Λ四實施例使用剖面示圖 JTF之第五實施例使用剖面示r 【主要元件符號說明】 II :圓管 13、14 ·接觸針 III :内管壁 22 :電路板 30 :金層 5、6 :接觸針 8 :彈性元件 71 :内壁 1 :測試探針 12 :彈簧 134、141 ··本體 21 :治具 23 :待測物體（ic) 4 :測試探針 7 :導管 51、61 :本體 M333565 100 ： 103 ： 105 : 201、 301、 304 : 306 : 401 : 測試探針 101、 導管 104 ： 軟導線 200 202 :接觸針 300 302 :接觸針 303 導管 305 凹槽 400 公端接觸針 402 102 :接觸針 彈性元件 測試探針 測試探針 彈性元件 凸桿 測試探針 母端接觸針M333565 VIII. New description: [New technical field], this creation is related to a kind of test probe, especially a contact pin made of Meng alloy material. The two contact pins are set with high transmission coefficient or high extension. A soft wire or wire with a coefficient to transmit the signal therebetween to improve overall wear resistance and service life. [Prior Art] The test probe of the prior art, as shown in Fig. 1, the test probe r mainly includes a circular 瞢 M ^ ^ 11 which is penetrated at both ends, and a set of two black and white One contact 4+ 1 ^ - recognizing the mountain*, pressing the stylus 13, 14 , the contact pin 13, 14 scoop -= the circle (four), the body 134, (4) is located in the circular tube u, and the inner tube wall of the round tube 11 Lu keeps sliding contact. The β-green reference is shown in Figure 2, you qar ν π1 糸 the name of the test probe 1 assembled in the household * ^ ^ ., 矣 on the board (Load Board) 22 above, when the test probe 1 Π The lower contact pin 14 of R contacts the load board 22 and is internally twisted, and the body 141 of the contact pin 14 is moved inwardly against the h 12 force. : Dynamic contact. 〃 usu's inner wall 111 talc month ft?, brother 3 picture, the tool (―, the lower contact probe " and installed in the treatment B〇ard) 2_ and the indentation, the upper connection 総 ^ 4 contact the circuit Board (Load pressure test and retraction., 'Ten 13 text to be tested Wei (IC) 23 is mainly used to test the test from the figures, test probe 5 M333565 object 23 and circuit board 22 (five) electrical Whether the signal can be normally turned on, because the contact pins 13, 14 of the test probe i must remain normal during the test = lower (four) and the inner wall ln can be kept in sliding contact, so that the signal can be = guard wheel to obtain the correct test result. In order to enhance the service life and accuracy of the contact pins 13, 14 of the test probe, it is common practice to electroplate a nickel layer or a gold layer on the surface of the contact pins u, u (as in the 3a). Or the gold plating layer has a certain thickness limit. • After the number of times reaches 80,000~1 million times, the surface of the nickel or gold layer is still:,,,,, ^, because it is consumed by long-term relative friction, which not only causes the impedance to increase. And the signal, the performance will be relatively reduced, and even produce incorrect results. Especially use In the transmission test of the high-frequency (> 1 GHz) signal, it is easier to process the size of the joint of the contact pins 13, 14 and the round tube 11 to the thickness of the layer of the It layer, resulting in a signal transmission effect. ,, '° [New content] = This 'this creation is intended to provide a kind of test probe, which makes the contact needle body made of gold alloy material, which can not only reduce the cost of secondary electricity, but also more Grinding. The second purpose of this creation is to provide a test probe. Because of the contact:: the quality is gold 355: the surface layer does not need to be gold-plated, even if the contact needle is cut due to the length and width, the sputum remains good. Signal transmission performance γ. 4 Another purpose of this creation is to provide a test probe with a high-transmission (four) number or a high-expansion coefficient of soft 6 M333565 wire between the upper and middle contact pins, so that the two contact pins The distance from the upper contact pin to the guide can be shortened, and the tight tolerance is affected. The other contact pins of the creation can be set with a line, and the signal transmitted between them can be directly transmitted from top to bottom. Need to pass to the lower contact needle, therefore, Not only the transmission but also the purpose of the contact between the needle and the catheter is to provide a test probe with a high conductivity or a high modulus of elasticity in the upper and lower layers of the reference pattern. Other technical content, features and Efficacy, in the detailed description of the following preferred embodiments, it will be clear that the test probe of the present invention, as shown in Fig. 4, the test probe 4, including two contact pins 5, 6, - Providing a conduit for the relative movement of the two contact pins? Oblique and: an elastic member 8 interposed between the two contact pins; wherein, the two contacts, the 6 series are formed of a gold alloy material, and the body, the tube of the η = the conduit In the case of 7, the front end protrudes from the duct 7, so that it can slide relative to the inside of =7 when the force is applied. When sliding relative to each other, the outer wall of the body 5 is kept in sliding contact with the wall 71 of the second official 7 so that the electrical signal to be tested for pressing the contact pin 5 is transmitted to the inner wall of the catheter 7 via the upper contact pin 5, and then transmitted. Go to the lower contact pin 6 and finally to the Load Board. Since the contact pin 5 and the crucible are made of a gold alloy material, even if the upper and lower contact pins are moved up and down and the parts to be tested are always slightly worn, the signal transmission performance can be maintained. M333565, as shown in FIG. 5, is another embodiment of the test probe of the present invention. As shown in the figure, the test probe 1〇〇, in addition to having two contact pins 1〇1, 102, one provides The two contact pins are opposite to the movable conduit 103, and an elastic member 104 interposed between the two contact pins, and a soft wire having a high conductivity or a high extension coefficient can be disposed at the bottom of the body of the two contact pins 101 and 102. Connected to each other. Please refer to FIG. 6 at the same time, because the soft wire 105 having a high conductivity or a high extension of the spring spread coefficient is disposed at the bottom of the body of the two-contact pins 101 and 1 2, when the two contact pins 1〇1, 1〇2 are forced to Internal sliding • When moving, the elastic member 104 and the flexible wire 1〇5 can be simultaneously compressed and deformed without affecting the function of the flexible wire 105 to transmit signals. In this way, the nickname transmission of the two contact pins 1〇1 and 102 can be affected by the tolerance of the processing contact of the two contact pins 1〇1, 1〇2 and the conduit 1〇3, and can be directly transmitted through the flexible wire 105. • Even more short distances make the signal transmission faster and more accurate. Please refer to FIG. 7 , which is a further embodiment of the test probe of the present invention. As shown in the figure, the test probe of the present invention is 2〇〇, and the contact pins 2〇1 and .202 may be cylindrical. It can also be a flat column type as shown. ^ When the contact pins 201, 202 are of a flat cylindrical type, the catheter is also a flat column type. Please refer to FIG. 8 , which is still another embodiment of the test probe of the present invention. As shown in the figure, the test probe 3 of the present invention has a contact pin 3〇, 302 in addition to the elastic component. 303 slides up and down in the conduit 3〇4, and the two contact pins 301 and 302 can transmit the signal through the plug-in contact between the male end and the female end, as shown in the figure, at the bottom end of the upper contact pin 3〇1. A downwardly extending projection 305 is provided, and the bottom end 8 of the lower contact pin 3〇2 M333565 has an opposite recess 306. Referring to FIG. 9, when the two contact pins 3〇1, 302 are forked and inwardly slid, the elastic member 303 is compressed, and the two contact pins 3 (H, the ground are more transparent to the groove 3 in the groove 3 Move, make the electrical signal directly transmitted. Please refer to the first _, the use of the male and female ends for the plug-in = touch probe, its male contact pin and the female contact pin can be removed The cylindrical type can also be a flat column type as shown in the figure. The test probe for the material comprehensive design, the contact needle is a gold alloy... the consumption and the use of the # life are greatly improved, and the two contacts have high conduction. A soft wire with a coefficient or a high elongation coefficient or a wire with a Γ elastic coefficient, or a two-contact pin for two: a plug-in contact, etc., can make the signal transmission more direct and speed, and will not be affected by the contact pin And the processing of the inner wall of the duct, the result is more accurate and accurate. It does have novelty and progress. It has not been publicized. It should be in accordance with the national patent law. Patent granted. Only the above is only the best of this creation _ Yes, She: This is to limit the scope of the implementation of this creation, that is, the simpleness of the creation of the second application: the benefit, the encirclement and the new description: The decoration should still belong to the scope of this creation patent. 9 M333565 Brief description of the formula: :1: The system is seen in the second part of the probe. The first view of the test probe is the first view: the surface view. The third picture shows the drop test probe to make the item map. The third picture is the view. Fig. 4 is a cross-sectional view of the contact pin of the probe. Fig. 5 is a cross-sectional view of the embodiment of the present creation. Fig. 7 is a cross-sectional view of the embodiment of the present creation. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 8 is a perspective view of a third embodiment of the present invention. FIG. 9 is a perspective view of a wide embodiment of the present invention. FIG. 1 is a diagram showing the use of a cross-sectional view. The fifth embodiment of Fig. JTF uses a cross-sectional view r [Description of main component symbols] II: round tube 13, 14 · contact pin III: inner tube wall 22: circuit board 30: gold layer 5, 6: contact pin 8: elastic element 71: inner wall 1: test probe 12: spring 134, 141 · body 21: jig 23: object to be tested (ic) 4: test probe 7: conduit 51, 61: body M333565 100 : 103 : 105 : 201, 301 , 304 : 306 : 401 : test probe 101 , conduit 104 : flexible wire 200 202 : contact pin 300 302 : contact pin 303 catheter 305 groove 400 male contact pin 402 102 : contact pin elastic element test probe test probe elastic element bump test probe female contact pin