M313240 八、新型說明： 【新型所屬之技術領域】 • 本創作係有關一種光學膜片檢測裝置，特別係一種用於檢測光學 膜片是否有缺陷（defect)之光學膜片檢測襞置。 【先前技術】 按，由於液晶顯示器具有輕薄化、低耗電量及高精細的影像晝質 等優點，故深受使用者的青睞，並且亦廣泛應用於各種電子產品上， 如行動電話、筆記型電腦、PDA等，其中偏光片（palorizer)乃係影響 液晶顯示器顯示明暗之主要關鍵性零件，在製作液晶片的過程中，上 下各用一片偏光片’並且此兩片係成交錯方向，利用外加電場控制光 源的通過，而產生明暗變化。 然，偏光片在生產過程中會因遭受不當的受力，而在表面上產生凹凸不 平的現象’再加上目前產品尺寸日益朝向大尺寸發展，故更容易使偏光片 有所缺陷(defect)，故如何檢測偏光狀品質優劣就成為_㈣要的課題。盆 中，習知的偏光細方式都是糊拍攝二_的攝影機，如嘱影财 偵測偏光狀三維賴，如職或是起泡等缺陷，故影像辨識纽會有所降低·’ 且，藉由這種_二維晝面的CCD攝影機拍攝不同光線照射角度所產生陰影的 差異，進而㈣雜影的差異來觸賊，並麵 、 、 陰影將隨著缺陷的不同而使得辨識效果不佳。 ％、疋的檢測方式，因為 有鑑於此’本創作係針對上述_擾，料上述之缺失。 5 M313240 【新型内容】 本創作之一目的係在提供一種光學膜片檢測裝置，其利用样狀— 概的設計’以供光源經由格狀光樹而產生格狀式的光源於待、則的光 膜片上，以使光學膜片所檢測出的影像更為清楚，進而能更精確判 光學膜片之是否有缺陷的存在。 種 本創作之另一目的係在提供一種光學膜片檢測裝置，其提供 穩定的檢測裝置，加強影像的辨識效果。M313240 VIII. New description: [New technical field] The present invention relates to an optical film detecting device, in particular to an optical film detecting device for detecting whether an optical film has a defect. [Prior Art] According to the advantages of thinness, low power consumption and high-definition image quality, the liquid crystal display is favored by users and widely used in various electronic products, such as mobile phones and notes. A computer, a PDA, etc., in which a polarizer is a key component that affects the display brightness of a liquid crystal display. In the process of fabricating a liquid crystal film, a polarizer is used up and down and the two pieces are staggered. An applied electric field controls the passage of the light source to produce a change in light and dark. However, the polarizer will suffer from undue stress during the production process, and the surface will be uneven. In addition, the current product size is increasingly oriented toward large size, so it is easier to make the polarizer defective. Therefore, how to detect the quality of the polarized light becomes the subject of _(4). In the basin, the conventional method of polarizing light is the camera of the second film, such as the detection of polarized three-dimensional ray, such as job or blistering, so the image recognition will be reduced. With this kind of CCD camera, the difference in shadows produced by different angles of light illumination, and (4) the difference of ghosts to touch the thief, the surface, shadow, and shadow will make the recognition effect poor. . %, 疋 detection method, because in view of this 'this creation is for the above _ disturbance, the above mentioned missing. 5 M313240 [New content] One of the purposes of this creation is to provide an optical film detecting device that uses a pattern-like design to provide a light source to a light source through a lattice light tree. On the diaphragm, the image detected by the optical film is made clearer, and the optical film can be more accurately determined whether or not the optical film is defective. Another object of the present invention is to provide an optical film detecting device which provides a stable detecting device and enhances the image recognition effect.
"立丨小匕秸一檢測平台，其 承載一光學膜片，一格狀光柵位在此光學膜片上方，一第_也1 4 " 乐先源，其發射光線 至一分光鏡以轉換光線至格狀光柵而產生一格狀光源於光學膜片上 “ 此走*學 經 膜片接收此格狀光源後再反射成一格狀光線穿過格狀光栅與分光^^"立丨小匕草-detection platform, which carries an optical film, a grid-like grating is placed above the optical film, a _1 &4;" Le Xianyuan, which emits light to a beam splitter Converting the light to the lattice grating to produce a grid-like light source on the optical film. "This walks through the diaphragm to receive the grid light source and then reflects it into a grid of light passing through the grid grating and splitting ^^
裝置接收此格狀光線，以判讀該光學膜片是否有缺陷。 底下藉由具體實施例配合所附的圖式詳加說明 創作之目的、技術内容、特點及其所達成之功效。【實施方式】 及一感測 當更容易瞭解本 本創作所揭示的光學膜片檢測裝置係用於檢測光學膜片，士偏光 片（polarizer)、擴散片（diffuser)或增亮膜(prism sheet)等光學膜片有無缺 陷。其中，這些缺陷可能係由於生產過程中因遭受不當的受力，而在光學膜片 表面上產生凹凸不平，如凹點、凸點、歪點或係起泡等缺陷，底下的光 學膜片係以偏光片為例，以便於說明本創作之技術特徵。 首先，請參照第一圖，係為本創作光學膜片檢測裝置之一實施例 6 M313240 示意圖。如圖所示，本創作之光學膜片檢測骏置1〇係包括_檢測平台 • 12，祕承載-偏光片14，-分光賴位於偏光片14的上方，一格狀 …光柵18位在分光鏡16與偏光M4之間，其中格狀光㈣即如第二圖所 示，一第一光源20位在分光鏡16之一側，其中第一光源別為線塑光源或 —面光源之-者，其構成係冷陰極管、發光二極體或係光纖導引之冷光源，及 ^ 一感測裝置22位在分光鏡16之上方，且感測裝置22與一電腦系統24連 結。其中，檢測平台12更可内設一第二光源％，其係為面光源，並由 • 冷陰極管、發光二極體或係光纖導引之冷光源所構成；感測裝置22則係一電 荷耦合元件（CCD)或一互補金屬氧化半導體（CM〇s)元件。 承上述之結構，請參照第三圖，則為本光學膜片檢測裝置1〇之一 檢測光學膜片示意圖。如圖所示，事先將待測的偏光片14置放在檢測 平台12上，接著第一光源20提供一光線li至分光鏡16，使得部分的光 線L1導向至格狀光柵18而產生一格狀光源於偏光片14上，之後偏光片 14接收此格狀光源後，則反射一格狀光線GL1(Grid Ught丨）穿過格狀 ® 光柵18、分光鏡16至感測裝置22，然後感測裝置22接收格狀光線 ^ GL1後會送出一數據資料至電腦系統24,進而判讀偏光片14是否有缺陷。其中， . 倘若偏光片14之表面凹凸不平時，則缺陷處之光柵將產生扭曲影像。 再者，請參照第四圖，係本檢測裝置10之另一種檢測光學膜片示意圖， 係用於判讀偏光片14是否有髒點、纖維或刮傷。首先，由檢測平台12内之第 ^一面光源26發出^一光線L2穿過偏光片14以產生一光線L3，光線L3再入射至格狀 光栅18產生一格狀光源，其穿過分光鏡16至感測裝置22，之後感測裝置22送 出一數據資料至電腦系統24，判讀偏光片14是否有髒點、纖維或刮傷。假若偏 7 M313240 光片14有髒點、纖維或刮傷的話，則格狀光柵18所產生的格狀光源，就會 有髒點、纖維或刮傷處的影像。 請參照第五圖，係本創作光學膜片檢測裝置之另一實施例示意圖。 如圖所示，本創作之光學膜片檢測裝置28更可在分光鏡16與感測裝置 22之間設一偏光鏡30。同理，檢測裝置28之檢測方式與檢測裝置1〇類 、 似，如第六圖所示，第一光源20提供一光線L1至分光鏡16，使得部分 的光線L1導向至格狀光柵18而產生一格狀光源於偏光片14上，之後偏 _ 光片14接收此格狀光源後’則反射一格狀光線GL1 (Gr id Light 1)穿過 格狀光柵18、分光鏡16至偏光鏡30，以產生一格狀光線GL2(Grid Light 2)，然後感測裝置22接收格狀光線GL2後會送出一數據資料至電腦系統 24，進而判讀偏光片η是否有缺陷。其中，倘若偏光片14之表面凹凸不平時， 則缺陷處之光栅將產生扭曲影像。 本創作所揭不的光學膜片檢測裝置，主要係利用格狀光拇之結構， 使光線經過格狀光柵後會產生格狀光源於待測的光學膜片上，若此時光學膜片 _的表面具有缺陷時’如凹點、凸點、歪點或起泡等三維缺陷，則於缺陷處之光 柵將產生㈣影像，故大大的提升缺陷處之影像辨識度，以彌補習知僅僅利用 、拍攝二維畫面的CCD攝影機去偵測這些三維的缺陷之不足之處。 以上所述之實施例僅係為說明本創作之技術思想及特點，其目的 在使熟習此項技藝之人士能夠瞭解本創作之内容並據以實施，當不能 以之限定本創作之專利_，即大凡依本創作所揭示之精神所作之^ 等變化或修飾，仍應涵蓋在本創作之專利範圍内。 8 M313240 【圖式簡單說明】 第一圖係根據本創作之一實施例示意圖。 第二圖係根據本創作之一格狀光柵示意圖。 第三圖係根據本創作第一圖之一檢測光學膜片示意圖。 第四圖係根據本創作第一圖之另一檢測光學膜片示意圖 第五圖係根據本創作之另一實施例示意圖。 第六圖係根據本創作第五圖之一檢測光學膜片示意圖。 【主要元件符號說明】 ίο光學膜片檢測裝置 12檢測平台 14偏光片 16分光鏡 18格狀光栅 20第一光源 22感測裝置 24電腦系統 26第二光源 28光學膜片檢测裝置 30偏光片 9The device receives the grid light to determine if the optical film is defective. The purpose of the creation, the technical content, the features and the effects achieved by the specific embodiments are explained in detail by the specific embodiments. [Embodiment] and a sensing. It is easier to understand that the optical film detecting device disclosed in the present invention is used for detecting an optical film, a polarizer, a diffuser or a prism sheet. Whether the optical film has defects. Among them, these defects may be caused by irregularities on the surface of the optical film due to improper force during the production process, such as pits, bumps, defects or blistering, and the underlying optical film system. Taking a polarizer as an example, in order to illustrate the technical features of the present creation. First, please refer to the first figure, which is a schematic diagram of an embodiment 6 M313240 of the optical film detecting device. As shown in the figure, the optical film detection of this creation includes a detection platform • 12, a secret bearing - a polarizer 14 , a split light is located above the polarizer 14 , a lattice shape ... grating 18 position in the split light Between the mirror 16 and the polarized light M4, wherein the lattice light (four) is as shown in the second figure, a first light source 20 is located on one side of the beam splitter 16, wherein the first light source is not a linear plastic light source or a surface light source - The cold cathode light source, the light emitting diode or the cold light source guided by the optical fiber, and the sensing device 22 are located above the beam splitter 16 , and the sensing device 22 is coupled to a computer system 24 . The detection platform 12 can be internally provided with a second light source %, which is a surface light source, and is composed of a cold cathode tube, a light emitting diode or a cold light source guided by a fiber; the sensing device 22 is a A charge coupled device (CCD) or a complementary metal oxide semiconductor (CM〇s) device. In view of the above structure, please refer to the third figure, which is a schematic diagram of the optical film detection device 1 of the optical film detecting device. As shown in the figure, the polarizer 14 to be tested is placed on the detecting platform 12 in advance, and then the first light source 20 supplies a light ray to the beam splitter 16 so that part of the light L1 is directed to the grating grating 18 to generate a grid. The light source is on the polarizer 14. After the polarizer 14 receives the grid light source, the grid light GL1 (Grid Ught丨) is reflected through the grid® grating 18 and the beam splitter 16 to the sensing device 22, and then sensed. After receiving the grid light GL1, the measuring device 22 sends a data data to the computer system 24 to determine whether the polarizer 14 is defective. Wherein, if the surface of the polarizer 14 is uneven, the grating at the defect will produce a distorted image. Furthermore, please refer to the fourth figure, which is another schematic diagram of the detection optical film of the detecting device 10, which is used to determine whether the polarizer 14 has dirty spots, fibers or scratches. First, a light L2 is emitted from the second light source 26 in the detecting platform 12 through the polarizer 14 to generate a light L3, and the light L3 is incident on the grating 18 to generate a lattice light source, which passes through the beam splitter 16. To the sensing device 22, the sensing device 22 then sends a data to the computer system 24 to determine if the polarizer 14 has dirty spots, fibers or scratches. If the 7 M313240 light sheet 14 has dirty spots, fibers or scratches, the lattice light source generated by the lattice grating 18 will have images of dirty spots, fibers or scratches. Please refer to the fifth figure, which is a schematic diagram of another embodiment of the present optical film detecting device. As shown, the optical film detecting device 28 of the present invention further provides a polarizer 30 between the beam splitter 16 and the sensing device 22. Similarly, the detecting device 28 is detected in the same manner as the detecting device. As shown in the sixth figure, the first light source 20 provides a light L1 to the beam splitter 16 so that part of the light L1 is directed to the grating grating 18. A lattice light source is generated on the polarizer 14, and then the polarizer 14 receives the lattice light source, and then reflects a lattice light GL1 (Gr id Light 1) through the grating grating 18 and the beam splitter 16 to the polarizer. 30, to generate a grid light GL2 (Grid Light 2), and then the sensing device 22 receives the grid light GL2 and sends a data to the computer system 24 to determine whether the polarizer η is defective. Wherein, if the surface of the polarizer 14 is uneven, the grating at the defect will produce a distorted image. The optical film detecting device disclosed in the present invention mainly utilizes the structure of the lattice light thumb, so that the light beam passes through the lattice grating to generate a lattice light source on the optical film to be tested, and if the optical film is at this time _ If the surface has defects, such as three-dimensional defects such as pits, bumps, defects or blistering, the grating at the defect will produce (4) images, so the image recognition of the defects is greatly improved to make up for the conventional use. A CCD camera that takes a two-dimensional picture to detect the inadequacies of these three-dimensional defects. The embodiments described above are only for explaining the technical idea and characteristics of the present invention, and the purpose thereof is to enable those skilled in the art to understand the contents of the present creation and implement it according to the patent, and the patent of the creation cannot be limited thereto. That is, the changes or modifications made by the people in accordance with the spirit revealed by this creation should still be covered by the scope of this creation patent. 8 M313240 [Simple Description of the Drawings] The first drawing is a schematic diagram of an embodiment according to the present creation. The second figure is a schematic diagram of a lattice grating according to the present creation. The third figure is a schematic diagram of detecting an optical film according to one of the first figures of the creation. The fourth drawing is a schematic view of another detecting optical film according to the first drawing of the present invention. The fifth drawing is a schematic view of another embodiment according to the present creation. The sixth figure is a schematic diagram of detecting an optical film according to one of the fifth figures of the present creation. [Main component symbol description] ίο optical film detecting device 12 detecting platform 14 polarizing plate 16 beam splitter 18 lattice grating 20 first light source 22 sensing device 24 computer system 26 second light source 28 optical film detecting device 30 polarizer 9