M3 09102 八、新型說明： 【新型所屬之技術領域】 本新型是有關於一種測試用探針（pogo pin)，特別是指 一種低磨耗的測試用探針。 【先前技術】 參閱圖1 ’傳統的測試用探針是1是可置換地設置於一 測試座100的一探針孔2〇〇中用以電連接一待測接點3〇〇 及一收訊接點400。 該測試用探針1是以導電材料製成，並包括一穿設於 该採針孔200的殼體件u、一上接觸件12、一下接觸件13 ，及一彈性元件14。 §亥殼體件11具有一中空的底壁111、一由該底壁lu 之外周緣向上延伸的圍繞壁112、一由該圍繞壁112之頂端 徑向向内延伸之中空的頂壁113,及一由該底壁lu與圍繞 壁112及頂壁113所界定的穿孔114。M3 09102 VIII. New description: [New technical field] The present invention relates to a test probe (pogo pin), in particular to a low-abrasive test probe. [Prior Art] Referring to FIG. 1 'The conventional test probe 1 is replaceably disposed in a probe hole 2 一 of a test socket 100 for electrically connecting a contact to be tested 3 〇〇 and a Contact 400. The test probe 1 is made of a conductive material and includes a housing member u, an upper contact member 12, a lower contact member 13, and an elastic member 14 which are bored in the pick-up hole 200. The housing member 11 has a hollow bottom wall 111, a surrounding wall 112 extending upward from the outer periphery of the bottom wall lu, and a hollow top wall 113 extending radially inwardly from the top end of the surrounding wall 112. And a perforation 114 defined by the bottom wall lu and the surrounding wall 112 and the top wall 113.
"亥上接觸件12是可上下移動地設置於該殼體件11的穿 孔丄14上半部’並具有一可移動地抵靠該頂壁113之底面的 抵靠部121、—由該抵靠部121向下延伸的,連接部122，及 -由该抵靠部121向上延伸並穿過該頂壁113而可接觸該待 測接點300的接觸部123。 疋Γ上下移動地設置於該殼體件η 孔114下半部，廿目士 並/、有一可移動地抵靠該底壁Ul之 抵靠部131、—由該抵靠部⑶向上延伸的連接部132, 由舌亥抵*部132向下延伸並穿過該底壁ill而可接觸該 M309102 吼接點400的接觸部133。 ”亥彈丨生元件14是可壓縮形變地設置於該殼體件11之穿 内’且二端分別連接該上接觸件12的連接部122及 4下接觸件13的連接部132,並用於因應該待測接點綱 及°亥收Λ接點_的間距緩衝調變該上、下接觸件12、13 的距離σ亥彈性元件141 _ ^ 參閱圖2，使用時，將該測試座設置於該收訊接點 彻上方、，且使該下接觸件13之接觸部133接觸該收訊接 點彻’並使該待測接點_接觸該上接觸件η之接觸部 依據》亥待测接點3 〇〇及該收訊接點彻的間距，該上 、下接觸件12、13相應配合壓縮該彈性元件14，使該彈性 ^件14偏斜抵#該殼料1卜岐得該上接觸件12的接 觸部123及該下接觸件 的接觸°卩133 _偏斜抵靠該殼 丘牛，^該彳㈣接點3⑻、該上接料12 『該下接觸们3及該收訊接點形成電通路。 由於使用時’該下接觸件13及該彈 靠著該殼體件u移動，而與該殼 2 ^抵 磨耗。另-方面，因元㈣面發生摩擦造成 口几件表面互相摩擦而刮落的顆粒， 冰積於该殼體件11内，影響訊息傳遞的正確性。 【新型内容】 :二本新型之目的’是在提供一種測試用探針，可 Ρ牛低磨耗並增加訊息傳遞的正確性。 於是，本新型測試用探針是設置於_测試座 孔中用以電連接一待測接點及一收訊接點。 針 M309102 的上::：用探針包含一具導電性的殼體件、-具導電性 的上接觸件，及-彈性元件。 、/體件疋直立穿設於該探針孔中，且底端凸伸出該測 試座之底面而可接觸該收訊接點，並具有—由頂面向下形成 的盲孔。 ,亥上接觸件是可上下移動地設置於該殼體件之盲孔上半 P 頁而凸伸出该測試座之頂面而可接觸該待測接點。 该弹性元件是可壓縮形變地設置於該殼體件的盲孔内， 且二端分別連接該上接觸件及該殼體件。 當該待測接點及收訊接點分別接觸該上接觸件的頂端及 该殼體件的底端時，該上接觸件與該殼體件相配合壓縮該彈 性兀件使其產生形變，同時該上接觸件抵靠該殼體件使該待 測接點、該上接觸件、該殼體件及該收訊接點呈電通路。 本新型之功效在於利用該具導電性的殼體件之底端直接 接觸該收訊接點，而不需在該殼體件的底端設置另一用於接 觸$亥收δίΐ接點的接觸件’以減少元件間相對運動產生的磨耗 並增進訊號傳遞的正確性。 【實施方式】 本新型之前述及其他技術内容、特徵與優點，在以下 配合參考圖式之二較佳實施例的詳細說明中，將可清楚的 明白。 在進行詳細說明前應注意的是，以下類似的元件是以 相同的編號來表示。 參閱圖3、4，本新型測試用探針之第一較佳實施例是 Μ3Ό9102 可置換地設置於一測試座100的一探針孔2〇〇中，並用以 電連接一待測接點300及一收訊接點4〇〇，其中，該待測接 點300疋以金屬墊的態樣呈現，而該收訊接點400為在 一電子基板（PCB)中形成鑽孔的態樣。 該測試用探針是導電材質所製成，並包含一殼體件2、 一上接觸件3，及一彈性元件4。 該殼體件2是直立穿設於該探針孔2〇〇中，並包括一設 置於該探針孔200内之中空的頂壁21、一由該頂壁21之外 周緣向下延伸的圍繞壁22、一由該圍繞壁22之底端向下突 伸出該測試座1〇〇並逐漸向内收合且剖視呈弧形的收合壁 23、一由該頂壁21與該圍繞壁22及該收合壁23界定出的 盲孔24及由忒收合壁23的底端向下延伸的長形的突針 W 25。5亥突針部25可接觸該收訊接點4〇〇。 忒上接觸件3是可上下移動地設置於該殼體件2的盲孔 =上半部，並包括一可移動地抵靠該頂壁21之底面的抵靠 =31、一由該抵靠部31向下延伸的連接部32，及一由該抵 向上延伸並牙過δ亥頂壁21而可接觸該待測接點3〇〇 的接觸部3 3。 該彈性元件4是可壓縮形變地設置於該殼體件2的盲孔 24内，且二端分別連接該上接觸件3之連接部32及該殼體 =2的收合壁23，並用於因應該待測接點3〇〇及該收訊接 =400的間距缓衝調變該上接觸件3的位置。在該第一較佳 實施:列中，該彈性元件4是一壓縮彈簧，且二端的直徑大於 Ρ刀的直徑，並由一端向中間部分逐漸縮減且剖視呈雙 M3 09102 凹形。 使用時’將該測試座100設置於該收訊接點4〇〇上方， 且使遠殼體件2之突針部25接觸該收訊接點4〇〇，並使該 待測接點300接觸該上接觸件3之接觸部33，依據該待測 接點300及該收訊接點4〇〇的距離，該上接觸件3與該殼體 件2相應配合壓縮該彈性元件4，使該彈性元件4之中間部 分變形，卻不抵靠該殼體件2，並連動該上接觸件3偏斜抵 靠該殼體件2，而沿該待測接點3〇〇、該上接觸件3、該殼 體件2及該收訊接點400形成電通路。 參閱圖5,為本新型測試用探針之第二較佳實施例，該 第二較佳實施例與該第一較佳實施例大致相同，不同之處在 於，於該待測接點300是以概呈圓形之金屬錫球的態樣呈現 ，而該收訊接點400為一金屬接墊。該殼體件2是包括一設 置於δ亥权針孔200内之中空的頂壁21、一由該頂壁21之外 周緣向下延伸的圍繞壁22、一由該圍繞壁22之底端向下突 伸出該測試座100並向内收合且剖視呈弧形的收合壁23， 及一由該頂壁21與該圍繞壁22及該收合壁23界定出的盲 孔24。該殼體件2可直接以該收合壁23之底端觸接該收訊 接點400，以形成電導通，一方面可簡化製造該殼體件2之 模具的複雜度，另一方面該殼體件2之底端不易受力斷折。 本新型之測試用探針將傳統的測試用探針之殼體件與 下接觸件改造成一體成型的型式，以改善習知中元件間相 對運動造成的磨耗。另外，設計該彈性元件4之中間部分 的直徑小於二端的直徑，一方面可避免該彈性元件4被壓 M309102 縮形變時’抵靠並摩擦該殼體件2造成磨耗，另一方面可 使該彈性元件4容易變形以連動該上接觸件3偏斜抵靠該 殼體件2。 歸納上述，本新型之測試用探針藉由該殼體件2直接 接觸該收訊接點彻，並將該彈性元件4設計成剖視左右兩 側呈雙凹形的形狀，以降低元件相對運動時的磨耗，且增 加訊息傳遞的正確性。故確實能達到本新型之目的。 惟以上所述者，僅為本新型之二較佳實施例而已，當 不能以此限定本新型實施之範圍，即大凡依本新型申請^ 利範圍及新型說明内容所作之簡單的等效變化與修飾，皆 仍屬本新型專利涵蓋之範圍内。 【圖式簡單說明】 圖1是一剖視圖，說明一傳統的測試用探針設置於一 測試座的-探針孔，且尚未電連接一待測接點及一收訊接 點時的狀態； 山圖2是一剖視圖，說明圖1之傳統的測試用探針之二 端分別接觸該待測接點及該收訊接點時的狀態； 圖3是一剖視圖，說明本新型之測試用探針之第一較 只施例，並說明其设置於該測試座的探針孔且尚未電連 接該待測接點及該收訊接點時的狀態；及 八圖4是一剖視圖，說明圖3之本新型測試用探針二端 分別接觸該待測接點及該收訊接點時的狀態；及 土圖5是一剖視圖，說明本新型之測試用探針之第二較 佳實施例’並說明其二端分別接觸該待測接點及該收訊接 M309102 點時的狀態。 M309102 【主要元件符號說明】"The upper contact member 12 is an upper portion of the perforation cymbal 14 of the housing member 11 that is movably movable up and down and has an abutting portion 121 movably abutting against the bottom surface of the top wall 113. The connecting portion 122 extending downward from the abutting portion 121 and extending upward from the abutting portion 121 and passing through the top wall 113 can contact the contact portion 123 of the contact to be tested 300. The cymbal is disposed up and down in the lower half of the housing member η hole 114, and the cymbal and/or abutting portion 131 movably abuts against the bottom wall U1, extending upward from the abutting portion (3) The connecting portion 132 extends downwardly from the tongue-and-groove portion 132 and passes through the bottom wall ill to contact the contact portion 133 of the M309102 contact point 400. The "black bullet generating member 14 is a connecting portion 132 that is compressively deformably disposed inside the housing member 11 and is connected to the connecting portion 122 of the upper contact member 12 and the lower contact member 13 at both ends, and is used for The distance between the upper and lower contacts 12, 13 is adjusted according to the pitch of the joint to be tested and the pitch of the contact point _ _ _ _ _ _ Refer to Figure 2, when used, set the test pedestal The receiving contact is completely above, and the contact portion 133 of the lower contact 13 is in contact with the receiving contact and the contact portion of the contact to be tested is contacted with the upper contact η. Measuring the contact point 3 〇〇 and the distance of the receiving contact, the upper and lower contacts 12, 13 correspondingly cooperate to compress the elastic member 14, so that the elastic member 14 is biased against the shell material 1 The contact portion 123 of the upper contact member 12 and the contact portion 133 of the lower contact member are biased against the shell and the cow, the 彳 (4) contact 3 (8), the upper material 12, the lower contact 3 and the The receiving contact forms an electrical path. Since the lower contact 13 and the spring move against the housing member u during use, the housing 2 abuts wear. The friction of the surface of the element (4) causes the surface of the mouth to rub against each other, and the ice is accumulated in the casing member 11, which affects the correctness of the message transmission. [New content]: The purpose of the two new models is to provide a kind of The test probe can reduce the wear of the yak and increase the correctness of the message transmission. Therefore, the new test probe is disposed in the _ test socket for electrically connecting a contact to be tested and a receiving contact. The upper::: probe of the needle M309102 includes a conductive housing member, an electrically conductive upper contact member, and an elastic member. The / body member is erected in the probe hole. And the bottom end protrudes from the bottom surface of the test seat to contact the receiving contact, and has a blind hole formed downward from the top surface. The upper contact member is blindly disposed on the housing member The top half of the hole protrudes from the top surface of the test seat to contact the contact point to be tested. The elastic element is compressively deformably disposed in the blind hole of the housing member, and the two ends are respectively connected to the upper portion. a contact member and the housing member. When the contact to be tested and the receiving contact contact the upper connection respectively The top contact and the bottom end of the housing member, the upper contact member cooperates with the housing member to compress the elastic member to deform, and the upper contact member abuts against the housing member to make the connection to be tested Point, the upper contact member, the housing member and the receiving contact are electrically connected. The function of the novel is to directly contact the receiving contact with the bottom end of the conductive housing member, without The bottom end of the housing member is provided with another contact member for contacting the contact point to reduce the wear caused by the relative movement between the components and improve the correctness of the signal transmission. [Embodiment] The foregoing and other The technical content, features, and advantages of the present invention will be apparent from the following detailed description of the preferred embodiments of the accompanying drawings. Said. Referring to FIG. 3 and FIG. 4, the first preferred embodiment of the test probe of the present invention is that the Μ3Ό9102 is replaceably disposed in a probe hole 2〇〇 of a test socket 100, and is electrically connected to a contact to be tested 300. And a receiving contact 4〇〇, wherein the to-be-tested contact 300 is represented by a metal pad, and the receiving contact 400 is a hole formed in an electronic substrate (PCB). The test probe is made of a conductive material and includes a housing member 2, an upper contact member 3, and an elastic member 4. The housing member 2 is erected and disposed in the probe hole 2, and includes a hollow top wall 21 disposed in the probe hole 200, and a downward extending portion from the outer periphery of the top wall 21. a surrounding wall 22, a folding wall 23 projecting downwardly from the bottom end of the surrounding wall 22 and gradually collapsing inwardly and having an arc shape in cross section, and a top wall 21 a blind hole 24 defined around the wall 22 and the folding wall 23 and an elongated protruding needle W 25 extending downward from the bottom end of the folding wall 23. The 5 protruding needle portion 25 can contact the receiving contact 4 Hey. The upper contact member 3 is a blind hole=upper half that is vertically movably disposed on the housing member 2, and includes abutment=31 movably against the bottom surface of the top wall 21, and the abutment The connecting portion 32 extending downward from the portion 31, and a contact portion 33 extending from the abutting upward and contacting the top wall 21 to contact the contact point 3 to be tested. The elastic member 4 is compressively deformably disposed in the blind hole 24 of the housing member 2, and the two ends are respectively connected to the connecting portion 32 of the upper contact member 3 and the folding wall 23 of the housing=2, and are used for The position of the upper contact 3 is modulated by the spacing of the contact 3 and the receiving connection = 400. In the first preferred embodiment: the elastic member 4 is a compression spring, and the diameter of both ends is larger than the diameter of the file, and is gradually reduced from one end to the intermediate portion and is concave in the cross section in the shape of a double M3 09102. When in use, the test socket 100 is disposed above the receiving contact 4〇〇, and the protruding portion 25 of the distal housing member 2 contacts the receiving contact 4〇〇, and the contact to be tested 300 is contacted. The contact portion 33 of the upper contact member 3, according to the distance between the contact 300 to be tested and the receiving contact 4, the upper contact member 3 and the housing member 2 cooperate to compress the elastic member 4, so that the contact member 33 The middle portion of the elastic member 4 is deformed without abutting against the housing member 2, and the upper contact member 3 is interlocked against the housing member 2, along the contact point to be tested 3〇〇, the upper contact member 3. The housing member 2 and the receiving contact 400 form an electrical path. Referring to FIG. 5, a second preferred embodiment of the test probe of the present invention is substantially the same as the first preferred embodiment, except that the contact 300 to be tested is Presented in the form of a generally round metal tin ball, and the receiving contact 400 is a metal pad. The housing member 2 includes a hollow top wall 21 disposed in the ΔHui pinhole 200, a surrounding wall 22 extending downward from the outer periphery of the top wall 21, and a bottom end of the surrounding wall 22. a folding wall 24 projecting downwardly from the test seat 100 and folded inwardly and having an arcuate shape, and a blind hole 24 defined by the top wall 21 and the surrounding wall 22 and the folding wall 23 . The housing member 2 can directly contact the receiving contact 400 at the bottom end of the folding wall 23 to form electrical conduction, on the one hand, simplifying the complexity of manufacturing the mold of the housing member 2, and on the other hand, The bottom end of the housing member 2 is not easily broken by force. The test probe of the present invention transforms the housing member and the lower contact member of the conventional test probe into an integrally formed type to improve the wear caused by the relative movement between the components in the conventional one. In addition, the diameter of the middle portion of the elastic member 4 is designed to be smaller than the diameter of the two ends. On the one hand, when the elastic member 4 is deformed by the pressure M309102, the wear of the elastic member 4 can be prevented from abutting and rubbing the housing member 2, and the other can be used. The elastic member 4 is easily deformed to interlock the upper contact member 3 against the housing member 2. In summary, the test probe of the present invention directly contacts the receiving contact by the housing member 2, and the elastic member 4 is designed to have a biconcave shape on the left and right sides in cross section to reduce the relative orientation of the components. Wear during exercise and increase the correctness of message transmission. Therefore, it can indeed achieve the purpose of this new type. However, the above description is only the preferred embodiment of the present invention, and the scope of the novel implementation cannot be limited thereto, that is, the simple equivalent change made by the novel application scope and the new description content is Modifications are still within the scope of this new patent. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a cross-sectional view showing a state in which a conventional test probe is disposed in a probe hole of a test socket and has not been electrically connected to a contact to be tested and a receiving contact; Figure 2 is a cross-sectional view showing the state in which the two ends of the conventional test probe of Figure 1 are in contact with the contact to be tested and the receiving contact respectively; Figure 3 is a cross-sectional view showing the test of the present invention The first embodiment of the needle is more than the embodiment, and the state of the probe hole disposed in the test socket is not electrically connected to the contact to be tested and the receiving contact; and FIG. 4 is a cross-sectional view illustrating the figure. 3 is a state in which the two ends of the new test probe are respectively in contact with the contact to be tested and the receiving contact; and FIG. 5 is a cross-sectional view showing the second preferred embodiment of the test probe of the present invention ' Also indicate the state when the two ends contact the contact to be tested and the receiving M309102 point respectively. M309102 [Main component symbol description]
100 ·. 測試座 24. * *盲孔 200 *， •探針孔 25· · • 突針部 300 · 待測接點 3… • 上接觸件 400 · •收訊接點 31 — • 抵靠部 2 · * •殼體件 32· · • 連接部 21·· •頂壁 33·· • 接觸部 22· · •圍繞壁 4… • 彈性元件 23· · • 收合壁 12100 ·. Test stand 24. * *Blind hole 200 *, • Probe hole 25 · · • Needle part 300 · Contact point 3 to be tested... • Upper contact 400 · • Receiving contact 31 — • Abutment 2 · * • Housing part 32 · · • Connecting part 21 · · • Top wall 33 · · • Contact part 22 · · • Surrounding wall 4... • Elastic element 23 · · • Folding wall 12