CN112730927A - Testing device - Google Patents
Testing device Download PDFInfo
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- CN112730927A CN112730927A CN202011589239.9A CN202011589239A CN112730927A CN 112730927 A CN112730927 A CN 112730927A CN 202011589239 A CN202011589239 A CN 202011589239A CN 112730927 A CN112730927 A CN 112730927A
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- 238000012360 testing method Methods 0.000 title claims abstract description 58
- 239000000523 sample Substances 0.000 claims abstract description 85
- 239000000758 substrate Substances 0.000 claims abstract description 27
- 230000005284 excitation Effects 0.000 claims abstract description 15
- 230000008878 coupling Effects 0.000 claims abstract description 4
- 238000010168 coupling process Methods 0.000 claims abstract description 4
- 238000005859 coupling reaction Methods 0.000 claims abstract description 4
- 238000000034 method Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 1
- 230000003044 adaptive effect Effects 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The embodiment of the application provides a testing device, includes: the bottom plate is provided with a first through hole; the first current probe and the second current probe are respectively arranged on the bottom plate through the first through hole, the first current probe is used for being respectively connected with a pin at the input end of the transformer, and the second current probe is used for being connected with a pin at the output end of the transformer; the substrate is arranged opposite to the bottom plate and used for arranging the transformer; the excitation unit is connected with the first current probe so as to excite the transformer; and the voltage measuring device is electrically connected with the output end of the transformer by coupling the second current probe so as to measure the voltage output by the transformer. The test device is simple in structure and convenient to use, the pins of the transformer are connected through the current probes, the current probes can be fully contacted with the pins of the transformer, and the result measured by the test device is accurate and reliable.
Description
Technical Field
The application relates to the technical field of transformer detection, in particular to a testing device.
Background
In the process of testing the transformer, the transformer testing device utilizes the common probe to be connected with the transformer, the common probe is not sufficient enough when being contacted with the pin of the transformer, namely a gap is reserved between the common probe and the pin, so that the voltage output by the transformer generates loss during testing, the tested voltage value of the testing device has errors, and the tested result is not accurate enough.
Disclosure of Invention
In view of this, an embodiment of the present application provides a testing apparatus, so as to solve the following problems in the prior art:
in the testing process, the contact between the probe of the testing device and the pin of the transformer is insufficient, so that the tested voltage value has errors, and the measured result is not accurate enough.
The embodiment of the application provides a testing arrangement for the voltage of test transformer output, testing arrangement includes:
the bottom plate is provided with a first through hole;
the first current probe and the second current probe are respectively arranged on the bottom plate through the first through hole, the first current probe is used for being respectively connected with a pin at the input end of the transformer, and the second current probe is used for being connected with a pin at the output end of the transformer;
the substrate is arranged opposite to the bottom plate and used for arranging the transformer;
an excitation unit connected to the first current probe to excite the transformer;
and the voltage measuring device is electrically connected with the output end of the transformer by coupling the second current probe so as to measure the voltage output by the transformer.
In some embodiments, a second through hole is disposed on the substrate at a position corresponding to the transformer pin, the size of the second through hole is matched with the size of the first current probe and the size of the second current probe, and the first current probe and the second current probe are respectively disposed between the bottom plate and the substrate and correspond to the second through hole.
In some embodiments, the base plate is connected to the base plate by retractable fixation posts.
In some embodiments, the testing device further comprises a pressing member for connecting the transformer with the first current probe and the second current probe in a pressing manner.
In some embodiments, the pressing member includes at least one pillar disposed around the substrate, and a pressing plate slidably coupled to the pillar, the pressing plate being located above the substrate.
In some embodiments, the pressing member further comprises a wrench, and the wrench is connected with the pressing plate to control the pressing plate to slide up and down along the support.
In some embodiments, the voltage measuring device comprises a voltmeter and a high-voltage rod connected with the voltmeter, and the voltmeter measures the high-voltage value output by the transformer through the high-voltage rod.
In some embodiments, the excitation unit comprises a power supply unit connected to the input of the transformer through the first current probe; and the anode of the high-voltage rod is connected with the second current probe, and the cathode of the high-voltage rod is connected with the cathode of the power supply unit.
In some embodiments, the excitation unit further comprises a switching tube control circuit, an input end of the switching tube control circuit is connected with the power supply unit, and an output end of the switching tube control circuit is connected with the first current probe at the input end of the transformer.
In some embodiments, the test device further comprises a voltage doubling circuit,
the input end of the voltage doubling circuit is connected with the second current probe so as to receive the output voltage of the transformer;
the output end of the voltage doubling circuit is connected with the voltage measuring device to provide the output voltage of the transformer after being boosted by the voltage doubling circuit.
Compared with the prior art, the testing device of the application has the beneficial effects that: the test device of this application simple structure, convenient to use is connected through the pin that adopts current probe and transformer, and the contact of current probe and the pin of transformer is abundant for in the test process of transformer, the result of the voltage value that testing arrangement measured is accurate reliable.
Drawings
In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only some embodiments described in the present disclosure, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a testing apparatus and a transformer provided in an embodiment of the present application;
fig. 2 is a schematic structural diagram of a testing apparatus and a transformer according to another embodiment of the present disclosure.
Description of the reference numerals
100-a base plate; 110 — a first via; 210-a first current probe; 220-a second current probe; 300-a substrate; 310-a second via; 400-telescopic fixed column; 500-an excitation unit; 600-means for measuring voltage; 610-a voltmeter; 620-high pressure bar; 621-positive electrode of high voltage rod; 622-negative pole of high voltage rod; 700-a press fit; 710-a pillar; 720-laminated board; 730-a wrench; 800-transformer.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions of the embodiments of the present application will be clearly and completely described below with reference to the drawings of the embodiments of the present application. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the described embodiments of the application without any inventive step, are within the scope of protection of the application.
Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this application belongs. As used in this application, the terms "first," "second," and the like do not denote any order, quantity, or importance, but rather are used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
Detailed descriptions of known functions and known components are omitted in the present application in order to keep the following description of the embodiments of the present application clear and concise.
When the transformer 800 is detected, the excitation unit 500 is used for exciting the transformer 800 to enable the transformer 800 to generate high voltage, then the test device is used for measuring the voltage actually output by the transformer 800, usually, a probe of the test device is connected with a pin of the transformer 800 for measurement, when a common probe is used in the test device, a gap is left between the common probe and the pin of the transformer 800 due to contact, the contact is insufficient, the voltage output by the transformer 800 is damaged, the measured voltage value has errors, and therefore the measured result is not accurate enough.
An embodiment of the present application provides a testing apparatus, as shown in fig. 1 and 2, for testing a voltage output by a transformer 800, the testing apparatus including: the base plate 100 is provided with a first through hole 110; a first current probe 210 and a second current probe 220 respectively disposed on the bottom plate 100 through the first through hole 110, wherein the first current probe 210 is configured to be connected to a pin of an input terminal of the transformer 800, and the second current probe 220 is configured to be connected to a pin of an anode of an output terminal of the transformer 800, and the current probes in the present application include the first current probe 210 and the second current probe 220, each of which includes a housing (not shown) and a needle bar (not shown) elastically connected to the housing, the housing is fixed in the first through hole, and when the transformer 800 needs to be tested, the needle bar is ejected from the housing and elastically presses on the pin of the transformer 800, so that the first current probe 210 and the second current probe 220 are correspondingly and sufficiently contacted with the pin of the transformer 800; the substrate 300 is disposed opposite to the bottom plate 100, and the substrate 300 is used for disposing the transformer 800, in a specific implementation, an adaptive sink groove may be disposed on the substrate 300 for guiding placement of the transformer, so as to quickly place the transformer 800 at a proper position for testing, and of course, the transformer 800 may also be placed in other manners, which is not limited in this application; the excitation unit 500 is connected to the first current probe 210 and is communicated with the transformer 800 to excite the transformer 800, in a specific implementation, an ac power supply unit may be connected to the input end of the transformer 800 through the first current probe 210 to generate an excitation signal to excite the transformer 800 to generate a high voltage, a switching tube may be connected between the ac power supply unit and the transformer 800, and a switching tube control circuit changes an operating frequency of the switching tube to control the input end of the transformer 800 to generate a desired high voltage signal, so as to generate a desired high voltage at the output end of the transformer 800, of course, the ac power supply unit may also use a dc power supply unit, and an implementation manner of the excitation unit 500 is not limited in the embodiment of the present application; the voltage measuring device 600 is electrically connected to the output terminal of the transformer 800 by coupling the second current probe 220, so as to measure the voltage output by the transformer 800.
It should be understood that the transformer in the embodiment of the present application may be a step-up transformer, and may also be a step-down transformer.
In this embodiment, the testing apparatus uses the current probe to connect with the pin of the transformer 800 to test the voltage value of the transformer 800, and the current probe is in sufficient and stable contact with the pin of the transformer 800, so that the measured result is accurate and reliable. In addition, the service life of the tested transformer and the testing device, especially the current probe, can be prolonged.
In some embodiments, the substrate 300 is provided with a second through hole at a position corresponding to the pin of the transformer 800, and the size of the second through hole is matched with the size of the first current probe 210 and the second current probe 220, so that the first current probe 210 and the second current probe 220 can conveniently extend into and leave the second through hole; the first current probe 210 and the second current probe 220 are respectively disposed on the base plate 100, a needle bar for connecting with a pin of the transformer 800 is disposed between the base plate 100 and the substrate 300, and a position of the second through hole corresponds to a position where the first current probe 210 and the second current probe 220 are disposed, so that the first current probe 210 and the second current probe 220 can extend into the second through hole to be connected with the pin of the transformer 800.
In some embodiments, the base plate 300 is connected to the base plate 100 by a retractable fixing post 400, and in particular, the retractable fixing post 400 may include a fixing post (not shown) and a sliding post (not shown) slidably connected to the fixing post, and the length of the retractable fixing post 400 is changed by sliding the sliding post relative to the fixing post to adjust the distance between the base plate 300 and the base plate 100, but the retractable fixing post 400 may also change its length in other ways to adjust the distance between the base plate 300 and the base plate 100, which is not limited in this application.
In some embodiments, the testing apparatus further includes a pressing member 700, the pressing member 700 includes a portion opposite to the substrate 300, and when the transformer 800 is placed on the substrate 300, the transformer 800 is relatively fixed on the substrate 300 by pressing, so that the transformer 800 can be stably and sufficiently connected to the first current probe 210 and the second current probe 220. In a specific implementation, the pressing member 700 includes at least one supporting pillar 710 disposed around the substrate 300, and a pressing plate 720 slidably connected to the supporting pillar 710, wherein the pressing plate 720 is located above the substrate 300 and can slide up and down relative to the supporting pillar 710, so as to press the transformer 800 against the substrate 300 when the transformer 800 is placed on the substrate 300.
In some embodiments, the pressing member 700 further includes a wrench 730, the wrench 730 is connected to the pressing plate 720, when the wrench 730 is lifted, the pressing plate 720 is driven to slide upwards along the pillar 710 so as to make the pressing plate 720 far away from the substrate 300, when the wrench 730 is pressed, the pressing plate 720 is driven to slide downwards along the pillar 710 so as to make the pressing plate 720 close to the substrate 300, and by controlling the pressing plate 720 to slide upwards and downwards along the pillar 710, the transformer 800 can be taken out from the substrate 300 or the transformer 800 can be pressed when the transformer 800 is placed on the substrate 300.
The testing device in the embodiment of the application fixes the transformer more firmly through the combination of the current probe, the bottom plate, the substrate and other structures, and enables the current probe and the pin of the transformer to be fully and stably contacted during testing, so that the tested result is accurate and reliable. Meanwhile, the testing device can well protect the current probe and the tested transformer, and prolong the service life of the transformer and the testing device, especially the service life of the current probe. As a transformer parameter testing device, the transformer parameter testing device can be used as a transformer auxiliary testing device, overcomes the defects of a transformer comprehensive tester and a voltage withstanding tester, can be used as a transformer batch screening tool, has a simple structure, is easy and convenient to operate, and is a low-cost and high-efficiency testing device. The testing device is particularly suitable for testing high-voltage transformers with up to ten thousand volts.
In some embodiments, the voltage measuring device 600 includes a voltmeter 610 and a high voltage rod 620 connected to the voltmeter 610, and the voltmeter 610 measures the high voltage value output by the transformer 800 through the high voltage rod 620. In specific implementation, the excitation unit 500 includes a power supply unit, and the positive and negative electrodes of the power supply unit may be connected to the input end of the transformer 800 through the two first current probes 210 to generate an excitation signal, so as to excite the output end of the transformer 800 to generate a high voltage; the positive electrode 621 of the high voltage bar is connected to the second current probe 220 to be connected to the output terminal of the transformer 800, and the negative electrode 622 of the high voltage bar is connected to the negative electrode of the power supply unit, so that the high voltage actually generated by the transformer 800 is measured.
In some embodiments, the excitation unit 500 further includes a switching tube control circuit, an input terminal of the switching tube control circuit is connected to the positive electrode of the power supply unit, an output terminal of the switching tube control circuit is connected to the first current probe 210 connected to the positive electrode of the input terminal of the transformer 800, and the operating frequency of the switching tube is changed by controlling the switching tube control circuit, so that the transformer 800 can generate the predetermined high voltage.
In some embodiments, the testing apparatus further includes a voltage doubling circuit, an input terminal of the voltage doubling circuit is connected to the second current probe 220 to receive the output voltage directly output by the transformer 800, and the voltage doubling circuit can adjust the voltage directly output by the transformer 800 as required to output a voltage which is twice, three times or more times of the voltage directly output by the transformer 800; the output end of the voltage doubling circuit is connected with the voltage measuring device 600 to provide the output voltage of the transformer 800 after being boosted by the voltage doubling circuit.
Moreover, although exemplary embodiments have been described herein, the scope thereof includes any and all embodiments based on the present application with equivalent elements, modifications, omissions, combinations (e.g., of various embodiments across), adaptations or alterations. The elements of the claims are to be interpreted broadly based on the language employed in the claims and not limited to examples described in the present specification or during the prosecution of the application, which examples are to be construed as non-exclusive. It is intended, therefore, that the specification and examples be considered as exemplary only, with a true scope and spirit being indicated by the following claims and their full scope of equivalents.
The above description is intended to be illustrative and not restrictive. For example, the above-described examples (or one or more versions thereof) may be used in combination with each other. For example, other embodiments may be used by those of ordinary skill in the art upon reading the above description. In addition, in the above detailed description, various features may be grouped together to streamline the application. This should not be interpreted as an intention that a disclosed feature not claimed is essential to any claim. Rather, subject matter of the present application can lie in less than all features of a particular disclosed embodiment. Thus, the following claims are hereby incorporated into the detailed description as examples or embodiments, with each claim standing on its own as a separate embodiment, and it is contemplated that these embodiments may be combined with each other in various combinations or permutations. The scope of the application should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.
The embodiments of the present application have been described in detail, but the present application is not limited to these specific embodiments, and those skilled in the art can make various modifications and modified embodiments based on the concept of the present application, and these modifications and modified embodiments should fall within the scope of the present application.
Claims (10)
1. A test apparatus for testing a voltage output by a transformer, the test apparatus comprising:
the bottom plate is provided with a first through hole;
the first current probe and the second current probe are respectively arranged on the bottom plate through the first through hole, the first current probe is used for being respectively connected with a pin at the input end of the transformer, and the second current probe is used for being connected with a pin at the output end of the transformer;
the substrate is arranged opposite to the bottom plate and used for arranging the transformer;
an excitation unit connected to the first current probe to excite the transformer;
and the voltage measuring device is electrically connected with the output end of the transformer by coupling the second current probe so as to measure the voltage output by the transformer.
2. The testing device as claimed in claim 1, wherein a second through hole is provided on the substrate at a position corresponding to the transformer pin, the size of the second through hole is adapted to the size of the first current probe and the second current probe, and the first current probe and the second current probe are respectively provided between the bottom plate and the substrate and correspond to the second through hole.
3. The testing device of claim 1 or 2, wherein the base plate is connected to the base plate by retractable fixation posts.
4. The testing device of claim 1, further comprising a crimp element to compressively connect the transformer with the first and second current probes.
5. The testing device of claim 4, wherein the pressing member comprises at least one support post disposed around the base plate, and a pressing plate slidably coupled to the support post, the pressing plate being positioned above the base plate.
6. The testing device as claimed in claim 5, wherein the pressing member further comprises a wrench, the wrench being connected to the pressing plate to control the pressing plate to slide up and down along the pillar.
7. The testing device of claim 1, wherein the voltage measuring device comprises a voltmeter and a high voltage rod connected with the voltmeter, and the voltmeter measures the high voltage value output by the transformer through the high voltage rod.
8. The test device of claim 7, wherein the excitation unit comprises a power supply unit connected to the input of the transformer through the first current probe; and the anode of the high-voltage rod is connected with the second current probe, and the cathode of the high-voltage rod is connected with the cathode of the power supply unit.
9. The testing device of claim 8, wherein the excitation unit further comprises a switching tube control circuit, an input of the switching tube control circuit is connected to the power supply unit, and an output of the switching tube control circuit is connected to the first current probe at the input of the transformer.
10. The test device of claim 1, further comprising a voltage doubler circuit,
the input end of the voltage doubling circuit is connected with the second current probe so as to receive the output voltage of the transformer;
the output end of the voltage doubling circuit is connected with the voltage measuring device to provide the output voltage of the transformer after being boosted by the voltage doubling circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011589239.9A CN112730927A (en) | 2020-12-29 | 2020-12-29 | Testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011589239.9A CN112730927A (en) | 2020-12-29 | 2020-12-29 | Testing device |
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| Publication Number | Publication Date |
|---|---|
| CN112730927A true CN112730927A (en) | 2021-04-30 |
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| CN202011589239.9A Pending CN112730927A (en) | 2020-12-29 | 2020-12-29 | Testing device |
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| CN107728041A (en) * | 2017-10-11 | 2018-02-23 | 李贺满 | A kind of electronic circuit board electric property detection device |
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| CN209215542U (en) * | 2018-11-05 | 2019-08-06 | 深圳亿昇动力科技有限公司 | A kind of PCBA programming and testing equipment |
| CN209911419U (en) * | 2019-02-26 | 2020-01-07 | 海盐德创电子有限公司 | Carrier test tool |
| CN212341257U (en) * | 2020-04-10 | 2021-01-12 | 深圳市沃特邦检测仪器设备有限公司 | Probe fixing device for testing machine |
| CN113267657A (en) * | 2021-07-21 | 2021-08-17 | 深圳市志金电子有限公司 | IC test probe structure and manufacturing method thereof |
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2020
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW545758U (en) * | 2002-09-20 | 2003-08-01 | L & K Precision Tech Co Ltd | Probe type connector |
| CN1637420A (en) * | 2004-01-09 | 2005-07-13 | 日本电子材料株式会社 | Probe card |
| TWM309102U (en) * | 2006-09-25 | 2007-04-01 | Global Master Tech Co Ltd | Pogo-pin for testing |
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Application publication date: 20210430 |
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