TWI904406B - 含碘的金屬化合物、包含其的用於沉積薄膜的組合物及其製造方法 - Google Patents

含碘的金屬化合物、包含其的用於沉積薄膜的組合物及其製造方法

Info

Publication number
TWI904406B
TWI904406B TW112104178A TW112104178A TWI904406B TW I904406 B TWI904406 B TW I904406B TW 112104178 A TW112104178 A TW 112104178A TW 112104178 A TW112104178 A TW 112104178A TW I904406 B TWI904406 B TW I904406B
Authority
TW
Taiwan
Prior art keywords
alkyl
iodine
thin film
metal
metal compound
Prior art date
Application number
TW112104178A
Other languages
English (en)
Chinese (zh)
Other versions
TW202332680A (zh
Inventor
權容熙
任永宰
全相勇
卞泰錫
李相贊
李相益
Original Assignee
南韓商Dnf有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020230009308A external-priority patent/KR102822581B1/ko
Application filed by 南韓商Dnf有限公司 filed Critical 南韓商Dnf有限公司
Publication of TW202332680A publication Critical patent/TW202332680A/zh
Application granted granted Critical
Publication of TWI904406B publication Critical patent/TWI904406B/zh

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
    • C01G19/00Compounds of tin
    • C01G19/02Oxides
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01GCOMPOUNDS CONTAINING METALS NOT COVERED BY SUBCLASSES C01D OR C01F
    • C01G30/00Compounds of antimony
    • C01G30/004Oxides; Hydroxides; Oxyacids
    • C01G30/005Oxides
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F5/00Compounds containing elements of Groups 3 or 13 of the Periodic Table
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F5/00Compounds containing elements of Groups 3 or 13 of the Periodic Table
    • C07F5/003Compounds containing elements of Groups 3 or 13 of the Periodic Table without C-Metal linkages
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/22Tin compounds
    • C07F7/2284Compounds with one or more Sn-N linkages
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F9/00Compounds containing elements of Groups 5 or 15 of the Periodic Table
    • C07F9/90Antimony compounds
    • C07F9/902Compounds without antimony-carbon linkages
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/407Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45527Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
    • C23C16/45536Use of plasma, radiation or electromagnetic fields
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45553Atomic layer deposition [ALD] characterized by the use of precursors specially adapted for ALD

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
  • Chemically Coating (AREA)
TW112104178A 2022-02-08 2023-02-07 含碘的金屬化合物、包含其的用於沉積薄膜的組合物及其製造方法 TWI904406B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2022-0016153 2022-02-08
KR20220016153 2022-02-08
KR1020230009308A KR102822581B1 (ko) 2022-02-08 2023-01-25 요오드 함유 금속 화합물 및 이를 포함하는 박막 증착용 조성물
KR10-2023-0009308 2023-01-25

Publications (2)

Publication Number Publication Date
TW202332680A TW202332680A (zh) 2023-08-16
TWI904406B true TWI904406B (zh) 2025-11-11

Family

ID=87521631

Family Applications (1)

Application Number Title Priority Date Filing Date
TW112104178A TWI904406B (zh) 2022-02-08 2023-02-07 含碘的金屬化合物、包含其的用於沉積薄膜的組合物及其製造方法

Country Status (4)

Country Link
US (1) US12384805B2 (https=)
JP (2) JP7645296B2 (https=)
CN (1) CN116574125B (https=)
TW (1) TWI904406B (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN121362212B (zh) * 2025-12-19 2026-04-10 苏州源展材料科技有限公司 一种异丙基三(二甲氨基)锡的制备方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2062995A1 (en) * 2007-10-31 2009-05-27 Advanced Technology Materials, Inc. Amorphous Ge/Te deposition process
US20090162973A1 (en) * 2007-12-21 2009-06-25 Julien Gatineau Germanium precursors for gst film deposition
US9537095B2 (en) * 2008-02-24 2017-01-03 Entegris, Inc. Tellurium compounds useful for deposition of tellurium containing materials
US9701695B1 (en) * 2015-12-30 2017-07-11 American Air Liquide, Inc. Synthesis methods for amino(halo)silanes
KR20220000366A (ko) * 2020-06-25 2022-01-03 신에쓰 가가꾸 고교 가부시끼가이샤 화학 증폭 레지스트 재료 및 패턴 형성 방법

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1471063A1 (en) * 2003-02-28 2004-10-27 Exonhit Therapeutics S.A. Compounds and methods of treating cell proliferative diseases, retinopathies and arthritis
KR101726620B1 (ko) * 2008-06-24 2017-04-14 엘지디스플레이 주식회사 발광 표시 패널 및 그의 제조 방법
EP2139041B1 (en) * 2008-06-24 2015-08-19 LG Display Co., Ltd. Luminescence display panel and method for fabricating the same
WO2013056015A1 (en) * 2011-10-14 2013-04-18 Incyte Corporation Isoindolinone and pyrrolopyridinone derivatives as akt inhibitors
JPWO2017014170A1 (ja) * 2015-07-17 2018-04-26 武田薬品工業株式会社 複素環化合物
US9777373B2 (en) * 2015-12-30 2017-10-03 American Air Liquide, Inc. Amino(iodo)silane precursors for ALD/CVD silicon-containing film applications and methods of using the same
KR20180063754A (ko) * 2016-12-02 2018-06-12 삼성전자주식회사 주석 화합물, 그의 합성 방법, ald용 주석 전구체 화합물 및 함주석 물질막의 형성 방법
AR110412A1 (es) * 2016-12-22 2019-03-27 Orion Corp Inhibidores de la cyp11a1

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2062995A1 (en) * 2007-10-31 2009-05-27 Advanced Technology Materials, Inc. Amorphous Ge/Te deposition process
US20090162973A1 (en) * 2007-12-21 2009-06-25 Julien Gatineau Germanium precursors for gst film deposition
US9537095B2 (en) * 2008-02-24 2017-01-03 Entegris, Inc. Tellurium compounds useful for deposition of tellurium containing materials
US9701695B1 (en) * 2015-12-30 2017-07-11 American Air Liquide, Inc. Synthesis methods for amino(halo)silanes
KR20220000366A (ko) * 2020-06-25 2022-01-03 신에쓰 가가꾸 고교 가부시끼가이샤 화학 증폭 레지스트 재료 및 패턴 형성 방법

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
期刊 C. C. Hsu, and R. A. Geanangel "Synthesis and studies of trimethylamine adducts with tin(II) halides" Inorganic Chemistry 16, 10 ACS Publications, 1 October 1977 2529-2534.
網路文獻 Chemical Abstract Compound Chemical Abstract Compound STN 1984/12/17 RN 92706-14-4;期刊 D. Hass "Wismut(III)-alkyl(bzw. aryl)imidojodide" Zeitschrift für Chemie Volume 4, Issue 5 Wiley May 1964 185-186.;期刊 S. P. Sinha "Über einen Komplex des Antimon (III) -chlorids mit α,α′-Dipyridyl" Zeitschrift für Chemie Volume 4, Issue 4 Wiley April 1964 150-151.;期刊 Alwyn G. Davies and John D. Kennedy "Organometallic reactions. Part XVII. Some exchange and addition reactions of aminodimethyltin compounds" Journal of the Chemical Society C: Organic issue 6 Royal Society of Chemistry 1970 759-765.;期刊 C. C. Hsu, and R. A. Geanangel "Synthesis and studies of trimethylamine adducts with tin(II) halides" Inorganic Chemistry 16, 10 ACS Publications, 1 October 1977 2529-2534. *

Also Published As

Publication number Publication date
JP7645296B2 (ja) 2025-03-13
CN116574125B (zh) 2025-07-25
JP2025003673A (ja) 2025-01-09
US12384805B2 (en) 2025-08-12
JP2023115908A (ja) 2023-08-21
US20230250114A1 (en) 2023-08-10
CN116574125A (zh) 2023-08-11
TW202332680A (zh) 2023-08-16

Similar Documents

Publication Publication Date Title
TWI904406B (zh) 含碘的金屬化合物、包含其的用於沉積薄膜的組合物及其製造方法
KR20240128971A (ko) 주석-함유 박막의 증착을 위한 주석-함유 전구체 및 이의 상응하는 증착 공정
JP7738107B2 (ja) アンチモニー含有薄膜蒸着用組成物およびそれを用いたアンチモニー含有薄膜の製造方法
KR102785094B1 (ko) 안티모니 함유 박막 증착용 조성물 및 이를 이용하는 안티모니 함유 박막의 제조방법
KR102822581B1 (ko) 요오드 함유 금속 화합물 및 이를 포함하는 박막 증착용 조성물
JP7822479B2 (ja) モリブデン化合物、その製造方法、およびそれを含む薄膜蒸着用組成物
KR102904483B1 (ko) 신규한 아미노알콕시실릴아민 화합물, 이의 제조방법 및 이를 포함하는 실리콘 함유 박막증착용 조성물
TW202506700A (zh) 用於沉積含銻薄膜之組成物以及使用該組成物製造含銻薄膜之方法
TWI885821B (zh) 環二矽氮烷化合物、包括該化合物之用於沉積含矽薄膜的組成物、及使用該化合物製造含矽薄膜的方法
JP7742191B2 (ja) モリブデン化合物、その製造方法、およびそれを含む薄膜の製造方法
TWI850897B (zh) 銦化合物及其製造方法、用於沉積含銦薄膜的組合物、以及含銦薄膜及其製造方法
KR20250000889A (ko) 안티모니 함유 박막 증착용 조성물 및 이를 이용하는 안티모니 함유 박막의 제조방법
TW202506695A (zh) 新穎胺基烷氧基矽基胺化合物、其製備方法及其應用
TW202311273A (zh) 矽前驅物
WO2023190386A1 (ja) 硫黄含有シロキサン、前記硫黄含有シロキサンを含むシリコン含有膜形成用の組成物、硫黄含有シロキサンの製造方法、シリコン含有膜、及びシリコン含有膜の製造方法
CN120118115A (zh) 氨基烷氧基二硅氮烷化合物、包含其的含硅薄膜沉积用组合物及使用其的含硅薄膜的制备方法